Testing head structure and testing device with same

Abstract

The utility model provides a testing head structure and a testing device with the same. The testing head structure comprises a connecting assembly which comprises a first connecting piece and a second connecting piece which are connected with each other; at least part of the abutting and pushing structure is used for being connected with the connecting assembly, the abutting and pushing end of the abutting and pushing structure is arranged opposite to the first connecting piece, and the abutting and pushing structure is movably arranged in the first direction so as to be close to or away from the first connecting piece and drive the first connecting piece to move; and the connecting assembly is movably arranged along a second direction relative to the pushing structure, so that the second connecting piece is close to or far away from the pushing structure, and the connecting assembly moves to a plugging position matched with the size of the to-be-tested port. According to the technical scheme provided by the utility model, the technical problem that the test head structure in the prior art is inconvenient to plug and unplug quickly can be solved.

Description

TECHNICAL FIELD

[0001] The utility model relates to test device technical field, specifically, relate to a test head structure and have its test device. BACKGROUND

[0002] At present, IO module (input output module) is the input output module in machine tool control system. In modern industrial machine tool or automatic production line, IO module is the important part of connecting control system and peripheral equipment, and it realizes the control system and peripheral equipment information interaction and control function, and IO module is the bridge of machine tool system and peripheral equipment. The input output terminal of IO module mostly uses screw type terminal, because the terminal is stable and reliable, has excellent electrical characteristics, and is easy to maintain.

[0003] However, when the quality of IO module is checked and function is verified, because the terminal quantity is numerous, the test method of the signal of the terminal is led out in the mode of wiring is low in efficiency. When IO module is screened and function is verified, sometimes need to repeatedly rewire each IO module, but the wiring step is more complicated, leads to difficult to realize the quick plug and the signal leading out of all input output terminals, has affected the efficiency of test. UTILITARIAN CONTENT

[0004] The main purpose of the utility model is to provide a test head structure and test device with it, so as to solve the technical problem that the test head structure in the prior art is inconvenient for quick plug.

[0005] In order to achieve the above purpose, according to one aspect of the utility model, a test head structure is provided, which comprises:

[0006] The connecting assembly comprises a first connecting piece and a second connecting piece connected with each other;

[0007] The push structure is at least partially connected with the connecting assembly, the push end of the push structure is arranged opposite to the first connecting piece, and the push structure is movably arranged along the first direction to approach or move away from the first connecting piece and drive the first connecting piece to move; the connecting assembly is movably arranged along the second direction relative to the push structure, so that the second connecting piece approaches or moves away from the push structure, so that the connecting assembly moves to the plug-in position suitable for the size of the to-be-tested port.

[0008] Further, the push structure comprises:

[0009] The circuit board forms at least part of the push structure.

[0010] Further, the pushing structure further comprises a buffer, the buffer is arranged at one end of the circuit board close to the first connecting piece; the buffer forms a pushing end of the pushing structure;

[0011] The buffer is a rubber piece; and / or,

[0012] The buffer protrudes from both sides of the circuit board.

[0013] Further, the test head structure further comprises an elastic piece;

[0014] The one end of the elastic piece is connected with the circuit board, and the other end of the elastic piece is connected with the second connecting piece; and / or,

[0015] The elastic piece is made of a conductive material; and / or,

[0016] The elastic piece is a spring structure.

[0017] Further, the connecting assembly is at least two, one and the other of the at least two connecting assemblies are oppositely and spacedly arranged, and the pushing structure is located between the one and the other of the at least two connecting assemblies; or,

[0018] The test head structure further comprises a fixed connecting assembly, the fixed connecting assembly is fixedly connected with the pushing structure, the connecting assembly and the fixed connecting assembly are oppositely and spacedly arranged, and the pushing structure is located between the connecting assembly and the fixed connecting assembly.

[0019] Further, the connecting assembly further comprises:

[0020] A transition piece, one end of the transition piece is connected with the first connecting piece, and the other end of the transition piece is connected with the second connecting piece; the extension direction of the transition piece is arranged at a preset angle with the peripheral wall of the to-be-tested port, the preset angle is greater than 0° and less than 90°.

[0021] The connecting assembly has an initial position at which the transition piece is oppositely arranged with the periphery of the to-be-tested port.

[0022] According to another aspect of the present application, a test device is provided, comprising: the test head structure provided above.

[0023] Further, the test head structure comprises a first test head and a second test head; the first test head is used for being connected with the output end of the to-be-tested module, and the second test head is used for being connected with the input end of the to-be-tested module; the test device further comprises:

[0024] A control module, the control module is used for generating a test electrical signal and receiving an electrical signal emitted by the to-be-tested module, and comparing the test electrical signal and the electrical signal emitted by the to-be-tested module;

[0025] The input module is electrically connected with the control module; the input module is used for electrically connecting with the first test head to transmit the electrical signal emitted by the to-be-tested port of the to-be-tested module received by the first test head to the control module;

[0026] The output module is electrically connected with the control module; the output module is used for electrically connecting with the second test head to transmit the electrical signal generated by the control module to the to-be-tested port.

[0027] Further, the input module comprises a signal input circuit and an input cable terminal connected with each other; the signal input circuit is electrically connected with the control module, and the input cable terminal is used for connecting with the first test head; the signal input circuit is used for performing voltage regulation processing on the current output by the input cable terminal; and / or,

[0028] The output module comprises an output driving circuit and an output cable terminal connected with each other; the output driving circuit is electrically connected with the control module, and the output cable terminal is used for connecting with the second test head; the output driving circuit is used for performing voltage regulation processing on the current output by the control module; and / or,

[0029] The testing device further comprises a communication interface circuit, and the output module and the input module are connected with the communication interface circuit; the communication interface circuit is used for emitting a communication signal to the to-be-tested module and receiving a communication signal emitted by the to-be-tested module.

[0030] Further, the testing device further comprises a control module; the testing device further comprises:

[0031] The alarm module is electrically connected with the control module, and the alarm module is used for emitting an alarm sound; and / or,

[0032] The indicator light module is electrically connected with the control module, and the indicator light module is used for indicating the running state and the test result of the testing device.

[0033] The technical scheme of the utility model, through the movement of the push structure can quickly plug and unplug the test head structure, accurately control the contact force of the first connecting piece and the second connecting piece and the to-be-tested port, ensure that the connecting assembly can form stable and close electrical contact with the to-be-tested port during the test process, thereby improving the accuracy of signal transmission and the efficiency of the test process. The push structure drives the first connecting piece to move in the first direction, thereby indirectly driving the second connecting piece to move. The second connecting piece can also move in the direction of approaching or moving away from the push structure during the movement of the first connecting piece, thereby adapting the size of the second connecting piece to the to-be-tested port, and facilitating the insertion or removal of the to-be-tested port. Moreover, since the connecting assembly can move in the second direction relative to the push structure, the test head can adapt to to-be-tested ports of different sizes without the need to replace the test head or make complex adjustments, improving the flexibility and versatility of the test system and being suitable for testing various IO modules. In addition, through the precise control of the push structure, damage to the port of the IO module or the test head itself caused by excessive contact force or inaccurate positioning is avoided, the service life of the test head structure is prolonged, and the test cost is reduced. The movable design and automatic push function of the test head make it easy to integrate into an automated test system, enabling rapid and batch IO module testing suitable for quality control and function verification on the production line. Therefore, the test head structure provided by the embodiment can solve the technical problem of the test head structure in the prior art that is not convenient for quick plugging and unplugging. BRIEF DESCRIPTION OF DRAWINGS

[0034] The drawings accompanying the specification of this application form a part of the application and serve to further provide a further understanding of the application, the illustrative embodiments of the application and the explanations thereof serve to explain the application without constituting an improper limitation thereof. In the drawings:

[0035] Figure 1 A structure schematic view of a test head structure provided by embodiment one of the utility model is shown;

[0036] Figure 2 A structure schematic view of the test head structure provided by embodiment one of the utility model in the initial position is shown;

[0037] Figure 3 A structure schematic view of the test head structure provided by embodiment one of the utility model in the plug-in position is shown;

[0038] Figure 4 A structure schematic view of a test device provided by embodiment three of the utility model is shown.

[0039] Among them, the above-mentioned drawing includes the following sign:

[0040] 1, to-be-tested port;

[0041] 2. test device;

[0042] 3. module to be tested;

[0043] 4. test head structure; 41, first test head; 42, second test head;

[0044] 10. connecting assembly;

[0045] 11. first connecting piece;

[0046] 12. second connecting piece;

[0047] 13. transition piece;

[0048] 20. pushing structure; 21, circuit board; 22, buffer piece;

[0049] 30. elastic piece;

[0050] 100. control module;

[0051] 200. signal input circuit;

[0052] 300. input ribbon terminal;

[0053] 400. output drive circuit;

[0054] 500. output ribbon terminal;

[0055] 600. communication interface circuit;

[0056] 700. alarm module;

[0057] 800. indicator light module;

[0058] 900. communication port;

[0059] 1000. output end;

[0060] 1100. input end. DETAILED DESCRIPTION

[0061] It should be noted that the embodiments in the present application and the features in the embodiments can be combined with each other without conflict. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0062] As Figures 1 to 3The utility model discloses an embodiment one provides a test head structure 4, and the test head structure 4 includes connecting assembly 10 and push structure 20. Connecting assembly 10 includes the first connecting piece 11 and the second connecting piece 12 that connect each other. At least part of push structure 20 is used to be connected with connecting assembly 10, and the push end of push structure 20 is opposite to the first connecting piece 11, and push structure 20 is movably arranged along the first direction to approach or away from the first connecting piece 11 and drive the first connecting piece 11 movement, and connecting assembly 10 is movably arranged along the second direction relative to push structure 20, to make the second connecting piece 12 approach or away from push structure 20, to make connecting assembly 10 movement to the size adaptation of the plug-in position of the port to be tested 1.

[0063] The utility model discloses an embodiment one provides a test head structure 4, and the test head structure 4 includes connecting assembly 10 and push structure 20. Connecting assembly 10 includes the first connecting piece 11 and the second connecting piece 12 that connect each other. At least part of push structure 20 is used to be connected with connecting assembly 10, and the push end of push structure 20 is opposite to the first connecting piece 11, and push structure 20 is movably arranged along the first direction to approach or away from the first connecting piece 11 and drive the first connecting piece 11 movement, and connecting assembly 10 is movably arranged along the second direction relative to push structure 20, to make the second connecting piece 12 approach or away from push structure 20, to make connecting assembly 10 movement to the size adaptation of the plug-in position of the port to be tested 1.

[0064] Specifically, during the insertion of the test head structure 4, when the test head structure 4 is in an uninserted state, the first connecting member 11 and the second connecting member 12 remain stationary, a certain distance is maintained between the first connecting member 11 and the to-be-tested port 1, a certain distance is maintained between the second connecting member 12 and the to-be-tested port 1, and the pushing structure 20 is not in contact with the first connecting member 11. When the test head structure 4 begins to approach the to-be-tested port 1, the pushing end of the pushing structure 20 is aligned with the first connecting member 11, preparing for a pushing action. At this time, no electrical connection is established between the test head structure 4 and the to-be-tested port 1. As the test head structure 4 is further pushed in, the pushing structure 20 moves in the first direction and gradually approaches the first connecting member 11, applying a pushing force to the first connecting member 11. Under the action of the pushing force, the first connecting member 11 begins to move towards the inner end wall of the to-be-tested port 1. Then, the second connecting member 12 moves in the direction of approaching the pushing structure 20 until at least part of the second connecting member 12 enters the to-be-tested port 1 and comes into contact with the inner circumferential wall of the to-be-tested port 1. Finally, the first connecting member 11 forms a close contact with the inner end wall of the to-be-tested port 1. At this time, a stable electrical connection is established between the test head structure 4 and the to-be-tested port 1, and signal transmission and detection can be performed. During the pulling out of the test head structure 4, the pushing structure 20 moves away from the to-be-tested port 1 in the first direction. Since at least part of the pushing structure 20 is connected to the connecting assembly 10, the connecting assembly 10 is also driven to move away from the to-be-tested port 1 in the first direction. Since the friction between the connecting assembly 10 and the inner wall of the to-be-tested port 1 is small, the connecting assembly 10 can be quickly pulled out of the to-be-tested port 1.

[0065] Specifically, the "insertion position adapted to the size of the to-be-tested port 1" refers to a position where at least part of the connecting assembly 10 is in contact with the inner wall of the to-be-tested port 1.

[0066] Preferably, the "insertion position adapted to the size of the to-be-tested port 1" refers to a position where the first connecting member 11 is in contact with the inner end wall of the to-be-tested port 1 and the second connecting member 12 is in contact with the inner circumferential wall of the to-be-tested port 1. This can better ensure the stability of the connection.

[0067] Specifically, at least part of the pushing structure 20 is also used to be electrically connected to the connecting assembly 10. With such a structural arrangement, the pushing structure 20 not only mechanically pushes the first connecting member 11, but also forms an electrical connection with the connecting assembly 10, ensuring that test signals can be transmitted between the connecting assembly 10 and the pushing structure 20, thereby establishing communication with the to-be-tested port 1, improving the integration of the test system and the efficiency of signal transmission.

[0068] Specifically, the connecting assembly 10 is made of conductive material. Specifically, the connecting assembly 10 is a metal piece. With such a structural arrangement, the use of a metal piece can ensure that the connecting assembly 10 has good electrical conductivity, which is conducive to efficient signal transmission. At the same time, the high strength and wear resistance of the metal material also ensure the reliability and durability of the connecting assembly 10, reducing errors caused by poor contact during testing.

[0069] Specifically, the pushing structure 20 extends along the first direction. This design ensures that the pushing action can be accurately applied to the first connecting piece 11, which is conducive to controlling the contact pressure between the pushing end of the pushing structure 20 and the first connecting piece 11, ensuring stable and reliable contact, which helps to improve the stability of signal transmission and the accuracy of testing.

[0070] Specifically, the first direction and the second direction are perpendicular to each other. This perpendicular movement design allows the connecting assembly 10 and the pushing structure 20 to move independently in two directions, ensuring the adaptability of the test head structure 4 to the to-be-tested port 1, and making the pushing and pulling actions smoother and more controllable, improving the flexibility and operation efficiency of the test head structure 4.

[0071] Specifically, the first connecting piece 11 and the second connecting piece 12 are arranged perpendicular to each other. With such a structural arrangement, the vertically arranged first connecting piece 11 and second connecting piece 12 can ensure that when inserted into the to-be-tested port 1, the two connecting pieces form stable and uniform contact with the inner end wall and the inner circumferential wall of the port, respectively, avoiding poor contact due to improper contact angle, and enhancing the reliability of electrical connection.

[0072] Specifically, the to-be-tested port 1 is a square port.

[0073] Specifically, the pushing structure 20 includes a circuit board 21, and the circuit board 21 forms at least part of the pushing structure 20. With such a structural arrangement, the circuit board 21 as part of the pushing structure 20 not only provides a signal transmission path, but also can realize complex electronic control and signal processing functions, making the test head structure 4 more comprehensive in function, and being able to adapt to different types of to-be-tested ports 1, enhancing the versatility and intelligent level of the testing device 2.

[0074] Specifically, the circuit board 21 is a PCB (printed circuit board). The PCB has good circuit wiring performance, high stability, and low cost in mass production, which can ensure the stability and accuracy of signal transmission during testing. At the same time, the PCB is easy to maintain and replace, reducing the maintenance cost during long-term use.

[0075] In the embodiment, the pushing structure 20 further comprises a buffer 22, which is arranged at one end of the circuit board 21 close to the first connecting piece 11, and forms the pushing end of the pushing structure 20. The buffer 22 is a rubber piece. With such a structure, the rubber is used as the buffer 22, which can effectively absorb and disperse the impact force in the pushing process, prevent the circuit board 21 and the first connecting piece 11 from being damaged when they are quickly contacted, protect the test head structure 4 and the to-be-tested port 1, and prolong the service life of the test head structure 4. The elastic property of the rubber also ensures that the first connecting piece 11 can form a good and stable contact when it is inserted into the to-be-tested port 1, and improves the reliability of the electrical connection.

[0076] Specifically, the pushing structure 20 further comprises a buffer 22, which is arranged at one end of the circuit board 21 close to the first connecting piece 11, and forms the pushing end of the pushing structure 20. The buffer 22 is arranged protruding from both sides of the circuit board 21. With such a structure, the protruding arrangement of the buffer 22 increases its contact area with the first connecting piece 11, so that the pressure distribution is more uniform during the pushing process, avoiding damage to the test head structure 4 that may be caused by excessive local pressure. At the same time, this design can also better adapt to to-be-tested ports 1 of different sizes, enhancing the versatility of the test head structure 4.

[0077] Specifically, the buffer 22 is arranged extending in the second direction. With such a structure, the extension of the buffer 22 in the second direction ensures that it can provide a continuous and correctly directed buffer force during the pushing process, which helps the first connecting piece 11 to move smoothly to the position where it is in contact with the inner wall of the to-be-tested port 1, avoiding poor contact due to deviation or inclination. This design also enables the buffer 22 to better adapt to the height of the to-be-tested port 1 (the height of the to-be-tested port 1 in the second direction), ensuring stable contact and signal transmission even when the port height changes slightly.

[0078] Specifically, the test head structure 4 further comprises a resilient piece 30. One end of the resilient piece 30 is connected to the circuit board 21, and the other end of the resilient piece 30 is connected to the second connecting piece 12. With such a structure, it is ensured that the second connecting piece 12 can stably establish an electrical connection with the inner circumferential wall of the to-be-tested port 1. The resilient piece 30 plays a key supporting and buffering role during the insertion and removal of the test head, which enables the second connecting piece 12 to stably contact in ports of different heights, while providing a restoring force when removed, avoiding hard collision of mechanical parts, protecting the circuit board 21 and the second connecting piece 12, and prolonging the service life of the test head structure 4.

[0079] Specifically, during the insertion process of the test head structure 4, the pushing structure 20 moves in the first direction, gradually approaching the first connecting piece 11 and exerting a pushing force on the first connecting piece 11. Under the action of the pushing force, the first connecting piece 11 begins to move towards the inner end wall of the to-be-tested port 1. Then, the pushing structure 20 drives the second connecting piece 12 to move in the first direction, and the second connecting piece 12 moves in the direction close to the pushing structure 20 under the action of the elastic member 30, until at least part of the second connecting piece 12 enters the to-be-tested port 1 and contacts the inner circumferential wall of the to-be-tested port 1. During the extraction process of the test head structure 4, the pushing structure 20 moves away from the to-be-tested port 1 in the first direction, the pushing structure 20 drives the elastic member 30 to move, and the elastic member 30 drives the second connecting piece 12 to move. Because the friction between the connecting assembly 10 and the inner wall of the to-be-tested port 1 is small, the test head structure 4 can be quickly extracted from the to-be-tested port 1.

[0080] Specifically, the test head structure 4 further comprises an elastic member 30. The elastic member 30 is made of a conductive material. With such a structure, the elastic member 30 is made of a conductive material, which not only has mechanical elasticity function, but also can be used as a signal transmission path, reducing the internal wire connection of the test head structure 4, simplifying the structure, reducing the interference and attenuation in the signal transmission process, and improving the accuracy and stability of signal transmission. Such integrated design is particularly important in scenarios requiring high frequency and fast testing, which helps to improve testing efficiency.

[0081] Specifically, the elastic member 30 is a metal elastic member. In this way, the use of metal elastic member combines the excellent conductivity of metal and the mechanical properties of elastic material, which can realize signal transmission while ensuring accurate elastic force on the second connecting piece 12 during insertion and extraction, ensuring the reliability of contact and the continuity of signal transmission. The high durability and strength of the metal elastic member further prolong the service life of the test head and reduce the maintenance requirements.

[0082] Specifically, the test head structure 4 further comprises an elastic member 30. The elastic member 30 is a spring structure. The spring structure has good elasticity and restoring force, which can ensure that the second connecting piece 12 can stably contact the inner circumferential wall of the to-be-tested port 1 in various heights of the to-be-tested port 1, and at the same time provide the ability to quickly return to the original position during extraction, avoiding potential damage to the test head structure 4 caused by residual stress. The design of the spring can also adapt to slight changes in port shape, improving the universality and adaptability of the test fixture.

[0083] Specifically, the side of the connecting assembly 10 close to the to-be-tested port 1 is smooth. With such a structural arrangement, the design of the smooth surface reduces the friction between the connecting assembly 10 and the to-be-tested port 1, making the insertion and extraction of the test head structure 4 more smooth, avoiding mechanical wear and tear and operation difficulty caused by excessive frictional resistance. In addition, the smooth surface also helps to improve the cleanliness of the test head structure 4, preventing dust and impurities from accumulating on the contact surface and affecting the quality of electrical contact, thereby ensuring the accuracy of the test signal and the reliability of the test result.

[0084] In the embodiment, there are at least two connecting assemblies 10, one and the other of which are oppositely and spacedly arranged, and the abutting structure 20 is located between one and the other of the at least two connecting assemblies 10. With such a structural arrangement, a stable test head structure 4 can be formed, so that when the abutting structure 20 pushes the connecting assembly 10, the connecting assembly 10 can be kept on both sides of the to-be-tested port 1, thereby ensuring the perpendicularity and accuracy of the test head structure 4 when inserted. The two oppositely arranged connecting assemblies 10 form a positioning frame, which can better adapt to to-be-tested ports 1 of different sizes, improving the flexibility and adaptability of the test head structure 4, while reducing the deviation that may occur during insertion, improving the accuracy and efficiency of the test.

[0085] Specifically, one and the other of the at least two connecting assemblies 10 are spacedly arranged along the first direction. With such a structural arrangement, it is ensured that even when facing to-be-tested ports 1 of different sizes, the connecting assembly 10 can be accurately aligned with the to-be-tested port 1, reducing the time wasted due to position adjustment and improving the convenience and speed of the test. At the same time, this design also ensures that the connecting assemblies 10 do not interfere with each other during insertion, further improving the reliability of the test.

[0086] Specifically, the connecting assembly 10 further comprises a transition piece 13, one end of the transition piece 13 being connected with the first connecting piece 11 and the other end of the transition piece 13 being connected with the second connecting piece 12; the extension direction of the transition piece 13 is arranged at a preset angle with the peripheral wall of the to-be-tested port 1, the preset angle being greater than 0° and less than 90°. Among them, the connecting assembly 10 has an initial position in which the transition piece 13 is oppositely arranged with the periphery of the to-be-tested port 1. With such a structural arrangement, it is ensured that the first connecting piece 11 and the second connecting piece 12 are smoothly transitioned, so that when the test head structure 4 is inserted into the to-be-tested port 1, it can contact the to-be-tested port 1 at the preset angle, avoiding damage to the test head structure 4 caused by hard contact. The selection of the preset angle enables the test head structure 4 to adapt to different types of to-be-tested ports 1, improving the universality of the test fixture, while the design of the transition piece 13 also optimizes the internal signal transmission path, reducing signal attenuation and interference during transmission, improving the accuracy and efficiency of the test.

[0087] Specifically, when the test head structure 4 is pushed into the to-be-tested port 1, first, due to the contact between the transition piece 13 and the periphery of the to-be-tested port 1, the connecting assembly 10 is subjected to a pressure shrinking towards the PCB, and the pushing end of the pushing structure 20 pushes the first connecting piece 11 towards the inside of the to-be-tested port 1, and the elastic piece 30 is compressed, and the second connecting piece 12 moves towards the PCB. When the test head structure 4 is completely pushed into the to-be-tested port 1, the first connecting piece 11 contacts the inner end wall of the to-be-tested port 1 due to the pressure of the buffer piece 22, and the second connecting piece 12 also well contacts the inner periphery wall of the to-be-tested port 1 due to the elastic force of the elastic piece 30, and maintains a certain tension so that the test head structure 4 and the to-be-tested port 1 are not easily loosened and dropped. After the connecting assembly 10 contacts the to-be-tested port 1, an electrical connection is established between the PCB and the connecting assembly 10 through the conductive elastic piece 30. Through this structure, the to-be-tested port 1 can be quickly electrically connected without up and down twisting or fixing the wire, and the test efficiency can be improved.

[0088] As shown in Figure 2 , when the connecting assembly 10 is in the initial position, the transition piece 13 is opposite to the periphery of the to-be-tested port 1. Figure 2 The arrows in Figure 3 indicate the moving directions of the first connecting piece 11 and the transition piece 13, respectively. As shown in Figure 3 , when the connecting assembly 10 is in the plugged position, the first connecting piece 11 contacts the inner end wall of the to-be-tested port 1, and the second connecting piece 12 contacts the inner periphery wall of the to-be-tested port 1 under the elastic force of the elastic piece 30.

[0089] In the second embodiment, the test head structure 4 further comprises a fixed connecting assembly, the fixed connecting assembly is fixedly connected with the pushing structure 20, the connecting assembly 10 and the fixed connecting assembly are oppositely and spacedly arranged, and the pushing structure 20 is located between the connecting assembly 10 and the fixed connecting assembly. With such a structure, the stability of the test head structure 4 is improved, the movement of the first connecting piece 11 and the second connecting piece 12 can be more accurately controlled, and the contact quality between the test head structure 4 and the to-be-tested port 1 and the reliability of signal transmission are improved. At the same time, the relative and spaced arrangement of the connecting assembly 10 and the fixed connecting assembly forms a stable clamping space, which can adapt to to-be-tested ports 1 of more extensive sizes, improves the universality and flexibility of the test head, and helps to improve the test efficiency.

[0090] Specifically, the connecting assembly 10 and the fixed connecting assembly are arranged at intervals along the first direction. With such an arrangement, the connecting assembly 10 and the fixed connecting assembly can provide sufficient support and positioning when inserted into the to-be-tested port 1, avoiding poor contact or signal transmission interruption caused by unstable position. This design also helps to simplify the insertion operation of the test head structure 4. Through accurate positioning along the first direction, stable connection with the to-be-tested port 1 can be quickly achieved, thereby improving the accuracy and speed of testing.

[0091] As shown in Figure 4 Embodiment three of the present application provides a test device 2, which includes the test head structure 4 provided in embodiment one or embodiment two.

[0092] The test device 2 provided in embodiment three of the present application can quickly plug and unplug the test head structure 4 through the movement of the pushing structure 20, accurately control the contact force of the first connecting piece 11 and the second connecting piece 12 with the to-be-tested port 1, and ensure that the connecting assembly 10 can quickly form stable and tight electrical contact with the to-be-tested port 1 during testing, thereby improving the accuracy of signal transmission and the efficiency of the testing process. The pushing structure 20 drives the first connecting piece 11 to move along the first direction, thereby indirectly driving the second connecting piece 12 to move. The second connecting piece 12 can also move along the direction of approaching or moving away from the pushing structure 20 during movement with the first connecting piece 11, so that the second connecting piece 12 is adapted to the size of the to-be-tested port 1, thereby facilitating the insertion or removal of the to-be-tested port 1. Moreover, since the connecting assembly 10 can move along the second direction relative to the pushing structure 20, the test head can adapt to different sizes of to-be-tested ports 1, without the need to replace the test head or make complex adjustments, thereby improving the flexibility and versatility of the testing system and being suitable for testing various IO modules. In addition, through the precise control of the pushing structure 20, damage to the port of the IO module or the test head itself caused by excessive contact force or inaccurate positioning is avoided, thereby prolonging the service life of the test head structure 4 and reducing the testing cost. The movable design and automatic pushing function of the test head make it easy to integrate into an automated testing system, realize rapid and batch IO module testing, and be suitable for quality control and function verification on the production line. Therefore, the test device provided in the present embodiment can solve the technical problem of the test head structure in the prior art that is not convenient for quick plugging and unplugging.

[0093] Specifically, the test head structure 4 is multiple, and the multiple test head structures 4 are arranged at intervals. In this way, the test device 2 can simultaneously test multiple to-be-tested ports 1, greatly improving the test efficiency. The multiple test head structures 4 are arranged at intervals, ensuring that each test head does not interfere with each other when being inserted and pulled out, reducing mechanical errors in the test process, and improving the accuracy and repeatability of the test.

[0094] Specifically, the test head structure 4 includes a first test head 41 and a second test head 42; the first test head 41 is used to connect with the output end 1000 of the to-be-tested module 3, and the second test head 42 is used to connect with the input end 1100 of the to-be-tested module 3. The test device 2 further includes a control module 100, an input module and an output module. The control module 100 is used to generate a test electrical signal and receive an electrical signal emitted by the to-be-tested module 3, and compare the test electrical signal with the electrical signal emitted by the to-be-tested module 3. The input module is electrically connected with the control module 100; the input module is used to be electrically connected with the first test head 41, so as to transmit the electrical signal emitted by the to-be-tested port 1 of the to-be-tested module 3 received by the first test head 41 to the control module 100. The output module is electrically connected with the control module 100; the output module is used to be electrically connected with the second test head 42, so as to transmit the electrical signal generated by the control module 100 to the to-be-tested port 1. With such a structure, the first test head 41 and the second test head 42 are used in a differentiated manner, so that the test device 2 can independently test the input and output functions of the to-be-tested module 3. Through the comparison of the test electrical signal generated by the control module 100 and the electrical signal emitted by the to-be-tested module 3, the fault point of the module can be quickly and accurately identified, and the efficiency and accuracy of fault diagnosis are improved. The design of the input module and the output module realizes efficient transmission and processing of the test electrical signal, ensuring the integrity and stability of the signal. Such a setting can form a test circuit loop in the test device 2, improving the test efficiency.

[0095] Specifically, the input module includes a signal input circuit 200 and an input ribbon terminal 300 connected with each other; the signal input circuit 200 is electrically connected with the control module 100, and the input ribbon terminal 300 is used to be connected with the first test head 41; the signal input circuit 200 is used to perform voltage regulation processing on the current output by the input ribbon terminal 300. With such a structure, the voltage regulation processing of the signal input circuit 200 ensures that the output signal of the to-be-tested module 3 can adapt to the input voltage requirement of the control module 100 when being transmitted to the control module 100, avoiding signal distortion or equipment damage caused by voltage mismatch. At the same time, the design of the voltage regulation circuit can also effectively isolate noise, improve the purity of the signal, and thus improve the reliability of the test result.

[0096] Specifically, the output module comprises an output drive circuit 400 and an output flat cable terminal 500 connected with each other; the output drive circuit 400 is electrically connected with the control module 100, and the output flat cable terminal 500 is used for being connected with the second test head 42; the output drive circuit 400 is used for performing voltage regulation processing on the current output by the control module 100. With such a structure, the voltage regulation processing of the output drive circuit 400 ensures that the test electrical signal generated by the control module 100 can meet the input voltage requirement of the to-be-tested module 3 when being transmitted to the to-be-tested module 3, avoiding signal transmission failure or equipment damage caused by voltage mismatch. Such a design can also provide sufficient driving capability to ensure that the signal can effectively activate the input end 1100 of the module, improving the accuracy and efficiency of the test.

[0097] In Example Three, the test device 2 further comprises a communication interface circuit 600, and the output module and the input module are both connected with the communication interface circuit 600, which is used for sending a communication signal to the to-be-tested module 3 and receiving a communication signal sent by the to-be-tested module 3. With such a structure, the addition of the communication interface circuit 600 enables the test device 2 to perform bidirectional data communication with the to-be-tested module 3, so as to detect the communication capability of the to-be-tested module 3, achieving comprehensive test coverage and improving the integrity and accuracy of fault diagnosis.

[0098] Specifically, the control module 100 is a microcontroller mainly composed of an STM32F103VCT6 single-chip microcomputer and its peripheral circuit. The output drive circuit 400 is composed of a triode control circuit, which controls the 24V signal switch by using the 3.3V signal generated by the microcontroller to drive the relay or other types of switches on the IO module. The signal input circuit 200 is mainly composed of an optical coupling isolation circuit, which isolates the 24V input signal through the optical coupling and outputs a 3.3V signal. The communication interface circuit 600 is mainly composed of various types of communication circuits, mainly depending on the communication mode of the module, such as Ethercat, RS232, TTL level, etc.

[0099] Specifically, the test device 2 further comprises an alarm module 700, which is electrically connected with the control module 100, and the alarm module 700 is used for emitting an alarm sound. In this way, the use of the alarm module 700 provides intuitive fault feedback for the operator, and when the module is detected to be abnormal, the alarm sound can immediately remind the operator, so that the fault can be discovered and handled in time, avoiding further test delay caused by negligence or misjudgment, and improving the work efficiency.

[0100] Specifically, the alarm module 700 is a buzzer alarm circuit, which is used for emitting an alarm sound when the IO module test is abnormal.

[0101] Specifically, the testing device 2 further comprises an indicator light module 800, which is electrically connected with the control module 100, and is used to indicate the running state and test result of the testing device 2. In this way, the setting of the indicator light module 800 provides visual feedback of the running state and test result, and the operator can quickly understand the working condition and test result of the testing device 2 by observing the change of the indicator light, which simplifies the operation process, reduces subjective judgment on the test result, and improves the objectivity and convenience of the test.

[0102] Specifically, the indicator light module 800 is an indicator light circuit, which indicates the running state of the testing device 2, the communication state between the testing device 2 and the IO module, the test result, etc.

[0103] Specifically, when the test head structure 4 is connected to the to-be-tested port 1 of the IO module, the test of the IO module can be started, and the test mainly includes communication, output and input of the IO module.

[0104] In the communication test, there are various communication modes of the IO module, such as serial communication (RS-232 / RS-485), USB, Ethernet, Modbus, CAN bus, Profibus bus, etc. In the communication test with Ethercat as the communication mode, when the communication interface circuit 600 of the testing device 2 cannot establish communication with the communication port 900 of the IO module, it is stated that the communication module of the IO module is abnormal, the testing device 2 sends an alarm information, and the indicator light circuit displays the communication abnormal state. When the IO module is directly connected to the upper control device through a wire or other wire, the communication test only involves the connection of the electrical signal, and does not involve the conversion of the communication protocol and data.

[0105] In the test of the module output signal, the testing device 2 sends an output control signal to the IO module, the IO module outputs a signal after receiving the output control signal, the output signal is transmitted to the test head structure 4 through the output end 1000, and then connected to the input wire terminal 300 of the testing device 2 for a data return test. The data is first subjected to voltage reduction by the signal input circuit 200 to reduce the data output by the IO module to 3.3V level which can be received by the chip (equivalent to the control module 100), and the data not meeting the output level of the IO module is excluded by the signal input circuit 200. The microcontroller of the testing device 2 compares with the test signal, if there is a mistake in the comparison, for example, there is a missing IO module output signal or the level output does not reach the normal output level of the IO module, an alarm information is sent, if it is passed, the IO module output test is verified to be qualified, and the indicator light indicates that the output test is qualified.

[0106] In the test of the module input signal, the test device 2 sends a control signal to the output drive circuit 400, and the output drive circuit 400 converts the 3.3V level of the microcontroller into the input level of the IO module, and the input level is connected to the test head structure 4 through the output cable terminal 500 and the cable, and the test head structure 4 is connected to the interface terminal of the input end 1100 of the IO module, and the input end 1100 terminal of the IO module detects the change of the external level, and is connected to the test device 2 through the output end 1000, and after the level conversion of the signal input circuit 200 of the test device 2, the data is connected to the microcontroller for comparison, if the comparison is wrong, an alarm information is sent, and the indicator light indicates that the test is unqualified, if the test is passed, the IO module input test is verified to be qualified, and the indicator light indicates that the input test is qualified.

[0107] From the above description, it can be seen that the embodiments of the utility model realize the following technical effects: through the connection with the test head structure, the simulation of the input and output signals can quickly verify whether all input and output ports of the IO module exist abnormity, and the test efficiency is improved. Through the design of the test head structure, the plug-in and signal leading-out of all input and output terminals are realized, and the test efficiency is improved.

[0108] It should be noted that the terms used herein are for the purpose of describing specific embodiments only and are not intended to limit exemplary embodiments according to the present application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise, and it should be further understood that the terms "comprise" and / or "include" as used herein specify the presence of stated features, steps, operations, devices, components and / or combinations thereof.

[0109] Unless specifically stated otherwise, the relative arrangements of components and steps, numerical expressions, and numerical values set forth in these embodiments are not meant to limit the scope of the present application. It should also be understood that the size of the various parts shown in the drawings can not be to scale for ease of illustration. Techniques, methods, and devices known to those of ordinary skill in the relevant art can not be discussed in detail, but should be considered as part of the specification, where appropriate. In all examples shown and discussed herein, any specific value should be interpreted as merely an example, and not as a limitation. Thus, other examples of the exemplary embodiments can have different values. It should be noted that like reference numerals and letters refer to like items throughout the drawings, and thus, once an item is defined in one drawing, it need not be discussed further in subsequent drawings.

[0110] In the description of the present application, it should be understood that the orientation words such as "front, back, up, down, left, right", "transverse, vertical, perpendicular, horizontal" and "top, bottom" and the like indicated orientation or position relationship are generally based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, without the opposite description, these orientation words do not indicate and imply that the indicated device or element must have a particular orientation or be constructed and operated in a particular orientation, therefore it cannot be understood as a limitation on the protection scope of the present application; the orientation words "inner, outer" refer to the inner and outer of the contour of each component itself.

[0111] For the convenience of description, spatial relative terms such as "over", "above", "upper surface", "upper" and the like can be used herein to describe the spatial positional relationship of one device or feature with other devices or features as shown in the drawings. It should be understood that the spatial relative terms are intended to include different orientations in use or operation in addition to the orientation of the device described in the drawings. For example, if the device in the drawing is inverted, the device described as "above" or "over" other devices or structures will be positioned "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below" orientations. The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein are interpreted accordingly.

[0112] In addition, it should be noted that the use of "first", "second" and the like to define parts only facilitates the differentiation of the corresponding parts, and the above words have no special meaning unless otherwise stated, and therefore cannot be understood as a limitation on the protection scope of the present application.

[0113] The above only describes preferred embodiments of the present application and is not intended to limit the present application. For those skilled in the art, the present application can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A test head structure, characterized by, The test head structure comprises: a connecting assembly (10) comprising a first connecting piece (11) and a second connecting piece (12) connected with each other; a pushing structure (20), at least part of the pushing structure (20) is used to be connected with the connecting assembly (10), a pushing end of the pushing structure (20) is arranged opposite to the first connecting piece (11), and the pushing structure (20) is movably arranged along a first direction to move close to or away from the first connecting piece (11) and drive the first connecting piece (11) to move; the connecting assembly (10) is movably arranged relative to the pushing structure (20) along a second direction to move the second connecting piece (12) close to or away from the pushing structure (20), so that the connecting assembly (10) moves to a plug-in position suitable for the size of the to-be-tested port (1).

2. The test head structure of claim 1, wherein The pushing structure (20) comprises: a circuit board (21), the circuit board (21) forms at least part of the pushing structure (20).

3. The test head structure of claim 2, wherein, The pushing structure (20) further comprises a buffer piece (22), the buffer piece (22) is arranged at one end of the circuit board (21) close to the first connecting piece (11); the buffer piece (22) forms the pushing end of the pushing structure (20); wherein the buffer piece (22) is a rubber piece; and / or, the buffer piece (22) is arranged on both sides of the circuit board (21) in a protruding manner.

4. The test head structure of claim 2, wherein The test head structure further comprises a resilient piece (30); wherein one end of the resilient piece (30) is connected with the circuit board (21), and the other end of the resilient piece (30) is connected with the second connecting piece (12); and / or, the resilient piece (30) is made of a conductive material; and / or, the resilient piece (30) is a spring structure.

5. The test head structure of claim 1, wherein The connecting assembly (10) is at least two, one and the other of the at least two connecting assemblies (10) are arranged opposite and spaced apart, and the pushing structure (20) is located between the one and the other of the at least two connecting assemblies (10); or, The test head structure further comprises a fixed connecting assembly, the fixed connecting assembly is fixedly connected with the pushing structure (20), the connecting assembly (10) and the fixed connecting assembly are arranged opposite and spaced apart, and the pushing structure (20) is located between the connecting assembly (10) and the fixed connecting assembly.

6. The test head structure of claim 1, wherein The connecting assembly (10) further comprises: a transition piece (13), one end of the transition piece (13) is connected with the first connecting piece (11), and the other end of the transition piece (13) is connected with the second connecting piece (12); the extension direction of the transition piece (13) is arranged at a preset angle with the peripheral wall of the to-be-tested port (1), and the preset angle is greater than 0° and less than 90°; wherein the connecting assembly (10) has an initial position in which the transition piece (13) is arranged opposite to the periphery of the to-be-tested port (1).

7. A test device characterized by, The test head structure comprises: any one of claims 1 to 6. The test head structure comprises:

8. The test device of claim 7, wherein, The test head structure comprises a first test head (41) and a second test head (42); the first test head (41) is used for connecting with an output end (1000) of the module to be tested, and the second test head (42) is used for connecting with an input end (1100) of the module to be tested; the test device further comprises: a control module (100) for generating a test electrical signal and receiving an electrical signal emitted by the module to be tested, and comparing the test electrical signal with the electrical signal emitted by the module to be tested; an input module electrically connected with the control module (100); the input module is used for electrically connecting with the first test head (41) to transmit the electrical signal emitted by the test port (1) of the module to be tested, which is received by the first test head (41), to the control module (100); an output module electrically connected with the control module (100); the output module is used for electrically connecting with the second test head (42) to transmit the electrical signal generated by the control module (100) to the test port (1).

9. The test device according to claim 8, wherein the input module comprises a signal input circuit (200) and an input ribbon terminal (300) connected with each other; the signal input circuit (200) is electrically connected with the control module (100), and the input ribbon terminal (300) is used for connecting with the first test head (41); the signal input circuit (200) is used for performing voltage regulation processing on the current output by the input ribbon terminal (300); and / or the output module comprises an output driving circuit (400) and an output ribbon terminal (500) connected with each other; the output driving circuit (400) is electrically connected with the control module (100), and the output ribbon terminal (500) is used for connecting with the second test head (42); the output driving circuit (400) is used for performing voltage regulation processing on the current output by the control module (100); and / or the test device further comprises a communication interface circuit (600), the output module and the input module are connected with the communication interface circuit (600), and the communication interface circuit (600) is used for emitting a communication signal to the module to be tested and receiving a communication signal emitted by the module to be tested.

10. The test device of claim 7, wherein, The test device further comprises a control module (100); The test device further comprises: an alarm module (700) electrically connected with the control module (100), the alarm module (700) is used for emitting an alarm sound; and / or an indicator light module (800) electrically connected with the control module (100), the indicator light module (800) is used for indicating the running state and test result of the test device.

Images