Multi-channel TE test fixture for EML optical device with soft board

Abstract

The utility model provides an EML optical device multi-channel TE test clamp with a soft board, comprising a pedestal and a PCB test board with a plurality of independent power supply channels, the pedestal is provided with a groove used for clamping the PCB test board, the PCB test board is provided with a plurality of groups of golden fingers, and the golden fingers are arranged in the groove. The FPC soft board of each EML optical device is correspondingly and electrically connected with one power supply channel through one group of golden fingers, the multi-channel TE test fixture further comprises a pressing plate fixed on the base, the pressing plate is located above the PCB test board, a plurality of crimping assemblies are arranged on the pressing plate, each crimping assembly corresponds to one group of golden fingers, and the pressing plate is fixed on the base. And the crimping assembly is used for pressing the bonding pad on the FPC soft board against the corresponding group of golden fingers. According to the utility model, a TE test can be carried out on a plurality of EML optical devices with FPC soft boards at the same time, and the working efficiency of the TE test is improved.

Description

Technical Field

[0001] The utility model relates to the field of optoelectronic technology, in particular to a multi-channel TE test fixture with an EML optical device and a flexible board. Background Art

[0002] EML optical devices are shipped with seven long pins, allowing for TE testing using ferrule power. TE testing measures the ratio of fiber output power under two different temperature conditions, or the TE value, which reflects the stability of the optical device under high and low temperature conditions. After leaving the factory, during user use, the seven long pins of EML optical devices are shortened and soldered to the FPC. Damaged EML optical devices are returned to the factory for repair. Because the seven pins of EML optical devices with FPCs are short, pin-powered devices cannot be used, making TE testing impossible. Therefore, it is necessary to provide a multi-channel TE test fixture that powers EML optical devices through the FPC. This fixture can simultaneously perform TE testing on multiple EML optical devices with FPCs, improving TE testing efficiency. Utility Model Content

[0003] The purpose of the present invention is to overcome the defects of the prior art and provide a multi-channel TE test fixture with a flexible circuit board for an EML optical device. The present invention at least solves some of the problems in the prior art.

[0004] The utility model is achieved in this way:

[0005] The utility model provides a multi-channel TE test fixture with an EML optical device and a flexible circuit board, comprising a base and a PCB test board with multiple independent power supply channels. The base is provided with a groove for clamping the PCB test board. The PCB test board is provided with several groups of gold fingers. The FPC flexible circuit board of each EML optical device is electrically connected to a corresponding power supply channel through a group of gold fingers. The multi-channel TE test fixture also includes a pressing plate fixed to the base, the pressing plate is located above the PCB test board, and the pressing plate is provided with several pressing assemblies, each pressing assembly corresponding to a group of gold fingers, and the pressing assemblies are used to press the pads on the FPC flexible circuit board against the corresponding group of gold fingers.

[0006] Furthermore, the multi-channel TE test fixture for EML optical devices with flexible boards also includes an EML optical device positioning block fixed on the base, the EML optical device positioning block is located above the PCB test board, and the EML optical device positioning block is provided with a plurality of U-shaped grooves on the side facing the pressure plate, and the fiber coupling sockets of the EML optical devices are limited in the U-shaped grooves, and the U-shaped grooves correspond one-to-one to the EML optical devices.

[0007] Furthermore, an adjustment plate is fixed on the top of the pressure plate, and the crimping assembly includes an adjusting screw, which is threadedly connected to the adjusting plate. A pressure head is provided at the bottom of the adjusting screw, and an elastic pressure pad is fixed at the bottom of the pressure head. The pressure pad is used to press the solder pads on the FPC soft board to a corresponding group of gold fingers, and an opening is provided on the pressure plate for the pressure pad to extend toward the FPC soft board.

[0008] Furthermore, a handle is fixed to the top of the adjusting screw, and the handle is located above the adjusting plate.

[0009] Furthermore, the adjustment plate and the pressing plate are detachably connected via screws.

[0010] Furthermore, the PCB test board is provided with a positioning pin on both sides of each group of gold fingers, and the FPC soft board of the EML optical device is provided with a positioning groove that cooperates with the positioning pin.

[0011] Furthermore, each group of gold fingers is evenly spaced and arranged on the PCB test board.

[0012] Furthermore, along the arrangement direction of each group of gold fingers, both ends of the pressure plate are fixed to the base by rotating screws, the base is provided with a positioning pin extending toward the pressure plate, and the pressure plate is provided with a positioning hole cooperating with the positioning pin.

[0013] Furthermore, along the arrangement direction of each group of gold fingers, two ends of the EML optical device positioning block are fixed to the base by screws.

[0014] Furthermore, the PCB test board is fixed to the base by screws.

[0015] The utility model has the following beneficial effects:

[0016] The utility model provides a multi-channel TE test fixture which supplies power to EML optical devices through an FPC soft board, and can perform TE tests on multiple EML optical devices with FPC soft boards at the same time, thereby improving the working efficiency of TE tests. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0018] Figure 1 A schematic diagram of a multi-channel TE test fixture for EML optical devices with a flexible circuit board provided in an embodiment of the present invention;

[0019] Figure 2 A top view of a multi-channel TE test fixture for EML optical devices with a flexible circuit board provided in an embodiment of the present invention;

[0020] Figure 3 The embodiment of the present invention provides Figure 2 Middle AA section;

[0021] Figure 4 A side view of a multi-channel TE test fixture for EML optical devices with a flexible circuit board provided in an embodiment of the present invention;

[0022] Figure 5 A top view of a base provided in an embodiment of the present utility model;

[0023] Figure 6 A top view of an EML optical device positioning block provided in an embodiment of the present utility model;

[0024] Figure 7 A side view of a pressing plate provided in an embodiment of the present utility model;

[0025] Figure 8 A top view of the adjustment plate provided in an embodiment of the present utility model;

[0026] Figure 9 A top view of the pressure head provided in an embodiment of the present utility model;

[0027] Figure 10 A top view of the pressure pad provided in an embodiment of the present utility model.

[0028] In the figure: 1-base; 2-EML optical device positioning block; 3-pressing plate; 4-adjusting plate; 5-pressing head; 6-adjusting screw; 7-handle; 8-pressing pad; 9-rotating screw; 10-locating needle; 11-locating pin; 12-PCB test board; 13-fiber coupling socket; 14-U-shaped groove; 15-convex pad. DETAILED DESCRIPTION

[0029] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0030] like Figures 1-10, an embodiment of the utility model provides a multi-channel TE test fixture for EML optical devices with flexible boards, including a base 1, a PCB test board 12 with multiple independent power supply channels, the PCB test board 12 with multiple independent power supply channels is an existing commercially available device and will not be described in detail here, the PCB test board 12 is connected to an external power supply, the base 1 is provided with a groove for clamping the entire PCB test board 12, the PCB test board 12 is provided with several groups of gold fingers, each FPC flexible board of the EML optical device is electrically connected to a power supply channel through a group of gold fingers, the multi-channel TE test fixture also includes a pressing plate 3 fixed to the base 1, the pressing plate 3 is located above the PCB test board 12, the pressing plate 3 is provided with several pressing components, each pressing component corresponds to a group of gold fingers, the pressing component is used to press the pads on the FPC flexible board to the corresponding group of gold fingers, to achieve electrical connection between the FPC flexible board and the gold fingers, and the 7 pins of the EML optical device are all electrically connected to the corresponding gold fingers through the pads on the FPC flexible board. In this embodiment, the PCB test board 12 has eight independent power supply channels, allowing it to simultaneously power eight EML optical devices with flexible printed circuit boards (FPCs) for TE testing. In this embodiment, the PCB test board 12 is equipped with eight sets of gold fingers, each electrically connected to a corresponding power supply channel. Each EML optical device's FPC pad is crimped to a corresponding set of gold fingers, effectively connecting the device's seven pins to the corresponding gold fingers.

[0031] In this embodiment, the multi-channel TE test fixture also includes an EML optical device positioning block 2 fixed to the base 1. The EML optical device positioning block 2 is located above the PCB test board 12. The side of the EML optical device positioning block 2 facing the pressure plate 3 is provided with several U-shaped grooves 14. The fiber coupling receptacles 13 of the EML optical device are restrained within these U-shaped grooves 14. The U-shaped grooves 14 prevent the fiber coupling receptacles 13 from tipping over. The U-shaped grooves 14 correspond one-to-one with the EML optical device. The EML optical device includes a fiber coupling receptacle 13 and an FPC (flexible printed circuit board). The fiber coupling receptacle 13 is used to connect optical fibers.

[0032] The PCB test board 12 is used to power the EML optical device. The EML optical device converts the electrical signal into an optical signal and transmits it via optical fiber to an external test device. The fiber output power is measured at room temperature. The fiber output power is then measured again at high temperature, and the ratio of the two output powers is calculated, which is the TE value. If needed, the multi-channel TE test fixture can be installed in a temperature-adjustable test chamber to facilitate adjustment of the ambient temperature during testing.

[0033] In this embodiment, an adjustment plate 4 is fixed to the top of the pressure plate 3. The crimping assembly includes an adjustment screw 6, which is threadedly connected to the adjustment plate 4. A pressure head 5 is provided at the bottom of the adjustment screw 6. A resilient pressure pad 8 is fixed to the bottom of the pressure head 5. The pressure pad 8 is elastic to prevent damage to the FPC soft board. The pressure pad 8 is used to press the solder pads on the FPC soft board against the corresponding set of gold fingers. The pressure plate 3 has an opening for the pressure pad 8 to extend toward the FPC soft board, and the pressure head 5 can rotate within the opening. In this embodiment, the bottom surface of the pressure pad 8 is insulated and smooth.

[0034] In this embodiment, a handle 7 is fixed to the top of the adjusting screw 6, and the handle 7 is located above the adjusting plate 4. The operator can rotate the adjusting screw 6 through the handle 7 to drive the pressure head 5 to rise or fall, so that the pressure pad 8 presses the FPC soft board tightly or leaves the FPC soft board.

[0035] In this embodiment, the adjusting plate 4 is detachably connected to the pressing plate 3 by screws. After the adjusting plate 4 and the pressing plate 3 are detached, the pressure head 5 and the pressure pad 8 at the bottom of the adjusting screw 6 can be replaced.

[0036] In this embodiment, the PCB test board 12 is equipped with a locating pin 10 on either side of each set of gold fingers. The EML optical component's flexible printed circuit board (FPC) is provided with locating grooves that mate with these locating pins 10. These locating pins 10 ensure precise alignment between the solder pads on the FPC and the gold fingers on the PCB test board 12. In this embodiment, the locating grooves are located on both sides of the FPC. In this embodiment, the PCB test board 12 is equipped with eight sets of locating pins 10, each set securing a separate FPC board for an EML optical component.

[0037] In this embodiment, each group of gold fingers is evenly spaced apart on the PCB test board 12. Along the arrangement direction of each group of gold fingers, the two ends of the pressure plate 3 are fixed to the base 1 via rotating screws 9. The base 1 is provided with positioning pins 11 extending toward the pressure plate 3. The pressure plate 3 is provided with positioning holes that cooperate with the positioning pins 11, facilitating the precise positioning and installation of the pressure plate 3. In this embodiment, the bottom ends of the pressure plate 3 exert a pressing force on the PCB test board 12. The center of the bottom of the pressure plate 3 is recessed to form a notch corresponding to the position of each group of gold fingers on the PCB test board 12, which does not contact the PCB test board 12. This design facilitates the removal of the pressure head 5 and pressure pad 8 from the pressure plate 3.

[0038] In this embodiment, along the arrangement direction of each group of gold fingers, both ends of the EML optical device positioning block 2 are fixed to the base 1 by screws.

[0039] In this embodiment, the PCB test board 12 is fixed to the base 1 by screws. In the area where the EML optical device positioning block 2, the PCB test board 12, and the base 1 face each other, the screws can sequentially penetrate the EML optical device positioning block 2, the PCB test board 12, and the base 1 to securely connect the three.

[0040] The base 1 may further be provided with a plurality of device receiving slots as required for receiving electronic devices on the lower surface of the PCB test board 12 . Figure 5 In the embodiment, the base 1 can be provided with a plurality of raised pads 15 at positions corresponding to the gold fingers on the PCB test board 12. The raised pads 15 press the PCB test board 12 upward, so that the gold fingers on the PCB test board 12 can better and more closely contact the pads on the FPC. Preferably, in this embodiment, the gold fingers are slightly higher than the upper surface of the PCB test board 12, so that the gold fingers can more closely contact the pads on the FPC.

[0041] When the multi-channel TE test fixture is in use, the fiber coupling socket 13 of the EML optical device is limited in the U-shaped groove 14 of the EML optical device positioning block 2, and the FPC soft board of the EML optical device is positioned and installed by the positioning pin 10, so that the soldering pads on the FPC soft board are facing the gold fingers on the PCB test board 12; then, the pressure plate 3 is installed above the base 1 through the positioning pin 11, and the rotary screw 9 is rotated to lock the pressure plate 3; then, the handle 7 of each channel is rotated, and the pressure head 5 and the pressure pad 8 are slightly lowered by adjusting the screw 6, so that the soldering pads on the FPC soft board are stably pressed and contacted with the gold fingers; then, the fiber coupling socket 13 of each EML optical device is plugged with an optical fiber, connected to the external detection equipment through the optical fiber, and the optical fiber output power is detected by the external detection equipment.

[0042] The utility model provides a multi-channel TE test fixture, which can clamp multiple coaxial packaged EML optical devices with FPC soft boards and can perform TE tests on multiple EML optical devices with FPC soft boards at the same time, thereby improving the working efficiency of TE testing.

[0043] The contents not described in detail in this specification belong to the prior art known to professional and technical personnel in this field.

[0044] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A multi-channel TE test fixture for EML optical devices with flexible circuit boards, characterized by: The multi-channel TE test fixture includes a base and a PCB test board with multiple independent power supply channels. The base is provided with a groove for clamping the PCB test board. The PCB test board is provided with several groups of gold fingers. The FPC soft board of each EML optical device is electrically connected to a corresponding power supply channel through a group of gold fingers. The multi-channel TE test fixture also includes a pressing plate fixed to the base. The pressing plate is located above the PCB test board. The pressing plate is provided with several pressing assemblies, each pressing assembly corresponds to a group of gold fingers, and the pressing assembly is used to press the pads on the FPC soft board to the corresponding group of gold fingers.

2. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 1, characterized in that: It also includes an EML optical device positioning block fixed on the base, the EML optical device positioning block is located above the PCB test board, and the EML optical device positioning block is provided with a plurality of U-shaped grooves on the side facing the pressure plate. The optical fiber coupling socket of the EML optical device is limited in the U-shaped groove, and the U-shaped groove corresponds to the EML optical device one by one.

3. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 1, characterized in that: An adjustment plate is fixed on the top of the pressure plate, and the crimping assembly includes an adjusting screw, which is threadedly connected to the adjusting plate. A pressure head is provided at the bottom of the adjusting screw, and an elastic pressure pad is fixed at the bottom of the pressure head. The pressure pad is used to press the solder pads on the FPC soft board to a corresponding group of gold fingers. An opening is provided on the pressure plate for the pressure pad to extend toward the FPC soft board.

4. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 3, characterized in that: A handle is fixed on the top of the adjusting screw, and the handle is located above the adjusting plate.

5. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 3, characterized in that: The adjusting plate and the pressing plate are detachably connected via screws.

6. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 1, characterized in that: The PCB test board is provided with a positioning pin on both sides of each group of gold fingers, and the FPC soft board of the EML optical device is provided with a positioning groove that cooperates with the positioning pin.

7. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 1, characterized in that: Each group of gold fingers is evenly spaced and arranged on the PCB test board.

8. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 7, characterized in that: Along the arrangement direction of each group of gold fingers, both ends of the pressure plate are fixed to the base by rotating screws. The base is provided with a positioning pin extending toward the pressure plate, and the pressure plate is provided with a positioning hole that cooperates with the positioning pin.

9. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 7, characterized in that: Along the arrangement direction of each group of gold fingers, both ends of the EML optical device positioning block are fixed to the base by screws.

10. The multi-channel TE test fixture for EML optical devices with flexible circuit boards according to claim 1, characterized in that: The PCB test board is fixed on the base by screws.

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