Chip pin coplanarity detection device

Abstract

The utility model discloses a gull-wing-shaped and J-shaped chip coplanarity detection device, which relates to the technical field of chip coplanarity detection and comprises a supporting bottom plate, a detection table is arranged on one side of the top of the supporting bottom plate, a detection lens is arranged on the top of the detection table, and a positioning baffle is arranged on one side of the top of the detection lens. An adjusting assembly is arranged on the other side of the top of the supporting bottom plate, anti-skid supporting legs are installed at the bottom of the supporting bottom plate, a microscope connecting assembly is arranged on the side face of the adjusting assembly, a microscope is arranged on the side face of the microscope connecting assembly, and an adjusting rotating rod and a rotating handle are arranged in the middle of the microscope connecting assembly. According to the chip pin detection device, the detection table and the detection lens are arranged to facilitate detection of chip pins, the microscope is arranged to observe the chip pins on the detection lens, the detection efficiency is improved, the adjustment of the microscope is realized through the adjusting rotating rod, and the use convenience of the device is improved.

Description

Technical Field

[0001] This utility model relates to the field of chip coplanarity detection technology, and in particular to a device for detecting the coplanarity of chip pins. Background Technology

[0002] Due to quality control requirements, chips must undergo 100% screening. However, during the screening process, gull-wing and J-type chips may experience issues such as pin deformation and lifting. Upon returning to the factory for reflow soldering, some gull-wing and J-type chip pins may exhibit poor soldering, manifesting as individual pins lifting off the pads or showing signs of cold solder joints. Cold solder joints indicate insufficient solder strength and can be easily removed from the solder surface with tweezers.

[0003] Currently, there are no effective measurement methods for gull-wing and J-type chip pin warping. Most methods involve observation after a chip malfunctions, followed by troubleshooting and analysis during the debugging phase to pinpoint the problem area before rework can proceed. This process is time-consuming and lacks accuracy. Summary of the Invention

[0004] The main purpose of this invention is to provide a device for detecting the coplanarity of chip pins, which can effectively solve the problems in the background art.

[0005] To achieve the above objectives, the technical solution adopted by this utility model is as follows:

[0006] A device for detecting the coplanarity of chip pins includes a supporting base plate and a detection stage, characterized in that it further includes a positioning baffle, an adjustment component, and a microscope; the detection stage has a cuboid structure and is horizontally placed on the surface of the supporting base plate; the top surface of the detection stage is horizontal and is provided with a detection lens with high flatness, the mirror surface of the detection lens facing upwards, the back surface of the detection lens being in contact with the top surface of the detection stage, and the area of ​​the detection lens being larger than the overall projected area of ​​the chip; the positioning baffle is located on one side of the detection stage, and the adjustment component is located on the other side of the detection stage;

[0007] The positioning baffle rests on one side of the detection lens, and the side of the positioning baffle is perpendicular to the detection lens.

[0008] The adjustment assembly includes a horizontal slide rail and a slider. A microscope is mounted on the slider via a connector, and the lens of the microscope is aligned with the detection lens.

[0009] Furthermore, the positioning baffle includes a vertical longitudinal plate and a horizontal transverse plate. The longitudinal plate is vertically fixed to the surface of the supporting base plate, and the transverse plate rests on one side of the detection lens. The height of the transverse plate is higher than the height of the detection lens, and the side of the transverse plate is perpendicular to the detection lens.

[0010] Further, the adjusting assembly comprises a horizontally arranged connecting horizontal plate and a sliding block, a cavity is arranged in the middle of the sliding block, a sliding groove is arranged below the sliding block, and the cavity and the sliding groove are in communication with each other; the connecting horizontal plate passes through the sliding groove; the sliding block can move horizontally on the connecting horizontal plate; and the sliding block is fixed with the microscope through a connecting piece.

[0011] Further, a driven gear strip is arranged on the connecting horizontal plate, a cavity is arranged in the middle of the sliding block, a driving gear is arranged in the cavity through a linkage rod, and the driving gear can rotate in the cavity with the linkage rod as the shaft; the connecting horizontal plate with the sliding driven gear strip passes through the cavity of the sliding block; and the driving gear is engaged with the driven gear strip below.

[0012] Further, one end of the linkage rod is provided with a rotating handle.

[0013] Further, symmetrical supporting seats are arranged at two ends below the connecting horizontal plate, and the supporting seats are fixed to the supporting bottom plate through bolts.

[0014] Further, the sliding block of the adjusting assembly is connected with the microscope through a microscope connecting assembly; an adjusting rotating rod is arranged in the middle of the microscope connecting assembly, one end of the adjusting rotating rod is provided with a rotating handle, and the other end of the adjusting rotating rod is installed with the microscope through a support.

[0015] Further, anti-skid supporting feet are installed at the bottom of the supporting bottom plate.

[0016] Compared with the prior art, the present application has the following beneficial effects:

[0017] 1. The detection platform and the detection lens are arranged to facilitate the detection of the chip pins, the microscope is arranged to observe the chip pins on the detection lens, the detection efficiency is improved, and the adjusting rotating rod is arranged to adjust the microscope, thereby improving the use convenience of the device.

[0018] 2. The adjusting assembly is arranged to move the microscope, the rotating handle is rotated to drive the linkage rod to rotate, thereby driving the sliding block to slide along the driven gear strip and the connecting horizontal plate, thereby achieving uniform movement of the microscope, facilitating batch detection and observation of the chip pins by the microscope, and improving the work efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 is a structural schematic view of the whole device of the present application;

[0020] Figure 2 is a structural schematic view of the bottom of the whole device of the present application;

[0021] Figure 3It is the structural schematic diagram of the detection table of the utility model;

[0022] Figure 4 It is the structural schematic diagram of the adjusting assembly of the utility model.

[0023] In the figure: 1, support bottom plate; 2, antiskid support foot; 3, detection table; 4, detection lens; 5, positioning baffle; 6, microscope; 7, microscope connecting assembly; 8, adjusting rotating rod; 9, rotating handle; 10, adjusting assembly; 11, support seat; 12, connecting cross plate; 13, sliding block; 14, sliding groove; 15, cavity; 16, driving gear; 17, driven gear strip; 18, linkage rod; 19, rotating handle. DETAILED DESCRIPTION

[0024] In order to make the technical means, creation features, purposes and effects of the utility model easy to understand, the utility model is further described below in combination with specific embodiments.

[0025] In the utility model, the chip mainly refers to gull wing type, J type chip.

[0026] Embodiment one

[0027] Please refer to Figure 1 、 Figure 2 、 Figure 3 As shown, the chip pin coplanarity detection device includes support bottom plate 1, detection table 3, positioning baffle 5 and adjusting assembly 10. The detection table 3 is a cuboid structure. The detection table 3 is horizontally placed on the board surface of the support bottom plate 1. The top surface of the detection table 3 is horizontal and is provided with detection lens 4 with high flatness. The mirror surface of the detection lens 4 faces upward, and the back surface of the detection lens 4 is attached to the top surface of the detection table 3. The positioning baffle 5 is arranged on the board surface of the support bottom plate 1 on one side of the detection table 3, and the adjusting assembly 10 is arranged on the board surface of the support bottom plate 1 on the other side of the detection table 3. The antiskid support foot 2 is installed at the bottom of the support bottom plate 1.

[0028] It should be noted that when detecting the chip pin, the chip as a whole is placed on the detection lens 4, so the area of the detection lens 4 is greater than the projection area of the chip as a whole.

[0029] The positioning baffle 5 includes a vertical longitudinal plate and a horizontal transverse plate. The longitudinal plate is vertically fixed on the board surface of the support bottom plate 1, and the transverse plate is arranged on one side of the detection lens 4. The height of the transverse plate is higher than the height at which the detection lens 4 is located, and the side surface of the transverse plate is perpendicular to the detection lens 4. The purpose of such arrangement is that when the chip is placed on the detection lens 4, the side without pin can be abutted against the side surface of the transverse plate, thereby playing the role of positioning and limiting.

[0030] The adjusting assembly 10 comprises a horizontal slide rail and a sliding block, and the microscope 6 is arranged on the sliding block through a connecting member. The lens of the microscope 6 is aligned with the detection lens 4. The microscope 6 can move horizontally on the sliding block, that is, the lens of the microscope 6 can move horizontally to observe the chip placed on the detection lens 4. The microscope 6 is connected to an external machine. When the chip is placed on the detection lens 4, the microscope 6 aligned with the detection lens 4 transmits the imaging of the chip pin and the pin on the mirror surface to the external machine, and the external machine can obtain 2 times of the pin lifting degree through the imaging. In GJB3243-98 "Electronic Component Surface Mounting Requirements", article 4.1.4 clearly requires that the coplanarity error of the lead of the component should be not more than 0.1 mm, so the chip with the lifting degree of more than 0.2 mm is determined as unqualified.

[0031] Embodiment two, based on embodiment one.

[0032] As shown in Figure 1 and Figure 4 , the adjusting assembly 10 comprises a horizontal connecting plate 12 and a sliding block 13. The middle of the sliding block 13 is provided with a cavity 15, and the lower part of the sliding block 13 is provided with a sliding groove 14, and the cavity 15 and the sliding groove 14 are in communication with each other. The connecting plate 12 passes through between the sliding grooves 14. The sliding block 13 can move horizontally on the connecting plate 12. The sliding block 13 is fixed with the microscope 6 through a connecting member.

[0033] Embodiment three, based on embodiment two.

[0034] As shown in Figure 1 , Figure 2 and Figure 4 , the adjusting assembly 10 comprises a horizontal connecting plate 12 and a sliding block 13. The connecting plate 12 is provided with a driven gear strip 17. The middle of the sliding block 13 is provided with a cavity 15, and the cavity 15 is provided with a driving gear 16 through a linkage rod 18, and the driving gear 16 can rotate in the cavity 15 with the linkage rod 18 as the shaft. The connecting plate 12 provided with the sliding driven gear strip 17 passes through the cavity 15 of the sliding block 13. The lower part of the driving gear 16 engages with the driven gear strip 17. One end of the linkage rod 18 is provided with a rotating handle 19. Operating the rotating handle 19 can make the driving gear 16 drive the sliding block 13 to move horizontally along the driven gear strip 17. The sliding block 13 is fixed with the microscope 6 through a connecting member. The adjusting assembly 10 is arranged to realize the movement of the position of the microscope 6. By rotating the rotating handle 19, the linkage rod 18 drives the driving gear 16 to rotate, so that the driving gear 16 drives the sliding block 13 to slide along the driven gear strip 17 and the connecting plate 12, thereby realizing the uniform movement of the microscope 6, thereby facilitating the batch detection and observation of the chip pin by the microscope 6, and improving the work efficiency.

[0035] Example four, based on example two.

[0036] As Figure 4 shown, the two ends below the connecting cross plate 12 are respectively provided with symmetrical support seats 11, and the bottoms of the support seats 11 are fixed with the support bottom plate 1 through bolts. The connecting cross plate 12 and the support bottom plate 1 are spaced.

[0037] Example five, based on example one.

[0038] As Figure 4 shown, the slider of the adjusting assembly 10 is connected with the microscope 6 through the microscope connecting assembly 7. The middle of the microscope connecting assembly 7 is provided with an adjusting rotating rod 8, one end of the adjusting rotating rod 8 is provided with a rotating handle 9, and the other end of the adjusting rotating rod 8 is provided with the microscope 6 through a support. The rotating handle 9 is adjacent to the rotating handle 19.

[0039] It should be noted that the utility model is a gull-wing type, J-type chip coplanarity detection device. When in use, the chip to be detected is placed on the detection lens 4, so that the detection lens 4 irradiates the pins on the chip, and the projection of the chip and the pins on the chip is projected on the detection lens 4. The microscope 6 is used to realize the penetration and detection of the pins on the chip. At the same time, the rotating handle 19 is rotated, so that the rotating handle 19 drives the linkage rod 18 and the driving gear 16 to rotate. The driving gear 16 rotates in the inside of the sliding block 13. The driving gear 16 and the driven gear strip 17 are meshed with each other, so that the driving gear 16 drives the sliding block 13 to move above the driven gear strip 17. The bottom of the driven gear strip 17 is fixedly connected with the connecting cross plate 12. The sliding block 13 is sleeved outside the connecting cross plate 12, so that the sliding block 13 drives the microscope 6 to move at a constant speed in the moving process, so that the microscope 6 realizes batch detection of the pins on the chip, improves the working efficiency of the device, and corrects the pins by using the anti-static correction tool when the height of the pins is unqualified.

Claims

1. A device for detecting the coplanarity of chip pins, comprising a support base plate (1) and a detection table (3), characterized in that: Also include positioning baffle (5), adjusting assembly (10) and microscope; The detection table (3) is cuboid structure, and the detection table (3) is horizontally placed on the board surface of support base plate (1);The top surface of detection table (3) is horizontal and is provided with detection lens (4) with high flatness, the mirror surface of detection lens (4) is upward, the back of detection lens (4) is attached to the top surface of detection table (3), and the area of detection lens (4) is greater than the projection area of chip whole;The positioning baffle (5) is arranged at one side of detection table (3), and adjusting assembly (10) is arranged at the other side of detection table (3); The positioning baffle (5) is arranged at one side of detection lens (4), and the side of positioning baffle (5) is perpendicular to detection lens (4); The adjusting assembly (10) includes a horizontal sliding rail and a sliding block, and the microscope (6) is arranged on the sliding block through a connecting member, and the lens of microscope (6) is aligned with detection lens (4).

2. The apparatus for detecting a coplanarity of a chip pin according to claim 1, wherein: The positioning baffle (5) includes a vertical longitudinal plate and a horizontal transverse plate, the longitudinal plate is vertically fixed on the board surface of support base plate (1), the transverse plate is arranged at one side of detection lens (4), the height of transverse plate is higher than the height where detection lens (4) is located, and the side of transverse plate is perpendicular to detection lens (4).

3. The apparatus for detecting a coplanarity of a chip pin according to claim 1, wherein: The adjusting assembly (10) includes horizontally placed connecting transverse plate (12) and sliding block (13), the middle of sliding block (13) is provided with cavity (15), the lower portion of sliding block (13) is provided with sliding groove (14), and cavity (15) and sliding groove (14) are in communication;Connecting transverse plate (12) passes through between sliding groove (14);Sliding block (13) can move horizontally on connecting transverse plate (12);Sliding block (13) is fixed with microscope (6) through a connecting member.

4. The apparatus for detecting a coplanarity of a chip pin according to claim 3, wherein: The connecting transverse plate (12) is provided with driven gear strip (17), the middle of sliding block (13) is provided with cavity (15), the cavity (15) is provided with driving gear (16) through linkage rod (18), and driving gear (16) can rotate in cavity (15) with linkage rod (18) as the shaft;The connecting transverse plate (12) provided with sliding driven gear strip (17) passes through the cavity (15) of sliding block (13);The lower portion of driving gear (16) engages with driven gear strip (17).

5. The apparatus for detecting a coplanarity of a chip pin according to claim 4, wherein: One end of linkage rod (18) is provided with rotating handle (19).

6. The apparatus for detecting a coplanarity of a chip pin according to claim 3, wherein: The lower portion of connecting transverse plate (12) is provided with symmetrical support seat (11) at both ends respectively, the bottom of support seat (11) is fixed with support base plate (1) through bolts, and there is a space between connecting transverse plate (12) and support base plate (1).

7. The apparatus for detecting a coplanarity of a chip pin according to claim 1, wherein: The sliding block of adjusting assembly (10) is connected with microscope (6) through microscope connecting assembly (7);The middle of microscope connecting assembly (7) is provided with adjusting rotating rod (8), one end of adjusting rotating rod (8) is provided with rotating handle (9), and the other end of adjusting rotating rod (8) is installed with microscope (6) through a support.

8. The apparatus for detecting a coplanarity of a chip pin according to claim 1, wherein: The bottom of support base plate (1) is installed with anti-skid supporting leg (2).

Images