Resistance value detector of thick film chip resistor

Abstract

The utility model discloses a resistance value detector for a thick film chip resistor, and relates to the technical field of detection equipment. The device comprises a moving mechanism, the moving mechanism comprises a moving assembly and an auxiliary assembly, the moving assembly comprises two adjusting boxes connected to the front side of a first supporting plate in a sliding mode, and two motors are fixedly connected to the sides, away from each other, of the two adjusting boxes. According to the utility model, the flying probe can be accurately moved to a corresponding position through the moving mechanism according to the coordinates of the chip pins, so that high-precision detection is realized, for some detected objects with irregular layout, independent movement of the flying probe can better adapt to the layout and accurately contact with each detection point, and the detection accuracy is improved. The situation that the flying probes cannot accurately reach detection points at certain special positions due to overall movement is avoided, the precision of detecting objects with complex layout is further improved, meanwhile, the two flying probes can start detection from different areas respectively, the detection time is saved, and the efficiency is improved.

Description

Technical Field

[0001] This utility model belongs to the field of testing equipment technology, and in particular relates to a resistance value tester for thick film wafer resistors. Background Technology

[0002] Thick film wafer resistor value tester is designed for precise testing. It features high-precision sensing technology, enabling it to quickly and accurately measure resistance values. It is easy to operate and can be widely used in fields such as electronic manufacturing and circuit testing. It effectively ensures resistor quality and circuit performance, providing reliable resistance value testing support for the stable operation and R&D production of electronic products.

[0003] Some existing testing instruments typically have two flying probes for detection. However, some existing testing instruments are not convenient for moving the two flying probes individually, which may prevent the flying probes from accurately moving to the corresponding detection position according to the position of the chip pins, thereby reducing the detection efficiency and detection effect. Utility Model Content

[0004] The purpose of this invention is to provide a resistance value tester for thick film wafer resistors. By incorporating a moving mechanism, it solves the problem that some existing testers are not convenient for moving two individual flying probes.

[0005] To solve the above-mentioned technical problems, this utility model is achieved through the following technical solution:

[0006] This utility model relates to a resistance value tester for thick-film wafer resistors, comprising a test stage and a support plate. The test stage is equipped with a moving mechanism and a fixing mechanism.

[0007] The moving mechanism includes a moving component and an auxiliary component. The moving component includes two adjusting boxes slidably connected to the front side of a support plate. Two motors are fixedly connected to the sides of the two adjusting boxes that are far apart from each other. The output shafts of the two motors are fixedly connected to threaded rods via shaft couplings. Z-shaped plates are threadedly connected to the two threaded rods. Fixed seats are fixedly connected to the bottom of the two Z-shaped plates. Flying needles are fixedly connected to the outer sides of the two fixed seats.

[0008] Furthermore, two hydraulic cylinders are fixedly connected to the front side of the support plate, and the output shafts of the two hydraulic cylinders are fixedly connected to the corresponding adjustment boxes. Several sliding grooves are opened on the front side of the support plate, and two sliders are fixedly connected to the rear side of the two adjustment boxes. Several sliders are slidably connected to the corresponding sliding grooves.

[0009] Furthermore, the auxiliary component includes two support plates two fixedly connected to the top of the testing platform, an electric slide rail one fixedly connected to the top of the two support plates two, an electric slider slidably connected to the electric slide rail one, and a support plate three fixedly connected to the top of the electric slider.

[0010] Furthermore, a second sliding groove is provided on the support plate three, a connecting block is fixedly connected to the rear side of the support plate one, the rear side of the connecting block extends to the rear side of the support plate three and is slidably connected to the sliding groove two, a second hydraulic cylinder is fixedly connected to the rear side of the support plate three, and the output shaft of the second hydraulic cylinder is fixedly connected to the connecting block.

[0011] Furthermore, the fixing mechanism includes an electric slide rail two fixedly connected to the top of the testing platform, a placement box slidably connected to the electric slide rail two, two slide rods fixedly connected to the inner wall of the placement box, and a support plate four fixedly connected to the two slide rods.

[0012] Furthermore, a fixing rod is fixedly connected to the top of the support plate four, and a Z-shaped plate two is rotatably connected to the top of the fixing rod. Sliding slider two is slidably connected to the two sliding rods, and sliding slider three is slidably connected to the two sliding rods.

[0013] Furthermore, both slider two and slider three are hinged to the Z-shaped plate two with connecting plates. The top of the placement box has two limiting grooves. The tops of both slider two and slider three are fixedly connected with connecting rods. The tops of the two connecting rods extend to the top of the placement box and slide to the corresponding limiting grooves.

[0014] Furthermore, a positioning ring is rotatably connected to the top of each of the two connecting rods, a hydraulic cylinder is fixedly connected to the inner bottom wall of the placement box, the output shaft of the hydraulic cylinder is fixedly connected to the second slider, a fixing frame is fixedly connected to the front side of the third support plate, and a CCD camera is fixedly connected to the front side of the fixing frame.

[0015] This utility model has the following beneficial effects:

[0016] 1. By setting up a moving mechanism and starting the motor, the motor drives the threaded rod to rotate. When the threaded rod rotates, it drives the internal threaded block to slide on the inner wall of the adjusting box. When the internal threaded block moves, it drives the Z-shaped plate to move. When the Z-shaped plate moves, it drives the flying needle to move through the fixed seat. The hydraulic cylinder is started, and the hydraulic cylinder drives the adjusting box to move. When the adjusting box moves, it drives the slider to slide in the slide groove. At the same time, when the adjusting box moves, it drives the Z-shaped plate to move through the internal threaded block. When the Z-shaped plate moves, it drives the flying needle to move through the fixed seat. Through the moving mechanism, the flying needle can be accurately moved to the corresponding position according to the coordinates of the chip pins, thereby achieving high-precision detection. For some objects with irregular layouts, the independent movement of the flying needle can better adapt to the layout and accurately contact each detection point, avoiding the inability to accurately reach certain special detection points due to the overall movement. This improves the accuracy of detecting objects with complex layouts. At the same time, the two flying needles can start detection from different areas, thereby saving detection time and improving efficiency.

[0017] 2. By setting up a fixing mechanism, the hydraulic cylinder is activated. The hydraulic cylinder drives slider two to slide on the slide rod. When slider two slides, it drives the connecting plate connected to slider two to move. When the connecting plate connected to slider two moves, it drives Z-shaped plate two to rotate. When Z-shaped plate two rotates, it drives slider three to move synchronously through the connecting plate connected to slider three. When slider three and slider two move, they drive the connecting rod to move. When the connecting rod moves, it drives the positioning ring to move. The fixing mechanism prevents the thick film wafer resistor from shifting during the detection process, ensuring that the resistor is accurately located within the test area of ​​the detection equipment. This ensures that the probe can accurately contact the pin every time, thereby stabilizing the transmission of the detection signal and improving the accuracy of the resistance value measurement. At the same time, it can isolate and protect the resistor, reducing the possibility of collision with external objects and reducing physical damage to the resistor caused by accidental collisions.

[0018] Of course, any product implementing this utility model does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0021] Figure 2 This is a schematic diagram of the rear view structure of this utility model;

[0022] Figure 3This is a schematic diagram of the structure of the support plate of this utility model;

[0023] Figure 4 This is a schematic diagram of the structure of the regulating box of this utility model;

[0024] Figure 5 This is a schematic diagram of the structure of the placement box of this utility model;

[0025] Figure 6 This is a schematic diagram of the slide bar of this utility model;

[0026] Figure 7 This utility model Figure 2 A magnified structural diagram of A in the middle.

[0027] The attached diagram lists the components represented by each number as follows:

[0028] 1. Testing table; 2. Moving mechanism; 3. Fixing mechanism; 21. Support plate one; 22. Adjustment box; 23. Motor; 24. Threaded rod; 25. Internal threaded block; 26. Z-shaped plate one; 27. Fixed seat; 28. Flying needle; 29. ​​Hydraulic cylinder one; 210. Slide groove; 211. Slider one; 212. Support plate two; 213. Electric slide rail one; 214. Electric slider; 215. Support plate three; 216. Slide groove two; 217. Connecting block; 218. Hydraulic cylinder two; 31. Electric slide rail two; 32. Placement box; 33. Slide rod; 34. Support plate four; 35. Fixing rod; 36. Z-shaped plate two; 37. Slider two; 38. Slider three; 39. Connecting plate; 310. Limiting groove; 311. Connecting rod; 312. Positioning ring; 313. Hydraulic cylinder; 314. Fixing frame; 315. CCD camera. Detailed Implementation

[0029] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0030] Please see Figure 1-5As shown, this utility model is a resistance value tester for thick film wafer resistors, including a test stage 1 and a support plate 21. The test stage 1 is equipped with a moving mechanism 2 and a fixing mechanism 3. The moving mechanism 2 includes a moving component and an auxiliary component. The moving component includes two adjusting boxes 22 slidably connected to the front side of the support plate 21. Two motors 23 are fixedly connected to the sides of the two adjusting boxes 22 that are far apart from each other. The output shafts of the two motors 23 are fixedly connected to threaded rods 24 via shaft couplings. Z-shaped plates 26 are threadedly connected to the two threaded rods 24. The bottom of each of the two plates 26 is fixedly connected to a fixed base 27, and each of the two fixed bases 27 is fixedly connected to a flying needle 28. Two hydraulic cylinders 29 are fixedly connected to the front of the support plate 21, and the output shafts of the two hydraulic cylinders 29 are fixedly connected to the corresponding adjustment boxes 22. Several sliding grooves 210 are provided on the front of the support plate 21, and two sliders 211 are fixedly connected to the rear of each of the two adjustment boxes 22. The sliders 211 are slidably connected to the corresponding sliding grooves 210. The auxiliary components include two support plates fixedly connected to the top of the testing table 1. 212, two support plates 212 are fixedly connected to the top of an electric slide rail 213, an electric slider 214 is slidably connected to the electric slide rail 213, a support plate 3 215 is fixedly connected to the top of the electric slider 214, a slide groove 216 is provided on the support plate 3 215, a connecting block 217 is fixedly connected to the rear side of the support plate 21, the rear side of the connecting block 217 extends to the rear side of the support plate 3 215 and is slidably connected to the slide groove 216, a hydraulic cylinder 218 is fixedly connected to the rear side of the support plate 3 215, and the output shaft of the hydraulic cylinder 218 is... Fixedly connected to the connecting block 217, the flying probe 28 can be precisely moved to the corresponding position according to the coordinates of the chip pins by the moving mechanism 2, thereby achieving high-precision detection. For some objects with irregular layouts, the independent movement of the flying probe 28 can better adapt to the layout and accurately contact each detection point, avoiding the inability to accurately reach certain special detection points due to overall movement, thus improving the accuracy of detection of objects with complex layouts. At the same time, the two flying probes can start detection from different areas, thereby saving detection time and improving efficiency.

[0031] The fixing mechanism 3 includes an electric slide rail 31 fixedly connected to the top of the testing table 1. A placement box 32 is slidably connected to the electric slide rail 31. Two slide rods 33 are fixedly connected to the inner wall of the placement box 32. A support plate 34 is fixedly connected to the two slide rods 33. A fixing rod 35 is fixedly connected to the top of the support plate 34. A Z-shaped plate 36 is rotatably connected to the top of the fixing rod 35. A slider 37 and a slider 38 are slidably connected to the two slide rods 33. Both sliders 37 and 38 are hinged to the Z-shaped plate 36 by a connecting plate 39. Two limiting grooves 310 are provided on the top of the placement box 32. A connecting rod 311 is fixedly connected to the top of both sliders 37 and 38. The tops of both connecting rods 311 extend to the top of the placement box 32 and are connected to the Z-shaped plate 36. The corresponding limiting groove 310 is slidably connected, and the top of each of the two connecting rods 311 is rotatably connected to a positioning ring 312. The inner bottom wall of the placement box 32 is fixedly connected to a hydraulic cylinder 313, and the output shaft of the hydraulic cylinder 313 is fixedly connected to the second slider 37. The front side of the support plate 3 215 is fixedly connected to a fixing frame 314, and the front side of the fixing frame 314 is fixedly connected to a CCD camera 315. The fixing mechanism 3 prevents the thick film wafer resistor from shifting during the detection process, ensuring that the resistor is accurately located within the test area of ​​the detection equipment, ensuring that the probe can accurately contact the pin each time, thereby stabilizing the transmission of the detection signal, improving the accuracy of the resistance value measurement, and isolating and protecting the resistor, reducing the possibility of collision with external objects, and reducing physical damage to the resistor caused by accidental collision.

[0032] A specific application of this embodiment is: CCD camera 315: CCD camera stands for charge-coupled device camera. When light shines on the CCD sensor through the camera lens, photons excite the charge in the photosensitive element. The charge accumulates in the photosensitive element. The charge in the CCD sensor is transferred to the edge of the pixel array through a series of capacitors and transmission devices, and output through the output circuit. The output circuit converts the charge into a voltage signal. The voltage signal is then converted into a digital signal by an analog-to-digital converter. After processing by a digital processor, such as color correction and white balance processing, a digital image is finally formed.

[0033] The motor 23 is started, driving the threaded rod 24 to rotate. As the threaded rod 24 rotates, it causes the internal threaded block 25 to slide on the inner wall of the adjusting box 22. The adjusting box 22 limits the internal threaded block 25, converting its rotational motion into linear motion. The movement of the internal threaded block 25 causes the Z-shaped plate 26 to move. The Z-shaped plate 26, in turn, moves the flying needle 28 via the fixed seat 27, thereby adjusting the X-axis position of the flying needle 28. The hydraulic cylinder 29 is then started, causing the adjusting box 22 to move. As the adjusting box 22 moves, it causes the slider 211 to slide within the slide groove 210. The slide groove 210 and the slider 211 guide and limit the movement path of the adjusting box 22. Simultaneously, the movement of the adjusting box 22 drives the motor 23 and the threaded rod 24, which in turn moves the Z-shaped plate 26. When the Z-shaped plate 26 moves, it drives the flying needle 28 to move via the fixed base 27, thereby adjusting the X-axis position of the flying needle 28. This allows for simultaneous adjustment of the X-axis and Y-axis positions of the two flying needles 28, enabling customization of their positions for better resistance detection. The electric slide rail 213 and electric slider 214 drive the support plate 215 to move. When the support plate 215 moves, it drives the support plate 21 to move. The hydraulic cylinder 218 is activated, causing the connecting block 217 to slide within the slide groove 216. When the connecting block 217 moves, it drives the support plate 21 to move. This movement, in turn, drives the support plate 21 to move via the hydraulic cylinder 218 and the electric slide rail 213, resulting in the overall movement of the support plate 21 and its components.

[0034] The placement box 32 is moved by the electric slide rail 31, which in turn moves the thick-film wafer resistor below the CCD camera 315. The resistance value of the thick-film wafer resistor is detected by the flying probe 28. The CCD camera 315 takes a picture of the detection position of the flying probe 28 and transmits the image signal to the image processing unit for analysis. The image processing unit feeds back the processed position information to the control system. The control system detects whether there are defective products based on the feedback information and can determine whether the defect is caused by probe misalignment. The hydraulic cylinder 313 is then activated. Sliding slider 2 37 slides on slider 33. When sliding slider 2 37 slides, it drives the connecting plate 39 connected to slider 2 37 to move. When the connecting plate 39 connected to slider 2 37 moves, it drives the Z-shaped plate 2 36 to rotate. When the Z-shaped plate 2 36 rotates, it drives slider 38 to move synchronously through the connecting plate 39 connected to slider 38. When slider 38 and slider 2 37 move, they drive the connecting rod 311 to move. When the connecting rod 311 moves, it drives the positioning ring 312 to move. In turn, the positioning ring 312 clamps and fixes the thick film wafer resistor, preventing the thick film wafer resistor from moving during the resistance value detection process, thus affecting the accuracy of the detection result.

[0035] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0036] The preferred embodiments of this utility model disclosed above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.

Claims

1. A resistance value tester for thick film wafer resistors, comprising a test stage (1) and a support plate (21), wherein the test stage (1) is provided with a moving mechanism (2) and a fixing mechanism (3), characterized in that: The moving mechanism (2) includes a moving component and an auxiliary component. The moving component includes two adjusting boxes (22) that are slidably connected to the front side of the support plate (21). Two motors (23) are fixedly connected to the two adjusting boxes (22) on the side away from each other. The output shafts of the two motors (23) are fixedly connected to threaded rods (24) through a coupling. Z-shaped plates (26) are threadedly connected to the two threaded rods (24). Fixed seats (27) are fixedly connected to the bottom of the two Z-shaped plates (26). Flying needles (28) are fixedly connected to the outer side of the two fixed seats (27).

2. The resistance value detector for a thick-film wafer resistor according to claim 1, characterized in that, Two hydraulic cylinders (29) are fixedly connected to the front side of the support plate (21). The output shafts of the two hydraulic cylinders (29) are fixedly connected to the corresponding adjustment box (22). Several sliding grooves (210) are opened on the front side of the support plate (21). Two sliders (211) are fixedly connected to the rear side of the two adjustment boxes (22). Several sliders (211) are slidably connected to the corresponding sliding grooves (210).

3. The resistance value detector for a thick-film wafer resistor according to claim 2, characterized in that, The auxiliary components include two support plates (212) fixedly connected to the top of the detection table (1), an electric slide rail (213) fixedly connected to the top of the two support plates (212), an electric slider (214) slidably connected to the electric slide rail (213), and a support plate (215) fixedly connected to the top of the electric slider (214).

4. The resistance value detector for a thick-film wafer resistor according to claim 3, characterized in that, The support plate three (215) is provided with a sliding groove two (216). A connecting block (217) is fixedly connected to the rear side of the support plate one (21). The rear side of the connecting block (217) extends to the rear side of the support plate three (215) and is slidably connected to the sliding groove two (216). A hydraulic cylinder two (218) is fixedly connected to the rear side of the support plate three (215). The output shaft of the hydraulic cylinder two (218) is fixedly connected to the connecting block (217).

5. The resistance value detector for a thick-film wafer resistor according to claim 4, characterized in that, The fixing mechanism (3) includes an electric slide rail two (31) fixedly connected to the top of the testing table (1), a placement box (32) is slidably connected on the electric slide rail two (31), and two slide rods (33) are fixedly connected to the inner wall of the placement box (32), and a support plate four (34) is fixedly connected to the two slide rods (33).

6. The resistance value detector for a thick-film wafer resistor according to claim 5, characterized in that, The top of the support plate four (34) is fixedly connected to a fixing rod (35), the top of the fixing rod (35) is rotatably connected to a Z-shaped plate two (36), the two sliding rods (33) are slidably connected to a slider two (37), and the two sliding rods (33) are slidably connected to a slider three (38).

7. The resistance value detector for a thick-film wafer resistor according to claim 6, characterized in that, Both slider two (37) and slider three (38) are hinged to Z-shaped plate two (36) with connecting plate (39). The top of the placement box (32) has two limiting grooves (310). The top of both slider two (37) and slider three (38) are fixedly connected with connecting rods (311). The top ends of the two connecting rods (311) extend to the top of the placement box (32) and slide to connect with the corresponding limiting grooves (310).

8. The resistance value detector for a thick-film wafer resistor according to claim 7, characterized in that, The top of each of the two connecting rods (311) is rotatably connected to a positioning ring (312). The inner bottom wall of the placement box (32) is fixedly connected to a hydraulic cylinder (313). The output shaft of the hydraulic cylinder (313) is fixedly connected to the second slider (37). The front side of the support plate (215) is fixedly connected to a fixing frame (314). The front side of the fixing frame (314) is fixedly connected to a CCD camera (315).

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