Pulse current flexible probe of power semiconductor device

Abstract

The utility model relates to the technical field of flexible current probes, in particular to a flexible pulse current probe of a power semiconductor device, which comprises a flexible current probe body, a coil is inserted on the right side of the flexible current probe body, and a connecting wire is inserted on the right side of the flexible current probe body. A supporting plate is rotatably mounted at the lower end of the current flexible probe body, a groove is formed in the lower side of the left end of the current flexible probe body, and a limiting assembly is arranged on the upper side of the left end of the supporting plate. The two groups of first connecting blocks, the two groups of second connecting blocks and the four groups of sliding blocks slide in the four groups of sliding grooves, and the two groups of screws are rotated to drive the two groups of first connecting blocks to move downwards, so that the supporting plate can be rotationally opened on the lower side of the current flexible probe body, and the current flexible probe body can be conveniently placed on a table top when not held; the indicating lamp on the current flexible probe body can be conveniently and directly checked, and the current flexible probe is convenient to take.

Description

Technical Field

[0001] This utility model relates to the field of flexible current probe technology, specifically a flexible pulse current probe for power semiconductor devices. Background Technology

[0002] A current probe is a magnetic ring designed based on Faraday's principle to measure interfering current signals in a conductor; essentially, it's a transformer with one turn. A current probe can measure the magnitude of the current flowing through a conductor. Current probes are divided into AC / DC current probes and AC current probes. The former can measure both direct current and alternating current, while the latter can only measure alternating current.

[0003] Existing pulse current flexible probes lack a support structure for the main body. When using the coil of the pulse current flexible probe for measurement, it is impossible to hold both the pulse current flexible probe and the coil at the same time, which means that the pulse current flexible probe needs to be placed on a table or the ground, which is not convenient. When using the pulse current flexible probe or detecting another set of currents, the tester has to frequently pick up and drop the pulse current flexible probe and the coil, which is too cumbersome. To solve the above problems, we propose a power semiconductor device pulse current flexible probe. Utility Model Content

[0004] The purpose of this invention is to provide a flexible pulse current probe for power semiconductor devices, in order to solve the problem mentioned in the background art that when using the coil of the flexible pulse current probe for measurement, it is impossible to hold the flexible pulse current probe and the coil at the same time, which means that the flexible pulse current probe needs to be placed on a table or the ground, which is not convenient. When using the flexible pulse current probe or detecting another set of currents, the tester has to frequently pick up and drop the flexible pulse current probe and the coil.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a flexible pulse current probe for a power semiconductor device, comprising a flexible current probe body.

[0006] A coil is inserted into the right side of the flexible current probe body, a connecting wire is inserted into the right side of the flexible current probe body, a support plate is rotatably mounted on the lower end of the flexible current probe body, a groove is opened on the lower left side of the flexible current probe body, a limit component is provided on the upper left side of the support plate, the limit component is inserted into the groove, and adjustment components are provided on the front and rear sides of the flexible current probe body and the support plate.

[0007] Preferably, the limiting component includes a protrusion, which is fixedly installed on the upper left side of the support plate. The protrusion has a movable groove, and multiple sets of springs are installed in the movable groove. Movable blocks are movably installed in the multiple sets of movable grooves, and the movable blocks are in contact with the inner right side wall of the groove.

[0008] Preferably, an anti-slip pad is glued to the right side of the movable block, and the anti-slip pad is made of rubber.

[0009] Preferably, the upper right side of the movable block is inclined.

[0010] Preferably, the adjustment assembly includes four sets of sliding grooves, which are respectively opened on the front and rear sides of the flexible current probe body and the support plate. A slider is movably installed in each of the four sets of sliding grooves. A first connecting block is provided on the front and rear sides of the support plate, and a second connecting block is provided on the front and rear sides of the flexible current probe body. The two sets of first connecting blocks are rotatably connected to the sliders on the front and rear sides of the support plate, and the two sets of second connecting blocks are connected to two sets of sliders on the flexible current probe body. A screw is rotatably installed on each of the two sets of first connecting blocks, and the two sets of screws are threaded into the two sets of second connecting blocks.

[0011] Preferably, the inner walls of the four sets of slide grooves and the four sets of sliders are all T-shaped, and the four sets of sliders are adapted to the inner walls of the four sets of slide grooves.

[0012] Compared with the prior art, the beneficial effects of this utility model are as follows: This utility model uses two sets of first connecting blocks, two sets of second connecting blocks, and four sets of sliders to slide in four sets of sliding grooves. By rotating two sets of screws to move the two sets of first connecting blocks downwards, the support plate can be rotated and opened under the flexible current probe body. This allows the flexible current probe body to be placed on a table when not being held, making it easy to directly view the indicator lights on the flexible current probe body and to easily pick it up. The support plate is flipped under the flexible current probe body and attached to the lower right side of the flexible current probe body. The two sets of first connecting blocks, two sets of second connecting blocks, and four sets of sliders slide in the four sets of sliding grooves. By rotating two sets of screws, the two sets of first connecting blocks and two sets of sliders are aligned with the two sets of sliding grooves after the support plate is flipped. By inserting the two sets of first connecting blocks and two sets of sliders into the two sets of sliding grooves on the support plate, the support plate can be fixed after flipping. The flexible current probe body is suspended by the protrusions and movable blocks, making it easy to place the flexible current probe body in a higher position for easy viewing and retrieval at any time. Attached Figure Description

[0013] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0014] Figure 1 This is a front view schematic diagram of the structure of this utility model;

[0015] Figure 2 This is a front view of the structure of the support plate in this utility model.

[0016] Figure 3 This is a front-view, flipped schematic diagram of the support plate structure in this utility model;

[0017] Figure 4 This is a schematic diagram of the left cross-sectional view of the structure of this utility model;

[0018] Figure 5 This is a front sectional view of the structure of this utility model;

[0019] Figure 6 This utility model Figure 5 A magnified view of part A in the diagram.

[0020] In the diagram: 1. Flexible current probe body; 2. Coil; 3. Connecting wire; 4. Support plate; 5. Groove; 6. Protrusion; 7. Movable groove; 8. Spring; 9. Movable block; 10. Anti-slip pad; 11. Slide groove; 12. Slider; 13. First connecting block; 14. Second connecting block; 15. Screw. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Please see Figure 1-6 One embodiment of this utility model is a flexible pulse current probe for a power semiconductor device, comprising a flexible current probe body 1.

[0023] A coil 2 is inserted into the right side of the flexible current probe body 1, and a connecting wire 3 is inserted into the right side of the flexible current probe body 1. A support plate 4 is rotatably mounted on the lower end of the flexible current probe body 1. A groove 5 is opened on the lower left side of the flexible current probe body 1. A limit component is provided on the upper left side of the support plate 4, and the limit component is inserted into the groove 5. Adjustment components are provided on the front and rear sides of the flexible current probe body 1 and the support plate 4. This device allows the flexible current probe body 1 to be placed vertically on the table by rotating the support plate 4 and locking it through the adjustment components. The support plate 4 can be flipped over by the adjustment components, and then the flexible current probe body 1 can be suspended by the upper limit component of the support plate 4, which facilitates the use of the flexible current probe body 1.

[0024] Furthermore, the limiting component includes a protrusion 6, which is fixedly installed on the upper left side of the support plate 4. A movable groove 7 is provided in the protrusion 6, and multiple sets of springs 8 are installed in the movable groove 7. A movable block 9 is movably installed in the multiple sets of movable grooves 7. The movable block 9 is in contact with the inner right side wall of the groove 5. After the device is flipped by the support plate 4, the movable block 9 pops out under the elastic force of the multiple sets of springs 8. The flexible current probe body 1 is suspended and placed through the support plate 4, the protrusion 6 and the movable block 9.

[0025] Furthermore, an anti-slip pad 10 is glued to the right side of the movable block 9. The anti-slip pad 10 is made of rubber. Based on the anti-slip pad 10 on the right side of the movable block 9, when the protrusion 6 is inserted into the groove 5, the movable block 9 descends under the action of the multiple sets of springs 8 and the anti-slip pad 10 is tightly attached to the inner wall of the groove 5, so that the support plate 4 is tightly attached to the lower left side of the current flexible probe body 1, preventing the support plate 4 from rotating.

[0026] Furthermore, the upper right side of the movable block 9 is inclined. Based on the upper and lower shape of the right side of the movable block 9, this structure allows the opening of the groove 5 to press the movable block 9 when the protrusion 6 is inserted into the groove 5, thereby pressing the movable block 9 into the movable groove 7.

[0027] Furthermore, the adjustment assembly includes four sets of sliding grooves 11, which are respectively opened on the front and rear sides of the flexible current probe body 1 and the support plate 4. Each of the four sets of sliding grooves 11 has a slider 12 movably installed in it. Each of the front and rear sides of the support plate 4 has a first connecting block 13, and each of the front and rear sides of the flexible current probe body 1 has a second connecting block 14. The two sets of first connecting blocks 13 are rotatably connected to the sliders 12 on the front and rear sides of the support plate 4, and the two sets of second connecting blocks 14 are connected to the two sets of sliders 12 on the flexible current probe body 1. Each of the two sets of first connecting blocks 13 has a screw 15 rotatably installed on it. The two sets of screws 15 are threaded into the two sets of second connecting blocks 14. This structure allows the support plate 4 to be rotated open or flipped at the lower end of the flexible current probe body 1 by sliding the four sets of sliders 12, the two sets of first connecting blocks 13, and the two sets of second connecting blocks 14 within the four sets of sliding grooves 11 and by rotating the two sets of screws 15 to separate the two sets of first connecting blocks 13 and the two sets of second connecting blocks 14.

[0028] Furthermore, the inner walls of the four sets of sliding grooves 11 and the four sets of sliders 12 are all T-shaped, and the four sets of sliders 12 are adapted to the inner walls of the four sets of sliding grooves 11. This structure, based on the shape of the inner walls of the four sets of sliding grooves 11 and the four sets of sliders 12, ensures that the four sets of sliders 12 will not be pulled back and forth or fall off when sliding in the four sets of sliding grooves 11.

[0029] Working principle: When using the flexible current probe body 1, such as Figure 1 , Figure 2 and Figure 4 As shown, the four sets of sliders 12 slide to the right within the four sliding grooves 11. As the four sets of sliders 12 slide, they cause the two sets of first connecting blocks 13 and the two sets of second connecting blocks 14 to move to the right. Rotating the two sets of screws 15 causes the two sets of first connecting blocks 13 to move downwards, separating them from the two sets of second connecting blocks 14. As the two sets of first connecting blocks 13 move downwards, the support plate 4 rotates and opens on the underside of the flexible current probe body 1. The two sets of sliders 12 on the two sets of first connecting blocks 13 also rotate as the support plate 4 opens, thus fixing the support plate 4 when it is unfolded. This facilitates placing the flexible current probe body 1 on a table. The four sets of sliders 12 continue to slide to the right. The two sets of sliders 12 and the two sets of first connecting blocks 13 slide out from the two sets of sliding grooves 11 on the support plate 4, flipping the support plate 4 to fit against the lower right side of the current flexible probe body 1. By twisting the two sets of screws 15, the two sets of first connecting blocks 13 and the two sets of sliders 12 are flipped and kept flush with the support plate 4. Then, the two sets of sliders 12 and the two sets of first connecting blocks 13 slide into the openings of the two sets of sliding grooves 11 on the support plate 4, which can fix the support plate 4 after it is flipped. The movable block 9 in the protrusion 6 pops out under the action of the multiple sets of springs 8. The current flexible probe body 1 is suspended by the support plate 4, the protrusion 6 and the movable block 9 for easy handling. The above is the complete working principle of this utility model.

[0030] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A flexible pulse current probe for a power semiconductor device, comprising a flexible current probe body (1), characterized in that: A coil (2) is inserted on the right side of the flexible current probe body (1), a connecting wire (3) is inserted on the right side of the flexible current probe body (1), a support plate (4) is rotatably installed at the lower end of the flexible current probe body (1), a groove (5) is opened on the lower left side of the flexible current probe body (1), a limit component is provided on the upper left side of the support plate (4), the limit component is inserted in the groove (5), and adjustment components are provided on the front and rear sides of the flexible current probe body (1) and the support plate (4).

2. The flexible pulse current probe for a power semiconductor device according to claim 1, characterized in that: The limiting component includes a protrusion (6), which is fixedly installed on the upper left side of the support plate (4). A movable groove (7) is provided in the protrusion (6), and multiple sets of springs (8) are installed in the movable groove (7). Movable blocks (9) are movably installed in the multiple sets of movable grooves (7), and the movable blocks (9) are in contact with the inner right side wall of the groove (5).

3. The flexible pulse current probe for a power semiconductor device according to claim 2, characterized in that: An anti-slip pad (10) is glued to the right side of the movable block (9), and the anti-slip pad (10) is made of rubber.

4. The flexible pulse current probe for a power semiconductor device according to claim 2, characterized in that: The upper right side of the movable block (9) is inclined.

5. A flexible pulse current probe for a power semiconductor device according to claim 1, characterized in that: The adjustment assembly includes four sets of sliding grooves (11), which are respectively opened on the front and rear sides of the flexible current probe body (1) and the support plate (4). Each of the four sets of sliding grooves (11) has a slider (12) movably installed in it. Each of the front and rear sides of the support plate (4) has a first connecting block (13), and each of the front and rear sides of the flexible current probe body (1) has a second connecting block (14). The two sets of first connecting blocks (13) are rotatably connected to the sliders (12) on the front and rear sides of the support plate (4). The two sets of second connecting blocks (14) are connected to the two sets of sliders (12) on the flexible current probe body (1). Each of the two sets of first connecting blocks (13) has a screw (15) rotatably installed on it. The two sets of screws (15) are threaded into the two sets of second connecting blocks (14).

6. The flexible pulse current probe for a power semiconductor device according to claim 5, characterized in that: The inner walls of the four sets of grooves (11) and the four sets of sliders (12) are all T-shaped, and the four sets of sliders (12) are adapted to the inner walls of the four sets of grooves (11).

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