Probe module and test mechanism

Abstract

The utility model relates to a probe module and a test mechanism, the probe module comprises a first base, a second base and at least two probes, the first base is detachably connected with the second base, the first base is provided with a plurality of first mounting grooves, and the second base is provided with a plurality of second mounting grooves; the probe is detachably inserted into the first mounting groove or the second mounting groove. According to the probe module provided by the invention, the probes are selectively inserted into the first mounting groove and / or the second mounting groove, so that the number of the probes and the distance between any two probes are changed, the probe module is adaptive to and compatible with electrical tests of to-be-tested products with different numbers of test points with different distances, and the first base is detachably connected with the second base, so that the test efficiency is improved. The probe is detachably inserted into the first mounting groove or the second mounting groove, the positioning matching requirement between the probe and the first base or the second base is lowered, when a certain part of the probe module is damaged, only the damaged structure needs to be replaced correspondingly, and the manufacturing and using cost of the probe module is lowered.

Description

Technical Field

[0001] The present application relates to the technical field of test components, and particularly to a probe module and a test mechanism. Background Art

[0002] With the increasing improvement of the technological level, the yield rate of products has always been a matter of great concern to people, so the detection of product performance is crucial. Usually, a product to be tested includes a plurality of parts to be tested. For example, a part to be tested generally includes at least two test points, and the performance of the test points can be detected by probes.

[0003] During the actual test process, the sizes of the parts to be tested in the same-specification products to be tested may also be different, and within parts to be tested of different sizes, the positions, quantities, etc. of the test points within the parts to be tested may also be different. However, the existing probe modules are usually used for the performance test of one specification of products to be tested. When the specification of the product to be tested changes, or when different test points of the same-specification products to be tested are tested, it is necessary to replace the probe module suitable for the specification, resulting in an increase in the test cost of the product. In addition, a probe module generally includes a base and a plurality of probes, and the plurality of probes are integrally formed on the base, resulting in an increase in the manufacturing cost of the probe module. Summary of the Invention

[0004] Based on this, it is necessary to provide a probe module and a test mechanism for the problems that the existing probe modules cannot be applied to the tests between test points with different quantities and spacings, and the manufacturing cost of the probe modules is relatively high.

[0005] A probe module, the probe module includes:

[0006] A first base and a second base, the first base and the second base are detachably connected, the first base is provided with a plurality of first mounting grooves, and the second base is provided with a plurality of second mounting grooves;

[0007] At least two probes, the probes are detachably inserted into the first mounting grooves or the second mounting grooves.

[0008] In one embodiment, the plurality of first mounting grooves are arranged in an array on the first base, and the plurality of second mounting grooves are arranged in an array on the second base;

[0009] Wherein, the array direction of the plurality of first mounting grooves is the same as the array direction of the plurality of second mounting grooves.

[0010] In one embodiment, there are multiple probes, and at least one probe is detachably inserted into the first mounting groove, and at least one probe is detachably inserted into the second mounting groove.

[0011] In one embodiment, the probe module further includes an adjusting member disposed between the first base and the second base for adjusting the distance therebetween.

[0012] In one embodiment, the first base is provided with a first stepped groove, and the second base is provided with a second stepped groove;

[0013] The adjusting member includes a base portion and a first protruding portion protruding along the circumferential direction of the base portion. Opposite ends of the base portion are respectively inserted into the first stepped groove and the second stepped groove, and at least a part of the first protruding portion protrudes outside the first stepped groove and / or the second stepped groove and is located between the first base and the second base.

[0014] In one embodiment, the adjusting member is detachably connected to the first base and the second base.

[0015] In one embodiment, the first base is provided with a plurality of first disassembly grooves corresponding to the plurality of first mounting grooves, and the first disassembly grooves communicate with the first mounting grooves;

[0016] The second base is provided with a plurality of second disassembly grooves corresponding to the plurality of second mounting grooves, and the second disassembly grooves communicate with the second mounting grooves.

[0017] In one embodiment, the probe module further includes a cover plate detachably connected to the first base and the second base.

[0018] In one embodiment, the first base is provided with at least one first insertion groove, and the second base is provided with at least one second insertion groove;

[0019] The cover plate includes a connecting portion and a plurality of second protruding portions protruding from the connecting portion. At least one of the second protruding portions is inserted into the first insertion groove, and at least one of the second protruding portions is inserted into the second insertion groove.

[0020] A testing mechanism, the testing mechanism comprising:

[0021] The probe module according to any one of the above technical solutions.

[0022] For the above-mentioned probe module and testing mechanism, the first base is provided with a plurality of first mounting grooves, and the second base is provided with a plurality of second mounting grooves. By inserting probes into the first mounting grooves and / or the second mounting grooves, a probe module can be formed to perform electrical tests on the product to be tested. The probe module provided in this application can change the number of probes and the distance between any two probes by selectively inserting probes into the first mounting grooves and / or the second mounting grooves, so as to adapt to and be compatible with the electrical tests of products to be tested with different numbers and distances of test points. Moreover, the first base and the second base are detachably connected, and the probes are detachably inserted into the first mounting grooves or the second mounting grooves, reducing the positioning and matching requirements between the probes and the first base or the second base. And when a certain part of the probe module is damaged, the damaged structure can be replaced correspondingly, reducing the manufacturing and use costs of the probe module. Description of the Drawings

[0023] Figure 1 It is a schematic structural diagram of the probe module provided in some embodiments.

[0024] Figure 2 It is an exploded schematic diagram of the probe module provided in some embodiments.

[0025] Figure 3 It is a front view of the probe module provided in some embodiments.

[0026] Figure 4 For Figure 3 The sectional view taken along the line A-A in

[0027] Reference Signs:

[0028] 100, probe module;

[0029] 110, first base; 111, first mounting groove; 112, first stepped groove; 113, first disassembly groove; 114, first insertion groove; 120, second base; 121, second mounting groove; 122, second stepped groove; 123, second disassembly groove; 124, second insertion groove; 130, probe; 140, adjusting member; 141, base portion; 142, first protrusion; 150, cover plate; 151, connecting portion; 152, second protrusion. Detailed Description of the Embodiments

[0030] To make the above objects, features, and advantages of the present application more obvious and understandable, the following will describe the specific embodiments of the present application in detail with reference to the drawings. Many specific details are set forth in the following description to fully understand the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present application. Therefore, the present application is not limited by the specific embodiments disclosed below.

[0031] In the description of the present application, it should be understood that if there are terms such as "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., the orientation or positional relationship indicated by these terms is based on the orientation or positional relationship shown in the drawings. These are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present application.

[0032] In addition, if there are terms such as "first" and "second", these terms are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present application, if there is a term "plurality", the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise specifically and clearly defined.

[0033] In the present application, unless otherwise clearly specified and limited, if there are terms such as "mounted", "connected", "coupled", "fixed", etc., these terms should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two elements or the interaction relationship between two elements, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0034] In the present application, unless otherwise clearly specified and limited, if there is a description such as a first feature being "on" or "under" a second feature, the meaning may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature may mean that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "beneath" and "underneath" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature has a lower horizontal height than the second feature.

[0035] It should be noted that if an element is referred to as "fixed to" or "disposed on" another element, it can be directly on the other element or there may be an intermediate element. If an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. If present, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are only for the purpose of illustration and do not represent the only implementation.

[0036] The following introduces the technical solutions provided by the embodiments of the present application in conjunction with the accompanying drawings.

[0037] Refer to Figure 1 As shown, the present application provides a probe module 100. The probe module 100 includes a first base 110, a second base 120 and at least two probes 130. The probe module 100 can be in contact with the test points of the product to be tested and perform electrical tests. Among them, the product to be tested can be an electronic component such as a circuit board or a display module.

[0038] The first base 110 and the second base 120 are detachably connected. The first base 110 is provided with a plurality of first mounting grooves 111, and the second base 120 is provided with a plurality of second mounting grooves 121. Preferably, the plurality of first mounting grooves 111 can be integrally formed on the first base 110 by injection molding, extrusion and other methods to simplify the forming method of setting the first mounting grooves 111 on the first base 110, and the plurality of second mounting grooves 121 can also be integrally formed on the second base 120 by injection molding, extrusion and other methods to simplify the forming method of setting the second mounting grooves 121 on the second base 120.

[0039] The probe 130 is detachably inserted into the first mounting groove 111 or the second mounting groove 121. Exemplarily, multiple probes 130 can be inserted into the plurality of first mounting grooves 111, that is, multiple probes 130 are all arranged on the first base 110; for another example, multiple probes 130 can be inserted into the plurality of second mounting grooves 121, that is, multiple probes 130 are all arranged on the second base 120; for another example, a part of the multiple probes 130 is inserted into the first mounting groove 111, and another part of the multiple probes 130 is inserted into the second mounting groove 121, that is, both the first base 110 and the second base 120 are provided with probes 130. In this way, by inserting the probe 130 into the first mounting groove 111 and / or the second mounting groove 121, the probe module 100 can perform electrical tests on the product to be tested.

[0040] The above probe module 100 selectively inserts the probe 130 into the first installation groove 111 and / or the second installation groove 121 to change the number of probes 130 and the distance between any two probes 130, so as to adapt to and be compatible with the electrical tests of products to be tested with different numbers and distances of test points. Moreover, the first base 110 and the second base 120 are detachably connected, and the probe 130 is detachably inserted into the first installation groove 111 or the second installation groove 121, reducing the positioning and matching requirements between the probe 130 and the first base 110 or the second base 120. And when a certain part of the probe module 100 is damaged, the damaged structure can be replaced correspondingly, reducing the manufacturing and use costs of the probe module 100.

[0041] In one embodiment, referring to Figure 1 As shown, a plurality of first installation grooves 111 are arranged in an array on the first base 110, and a plurality of second installation grooves 121 are arranged in an array on the second base 120. Among them, the array direction of the plurality of first installation grooves 111 is the same as the array direction of the plurality of second installation grooves 121. Exemplarily, the plurality of first installation grooves 111 are distributed in an array along the length direction of the first base 110, and the plurality of second installation grooves 121 are distributed in an array along the length direction of the second base 120. In this way, the plurality of first installation grooves 111 and the plurality of second installation grooves 121 are provided for the selective insertion of the probe 130 to change the number of probes 130 and the distance between any two probes 130, so as to adapt to and be compatible with the electrical tests of products to be tested with different numbers and distances of test points.

[0042] Furthermore, referring to Figure 1 As shown, there are multiple probes 130, and at least one probe 130 is detachably inserted into the first installation groove 111, and at least one probe 130 is detachably inserted into the second installation groove 121, that is to say, probes 130 are provided on both the first base 110 and the second base 120. In this way, when the positions and distances of the test points of the product to be tested change, the probe 130 can be selectively inserted into any first installation groove 111 or any second installation groove 121 according to the test points of the product to be tested, so as to change the number of probes 130 and the distance between any two probes 130, and adapt to and be compatible with the electrical tests of products to be tested with different numbers and distances of test points. And when any probe 130 is damaged, the damaged probe 130 can be separately disassembled and replaced, without replacing the entire probe module 100, reducing the use cost of the probe module 100.

[0043] In this embodiment, there are 34 first mounting grooves 111, and each first mounting groove 111 can accommodate the insertion of 1 to 34 probes 130. There are also 34 second mounting grooves 121, and each second mounting groove 121 can accommodate the insertion of 1 to 34 probes 130. The probe module 100 can accommodate the insertion of 2 to 68 probes 130. Moreover, by changing the types of the probes 130 inserted into the first mounting grooves 111 and the second mounting grooves 121, the type of the probe module 100 can be changed. For example, when the test points of the product to be tested are female connectors, the probes 130 in the probe module 100 can be made male connectors; when the test points of the product to be tested are male connectors, the probes 130 in the probe module 100 can be made female connectors, further reducing the use cost of the probe module 100.

[0044] In order to adjust the distance between the probes 130 on the first base 110 and the probes 130 on the second base 120, in one embodiment, refer to Figure 1 and Figure 2 As shown, the probe module 100 further includes an adjusting member 140. The adjusting member 140 is disposed between the first base 110 and the second base 120, and the adjusting member 140 is used to adjust the distance between the first base 110 and the second base 120. In this way, when probes 130 are inserted into both the first base 110 and the second base 120, by adjusting the distance between the first base 110 and the second base 120 through the adjusting member 140, the distance between the probes 130 on the first base 110 and the probes 130 on the second base 120 can be adjusted to adapt to and be compatible with the electrical tests of the products to be tested with different spaced test points.

[0045] Specifically, continue to refer to Figure 3 and Figure 4 As shown, the first base 110 is provided with a first stepped groove 112, and the second base 120 is provided with a second stepped groove 122. Preferably, the first stepped groove 112 can be integrally formed on the first base 110 by injection molding, extrusion, etc., to simplify the forming method of setting the first stepped groove 112 on the first base 110, and the second stepped groove 122 can also be integrally formed on the second base 120 by injection molding, extrusion, etc., to simplify the forming method of setting the second stepped groove 122 on the second base 120.

[0046] The adjusting member 140 includes a base portion 141 and a first convex portion 142. The first convex portion 142 protrudes along the circumferential direction of the base portion 141. For example, the first convex portion 142 is a frustum structure protruding from the middle section of the base portion 141. Opposite ends of the base portion 141 are respectively inserted into the first stepped groove 112 and the second stepped groove 122. At least a part of the first convex portion 142 protrudes to the outside of the first stepped groove 112 and / or the second stepped groove 122, and the first convex portion 142 is located between the first base 110 and the second base 120. Thus, when the probes 130 are provided on both the first base 110 and the second base 120, by protruding the first convex portion 142 into the first stepped groove 112 and / or the second stepped groove 122, the first base 110 and the second base 120 can be spaced apart to adjust the distance between the probes 130 on the first base 110 and the probes 130 on the second base 120, so as to adapt to and be compatible with the electrical tests of the products to be tested with different spacing test points.

[0047] It should be noted that if the distance that the first base 110 and the second base 120 need to be spaced apart is relatively large and the requirement cannot be met only by relying on the first convex portion 142, elements such as gaskets and adjusting rings can be sleeved on the base portion 141 to meet the adjustment between the first base 110 and the second base 120 with a large distance.

[0048] Furthermore, in one embodiment, referring to Figure 1 、 Figure 2 and Figure 4 as shown, there are multiple adjusting members 140, and the multiple adjusting members 140 are spaced along the circumferential direction of the first base 110. Since the sizes of the first base 110 and the second base 120 are relatively larger than those of the adjusting member 140, if only one adjusting member 140 is used to support the adjusted first base 110 and second base 120, the first base 110 and the second base 120 are likely to shake. In the above probe module 100, the adjusted first base 110 and second base 120 are supported by multiple adjusting members 140, which can improve the stability of the adjusted first base 110 and second base 120.

[0049] For example, in this embodiment, there are two adjusting members 140, and the two adjusting members 140 are arranged near the two end portions of the first base 110 or the second base 120. Of course, in other feasible embodiments, the number of the adjusting members 140 can also be other numbers, and the specific number of the adjusting members 140 is not limited in this application.

[0050] In order to further improve the convenience of adjusting the distance between the first base 110 and the second base 120, in one embodiment, referring to Figure 2 and Figure 4As shown, the adjusting member 140 is detachably connected to the first base 110 and the second base 120. When the distance between the first base 110 and the second base 120 changes, the distance between the first base 110 and the second base 120 can be adjusted to a preset value by replacing the adjusting member 140 with a suitable specification, so as to perform electrical tests on the products to be tested at different distance test points, without replacing the entire probe module 100, reducing the use cost of the probe module 100.

[0051] During the long-term abutting test of the probe 130, the position of the probe 130 on the first base 110 or the second base 120 may shift, resulting in a jamming phenomenon between the probe 130 and the first base 110 or the second base 120. When the probe 130 needs to be disassembled and replaced, the probe 130 is not easily separated from the first base 110 or the second base 120. In one embodiment, refer to Figure 1 and Figure 2 As shown, the first base 110 is provided with a plurality of first disassembly grooves 113 in an array. The plurality of first disassembly grooves 113 correspond to the plurality of first installation grooves 111, and the first disassembly grooves 113 communicate with the first installation grooves 111. If the probe 130 is jammed on the first base 110, an auxiliary needle member can be inserted into the corresponding first disassembly groove 113, and the auxiliary needle member acts on the part of the probe 130 extending into the first base 110 in a way of dialing, pushing, etc., to assist in the disassembly and replacement operation of the probe 130 jammed on the first base 110. The second base 120 is provided with a plurality of second disassembly grooves 123 in an array. The plurality of second disassembly grooves 123 correspond to the plurality of second installation grooves 121, and the second disassembly grooves 123 communicate with the second installation grooves 121. If the probe 130 is jammed on the second base 120, an auxiliary needle member can be inserted into the corresponding second disassembly groove 123, and the auxiliary needle member acts on the part of the probe 130 extending into the second base 120 in a way of dialing, pushing, etc., to assist in the disassembly and replacement operation of the probe 130 jammed on the second base 120.

[0052] In one embodiment, refer to Figure 2 and Figure 4 As shown, the probe module 100 further includes a cover plate 150. The cover plate 150 is detachably connected to the first base 110 and the second base 120. When the first base 110 and the second base 120 need to be connected, the cover plate 150 is simultaneously connected to the first base 110 and the second base 120, and the first base 110 and the second base 120 are indirectly connected into one body through the cover plate 150; when the first base 110 and the second base 120 need to be disassembled, the cover plate 150 is simultaneously disassembled from the first base 110 and the second base 120, and the connection relationship between the first base 110 and the second base 120 is released, and the disassembly of the first base 110 and the second base 120 can be completed.

[0053] Specifically, refer toFigure 2 As shown in Figure 4 Figure 4 , the first base 110 is provided with at least one first insertion slot 114, and the second base 120 is provided with at least one second insertion slot 124. The first insertion slot 114 can be integrally formed in the first base 110 by injection molding, extrusion and other methods, so as to simplify the forming method of arranging the first insertion slot 114 in the first base 110, and the second insertion slot 124 can also be integrally formed in the second base 120 by injection molding, extrusion and other methods, so as to simplify the forming method of arranging the second insertion slot 124 in the second base 120.

[0054] The cover plate 150 includes a connecting portion 151 and a second protruding portion 152. The second protruding portion 152 protrudes from the connecting portion 151. At least one second protruding portion 152 is inserted into the first insertion slot 114, and at least one second protruding portion 152 is inserted into the second insertion slot 124. Through the cooperation between the second protruding portion 152 and the first insertion slot 114 and the second insertion slot 124, the cover plate 150 can be detachably connected to the first base 110 and the second base 120 at the same time.

[0055] Of course, the connection between the cover plate 150 and the first base 110 and the second base 120 is not limited to the above embodiments. For example, the cover plate 150 can also be detachably connected to the first base 110 and the second base 120 by screwing, clamping and other methods. The present application does not limit the connection relationship between the cover plate 150 and the first base 110 and the second base 120.

[0056] In addition, referring to Figure 1 As shown in Figure 2 Figure 2 , the present application also provides a testing mechanism. The testing mechanism includes a probe module 100 as described in the above technical solution, and the testing mechanism can be abutted against the test points of the product to be tested and perform electrical tests.

[0057] For the above testing mechanism, by selectively inserting the probe 130 into the first installation slot 111 and / or the second installation slot 121, the number of probes 130 and the distance between any two probes 130 can be changed to adapt to and be compatible with the electrical tests of the products to be tested with different numbers and distances of test points. Moreover, the first base 110 and the second base 120 are detachably connected, and the probe 130 is detachably inserted into the first installation slot 111 or the second installation slot 121, reducing the positioning and matching requirements between the probe 130 and the first base 110 or the second base 120. And when a certain part of the probe module 100 is damaged, only the damaged structure needs to be replaced correspondingly, reducing the manufacturing and use costs of the testing mechanism.

[0058] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the various technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0059] The above-described embodiments only represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the patent application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the appended claims.

Claims

1. A probe module, characterized in that: The probe module comprises: A first base and a second base, wherein the first base and the second base are detachably connected, the first base is provided with a plurality of first mounting grooves, and the second base is provided with a plurality of second mounting grooves; At least two probes are detachably plugged into the first mounting slot or the second mounting slot.

2. The probe module according to claim 1, characterized in that: A plurality of first mounting slot arrays are disposed on the first base, and a plurality of second mounting slot arrays are disposed on the second base; Wherein, the array direction of the plurality of first installation slots is consistent with the array direction of the plurality of second installation slots.

3. The probe module according to claim 1, characterized in that: There are multiple probes, and at least one of the probes is detachably plugged into the first mounting groove, and at least one of the probes is detachably plugged into the second mounting groove.

4. The probe module according to claim 1, characterized in that: The probe module further includes an adjusting member, which is disposed between the first base and the second base and is used to adjust the distance between the first base and the second base.

5. The probe module according to claim 4, characterized in that: The first base is provided with a first step groove, and the second base is provided with a second step groove; The adjusting member includes a base and a first protrusion protruding along the circumferential direction of the base, the opposite ends of the base are respectively inserted into the first step groove and the second step groove, the first protrusion at least partially protrudes to the outside of the first step groove and / or the second step groove, and is located between the first base and the second base.

6. The probe module according to claim 4, characterized in that: The adjusting member is detachably connected to the first base and the second base.

7. The probe module according to claim 2, characterized in that: The first base array has a plurality of first disassembly slots corresponding to the plurality of first installation slots, and the first disassembly slots are connected to the first installation slots; The second base array has a plurality of second disassembly slots corresponding to the plurality of second installation slots, and the second disassembly slots are communicated with the second installation slots.

8. The probe module according to claim 1, characterized in that: The probe module further includes a cover plate, and the cover plate is detachably connected to the first base and the second base.

9. The probe module according to claim 8, characterized in that: The first base is provided with at least one first plug-in slot, and the second base is provided with at least one second plug-in slot; The cover plate includes a connecting portion and a plurality of second protrusions protruding from the connecting portion, at least one of the second protrusions is plugged into the first plugging groove, and at least one of the second protrusions is plugged into the second plugging groove.

10. A testing mechanism, characterized in that: The testing organization includes: A probe module as described in any one of claims 1 to 9.

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