Aging test lamp holder adaptive to various products
By designing aging test lamp stands that are suitable for a variety of products, the problems of low efficiency and poor safety of traditional test racks are solved, automated and intelligent testing are realized, and lamps of different shapes and sizes are adapted to improve testing efficiency and accuracy.
Patent Information
- Application Number
- CN202421976106.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-15
- Publication Date
- 2025-07-04
- Estimated Expiration
- 2034-08-15
AI Technical Summary
The aging test rack of traditional lamps is inefficient, and relying on manual operations is prone to missed detection and misjudgment, poor safety and poor adaptability, and cannot meet the testing needs of different types of lamps at the same time.
Design an aging test lamp holder suitable for a variety of products, including aging test area for strip lights, spherical lights and disc lights. By adjusting the installation base distance and layered voltage simulation area, automated and intelligent testing can be achieved.
Improves testing efficiency and safety, reduces production and maintenance costs, and can accurately evaluate the performance and durability of lamps in a variety of voltage environments.
Smart Images
Figure CN223065363U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of lamp testing, and particularly to an aging test lamp holder suitable for multiple products. Background Art
[0002] Traditional lamp aging test racks have some limitations, which are mainly manifested in the following aspects: First, they usually rely on manual operation to turn on and off the power supply to meet the test requirements, which is not only inefficient, but also prone to missed inspections and misjudgments during large-scale tests or holidays. Second, traditional test racks need to be manually inspected and recorded regularly, which not only increases the workload, but also may pose safety risks in a high-temperature and airtight test environment. In addition, the existing test rack products have poor adaptability and cannot meet the test requirements of different types of lamps at the same time, which limits their application scope and flexibility. Therefore, improving the design of these test racks and enhancing the level of automation and intelligence are of great significance for improving test efficiency and safety. Content of the Utility Model
[0003] I. Technical Problems to be Solved
[0004] Aiming at the above-mentioned defects existing in the prior art, the utility model particularly provides an aging test lamp holder suitable for multiple products, which solves the problems of low test efficiency and safety of the existing design.
[0005] II. Technical Solutions
[0006] To solve the above technical problems, the utility model provides an aging test lamp holder suitable for multiple products, which includes a strip lamp aging test area, a spherical lamp aging test area, and a disc lamp aging test area. The strip lamp aging test area includes a first mounting base and a second mounting base provided on the aging test lamp holder. A moving block is provided at the bottom of the second mounting base, and a moving groove adapted to the model of the moving block is opened on the aging test lamp holder. The second mounting base moves along the long side direction of the moving groove through the moving block to adjust the distance between the first mounting base and the second mounting base to accommodate strip lamps of different lengths. The spherical lamp aging test area includes a lamp socket provided on the aging test lamp holder. The lamp socket is located above the strip lamp aging test area and is used for mounting spherical lamps. The disc lamp aging test area is used for the aging test of disc lamps.
[0007] Preferably, the aging test lamp holder is divided into four layers, which are a low-voltage environment simulation area, an atmospheric pressure environment simulation area, a high-voltage environment simulation area, and a direct current environment simulation area from bottom to top.
[0008] Preferably, a plurality of power supplies are provided on the aging test lamp holder, and the power supplies are connected to the second mounting base and the disc lamp through wires.
[0009] Preferably, the aging test area for disc lights includes a support frame provided on the aging test lamp rack, and a limiting rod for preventing the disc lights from falling off is provided at the center of the support frame.
[0010] Preferably, a display screen is provided on the side of the aging test lamp rack, and the display screen shows the test cycle, voltage magnitude, set time, and lamp state information.
[0011] Preferably, a switch button for controlling the opening and closing of the entire device is provided on the side of the aging test lamp rack.
[0012] III. Beneficial Effects
[0013] Compared with the prior art, the utility model significantly improves the applicability and flexibility of the test lamp rack by designing a multi-functional aging test lamp rack with a strip lamp aging test area, a spherical lamp aging test area, and a disc lamp aging test area. This design allows the lamp rack to adapt to lamps of different shapes and sizes. By adjusting the distance between the mounting bases and using specific mounting seats, it ensures that the lamps can be aged tested at appropriate positions. This not only reduces the need to design test equipment separately for different lamp types, but also reduces production and maintenance costs, while improving test efficiency.
[0014] Furthermore, through the layered structure design, including low-voltage, normal-pressure, high-voltage, and direct-current environment simulation areas, the working states of lamps under various voltage environments can be simulated. This multi-environment simulation ability enables the lamps to be tested at multiple voltage levels close to actual application conditions, thus more accurately evaluating the performance and durability of the lamps. This helps to promptly discover potential design defects or manufacturing problems, ensuring the reliability and safety of the lamps in actual use. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 is a three-dimensional schematic diagram of an aging test lamp rack adapted to multiple products.
[0016] Figure 2 is a three-dimensional schematic diagram of an aging test lamp rack adapted to multiple products from a bottom-up perspective.
[0017] Figure 3 is a three-dimensional schematic diagram of the internal structure of an aging test lamp rack adapted to multiple products.
[0018] Figure 4 is a three-dimensional schematic diagram of the internal structure of the device from the perspective of the disc lamp aging test area of an aging test lamp rack adapted to multiple products.
[0019] Figure 5 is an aging test lamp rack adapted to multiple products Figure 4 Local enlarged view at A in
[0020] Figure 6It is a schematic diagram of component disassembly of the long-strip lamp aging test area of an aging test lamp holder adapted to multiple products.
[0021] In the figure:
[0022] 1 is the long-strip lamp aging test area; 11 is the first mounting base; 12 is the second mounting base; 121 is the moving block; 122 is the moving slot; 2 is the spherical lamp aging test area; 21 is the lamp holder; 3 is the disc lamp aging test area; 31 is the support frame; 32 is the limiting rod; 4 is the low-pressure environment simulation area; 5 is the normal-pressure environment simulation area; 6 is the high-pressure environment simulation area; 7 is the direct-current environment simulation area; 8 is the power supply; 81 is the electric wire; 9 is the display screen; 10 is the switch button. Specific implementation manners
[0023] The following will further describe in detail the specific implementation manners of the present utility model in conjunction with the accompanying drawings and embodiments. The following embodiments are used to illustrate the present utility model, but cannot be used to limit the scope of the present utility model.
[0024] Embodiment 1:
[0025] As Figures 1-6 shown, the aging test lamp holder adapted to multiple products in this embodiment includes a long-strip lamp aging test area 1, a spherical lamp aging test area 2, and a disc lamp aging test area 3. The long-strip lamp aging test area 1 includes a first mounting base 11 and a second mounting base 12 provided on the aging test lamp holder. A moving block 121 is provided at the bottom of the second mounting base 12. A moving slot 122 adapted to the model of the moving block 121 is opened on the aging test lamp holder. The second mounting base 12 moves along the long side direction of the moving slot 122 through the moving block 121 to adjust the distance between the first mounting base 11 and the second mounting base 12 to accommodate long-strip lamps of different lengths. The spherical lamp aging test area 2 includes a lamp holder 21 provided on the aging test lamp holder. The lamp holder 21 is located above the long-strip lamp aging test area 1 and is used for the installation of spherical lamps. The disc lamp aging test area 3 is used for the aging test of disc lamps.
[0026] The bulb models applicable to existing aging test racks are relatively single. In this utility model, the aging test lamp rack mainly consists of three test areas: the strip lamp aging test area 1, the spherical lamp aging test area 2, and the disc lamp aging test area 3. The strip lamp aging test area 1 has two mounting bases, namely the first mounting base 11 and the second mounting base 12. These two bases are installed on the aging test lamp rack and are used to fix strip lamps. To accommodate strip lamps of different lengths, a moving block 121 is provided at the bottom of the second mounting base 12, and a moving slot 122 adapted to the model of the moving block 121 is provided on the aging test lamp rack. By moving the moving block 121 along the long side direction in the moving slot 122, the distance between the first and second mounting bases 12 can be adjusted to accommodate strip lamps of different lengths. The spherical lamp aging test area 2 includes a lamp socket 21 provided above the strip lamp aging test area 1, which is specifically used for the installation and testing of spherical lamps. Finally, the disc lamp aging test area 3 is a test area designed for disc-shaped lamps and is used for the aging test of these lamps. The design of the entire aging test lamp rack allows it to adapt to a variety of lamps of different shapes and sizes. By adjusting the distance between the mounting bases and using specific mounting seats, it is ensured that the lamps can be aged tested in the appropriate positions. Such a design improves the flexibility and efficiency of the test and can meet the test requirements of different types of lamps.
[0027] As Figure 1 shown, the aging test lamp rack is divided into four layers, from bottom to top are the low-voltage environment simulation area 4, the normal-pressure environment simulation area 5, the high-voltage environment simulation area 6, and the direct-current environment simulation area 7. The working principle of the aging test lamp rack involves its layered structure and voltage area settings. The aging test lamp rack is designed as a four-layer structure, and each layer simulates a different voltage environment to meet the test requirements of lamps under different voltage conditions. From bottom to top, the first layer is the low-voltage environment simulation area 4, which is used to test the performance of lamps under conditions lower than the standard voltage; the second layer is the normal-pressure environment simulation area 5, which simulates the standard voltage environment and is used for conventional aging tests; the third layer is the high-voltage environment simulation area 6, which is used to test the tolerance and performance of lamps under conditions higher than the standard voltage; the topmost layer is the direct-current environment simulation area 7, which is specifically used to test the working state of lamps under the condition of a direct-current power supply 8. Each layer is equipped with a corresponding power supply 8 and a control system to ensure that the lamps can be tested under the set voltage conditions.
[0028] As Figures 3-6 shown, several power supplies 8 are provided on the aging test lamp rack. The power supplies 8 are connected to the second mounting base 12 and the disc lamp through wires 81, which can test the stability of the lamps under the standard voltage and can also simulate the influence of voltage fluctuations or frequency changes on the performance of the lamps. The fast adjustment function of the power supply 8 means that the voltage and frequency settings can be quickly switched at different test stages, thereby saving test time and improving test efficiency.
[0029] As Figure 4 shown, the disc lamp aging test area 3 includes a support frame 31 provided on the aging test lamp rack. At the center position of the support frame 31, there is a limiting rod 32 to prevent the disc lamp from falling off. On the aging test lamp rack, several support frames 31 are equipped in the disc lamp aging test area 3. The support frame 31 is used to fix the disc lamp to ensure its stable placement during the test. A limiting rod 32 is specially designed at the center position of the support frame 31. Its function is to prevent the disc lamp from falling off or shifting due to vibration or other external forces during the test, and at the same time reduce the test interruption or error caused by the displacement or falling off of the lamp, improving the reliability and accuracy of the test. Through the combined use of the support frame 31 and the limiting rod 32, the aging test lamp rack can provide a stable test platform for the disc lamp to meet different test requirements.
[0030] Embodiment 2:
[0031] Compared with Embodiment 1, as Figure 1 shown, in this embodiment, a display screen 9 is provided on the side of the aging test lamp rack. The display screen 9 displays the test cycle, voltage magnitude, set time, and lamp state information. The function of this display screen 9 is to display the key parameters and state information during the test in real time, providing intuitive feedback to the test personnel. It can conveniently obtain the test data and make adjustments or evaluations in a timely manner, thereby improving the efficiency and accuracy of the aging test. A switch button 10 for controlling the opening and closing of the entire device is provided on the side of the aging test lamp rack.
[0032] The above is only the preferred embodiment of the present utility model. It should be noted that for those of ordinary skill in the art in this technical field, without departing from the technical principle of the present utility model, several improvements and refinements can still be made, and these improvements and refinements should also be regarded as the protection scope of the present utility model.
Claims
1. An aging test lamp holder adapted to multiple products, characterized in that The aging test lamp holder adapted to multiple products includes a strip lamp aging test area (1), a spherical lamp aging test area (2), and a disc lamp aging test area (3); The strip lamp aging test area (1) includes a first mounting base (11) and a second mounting base (12) provided on the aging test lamp holder. A moving block (121) is provided at the bottom of the second mounting base (12). A moving groove (122) adapted to the model of the moving block (121) is opened on the aging test lamp holder. The second mounting base (12) moves along the long side direction of the moving groove (122) through the moving block (121) to adjust the distance between the first mounting base (11) and the second mounting base (12) to accommodate strip lamps of different lengths. The spherical lamp aging test area (2) includes a lamp socket (21) provided on the aging test lamp holder. The lamp socket (21) is located above the strip lamp aging test area (1). The lamp socket (21) is used for the installation of spherical lamps. The disc lamp aging test area (3) is used for the aging test of disc lamps.
2. The aging test lamp holder adapted to multiple products according to claim 1, wherein, The aging test lamp holder is divided into four layers, which are a low-voltage environment simulation area (4), an atmospheric pressure environment simulation area (5), a high-voltage environment simulation area (6), and a direct current environment simulation area (7) from bottom to top.
3. The aging test lamp holder adapted to multiple products according to claim 1, wherein, A number of power supplies (8) are provided on the aging test lamp holder. The power supplies (8) are connected to the second mounting base (12) and the disc lamp through wires (81).
4. The aging test lamp holder adapted to multiple products according to claim 1, characterized in that The disc lamp aging test area (3) includes a support frame (31) provided on the aging test lamp holder. A limiting rod (32) for preventing the disc lamp from falling off is provided at the central position of the support frame (31).
5. The aging test lamp holder adaptable to multiple products according to claim 1, wherein A display screen (9) is provided on the side of the aging test lamp holder. The display screen (9) displays the test cycle, voltage magnitude, set time, and lamp state information.
6. The aging test lamp holder adapted to multiple products according to claim 1, characterized in that, A switch button (10) for controlling the opening and closing of the entire device is provided on the side of the aging test lamp holder.