Circuit board assembly test fixture

Abstract

The utility model relates to a circuit board assembly test fixture, which comprises a test board, a positioning base, a cover plate assembly and a probe assembly, and is characterized in that the test board comprises a horizontally arranged table board; the positioning base is fixed to the top surface of the table plate; the positioning base is used for fixing a circuit board assembly; the cover plate assembly is fixed to the top face of the table plate. The probe assembly is fixed on the top surface of the table plate; the probe assembly comprises a probe substrate capable of translating in the horizontal direction, and more than two test probes are arranged at one end, facing the positioning base, of the probe substrate; and one end, provided with the test probe, of the probe substrate can be translated into the positioning base. According to the circuit board assembly test fixture provided by the invention, a fixed structure of the test probe is changed into a translation structure, and the test probe is translated into the shell of the circuit board assembly, so that the test contact on the circuit board is in contact with the test probe on the probe substrate, and the circuit board is effectively and electrically connected with electronic test equipment; therefore, the function test of the circuit board is completed.

Description

TECHNICAL FIELD

[0001] The utility model relates to the field of circuit board processing, especially a circuit board assembly test fixture. BACKGROUND

[0002] The circuit board assembly is Printed Circuit Board Assembly, PCBA for short, which is usually formed by the whole process of SMT (Surface Mount Technology) mounting and DIP (Dual In-line Package) plug-in after the PCB bare board.

[0003] When testing the circuit board assembly, the finished circuit board needs to be placed on the burning test fixture, and the electrical signal of the circuit board test point is led out to the electronic test equipment through the electrical connection device for circuit board testing. Electronic testing apparatus The electronic test equipment can be a burner that writes the program code into the chip of the circuit board to make the chip perform operations according to the designed functions.

[0004] In the prior art, the burning test fixture can only test the exposed circuit board. Since the test contacts on the circuit board are exposed, the electronic test equipment can contact the test contacts on the circuit board through the test probe module to obtain the electrical signal for testing the circuit board.

[0005] However, during the assembly process of the electronic product, the circuit board may also fail, so the assembled electronic product also needs to be tested. The traditional electronic product burning test tool is used to test the circuit board, so the test probe is vertically arranged on the test table, and the circuit board is moved up and down to make the test contacts of the circuit board contact the test probe. The assembled circuit board assembly usually has a fully covered shell, and the circuit board is arranged in the shell. The test contacts on the circuit board cannot be exposed, and the test contacts on the circuit board in the shell cannot contact the test probe on the test table, so the test cannot be completed.

[0006] In addition, in some scenarios, due to the irregular shape or large size of the circuit board, the small space of the fixture positioning base, and other factors, even if the circuit board assembly does not have a shell, the straight up and down movement on the fixture cannot ensure that the test contacts can touch the test probe, so the test cannot be completed.

[0007] There is a need for a new type of burn-in test fixture that can effectively test circuit boards in irregularly shaped or shell-equipped circuit board assemblies. Utility model content

[0008] The present application provides a circuit board assembly test fixture to solve the technical problem that the test contacts of the circuit board in the shell-equipped circuit board assembly are difficult to contact with the test probes.

[0009] The present application provides a circuit board assembly test fixture, which includes a test table, a positioning base, a cover plate assembly, and a probe assembly. The test table includes a horizontally arranged table plate. The positioning base is fixed to the top surface of the table plate. The positioning base is used to fix the circuit board assembly. The cover plate assembly is fixed to the top surface of the table plate. The probe assembly is fixed to the top surface of the table plate. The probe assembly includes a probe substrate that can translate in the horizontal direction. The end of the probe substrate towards the positioning base is provided with two or more test probes. The end of the probe substrate provided with the test probes can translate into the positioning base.

[0010] Further, the probe assembly includes a linear guide rail, a first slider, and a first slider. The linear guide rail is fixed to the top surface of the table plate. The extension direction of the linear guide rail is consistent with the central axis direction of the positioning base. The first slider is slidably installed to the linear guide rail. The first slider is fixed to the top surface of the table plate. The first pressing clamp includes a first wrench and a first connecting rod. One end of the first connecting rod is connected to the first slider, and the other end is hingedly connected to the first wrench.

[0011] Further, the probe assembly includes a second slider and a third slider. The second slider is fixed to the top surface of the first slider. The third slider is detachably fixed to the side of the second slider towards the positioning base.

[0012] Further, the probe assembly further includes a strip-shaped hole, a blind hole, and a fastener. The strip-shaped hole penetrates through the second slider and extends along the vertical direction. The blind hole is recessed on the surface of the third slider towards the second slider. One end of the fastener passes through the strip-shaped hole, and the other end is connected to the blind hole. The third slider is fixed to the second slider by the fastener.

[0013] Further, the probe substrate is fixed to the top surface or the bottom surface of the third slider. The end of the probe substrate provided with the test probes extends towards the positioning base.

[0014] Further, the probe substrate includes a horizontally arranged substrate body. The test probes are vertically arranged on the top surface or the bottom surface of the substrate body. The substrate body is electrically connected to a data processing device through a data interface.

[0015] Further, the positioning base comprises a positioning base plate and four clamping blocks, the positioning base plate is detachably mounted to the top surface of the table plate, the four clamping blocks are detachably mounted to the top surface of the positioning base plate, any two adjacent clamping blocks form a gap, and the four clamping blocks enclose a containing space for containing the circuit board assembly, the containing space is matched with the shape and size of the circuit board assembly.

[0016] Further, the cover plate assembly comprises a liftable cover plate, at least one strip-shaped block extending horizontally is arranged at the edge of the cover plate, and the strip-shaped block is located above the positioning base.

[0017] Further, the cover plate assembly comprises a back plate support, a second pressing clamp and guide columns, the back plate support is fixed to the top surface of the table plate, the second pressing clamp is fixed to the back plate support, the second pressing clamp comprises a second wrench and a second connecting rod, one end of the second connecting rod is connected to the cover plate, and the other end of the second connecting rod is hingedly connected to the second wrench, one end of the guide column is vertically connected to the top surface of the table plate, and the other end of the guide column is connected to the back plate support, the cover plate is provided with cover plate through holes, each guide column passes through a cover plate through hole, and when the second wrench is pulled, the cover plate is driven by the second connecting rod to move up and down along the guide column.

[0018] Further, the cover plate assembly comprises a limiting block, one end of the limiting block is fixed to the top surface of the cover plate, and the other end of the limiting block vertically extends downward.

[0019] Further, the circuit board assembly comprises a circuit board, and the surface of the circuit board is provided with two or more test points; when the circuit board assembly is mounted to the positioning base, one end of the probe base plate provided with test probes can be translated to above or below the circuit board, and each test probe can be arranged opposite to a test point.

[0020] The circuit board assembly test fixture has the advantages that the test probe is changed from a traditional fixed structure into a translational structure, the test probe is translated into the shell of the circuit board assembly, the test contacts on the circuit board and the test probe on the probe base plate can be contacted by slightly pressing the shell of the circuit board assembly, the circuit board and the electronic test equipment are effectively electrically connected, and the functional test of the circuit board is completed.

[0021] In some scenarios, due to the irregular shape of the circuit board or the large size, the jig positioning base contains small space and other factors, even if the circuit board assembly does not have a shell, the straight up and down movement on the jig cannot ensure that the test contacts can touch the test probe, and the jig of the utility model can also be used to translate the test probe to the test contacts of the circuit board from the side, and then complete the functional test of the circuit board. BRIEF DESCRIPTION OF DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0023] Figure 1 is a schematic diagram of the overall structure of the circuit board assembly described in the embodiments of the present application;

[0024] Figure 2 is a schematic diagram of the structure of the circuit board assembly after removing the bottom shell described in the embodiments of the present application;

[0025] Figure 3 is a schematic diagram of the overall structure of the circuit board assembly test jig described in the embodiments of the present application;

[0026] Figure 4 is a schematic diagram of the structure of the test bench described in the embodiments of the present application;

[0027] Figure 5 is a schematic diagram of the structure of the positioning base described in the embodiments of the present application;

[0028] Figure 6 is a schematic diagram of the structure of the probe assembly described in the embodiments of the present application;

[0029] Figure 7 is a schematic diagram of the exploded structure of the three sliders in the probe assembly described in the embodiments of the present application;

[0030] Figure 8 is a schematic diagram of the use state of the circuit board assembly test jig described in the embodiments of the present application;

[0031] Figure 9 is a schematic diagram of the structure of the circuit board and the probe substrate interface described in the embodiments of the present application.

[0032] BRIEF DESCRIPTION OF DRAWINGS:

[0033] 100 test bench, 110 support bottom plate, 120 support column, 130 table plate;

[0034] 200 positioning base, 210 positioning substrate, 220 clamping block, 221 second notch, 230 first notch, 240 accommodating space

[0035] 300 probe assembly, 310 first slider, 311 sliding connecting piece, 320 second slider, 321 bar-shaped hole, 330 third slider, 331 blind hole, 340 linear guide rail, 350 first pressing clamp, 351 first wrench, 352 first connecting rod, 360 fastener, 370 probe substrate, 371 test probe, 372 substrate body, 380 cushion block

[0036] 400 cover plate assembly, 410 back plate support, 411 vertical plate, 412 back plate, 413 boss, 430 cover plate, 431 bar-shaped block, 440 second pressing clamp, 441 second wrench, 442 second connecting rod, 450 limiting block, 451 horizontal block, 452 vertical block

[0037] 900 circuit board assembly, 910 housing, 911 housing opening, 920 circuit board, 921 test contact. DETAILED DESCRIPTION

[0038] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application. In addition, it should be understood that the specific embodiments described herein are only used to illustrate and explain the present application, and are not used to limit the present application. In the present application, the orientation words such as "upper", "lower", "left", "right" generally refer to the upper, lower, left and right of the device in the actual use or working state, and specifically refer to the direction of the drawing surface in the drawings.

[0039] It should be noted that the description order of the following embodiments is not used as a limitation on the preferred order of the embodiments of the present application. In the following embodiments, the description of each embodiment is focused on, and the parts not described in detail in a certain embodiment can be referred to the related description of other embodiments.

[0040] The present embodiment provides a circuit board assembly test fixture for testing a circuit board assembly with or without a housing.

[0041] As shown in Figures 1-2 The circuit board assembly 900 described in the present embodiment includes a housing 910, one end of the housing 910 is provided with a detachable or shell switch cover (not shown in the figure), when the cover is opened or removed, one end of the housing 910 forms a housing opening 911.

[0042] The circuit board 920 is provided with a plurality of test contacts 921 arranged in an array at one end close to the opening 911 of the shell 910. In this embodiment, the lower surface of one end of the circuit board 920 is provided with a contact module, and the contact module includes eight test contacts 921 arranged in a 2*4 matrix. In other embodiments, the circuit board assembly 900 can also be a finished circuit board without a shell, and can have more or fewer test contacts.

[0043] As shown in Figures 3-4 , the circuit board assembly test fixture described in this embodiment includes a test table 100, and the test table 100 includes a rectangular ring-shaped support base plate 110. Four support columns 120 of the same length are provided at the four corners of the support base plate 110, and a horizontal table plate 130 is provided at the top of the support columns 120. The test table 100 is stable in structure and will not shake.

[0044] As shown in Figure 3 , the circuit board assembly test fixture further includes a positioning base 200 fixed to the top surface of the table plate 130, a probe assembly 300, and a cover plate assembly 400.

[0045] As shown in Figure 5 , the positioning base 200 includes a positioning base plate 210 and four clamping blocks 220. The positioning base plate 210 is detachably mounted to the top surface of the table plate 130, and the positioning base plate 210 is rectangular and has two mutually perpendicular central axes. The four clamping blocks 220 are detachably mounted to the four corners of the top surface of the positioning base plate 210, and a first gap 230 is formed between any two adjacent clamping blocks 220.

[0046] In this embodiment, the four clamping blocks 220 of the positioning base 200 are each provided with an L-shaped second gap 221, and the second gaps 221 of the four clamping blocks 220 are opposite to each other and form a rectangular accommodation space 240 for accommodating the circuit board assembly 900. The shape and size of the accommodation space 240 match those of the circuit board assembly 900. In this embodiment, the shape of the shell 910 is a rectangular parallelepiped, and therefore the shape of the accommodation space 240 is also a rectangular parallelepiped, and the size of the accommodation space 240 matches that of the shell 910. The shell 910 of the circuit board assembly 900 can be fitted into the rectangular accommodation space 240. When the shell cover is opened or removed, one end of the shell 910 forms a shell opening 911, and when the circuit board assembly 900 is placed on the positioning base 200, the shell opening 911 is arranged opposite and adjacent to the first gap 230 of the positioning base 200 facing the probe assembly 300.

[0047] As shown in Figure 3 , Figure 6 , Figure 7As shown, the probe assembly 300 comprises at least one linear guide rail 340 fixed to the top surface of the table plate and a first pressing clamp 350, the extending direction of the linear guide rail 340 is consistent with the direction of one of the central axes of the positioning base 200. The probe assembly 300 further comprises a first sliding block 310, a second sliding block 320 and a third sliding block 330.

[0048] The first sliding block 310 is slidably installed to the linear guide rail 340 through a sliding connector 311 at the bottom thereof. The second sliding block 320 is a flat plate fixed perpendicularly to the top surface of the first sliding block 310, and the third sliding block 330 is detachably fixed to the side surface of the second sliding block 320 facing the positioning base 300.

[0049] The second sliding block 320 is provided with a strip-shaped hole 321 extending along the vertical direction, and the surface of the third sliding block 330 facing the second sliding block 320 is provided with a concave blind hole 331. The probe assembly 300 further comprises a fastener 360, preferably a bolt, one end of which with a larger width penetrates through the strip-shaped hole 321, and the other end thereof is connected to the blind hole 331.

[0050] The first pressing clamp 350 comprises a first wrench 351 and a first connecting rod 352, one end of the first connecting rod 352 is connected to the first sliding block 310, and the other end thereof is hingedly connected to the first wrench 351. The first connecting rod 352 is horizontally arranged, and the central axis of the first connecting rod 352 is parallel to the extending direction of the linear guide rail 340. When the first wrench 351 is pulled, the first connecting rod 352 can drive the first sliding block 310 to horizontally displace on the linear guide rail 340.

[0051] The probe assembly 300 further comprises a probe substrate 370, one end of which is fixed to the bottom surface of the third sliding block 330 through a pad 380, and the upper surface of the other end thereof is provided with a test probe module, and the probe substrate 370 extends towards the positioning base 200. Each test probe module has a plurality of test probes 371 arranged in a matrix and extending vertically from bottom to top. In this embodiment, the test probe module comprises eight test probes arranged in a 2*4 matrix.

[0052] The probe substrate 370 comprises a substrate body 372 arranged horizontally, and the test probes 371 are vertically arranged on the top surface of the substrate body 372; and the substrate body 372 is electrically connected to an electronic test device (not shown) through a connecting circuit board or a data interface (not shown). The length of the probe substrate 370 in the extending direction is greater than the length of the third sliding block 330, and the test probe module composed of a plurality of test probes is exposed outside the coverage area of the third sliding block 330.

[0053] As Figure 8As shown, in this embodiment, the fastener 360 is used to fix the third slider 330 to the second slider 320 through the strip-shaped hole 321, and the height of the fastener 360 on the strip-shaped hole 321 can be freely adjusted, so that the height of the third slider 330 and the probe substrate 370 can be adjusted. The probe substrate 370 is fixed to the bottom surface of the third slider 330 through the cushion block 380, and after the third slider 330 is fixed by the fastener, the user can select a cushion block 380 with different height or without the cushion block 380 to adjust the height of the probe substrate 370. The user can determine the appropriate height of the probe substrate 370 according to the height of the circuit board 920 on the positioning base 200, so as to adjust the height.

[0054] As shown in FIG. 6, Figure 8 , Figure 9 After the first wrench 351 is inwardly turned, the end of the probe substrate 370 provided with the test probes can pass through the first gap 230 of the positioning base 200, pass through the shell opening 911 of the circuit board assembly 900, and extend into the shell 910 of the circuit board assembly 900, so that each test probe 371 is arranged opposite to a test contact 921 on the bottom surface of the circuit board 920. The third slider 330 and the cushion block 380 abut against the surface of the shell 910 of the circuit board assembly 900, thereby limiting the length of the probe substrate 370 extending into the shell 910, and preventing the damage of the components in the circuit board assembly.

[0055] As shown in FIG. 6, Figure 3 , Figure 8 The cover assembly 400 includes a back plate support 410 fixed to the top surface of the table plate 130, two guide columns 420, a liftable cover plate 430, and a second pressing clamp 440.

[0056] The back plate support 410 is a vertical stand, which includes two vertical plates 411 arranged in parallel, and a back plate 412 arranged vertically on the top of the vertical plates 411 and facing the positioning base 200, and the surfaces of the back plate 412 on both sides are perpendicular to the top surface of the table plate 130. The bottom ends of the surfaces of the back plate 412 facing the positioning base 200 are respectively provided with a horizontal boss 413; one end of each guide column 420 is connected to the top surface of the table plate 130 perpendicularly, and the other end is connected to one boss 413 of the back plate support 410.

[0057] The cover plate 430 is provided with two cover plate through holes 431, and each guide column 420 can slidably pass through one cover plate through hole (not shown in the figure); the edges of the cover plate 430 are provided with two strip-shaped blocks 431 extending in the horizontal direction, and the two strip-shaped blocks 431 are located above the positioning base 200.

[0058] The second pressing clamp 440 is fixed to the top of the back plate support 410, and includes a second wrench 441 and a second connecting rod 442. The second wrench 441 is fixed to the top center of the surface of the back plate 412 towards the positioning base 200, and the second connecting rod 442 is vertically arranged, with one end connected to the top of the cover plate 430 and the other end hinged to the second wrench 441.

[0059] As shown in Figure 8 , Figure 9 When the second wrench 441 is pulled, the cover plate 430 is moved up and down along the two guide columns 420 by the second connecting rod 442. When the circuit board assembly 900 is placed on the positioning base 200, the second wrench 441 is pulled downward, and the second connecting rod 442 pushes the cover plate 430 to the top of the shell 910 of the circuit board assembly 900, and the two strip-shaped blocks 431 slightly press down the circuit board assembly 900. If one end of the probe substrate 370 has been inserted into the shell 910 of the circuit board assembly 900, and each test probe 371 is arranged opposite to a test contact 921 on the bottom surface of the circuit board 920, after the circuit board assembly 900 is slightly pressed down, each test probe 371 is in contact with a test contact 921 on the bottom surface of the circuit board 920. Since the substrate body 373 is electrically connected to an electronic test device through a connecting circuit board or a data interface (not shown in the figure), when the plurality of test probes 371 abut against the plurality of test contacts 921, the circuit board 920 in the circuit board assembly 900 is effectively electrically connected to the electronic test device, and various tests can be completed.

[0060] The cover plate assembly 400 further includes an L-shaped limiting block 450, which includes a horizontal block 451 and a vertical block 452. One end of the horizontal block 451 is fixed to the top surface of the cover plate 430, and the other end is connected to the top end of the vertical block 452, which extends vertically downward. When the first wrench 351 is pulled inward, the second sliding block 320 is also pulled inward to be located directly below the limiting block 450; when the second wrench 441 is pulled downward, the lower surface of the horizontal block 451 abuts against the upper surface of the second sliding block 320. The limiting block 450 can effectively prevent the cover plate 430 from being pressed too low to damage the shell 910 of the circuit board assembly 900.

[0061] In the working process of the embodiment, the operation process and the use method are described below.

[0062] As shown in Figure 3 , Figure 5 , Figure 6As shown, in the initial state, the first wrench 351 of the first pressing clamp 350 is pulled outward and upward, and the probe base plate 370 is positioned opposite the notch 230 at one end of the positioning base 200. The user places the circuit board assembly 900 in the accommodating space 240 of the positioning base 200 and adjusts the height of the probe base plate 370 so that the probe base plate 370 is positioned opposite the housing opening 911 of the circuit board assembly 900 and is slightly lower than the height of the circuit board 920. The height difference between the two is slightly longer than the length of the test probe.

[0063] like Figures 1-2 、 Figures 5-8 As shown, the tester pulls the first wrench 351 of the first pressure clamp 350 inward, and the first connecting rod 352 pushes the first slider 310, the second slider 320, and the third slider 330 to translate along the linear guide 340 toward the positioning base 200. When the first wrench 351 is fully pulled, one end of the test probe provided on the probe base 370 passes through the first notch 230 of the positioning base 200, through the housing opening 911 of the circuit board assembly 900, and into the housing 910 of the circuit board assembly 900, so that each test probe 371 is arranged opposite a test contact 921 on the bottom surface of the circuit board. The distance between each test probe 371 and the test contact 921 is very small, preferably less than 3 mm.

[0064] like Figure 8 As shown, the tester pulls the second wrench 441 of the second pressing clamp 440 downward, and the second connecting rod 442 pushes the cover 430 downward. The two bar blocks 431 of the cover 430 are pressed down to the top of the shell 910 of the circuit board assembly 900, pressing the shell 910 slightly downward.

[0065] like Figure 9 As shown, since one end of the probe substrate 370 has previously been inserted into the housing 910 of the circuit board assembly 900, and each test probe 371 is positioned opposite a test contact 921 on the bottom surface of the circuit board 920, after the circuit board assembly 900 is slightly pressed downward, each test probe 371 contacts a test contact 921 on the bottom surface of the circuit board 920. Since the substrate body 372 is electrically connected to an electronic test device via a connecting circuit board or data interface (not shown), when multiple test probes 371 abut the multiple test contacts 921, the circuit board 920 in the circuit board assembly 900 is effectively electrically connected to the electronic test device, allowing various tests to be completed.

[0066] After the test is completed, the tester first pulls the second wrench 441 of the second pressing clamp 440 upward, so that the plurality of test probes 371 are separated from the plurality of test contacts 921; then the first wrench 351 of the first pressing clamp 350 is pulled outward, the first connecting rod 352 pulls the first slide block 310, the second slide block 320 and the third slide block 330 to translate along the linear guide rail 340 away from the positioning base 200, and the probe substrate 370 is translated out of the shell 910. The tester removes the circuit board assembly 900 that has completed the test from the positioning base 200, places another circuit board assembly 900 that needs to be tested on the positioning base 200, and repeats the above operation steps to complete the test of a plurality of similar circuit board assemblies.

[0067] The utility model provides a kind of circuit board assembly test fixture, test probe is changed from fixed structure to translational structure, test probe is translated to the shell of circuit board assembly, by the way of slightly pressing circuit board assembly shell, so that the test contact on circuit board and the test probe on probe substrate can be contacted, so that circuit board and electronic test equipment are effectively electrically connected, and then the functional test of circuit board is completed.

[0068] In some scenarios, due to the irregular shape of the circuit board or the large size, the small space of the jig positioning base, etc. Even if the circuit board assembly does not have a shell, the straight up and down movement on the jig cannot ensure that the test contact can touch the test probe. The jig of the utility model can also be used to translate the test probe to the test contact below the circuit board from the side, and then complete the functional test of the circuit board.

[0069] The above describes a circuit board assembly test fixture in detail. This article applies specific examples to explain the principles and implementation methods of the application. The above examples are only used to help understand the method and its core idea. For those skilled in the art, according to the idea of the application, the specific implementation and application range will be changed. In summary, the content of this specification should not be understood as a limitation of the application.

Claims

1. A circuit board assembly test fixture, comprising: comprising: a test bench including a horizontally arranged table board; a positioning base fixed to a top surface of the table board; a cover plate assembly fixed to the top surface of the table board; and a probe assembly fixed to the top surface of the table board, the probe assembly including a probe base plate capable of horizontal translation, the probe base plate having two or more test probes at one end thereof facing the positioning base, the probe base plate having the end with the test probes capable of translation into the positioning base.

2. The circuit board assembly test fixture of claim 1, wherein the probe assembly includes: a linear guide fixed to the top surface of the table board, the linear guide extending in a direction coinciding with a central axis of the positioning base; a first sliding block slidably mounted to the linear guide; and a first pressing clamp fixed to the top surface of the table board, the first pressing clamp including a first wrench and a first connecting rod, one end of the first connecting rod being connected to the first sliding block and the other end being hingedly connected to the first wrench.

3. The circuit board assembly test fixture of claim 2, wherein the probe assembly includes: a second sliding block fixed to a top surface of the first sliding block; and a third sliding block detachably fixed to a side surface of the second sliding block facing the positioning base. The probe assembly further includes: a strip-shaped hole extending through the second sliding block in a vertical direction; and a blind hole recessed in a surface of the third sliding block facing the second sliding block, 4. The circuit board assembly test fixture of claim 3, wherein, a fastener having one end passing through the strip-shaped hole and the other end being connected to the blind hole, the third sliding block being fixed to the second sliding block by the fastener.

5. The circuit board assembly test fixture of claim 3, wherein the probe base plate is fixed to a top surface or a bottom surface of the third sliding block, and the end of the probe base plate with the test probes extends toward the positioning base.

6. The circuit board assembly test fixture of claim 1, wherein the probe base plate includes a horizontally arranged base plate body, the test probes are vertically arranged on a top surface or a bottom surface of the base plate body, and the base plate body is electrically connected to a data processing device through a data interface.

7. The circuit board assembly test fixture of claim 1, wherein the positioning base includes: a positioning base plate detachably mounted to the top surface of the table board; and four clamping blocks detachably mounted to a top surface of the positioning base plate, any two adjacent clamping blocks forming a gap therebetween, the four clamping blocks forming a receiving space for receiving a circuit board assembly, the receiving space having a shape and a size matching those of the circuit board assembly.

8. The circuit board assembly test fixture of claim 1, wherein the cover plate assembly includes a cover plate capable of lifting, the cover plate having at least one strip-shaped block extending in a horizontal direction at an edge thereof, and the strip-shaped block being located above the positioning base.

9. The circuit board assembly test fixture of claim 8, wherein the cover plate assembly includes: a back plate support fixed to the top surface of the table board. ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ a second pressing jaw fixed to the back plate support; the second pressing jaw comprises a second wrench and a second connecting rod, one end of the second connecting rod is connected to the cover plate, and the other end is hingedly connected to the second wrench; and a guide column, one end of which is connected perpendicularly to the top surface of the table plate, and the other end of which is connected to the back plate support; the cover plate is provided with a cover plate through hole, and each guide column passes through a cover plate through hole; when the second wrench is pulled, the cover plate is driven by the second connecting rod to move up and down along the guide column.

10. The circuit board assembly test fixture of claim 1, wherein the cover plate assembly comprises a limiting block, one end of which is fixed to the top surface of the cover plate, and the other end of which extends vertically downward.

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