Electronic component aging test fixture

Abstract

The utility model relates to the technical field of electronic component burn-in testing, in particular to an electronic component burn-in testing clamp which comprises a base, electric push rods are fixedly installed on the left side and the right side of the upper surface of the base respectively, the output ends of the electric push rods are fixedly connected with a detection table, and gaskets are fixedly installed on the upper surface of the detection table. A fixing plate is fixedly installed on the rear side of the upper surface of the detection table, fixing assemblies are arranged on the front side of the upper surface of the detection table and used for fixing electronic elements, and detection assemblies are arranged on the left side and the right side of the detection table and used for conducting power-on detection on the electronic elements. According to the aging test fixture for the electronic component, through the cooperation of the movement of the electrode plate and the up-down movement of the detection table, the electrode plate can be in contact with contacts of various types of electronic components conveniently, the device can test the various types of electronic components conveniently, and the adaptability of the device is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to electronic components aging test technical field, concretely to a kind of electronic components aging test fixture. BACKGROUND

[0002] With the rapid development of electronic technology, the reliability of electronic components is increasingly required. Aging test, as an effective screening method, can detect potential defects in components and improve product reliability. Aging test uses a fixture to fix electronic components.

[0003] Patent application number: 202123202513.5 proposes an electronic component aging test fixture. The sliding seat can slide on the sliding plate, and the position of the fixture can be adjusted according to the user's needs, making it convenient to use. By setting the fixed screw, the second fixed plate, and the spring, the electronic component is placed between the two electrode sheets. The fixed screw can drive the second fixed plate to move forward and backward, and can fix different sizes of electronic components according to the user's needs.

[0004] The device also has some shortcomings when in use, such as the height of the second fixed plate and the detection table of the device cannot be adjusted conveniently. When fixing electronic components of multiple models, it is difficult to ensure that the power supply contacts of the electronic components are on the same horizontal plane as the second fixed plate, resulting in poor adaptability of the device. UTILITY MODEL CONTENT

[0005] The utility model aims to provide an electronic component aging test fixture to solve the problems raised in the background technology.

[0006] To achieve the above-mentioned purpose, the utility model provides the following technical scheme:

[0007] An electronic component aging test fixture includes a base, an electric push rod is fixedly installed on the upper surface of the base, the output end of the electric push rod is fixedly connected with a detection table, a gasket is fixedly installed on the upper surface of the detection table, a fixed plate is fixedly installed on the rear side of the upper surface of the detection table, a fixed assembly is provided on the front side of the upper surface of the detection table for fixing electronic components, and detection assemblies are provided on the left and right sides of the detection table for electrically detecting electronic components.

[0008] The detection assembly includes a slide rod holder installed on the side of the base, two sliding blocks are slidingly installed on the slide rod holder, a support plate is fixedly installed on the upper surface of the sliding block, threaded rods are screw-connected and assembled at the top end of the support plate, a positioning plate is rotatably installed at one end of the threaded rod facing the center of the detection table, electrode sheets are fixedly installed on the surface of the positioning plate, a conductive rod is slidingly arranged through the top end of the support plate, one end of the conductive rod is fixedly connected with the positioning plate, and a connector column is fixedly installed at the other end of the conductive rod.

[0009] Preferably, the fixing assembly comprises a movable push plate, a plurality of springs are fixedly installed on the surface of the movable push plate towards the side of the fixing plate, one end of the spring is fixedly connected with a buffer plate, the buffer plate is arranged above the gasket, a telescopic device is fixedly installed at the center of the bottom surface of the detection table, and the output end of the telescopic device is fixedly connected with the movable push plate.

[0010] Preferably, a magnet is fixedly installed on the surface of the sliding block towards the base.

[0011] Preferably, a knob is fixedly installed at the end of the threaded rod away from the detection table.

[0012] Preferably, the joint column, the conductive rod and the positioning plate are all made of copper material, and the supporting plate and the threaded rod are all made of insulator.

[0013] Preferably, a processor is installed in the base, and a control panel is fixedly installed on the front surface of the base.

[0014] Compared with the prior art, the electronic component aging test fixture has the following beneficial effects:

[0015] 1. The electronic component aging test fixture is convenient to drive the electrode sheet and the contact of the electronic component to align by sliding the sliding block on the slide rod frame, then drives the threaded rod to rotate by rotating the knob, drives the positioning plate to move by rotating the threaded rod, drives the electrode sheet to move and contact the contact of the electronic component by the positioning plate, and supplies power to the electrode sheet by connecting the power supply contact of the detection device and the joint column, so as to test the electronic component.

[0016] 2. The electronic component aging test fixture is convenient for the electrode sheet to contact the contacts of electronic components of various models by the cooperation of the movement of the electrode sheet and the up-down movement of the detection table, so as to facilitate the device to test electronic components of various models and improve the adaptability of the device. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 It is a structural schematic view of the utility model;

[0018] Figure 2 It is a structural schematic view of the utility model when the electronic component is fixed;

[0019] Figure 3 It is a structural schematic view of the fixing assembly of the utility model;

[0020] Figure 4 It is a structural schematic view of the detection assembly of the utility model.

[0021] In the figure: 1, base; 2, electric push rod; 3, detection table; 4, gasket; 5, fixed plate; 6, moving push plate; 7, spring; 8, buffer plate; 9, telescopic device; 10, slide bar frame; 11, sliding block; 12, magnet; 13, support plate; 14, threaded rod; 15, positioning plate; 16, electrode sheet; 17, conductive rod; 18, joint column; 19, electronic component; 20, control panel. DETAILED DESCRIPTION

[0022] Please refer to Figures 1-4 An electronic component burn-in test fixture, including base 1, the upper surface of base 1 is fixedly installed with electric push rod 2 on both sides, the output end of electric push rod 2 is fixedly connected with detection table 3, by starting electric push rod 2, driving detection table 3 to ascend and descend as a whole, it is convenient to drive electronic component 19 to move up and down, adjusting the height of electronic component 19, the upper surface of detection table 3 is fixedly installed with gasket 4,

[0023] The inside of gasket 4 can be provided with heating sheet according to the demand, it is convenient to heat the detected electronic component 19 for detection;

[0024] The rear side of the upper surface of detection table 3 is fixedly installed with fixed plate 5, the front side of the upper surface of detection table 3 is provided with fixed assembly for fixing electronic component 19, the left and right sides of detection table 3 are provided with detection assembly for conducting detection on electronic component 19;

[0025] Detection assembly includes slide bar frame 10 installed on the side of base 1, two sliding blocks 11 are slidingly installed on the upper surface of slide bar frame 10, support plate 13 is fixedly installed on the upper surface of sliding block 11, threaded rod 14 is screw-jointed and assembled on the top end of support plate 13, positioning plate 15 is rotatably installed on the end of threaded rod 14 towards the center of detection table 3, electrode sheet 16 is fixedly installed on the surface of positioning plate 15, conductive rod 17 is slidingly arranged through the top end of support plate 13, one end of conductive rod 17 is fixedly connected with positioning plate 15, joint column 18 is fixedly installed on the other end of conductive rod 17, knob is fixedly installed on the end of threaded rod 14 away from detection table 3;

[0026] By pushing sliding block 11 to slide on slide bar frame 10, it is convenient to drive electrode sheet 16 to align with the contact of electronic component 19, then by rotating knob, driving threaded rod 14 to rotate, threaded rod 14 drives positioning plate 15 to move through its rotation, positioning plate 15 drives electrode sheet 16 to move and contact with electronic component 19, by connecting the power supply contact of detection device with joint column 18, supplying power to electrode sheet 16, burn-in test is carried out on electronic component 19.

[0027] Further, the fixing assembly comprises a moving push plate 6, a plurality of springs 7 are fixedly installed on the surface of one side of the moving push plate 6 towards the fixing plate 5, one end of each spring 7 is fixedly connected with a buffer plate 8, the buffer plate 8 is arranged above the gasket 4, a telescopic device 9 is fixedly installed at the center of the bottom surface of the detection table 3, the output end of the telescopic device 9 is fixedly connected with the moving push plate 6, the electronic component 19 is placed on the gasket 4, the moving push plate 6 is driven to move by starting the telescopic device 9, the moving push plate 6 drives the buffer plate 8 to move by the springs 7 and cooperates with the fixing plate 5, so that the electronic component 19 is conveniently fixed on the detection table.

[0028] The surface of the sliding block 11 towards the base 1 is fixedly installed with a magnet 12, the magnet 12 is attached to the surface of the base 1, so that the movement of the sliding block 11 is conveniently limited and placed on the slide rod holder 10 to rotate, which affects the normal work of the device, and when the sliding block 11 is pushed to the predetermined position, the magnet 12 is attached to the base 1, so that the position of the sliding block 11 is conveniently fixed.

[0029] Further, the joint column 18, the conductive rod 17 and the positioning plate 15 are all made of copper material, and the supporting plate 13 and the threaded rod 14 are both made of insulator, so as to prevent the device from short circuiting and affecting the normal work of the device.

[0030] The inside of the base 1 is installed with a processor, the front surface of the base 1 is fixedly installed with a control panel 20, the processor is electrically connected with the electric push rod 2, the telescopic device 9, the heating sheet and the control panel respectively, so that the inside of the device is conveniently inputted with working commands through the control panel to control the whole device to work.

[0031] Working principle: the electronic component 19 is placed on the gasket 4, the moving push plate 6 is driven to move by starting the telescopic device 9, the moving push plate 6 drives the buffer plate 8 to move by the springs 7 and cooperates with the fixing plate 5, so that the electronic component 19 is conveniently fixed on the detection table, which is convenient for subsequent testing, the detection table 3 is driven to ascend and descend by starting the electric push rod 2, so as to conveniently drive the electronic component 19 to move up and down and drive the contact of the electronic component 19 to align with the height of the electrode sheet 16.

[0032] The electrode sheet 16 is conveniently aligned with the contact of the electronic component 19 by pushing the sliding block 11 to slide on the slide rod holder 10, then the threaded rod 14 is driven to rotate by rotating the knob, the threaded rod 14 drives the positioning plate 15 to move by itself, the positioning plate 15 drives the electrode sheet 16 to move and contact with the electronic component 19, the electrode sheet 16 is powered by connecting the power supply contact of the detection device with the joint column 18, so as to test the electronic component 19.

[0033] The device is convenient for the contact of the electrode sheet 16 and the contacts of various models of electronic components 19 through the movement of the electrode sheet 16 and the up-down movement of the detection table 3, is convenient for the device to test various different models of electronic components 19, and improves the adaptability of the device.

Claims

1. An electronic component burn-in test fixture comprising a base (1), characterised in that: The upper surface of the base (1) is fixedly installed with an electric push rod (2) on the left and right sides, the output end of the electric push rod (2) is fixedly connected with a detection table (3), the upper surface of the detection table (3) is fixedly installed with a gasket (4), the upper surface of the detection table (3) is fixedly installed with a fixed plate (5), the upper surface of the detection table (3) is provided with a fixed assembly for fixing an electronic element (19), and the left and right sides of the detection table (3) are provided with detection assemblies for conducting power-on detection on the electronic element (19). The detection assembly comprises a slide rod frame (10) installed on the side of the base (1), two slide blocks (11) are slidably installed on the slide rod frame (10), the upper surfaces of the slide blocks (11) are fixedly installed with support plates (13), the top ends of the support plates (13) are screw-connected with threaded rods (14), one end of each threaded rod (14) towards the center of the detection table (3) is rotatably installed with a positioning plate (15), the surface of the positioning plate (15) is fixedly installed with an electrode sheet (16), the top end of the support plate (13) is slidably provided with a conductive rod (17), one end of the conductive rod (17) is fixedly connected with the positioning plate (15), and the other end of the conductive rod (17) is fixedly installed with a connector column (18).

2. An electronic component burn-in test fixture according to claim 1, wherein: The fixed assembly comprises a movable push plate (6), a plurality of springs (7) are fixedly installed on the surface of the movable push plate (6) towards one side of the fixed plate (5), one end of each spring (7) is fixedly connected with a buffer plate (8), the buffer plate (8) is arranged above the gasket (4), the bottom surface of the detection table (3) is fixedly installed with a telescopic device (9), and the output end of the telescopic device (9) is fixedly connected with the movable push plate (6).

3. The electronic component burn-in test fixture of claim 1, wherein: The surface of the slide block (11) towards the base (1) is fixedly installed with a magnet (12), and the magnet (12) is attached to the surface of the base (1).

4. The electronic component burn-in test fixture of claim 1, wherein: One end of the threaded rod (14) away from the detection table (3) is fixedly installed with a knob.

5. The electronic component burn-in test fixture of claim 1, wherein: The connector column (18), the conductive rod (17) and the positioning plate (15) are all made of copper material, and the support plate (13) and the threaded rod (14) are all made of insulator.

6. The electronic component burn-in test fixture of claim 1, wherein: A processor is installed in the base (1), and a control panel (20) is fixedly installed on the front surface of the base (1).

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