Low-temperature cylindrical cavity resistivity testing device
By designing a low-temperature cylindrical resonant cavity test system for multiple samples switching, the problem of cavity size changes and difficult samples to replace in a variable temperature environment is solved, and real-time calibration of samples and high-efficiency resistivity testing of samples in a low temperature environment is achieved.
Patent Information
- Application Number
- CN202422669401.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-04
- Publication Date
- 2025-08-22
- Estimated Expiration
- 2034-11-04
AI Technical Summary
In a temperature variable environment, when the existing resonance method measures the resistivity of the material, changes in the cavity size lead to large calibration errors, and the samples are difficult to replace in real time, affecting the testing accuracy and efficiency.
Design a low-temperature cylindrical resonant cavity test system for multi-sample switching, which can realize the switching and calibration of samples in low-temperature environments through lifting and rotating platforms, combine the window of transparent insulation materials to ensure the accuracy of the test, and use nitrogen to control the low-temperature environment.
Real-time calibration and multi-sample testing of samples under variable temperature environments are realized, reducing the calibration error of room temperature and improving the testing accuracy and efficiency.
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Figure CN223259779U_ABST
Abstract
Description
Technical Field
[0001] The invention discloses a low-temperature cylindrical cavity resistivity testing device, which relates to the field of electromagnetic characteristic parameter testing, and in particular to a low-temperature testing system for a cylindrical resonant cavity. Background Art
[0002] With the development of society and the advancement of science and technology, the electromagnetic parameter testing of materials is becoming increasingly important in military and civilian applications. Among them, the resonance method has attracted much attention in the electromagnetic parameter testing of materials due to its high test accuracy. However, when measuring the resistivity of materials under variable temperature conditions, the resonance method also has its own shortcomings: 1. The resonance method for measuring resistivity usually requires standard sample calibration. The general practice is to calibrate once at room temperature, and then use this calibration state for conductivity testing in a variable temperature environment. This method does not take into account the thermal physical properties of the cavity under a variable temperature environment, resulting in changes in the cavity size under a variable temperature environment. Therefore, the normal temperature calibration state is no longer applicable to the current test environment. 2. Under a variable temperature environment, since the test environment is in a closed adiabatic space, it is difficult to replace the sample. Therefore, real-time calibration under a variable temperature environment is a problem that needs to be solved urgently. Based on the above problems, the present invention is to design a cylindrical resonant cavity resistivity testing device that can be used to achieve free switching of samples in a variable temperature environment. Summary of the Invention
[0003] The purpose of the present invention is to solve the problem that it is difficult to replace samples in a cylindrical resonant cavity under a variable temperature environment. A low-temperature testing system for a cylindrical resonant cavity with multi-sample switching testing is designed, so that the sample can realize the two functions of standard sample calibration and sample resistivity testing in a low-temperature environment, thereby realizing the real-time calibration capability of the sample in a variable temperature environment and realizing the multi-sample testing problem in a low-temperature environment. Therefore, the testing device not only reduces the test error caused by normal temperature calibration, but also improves the resistivity detection efficiency of the sample.
[0004] In order to achieve the above-mentioned purpose of the invention, the technical solution of the present invention is as follows:
[0005] A low temperature cylindrical cavity resistivity test device, as shown in the attached Figure 1As shown, it includes: a sealing cover plate 1, a cylindrical resonant cavity 2, a sealing cover 3, a test sample 6, a turntable frame 7, a rotating platform 8, a lifting platform 9 and an insulating bottom plate 10. The sealing cover plate 1, the sealing cover 3 and the insulating bottom plate 10 are fixed together to form a closed space to provide a low-temperature environment for the sample. The lifting platform 9 is connected to the rotating platform 8, and the rotating platform 8 is fixed to the metal support rod. The metal support rod passes through the insulating bottom plate 10 and is fixed to the turntable frame 7. Therefore, the lifting and rotation of the turntable frame 7 can be achieved by controlling the lifting platform 9 and the rotating platform 8. The upper end of the cylindrical resonant cavity 2 is fixed to the sealing cover plate 1, and the lower end is the test end, which overlaps with the sample and can be used for resistivity testing. The test sample 6 is placed on the turntable frame 7. Therefore, by controlling the lifting and rotation of the test sample 6, the sample switching test of the cylindrical resonant cavity in a low-temperature environment can be achieved.
[0006] As a preferred method, Figure 2 As shown, the turntable rack 7 has a total of 4 sample slots of the same size, which can be used to place 4 samples of the same size, one of which is the short-circuit surface of the cavity to obtain the cavity quality factor of the cylindrical cavity, and one sample is a standard sample with known resistivity for test calibration of the cylindrical cavity method.
[0007] As a preferred method, Figure 1 As shown, the sealing cover 3 has windows 5 and 4. Window 5 is a sample placement window, sealed with transparent insulation material. It is used for placing samples during testing and observing whether the sample overlaps with the lower end of the cylindrical cavity 2 to ensure the accuracy of the test operation. In addition, window 4 is a sampling window, used for sampling during the test process, thereby enabling resistivity testing of multiple samples.
[0008] As a preferred embodiment, the lifting platform 9 is provided with a limit function, which can ensure that the overlap state of the sample with the cylindrical cavity is consistent each time when switching the sample test, thereby helping to improve the stability and repeatability of the test operation.
[0009] As a preferred method, Figure 3 As shown, the sealing cover 3 is provided with nitrogen inlet and outlet 12 and 11, and the internal low temperature can be controlled by controlling the flow rate of nitrogen.
[0010] The present invention provides a low-temperature cylindrical cavity resistivity test device with the following characteristics and beneficial effects:
[0011] 1. The use of a lifting and rotating platform enables the replacement of test samples, which facilitates standard sample calibration testing in a cooling environment, avoiding the problem of excessive errors in using normal temperature calibration data, thereby improving the test accuracy of the resonance method for resistivity;
[0012] Second, a sample placement and sampling window is set on the side of the sealing cover. On the one hand, it can ensure that the test samples can be loaded on site at low temperature, so it can be used for centralized testing of a large number of samples, greatly improving the test efficiency of the test system. On the other hand, the sample placement window is sealed with transparent insulation material, which can be used to observe the sample placement of the system to ensure test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Attachment Figure 1 This is a structural diagram of a low-temperature cylindrical cavity resistivity testing device;
[0014] Attachment Figure 2 Schematic diagram of the test of the sample by the cylindrical resonant cavity;
[0015] Attachment Figure 3 Schematic diagram of the nitrogen inlet and outlet of the test device;
[0016] Among them, 1 is the sealing cover plate, 2 is the cylindrical resonant cavity, 3 is the sealing cover, 4 is the sampling window, 5 is the placement window, 6 is the test sample, 7 is the turntable rack, 8 is the rotating platform, 9 is the lifting platform, 10 is the insulation bottom plate, 11 is the nitrogen inlet, and 12 is the nitrogen outlet. DETAILED DESCRIPTION
[0017] The following describes the embodiments of the present invention through specific examples. Those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.
[0018] A low temperature cylindrical cavity resistivity test device, as shown in the attached Figure 1 As shown, it includes: a sealing cover plate 1, a cylindrical resonant cavity 2, a sealing cover 3, a test sample 6, a turntable frame 7, a rotating platform 8, a lifting platform 9 and an insulating bottom plate 10. The sealing cover plate 1, the sealing cover 3 and the insulating bottom plate 10 are fixed together to form a closed space to provide a low-temperature environment for the sample. The lifting platform 9 is connected to the rotating platform 8, and the rotating platform 8 is fixed to the metal support rod. The metal support rod passes through the insulating bottom plate 10 and is fixed to the turntable frame 7. Therefore, the lifting and rotation of the turntable frame 7 can be achieved by controlling the lifting platform 9 and the rotating platform 8. The upper end of the cylindrical resonant cavity 2 is fixed to the sealing cover plate 1, and the lower end is the test end, which overlaps with the sample and can be used for resistivity testing. The test sample 6 is placed on the turntable frame 7. Therefore, by controlling the lifting and rotation of the test sample 6, the sample switching test of the cylindrical resonant cavity in a low-temperature environment can be achieved.
[0019] Furthermore, as attached Figure 2As shown, the turntable rack 7 has a total of 4 sample slots of the same size, which can be used to place 4 samples of the same size, one of which is the short-circuit surface of the cavity to obtain the cavity quality factor of the cylindrical cavity, and the other sample is a standard sample with known resistivity for test calibration of the cylindrical cavity method.
[0020] Furthermore, as attached Figure 1 As shown, the sealing cover 3 has windows 5 and 4. Window 5 is a sample placement window, sealed with transparent insulation material. It is used for placing samples during testing and observing whether the sample overlaps with the lower end of the cylindrical cavity 2 to ensure the accuracy of the test operation. In addition, window 4 is a sampling window, used for sampling during the test process, thereby enabling resistivity testing of multiple samples.
[0021] Furthermore, the lifting platform 9 is provided with a limit function, which can ensure that the overlap state of the sample and the cylindrical cavity is consistent each time when switching the sample test, thereby helping to improve the stability and repeatability of the test operation.
[0022] Furthermore, as attached Figure 3 As shown, the sealing cover 3 is provided with nitrogen inlet and outlet 12 and 11, and the internal low temperature can be controlled by controlling the flow rate of nitrogen.
[0023] In addition, the present invention tests the resistivity of samples in a low temperature environment as follows:
[0024] 1. Fill the test device with nitrogen and allow the sample to reach the preset temperature. Then rotate the short-circuit metal surface on the turntable to the lower end of the cavity to obtain the cavity quality factor of the cylindrical resonant cavity. Q 0;
[0025] 2. Rotate the standard sample with known resistivity on the turntable to the lower end of the cavity for testing to obtain the calibration quality factor of the cylindrical resonant cavity. Q 1;
[0026] 3. Then rotate the test sample to the lower end of the cavity for testing to obtain the quality factor of the cylindrical resonant cavity after loading the sample. Q 2;
[0027] 4. After obtaining the above test data, the surface resistivity Rs of the sample is calculated as follows:
[0028]
[0029] Where Rs is the resistivity of the test sample, Rs0 and Rs1 are the resistivities of the short-circuit surface and the standard sample, respectively.
Claims
1. A low-temperature cylindrical cavity resistivity test device, comprising: A sealing cover plate (1), a cylindrical resonant cavity (2), a sealing cover (3), a test sample (6), a turntable frame (7), a rotating platform (8), a lifting platform (9) and a heat-insulating bottom plate (10). The sealing cover plate (1), the sealing cover (3) and the heat-insulating bottom plate (10) are fixed together to form a closed space for providing a low-temperature environment for the sample. The lifting platform (9) is connected to the rotating platform (8), and the rotating platform (8) is fixed to a metal support rod. The metal support rod passes through the heat-insulating bottom plate (10) and is fixed to the turntable frame (7). Therefore, the lifting and rotation of the turntable frame (7) can be achieved by controlling the lifting platform (9) and the rotating platform (8). The upper end of the cylindrical resonant cavity (2) is fixed to the sealing cover plate (1), and the lower end is a test end, which overlaps with the sample and can be used for resistivity testing. The test sample (6) is placed on the turntable frame (7). Therefore, by controlling the lifting and rotation of the test sample (6), the sample switching test of the cylindrical resonant cavity in a low-temperature environment can be achieved.
2. A low-temperature cylindrical cavity resistivity testing device according to claim 1, characterized in that: The turntable rack (7) has a total of four sample slots of the same size, which can be used to place four samples of the same size, one of which is the short-circuit surface of the cavity to obtain the cavity quality factor of the cylindrical cavity, and one sample is a standard sample with a known resistivity to be used for test calibration of the cylindrical cavity method.
3. A low-temperature cylindrical cavity resistivity testing device according to claim 1, characterized in that: The sealing cover (3) is provided with a window (5) and a window (4). Window (5) is a sample setting window, which is sealed with a transparent heat-insulating material and is used for setting out samples during the test and observing whether the sample overlaps with the lower end of the cylindrical resonant cavity (2) to ensure the accuracy of the test operation. In addition, window (4) is a sampling window, which is used for sampling during the test process, thereby realizing resistivity testing of multiple samples.
4. A low-temperature cylindrical cavity resistivity testing device according to claim 1, characterized in that: The lifting platform (9) is provided with a limit function, which can ensure that the overlap state of the sample with the cylindrical cavity is consistent each time when switching the sample test, thereby facilitating the improvement of the stability and repeatability of the test operation.
5. A low-temperature cylindrical cavity resistivity testing device according to claim 1, characterized in that: The sealing cover (3) is provided with a nitrogen inlet and outlet, and the internal low temperature can be controlled by controlling the flow rate of the nitrogen.