Autocorrelator

Abstract

The utility model discloses an autocorrelator, which belongs to the field of laser measurement and comprises a base, a plurality of reflectors, a plurality of wave plates, a first right-angle reflector assembly, a second right-angle reflector assembly, a wafer, a lens and a power meter. Wherein the wafer is installed on the base through the first adjusting support, and the first right-angle reflector assembly and the second right-angle reflector assembly are installed on the base through the two second adjusting supports respectively; the first adjusting support comprises a support body, a wafer base and a locking piece, the wafer base is rotationally arranged on the support body, and the locking piece is used for limiting rotation of the wafer base. The optical path structure is ingenious in design, and can detect and obtain clean self-correlation signals; the positions of the wafer and the two right-angle reflectors can be adjusted through the first adjusting support and the second adjusting support respectively, noise caused by interference signals can be reduced through fine adjustment, the measurement accuracy of the autocorrelator is improved, the light path adjusting difficulty of the autocorrelator is reduced, and time spent on light path adjusting is saved.

Description

TECHNICAL FIELD

[0001] The utility model relates to laser measurement field especially relates to a self correlation appearance. BACKGROUND

[0002] The traditional method for measuring laser pulse width is to utilize the photoelectric double photon detector to directly display the pulse waveform, however, the fastest response time of the existing photoelectric response device is picosecond order, which cannot be used for measuring femtosecond order ultrashort laser pulse information, so it is necessary to scan the femtosecond laser pulse itself, utilize the nonlinear effect of light and matter interaction to convert the time measurement into space measurement, thereby obtaining the self correlation signal of the femtosecond laser pulse.

[0003] The basic process of measuring femtosecond laser pulse width is that the measured femtosecond laser is divided into two beams by a beam splitter, one of the beams passes through a delay device, and the other beam does not pass through the delay device, then the two beams passing through different paths are superimposed, the second order nonlinear effect of the frequency doubling crystal is utilized or the photoelectric conversion medium with double photon absorption effect is adopted to convert the optical signal into an electrical signal for measurement, the optical path difference of the two paths is adjusted to obtain the second order correlation signal, thereby the width of the ultrashort pulse is calculated out.

[0004] The beam splitter of the self correlation appearance in the prior art is composed of two pieces of beam splitter plates with parallel surfaces, and no calibration light path is provided, which leads to complex light path structure, great difficulty in light path adjustment, and complete superposition of the interference field signal formed after multiple reflections of the two surfaces of the beam splitter and the interference signal of the outcoming light path after superposition, thereby bringing additional noise. UTILITY MODEL CONTENTS

[0005] The utility model provides a kind of self correlation appearance, can solve the problem of complex light path structure of existing self correlation appearance and inconvenient to adjust light path.

[0006] A kind of self correlation appearance, including pedestal, further include multiple reflectors and wave sheet, right angle mirror component one, right angle mirror component two, wafer, lens, power meter;

[0007] Wherein, wafer is installed on pedestal by adjusting support one, right angle mirror component one and right angle mirror component two are installed on pedestal by two adjusting support two respectively;

[0008] Adjusting support one includes frame body, wafer seat and locking piece, wafer seat is rotationally arranged on frame body, and locking piece is used to limit the rotation of wafer seat;

[0009] The adjusting support two comprises a position adjusting assembly and an angle adjusting assembly, and the right-angle mirror assembly one or the right-angle mirror assembly two is installed on the angle adjusting assembly.

[0010] Preferably, the plurality of mirrors are mirror one, mirror two, mirror five, mirror four and mirror three arranged in sequence along the laser measuring direction.

[0011] Part of the laser reflected by the mirror two is transmitted to the right-angle mirror assembly one through the mirror five, the laser reflected by the right-angle mirror assembly one is reflected to the mirror four through the mirror five, another part of the laser reflected by the mirror two is reflected to the right-angle mirror assembly two through the mirror five, and the laser reflected by the right-angle mirror assembly two is transmitted to the mirror four through the mirror five.

[0012] Preferably, the mirror five is a non-polarization beam splitter.

[0013] Preferably, the adjusting support two further comprises a calibration mirror, which is located between the mirror two and the mirror five.

[0014] Preferably, the wafer seat is a cylindrical structure, the wafer is fixedly installed on the wafer seat, the mounting hole is provided on the frame body and matched with the wafer seat, the mounting hole is communicated with the outside through the through groove, the locking piece has a threaded part, the threaded groove matched with the locking piece is provided on the frame body, and the threaded groove penetrates the through groove.

[0015] Preferably, the position adjusting assembly is an electric sliding table.

[0016] Preferably, the position adjusting assembly is a manual sliding table.

[0017] Preferably, the angle adjusting assembly comprises an angle adjusting seat and adjusting pieces threadedly connected to the angle adjusting seat, the mounting seat is hinged on the angle adjusting seat, the mounting seat is connected with the right-angle mirror assembly one or the right-angle mirror assembly two, and the two adjusting pieces abut on the mounting seat respectively.

[0018] Preferably, the adjusting piece is a spring plunger.

[0019] Compared with the prior art, the optical path structure of the utility model has the advantages that the optical path structure is designed ingeniously, clean autocorrelation signals can be detected and obtained, the position adjustment of the wafer and the two right-angle mirrors can be realized through the adjusting support one and the adjusting support two respectively, the noise caused by the interference signals can be reduced through fine adjustment, the measurement accuracy of the autocorrelation instrument is improved, the optical path adjustment difficulty of the autocorrelation instrument is reduced, and the time spent on the optical path adjustment is saved. BRIEF DESCRIPTION OF DRAWINGS

[0020] Figure 1 It is a structural schematic view of the utility model;

[0021] Figure 2 This is a schematic diagram of the structure of a right-angle reflector assembly 1;

[0022] Figure 3 This is a schematic diagram of the structure of the second right-angle reflector assembly;

[0023] Figure 4 This is a schematic diagram of the structure of the adjustment bracket one;

[0024] Figure 5 This is a schematic diagram of laser measurement.

[0025] Explanation of reference numerals in the attached figures:

[0026] 1-Base, 2-Reflector I, 3-Waveplate, 4-Reflector II, 5-Calibration Mirror, 6-Reflector V, 7-Right-Angle Reflector Assembly I, 8-Right-Angle Reflector Assembly II, 9-Reflector IV, 10-Reflector III, 11-Crystal, 12-Lens, 13-Power Meter, 21-Frame, 22-Crystal Holder, 23-Locking Component, 24-Through Slot, 31-Electric Slide, 32-Manual Slide, 33-Angle Adjustment Seat, 34-Mounting Seat, 35-Adjustment Component. Detailed Implementation

[0027] The following describes a specific embodiment of the present invention in detail with reference to the accompanying drawings. However, it should be understood that the scope of protection of the present invention is not limited to the specific embodiment.

[0028] Example 1

[0029] like Figures 1 to 5 As shown, an autocorrelator provided in this embodiment of the present invention includes a base 1 and multiple mirrors mounted on the base 1, as well as a waveplate 3, a right-angle mirror assembly 7, a right-angle mirror assembly 8, a crystal 11, a lens 12, and a power meter 13.

[0030] To achieve the optical path calibration function, the chip 11 is mounted on the base 1 via an adjustment bracket 1, and the right-angle mirror assembly 7 and the right-angle mirror assembly 8 are mounted on the base 1 via two adjustment brackets 2 respectively.

[0031] Specifically, the adjustment bracket of this embodiment includes a frame 21, a wafer holder 22, and a locking member 23. The wafer 11 is fixedly installed on the wafer holder 22. The locking member 23 is used to restrict the rotation of the wafer holder 22. The wafer holder 22 has a cylindrical structure. The frame 21 has a mounting hole that mates with the wafer holder 22. The wafer holder 22 is rotatably installed in the mounting hole on the frame 21. In addition, the mounting hole communicates with the outside through a through groove 24. The locking member 23 has a threaded part. The frame 21 has a threaded groove that mates with the locking member 23. The threaded groove passes through the through groove 24. By tightening the locking member 23, the space of the through groove 24 can be compressed, thereby squeezing the wafer holder 22 to achieve the purpose of fixing the wafer holder 22 and the wafer 11. When adjustment is required, the locking member 23 can be loosened.

[0032] In addition, the second adjustment bracket in this embodiment includes a position adjustment component and an angle adjustment component, and the right-angle reflector component 7 or the right-angle reflector component 8 is mounted on the angle adjustment component;

[0033] An angle adjustment component is mounted on a position adjustment component. In this embodiment, the position adjustment component uses a manual slide table 32 or an electric slide table 31. This is an existing structure and will not be described in detail here. The position adjustment of the right-angle reflector in the sliding direction is achieved by electric or manual means.

[0034] The angle adjustment component can be implemented using an existing hinged structure.

[0035] The positions of the wafer 11 and the two right-angle mirrors can be adjusted by adjusting bracket one and bracket two respectively. Fine-tuning can reduce the noise caused by interference signals and improve the measurement accuracy of the autocorrelator.

[0036] In addition, the multiple reflectors in this embodiment are reflector 1 2, reflector 2 4, reflector 5 6, reflector 4 9 and reflector 3 10 arranged sequentially along the laser measurement direction. It also includes a calibration mirror 5, which is located between reflector 2 4 and reflector 5 6, wherein reflector 5 6 is a non-polarizing beam splitter.

[0037] like Figure 5As shown, the laser beam to be tested first enters the reflector 2, which reflects it to the waveplate 3. After being reflected by the waveplate 3, it reaches the reflector 4. The laser beam reflected from the reflector 4 passes through the calibration mirror 5, and a portion of it is transmitted through the reflector 6 to the right-angle reflector assembly 1. The laser beam reflected from the right-angle reflector assembly 1 is reflected by the reflector 6 to the reflector 9. The other portion of the laser beam reflected from the reflector 4 is reflected by the reflector 6 to the right-angle reflector assembly 2 8. The laser beam reflected from the right-angle reflector assembly 2 is transmitted through the reflector 6 to the reflector 9. The two laser beams are reflected by the reflector 9 to the reflector 10. The reflector 10 reflects the two laser beams to the crystal 11, and after passing through the crystal 11 and the lens 12, they finally enter the power meter 13 for measurement.

[0038] Example 2

[0039] like Figures 1 to 5 As shown, based on Embodiment 1, the autocorrelator provided in this embodiment differs from Embodiment 1 in that the angle adjustment component of this embodiment includes an angle adjustment seat 33 and two adjustment members 35 threadedly connected to the angle adjustment seat 33. A mounting seat 34 is hinged on the angle adjustment seat 33, and the mounting seat 34 is connected to the right-angle reflector assembly 7 or the right-angle reflector assembly 8. The two adjustment members 35 are located on both sides of the connecting shaft of the mounting seat 34. By turning the adjustment members 35, the adjustment members 35 can be made to abut against the mounting seat 34. By rotating the two adjustment members 35 clockwise and counterclockwise, the angle of the mounting seat 34 can be adjusted. In addition, to reduce hard friction, the adjustment members 35 in this embodiment are spring plungers.

[0040] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit and essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0041] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. An autocorrelation meter, comprising a base, characterized in that, It also includes multiple mirrors, waveplates, right-angle mirror assembly one, right-angle mirror assembly two, crystal, lens, and power meter; The wafer is mounted on the base via an adjustment bracket 1, and the right-angle mirror assembly 1 and the right-angle mirror assembly 2 are mounted on the base via two adjustment brackets 2 respectively; The adjustment bracket includes a frame, a wafer holder, and a locking component. The wafer holder is rotatably mounted on the frame, and the locking component is used to limit the rotation of the wafer holder. The second adjustment bracket includes a position adjustment component and an angle adjustment component, with either the first or second right-angle reflector component mounted on the angle adjustment component.

2. The autocorrelation instrument as described in claim 1, characterized in that, The multiple reflectors are, in sequence, reflector one, reflector two, reflector five, reflector four, and reflector three, arranged along the laser measurement direction; In this process, a portion of the laser reflected by mirror 2 is transmitted through mirror 5 to right-angle mirror assembly 1, and the laser reflected by right-angle mirror assembly 1 is reflected by mirror 5 to mirror 4. Another portion of the laser reflected by mirror 2 is reflected by mirror 5 to right-angle mirror assembly 2, and the laser reflected by right-angle mirror assembly 2 is transmitted through mirror 5 to mirror 4.

3. An autocorrelation instrument as described in claim 2, characterized in that, The fifth reflector is a non-polarizing beam splitter.

4. An autocorrelation instrument as described in claim 1, characterized in that, It also includes a calibration mirror, which is located between mirror two and mirror five.

5. An autocorrelation instrument as described in claim 1, characterized in that, The wafer holder is a cylindrical structure, and the wafer is fixedly mounted on the wafer holder. The frame has mounting holes that mate with the wafer holder. The mounting holes are connected to the outside through a through groove. The locking member has a threaded part, and the frame has a threaded groove that mates with the locking member. The threaded groove passes through the through groove.

6. An autocorrelation instrument as described in claim 1, characterized in that, The position adjustment component is an electric slide table.

7. An autocorrelation instrument as described in claim 1, characterized in that, The position adjustment component is a manual slide.

8. An autocorrelation instrument as described in claim 1, characterized in that, The angle adjustment assembly includes an angle adjustment seat and an adjustment component threadedly connected to the angle adjustment seat. A mounting base is hinged to the angle adjustment seat, and the mounting base is connected to either right-angle reflector assembly one or right-angle reflector assembly two. The two adjustment components respectively abut against the mounting base.

9. An autocorrelation instrument as described in claim 1, characterized in that, The adjusting element is a spring plunger.

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