Probe card fixing jig

Abstract

The utility model discloses a probe card fixing jig, belongs to the technical field of probe card jigs, and mainly solves the problems that in the prior art, when a fixing jig is used, only double faced adhesive tape is used for bonding and fixing, the fixing effect is poor, the fixing jig is not firm after being fixed, and a bonded probe card is inconvenient to detach and poor in practicability. The fixing jig comprises a mounting table, a positioning groove is formed in the mounting table in a penetrating mode, the positioning groove is annular, a probe card body is arranged in the positioning groove, a plurality of movable blocks are movably arranged in the positioning groove, positioning columns are fixedly connected to the tops of the movable blocks, the probe card body can be tightly pressed by the positioning columns close to one another, and the surfaces of the positioning columns are sleeved with anti-skid sleeves. A sliding groove is formed in the positioning column, a sliding block is slidably installed in the sliding groove, the surface of the sliding block is fixedly connected with a pressing plate, and the pressing plate penetrates through the positioning column.

Description

TECHNICAL FIELD

[0001] The utility model relates to probe card jig technical field, more specifically, especially, it relates to a probe card fixing jig. BACKGROUND

[0002] The probe card is a test interface, mainly tests the bare core, is composed of probe, electronic component, wire and PCB board, the probe on the probe card contacts the chip, leads out the chip signal, and then cooperates with the peripheral test instrument and software control to achieve the purpose of automatic measurement, the probe card is one of the important processes in IC manufacturing, which has a considerable influence on manufacturing cost, when detecting and maintaining the probe card, the probe card needs to be fixed on the installation table, so a fixing jig is needed to fix the probe card.

[0003] However, the types of fixing jigs in the prior art are various, such as the utility model patent CN220438394U relates to a probe card fixing jig, the utility model is provided with a reinforcing ring support, two fixing blocks and a bottom plate, the reinforcing ring support is used for fixed connection with the probe card, the two fixing blocks are fixedly installed on one side of the reinforcing ring support and are in threaded connection with the reinforcing ring support, the bottom plate is installed on the side face of the two fixing blocks away from the reinforcing ring support, and is used for fixed installation with the needle adjusting machine; the utility model mainly solves the problem of unstable connection between the probe card fixing jig in the prior art and the probe card.

[0004] Although the fixing jig can use glue to bond the probe card to complete the fixation of the probe card, the jig only relies on double-sided adhesive tape for bonding and fixation during use, which not only has poor fixation effect and is not firm after fixation, but also the bonded probe card is not convenient to disassemble, and the practicality is poor, so it is necessary to design a probe card fixing jig. SUMMARY

[0005] This section aims to outline some aspects of the embodiments of the utility model and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this section and the abstract of the specification and the utility model name to avoid obscuring the purpose of this section, the abstract of the specification and the utility model name, and such simplifications or omissions cannot be used to limit the scope of the utility model.

[0006] To achieve the above-mentioned purpose, the utility model provides a kind of probe card fixing jig, by the following specific technical means is achieved:

[0007] The utility model provides a probe card fixing jig, including installation platform, installation platform is provided with positioning slot through, positioning slot is annular, positioning slot is provided with probe card body, a plurality of movable blocks are movably arranged in the positioning slot, the top of movable block is all fixedly connected with the positioning column, a plurality of mutually close positioning column can compress the probe card body, the surface of positioning column is equipped with the antiskid sleeve, the positioning column is equipped with the sliding slot, the inside of sliding slot is slidably installed with the sliding block, the surface of sliding block is fixedly connected with the pressing plate, and the pressing plate penetrates the positioning column.

[0008] Preferably, the sliding slot is provided with a compression spring, one end of the compression spring is fixed with the sliding block, the compression spring is in a compressed state, the compression spring can push the sliding block to compress the pressing plate, the positioning column is provided with a pull rod, one end of the pull rod is fixed with the sliding block, the pull rod is located at the axis position of the compression spring, and one end of the pull rod away from the pressing plate is fixed with a pull head.

[0009] Preferably, the four peripheries of the installation platform are rotatably connected with threaded sleeves through bearings, the inner surfaces of the threaded sleeves are threadedly installed with screws, the ends of the screws close to each other extend into the positioning slot and are fixed with the movable blocks, the outer surfaces of the threaded sleeves are coaxially provided with adjusting rollers, the inner wall of the installation platform is equally provided with a plurality of guide grooves, the surfaces of the movable blocks away from each other are fixedly connected with guide rods, and the guide rods are slidably installed with the guide grooves.

[0010] Preferably, the movable blocks are located at four different positions respectively, the movable blocks close to each other can clamp the probe card body to the outer surface of the antiskid sleeve, the antiskid sleeve is made of rubber material, and the antiskid sleeve is located below the pressing plate.

[0011] Preferably, the lower portion of the installation platform is provided with a bearing frame, the bearing frame has an inverted U-shaped structure, two symmetrical fixed plates are fixed to the upper surface of the bearing frame, and the surfaces of the two fixed plates close to each other are rotatably connected with transmission shafts through bearings.

[0012] Preferably, one of the fixed plates is provided with two threaded rings, the inner surfaces of the threaded rings are threadedly installed with threaded limit rods, the outer surface of one side of the installation platform is provided with two clamping holes, the clamping holes are matched with the ends of the threaded limit rods, and the threaded limit rods can be screwed into the clamping holes.

[0013] Preferably, the ends of the transmission shafts close to each other are fixedly connected with mounting frames, the ends of the mounting frames close to each other are fixed with the installation platform, and the mounting frames can be flipped between the two fixed plates.

[0014] Due to the use of the above technical scheme, the utility model has the following advantages compared with the prior art:

[0015] When fixing the probe card to be detected and maintained, the probe card is placed on the plurality of movable blocks, then the adjusting roller is rotated to drive the threaded sleeve to rotate, and the threaded sleeve is smoothly guided through the guide rod, so that one end of the screw rod drives the positioning columns to approach each other, the probe card is clamped by the positioning columns in four directions to complete the preliminary positioning operation; after the positioning of the probe card, the compression spring drives the sliding block to slide, and the pressing plate can move together with the sliding block and approach the probe card, so that the plurality of corresponding pressing plates press the probe card, and the stability of the probe card is further improved, and the fixing effect of the probe card is ensured. BRIEF DESCRIPTION OF DRAWINGS

[0016] The accompanying drawings, which form a part of this application, are used to provide a further understanding of the application and are incorporated herein in their entirety. The embodiments of the application illustrated in the drawings are used to explain the present application and are not intended to limit the present application. In the drawings:

[0017] Figure 1 It is a perspective view of the present application;

[0018] Figure 2 It is a partial enlarged view of the present application;

[0019] Figure 3 It is a structure diagram of the movable block and the positioning column;

[0020] Figure 4 It is a structure diagram of the bearing frame, the fixed support plate, the mounting frame, the threaded ring and the threaded limiting rod;

[0021] Figure 5 It is a front view of the present application;

[0022] Figure 6 It is an enlarged structure diagram of A.

[0023] In the drawings: 1, mounting table; 2, positioning groove; 3, movable block; 4, positioning column; 5, anti-skid sleeve; 6, sliding block; 7, pressing plate; 8, probe card body; 9, threaded sleeve; 10, screw rod; 11, adjusting roller; 12, guide rod; 13, compression spring; 14, pull rod; 15, pull head; 16, bearing frame; 17, fixed support plate; 18, transmission shaft; 19, mounting frame; 20, threaded ring; 21, threaded limiting rod; 22, clamping hole. DETAILED DESCRIPTION

[0024] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific embodiments of the present application will be described in detail below with reference to the drawings.

[0025] Many specific details are set forth in the following description in order to provide a thorough understanding of the present application. However, the present application can be practiced according to other embodiments that can not be described in detail herein, and the skilled in the art will appreciate that the present application can be practiced in a variety of ways, all of which are intended to fall within the scope of the present application.

[0026] Secondly, the "one embodiment" or "embodiment" referred to herein means that the specific features, structures or characteristics can be included in at least one implementation of the present application. "In one embodiment" appearing in different places in the specification does not mean the same embodiment, nor is it an embodiment that is independent or alternative to other embodiments. The present application provides the following embodiments.

[0027] As shown in Figure 1 , Figure 2 and Figure 3 , it is a structural schematic diagram of the probe card fixing jig in the embodiment, the fixing jig in the embodiment includes a mounting table 1, the mounting table 1 is provided with a positioning groove 2, the positioning groove 2 is annular, the positioning groove 2 is provided with a probe card body 8, a plurality of movable blocks 3 are movably arranged in the positioning groove 2, the top of each movable block 3 is fixedly connected with a positioning column 4, a plurality of positioning columns 4 close to each other can compress the probe card body 8, a non-slip sleeve 5 is sleeved on the surface of the positioning column 4, a threaded sleeve 9 is rotatably connected around the mounting table 1, a screw rod 10 is screwedly installed on the inner surface of the threaded sleeve 9, one end of the plurality of screw rods 10 close to each other extends into the positioning groove 2 and is fixedly connected with the movable block 3, an adjusting roller 11 is coaxially arranged on the outer surface of the threaded sleeve 9, a plurality of guide grooves are equidistantly formed in the inner wall of the mounting table 1, a guide rod 12 is fixedly connected to the surface of each movable block 3 away from each other, and the guide rod 12 and the guide groove slide relative to each other; when fixing the probe card to be detected and maintained, the probe card is placed on the plurality of movable blocks 3, then the adjusting roller 11 is rotated, the threaded sleeve 9 is driven by the adjusting roller 11, the screw rod 10 is driven by one end of the threaded sleeve 9, the plurality of positioning columns 4 are driven to move close to each other, and the non-slip sleeve 5 is arranged, the probe card is clamped by the positioning columns 4 in four directions to complete the preliminary positioning work.

[0028] As shown in Figure 3As shown in the figure, the sliding slot is internally slidably installed with a sliding block 6, the surface of the sliding block 6 is fixedly connected with a pressing plate 7, the pressing plate 7 is internally provided with a compression spring 13 penetrating through the sliding slot of the positioning column 4, one end of the compression spring 13 is fixedly connected with the sliding block 6, the compression spring 13 is in a compressed state, the compression spring 13 can push the sliding block 6 to compress the pressing plate 7 against the probe card body 8, the positioning column 4 is penetratingly provided with a pull rod 14, one end of the pull rod 14 is fixedly connected with the sliding block 6, the pull rod 14 is located at the axial position of the compression spring 13, one end of the pull rod 14 away from the pressing plate 7 is fixedly provided with a pulling head 15, after the probe card is positioned, the probe card body 8 is placed between the movable block 3 and the pressing plate 7, through the guidance between the sliding slot and the sliding block 6, the compression spring 13 is driven to slide by the resilience of the compression spring 13, the pressing plate 7 can move together with the sliding block 6 and approach the placed probe card body 8, so that multiple corresponding pressing plates 7 compress the probe card, further improving the stability of the probe card, thereby ensuring good fixing effect of the probe card, being more firm and practical.

[0029] As shown in the figure, Figure 4 and Figure 5 As shown in the figure, the lower side of the mounting table 1 is provided with a bearing frame 16, the bearing frame 16 can support the deflectable mounting table 1, the bearing frame 16 is in an inverted U shape, two symmetrically arranged fixed supporting plates 17 are fixed to the upper surface of the bearing frame 16, the mutually approaching surfaces of the two fixed supporting plates 17 are both rotatably connected with a transmission shaft 18 through a bearing, the mutually approaching ends of the transmission shaft 18 are both fixedly connected with a mounting frame 19, the mutually approaching ends of the mounting frame 19 are fixedly connected with the mounting table 1, and the mounting frame 19 can be flipped between the two fixed supporting plates 17.

[0030] In addition, as shown in the figure, Figure 4 and Figure 6 As shown in the figure, one of the two fixed supporting plates 17 is penetratingly provided with two threaded rings 20, the inner surfaces of the threaded rings 20 are both threadedly installed with a threaded limiting rod 21, the outer surface of one side of the mounting table 1 is provided with two clamping holes 22, and the clamping holes 22 are matched with the ends of the threaded limiting rods 21, and the threaded limiting rods 21 can be screwed to embed the ends into the clamping holes 22, in order to detect and maintain the back of the probe card, the probe card body 8 needs to be flipped, the threaded rings 20 and the threaded limiting rods 21 are threadedly matched, the threaded limiting rods 21 are respectively loosened, the ends of the threaded limiting rods 21 are withdrawn from the clamping holes 22, the mounting table 1 is flipped by half a circle through the transmission shaft 18, so that the clamping holes 22 are respectively aligned with the other threaded limiting rods 21, the ends of the threaded limiting rods 21 are re-embedded into the clamping holes 22, and the flipped probe card is limited and fixed, thereby conveniently flipping the back of the mounting table 1 to face upward, and detecting and maintaining the back of the probe card.

[0031] The plurality of movable blocks 3 are respectively located in four different positions in this embodiment, and the anti-skid sleeve 5 is made of rubber material and is located below the pressing plate 7.

[0032] Although the embodiments of the present application have been shown and described, it is to be understood that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present application, and the scope of the present application is defined by the appended claims and their equivalents.

Claims

1. A probe card fixing fixture, comprising a mounting platform (1), wherein a positioning groove (2) is provided through the mounting platform (1), the positioning groove (2) is annular, and a probe card body (8) is disposed within the positioning groove (2), characterized in that: Multiple movable blocks (3) are movably arranged in the positioning groove (2). The top of each movable block (3) is fixedly connected to a positioning post (4). Multiple positioning posts (4) that are close to each other can press the probe card body (8). The surface of the positioning post (4) is covered with an anti-slip sleeve (5). A sliding groove is opened in the positioning post (4). A slider (6) is slidably installed inside the sliding groove. A pressure plate (7) is fixedly connected to the surface of the slider (6), and the pressure plate (7) penetrates the positioning post (4).

2. The probe card fixing fixture according to claim 1, characterized in that: A compression spring (13) is installed in the slide groove, and one end of the compression spring (13) is fixed to the slider (6). The compression spring (13) is in a compressed state and can push the slider (6) to make the pressure plate (7) press the probe card body (8). A pull rod (14) is installed through the positioning post (4). One end of the pull rod (14) is fixedly connected to the slider (6). The pull rod (14) is located at the axis of the compression spring (13). A pull head (15) is fixed at the end of the pull rod (14) away from the pressure plate (7).

3. The probe card fixing fixture according to claim 1, characterized in that: The mounting platform (1) is rotatably connected to threaded sleeves (9) by bearings on all four sides. The inner surface of the threaded sleeves (9) is threaded with screws (10). The ends of the multiple screws (10) that are close to each other extend into the positioning grooves (2) and are fixed to the movable blocks (3). The outer surface of the threaded sleeves (9) is coaxially provided with adjusting rollers (11). The inner wall of the mounting platform (1) is provided with multiple guide grooves at equal intervals. The surfaces of the multiple movable blocks (3) that are far apart from each other are fixedly connected with guide rods (12), and the guide rods (12) are slidably installed with the guide grooves.

4. The probe card fixing fixture according to claim 1, characterized in that: Multiple movable blocks (3) are located in four different positions. The movable blocks (3) that are close to each other can clamp the probe card body (8) onto the outer surface of the anti-slip sleeve (5). The anti-slip sleeve (5) is made of rubber material and is located below the pressure plate (7).

5. A probe card fixing fixture according to claim 1, characterized in that: A support frame (16) is provided below the mounting platform (1). The support frame (16) is in the shape of an inverted U. Two symmetrically arranged fixed support plates (17) are fixed to the upper surface of the support frame (16). The surfaces of the two fixed support plates (17) that are close to each other are connected to a drive shaft (18) through a bearing.

6. A probe card fixing fixture according to claim 5, characterized in that: One of the fixed support plates (17) has two threaded rings (20) through it. The inner surface of each threaded ring (20) is threaded with a threaded limiting rod (21). The outer surface of one side of the mounting platform (1) has two snap-fit ​​holes (22), and the snap-fit ​​holes (22) match the ends of the threaded limiting rods (21). Tightening the threaded limiting rods (21) will allow one end of them to be inserted into the snap-fit ​​holes (22).

7. A probe card fixing fixture according to claim 5, characterized in that: The drive shafts (18) are fixedly connected to each other at their close ends, and the close ends of the mounting brackets (19) are fixed to the mounting platform (1). The mounting brackets (19) can be flipped between the two fixed support plates (17).

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