IGBT (Insulated Gate Bipolar Translator) test circuit capable of quickly modifying gate parameters

Abstract

The utility model relates to an IGBT test circuit capable of rapidly modifying gate pole parameters, comprising a test circuit body, the test circuit body is composed of a signal generator, a driving ICU1 module, an Rg module, an Rge module, a Cge module and an IGBT, the output positive electrode of the signal generator is connected with one pin of the driving ICU1 module, the Rg module and the first pin of the IGBT in sequence through a line, and the output positive electrode of the signal generator is connected with the other pin of the driving ICU1 module, the Rg module and the second pin of the IGBT through a line. A third pin of the IGBT is connected with the other pin of the driving ICU1 module through a line and then connected with GND together, one of the remaining pins of the driving ICU1 module is connected with an output negative electrode line of the signal generator to form a circuit loop, an Rge module and a Cge module are arranged on the circuit loop and located between the driving ICU1 module and the IGBT in parallel, and the Rge module and the Cge module are arranged in series. The utility model has the advantages of simple and reasonable structure, practicability, convenience and the like.

Description

TECHNICAL FIELD

[0001] The utility model belongs to IGBT test technical field relates to a kind of IGBT test circuit of gate parameter can be quickly modified. BACKGROUND

[0002] With the development of technology, IGBT is widely used in household appliances, industrial control, new energy vehicles, photovoltaic and wind power fields, wherein, the standard for evaluating whether the performance of power device is qualified includes static characteristics, switching characteristics, short-circuit characteristics, etc. When debugging IGBT short-circuit characteristics, in order to improve or eliminate oscillation, different gate parameters (including Rg, Cge and Rge) need to be matched, and each adjustment requires re-soldering, replacing resistance or capacitance, resulting in a tedious test process.

[0003] Therefore, an IGBT test circuit capable of quickly modifying gate parameters is designed to overcome the above problems. INVENTION CONTENTS

[0004] The utility model aims at overcoming the deficiencies of prior art, and provides an IGBT test circuit capable of quickly modifying gate parameters, which has simple and reasonable structure, is practical and convenient to use, and runs stably.

[0005] The utility model is realized through the following technical scheme: an IGBT test circuit capable of quickly modifying gate parameters, comprising a test circuit body, the test circuit body is composed of a signal generator, a driving ICU1 module, an Rg module, an Rge module, a Cge module and an IGBT, the output positive pole of the signal generator is connected with one of the feet of the driving ICU1 module, the Rg module and the 1 foot line of the IGBT in sequence, the 3 feet of the IGBT are connected with the other foot line of the driving ICU1 module after GND, one of the remaining pins of the driving ICU1 module is connected with the output negative pole line of the signal generator, to form a circuit loop, and the Rge module and the Cge module are provided in parallel between the driving ICU1 module and the IGBT on the circuit loop, and the Rge module and the Cge module are provided in series.

[0006] As a preferred, the Rg module is composed of at least three groups of parallelly arranged switch circuits, each switch circuit is composed of a switch and a resistance, and the resistance value of the Rg module is adjusted by adjusting the opening and closing of each switch.

[0007] As a preferred, the driving ICU1 module is provided with 8 pins in total, wherein the 2 feet are connected with the output positive pole of the signal generator, the 3 feet are connected with the output negative pole of the signal generator, the 6 and 7 feet are short-circuited and connected with each switch in the Rg module in sequence, and the 8 feet are connected with the power supply 15V.

[0008] As preferred: the Rge module is composed of at least three groups of parallel switch circuits, each group of switch circuits is composed of a switch and a resistor, by adjusting the opening and closing of each switch, thereby adjusting the resistance of the Rge module, and each resistor is connected to the Cge module after being connected to the line far away from the one end of the switch.

[0009] As preferred: the Cge module is composed of at least three groups of parallel capacitor switch circuits, each group of switch circuits is composed of a switch and a capacitor, by adjusting the opening and closing of each switch, thereby adjusting the capacitance of the Cge module, and each capacitor is connected to the 3-pin of IGBT after being short-circuited to each other far away from the one end of the switch.

[0010] The beneficial effects of the utility model are as follows:

[0011] The IGBT test circuit capable of quickly modifying gate parameters designed by the utility model can realize the combination of 343 kinds of Rg, Rge and Cge at most by controlling the switch state of each switch, thereby improving or eliminating the oscillation appearing in the short circuit test. BRIEF DESCRIPTION OF DRAWINGS

[0012] Figure 1 It is the whole structure schematic diagram of the utility model.

[0013] Figure 2 It is the short circuit test waveform diagram when Rg=21ohm, Rge=10ohm, Cge=10nf.

[0014] Figure 3 It is the short circuit test waveform diagram when Rg=37ohm, Rge=10ohm, Cge=10nf.

[0015] Figure 4 It is the short circuit test waveform diagram when Rg=37ohm, Rge=10ohm, Cge=22nf. DETAILED DESCRIPTION

[0016] In order to make those skilled in the art more clearly understand the purpose, technical scheme and advantages of the utility model, the utility model is further described below in combination with the drawings and examples.

[0017] In the description of the utility model, it is understood that the orientation or position relationship indicated by the terms such as "up", "down", "left", "right", "inner", "outer", "horizontal", "vertical" is based on the orientation or position relationship shown in the drawings, and is only for the convenience of describing the utility model, and does not indicate or imply that the indicated device or element must have a particular orientation, therefore it cannot be understood as a limitation on the utility model.

[0018] The utility model discloses an IGBT test circuit of fast modification gate parameter will be described in detail below with the drawings: as Figure 1 As shown in a kind of IGBT test circuit of fast modification gate parameter, including test circuit body, the test circuit body is by signal generator 1, driving ICU1 module 2, Rg module 3, Rge module 4, Cge module 5 and IGBT 6 composition, the output positive pole 7 of signal generator 1 is sequentially connected with one of the foot of driving ICU1 module 2, Rg module 3 and the 1 foot line of IGBT 6, after its 3 foot of IGBT 6 is connected with the other foot line of driving ICU1 module 2, after being connected with GND in common, one of the remaining pin of this driving ICU1 module 2 is connected with the output negative pole 8 of signal generator 1 line, constitute circuit loop, and Rge module 4 and Cge module 5 are provided with parallel connection between driving ICU1 module 2 and IGBT 6 on circuit loop, and Rge module 4 and Cge module 5 are series connection between them.

[0019] The Rg module 4 is composed of at least three groups of parallelly arranged switch circuits, each group of switch circuits is composed of one switch and one resistor, the switches are SW1, SW2 and SW3 respectively, and the resistors are R1, R2 and R3 respectively, the resistance value of the Rg module 4 is adjusted by adjusting the opening and closing of each switch.

[0020] The driving ICU1 module 2 is provided with eight pins in total, wherein the two pins are connected with the output positive pole 7 of the signal generator 1, the three pins are connected with the output negative pole 8 of the signal generator 1, the sixth pin and the seventh pin are short-circuited and connected with each switch in the Rg module 3 respectively, and the eighth pin is connected with a power supply of 15V.

[0021] The Rge module 3 is composed of at least three groups of parallelly arranged switch circuits, each group of switch circuits is composed of one switch and one resistor, the switches are SW4, SW5 and SW6 respectively, and the resistors are R4, R5 and R6 respectively, the resistance value of the Rge module 3 is adjusted by adjusting the opening and closing of each switch, and the ends of each resistor, which are away from the switches, are connected and then connected with the Cge module 5.

[0022] The Cge module 5 is composed of at least three groups of parallelly arranged capacitor switch circuits, each group of switch circuits is composed of one switch and one capacitor, the switches are SW7, SW8 and SW9 respectively, and the capacitors are C1, C2 and C3 respectively, the capacitance of the Cge module 5 is adjusted by adjusting the opening and closing of each switch, and the ends of each capacitor, which are away from the switches, are short-circuited and then connected with the third pin of the IGBT 6.

[0023] The number of switch circuits and capacitor switch circuits in the utility model can be adjusted according to actual conditions, and actual requirements can be met, without any limitation.

[0024] The specific implementation method of the utility model is:

[0025] When the switch SW1, SW2, SW3 closes any one, the resistance of Rge module = R4 or R5 or R6, closes any two, the resistance of Rge module = R4 / / R5 or R4 / / R6 or R5 / / R6, three all close, the resistance of Rg module = R4 / / R5 / / R6, can realize 7 different resistance of Rg at most

[0026] When the switch SW4, SW5, SW6 closes any one, the resistance of Rg module = R1 or R2 or R3, closes any two, the resistance of Rg module = R1 / / R2 or R1 / / R3 or R2 / / R3, three all close, the resistance of Rg module = R1 / / R2 / / R3, can realize 7 different resistance of Rge at most

[0027] When the switch SW7, SW8, SW9 closes any one, the capacitance of Cge module = C1 or C2 or C3, closes any two, the capacitance of Cge module = C1 / / C2 or C1 / / C3 or C2 / / C3, three all close, the capacitance of Cge module = C1 / / C2 / / C3, can realize 7 different capacitance of Cge at most.

[0028] In the short circuit test waveform diagram of the utility model, the following three groups of data are selected:

[0029] When Rg = 21 ohm, Rge = 10 ohm, Cge = 10 nf, the short circuit test waveform diagram as shown in Figure 2 .

[0030] When Rg = 37 ohm, Rge = 10 ohm, Cge = 10 nf, the short circuit test waveform diagram as shown in Figure 3 .

[0031] When Rg = 37 ohm, Rge = 10 ohm, Cge = 22 nf, the short circuit test waveform diagram as shown in Figure 4 .

[0032] The specific embodiments described in the present application are only illustrative of the principles and effects of the utility model, and are not used to limit the utility model. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the utility model. Therefore, all equivalent modifications or changes made by those skilled in the art without departing from the spirit and technical concept disclosed by the utility model should be covered by the claims of the utility model.

Claims

1. An IGBT test circuit capable of quickly modifying gate parameters, comprising a test circuit body, characterized in that: The test circuit body is composed of a signal generator (1), a driving ICU1 module (2), an Rg module (3), an Rge module (4), a Cge module (5) and an IGBT (6), the output positive pole (7) of the signal generator (1) is connected with one foot of the driving ICU1 module (2), the Rg module (3) and the 1 foot of the IGBT (6) in sequence, then the 3 foot of the IGBT (6) is connected with the other foot of the driving ICU1 module (2) in sequence, and the GND is connected in common, one foot of the remaining pin of the driving ICU1 module (2) is connected with the output negative pole (8) of the signal generator (1) in sequence, a circuit loop is formed, and the Rge module (4) and the Cge module (5) are arranged in parallel between the driving ICU1 module (2) and the IGBT (6) on the circuit loop, and the Rge module (4) and the Cge module (5) are arranged in series.

2. The IGBT test circuit with fast modifiable gate parameters of claim 1, wherein: The Rg module (4) is composed of at least three groups of parallelly arranged switch circuits, each group of switch circuits is composed of one switch and one resistor, the on-off of each switch is adjusted, so that the resistance of the Rg module (4) is adjusted.

3. The IGBT test circuit with fast modifiable gate parameters according to claim 1 or 2, characterized in that: The driving ICU1 module (2) is provided with 8 pins in total, the 2 foot is connected with the output positive pole (7) of the signal generator (1), the 3 foot is connected with the output negative pole (8) of the signal generator (1), the 6 foot and the 7 foot are short-circuited and connected with each switch in the Rg module (3) in sequence, and the 8 foot is connected with the power supply 15V.

4. The IGBT test circuit with fast modifiable gate parameters of claim 3, wherein: The Rge module (3) is composed of at least three groups of parallelly arranged switch circuits, each group of switch circuits is composed of one switch and one resistor, the on-off of each switch is adjusted, so that the resistance of the Rge module (3) is adjusted, and the ends of each resistor far away from the switch are connected in sequence and then connected with the Cge module (5).

5. The IGBT test circuit with fast modifiable gate parameters of claim 4, wherein: The Cge module (5) is composed of at least three groups of parallelly arranged capacitor switch circuits, each group of switch circuits is composed of one switch and one capacitor, the on-off of each switch is adjusted, so that the capacitance of the Cge module (5) is adjusted, and the ends of each capacitor far away from the switch are short-circuited and then connected with the 3 foot of the IGBT (6).

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