Digital temperature sensor test system
By designing a digital temperature sensor test system, and using the constant temperature bath environment provided by the temperature reference sensor and the constant temperature tank for calibration, the problem of insufficient batch testing accuracy and efficiency of digital temperature sensors in the prior art is solved, and higher testing accuracy and efficiency are achieved.
Patent Information
- Application Number
- CN202421808783.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-29
- Publication Date
- 2025-06-17
- Estimated Expiration
- 2034-07-29
AI Technical Summary
The prior art needs to improve accuracy and efficiency in batch testing of digital temperature sensors.
A digital temperature sensor testing system is designed, including test components, a first board and a constant temperature tank. The test component carries the digital temperature sensor to be tested and integrates the temperature reference sensor. The first board receives temperature data and tests through the constant temperature bath environment provided by the constant temperature tank.
The dual verification of the constant temperature bath environment provided by the temperature reference sensor and the constant temperature tank improves the accuracy of the digital temperature sensor test, while the data reception and processing of the first board improves the test efficiency.
Smart Images
Figure CN222993870U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of sensors, in particular to a digital temperature sensor test system. Background Art
[0002] With the development of technology, the demand for temperature measurement in some industries is increasing. In the past, the common temperature measurement methods mainly used thermistors, thermocouples or thermal resistors. However, with the increasing demand for high-integration, high-precision and easy-to-use temperature measurement solutions, digital temperature sensors have emerged.
[0003] Most digital temperature sensors internally integrate measurement circuits, digital processing circuits and communication interfaces, etc., with high integration, no need to design complex peripheral circuits, and through different packaging forms, they can meet the use in more scenarios.
[0004] However, there are some difficulties in the production and manufacturing process of digital temperature sensors. For example, they need to be tested in an accurate and stable environment. In the prior art, when testing digital temperature sensors, there is room for improvement in terms of accuracy and efficiency. Summary of the Utility Model
[0005] The utility model provides a digital temperature sensor test system, aiming to effectively solve the technical problem that there is room for improvement in terms of accuracy and efficiency in the batch testing of data temperature sensors in the prior art.
[0006] The utility model provides a digital temperature sensor test system, including: a test component for carrying the digital temperature sensor to be tested and integrating a temperature reference sensor; a first board card electrically connected to the test component for receiving the first temperature data measured by the digital temperature sensor to be tested on the test component and the second temperature data measured by the temperature reference sensor; a constant temperature bath for providing a constant temperature bath environment for the test board card.
[0007] Further, the test component includes: a second board card and a test board card, the second board card and the test board card are electrically connected, the test board card is used for carrying the digital temperature sensor to be tested and is electrically connected to the digital temperature sensor to be tested, and the second board card integrates the temperature reference sensor.
[0008] Further, the second board card and the test board card are both provided with heat dissipation through holes.
[0009] Further, the system further includes a third board card, and the first board card is electrically connected to the test component through the third board card.
[0010] Further, the temperature reference sensor is a high-precision temperature sensor.
[0011] Further, the temperature control accuracy of the constant temperature bath is ±0.01°C, the temperature fluctuation is ±0.005 - 0.01°C, and the temperature range is -40°C to 160°C.
[0012] Further, there are at least two digital temperature sensors to be tested and at least two temperature reference sensors, and the digital temperature sensors to be tested and the temperature reference sensors are at the same depth in the constant temperature bath environment.
[0013] Further, the electrical connection between the test component and the first board is a digital communication connection.
[0014] Further, the system further includes a power supply module for supplying power to the test component and the first board.
[0015] Further, the system further includes a terminal for displaying the first temperature data measured by the digital temperature sensor to be tested received by the first board and the second temperature data measured by the temperature reference sensor, and for displaying the temperature of the constant temperature bath environment provided by the constant temperature bath.
[0016] Further, the first board includes: a main controller, a digital communication multi-channel selector, and a digital communication level conversion circuit, and the digital communication level conversion circuit is used for communication connection with the digital temperature sensor to be tested and the temperature reference sensor.
[0017] Further, the digital communication level conversion circuit includes: a power supply, a first level conversion module, and a second level conversion module. Among them, the power supply is used for supplying power to the first level conversion module and the second level conversion module. The first level conversion module and the second level conversion module are in parallel. The first level conversion module is used for level conversion of the digital temperature sensor to be tested, and the second level conversion module is used for level conversion of the temperature reference sensor.
[0018] Through one or more of the above embodiments in the present utility model, at least the following technical effects can be achieved:
[0019] In the technical solution disclosed by the present utility model, a test component can be used to measure the temperature of the constant temperature bath environment provided in the constant temperature bath. During the process of measuring the temperature of the constant temperature bath environment, the second temperature data measured by the temperature reference sensor can provide a reference for the first temperature data measured by the digital temperature sensor to be tested. In addition, the temperature of the constant temperature bath environment provided by the constant temperature bath itself can also provide a reference for the first temperature data measured by the digital temperature sensor to be tested, thereby making the test of the digital temperature sensor to be tested more accurate. The first board can receive these measured first temperature data and second temperature data, thereby providing data reserves for rapid testing and improving the test efficiency of the digital temperature sensor to be tested. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] The following will, with reference to the accompanying drawings, clearly and completely describe the technical solutions of the present utility model through a detailed description of the specific embodiments of the present utility model, and the technical solutions and other beneficial effects of the present utility model will become obvious.
[0021] Figure 1 Schematic diagram of the structure of the digital temperature sensor test system provided by an embodiment of the present utility model;
[0022] Figure 2 Schematic diagram of the structure of the test component of the digital temperature sensor test system provided by an embodiment of the present utility model;
[0023] Figure 3 Digital communication level conversion circuit diagram of the digital temperature sensor test system provided by an embodiment of the present utility model.
[0024] Reference numerals:
[0025] 1, first board; 2, test component; 3, constant temperature bath; 4, power supply module; 5, terminal; 21, second board; 211, temperature reference sensor; 22, test board; 221, digital temperature sensor to be tested; 6, heat dissipation through hole; 11, third board. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0026] The following will, with reference to the accompanying drawings in the embodiments of the present utility model, clearly and completely describe the technical solutions in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of the present utility model.
[0027] In the description of the present utility model, it should be noted that unless otherwise clearly specified and defined, the term "and / or" in this article is merely a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this article generally represents an "or" relationship between the associated objects before and after without special explanation.
[0028] With the development of human technology, the demand for temperature measurement is increasing. In the past, the commonly used temperature measurement schemes mainly included thermistors, thermocouples, and resistance temperature detectors (RTDs). However, in more and more scenarios, a temperature measurement scheme with high integration, high precision, and easy use is required. Digital temperature sensors have emerged as the times require and are widely used in the medical industry, industry, automotive electronics, aerospace, consumer electronics and other fields. Most digital temperature sensors integrate a measurement circuit, a digital processing circuit, a communication interface, etc. internally, with a high degree of integration, and do not require the design of complex peripheral circuits. Moreover, through different packaging forms, they can meet the use in more scenarios. For users, they only need to read the temperature result through a specific communication method (I2C, SPI, etc.).
[0029] However, high-precision digital temperature sensors face some challenges in the process of mass production and manufacturing. For example, they need to be tested and calibrated in an accurate and stable environment. The existing batch testing and batch calibration schemes for digital temperature sensors still have deficiencies in terms of accuracy and efficiency. Therefore, a high-efficiency, stable and reliable, high-precision batch testing and calibration scheme is needed to solve the challenges faced by digital temperature sensors.
[0030] The embodiment of the present application provides a digital temperature sensor test system, which can improve the accuracy and efficiency of testing digital temperature sensors.
[0031] Figure 1 The digital temperature sensor test system provided by the embodiment of the present utility model is shown as follows, including: a test component 2, a first board 1, and a constant temperature bath 3. The test component 2 is used to carry the digital temperature sensor 221 to be tested and integrates a temperature reference sensor 211; the first board 1 is electrically connected to the test component 2 and is used to receive the first temperature data measured by the digital temperature sensor 221 to be tested on the test component 2 and the second temperature data measured by the temperature reference sensor 211; the constant temperature bath 3 is used to provide a constant temperature bath environment for the test board 22.
[0032] In this embodiment, the temperature reference sensor 211 is a high-precision temperature sensor. When testing the digital temperature sensor 221 to be tested, the test component 2 is placed in a constant temperature bath 3, which is preset and has a constant-temperature water bath environment. Subsequently, the digital temperature sensor 221 to be tested carried on the test component 2 will detect the temperature in the constant temperature bath 3 and obtain a first temperature data, and the temperature reference sensor 211 will also detect the temperature in the constant temperature bath 3 and obtain a second temperature data. Since the temperature reference sensor 211 is a high-precision temperature sensor, the second temperature data has a high credibility. After comparing the second temperature data with the first temperature data, it is possible to know whether the first data temperature measured by the digital temperature sensor 221 to be tested is accurate.
[0033] In addition, the constant temperature accuracy of the constant temperature bath 3 is ±0.01 °C, the temperature fluctuation is ±0.005 - 0.01 °C, and the temperature range is -40 °C to 160 °C. And the constant temperature environment of the constant temperature bath is preset for the constant temperature bath 3, and it also has a set temperature, which can provide a reference for the second temperature data to verify the credibility of the second temperature data, and can provide a reference for the first temperature data. By comparing the first temperature data with the set temperature, it is also possible to further know whether the first data temperature measured by the digital temperature sensor 221 to be tested is accurate.
[0034] Therefore, the digital temperature sensor testing system provided in this embodiment can use the test component 2 to measure the temperature of the constant temperature bath environment provided in the constant temperature bath 3. And during the process of measuring the temperature of the constant temperature bath environment, the second temperature data measured by the temperature reference sensor 211 can provide a reference for the first temperature data measured by the digital temperature sensor 221 to be tested. In addition, the temperature of the constant temperature bath environment provided by the constant temperature bath 3 itself can also provide a reference for the first temperature data measured by the digital temperature sensor 221 to be tested, thereby making the test of the digital temperature sensor 221 to be tested more accurate. And the first board 1 can receive these measured first temperature data and second temperature data, thereby providing data reserve for rapid testing and improving the testing efficiency of the digital temperature sensor 221 to be tested.
[0035] In one embodiment, as Figure 2 shown, the test component 2 includes: a second board 21 and a test board 22. The second board 21 and the test board 22 are electrically connected. The test board 22 is used to carry the digital temperature sensor 221 to be tested, and the second board 21 is integrated with the temperature reference sensor 211.
[0036] In this embodiment, there are at least two digital temperature sensors 221 to be tested and temperature reference sensors 211, and the digital temperature sensors 221 to be tested and the temperature reference sensors 211 are at the same depth in the constant temperature bath environment.
[0037] By setting multiple digital temperature sensors 221 to be tested and a temperature reference sensor 211, batch testing of the digital temperature sensors 221 to be tested can be achieved, and by placing the digital temperature sensors 221 to be tested and the temperature reference sensor 211 at the same depth in a constant temperature bath environment, the error of the test results can be reduced.
[0038] In one embodiment, both the second board 21 and the test board 22 are provided with heat dissipation through holes 6.
[0039] The design of the heat dissipation through holes 6 reduces the volume of the board, improves the heat dissipation efficiency, shortens the time required for the constant temperature bath to maintain heat while ensuring accuracy, and thus shortens the test time.
[0040] In one embodiment, the system further includes a third board 11, and the first board 1 and the test component 2 are electrically connected through the third board 11.
[0041] By using the third board 11 to connect the first board 1 and the test component 2, wherein the second board 21 in the test component 2 is electrically connected to the third board 11. The setting of the second board 21 enables more convenient communication between the first board 1 and the second board 21. In other embodiments, the first board 1 and the test component 2 can also be connected by wires.
[0042] In one embodiment, the electrical connection between the test component 2 and the first board 1 is a digital communication connection.
[0043] In this embodiment, the first board includes: a main controller, a digital communication multi-channel selector, and a digital communication level conversion circuit. The digital communication level conversion circuit is used for communication connection with the digital temperature sensor to be tested and the temperature reference sensor.
[0044] This embodiment realizes the digital communication connection between the test component 2 and the first board 1 through a digital communication level conversion circuit. More specifically, the digital communication level conversion circuit realizes the digital communication connection between the test board 22, the second board 21 and the first board 1. Exemplarily, as Figure 3 shown, wherein, the INA and OUTA parts, and the INB and OUTB parts respectively represent a test board 22 and a second board 21. There are 8 sensors on each board. For example, the first circuit branch where QA0 is located is the digital communication level conversion circuit where a sensor is located.
[0045] Among them, the digital communication level conversion circuit includes: a power supply, a first level conversion module, and a second level conversion module. The power supply is used to supply power to the first level conversion module and the second level conversion module. The first level conversion module and the second level conversion module are connected in parallel. The first level conversion module is used to perform level conversion on the digital temperature sensor to be tested, and the second level conversion module is used to perform level conversion on the temperature reference sensor.
[0046] In this embodiment, the power supply can be a module of the total power supply of the digital temperature sensor test system or a separate power supply.
[0047] Specifically, the first level conversion module is used to perform level conversion on the digital temperature sensor 221 to be tested. The first level conversion module includes a number of first MOS transistors and a first resistor. The number of first MOS transistors and the first resistor is the same. The drain of one first MOS transistor is electrically connected to a test board to realize the input of the level signal. The gate is connected to the power supply and electrically connected to the first end of a first resistor. The source is electrically connected to the second end of the first resistor and realizes the output of the level signal.
[0048] In addition, for the convenience of wire layout in the circuit, all the first MOS transistors and all the first resistors in this application are integrated. Among them, as described above, the gate of one first MOS transistor is connected to the power supply and electrically connected to the first end of a first resistor. The gates of other first MOS transistors are only electrically connected to the first end of the corresponding first resistor. The drains of other first MOS transistors are electrically connected to a test board. The sources of other first MOS transistors are electrically connected to the second end of the corresponding first resistor. And the input ends of the level signals of all the first MOS transistors are electrically connected, and the output ends of the level signals are also electrically connected.
[0049] Correspondingly, the second level conversion module is used to perform level conversion on the temperature reference sensor 211. The second level conversion module includes a number of second MOS transistors and a second resistor. The number of second MOS transistors and the second resistor is the same. The drain of one second MOS transistor is electrically connected to a second board to realize the input of the level signal. The gate is connected to the power supply and electrically connected to the first end of a second resistor. The source is electrically connected to the second end of the second resistor and realizes the output of the level signal.
[0050] In addition, for the convenience of wire arrangement in the circuit, all the second MOS transistors and all the second resistors in this application are integrated. Among them, as described above, the gate of one second MOS transistor is connected to the power supply and electrically connected to the first end of one second resistor. The gates of other second MOS transistors are only electrically connected to the first end of the corresponding second resistor. The drains of other second MOS transistors are connected to a second circuit board, and the sources of other second MOS transistors are connected to the second end of the corresponding second resistor. Moreover, the input terminals of the level signals of all the second MOS transistors are electrically connected, and the output terminals of the level signals are also electrically connected.
[0051] In one embodiment, the digital temperature sensor test system further includes a power supply module 4, and the power supply module 4 is used to supply power to the test component 2 and the first circuit board 1.
[0052] In this embodiment, the power supply module 4 can supply power to the first circuit board 1, the test component 2, etc.
[0053] In one embodiment, the digital temperature sensor test system further includes a terminal 5, and the terminal 5 is used to display the first temperature data measured by the digital temperature sensor 221 to be tested received by the first circuit board 1 and the second temperature data measured by the temperature reference sensor 211, and is used to display the temperature of the constant temperature bath environment provided by the constant temperature bath 3.
[0054] In this embodiment, the terminal 5 can be used to display the temperature of the constant temperature bath environment, the first temperature data measured by the digital temperature sensor 221 to be tested, the second temperature data measured by the temperature reference sensor 211, etc. In other embodiments, the terminal 5 can also send a power switch command to control the power supply module 4 to supply power. In other embodiments, the terminal 5 can also send a constant temperature bath setting command to set the temperature of the constant temperature bath of the constant temperature bath 3.
[0055] In summary, although the present utility model has been disclosed above with the preferred embodiments, the above preferred embodiments are not intended to limit the present utility model. Those of ordinary skill in the art can make various changes and modifications without departing from the spirit and scope of the present utility model. Therefore, the protection scope of the present utility model shall be subject to the scope defined by the claims.
Claims
1. A digital temperature sensor testing system, characterized in that: include: A test assembly, used to carry a digital temperature sensor to be tested and integrated with a temperature reference sensor; A first board, electrically connected to the test assembly, for receiving first temperature data measured by a digital temperature sensor to be tested on the test assembly and second temperature data measured by the temperature reference sensor; The constant temperature bath is used to provide a constant temperature bath environment for the test component.
2. The digital temperature sensor testing system according to claim 1, characterized in that: The test assembly includes: a second board and a test board, the second board is electrically connected to the test board, the test board is used to carry the digital temperature sensor to be tested and is electrically connected to the digital temperature sensor to be tested, and the second board is integrated with the temperature reference sensor.
3. The digital temperature sensor testing system as claimed in claim 2, characterized in that: The second board and the test board are both provided with heat dissipation through holes.
4. The digital temperature sensor testing system according to claim 1, characterized in that: The system further comprises a third board, and the first board is electrically connected to the test component via the third board.
5. The digital temperature sensor testing system according to claim 1, characterized in that: The temperature reference sensor is a high-precision temperature sensor.
6. The digital temperature sensor testing system according to claim 1, characterized in that: The thermostatic bath has a precision of ±0.01°C, a temperature fluctuation of ±0.005 to 0.01°C, and a temperature range of -40°C to 160°C.
7. The digital temperature sensor testing system according to claim 1, characterized in that: There are at least two of the digital temperature sensors to be tested and the temperature reference sensors, and the digital temperature sensors to be tested and the temperature reference sensors are at the same depth in the constant temperature bath environment.
8. The digital temperature sensor testing system according to claim 1, characterized in that: The electrical connection between the test component and the first board is a digital communication connection.
9. The digital temperature sensor testing system according to claim 1, characterized in that: The system further comprises a power supply module, and the power supply module is used to supply power to the test component and the first board.
10. The digital temperature sensor testing system according to claim 1, characterized in that: The system also includes a terminal, which is used to display the first temperature data measured by the digital temperature sensor to be tested and received by the first board and the second temperature data measured by the temperature reference sensor, and is used to display the temperature of the constant temperature bath environment provided by the constant temperature bath.
11. The digital temperature sensor testing system according to claim 1, characterized in that: The first board includes: a main controller, a digital communication multi-channel selector and a digital communication level conversion circuit, and the digital communication level conversion circuit is used for communication connection with the digital temperature sensor to be tested and the temperature reference sensor.
12. The digital temperature sensor testing system according to claim 11, characterized in that: The digital communication level conversion circuit includes: a power supply, a first level conversion module and a second level conversion module, wherein the power supply is used to supply power to the first level conversion module and the second level conversion module, the first level conversion module and the second level conversion module are connected in parallel, the first level conversion module is used to perform level conversion on the digital temperature sensor to be tested, and the second level conversion module is used to perform level conversion on the temperature reference sensor.