Kit for providing Hall chip magnetic field test environment

Abstract

The utility model provides a kit for providing a Hall chip magnetic field test environment. The kit comprises a support, a magnet adjusting assembly, a permanent magnet and a test circuit board. Wherein the test circuit board is electrically connected with the Hall chip, the permanent magnet is connected with the magnet adjusting assembly, a controller is arranged on the test circuit board, the controller is electrically connected with the magnet adjusting assembly, and the distance between the permanent magnet and the Hall chip and the rotation angle of the permanent magnet are further changed through mutual cooperation of the controller and the magnet adjusting assembly. Therefore, the magnetic induction intensity around the Hall chip and the relative angle of the magnetic field are changed, control over the magnetic field environment during chip testing is achieved, errors and uncertainty in the testing process are reduced through accurate magnetic field control, the testing efficiency is improved, and the testing accuracy and reliability are improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the field of integrated circuit, specifically, relate to a kit of providing hall chip magnetic field test environment. BACKGROUND

[0002] At present, in the prior art, the test of part hall chip, usually will require testing in a controllable magnetic field environment, conventional sorting machine test kit and hand test kit cannot provide such environment. UTILITY MODEL CONTENTS

[0003] The utility model aims at least solves one of prior art or related art existing technical problems.

[0004] Therefore, the first aspect of the utility model provides a kit of providing hall chip magnetic field test environment.

[0005] Therefore, the first aspect of the utility model provides a kit of providing hall chip magnetic field test environment.

[0006] In addition, the kit of providing hall chip magnetic field test environment provided by the utility model can have the following additional technical features:

[0007] In some technical solutions of the utility model, the magnet adjusting assembly can include: a motor connected to the top end of the support, the motor being electrically connected to the controller; an adjusting assembly connected to the permanent magnet; an encoder connected to the support, the encoder being located in the first cavity, the encoder being connected to the second output shaft of the motor, and the encoder being electrically connected to the controller; wherein the first output shaft of the motor is connected to the adjusting assembly, the controller is used to control the rotation angle of the motor, and the encoder is used to detect the rotation angle of the motor.

[0008] In some technical solutions of the utility model, optionally, the adjusting assembly comprises: a magnet base, the magnet base is internally provided with a second cavity, the first output shaft is located in the second cavity, the magnet base is connected with the bottom of the permanent magnet, and an internally threaded through hole is arranged on the magnet base; a plurality of support columns, one end of the support column is connected with the motor; a jackscrew, the jackscrew is connected with the magnet base through the internally threaded through hole, and one end of the jackscrew abuts against the first output shaft; a bearing, the inner ring of the bearing is attached to the permanent magnet and located at the top of the magnet base; wherein, the motor is provided with mounting holes, the number of the mounting holes is same as that of the support columns, the support columns are connected with the motor through the mounting holes, a support disc is arranged on the support column, and the bottom of the bearing is rested on the bearing.

[0009] In some technical solutions of the utility model, optionally, the upper cover plate is detachably connected with the test circuit board.

[0010] In some technical solutions of the utility model, optionally, the lower cover plate, one side of the lower cover plate is connected with the permanent magnet, and the other side of the lower cover plate is connected with the test circuit board.

[0011] In some technical solutions of the utility model, optionally, the other end of the support column is connected with the lower cover plate.

[0012] In some technical solutions of the utility model, optionally, one side of the lower cover plate is provided with a groove, and part of the bearing is clamped with the lower cover plate through the groove.

[0013] The additional aspects and advantages of the utility model will be partially given in the following description, some will become obvious from the following description, or be understood through the practice of the utility model. BRIEF DESCRIPTION OF DRAWINGS

[0014] The above and / or additional aspects and advantages of the utility model will become apparent and more readily appreciated from the following description of the embodiments, with reference to the following drawings, in which:

[0015] Fig. 1 Fig. 1 shows one of the schematic diagrams of the kit for providing the Hall chip magnetic field test environment according to one embodiment of the utility model;

[0016] Fig. 2 Fig. 1 shows one of the schematic diagrams of the kit for providing the Hall chip magnetic field test environment according to one embodiment of the utility model;

[0017] Fig. 3 Fig. 1 shows one of the schematic diagrams of the adjusting assembly according to one embodiment of the utility model;

[0018] In which, Figs. 1 to 3 The correspondence between the reference signs and the component names in the drawings is as follows:

[0019] 1, Hall chip; 2, upper cover plate; 3, wire; 4, test circuit board; 5, lower cover plate; 6, adjusting assembly; 7, permanent magnet; 8, motor; 9, encoder; 10, base; 61, bearing; 62, jackscrew; 63, support column; 64, magnet seat. DETAILED DESCRIPTION

[0020] In order to enable the above-mentioned purposes, features and advantages of the present application to be more clearly understood, the present application will be further described below with reference to the drawings and specific embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0021] In the following description, many specific details are set forth in order to provide a thorough understanding of the present application, but the present application can also be practiced in other ways different from those described herein, and therefore, the scope of protection of the present application is not limited by the specific embodiments disclosed below.

[0022] The following refers to Figs. 1 to 3 A kit for providing a Hall chip magnetic field test environment is described according to some embodiments of the present application.

[0023] In one embodiment of the present application, as Fig. 1 and Fig. 2 shown, a kit for providing a Hall chip 1 magnetic field test environment is proposed, for Hall chip 1, comprising: a bracket, the bracket is provided with a first cavity; a magnet adjusting assembly 6, the magnet adjusting assembly 6 is connected with the bracket; a permanent magnet 7, the permanent magnet 7 is connected with the magnet adjusting assembly 6; a test circuit board 4, the test circuit board 4 is electrically connected with the Hall chip 1; wherein, the test circuit board 4 is provided with a controller, the controller is electrically connected with the magnet adjusting assembly 6, the magnet adjusting assembly 6 can adjust the magnetic induction intensity and the magnetic field angle that the Hall chip 1 is inducted when testing.

[0024] The present application proposes a kit for providing a Hall chip 1 magnetic field test environment, comprising a bracket, a magnet adjusting assembly 6, a permanent magnet 7 and a test circuit board 4. Among them, the test circuit board 4 is electrically connected with the Hall chip 1, the permanent magnet 7 is connected with the magnet adjusting assembly 6, wherein the test circuit board 4 is provided with a controller, the controller is electrically connected with the magnet adjusting assembly 6, through the cooperation of the controller and the magnet adjusting assembly 6, and then the distance between the permanent magnet 7 and the Hall chip 1 and the rotation angle of the permanent magnet 7 are changed, so as to change the magnetic induction intensity around the Hall chip 1 and the relative angle of the magnetic field, so as to realize the control of the magnetic field environment during chip testing, the accurate magnetic field control reduces the error and uncertainty in the test process, so as to improve the test efficiency, and improve the accuracy and reliability of the test.

[0025] Specifically, the test circuit and the Hall chip 1 are connected through the wire 3.

[0026] Further, in some embodiments of the utility model, magnet adjusting assembly 6 includes: motor 8, motor 8 is connected with the top of support, motor 8 is electrically connected with controller;Adjusting assembly 6, adjusting assembly 6 is connected with permanent magnet 7;Encoder 9, encoder 9 is connected with support, encoder 9 is located in the first cavity, encoder 9 is connected with the second output shaft of motor 8, encoder 9 is electrically connected with controller;Wherein, the first output shaft of motor 8 is connected with adjusting assembly 6, controller is used to control the rotation angle of motor 8, and encoder 9 is used to detect the rotation angle of motor 8.

[0027] In this embodiment, magnet adjusting assembly 6 includes motor 8, adjusting assembly 6 and encoder 9. Wherein, adjusting assembly 6 is connected with permanent magnet 7, motor 8 is electrically connected with controller, and encoder 9 is electrically connected with motor 8, and then in testing, the first output shaft of motor 8 rotates, and then drives permanent magnet 7 to rotate, so as to adjust the magnetic field angle sensed by Hall chip 1. And, encoder 9 can detect the rotation angle of motor 8 through the second output shaft, and then ensure that the rotation angle of motor 8 is the rated value according to the detected rotation angle. Through the cooperation of controller, motor 8 and encoder 9, the rotation angle of motor 8 can be adjusted and detected in real time, and then the accuracy of the magnetic field angle is ensured, so that the magnetic field angle can be quickly and accurately adjusted in the testing process, which reduces the time required for testing and improves the testing efficiency.

[0028] It should be noted that when motor 8 receives the instruction, the first output shaft and the second output shaft rotate the same angle.

[0029] Preferably, permanent magnet 7 is provided with a notch, the notch is matched with the first output shaft of motor 8, and permanent magnet 7 can be sleeved on the first output shaft of motor 8 through the notch.

[0030] Further, in some embodiments of the utility model, as shown in Fig. 3 Adjusting assembly 6 includes: magnet seat 64, second cavity is arranged in magnet seat 64, the first output shaft is located in the second cavity, magnet seat 64 is connected with the bottom of permanent magnet 7, and internal threaded through hole is arranged on magnet seat 64;Supporting column 63, the number of supporting column 63 is multiple, one end of supporting column 63 is connected with motor 8;Jack 62, jack 62 is connected with magnet seat 64 through internal threaded through hole, and one end of jack 62 abuts against the first output shaft;Bearing 61, the inner ring of bearing 61 is attached to permanent magnet 7 and located at the top of magnet seat 64;Wherein, mounting hole is arranged on motor 8, the number of mounting hole is same as the number of supporting column 63, supporting column 63 is connected with motor 8 through mounting hole, supporting disc is arranged on supporting column 63, and the bottom of bearing 61 is rested on bearing 61.

[0031] In this embodiment, the adjustment assembly 6 includes a bearing 61, a set screw 62, a support column 63, and a magnet base 64. The magnet base 64 is connected to the permanent magnet 7. Loosening the set screw 62 releases the fixation on the magnet base 64, allowing the operator to fine-tune its height, thereby adjusting the distance between the permanent magnet 7 and the Hall chip 1. After adjustment, the set screw 62 is used to fix the magnet base 64 again, completing the adjustment of the magnetic induction intensity. Furthermore, the inner ring of the bearing 61 limits the movement of the permanent magnet 7, and the support plate effectively supports the bottom of the bearing 61, preventing the permanent magnet 7 from shifting during adjustment while ensuring the stability of the bearing 61.

[0032] It should be noted that when the set screw 64 is tightened, the set screw 64 is in close contact with the first output shaft, thereby achieving fixation. Furthermore, the end of the set screw 64 used to hold the first output shaft has a roller, so the set screw 64 can fix the magnet holder 62 without affecting the rotation of the first output shaft of the motor.

[0033] Furthermore, in some embodiments of this utility model, the upper cover plate 2 is detachably connected to the test circuit board 4.

[0034] In this embodiment, the upper cover 2 can cover the Hall chip 1, thereby preventing the Hall chip 1 from experiencing a decrease in test accuracy due to external interference (such as dust). Furthermore, the removable upper cover 2 allows for removal as needed; for example, if this device is used as part of a sorting machine test kit, the upper cover 2 needs to be removed for precise positioning of the test kit. The upper cover 2 enhances the flexibility of the device.

[0035] Furthermore, in some embodiments of this utility model, the lower cover plate 5 has one side connected to the permanent magnet 7 and the other side connected to the test circuit board 4.

[0036] In this embodiment, the lower cover plate 5 isolates the Hall chip 1 from direct contact with the permanent magnet 7, thereby avoiding the influence of temperature and downward pressure on the permanent magnet 7. Furthermore, the lower cover plate 5 ensures that there are no ferrous components around the Hall chip 1, which can minimize residual magnetic interference.

[0037] Preferably, the lower cover plate 5 is made of a non-ferrous material.

[0038] Specifically, the conductor 3 and the lower cover plate 5 are connected by several cylindrical pins for positioning.

[0039] Furthermore, in some embodiments of this utility model, the other end of the support column 63 is connected to the lower cover plate 5.

[0040] In this embodiment, the stability of the device can be further increased by connecting the support column 63 to the lower cover plate 5.

[0041] Further, in some embodiments of the utility model, one side of lower cover plate 5 is equipped with recess, part of bearing 61 is clamped with lower cover plate 5 through recess.

[0042] In this embodiment, the stability of bearing 61 can be increased through recess.

[0043] In one embodiment of the utility model, the working process of the kit for providing the magnetic field test environment of Hall chip 1 is as follows:

[0044] The operator places Hall chip 1 on test circuit board 4, and then starts the test. When the magnetic induction intensity needs to be adjusted, loosen top screw 62, adjust magnet holder 64 and drive permanent magnet 7 to move through magnet holder 64, and then adjust the distance between permanent magnet 7 and Hall chip 1, so as to change the magnetic induction intensity around Hall chip 1, and when the required magnetic induction intensity is obtained, magnet holder 64 is fixed through top screw 62, and then the test is started.

[0045] When the magnetic field angle needs to be adjusted, the rotation angle of motor 8 is controlled through the controller, and then the rotation angle of permanent magnet 7 is accurately controlled, so as to adjust the magnetic field angle, and then the magnetic field angle can be adjusted according to the requirement, and the test logic of Hall chip 1 during the test is met.

[0046] In the claims, specification and drawings of the utility model, the term "a plurality of" refers to two or more than two, unless there is additional explicit limitation, the orientation or position relationship indicated by the terms "upper", "lower" and the like is based on the orientation or position relationship shown in the drawings, which is only for the convenience of describing the utility model and making the description process more simple, and is not intended to indicate or imply that the device or element must have the described specific orientation, structure and operation, therefore these descriptions cannot be understood as the limitation of the utility model; The terms "connection", "installation", "fixation" and the like should be understood in a broad sense, for example, "connection" can be fixed connection between multiple objects, can also be detachable connection between multiple objects, or integral connection; It can be direct connection between multiple objects, or indirect connection between multiple objects through intermediate medium. For ordinary skilled in the art, the specific meaning of the above terms in the utility model can be understood according to the specific circumstances of the above data.

[0047] In the claims, the specification, and the drawings of the present application, terms such as "one embodiment", "an embodiment", "certain embodiments" and the like mean that the particular feature, structure, material, or characteristic being referred to is included in at least one embodiment of the present application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment. Further, the description as used herein is intended to be illustrative of at least one embodiment of the present application and is not intended to be limiting. Still further, any one or more of the features, structures, materials, or characteristics could be combined in any suitable manner in one or more embodiments or examples.

[0048] The above descriptions are merely some embodiments of the present application, and are not intended to limit the present application. For those skilled in the art, the present application can have various modifications and changes. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A kit for providing a Hall chip magnetic field test environment for a Hall chip (1), characterized in that The kit comprises: a bracket provided with a first cavity; a magnet adjusting assembly (6) connected with the bracket; a permanent magnet (7) connected with the magnet adjusting assembly (6); a test circuit board (4) electrically connected with the Hall chip (1); wherein the test circuit board (4) is provided with a controller electrically connected with the magnet adjusting assembly (6), and the magnet adjusting assembly (6) can adjust the magnetic induction intensity and the magnetic field angle sensed by the Hall chip (1) during testing.

2. The kit of claim 1, wherein, The magnet adjusting assembly (6) comprises: a motor (8) connected with the top end of the bracket, the motor (8) being electrically connected with the controller; an adjusting assembly (6) connected with the permanent magnet (7); an encoder (9) connected with the bracket, the encoder (9) being located in the first cavity, the encoder (9) being connected with the second output shaft of the motor (8), and the encoder (9) being electrically connected with the controller; wherein the first output shaft of the motor (8) is connected with the adjusting assembly (6), the controller is used for controlling the rotation angle of the motor (8), and the encoder (9) is used for detecting the rotation angle of the motor (8).

3. The kit of claim 2, wherein the kit further comprises a Hall chip. The adjusting assembly (6) comprises: a magnet seat (64) provided with a second cavity inside, the first output shaft being located in the second cavity, the magnet seat (64) being connected with the bottom of the permanent magnet (7), and the magnet seat (64) being provided with an internally-threaded through hole; a plurality of support columns (63), one end of each support column (63) being connected with the motor (8); a jackscrew (62) connected with the magnet seat (64) through the internally-threaded through hole, one end of the jackscrew (62) abutting against the first output shaft; a bearing (61) with an inner ring abutting against the permanent magnet (7) and located at the top of the magnet seat (64); wherein the motor (8) is provided with mounting holes, the number of the mounting holes being the same as the number of the support columns (63), the support columns (63) being connected with the motor (8) through the mounting holes, the support columns (63) being provided with support discs, and the bottom of the bearing (61) being rested on the support discs.

4. The kit for providing a Hall chip magnetic field test environment according to claim 1, wherein an upper cover plate (2) is detachably connected with the test circuit board (4).

5. The kit for providing a Hall chip magnetic field test environment according to claim 3, wherein a lower cover plate (5) is connected with the top of the permanent magnet (7) on one side, and connected with the test circuit board (4) on the other side.

6. The kit for providing a Hall chip magnetic field test environment according to claim 5, wherein The other end of the support column (63) is connected with the lower cover plate (5). 7.The kit for providing a Hall chip magnetic field test environment according to claim 5, wherein, One side of the lower cover plate (5) is provided with a groove, and part of the bearing (61) is clamped with the lower cover plate (5) through the groove.

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