Novel ERU female seat integrated probe electrical testing detector

Abstract

The utility model discloses a novel ERU female seat integrated probe electrical testing detector, which comprises a machine seat, a control box, a tester, a moving device, a driving device and a first testing device, the control box is arranged on the machine base, and the tester is electrically connected with the control box; the moving device comprises a sliding seat, a carrier, an integrated probe, a pressing mechanism and a first driving mechanism; the driving device is positioned below the integrated probe and drives the integrated probe to move upwards; the first testing device comprises a first movable seat, a testing circuit board and a second driving mechanism. The integrated probe is adopted, the plurality of elastic contact pins are integrally formed on the integrated probe, and the plurality of elastic contact pins are arranged in the front row and the rear row at intervals and are respectively in contact with the two rows of terminals, so that a traditional single-probe contact mode is replaced, the elastic force of each elastic contact pin is relatively good, the detection requirement is completely met, convenience is brought to electrical detection, and the detection efficiency is improved. And the integrated probe is simple in structure and convenient to install and use.

Description

Technical Field

[0001] The utility model relates to the field of detection machines, in particular to a novel ERU female seat integrated probe electrical detection machine. Background Art

[0002] A connector is a device that connects two active devices and is used to transmit current or signals. The main supporting fields of electrical connectors include transportation, communications, networks, IT, medical care, home appliances, etc. The rapid development of the technical level of products in the supporting fields and the rapid growth of the market have strongly driven the development of connector technology. So far, connectors have developed into serialized and specialized products with a complete range of products, rich quality specifications, diverse structural forms, subdivided professional directions, obvious industry characteristics, and standardized standard systems. During the connector assembly process, the terminals need to be plugged into the corresponding positions of the product.

[0003] The ERU female socket is one of many connectors, which is mainly used in medical equipment. The main structure of the ERU female socket includes an insulating seat and two rows of terminals arranged on the insulating seat. The ERU female socket needs to be electrically tested after assembly. In the prior art, the electrical testing of the ERU female socket usually uses multiple probes, one probe corresponding to one terminal. However, due to the small size of the ERU female socket, the small width of the terminal, and the small PIN distance between the two adjacent terminals, which is only 0.43mm, the probe is relatively small, and the elastic force of the probe cannot meet the detection requirements. Therefore, it is necessary to study a solution to the above problems. Utility Model Content

[0004] In view of this, the present invention aims to address the deficiencies in the prior art, and its main purpose is to provide a new ERU mother socket integrated probe electrical testing machine, which can effectively solve the problem that the existing ERU mother socket uses multiple probes, resulting in the elastic force of the probes being unable to meet the testing requirements.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] A novel ERU female base integrated probe electrical testing machine includes a base, a control box, a tester, a moving device, a driving device and a first testing device;

[0007] The control box is arranged on the machine base, and the tester is electrically connected to the control box;

[0008] The moving device includes a slide, a carrier, an integrated probe, a pressing mechanism, and a first driving mechanism; the slide can be arranged on the machine base so as to move back and forth laterally; the carrier can be taken and placed on the slide, and the carrier has a placement position for placing the ERU mother seat; the integrated probe can be hung on the upper carrier so as to move up and down, and the integrated probe is integrally formed with a plurality of elastic contact feet, and the plurality of elastic contact feet are arranged in two rows at intervals; the pressing mechanism is arranged on the slide and is located on the side of the carrier; the first driving mechanism is arranged on the machine base and drives the slide to move back and forth laterally, and the first driving mechanism is electrically connected to the control box;

[0009] The driving device is arranged on the machine base and connected to the control box. The driving device is located below the integrated probe and prompts the integrated probe to move upward.

[0010] The first testing device includes a first movable seat, a test circuit board and a second driving mechanism. The first movable seat can be tilted forward and backward and moved up and down and is arranged on the machine base and is located on the rear side of the mobile device. The test circuit board is arranged on the first movable seat and moves back and forth with the first movable seat. The test circuit board is electrically connected to the control box. The front end of the test circuit board has a plug-in portion symmetrically connected to the ERU female seat. The second driving mechanism is arranged on the machine base and drives the first movable seat to move back and forth. The second driving mechanism is electrically connected to the control box.

[0011] As a preferred solution, the base includes a base body and a bracket arranged on the base body, the control box, the moving device and the driving device are all arranged on the base body, and the first testing device is arranged on the bracket.

[0012] As a preferred solution, a first slide rail is provided on the seat body, and the slide seat is provided on the first slide rail and moves back and forth laterally along the first slide rail.

[0013] As a preferred solution, a second slide rail is provided on the bracket, and the first movable seat is provided on the second slide rail and moves back and forth along the second slide rail.

[0014] As a preferred solution, the integrated probe includes a base and two substrates extending from the base, and a through groove is formed on the front and back of the two substrates and on the left and right sides of the top of each substrate. The cross-section of the through groove is L-shaped, and an elastic plate is formed on the outside of each through groove. A plurality of slots are opened on the elastic plate, and the aforementioned elastic contact feet are formed between two adjacent slots.

[0015] As a preferred solution, hanging holes are formed through the front and rear side surfaces of the two base plates, and the carrier is provided with a hanging rod, which is inserted into the hanging holes.

[0016] As a preferred solution, the first driving mechanism is a cylinder.

[0017] As a preferred solution, the driving device includes a driving cylinder and a push rod, and the driving cylinder drives the push rod to move up and down.

[0018] As a preferred solution, the second driving mechanism is a cylinder.

[0019] As a preferred solution, a second testing device is further provided on the machine base, and the second testing device is arranged side by side with the first testing device in a transverse direction.

[0020] Compared with the prior art, the present invention has obvious advantages and beneficial effects. Specifically, it can be seen from the above technical solution that:

[0021] By adopting an integrated probe, multiple elastic contact pins are integrally formed on the integrated probe. The multiple elastic contact pins are arranged in two rows at intervals and contact the two rows of terminals respectively, replacing the traditional single probe contact method. The elastic force of each elastic contact pin is good, which fully meets the detection requirements and brings convenience to electrical testing. In addition, the integrated probe has a simple structure and is easy to install and use.

[0022] In order to more clearly illustrate the structural features and effects of the present invention, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a three-dimensional schematic diagram of a preferred embodiment of the present utility model;

[0024] Figure 2 It is a three-dimensional schematic diagram from another angle of a preferred embodiment of the present utility model;

[0025] Figure 3 It is a cross-sectional view of a preferred embodiment of the present utility model;

[0026] Figure 4 yes Figure 3 A magnified schematic diagram of position A in the middle;

[0027] Figure 5 This is a schematic diagram of the internal structure of a preferred embodiment of the present utility model;

[0028] Figure 6 It is a three-dimensional schematic diagram of an integrated probe in a preferred embodiment of the present utility model.

[0029] Description of the accompanying drawings:

[0030] 10. Base 11. Base body

[0031] 12. Bracket 13. First slide rail

[0032] 14. Second slide rail 15. Third slide rail

[0033] 20. Control box 30. Tester

[0034] 40. Moving device 41. Sliding seat

[0035] 42. Vehicle 421. Placement

[0036] 422, hanging rod 43, integrated probe

[0037] 431, elastic contact foot 432, base

[0038] 433, base plate 44, pressing mechanism

[0039] 45. First driving mechanism 401, through slot

[0040] 402, elastic plate 403, slot

[0041] 404, hanging hole 50, driving device

[0042] 51. Driving cylinder 52. Ejector rod

[0043] 60. First testing device 61. First movable seat

[0044] 62. Test circuit board 621. Connector

[0045] 63. Second drive mechanism 70. ERU female base

[0046] 71, terminal 80, second test device

[0047] 81. Second movable seat 82. Plug-in plate

[0048] 83. The third driving mechanism. DETAILED DESCRIPTION

[0049] Please refer to Figures 1 to 6 As shown, it shows the specific structure of a preferred embodiment of the present invention, including a base 10, a control box 20, a tester 30, a moving device 40, a driving device 50 and a first testing device 60.

[0050] The base 10 includes a base body 11 and a bracket 12 disposed on the base body 11 . A first slide rail 13 is disposed on the base body 11 , and a second slide rail 14 and a third slide rail 15 are disposed on the bracket 12 .

[0051] The control box 20 is mounted on the base 10 , and the tester 30 is electrically connected to the control box 20 . In this embodiment, the control box 20 is mounted on the base 11 .

[0052] The moving device 40 includes a slide 41, a carrier 42, an integrated probe 43, a pressing mechanism 44 and a first driving mechanism 45; the slide 41 can be arranged on the machine base 10 so as to move back and forth laterally; the carrier 42 can be arranged on the slide 41 so as to be removable and removable, and the carrier 42 has a placement position 421 for placing the ERU mother seat 70; the integrated probe 43 can be hung on the carrier 42 so as to move up and down, and the integrated probe 43 is integrally formed with a plurality of elastic contact feet 431, and the plurality of elastic contact feet 431 are arranged in two rows at intervals in front and back; the pressing mechanism 44 is arranged on the slide 41 and is located on the side of the carrier 42, and the pressing mechanism 44 is used to press the carrier 42 downward so that the carrier 42 is firmly fixed on the slide 42; the first driving mechanism 45 is arranged on the machine base 10 and drives the slide 41 to move back and forth laterally, and the first driving mechanism 45 is electrically connected to the control box 20.

[0053] In this embodiment, the moving device 40 is disposed on the base 11. The slide 41 is disposed on the first slide rail 13 and moves back and forth laterally along the first slide rail 13, so that the slide 41 moves smoothly. The integrated probe 43 includes a base 432 and two base plates 433 extending from the base 432. The two base plates 433 have through-slots 401 formed on the front and back sides, and on the left and right sides of the top of each base plate 433. The cross-section of the through-slot 401 is L-shaped. An elastic plate 402 is formed on the outside of each through-slot 401. The elastic plate 402 has multiple slots 403 formed on it, and the aforementioned elastic contact feet 431 are formed between adjacent slots 403. In addition, hanging holes 404 are formed on the front and rear sides of the two base plates 433. The carrier 42 has a hanging rod 422, which is inserted into the hanging hole 404. The structure is simple and easy to assemble. The pressing mechanism 44 is a manual connecting rod pressing mechanism. The first driving mechanism 45 is a cylinder.

[0054] The drive device 50 is mounted on the base 10 and connected to the control box 20. The drive device 50 is positioned below the integrated probe 43 and forces the integrated probe 43 to move upward. In this embodiment, the drive device 50 is mounted on the base 11. The drive device 50 includes a drive cylinder 51 and a push rod 52. The drive cylinder 51 drives the push rod 52 to move up and down, and the push rod 52 is used to push the integrated probe 43 upward.

[0055] The first test device 60 includes a first movable seat 61, a test circuit board 62, and a second drive mechanism 63. The first movable seat 61 is arranged on the machine base 10 and is located on the rear side of the mobile device 40 so as to be tilted forward and backward and up and down and movable back and forth. The test circuit board 62 is arranged on the first movable seat 61 and moves back and forth with the first movable seat 61. The test circuit board 62 is electrically connected to the control box 20. The front end of the test circuit board 62 has a plug-in portion 621 symmetrically connected to the ERU female seat 70. The second drive mechanism 63 is arranged on the machine base 10 and drives the first movable seat 61 to move back and forth. The second drive mechanism 63 is electrically connected to the control box 20. In this embodiment, the first test device 60 is arranged on the bracket 12. The first movable seat 61 is arranged on the second slide rail 14 and moves back and forth along the second slide rail 14, so that the first movable seat 61 moves back and forth smoothly. The second drive mechanism 63 is a cylinder with a simple structure.

[0056] Furthermore, the base 10 is also provided with a second test device 80, which is arranged horizontally side by side with the first test device 60. The second test device 80 is used to perform plug-in and pull-out tests on the ERU female socket 70. Its specific structure includes a second movable base 81, an insertion plate 82, and a third drive mechanism 83. The second movable base 81 is arranged on the base 10 and can be tilted forward and backward, up and down, and moved back and forth. It is located on the rear side of the movable device 40. The insertion plate 82 is arranged on the second movable base 81 and moves back and forth with the second movable base 81. The third drive mechanism 83 is arranged on the base 10 and drives the second movable base 81 to move back and forth. The third drive mechanism 83 is electrically connected to the control box 20. In this embodiment, the second test device 80 is arranged on the bracket 12. The second movable base 81 is arranged on the third slide rail 15 and moves back and forth along the third slide rail 15, so that the second movable base 81 moves back and forth smoothly. The third drive mechanism 83 is a cylinder with a simple structure.

[0057] The working principle of this embodiment is described in detail as follows:

[0058] First, the ERU mother seat 70 to be tested is installed on the carrier 42. Then, the carrier 42 is manually placed on the slide 41 and the carrier 42 is pressed and fixed by the pressing mechanism 44. Next, the equipment is started for testing. The moving device 40 works, and the first driving mechanism 45 drives the slide 41 to move to the right. When the ERU mother seat 70 is facing the second test device 80, the first driving mechanism 45 stops working. Then, the second test device 80 performs a plug-in test on the ERU mother seat 70. The third driving mechanism 83 drives the second movable seat 81 to move back and forth, so that the front end of the plug-in plate 82 is plugged and unplugged multiple times on the plug interface of the ERU mother seat 70. Then, the first driving mechanism 45 works again, and the first driving mechanism 45 is driven by the first driving mechanism 4 The slide 41 continues to move rightward, positioning the ERU receptacle 70 directly opposite the first test device 60. The drive mechanism 50 then operates, driving the integrated probe 43 upward, causing each of its resilient contact pins 431 to contact and establish contact with the soldered portions of the front and rear rows of terminals 71 on the ERU receptacle 70. Simultaneously, the first test device 60 operates, with the second drive mechanism 63 driving the first movable seat 61 forward and downward, allowing the plug-in portion 621 of the test circuit board 62 to insert into the receptacle of the ERU receptacle 70 and establish contact with the contact portions of each terminal 71. This allows the tester 30 and control box 20 to perform continuity, withstand voltage, and open circuit tests on the ERU receptacle 70. After the tests are complete, the drive mechanism 50 resets, and the integrated probe 43 moves downward under its own weight, separating from the ERU receptacle 70. Simultaneously, the first test device 60 resets, and the movable mechanism 40 resets, allowing the ERU receptacle 70 to be removed.

[0059] The design focus of the utility model is that an integrated probe is adopted, on which a plurality of elastic contact pins are integrally formed. The plurality of elastic contact pins are arranged in two rows at intervals and contact the two rows of terminals respectively, replacing the traditional single probe contact method. The elastic force of each elastic contact pin is good, which fully meets the detection requirements and brings convenience to electrical testing. In addition, the integrated probe has a simple structure and is easy to install and use.

[0060] The above description is merely a preferred embodiment of the present invention and does not limit the technical scope of the present invention. Therefore, any minor modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention are still within the scope of the technical solution of the present invention.

Claims

1. A new type of ERU female integrated probe electrical testing machine, characterized by: It includes a base, a control box, a tester, a moving device, a driving device and a first testing device; The control box is arranged on the machine base, and the tester is electrically connected to the control box; The moving device includes a slide, a carrier, an integrated probe, a pressing mechanism, and a first driving mechanism; the slide can be arranged on the machine base so as to move back and forth laterally; the carrier can be taken and placed on the slide, and the carrier has a placement position for placing the ERU mother seat; the integrated probe can be hung on the upper carrier so as to move up and down, and the integrated probe is integrally formed with a plurality of elastic contact feet, and the plurality of elastic contact feet are arranged in two rows at intervals; the pressing mechanism is arranged on the slide and is located on the side of the carrier; the first driving mechanism is arranged on the machine base and drives the slide to move back and forth laterally, and the first driving mechanism is electrically connected to the control box; The driving device is arranged on the machine base and connected to the control box. The driving device is located below the integrated probe and prompts the integrated probe to move upward. The first testing device includes a first movable seat, a test circuit board and a second driving mechanism. The first movable seat can be tilted forward and backward and moved up and down and is arranged on the machine base and is located on the rear side of the mobile device. The test circuit board is arranged on the first movable seat and moves back and forth with the first movable seat. The test circuit board is electrically connected to the control box. The front end of the test circuit board has a plug-in portion symmetrically connected to the ERU female seat. The second driving mechanism is arranged on the machine base and drives the first movable seat to move back and forth. The second driving mechanism is electrically connected to the control box.

2. The novel ERU female base integrated probe electrical testing machine according to claim 1 is characterized by: The base includes a base body and a bracket arranged on the base body. The control box, the moving device and the driving device are all arranged on the base body, and the first testing device is arranged on the bracket.

3. The novel ERU female base integrated probe electrical testing machine according to claim 2 is characterized by: The seat body is provided with a first slide rail, and the slide seat is provided on the first slide rail and moves back and forth laterally along the first slide rail.

4. The novel ERU female socket integrated probe electrical testing machine according to claim 2 is characterized by: The bracket is provided with a second slide rail, and the first movable seat is provided on the second slide rail and moves back and forth along the second slide rail.

5. The novel ERU female base integrated probe electrical testing machine according to claim 1 is characterized by: The integrated probe includes a base and two substrates extending from the base. A through groove is formed on the front and back of the two substrates and on the left and right sides of the top of each substrate. The cross-section of the through groove is L-shaped. An elastic plate is formed on the outside of each through groove. A plurality of slots are opened on the elastic plate, and the aforementioned elastic contact feet are formed between two adjacent slots.

6. The novel ERU female base integrated probe electrical testing machine according to claim 5 is characterized by: Hanging holes are formed through the front and rear side surfaces of the two base plates, and the carrier is provided with a hanging rod which is passed through the hanging holes.

7. The novel ERU female base integrated probe electrical testing machine according to claim 1 is characterized by: The first driving mechanism is a cylinder.

8. The novel ERU female socket integrated probe electrical testing machine according to claim 1 is characterized by: The driving device includes a driving cylinder and a push rod, and the driving cylinder drives the push rod to move up and down.

9. The novel ERU female base integrated probe electrical testing machine according to claim 1 is characterized by: The second driving mechanism is a cylinder.

10. The novel ERU female socket integrated probe electrical testing machine according to claim 1 is characterized in that: A second testing device is also provided on the machine base, and the second testing device is arranged side by side with the first testing device in a transverse direction.

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