Electrical performance testing device

Abstract

The utility model discloses an electrical performance testing device, which comprises a host, a first wire harness, a first electronic probe, a second wire harness and a second electronic probe, the first electronic probe comprises a first testing surface, a first probe and a first magnetic piece, and the second electronic probe comprises a second testing surface, a second probe and a second magnetic piece. The end, close to the first testing face, of the first magnetic piece is a first magnetic attraction end, the end, close to the second testing face, of the second magnetic piece is a second magnetic attraction end, and the polarity of the first magnetic attraction end is opposite to that of the second magnetic attraction end. The electrical performance testing device disclosed by the utility model can provide more stable and reliable testing results; the method not only can adapt to detection scenes with large area, large size, thin thickness and flexible rigidity, but also can consider an independent test scene and a matched test scene, is higher in applicability, and can be compatible with various test scenes.

Description

Technical Field

[0001] The utility model relates to the field of electrical performance testing, in particular to an electrical performance testing device. Background Art

[0002] In the electronics sector, standardized requirements exist for various electrical performance characteristics. Testing of internal resistance, voltage, current, and other performance indicators is often required, both before and during the product's lifecycle. Currently, testing the electrical performance of electronic products is performed in specialized locations, such as those with extremely large surfaces, large dimensions, thin and lightweight components, or products with limited rigidity that cannot be bent or damaged.

[0003] Traditional electrical performance testing often uses ordinary handheld probes or clamp-on probes for contact-based electrical performance testing. For test points with very large areas and large dimensions, handheld probes and clamp-on probes cannot simultaneously cover both the front and back sides while ensuring test stability and accuracy. At thin test points or weak rigidity test points, handheld probes or clamp-on probes can easily damage the test points, affecting the performance of the object under test and failing to guarantee test stability and accuracy. In short, ordinary probe testing requires manual maintenance of good contact between the probe and the object under test, while clamp-on probes require the object under test to have a clamping position. Whether ordinary probes or clamp-on probes, when testing extremely large, large, thin, or weak rigidity test points, either cannot reach the test point or are prone to jitter and bending during the test. Furthermore, they cannot effectively contact and fixate flat test points. Handheld probes, in particular, cannot guarantee stable contact during the test process, making stable and accurate measurements impossible, resulting in erroneous measurement data. Clamp-on probes, on the other hand, cannot meet the testing requirements of large, large, and thin test points.

[0004] Therefore, how to ensure that the probe effectively contacts the test point in a test scenario with a large area, large size, thin thickness and weak rigidity, and maintain stable contact during the test process to ensure the stability and validity of the test data is a technical problem that urgently needs to be solved. Summary of the Invention

[0005] The embodiment of the utility model provides an electrical performance testing device to solve the problem that it is difficult to stably and accurately test electrical performance in large-area, large-size, thin-thickness, and weak-rigidity testing scenarios.

[0006] To solve the above technical problems, an embodiment of the present utility model provides an electrical performance testing device, comprising a host, a first wiring harness, a first electronic probe, a second wiring harness, and a second electronic probe, wherein one end of the first wiring harness is used to be electrically connected to the host, and the other end of the first wiring harness is used to be electrically connected to the first electronic probe, one end of the second wiring harness is used to be electrically connected to the host, and the other end of the second wiring harness is used to be electrically connected to the second electronic probe;

[0007] The first electronic probe includes a first test surface, a first probe, and a first magnetic member, wherein a side of the first probe close to the first test surface is used to electrically connect to the component under test; the second electronic probe includes a second test surface, a second probe, and a second magnetic member, wherein a side of the second probe close to the second test surface is used to electrically connect to the component under test;

[0008] One end of the first magnetic member close to the first test surface is a first magnetic end, and one end of the second magnetic member close to the second test surface is a second magnetic end. The polarities of the first magnetic end and the second magnetic end are opposite.

[0009] Optionally, the first magnetic end is an N pole, and the second magnetic end is an S pole.

[0010] Optionally, the first electronic probe is a disc-type probe, the first magnetic part is annular, the first magnetic part is arranged around the first probe, and the first magnetic part is arranged close to the first test surface; the second electronic probe is a disc-type probe, the second magnetic part is annular, the second magnetic part is arranged around the second probe, and the second magnetic part is arranged close to the second test surface.

[0011] Optionally, the first electronic probe includes a first adsorption disk, which is used to be detachably adsorbed and connected to the first test surface; the second electronic probe includes a second adsorption disk, which is used to be detachably adsorbed and connected to the second test surface.

[0012] Optionally, the first electronic probe includes a first disc-shaped handle.

[0013] Optionally, the second electronic probe includes a second disc-type handle.

[0014] Optionally, the first electronic probe includes a first switch button, and the first switch button is used to cut off or connect the electrical connection between the first probe and the first wiring harness.

[0015] Optionally, the first electronic probe includes a first disc-shaped handle, and the first switch button is installed on the first disc-shaped handle.

[0016] Optionally, the first electronic probe includes a first signal receiving component, one end of the first signal receiving component is used to be electrically connected to the first wiring harness, and the other end of the first signal receiving component is electrically connected to the first probe; the second electronic probe includes a second signal receiving component, one end of the second signal receiving component is used to be electrically connected to the second wiring harness, and the other end of the second signal receiving component is electrically connected to the second probe.

[0017] Optionally, the first electronic probe includes a first switch button, and the first switch button is used to cut off or connect the electrical connection between the first signal receiving component and the search first wiring harness.

[0018] The beneficial effect of the present invention is that: by setting a first magnetic part on the first electronic probe and a second magnetic part on the second electronic probe, and the polarities of the first magnetic end of the first magnetic part and the second magnetic end of the second magnetic part are opposite, opposite poles attract each other. During the test, the first magnetic part and the second magnetic part attract each other, so that the first electronic probe and the second electronic probe are respectively placed on both sides of the test point, and the first electronic probe and the second electronic probe are attracted together by gravity; so that the two probes are in contact with the test point while being more firmly and stably sucked together, maintaining the first electronic probe and the second electronic probe in firm contact with the test point, effectively ensuring the stability and accuracy of the test. It can not only adapt to large-area, large-size, thin-thickness, flexible and rigid detection scenarios, but also take into account both individual test scenarios and coordinated test scenarios, with greater applicability and compatibility with multiple test scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0020] Figure 1 This is a schematic diagram of the composition of an electrical performance testing device in one embodiment of the present utility model;

[0021] Figure 2 This is a schematic structural diagram of a first electronic probe in one embodiment of the present utility model;

[0022] Figure 3 This is a schematic diagram of a first electronic probe without a button in one embodiment of the present invention;

[0023] Figure 4 This is a schematic diagram of a first electronic probe with a button in one embodiment of the present invention;

[0024] Figure 5 This is a cross-sectional view of a first electronic probe with a signal collecting component in one embodiment of the present invention;

[0025] Figure 6 This is a schematic diagram of a first electronic probe connecting two wire harnesses in one embodiment of the present invention;

[0026] Figure 7 This is a schematic diagram of a first electronic probe without a handle in one embodiment of the present invention;

[0027] Figure 8 This is a schematic diagram of a triangular first electronic probe in one embodiment of the present invention.

[0028] The reference numerals in the specification are as follows:

[0029] 10. Main unit; 21. First wiring harness; 22. Second wiring harness; 31. First electronic probe; 311. First test surface; 312. First probe; 313. First magnetic component; 314. First magnetic end; 315. First disc handle; 316. First switch button; 317. First signal receiving component; 32. Second electronic probe. DETAILED DESCRIPTION

[0030] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0031] In the description of the present invention, it should be understood that the terms "longitudinal," "radial," "length," "width," "thickness," "upper," "lower," "front," "back," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of the present invention and simplify the description. They do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present invention. In the description of the present invention, unless otherwise specified, "plurality" means two or more.

[0032] In the description of this utility model, it should be noted that, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; direct connections, indirect connections through an intermediate medium, and internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0033] The utility model provides an electrical performance testing device, such as Figures 1 to 8As shown, the device includes a host 10, a first wiring harness 21, a first electronic probe 31, a second wiring harness 22, and a second electronic probe 32. The electrical performance testing device provided by the present invention can be a device for testing one or more of current, resistance, voltage, capacitance, and inductance; wherein the host 10 is a current tester, a resistance tester, or a voltage tester. The host 10 includes a first test interface and a second test interface, which can generally be an input interface and an output interface. The first test interface is electrically connected to the first wiring harness 21, and the second test interface is electrically connected to the second wiring harness 22, forming a conductive loop between the first test interface and the component under test.

[0034] One end of the first wiring harness 21 is electrically connected to the host 10, such as to the first test interface. This electrical connection can be direct or indirect, such as through a switch, which then establishes a conductive connection between the first wiring harness 21 and the host 10 and controls the on / off switching of the electrical connection. The other end of the first wiring harness 21 is electrically connected to the first electronic probe 31, which can also be direct or indirect.

[0035] One end of the second wiring harness 22 is electrically connected to the host 10, such as to the second test port of the host 10. This electrical connection can be direct or indirect. The other end of the second wiring harness 22 is electrically connected to the second electronic probe 32, which can also be direct or indirect.

[0036] In the electrical performance testing device provided by the present invention, the first wiring harness 21 serves as the intermediate electrical conduction wiring harness between the main unit 10 and the first electronic probe 31, and the second wiring harness 22 serves as the intermediate point conduction wiring harness between the main unit 10 and the second electronic probe 32, and the physical connection method thereof is detachable; that is, the connection method includes two states. During the test, the first wiring harness 21 and the second wiring harness 22 serve as the intermediate point conduction wiring harnesses, and are physically connected to the front and rear modules to achieve electrical connection; and when not testing or after the test is completed, the first wiring harness 21 and the second wiring harness 22 can be removed from the electrical performance testing device and can be reassembled during testing.

[0037] The electrical performance testing device provided by the present invention can be assembled into a complete structure, comprising a main unit 10, a first wiring harness 21, a first electronic probe 31, a second wiring harness 22, and a second electronic probe 32. This allows for direct electrical performance testing without requiring assembly. Alternatively, two or more of the main unit 10, the first wiring harness 21, the first electronic probe 31, the second wiring harness 22, and the second electronic probe 32 can be detachable, allowing them to be assembled during testing and disassembled after the test is complete.

[0038] like Figure 2 、 Figure 5 or Figure 7As shown, the first electronic probe 31 includes a first test surface 311, a first probe 312 and a first magnetic member 313. The first probe 312 is close to the first test surface 311 and is used to electrically connect to the component to be tested. Figure 2 As shown, the first test surface 311 is the lower surface of the first electronic probe 31. During testing, the first test surface 311 is attached to the component under test to achieve electrical connection between the first probe 312 and the component under test. The side of the first probe 312 closest to the first test surface 311 is generally exposed and can be flush with the first test surface 311 or protrude from the first test surface 311, so that the first probe 312 can be electrically connected to the component under test when the first test surface 311 is attached to the component under test. Of course, in certain special cases, such as when the test position of the component under test is raised, the side of the first probe 312 closest to the first test surface 311 can also be concave relative to the first test surface 311, so that when the first test surface 311 is attached to the component under test, the first probe 312, which is concave relative to the first test surface 311, can be electrically connected to the raised test position of the component under test.

[0039] The second electronic probe 32 has the same basic structure as the first electronic probe 31, including a second test surface, a second probe and a second magnetic member. The side of the first probe 312 close to the second test surface is used to electrically connect to the component to be tested. It can be understood that the basic structure of the second electronic probe 32 is the same as the basic structure of the first electronic probe 31, and will not be described in detail here. It should be noted that in the embodiment of the present invention, the first electronic probe 31 and the drawings of its detailed structure are used for explanation. The second electronic probe 32 and its detailed structure can refer to the structure of the first electronic probe 31 and its drawings, and will not be described separately. It can be understood by those skilled in the art that the second electronic probe 32 can choose the same structure as the first electronic probe 31, or the first electronic probe 31 and the second electronic probe 32 can adopt different structures (such as Figure 2 and Figure 7 There are two structures) used in combination.

[0040] like Figure 1 and Figure 2As shown, in one embodiment of the present invention, the end of the first magnetic member 313 close to the first test surface 311 is the first magnetic end 314, and the end of the second magnetic member close to the second test surface is the second magnetic end, and the polarity of the first magnetic end 314 and the second magnetic end are opposite. Among them, the second magnetic member has the same basic structure as the first magnetic member 313, and the difference is that the polarity of the first magnetic end 314 and the second magnetic end are opposite. During the test process, the first magnetic end 314 of the first magnetic member 313 and the second magnetic end of the second magnetic member can be arranged relative to each other, and opposite poles attract each other, so that the first electronic probe 31 and the second electronic probe 32 are attracted together, while maintaining good and stable contact between the first probe 312 and the second probe and the component to be tested, ensuring their stable electrical connection.

[0041] By setting a first magnetic part 313 on the first electronic probe 31 and a second magnetic part on the second electronic probe 32, and the polarities of the first magnetic end 314 of the first magnetic part 313 and the second magnetic end of the second magnetic part are opposite, opposite poles attract each other. During the test, the first magnetic part 313 and the second magnetic part attract each other, so that the first electronic probe 31 and the second electronic probe 32 are respectively placed on both sides of the test point, and the first electronic probe 31 and the second electronic probe 32 are attracted together by gravity; so that the two probes are in contact with the test point while being more firmly and stably sucked together, maintaining the first electronic probe 31 and the second electronic probe 32 in firm contact with the test point, effectively ensuring the stability and accuracy of the test. It can not only adapt to large-area, large-size, thin-thickness, flexible and rigid detection scenarios, but also take into account both individual test scenarios and coordinated test scenarios, with greater applicability and compatibility with multiple test scenarios.

[0042] In some scenarios, the first electronic probe 31 and the second electronic probe 32 are used in conjunction with each other. For example, when testing the electrical performance of a large, large, flat PCB or flexible circuit board, the first electronic probe 31 and the second electronic probe 32 need to be placed on the front and back large side surfaces of the PCB or flexible circuit board, respectively. In particular, when the positions of the components to be tested on the front and back overlap on the large surface, the first electronic probe 31 can be placed on the front of the large surface and the second electronic probe 32 on the side of the large surface. In this way, the first electronic probe 31 and the second electronic probe 32 are attracted together by the first magnetic member 313 and the second magnetic member, allowing for accurate and stable testing of electrical performance.

[0043] In other scenarios, such as when two positive and negative test points are located at different positions far apart on the same plane, the first electronic probe 31 and the second electronic probe 32 are magnetic themselves and can also be used separately; a separate metal part is placed at the test station, and the first electronic probe 31 or the second electronic probe 32 is attracted to the metal part to stably detect electrical performance.

[0044] In one embodiment of the present invention, the first magnetic end 314 is an N pole and the second magnetic end is an S pole; similarly, the first magnetic end 314 can also be an S pole and the second magnetic end can be an N pole, as long as the polarities of the first magnetic end 314 and the second magnetic end are opposite.

[0045] like Figure 2 or Figure 7 As shown, the first electronic probe 31 is a disc-type probe, and the first magnetic member 313 is annular. The first magnetic member 313 is arranged around the first probe 312, and the first magnetic member 313 is arranged close to the first test surface 311. This ensures that the first magnetic member 313 has good magnetism on the first test surface 311, thereby providing a stronger and more stable attraction, further improving the stability of the test.

[0046] Similarly, the second electronic probe 32 can also be a disc-type probe, with the second magnetic member being annular, surrounding the second probe, and close to the second test surface. Its mechanism of action and efficacy are the same as those of the first electronic probe 31.

[0047] It should be noted that Figure 2 and Figure 7 The structure of the first electronic probe 31 is expressed and illustrated, and the structure of the second electronic probe 32 can also be selected Figure 2 or Figure 7 Any one of the first electronic probe 31 and the second electronic probe 32 can choose the same or different structures. It is easy to understand that Figure 2 or Figure 7 The related structure of the first electronic probe 31 in the figure can also represent the related structure of the second electronic probe 32 when the second electronic probe 32 selects the same structure.

[0048] Figure 2 The first electronic probe 31 in the figure is a first electronic probe 31 with a first disc-shaped handle 315; Figure 7 The first electronic probe 31 is a disc-shaped first electronic probe 31 and does not have a first disc-shaped handle 315 .

[0049] In the electrical performance testing device provided by the utility model, the first electronic probe 31 and the second electronic probe 32 can be combined in at least the following ways:

[0050] The first electronic probe 31 adopts Figure 2 Structure, the second electronic probe 32 adopts Figure 2 Structure; The first electronic probe 31 adopts Figure 2 Structure, the second electronic probe 32 adopts Figure 7 Structure; The first electronic probe 31 adopts Figure 7 Structure, the second electronic probe 32 adopts Figure 7Structure; The first electronic probe 31 adopts Figure 7 Structure, the second electronic probe 32 adopts Figure 2 structure.

[0051] In addition, if Figure 8 As shown, in one embodiment of the present invention, the first electronic probe 31 can also be a triangular probe to match different application scenarios. Similarly, the second electronic probe 32 can also be selected to have the same structure.

[0052] Figure 2 The first electronic probe 31 is a disc-type probe. Figure 8 The first electronic probe 31 is a triangular probe. Generally, the second electronic probe 32 preferably has the same structure as the first electronic probe 31, and is also a disc-shaped probe or a triangular probe, so that the first and second electronic probes 31 and 32 can better cooperate during use. Of course, the possibility of selecting electronic probes of different shapes is not excluded and can be an option in certain specific situations.

[0053] In one embodiment of the present invention, the first electronic probe 31 includes a first adsorption disk, which is used to be removably adsorbed and connected to the first test surface 311; the second electronic probe 32 includes a second adsorption disk, which is used to be removably adsorbed and connected to the second test surface. The first electronic probe 31 and the second electronic probe 32 are both magnetic, and the first adsorption disk and the second adsorption disk can be selected from ring-shaped or sheet-shaped metal disks. When the first electronic probe 31 and the second electronic probe 32 are separated to independently test the electrical connection, the first electronic probe 31 or the second electronic probe 32 is clamped to the component under test to provide good and stable conductive contact.

[0054] It is easy to understand that the first electronic probe 31 with the first adsorption disk can also be used in conjunction with the second electronic probe 32 with the second adsorption disk. In the present invention, the first and second adsorption disks have simple structures and can be selected as ring-shaped, sheet-shaped, or any other metal structure that matches the structure, and are not shown in the drawings.

[0055] like Figure 2 、 Figure 3 、 Figure 4 、 Figure 5 、 Figure 6As shown, the first electronic probe 31 includes a first disc-shaped handle 315, which makes it easier to separate the first electronic probe 31 from the component under test. Similarly, the second electronic probe 32 can also be equipped with a second disc-shaped handle, which performs the same function as the first disc-shaped handle 315 in the first electronic probe 31. Especially in some scenarios with strong attraction, the configuration of the first disc-shaped handle 315 and the second disc-shaped handle can simultaneously apply a separation force from both sides of the first electronic probe 31 and the second electronic probe 32, pulling the first electronic probe 31 and the second electronic probe 32 apart.

[0056] like Figure 4 As shown, in one embodiment, the first electronic probe 31 includes a first switch button 316, which is used to disconnect or connect the electrical connection between the first probe 312 and the first wiring harness 21. Similarly, the second electronic probe 32 may also be provided with a similar structure. Generally, the first and second electronic probes 31, 32 are in the same electrical circuit, eliminating the need for a switch button. Therefore, a single switch button on either the first or second electronic probe 31, 32 is sufficient.

[0057] The switch button has a zeroing function. After the test is completed, pressing the switch button closes the test signal channel and resets the test. To start the test, after installing the electrical performance test device provided by the utility model, pressing the switch button closes the circuit and begins the test. This ensures data integrity and can record instantaneous signal data under certain circumstances.

[0058] like Figure 4 and Figure 5 As shown, in one embodiment, the first electronic probe 31 includes a first disc-type handle 315. In this case, the first switch button 316 can be set on the first disc-type handle 315; if a switch button is set on the second electronic probe 32, the switch button can be set on the second disc-type handle if a second disc-type handle is provided. The structure of the switch button can refer to the structural drawing of the first electronic probe 31.

[0059] like Figure 2 and Figure 5As shown, in one embodiment, the first electronic probe 31 includes a first signal receiving element 317, one end of which is used to electrically connect to the first wiring harness 21, and the other end of the first signal receiving element 317 is electrically connected to the first probe 312; the second electronic probe 32 includes a second signal receiving element, one end of which is used to electrically connect to the second wiring harness 22, and the other end of the second signal receiving element is electrically connected to the second probe. By providing the first signal receiving element 317 as an intermediate mechanism between the first probe 312 and the first wiring harness 21, a stable connection between the two ends is facilitated; at the same time, the first signal receiving element 317 can be selected into different structures according to actual conditions, such as a circular ring or a square sheet, so that it is easier to connect to the first wiring harness 21 and more stable to connect to the first probe 312. Similarly, the second signal receiving element has the same structure, preferred reasons, and function as the first signal receiving element 317.

[0060] In one embodiment, the first electronic probe 31 includes a first switch button 316 . For convenience, the first switch button 316 can be disposed between the first signal receiving component 317 and the first wiring harness 21 to cut off or connect the electrical connection between the first signal receiving component 317 and the first wiring harness 21 .

[0061] like Figure 5 As shown, in one embodiment of the present invention, the first wiring harness 21 is one; Figure 6 and Figure 8 As shown, in other embodiments, two first wire harnesses 21 can be used. When using a single-wire test fixture, that is, when there is only one first wire harness 21, the first wire harness 21 is installed in the middle of the first electronic probe 31 to effectively prevent interference signals. When using a dual-wire test fixture, that is, when there are two first wire harnesses 21, the two first wire harnesses 21 are respectively installed above and below the first electronic probe 31. This solution is used in certain special testing situations to enhance anti-interference capabilities and shielding effects.

[0062] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention, and should all be included in the scope of protection of the present invention.

Claims

1. An electrical performance testing device, characterized in that: The system comprises a host, a first wiring harness, a first electronic probe, a second wiring harness and a second electronic probe, wherein one end of the first wiring harness is used to be electrically connected to the host, and the other end of the first wiring harness is used to be electrically connected to the first electronic probe, one end of the second wiring harness is used to be electrically connected to the host, and the other end of the second wiring harness is used to be electrically connected to the second electronic probe; The first electronic probe includes a first test surface, a first probe, and a first magnetic member, wherein a side of the first probe close to the first test surface is used to electrically connect to the component under test; the second electronic probe includes a second test surface, a second probe, and a second magnetic member, wherein a side of the second probe close to the second test surface is used to electrically connect to the component under test; One end of the first magnetic member close to the first test surface is a first magnetic end, and one end of the second magnetic member close to the second test surface is a second magnetic end. The polarities of the first magnetic end and the second magnetic end are opposite.

2. The electrical performance testing device according to claim 1, characterized in that: The first magnetic end is an N pole, and the second magnetic end is an S pole.

3. The electrical performance testing device according to claim 1 or 2, characterized in that: The first electronic probe is a disc-type probe, the first magnetic part is annular, the first magnetic part is arranged around the first probe, and the first magnetic part is arranged close to the first test surface; the second electronic probe is a disc-type probe, the second magnetic part is annular, the second magnetic part is arranged around the second probe, and the second magnetic part is arranged close to the second test surface.

4. The electrical performance testing device according to claim 1 or 2, characterized in that: The first electronic probe includes a first adsorption disk, which is used to be detachably adsorbed and connected to the first test surface; the second electronic probe includes a second adsorption disk, which is used to be detachably adsorbed and connected to the second test surface.

5. The electrical performance testing device according to claim 3, characterized in that: The first electronic probe includes a first disc-shaped handle.

6. The electrical performance testing device according to claim 5, characterized in that: The second electronic probe includes a second disc-type handle.

7. The electrical performance testing device according to claim 1 or 2, characterized in that: The first electronic probe includes a first switch button, and the first switch button is used to cut off or connect the electrical connection between the first probe and the first wiring harness.

8. The electrical performance testing device according to claim 7, characterized in that: The first electronic probe includes a first disc-shaped handle, and the first switch button is installed on the first disc-shaped handle.

9. The electrical performance testing device according to claim 1 or 2, characterized in that: The first electronic probe includes a first signal receiving component, one end of which is used to be electrically connected to the first wiring harness, and the other end of which is electrically connected to the first probe; the second electronic probe includes a second signal receiving component, one end of which is used to be electrically connected to the second wiring harness, and the other end of which is electrically connected to the second probe.

10. The electrical performance testing device according to claim 9, characterized in that: The first electronic probe includes a first switch button, and the first switch button is used to cut off or connect the electrical connection between the first signal receiving component and the first wiring harness.

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