Long-life test probe for integrated circuit

Abstract

The utility model relates to the technical field of test probes, in particular to a long-life test probe for an integrated circuit, which comprises a test probe body, a protective sleeve arranged on the outer side of the test probe body in a sleeving manner, and a fixing assembly arranged in the protective sleeve and used for fixing the test probe body. The protective sleeve is arranged on the fixing assembly, so that a worker can hold the protective sleeve when installing the test probe body, the fixing assembly clamps the test probe body in the protective sleeve, the situation that the worker is difficult to take the probe when installing the test probe due to the fact that the size of the test probe is small is avoided, and the fixing assembly is elastic, so that the test probe is not easy to take. After a worker installs the test probe body, the protective sleeve can be pulled downwards, and the protective sleeve can be detached to be continuously used by other test probes, so that the worker can install the test probe more conveniently.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of test probes, in particular to a long-life test probe for integrated circuits. BACKGROUND

[0002] The long-life test probe for integrated circuits is a tool for testing and debugging electronic devices, mainly used for reading and detecting signals in circuits. It obtains voltage or current signals through pins connected to the circuit board and transmits these signals back to the test equipment for analysis and processing, thereby helping engineers locate and repair faults on the circuit board.

[0003] However, the existing test probe is small in size, which makes it difficult for workers to hold the probe when installing the test probe. Therefore, the application provides a long-life test probe for integrated circuits to solve the above technical problems. CONTENT OF THE UTILITY MODEL

[0004] In view of the shortcomings of the prior art, the application aims to provide a long-life test probe for integrated circuits to solve the technical problem that the existing test probe is small in size, making it difficult for workers to hold the probe when installing the test probe.

[0005] The above-mentioned purpose of the application is achieved by the following technical scheme: a long-life test probe for integrated circuits, comprising a test probe body, a protective sleeve sleeved outside the test probe body, and a fixing assembly arranged in the protective sleeve for fixing the test probe body.

[0006] Further, the fixing assembly comprises two arc-shaped clamping plates arranged on the opposite sides inside the protective sleeve and a supporting spring arranged between the arc-shaped clamping plates and the inner wall of the protective sleeve for pushing the two arc-shaped clamping plates close to each other.

[0007] By adopting the above technical scheme, when workers install the test probe body, they can hold the protective sleeve because the supporting spring pushes the arc-shaped clamping plates to clamp the test probe body in the protective sleeve. Thus, workers will not find it difficult to hold the probe when installing the test probe due to its small size. Moreover, since the fixing assembly is elastic, workers can pull down the protective sleeve after completing the installation of the test probe body, and then disassemble the protective sleeve for use with other test probes, making it more convenient for workers to install the test probe.

[0008] Further, the opposite sides inside the protective sleeve are provided with sliding grooves arranged along the height direction of the protective sleeve, the outer side of the protective sleeve is provided with a connecting groove penetrating the protective sleeve and communicating with the sliding grooves, and the sliding grooves are provided with a sliding assembly.

[0009] Further, the sliding assembly comprises a sliding block connected to the protective sleeve through the sliding groove and a push rod fixedly arranged on the sliding block and extending out of the protective sleeve through the connecting groove.

[0010] By adopting the above technical scheme, although the protective sleeve is arranged to make it more convenient for the worker to install the test probe, when installing the test probe body, some special installation positions need to push the test probe body to be mostly inserted into the installation position, and the arrangement of the protective sleeve blocks the test probe body from being inserted into the installation position, resulting in that the test probe body cannot be installed into the installation position. The arrangement of the sliding assembly solves this technical problem. When the test probe body needs to be mostly installed in the installation position, the test probe body is first pulled to move upward, so that the arc-shaped clamping plate only clamps part of the bottom end of the test probe body, and then only the two push rods are pushed in the direction of the installation position, so that the push rods drive the sliding block to slide in the direction of the installation position, so that the test probe body clamped by the arc-shaped clamping plate extends into the installation position. In this way, the test probe body can be mostly inserted into the installation position to complete the installation, thereby improving the applicability of the protective sleeve.

[0011] Further, one end of each of the two push rods away from the sliding block is provided with a connecting rod penetrating through the two push rods.

[0012] By adopting the above technical scheme, the two push rods are connected in series through the connecting rod, so that the worker can push the two push rods at the same time to facilitate the worker to use the push rod.

[0013] Further, one face of one of the two arc-shaped clamping plates away from the other arc-shaped clamping plate is provided with a control structure for controlling the arc-shaped clamping plate.

[0014] Further, the control structure comprises a through groove opened on the outer side of the protective sleeve and penetrating into the interior of the protective sleeve and a control rod penetrating into the protective sleeve through the through groove and fixedly connected to one end of the arc-shaped clamping plate, and the through groove is in the same height as the sliding groove.

[0015] By adopting the above technical scheme, after the worker installs the test probe body, the worker can pull the arc-shaped clamping plate outward through the control rod to compress the supporting spring, so as to prevent the test probe from being taken out when the worker removes the protective sleeve.

[0016] Further, the upper and lower end edges of the arc-shaped clamping plate are circular arc portions.

[0017] By adopting the above technical scheme, the test probe body is inserted into the protective sleeve.

[0018] In summary, the present application has at least one of the following beneficial technical effects:

[0019] 1. The protective sleeve and the fixing assembly are arranged, so that the worker can hold the protective sleeve when installing the test probe body, because the support spring pushes the arc-shaped clamping plate to clamp the test probe body in the protective sleeve, so that the worker will not be difficult to take the probe when installing the test probe because the volume of the test probe is small, and because the fixing assembly is elastic, the worker can pull down the protective sleeve after completing the installation of the test probe body, and the protective sleeve is disassembled to continue to use other test probes, so that the worker can install the test probe more conveniently. BRIEF DESCRIPTION OF DRAWINGS

[0020] Figure 1 is a schematic diagram of the overall structure of the embodiment;

[0021] Figure 2 is a top view of the overall structure of the embodiment with the test probe body hidden.

[0022] Reference signs: 1, test probe body; 2, protective sleeve; 20, sliding groove; 21, connecting groove; 3, fixing assembly; 30, arc-shaped clamping plate; 31, support spring; 4, sliding assembly; 40, sliding block; 41, push rod; 42, connecting rod; 5, control structure; 50, through groove; 51, control rod. DETAILED DESCRIPTION

[0023] The application will be further described in detail below with reference to the accompanying drawings.

[0024] Embodiment, refer to Figure 1 , Figure 2 A long-life test probe for integrated circuits, comprising a test probe body 1, a protective sleeve 2 arranged outside the test probe body 1, and a fixing assembly 3 arranged in the protective sleeve 2 for fixing the test probe body 1, the fixing assembly 3 comprising two arc-shaped clamping plates 30 arranged on the opposite sides inside the protective sleeve 2 and a support spring 31 arranged between the arc-shaped clamping plates 30 and the inner wall of the protective sleeve 2 for pushing the two arc-shaped clamping plates 30 close to each other, the protective sleeve 2 is arranged, so that the worker can hold the protective sleeve 2 when installing the test probe body 1, because the support spring 31 pushes the arc-shaped clamping plate 30 to clamp the test probe body 1 in the protective sleeve 2, so that the worker will not be difficult to take the probe when installing the test probe because the volume of the test probe is small, and because the fixing assembly 3 is elastic, the worker can pull down the protective sleeve 2 after completing the installation of the test probe body 1, and the protective sleeve 2 is disassembled to continue to use other test probes, so that the worker can install the test probe more conveniently.

[0025] Although the protective sleeve 2 is arranged to make it more convenient for the staff to install the test probe, in the installation of the test probe body 1, some special installation positions need to push the test probe body 1 to be mostly retracted into the installation position, and the arrangement of the protective sleeve 2 blocks the test probe body 1 from retracting into the installation position, so that the test probe body 1 cannot be installed into the installation position. In order to solve this technical problem, the embodiment is provided with a sliding groove 20 arranged along the height direction of the protective sleeve 2 on the opposite sides inside the protective sleeve 2, a connecting groove 21 is arranged on the outside of the protective sleeve 2 and penetrates the protective sleeve 2 and communicates with the sliding groove 20, and a sliding assembly 4 is arranged in the sliding groove 20. The sliding assembly 4 includes a sliding block 40 connected to the protective sleeve 2 through the sliding groove 20 and a pushing rod 41 fixedly arranged on the side of the sliding block 40 close to the connecting groove 21 and extending out of the protective sleeve 2 through the connecting groove 21. Through the arrangement of the sliding assembly 4, when the test probe body 1 needs to be mostly installed in the installation position, the test probe body 1 is first pulled upward to move, so that the arc-shaped clamping plate 30 only clamps part of the bottom end of the test probe body 1, and then only needs to be pushed in the direction of the installation position against the two pushing rods 41, so that the pushing rod 41 drives the sliding block 40 to slide in the direction of the installation position, so that the test probe body 1 clamped by the arc-shaped clamping plate 30 extends into the installation position. In this way, the test probe body 1 can be mostly retracted into the installation position, and the installation is completed, thereby improving the applicability of the protective sleeve 2.

[0026] In the embodiment, the ends of the two pushing rods 41 away from the sliding block 40 are provided with a connecting rod 42 penetrating the two pushing rods 41, so that the two pushing rods 41 are connected in series through the connecting rod 42, so that the staff can simultaneously push the two pushing rods 41, thereby facilitating the staff to use the pushing rod 41.

[0027] In the embodiment, one side of one of the two arc-shaped clamping plates 30 away from the other arc-shaped clamping plate is provided with a control structure 5 for controlling the arc-shaped clamping plate 30. The control structure 5 includes a through groove 50 arranged on the outside of the protective sleeve 2 and penetrating into the inside of the protective sleeve 2, and a control rod 51 extending into the protective sleeve 2 through the through groove 50 and fixedly connected to the arc-shaped clamping plate 30 at one end. The through groove 50 is the same height as the sliding groove 20, so that after the staff installs the test probe body 1, the staff can pull the arc-shaped clamping plate 30 out of the protective sleeve 2 through the control rod 51 to compress the supporting spring 31, so as to prevent the test probe from being taken out when the staff removes the protective sleeve 2.

[0028] In the embodiment, the upper and lower edges of the arc-shaped clamping plate 30 are circular arc portions, so as to facilitate the insertion of the test probe body 1 into the protective sleeve 2.

[0029] Specific implementation process: when the test probe body 1 needs to be installed, hold the protective sleeve 2, install the test probe body 1 end towards the installation position, then push the test probe body 1 into the installation position, and then push the connecting rod 42 towards the installation position, so that the test probe body 1 clamped by the arc-shaped clamping plate 30 extends into the installation position, after installation is completed, pull the arc-shaped clamping plate 30 out of the protective sleeve 2 to compress the supporting spring 31 to take down the protective sleeve 2.

[0030] The embodiments of the present specific implementation are the preferred embodiments of the present application, and are not intended to limit the protection scope of the application, so that: any equivalent changes made according to the structure, shape, principle of the present application should be covered within the protection scope of the present application.

Claims

1. A long-life test probe for integrated circuits, characterized in that, The utility model relates to a test probe body (1), the protective sleeve (2) of test probe body (1) outside is set, and the fixed assembly (3) for fixing test probe body (1) is set in protective sleeve (2) inside, the fixed assembly (3) includes two arc clamping plates (30) respectively setting in the opposite two sides of protective sleeve (2) inside and the support spring (31) for pushing two arc clamping plates (30) to each other between arc clamping plate (30) and the inner wall of protective sleeve (2) is set, the opposite two sides of protective sleeve (2) inside are set with the slide groove (20) along the height direction of protective sleeve (2), the connecting groove (21) of being set with the through protective sleeve (2) and the communication of slide groove (20) is set outside protective sleeve (2), the slide assembly (4) is equipped in slide groove (20).

2. The long-life test probe for an integrated circuit according to claim 1, wherein The slide assembly (4) includes a sliding block (40) connected to the protective sleeve (2) through the slide groove (20) and a push rod (41) fixedly arranged on the side of the sliding block (40) close to the connecting groove (21) and extending out of the protective sleeve (2) through the connecting groove (21).

3. The long-life test probe for an integrated circuit according to Claim 2, wherein The ends of the two push rods (41) away from the sliding block (40) are provided with a connecting rod (42) penetrating through the two push rods (41).

4. The long-life test probe for an integrated circuit according to Claim 1, wherein One side of one of the two arc clamping plates (30) away from the other arc clamping plate is provided with a control structure (5) for controlling the arc clamping plate (30).

5. The long-life test probe for an integrated circuit according to Claim 4, wherein The control structure (5) includes a through groove (50) opened on the outside of the protective sleeve (2) and penetrating into the inside of the protective sleeve (2), and a control rod (51) extending into the protective sleeve (2) through the through groove (50) and fixedly connected to the arc clamping plate (30) at one end, and the through groove (50) is level with the slide groove (20).

6. The long-life test probe for an integrated circuit according to claim 1, wherein The upper and lower edges of the arc clamping plate (30) are circular arc portions.

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