Testing device for testing BMS charging indicator lamp function

By simplifying the function test of BMS charging indicator lights using microcontroller counters and display screens, the problems of high costs and rework risks in the existing technology are solved, and a low-cost and efficient testing method is realized.

CN223092110UActive Publication Date: 2025-07-11HEFEI GUOXUAN HIGH TECH POWER ENERGY
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Patent Information

Application Number
CN202421972982.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-13
Publication Date
2025-07-11
Estimated Expiration
2034-08-13

AI Technical Summary

Technical Problem

In the prior art, BMS charging indicator function testing requires expensive equipment and high labor costs, and the cost of rework and modification after loading is high.

Method used

The microcontroller counter and display screen are used to connect the positive and negative ends of the BMS to be tested to capture signal level changes, and use LED lights and display screens to display test results to simplify the structure of the test device.

Benefits of technology

It reduces the cost of testing equipment and labor, improves testing efficiency, quickly determines test results, and reduces the risk of rework.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a testing device for testing the function of a BMS charging indicating lamp, which comprises a single chip microcomputer counter and a display screen connected with the single chip microcomputer counter, and the positive / negative electrode pin of the single chip microcomputer counter is respectively connected to the positive / negative electrode end of a tested BMS; the value mapped to the single-chip microcomputer counter in one period is equal to the instant count value of the single-chip microcomputer counter at the high and low levels of the signal; the method comprises the following steps: configuring a single-chip microcomputer counter: in a period, when a signal is changed from a low level to a high level, triggering interruption, storing a value of the single-chip microcomputer counter into a first register to be 1, and then resetting a count value of the single-chip microcomputer counter; when the signal is changed from the high level to the low level, the interruption is triggered, the count value of the single-chip microcomputer counter is stored in the second register and is 2, and the count value is not reset; according to the testing device, the operation efficiency is improved, and the testing time is saved.
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Description

Technical Field

[0001] The utility model relates to the technical field of new energy, in particular to a test device for testing the function of a BMS charging indicator light. Background Art

[0002] Currently, the functions of BMS testing are becoming more and more comprehensive, including the testing of the function of the BMS charging indicator light, including the status of the indicator light (always on or always off) and different flashing frequencies. For the function test of the BMS function indicator light, before the product is installed on the actual vehicle, a PWM acquisition board or an oscilloscope is required for testing. The required equipment is expensive, and the tester needs to be able to operate the above precision instruments proficiently. The testing equipment cost and labor cost are expensive.

[0003] If the test is not carried out before installation and is carried out after installation, and if there are problems, rework and modification are required, which requires additional costs. Summary of the Utility Model

[0004] Based on the technical problems existing in the background art, the utility model proposes a test device for testing the function of a BMS charging indicator light, which improves the operation efficiency and saves the test time.

[0005] The test device for testing the function of a BMS charging indicator light proposed by the utility model includes a single microcontroller counter and a display screen connected to the microcontroller counter. The positive / negative pins of the microcontroller counter are respectively connected to the positive / negative terminals of the BMS to be tested; the value mapped to the microcontroller counter in one cycle is equal to the instantaneous count value of the microcontroller counter at the moment of the high and low levels of the signal.

[0006] Further, the single microcontroller counter is configured as follows: in one cycle, when the signal changes from low level to high level, an interrupt is triggered, and the value of the microcontroller counter is saved to the first register, which is value 1, and then the count value of the microcontroller counter is cleared; when the signal changes from high level to low level, an interrupt is triggered, and the count value of the microcontroller counter is saved to the second register, which is value 2, and the count value is not cleared.

[0007] Further, it further includes an LED lamp, and both ends of the LED lamp are respectively connected to the positive terminal and the negative terminal of the BMS to be tested.

[0008] Further, the microcontroller counter, the display screen, and the LED lamp are respectively connected to the BMS to be tested through connecting wires; or

[0009] The microcontroller counter, the display screen, and the LED lamp are respectively connected to the BMS to be tested through the printed circuits on the PCB board.

[0010] Further, it further includes a housing, and the microcontroller counter, the display screen, and the LED lamp are respectively arranged in the housing.

[0011] A test device for testing the charging indicator function of a BMS, comprising a single-chip microcomputer counter group and a display screen connected to the single-chip microcomputer counter group. The positive / negative pins of the single-chip microcomputer counter group are respectively connected to the positive / negative terminals of the BMS to be tested; the value mapped to the single-chip microcomputer counter group in one cycle is equal to the sum of the count values of a set number of single-chip microcomputers in the single-chip microcomputer counter group at the moment when the signal changes from low level to high level and the count values of another set number of single-chip microcomputers at the moment when the signal changes from high level to low level.

[0012] Further, when the single-chip microcomputer counter group includes two single-chip microcomputers;

[0013] Configure one of the single-chip microcomputers in the single-chip microcomputer counter group: in one cycle, when the signal changes from high level to low level, trigger acquisition, clear the count value of the single-chip microcomputer counter, when the signal changes from low level to high level, trigger an interrupt, save the value of the single-chip microcomputer counter to the register, which is 3, and then the count value of the single-chip microcomputer counter is not cleared;

[0014] Configure the other single-chip microcomputer in the single-chip microcomputer counter group: in one cycle, when the signal changes from low level to high level, trigger acquisition, clear the count value of the single-chip microcomputer counter, when the signal changes from high level to low level, trigger an interrupt, save the value of the single-chip microcomputer counter to the register, which is 4, and then the count value of the single-chip microcomputer counter is not cleared.

[0015] The advantages of a test device for testing the charging indicator function of a BMS provided by the present utility model are as follows: The test device for testing the charging indicator function of a BMS provided in the structure of the present utility model has a low manufacturing cost and a simple connection. By leaving positive and negative wiring pins, directly connect the positive and negative pins of the charging indicator of the BMS to be tested. After connecting the pins, turn on the charging indicator function of the BMS. At this time, the LED on the test device can show whether it is on, off, or flashing. In addition, the display screen will show the corresponding frequency and duty cycle; it can quickly compare whether the test result is consistent with the design result; the test operation is efficient and convenient, the result comparison is simple and clear, improving the operation efficiency and saving the test time. Description of the Drawings

[0016] Figure 1 It is a schematic structural diagram of the present utility model;

[0017] Figure 2 It is a schematic diagram of the cycle division during the capture measurement of a single single-chip microcomputer;

[0018] Figure 3 It is a schematic diagram of the cycle division during the capture measurement of one of the single-chip microcomputers in the single-chip microcomputer counter group;

[0019] Figure 4 Schematic diagram of cycle division during the capture measurement of another single-chip microcomputer in the single-chip microcomputer counter group;

[0020] Among them, 1 - single-chip microcomputer counter, 2 - display screen, 3 - BMS under test, 4 - LED lamp, 5 - PCB board, 6 - housing, 7 - positive connection wire, 8 - negative connection wire. Specific implementation manners

[0021] Next, the technical solution of the present utility model will be described in detail through specific embodiments. Many specific details are set forth in the following description in order to fully understand the present utility model. However, the present utility model can be implemented in many other ways different from those described herein. Those skilled in the art can make similar improvements without departing from the connotation of the present utility model. Therefore, the present utility model is not limited by the specific implementations disclosed below.

[0022] Embodiment 1

[0023] As Figures 1 to 4 shown, a test device for testing the charging indicator function of a BMS proposed by the present utility model includes a single single-chip microcomputer counter 1, a display screen 2 connected to the single-chip microcomputer counter 1, an LED lamp 4, a PCB board 5, and a housing 6. The positive / negative pins of the single-chip microcomputer counter 1 are respectively connected to the positive / negative terminals of the BMS 3 under test. The two ends of the LED lamp 4 are respectively connected to the positive terminal and the negative terminal of the BMS 3 under test. The single-chip microcomputer counter 1, the display screen 2, and the LED lamp 4 are respectively arranged in the housing 6; the single-chip microcomputer counter 1, the display screen 2, and the LED lamp 4 are respectively connected to the BMS 3 under test through connection wires; alternatively, the single-chip microcomputer counter 1, the display screen 2, and the LED lamp 4 are respectively connected to the BMS 3 under test through the printed circuits on the PCB board 5, and the positive and negative pins are led out from the housing 6 to be connected to the charging indicator pins of the BMS 3 under test. The housing 6 can be made of various materials, such as metal or non-metal, transparent or opaque materials.

[0024] In this embodiment, according to the schematic diagram of the principle of the test device for the charging indicator function of the BMS 3 under test as Figure 1 shown, the test tooling is built. Among them, the single-chip microcomputer counter 1 uses an STM32 single-chip microcomputer, and other single-chip microcomputers can also be used as long as the functions of this embodiment can be achieved.

[0025] As Figure 2The single-chip microcomputer counter 1 is configured as follows: In one cycle, when the signal changes from low level to high level (rising edge), an interrupt is triggered, the value of the single-chip microcomputer counter 1 is saved to the first register, which is value 1, and then the count value of the single-chip microcomputer counter 1 is cleared; when the signal changes from high level to low level (falling edge), an interrupt is triggered, the count value of the single-chip microcomputer counter 1 is saved to the second register, which is value 2, and the count value is not cleared.

[0026] Set the operation steps. In one cycle, the value mapped to the single-chip microcomputer counter 1 is equal to the count value of the single-chip microcomputer counter 1 at the moment when the signal changes from low level to high level (value 1). Therefore, the frequency of the charging indicator light of the measured BMS3 is equal to the frequency of the STM32 single-chip microcomputer / (value 1), and the duty cycle of the charging indicator light of the measured BMS3 = (value 2) / (value 1). Transmit the result of the operation to the display screen 2.

[0027] By observing the state of the LED light 4 and the value displayed on the display screen 2, the functional parameters of the charging indicator light of the measured BMS3 can be obtained, and then by comparing with the design value, the test result can be quickly determined.

[0028] Embodiment 2

[0029] As Figure 1 and 3 shown, a test device for testing the function of the BMS charging indicator light includes a single-chip microcomputer counter group, a display screen 2 connected to the single-chip microcomputer counter group, an LED light 4, a PCB board 5, and a housing 6. The positive / negative pins of the single-chip microcomputer counter group are respectively connected to the positive / negative terminals of the measured BMS3. The two ends of the LED light 4 are respectively connected to the positive terminal and the negative terminal link of the measured BMS3. The single-chip microcomputer counter group, the display screen 2, and the LED light 4 are respectively arranged in the housing 6; the single-chip microcomputer counter group, the display screen 2, and the LED light 4 are respectively connected to the measured BMS3 through connecting wires; or, the single-chip microcomputer counter group, the display screen 2, and the LED light 4 are respectively connected to the measured BMS3 through the printed circuits on the PCB board 5, and the positive and negative pins are led out from the housing 6 to be connected to the charging indicator light pins of the measured BMS3.

[0030] The difference between Embodiment 1 and Embodiment 2 is that: Embodiment 1 uses a single single-chip microcomputer (single-chip microcomputer counter) to capture measurement data, and Embodiment 2 uses multiple single-chip microcomputers (single-chip microcomputer counter group) to capture measurement data.

[0031] In this embodiment, according to the schematic diagram of the principle of the test device for the function of the BMS3 charging indicator light as Figure 1 shown, the test tooling is built. Here, the single-chip microcomputer counter group is described with two single-chip microcomputer counters. The single-chip microcomputer counter group uses two identical STM32 single-chip microcomputers, and other single-chip microcomputers can also be used as long as the functions of this embodiment can be achieved.

[0032] When the single-chip microcomputer counter group includes two single-chip microcomputer counters;

[0033] Such as Figure 3 Configure one of the single-chip microcomputer counters in the single-chip microcomputer counter group: In one cycle, when the signal changes from high level to low level (falling edge), trigger the acquisition, clear the count value of the single-chip microcomputer counter, when the signal changes from low level to high level (rising edge), trigger an interrupt, save the value of the single-chip microcomputer counter to the register, the value is 3, then the count value of the single-chip microcomputer counter is not cleared, in the next cycle, when another falling edge arrives, repeat the previous operation;

[0034] Such as Figure 4 As shown, configure the other single-chip microcomputer counter in the single-chip microcomputer counter group: In one cycle, when the signal changes from low level to high level, trigger the acquisition, clear the count value of the single-chip microcomputer counter, when the signal changes from high level to low level, trigger an interrupt, save the value of the single-chip microcomputer counter to the register, the value is 4, then the count value of the single-chip microcomputer counter is not cleared, in the next cycle, when another rising edge arrives, repeat the previous operation.

[0035] Set the operation steps. In one cycle, the value mapped to the single-chip microcomputer counter group is equal to the sum of the count values (value 3) of the set number of single-chip microcomputer counters in the single-chip microcomputer counter group at the moment when the signal changes from low level to high level and the count values (value 4) of another set number of single-chip microcomputer counters at the moment when the signal changes from high level to low level. Therefore, the frequency of the charging indicator of the measured BMS3 is equal to the frequency of the STM32 single-chip microcomputer / (value 3 + value 4), and the duty cycle of the charging indicator of the measured BMS3 = (value 4) / (value 3 + value 4). Transmit the result of the operation to the display screen.

[0036] In one cycle, the value mapped to the single-chip microcomputer counter group is equal to the sum of the count values of the set number of single-chip microcomputer counters in the single-chip microcomputer counter group at the moment when the signal changes from low level to high level and the count values of another set number of single-chip microcomputer counters at the moment when the signal changes from high level to low level.

[0037] By observing the state of LED lamp 4 and the value displayed on the display screen 2, the functional parameters of the charging indicator of the measured BMS3 can be obtained, and then by comparing with the design value, the test result can be quickly determined.

[0038] The connection lines in Embodiment 1 and Embodiment 2 are described as follows. One end of the LED lamp 4 is connected to the positive pin of the charging indicator of the BMS 3 under test through the positive connection line 7, and the other end of the LED lamp 4 is connected to the negative pin of the charging indicator of the BMS 3 under test through the negative connection line 8. One end of the single-chip microcomputer counter 1 or the single-chip microcomputer counter group is connected to the positive pin of the charging indicator of the BMS 3 under test through the positive connection line 7, and one end of the single-chip microcomputer counter or the single-chip microcomputer counter group is connected to the negative pin of the charging indicator of the BMS 3 under test through the negative connection line 8. The single-chip microcomputer counter 1 or the single-chip microcomputer counter group is connected to the display screen 2 through a communication line. One end of the display screen 2 is connected to the output end of the single-chip microcomputer counter or the single-chip microcomputer counter group, and the other end is connected to the negative pin of the charging indicator of the BMS 3 under test through the negative connection line 8.

[0039] The printed circuits on the PCB board 5 in Embodiment 1 and Embodiment 2 are also printed by the above connection method, except that one is in the form of an external cable, and the PCB board 5 is in the form of cable embedding. The functions achieved by both are the same.

[0040] From the above embodiments, it can be concluded that in this embodiment, the positive and negative pins can be led out from the housing 6 to be connected to the pins of the charging indicator of the BMS 3 under test. After the connection, the charging indicator function of the BMS 3 under test is started, and the test device automatically tests and displays the test results. Compared with the existing method of collecting and analyzing through a PWM board or an oscilloscope, the test operation efficiency is improved, and the test time and labor costs are greatly saved. At the same time, compared with testing after installing on a real vehicle, the risk identification ability is greatly improved, and the rework cost is reduced. In addition, in this embodiment, common electronic components such as the LED lamp 4, the single-chip microcomputer counter (group), and the display screen have low material costs, the device principle is simple, and it can be quickly assembled and put into work.

[0041] The above is only a preferred specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention, according to the technical solution and the inventive concept of the present invention, makes equivalent substitutions or changes, and all should be covered by the protection scope of the present invention.

Claims

1. A test device for testing the function of the BMS charging indicator light, characterized in that, It includes a single microcontroller counter (1) and a display screen (2) connected to the microcontroller counter (1). The positive / negative pins of the microcontroller counter (1) are respectively connected to the positive / negative terminals of the BMS (3) to be measured. The value mapped to the microcontroller counter (1) in one cycle is equal to the count value of the microcontroller counter (1) at the moment when the signal changes from high level to low level.

2. The test device for testing the BMS charging indicator function according to claim 1, characterized in that, Configure the single microcontroller counter (1): In one cycle, when the signal changes from low level to high level, an interrupt is triggered, and the value of the microcontroller counter (1) is saved to the first register, which is value 1. Then the count value of the microcontroller counter (1) is cleared. When the signal changes from high level to low level, an interrupt is triggered, and the count value of the microcontroller counter (1) is saved to the second register, which is value 2, and the count value is not cleared.

3. The test device for testing the BMS charging indicator function according to claim 1, characterized in that, It also includes an LED lamp (4). The two ends of the LED lamp (4) are respectively connected to the positive terminal and the negative terminal of the BMS (3) to be measured.

4. The test device for testing the BMS charging indicator function according to claim 3, characterized in that, The microcontroller counter (1), the display screen (2), and the LED lamp (4) are respectively connected to the BMS (3) to be measured through connecting wires; or The microcontroller counter (1), the display screen (2), and the LED lamp (4) are respectively connected to the BMS (3) to be measured through the printed circuits on the PCB board (5).

5. The test device for testing the BMS charging indicator function according to claim 3, characterized in that It also includes a housing (6). The microcontroller counter (1), the display screen (2), and the LED lamp (4) are respectively arranged in the housing (6).

6. A test device for testing the function of the BMS charging indicator light, characterized in that, It includes a group of microcontroller counters and a display screen (2) connected to the group of microcontroller counters. The positive / negative pins of the group of microcontroller counters are respectively connected to the positive / negative terminals of the BMS (3) to be measured. The value mapped to the group of microcontroller counters in one cycle is equal to the sum of the count values of a set number of microcontroller counters in the group of microcontroller counters at the moment when the signal changes from low level to high level and the count values of another set number of microcontroller counters at the moment when the signal changes from high level to low level.

7. The test device for testing the BMS charging indicator function according to claim 6, wherein, When the group of microcontroller counters includes two microcontroller counters; Configure one of the microcontroller counters in the group of microcontroller counters: In one cycle, when the signal changes from high level to low level, acquisition is triggered, and the count value of the microcontroller counter is cleared. When the signal changes from low level to high level, an interrupt is triggered, and the value of the microcontroller counter is saved to the register, which is value 3. Then the count value of the microcontroller counter is not cleared; Configure the other microcontroller counter in the group of microcontroller counters: In one cycle, when the signal changes from low level to high level, acquisition is triggered, and the count value of the microcontroller counter is cleared. When the signal changes from high level to low level, an interrupt is triggered, and the value of the microcontroller counter is saved to the register, which is value 4. Then the count value of the microcontroller counter is not cleared.

8. The test device for testing the BMS charging indicator function according to claim 7, wherein, The group of microcontroller counters, the display screen (2), and the LED lamp (4) are respectively connected to the BMS (3) to be measured through connecting wires; or The group of microcontroller counters, the display screen (2), and the LED lamp (4) are respectively connected to the BMS (3) to be measured through the printed circuits on the PCB board (5).

9. The test device for testing the BMS charging indicator function according to claim 7, characterized in that, It also includes a housing (6). The group of microcontroller counters, the display screen (2), and the LED lamp (4) are respectively arranged in the housing (6).