Device for testing functional socket and probe of mainboard

Abstract

The utility model belongs to the field of electronic circuit board detection, and provides a device for testing a functional jack and a probe of a mainboard, which comprises a support frame, the translation assembly is arranged on the supporting frame, and a translation block is arranged on the translation assembly; the translation block is provided with a test bottom die which moves synchronously, and the test bottom die is provided with a test station which is used for placing a mainboard. The lifting assembly is arranged on the supporting frame, and a lifting block is arranged on the lifting assembly; the test lifting block is provided with a test top die which moves synchronously, and the test top die is provided with a test probe. And the plugging test assembly comprises a first telescopic assembly and a test plug, the first telescopic assembly is arranged on the supporting frame, and the test plug is arranged at the free end of the first telescopic assembly. According to the utility model, the translation assembly and the lifting assembly are arranged to realize automatic detection of the mainboard, the plugging test assembly is combined to complete mainboard line detection and functional jack detection at the same time, a plurality of traditional manual process operations are combined into a whole, the operation is simple, the accuracy rate is high, and the detection efficiency is high.

Description

Technical Field

[0001] The utility model belongs to the technical field of electronic circuit board detection, and particularly relates to a device for functional socket and probe testing of a main board. Background Art

[0002] The detection of the circuit board of electronic products is one of the common detections, mainly used for the connection status and data transmission status between the connection points of each component inside the circuit board. Its main processes are downloading, writing numbers, burning, and calibration stations. The existing operation method is manual operation for the above four steps, and one employee needs to be configured at each process station. This operation and testing method has low efficiency, high labor cost, and low automation. At the same time, the burning station needs to be powered off within a specified time, and the manual button is not timely, resulting in many mismeasurements. Summary of the Utility Model

[0003] The utility model provides a device for functional socket and probe testing of a main board, which solves the problems of low manual efficiency, high labor cost, low automation, and high manual mismeasurement rate in the above circuit board detection process.

[0004] In order to achieve the above object, the utility model adopts the following technical scheme:

[0005] A device for functional socket and probe testing of a main board, comprising:

[0006] A support frame;

[0007] A translation assembly, arranged on the support frame, and a translation block capable of reciprocating translation relative to the support frame is arranged on the translation assembly;

[0008] A test bottom mold, detachably arranged on the translation block of the translation assembly, and the test bottom mold can reciprocate translation along with the translation block. Among them, a test station is arranged on the test bottom mold;

[0009] A lifting assembly, arranged on the support frame, and a lifting block capable of reciprocating lifting relative to the support frame is arranged on the lifting assembly;

[0010] A test top mold, detachably arranged on the lifting block of the lifting assembly, and a preset distance is arranged between the test top mold and the test bottom mold in the moving direction of the lifting assembly. The test top mold can reciprocate lifting along with the lifting block. Among them, test probes are arranged on the test top mold;

[0011] A plugging and unplugging test assembly, arranged on the support frame, and the plugging and unplugging test assembly includes a first telescopic assembly and a test plug. The first telescopic assembly is arranged on the support frame, and the test plug is arranged at the free end of the first telescopic assembly.

[0012] In some embodiments, the first telescopic assembly is a first cylinder, the test plug is arranged at one end of the telescopic rod of the first cylinder, a first relief groove is arranged on the test bottom mold, and the first relief groove corresponds to the position of the first telescopic assembly.

[0013] In some embodiments, a horizontal adjustment assembly is further included. The horizontal adjustment assembly includes a first lead screw rotatably arranged on the support frame, a first guide rail fixedly arranged on the support frame, a first nut rotatably arranged on the first lead screw, and a first slider slidably arranged on the first guide rail. The first telescopic assembly is arranged on the first slider. Wherein, the first slider is connected to the first nut, and the first lead screw and the first guide rail are arranged relatively parallel.

[0014] In some embodiments, a vertical adjustment assembly is further included at one end of the telescopic rod. The vertical adjustment assembly includes a first base arranged at one end of the telescopic rod and a first connecting block arranged on the first base. The test plug is detachably arranged on the first connecting block. Wherein, the first connecting block can be adjusted up and down relative to the first base.

[0015] In some embodiments, a first chute and a first connection slot adapted to the first connecting block are arranged on the first base in the vertical direction. A first locking screw is arranged on the first connection slot. A first threaded hole corresponding to the position of the first connection slot is arranged on the first connecting block. One end of the first locking screw can pass through the first connection slot and be connected to the first threaded hole.

[0016] In some embodiments, the plugging and unplugging test assembly further includes a second base. A second chute and a second connection slot consistent with the telescopic direction of the telescopic rod are arranged on the second base. A second protrusion adapted to the second chute is arranged on the first slider. Wherein, a second locking screw is arranged on the second connection slot. A plurality of adapted second threaded holes are arranged on the first slider. One end of the second locking screw can pass through the second connection slot and be connected to any one of the plurality of second threaded holes.

[0017] In some embodiments, the translation assembly includes a second driving member, a second guide rail and a second slider arranged on the support frame. The first output end of the second driving member is connected to the translation block. The second guide rail is arranged on the support frame. The second slider is slidably arranged on the second guide rail. The second slider is connected to the translation block. Wherein, the moving direction of the first output end of the second driving member is parallel to the axis direction of the second guide rail.

[0018] In some embodiments, a first sensor and a second sensor are further provided on the support frame. When the first output end of the second driving member moves to the position of the first sensor, the test lower die moves to the loading and unloading position. When the first output end of the second driving member moves to the position of the second sensor, the positions of the test bottom die and the test top die correspond to each other.

[0019] In some embodiments, the lifting assembly includes a third driving member, a first guide sleeve and a first guide shaft disposed on the support frame. The second output end of the third driving member is connected to the lifting block. The first guide sleeve is disposed on the support frame. The first guide shaft is movably disposed through the first guide sleeve, and one end of the first guide shaft is connected to the lifting block. Wherein, the moving direction of the second output end of the third driving member is parallel to the axis of the first guide shaft.

[0020] In some embodiments, a scanning device, a safety grating, a first sensor and a warning light are further included. The scanning device includes a scanner and a link assembly. The scanner is movably disposed on the support frame through the link assembly. When the test bottom die is at the loading and unloading position, the scanning window of the scanner is aligned with the test station. The safety grating includes a first grating and a second grating, and the first grating and the second grating are respectively located on both sides of the test bottom die. The first sensor is disposed on the translation block and is used to detect whether there is a product to be tested at the test station. The warning light can display different colors.

[0021] Compared with the prior art, the beneficial effects brought by the present utility model are as follows:

[0022] In this application, a translation assembly, a lifting assembly and a plug and unplug test assembly are provided on the support frame, a test bottom die is provided on the translation assembly, a test top die is provided on the lifting assembly, and a plug is provided on the plug and unplug test assembly. The test bottom die is driven by the translation assembly to move to the target position, corresponding to the position of the test top die. The test probe of the test top die is driven by the lifting assembly to detect the main board at the test station of the test bottom die. At the same time, the plug and unplug test assembly drives the test plug to move reciprocally to detect the functional socket of the main board, completely replacing manual detection, and multiple detections can be carried out simultaneously, improving the detection efficiency. Only one worker is required to complete the detection of the whole process, reducing the labor cost.

[0023] Additional aspects and advantages of the present application will be given in part in the following description, and these will become obvious from the following description, or can be understood through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 is a first perspective view of a device for testing functional sockets and probes of a main board according to the present utility model;

[0025] Figure 2 A three-dimensional view of the test bottom mold of the device for functional socket and probe testing of the main board of the present utility model located at the loading and unloading positions;

[0026] Figure 3 A second three-dimensional view of the device for functional socket and probe testing of the main board of the present utility model;

[0027] Figure 4 An exploded view of the lifting assembly and the test top mold of the device for functional socket and probe testing of the main board of the present utility model;

[0028] Figure 5 For Figure 4 A schematic diagram of another angle in

[0029] Figure 6 An exploded view of the translation assembly and the test bottom mold of the device for functional socket and probe testing of the main board of the present utility model;

[0030] Figure 7 A schematic diagram of the translation assembly of the device for functional socket and probe testing of the main board of the present utility model;

[0031] Figure 8 For Figure 7 A schematic diagram of another angle of the translation assembly in

[0032] Figure 9 An exploded view of the plugging and unplugging test assembly of the device for functional socket and probe testing of the main board of the present utility model;

[0033] Figure 10 For Figure 9 A schematic diagram of another perspective of the plugging and unplugging test assembly in

[0034] Figure 11 A schematic diagram of the structure of the test bottom mold of the device for functional socket and probe testing of the main board of the present utility model on the side close to the plugging and unplugging test assembly. Detailed implementation manner

[0035] The following further describes the present application in detail with reference to specific drawings. In the description of this embodiment, unless otherwise specified, the orientation or positional relationship indicated by terms such as "left" and "right" is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the present application must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application.

[0036] As Figure 1 And Figure 3As shown in the figure, the present utility model provides a device for functional socket and probe testing of a main board, which mainly includes a support frame 100, a translation assembly 200, a test bottom film 2032, a lifting assembly 400, a test top mold 4022, and a plugging and unplugging test assembly 800.

[0037] Specifically, the support frame 100 includes a first bottom plate 101, a first side plate 102, and a first top plate 103. One end of two first side plates 102 is fixed on the first bottom plate 101, and the first side plate 102 is perpendicularly arranged relative to the first bottom plate 101. The first top plate 103 is fixed at the other end of the two first side plates 102, and the first top plate 103 is parallel to the first bottom plate 102. The first top plate 103, the first side plate 102, and the first bottom plate 101 form a "mouth" - shaped structure. Optionally, the first top plate 103, the first side plate 102, and the first bottom plate 101 can also be an integrally - constructed structure.

[0038] As Figure 6 shown, the translation assembly 200 is arranged on the first bottom plate 101 of the support frame 100. A translation block 203 capable of reciprocating relative to the first bottom plate 101 is provided on the translation assembly 200. A detachable test bottom mold 2032 is arranged on the translation block 203. A test station 20321 is provided on the test bottom mold 2032, and the test station 20321 is used for the positioning and installation of the main board 20322. By the movement of the translation block 203, the reciprocating movement of the test bottom mold 2032 is driven. More specifically, a plurality of first through - holes are provided through the test bottom mold 2032. In this embodiment, there are 4 first through - holes. First fixing holes corresponding to the plurality of first through - holes are provided on the translation block 203. The test bottom mold 2032 is fixed on the translation block 203 by a first screw 2031 passing through the first through - hole and being fixed to a first fixing hole adapted to the first screw 2031. In this embodiment, the first fixing hole is an internal - thread hole. Optionally, the first fixing holes can be set in multiple groups, which can match the first through - holes of different - sized test bottom molds 2032, making the application range of the entire test device larger.

[0039] As Figure 4 and Figure 5As shown in the figure, the lifting component 400 is arranged on the first top plate 103 of the support plate 100. A lifting block 402 is provided on the lifting component 400. The lifting block 402 can move up and down relative to the first top plate 103. A test top mold 4022 is detachably connected to the lifting block 402. A preset spacing is provided in the vertical direction between the test top mold 4022 and the test bottom mold 2032, leaving a reserved space for the test probes on the test top mold 4022. By driving the lifting block 402 to move up and down through the lifting component 400, the test top mold 4022 is driven to move up and down, so that the test probes of the test top mold 4022 can contact and detect the main board located on the test bottom mold 2032. More specifically, a plurality of second through holes are provided on the lifting block 402, and a plurality of second fixing holes corresponding to the second through holes are provided on the test top mold 4022. The test top mold 4022 is fixed to the lifting block 402 by a second screw 4021 passing through the second through hole and extending into the second fixing hole. In this embodiment, similar to the principle of the test bottom mold 2032, by setting multiple groups of second through holes, test top molds 4022 of different sizes can be matched, and corresponding settings can be made with the test bottom mold 2032 to replace different test modules, improving the adaptability of the test device.

[0040] As Figure 9 and Figure 10 shown, the plug and unplug test component 800 has a first telescopic component 801 and a plug component 804. The plug component 804 includes a test plug 4042, which is arranged at the free end of the first telescopic component 801. The first telescopic component 801 is arranged on one side of the first bottom plate 101 of the support frame 100. As Figure 3 shown, when the test bottom mold 2032 moves to the test position through the translation block 203, the free end of the first telescopic component 801 extends, driving the test plug 8042 to move, and inserting the test plug 8042 into the functional socket of the main board 20322 for detection. When the detection is completed, the free end of the first telescopic component 801 drives the test plug 8042 to pull out of the functional socket and return to the initial position. In this embodiment, the functional socket of the main board 20322 is a Type-c socket, and the test plug 8042 is selected as a corresponding Type-c plug. Optionally, the functional socket can also be a headphone jack, an Apple electronic product socket, a USB socket or an Android electronic product socket, and only the corresponding test plug 8042 needs to be replaced.

[0041] In this application, by integrating the probe detection of the main board 20322 and the detection of the functional socket on a set of equipment, only one person is required to perform the test operation, and automatic detection is realized. While improving the detection efficiency, since power-off processing needs to be performed within a specified time during burning, manual buttons are replaced by automation to avoid untimely power-off by manual operation, ensuring the detection quality.

[0042] In one embodiment, since the cylinder control structure is simple and has a fast response speed, the first telescopic assembly 801 is preferably a first cylinder. The test plug 8042 is arranged at one end of the telescopic rod of the first cylinder. By reciprocating the telescopic rod of the first cylinder, the test plug 8042 is driven to perform plugging and unplugging actions. Optionally, the first telescopic assembly 801 can also be a combined structure of a motor, a lead screw slider, and a guide rail. By the forward and reverse rotation of the motor, the slider is driven to perform reciprocating linear movement along the lead screw. Optionally, the first telescopic assembly 801 can also be realized by combining an electrode synchronous belt and a synchronous pulley structure with a guide rail slider. By the forward and reverse rotation of the motor, the slider is driven to perform reciprocating linear movement along the guide rail, so as to realize the reciprocating linear plugging and unplugging actions of the test plug 8042.

[0043] Further, to avoid interference between the test plug 8042 and the test bottom mold 2032 when the test plug 8042 performs plugging and unplugging tests, as Figure 11 shown, a first relief groove 20323 is provided on the test bottom mold 2032. Specifically, the first relief groove 20323 is a notch, and its position corresponds to the position of the plugging and unplugging test assembly 800. While the test plug 8042 is inserted into the functional socket of the main board 20322, a part of the first telescopic assembly 801 will not collide and interfere with the test bottom mold 2032.

[0044] In one embodiment, as Figure 9 and Figure 10As shown, since different mainboards 20322 will be tested and the positions of the functional sockets on the mainboard 20322 are different, a horizontal adjustment component is provided to adjust the horizontal position of the test plug 8042 of the plug-and-play test component 800. Specifically, the horizontal adjustment component includes a first lead screw 805, a first nut 8051, a first guide rail 806, and a first slider 8061. The first lead screw 805 is rotatably arranged on the first bottom plate 101. Specifically, by providing a bracket and arranging a bearing on the bracket to fix the first lead screw 805. The first nut 8051 is adapted to the first lead screw 805 and can rotate relative to the first lead screw 805. The first slider 8061 is adapted to the first guide rail 806 and is slidably arranged on the first guide rail 806. The first slider 8061 is connected to the first nut 8051. In this embodiment, for the convenience of assembly, the first slider 8061 and the first nut 8051 are fixedly connected by a first fixing block 8052. The first cylinder is arranged on the first fixing block 8052. It should be noted that the first guide rail 806 and the first lead screw 805 are arranged parallel to each other. In this embodiment, to facilitate the rotation of the first lead screw 805, a first knob 8053 is further arranged at one end of the first lead screw 805. By rotating the first knob 8053, the first nut 8051 moves in the axial direction of the first lead screw 805 under the limitation of the first slider 8061, so as to adjust the horizontal position of the test plug 8042 of the plug-and-play test component 800. Optionally, the rotation of the first lead screw 805 can also be set to be driven by a motor. By providing the first lead screw 805, the precise control of the horizontal position of the test plug 8042 can be realized. At the same time, a self-locking mechanism will be formed between the first lead screw 805 and the first nut 8051, and there is no need for an additional locking structure to fix the position of the plug-and-play test component 800. Optionally, the first nut 8051 and the first slider 8061 can also be set as an integral structure.

[0045] Further, it further includes a vertical adjustment component disposed at one end of the telescopic rod. The height of the test plug 8042 is adjusted through the vertical adjustment component to adapt to the functional sockets of the main board 20322 at different heights. Specifically, the vertical adjustment component includes a first base 8011 and a first connecting block 803. The position of the first connecting block 803 relative to the first base 8011 can be moved for lifting adjustment, and the two are detachably connected. More specifically, a first vertical chute 80112 is provided on the first base 8011. The width of the first chute 80112 is adapted to the width of the first connecting block 803, and the first connecting block 803 can move up and down within the first chute 80112. Further, to fix the position of the first connecting block 803 on the first base 8011, a first connecting notch 80111 is provided on the first base 8011. The first connecting notch 80111 has a certain length, penetrates the first base 8011, and the direction of the first connecting notch 80111 is the same as the direction of the first chute 80112. In this embodiment, both are in the vertical direction. A first threaded hole is provided on the first connecting block 803. A first locking screw is provided on the first connecting notch 80111. One end of the first locking screw passes through the first connecting notch 80111 and is connected to the first threaded hole, thereby fixing the first connecting block 803 relative to the first base 8011, and thus realizing the height adjustment of the test plug 8042 disposed on the first connecting block 803. Further, the first connecting notch 80111 is a countersunk notch, and the screw head of the first locking screw is placed in the countersunk notch.

[0046] Further, a clamping notch 8031 is provided on the first connecting block 803, and a matching clamping boss 8041 is provided on the test plug 8042. The clamping boss 8041 is detachably connected by inserting it into the clamping notch 8031. Further, one end of a screw can also be used to abut and lock the clamping boss 8041.

[0047] In one embodiment, to prevent the length of the telescopic rod of the first telescopic component 801 from being insufficient and causing the test plug 8042 to be unable to be inserted into the functional socket of the main board 20322, the plug and unplug test component 800 further includes a second base 802. A second chute 8021 and a second connection notch 8022 consistent with the direction of the telescopic rod are provided on the second base 802. A second protrusion adapted to the second chute 821 is provided on the first slider 8061. In this embodiment, the second protrusion is the first fixing block 8052, and the width of the first fixing block 8052 is adapted to the width of the second chute 8021. The second base 802 can move and adjust relative to the first fixing block 8052 in the axial direction of the telescopic rod through the second chute 8021; further, the second base 802 is fixed by setting the second connection notch 8022, and the second connection notch 8022 has a certain length. Specifically, the second connection notch 8022 is consistent with the telescopic direction of the telescopic rod. A plurality of second threaded holes corresponding to the position of the second connection notch 8022 are provided on the first fixing block 8052. The central connection lines of the plurality of second threaded holes are on a straight line, and the central connection line is consistent with the length direction of the second connection notch 8022. A second locking screw is provided on the second connection notch 8022. One end of the second locking screw passes through the second connection notch 8022 and is connected to one of the plurality of second threaded holes, so as to fix the second base 802 to the first fixing block 8052 after adjustment.

[0048] In one embodiment, as Figure 7 shown, the translation component 200 includes a second driving member 201, a second guide rail 202, and a second slider 2021. The second driving member 201 is fixed to the first bottom plate 101. The first output end 2011 of the second driving member 201 is fixedly connected to the translation block 203. The second guide rail 202 is provided on the first bottom plate 101 of the support frame 100. The second slider 2021 is slidably provided on the second guide rail 202. The second slider 2021 is fixedly connected to the translation block 203 and is connected to the first output end 2011 of the second driving member 201. Among them, the axial direction of the second guide rail 202 is parallel to the moving direction of the first output end 2011 of the second driving member 201. In this embodiment, there are two second guide rails 202 and they are arranged in parallel. The two second guide rails 202 are respectively located on both sides of the second driving member 201. In this embodiment, since the cylinder has a fast reaction speed, simple control, and simple structure, the second driving member is preferably a rodless cylinder, and the slider on the rodless cylinder is the first output end 2011. Optionally, if the stroke is small, the second driving member 201 can also be a double-axis push rod cylinder. Optionally, the second driving member 201 can also be driven by a motor. The reciprocating linear movement of the translation block is completed through the forward and reverse rotation of the motor combined with the screw rod slider structure. Optionally, the screw rod slider structure can also be replaced with a synchronous belt and synchronous pulley structure to realize the reciprocating linear movement of the translation block.

[0049] In one embodiment, as Figure 8 shown, a first sensor 2042 and a second sensor 2041 are further provided on the first bottom plate 101 of the support frame 100. The first sensor 2042 and the second sensor 2041 are arranged at two extreme positions of the first output end 2011, that is, when the translation block 203 drives the test bottom mold 2032 to be in the initial loading or unloading position and when the translation block 203 drives the test bottom mold 2032 to be directly below the test top mold 4022, positions where the test probe and the test plug 8042 can be detected. Specifically, an induction tab 20111 is provided on the first output end 2011. When the induction tab 20111 of the first output end 2011 is at the position of the first sensor 5042, at this time, the test bottom mold 2032 is in the loading or unloading position, and the first output end 2011 is about to move in the direction of the second sensor 2041 driven by the second driving member 201; when the induction tab 20111 of the first output end 2011 is at the position of the second sensor 2041, at this time, the test bottom mold 2032 is in the test position, the test top mold 4022 moves downward to perform the test on the main board 20322, and the test plug 8042 moves toward the functional socket of the main board 20322 to perform the detection of the functional socket. After the detection is completed, the test top mold 4022 moves upward, the test plug 8042 is pulled out, and the test bottom mold 2032 moves to the loading and unloading position under the action of the translation block 203, and so on.

[0050] In one embodiment, as Figure 4 and Figure 5 shown, the lifting assembly 400 includes a third driving member 401, a first guide sleeve 403, and a first guide shaft 404. The third driving member 401 is fixed to the first top plate 103, the second output end 4011 of the third driving member 401 is fixedly connected to the lifting block 402, the first guide sleeve 403 is fixedly arranged on the first top plate 103 of the support frame 100, the first guide shaft 404 is movably sleeved in the first guide sleeve 403, and the moving direction of the first guide shaft 404 is parallel to the moving direction of the second output end 4011. Specifically, in this embodiment, since the stroke of the test top mold 4022 is short, the reverse speed of the cylinder is fast, and the structure is simple and easy to control, the third driving member 401 is preferably a double-axis cylinder. Optionally, the third driving member 401 can also be replaced by a lead screw slider structure or a synchronous belt and synchronous pulley structure. Combining the first guide sleeve 403 and the first guide shaft 404, the lifting block 402 can be adjusted in the vertical direction. Optionally, the third driving member 401 can also be a single-axis cylinder.

[0051] In one embodiment, a scanning device 600 is also included, and the scanning device 600 is mainly used for scanning the information of the mainboard 20322. For example, a barcode or a two-dimensional code, etc. The scanning device 600 includes a scanner and a connecting rod assembly. In this embodiment, the scanner is connected by multiple groups of first connecting rods 602 and second connecting rods 603 and multiple first clamping rings 604 that clamp the first connecting rods 602 and second connecting rods 603. Among them, the first clamping rings 604 can be moved and adjusted axially with the first connecting rods 602 and second connecting rods 603, and can rotate around the first connecting rods 602 and second connecting rods 603 to adjust the angle of the scanning window 601 of the scanner so that the scanning window 601 is aligned with the barcode or two-dimensional code of the mainboard 20322 on the test station 20321 of the test bottom mold 2032. After the scan is successful, the translation block 203 can move; if the three scans are unsuccessful, manual processing is performed.

[0052] Furthermore, a safety grating 700 is also included, and the safety grating 700 is mainly used to detect whether the operator's hand leaves the test station. Specifically, the safety grating 700 includes a first grating and a second grating, which are respectively arranged on the first bottom plate 101 and located on both sides of the test bottom mold 2032. The test bottom mold 2032 can pass through the space formed by the first grating and the second grating. When the operator's hand leaves the detection range of the safety grating 700, the translation block 203 can be driven.

[0053] Furthermore, it also includes a first sensor 2033, which is disposed on the translation block 203. Figure 6 As shown, a clearance space is provided on the translation block 203 for installing the first sensor 2033. By setting the first sensor 2033, it is possible to detect whether the main board 20322 is in place and whether there is a main board on the test station 20321. If not, the translation block 203 remains stationary. If yes, when the scanning device 600 reads the code and the operator's hand leaves the detection range of the safety grating 700, the translation block 203 drives the test bottom mold 2032 to move to the test position.

[0054] Furthermore, a prompt light is also included, which is mainly used for feedback of the detection result of the main board 20322. For example, if the main board 20322 passes the detection, the green light is on, and if the main board 20322 fails the detection, the red light is on. Optionally, the color of the prompt light is not limited, and the quality of the detection result of the main board 20322 can be defined by using two different colors. It should be noted that the scanner, the safety grating 700, the first sensor 2033 and the prompt light are respectively electrically connected to the control panel to realize the connection of each functional part. This is a prior art and will not be repeated here.

[0055] The above are only the preferred embodiments of the present utility model. It should be noted that for those of ordinary skill in the art, without departing from the principle of the present utility model, several improvements and modifications can be made. These improvements and modifications should also be regarded as the protection scope of the present utility model.

Claims

1. A device for testing the function sockets and probes of a motherboard, characterized in that: include: Support frame; A translation assembly is arranged on the support frame, and a translation block is provided on the translation assembly and can reciprocate relative to the support frame; A test bottom mold, which is detachably arranged on the translation block of the translation assembly, and the test bottom mold can follow the translation block to perform reciprocating translation, wherein a test station is arranged on the test bottom mold; A lifting assembly is arranged on the support frame, and a lifting block is provided on the lifting assembly and can be lifted and lowered reciprocally relative to the support frame; A test top mold is detachably arranged on the lifting block of the lifting assembly, and a preset spacing is arranged between the test top mold and the test bottom mold in the moving direction of the lifting assembly. The test top mold can follow the lifting block to perform reciprocating lifting, wherein a test probe is arranged on the test top mold; The plug-in test assembly is arranged on the support frame, and the plug-in test assembly includes a first telescopic assembly and a test plug. The first telescopic assembly is arranged on the support frame, and the test plug is arranged at the free end of the first telescopic assembly.

2. A device for testing the function socket and probe of a motherboard according to claim 1, characterized in that: The first telescopic component is a first cylinder, the test plug is arranged at one end of the telescopic rod of the first cylinder, and a first clearance groove is arranged on the test bottom mold, and the first clearance groove corresponds to the position of the first telescopic component.

3. A device for testing the function socket and probe of a motherboard according to claim 2, characterized in that: It also includes a horizontal adjustment component, which includes a first screw rod rotatably set on the support frame, a first guide rail fixedly set on the support frame, a first nut rotatably set on the first screw rod, and a first slider slidably set on the first guide rail, and the first telescopic component is set on the first slider, wherein the first slider is connected to the first nut, and the first screw rod and the first guide rail are set relatively parallel.

4. A device for testing the function socket and probe of a motherboard according to claim 3, characterized in that: It also includes a vertical adjustment component arranged at one end of the telescopic rod, the vertical adjustment component includes a first base arranged at one end of the telescopic rod, and a first connecting block arranged on the first base, the test plug is detachably arranged on the first connecting block, wherein the first connecting block can be raised and lowered relative to the first base.

5. A device for testing the function socket and probe of a motherboard according to claim 4, characterized in that: The first base is provided with a first sliding groove and a first connecting notch arranged in a vertical direction and adapted to the first connecting block, the first connecting notch is provided with a first locking screw, and the first connecting block is provided with a first threaded hole corresponding to the position of the first connecting notch, and one end of the first locking screw can pass through the first connecting notch and be connected to the first threaded hole.

6. A device for testing the function socket and probe of a motherboard according to claim 5, characterized in that: The plug-in test assembly also includes a second base, which is provided with a second slide groove and a second connecting notch consistent with the extension and retraction direction of the telescopic rod, and the first slider is provided with a second protrusion adapted to the second slide groove, wherein the second connecting notch is provided with a second locking screw, and the first slider is provided with a plurality of adapted second threaded holes, and one end of the second locking screw can pass through the second connecting notch and be connected to any one of the plurality of second threaded holes.

7. A device for testing the function socket and probe of a motherboard according to claim 1, characterized in that: The translation assembly includes a second driving member, a second guide rail and a second slider arranged on the support frame, the first output end of the second driving member is connected to the translation block, the second guide rail is arranged on the support frame, the second slider is slidably arranged on the second guide rail, and the second slider is connected to the translation block, wherein the moving direction of the first output end of the second driving member is parallel to the axial direction of the second guide rail.

8. The device for testing the function socket and probe of a mainboard according to claim 7, characterized in that: The support frame is also provided with a first sensor and a second sensor. When the first output end of the second driving member moves to the position of the first sensor, the test lower mold moves to the upper and lower material positions. When the first output end of the second driving member moves to the position of the second sensor, the positions of the test bottom mold and the test top mold correspond.

9. The device for testing the function socket and probe of a motherboard according to claim 1, characterized in that: The lifting assembly includes a third driving member, a first guide sleeve and a first guide shaft arranged on the support frame, the second output end of the third driving member is connected to the lifting block, the first guide sleeve is arranged on the support frame, the first guide shaft is movably passed through the first guide sleeve, and one end of the first guide shaft is connected to the lifting block, wherein the moving direction of the second output end of the third driving member is parallel to the axis of the first guide shaft.

10. The device for testing the function socket and probe of a motherboard according to claim 1, characterized in that: It also includes a scanning device, a safety grating, a first sensor and a prompt light. The scanning device includes a scanner and a connecting rod assembly. The scanner is movably arranged on the support frame through the connecting rod assembly. When the test base mold is located at the upper and lower material positions, the scanning window of the scanner is aligned with the test station; the safety grating includes a first grating and a second grating, and the first grating and the second grating are respectively located on both sides of the test base mold; the first sensor is arranged on the translation block, and is used to detect whether there is a product to be tested at the test station; the prompt light can display different colors.

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