Integrated circuit packaging detection board
The design of the integrated circuit packaging test board enables efficient CCD testing and power-on testing of integrated circuit packaging, solving the problems of low testing efficiency and high cost, and supporting the universality of multiple test components.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-24
- Publication Date
- 2026-03-03
AI Technical Summary
Existing technologies for integrated circuit packaging and testing are inefficient and costly, requiring two separate tests: CCD testing and power-on testing. Furthermore, each type of integrated circuit requires a specially designed testing device.
An integrated circuit packaging test board was designed, which includes a circuit board and a test box. The test box is equipped with a card holder, a CCD camera and a supplementary light bead, which can perform CCD testing and power-on testing simultaneously. The height of the card holder can be adjusted by a lifting mechanism to support the adaptability of different test items.
It improves testing efficiency and reduces testing costs, and achieves universality for multiple testing components through reusable testing boxes and replaceable pads.
Smart Images
Figure CN223966496U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of integrated circuit packaging technology, and specifically to an integrated circuit packaging testing board. Background Technology
[0002] Integrated circuits undergo testing after packaging to ensure product quality. Testing includes plastic cover inspection and power-on testing. Currently, the practice is to first pass the entire tray of integrated circuits through CCD inspection (an image acquisition and processing technology based on photoelectric conversion principles), and then perform power-on testing on each individual circuit. Power-on testing requires a specially designed testing device for the size and circuitry of each integrated circuit. Because this testing is performed in two stages, the efficiency is low, and the need for customized testing equipment for each type of integrated circuit leads to high testing costs, which is detrimental to product competitiveness. Utility Model Content
[0003] To address the shortcomings of the prior art, this invention proposes an integrated circuit packaging testing board capable of simultaneously performing CCD testing and power-on testing on the packaged integrated circuit.
[0004] This utility model proposes an integrated circuit packaging test board, including a circuit board and a test box soldered on the circuit board. The test box includes a bottom box and a flip cover. The cavity of the bottom box is provided with a card holder for placing test pieces. The flip cover is provided with a CCD camera with a lens facing the card holder. The CCD camera is electrically connected to the circuit board.
[0005] The card holder is equipped with replaceable pads, which have several contacts that mate with the pins of the detection element and are electrically connected to the circuit board.
[0006] Preferably, the card holder has a ring of fill light grooves around its perimeter, and the flip cover has several LED beads for fill light during shooting. When the flip cover is closed, the LED beads are located in the fill light grooves.
[0007] Preferably, the bottom box is equipped with a limit switch for controlling the lamp beads to turn on, and the limit switch is opened by squeezing when the flip cover is closed.
[0008] Preferably, the base box is equipped with a lifting mechanism for adjusting the height of the card holder.
[0009] Preferably, the lifting mechanism includes a sleeve gear and a handwheel. The inner cavity of the base box is divided into a detection cavity and a bottom cavity by a partition. The card seat is located in the detection cavity. The sleeve gear is rotatably located in the bottom cavity directly below the card seat. A screw is provided at the bottom of the card seat. The screw passes downward through the partition and is inserted into the sleeve hole in the middle of the sleeve gear. The inner wall of the sleeve hole is provided with an internal thread that mates with the screw.
[0010] The handwheel is rotatably mounted in the bottom cavity, which has an opening on one side. The handwheel extends out of the opening on one side, and the teeth on the other side mesh with the sleeve gear.
[0011] Preferably, the bottom of the flip cover has a light-shielding strip near the edge, and the top wall of the bottom box has a groove for accommodating the light-shielding strip.
[0012] Preferably, the top of the card holder is centrally located with a detection position for placing the test piece, and four petal-shaped guide blocks are arranged around the detection position. Each petal-shaped guide block has a guide slope that slopes towards the center, and grooves are provided between the petal-shaped guide blocks.
[0013] Preferably, the screw has a through hole, and the connecting wire of the pad passes through the through hole and is soldered onto the circuit board.
[0014] The beneficial effects of this utility model include: after the flip cover is closed, the integrated circuit packaging test board takes pictures of the test piece through a CCD camera set in the flip cover, and at the same time, it connects to the pins of the test piece through the contacts of the card holder for power-on testing, which improves the testing efficiency; the test box is equipped with LED beads for supplementary lighting, which are opened by closing the flip cover to avoid the light from irritating the test personnel when the flip cover is opened; the bottom box is equipped with a lifting mechanism for adjusting the height of the card holder, which can meet the height requirements of different test pieces by adjusting the height of the card holder; the card holder is equipped with replaceable pads, each pad is set with contacts for a specific model of test piece, and the test box can be reused when the model of the test piece is changed, which reduces the manufacturing cost. Attached Figure Description
[0015] The present invention will now be described in detail with reference to the embodiments and accompanying drawings, wherein:
[0016] Figure 1 This is a perspective view of the flip-top open state of the integrated circuit packaging and testing board of this utility model.
[0017] Figure 2 This is a three-dimensional view of the flip-top snap-fit state of the integrated circuit packaging and testing board of this utility model.
[0018] Figure 3 This is an exploded view of the integrated circuit packaging and testing board of this utility model.
[0019] Figure 4 This is a cross-sectional view of the integrated circuit packaging and testing board of this utility model.
[0020] Figure label:
[0021] 1-Circuit board, 2-Detection box, 3-Base box, 31-Fill light slot, 32-Limit switch, 33-Groove, 34-Detection cavity, 35-Bottom cavity, 4-Flip cover, 41-LED bead, 42-Light-shielding strip, 5-Card holder, 51-Padded block, 52-Contact, 53-Screw, 54-Detection position, 55-Petal-shaped guide block, 56-Guide slope, 57-Groove, 6-CCD camera, 7-Detection component, 81-Sleeve gear, 82-Hand dial. Detailed Implementation
[0022] To make the technical problem to be solved, the technical solution, and the beneficial effects of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this utility model and are not intended to limit this utility model.
[0023] Therefore, a feature pointed out in this specification is used to describe one feature of one embodiment of the present invention, and does not imply that every embodiment of the present invention must have the described feature. Furthermore, it should be noted that this specification describes many features. Although certain features may be combined to illustrate possible system designs, these features may also be used in other combinations not explicitly stated. Therefore, unless otherwise stated, the described combinations are not intended to be limiting.
[0024] The principle of this utility model will be described in detail below with reference to the accompanying drawings and embodiments.
[0025] This invention proposes an integrated circuit packaging testing board, comprising a circuit board 1 and a testing box 2 soldered onto the circuit board 1. The testing box 2 includes a base box 3 and a flip cover 4. The cavity of the base box 3 contains a holder 5 for placing a test piece 7. The flip cover 4 has a CCD camera 6 with its lens facing the holder 5, and the CCD camera 6 is electrically connected to the circuit board 1. The holder 5 has replaceable pads 51, and each pad 51 has several contacts 52 that mate with the pins of the test piece, and the contacts 52 are electrically connected to the circuit board 1. The circuit board 1 has a testing circuit and is encapsulated to prevent leakage and oxidation. After the flip cover 4 is closed, the integrated circuit packaging testing board takes pictures of the test piece 7 through the CCD camera 6 located on the flip cover 4, and simultaneously connects the pins of the test piece through the contacts 52 of the holder 5 for power-on testing, thus improving testing efficiency.
[0026] In this embodiment, a ring of supplementary lighting grooves 31 is provided around the periphery of the card holder 5. The flip cover 4 is equipped with four LED beads 41 for supplementary lighting during photography. When the flip cover 4 is closed, the LED beads 41 are located within the supplementary lighting grooves 31. The supplementary lighting grooves 31 are petal-shaped, and the four LED beads 41 are located at the four corners, ensuring that the inspection piece 7 receives uniform illumination and avoiding shadows during photography. The bottom box 3 is equipped with a limit switch 32 for controlling the opening of the LED beads 41. The limit switch 32 is opened by squeezing when the flip cover 4 is closed. The LED beads 41 are opened by snapping the flip cover 4 shut, which can prevent the light from irritating the eyes of the inspection personnel when the flip cover 4 is open.
[0027] In this embodiment, a light-shielding strip 42 is provided around the bottom edge of the flip cover 4, and a groove 33 is provided on the top wall of the base box 3 to accommodate the light-shielding strip 42. After the flip cover 4 is closed, the light-shielding strip 42 can completely block the light, preventing light leakage from irritating the eyes of the testing personnel.
[0028] In this embodiment, the base box 3 is equipped with a lifting mechanism for adjusting the height of the card holder 5. The lifting mechanism includes a sleeve gear 81 and a handwheel 82. The inner cavity of the base box 3 is divided into a detection cavity 34 and a bottom cavity 35 by a partition. The card holder 5 is located in the detection cavity 34. The sleeve gear 81 is rotatably located in the bottom cavity 35 directly below the card holder 5. A hollow screw 53 is provided at the bottom of the card holder 5. The screw 53 passes downward through the partition and is inserted into the sleeve hole in the middle of the sleeve gear 81. The inner wall of the sleeve hole is provided with an internal thread that mates with the screw 53. The handwheel 82 is rotatably located in the bottom cavity 35. One side of the bottom cavity 35 has an opening, and one side of the handwheel 82 protrudes from the opening. The teeth on the other side mesh with the sleeve gear 81. The diameter of the handwheel 82 is smaller than the diameter of the sleeve gear 81. By moving the handwheel 82, the height of the card holder 5 can be finely adjusted to meet the height requirements of different detection pieces 7. The screw 53 has a through hole, and the connecting wire of the pad 51 passes through the through hole and is soldered to the circuit board 1.
[0029] In this embodiment, a detection position 54 for placing the test piece 7 is centrally located at the top of the card holder 5. Four petal-shaped guide blocks 55 are arranged around the detection position 54. Each petal-shaped guide block 55 has a guide slope 56 that slopes towards the center, and grooves 57 are provided between the petal-shaped guide blocks 55. A pad 51 is attached to the detection position 54. The testing personnel use a pneumatic blow-suction gun to remove the test piece 7 from the chip tray and place it in the detection position 54. The guide slope 56 of the petal-shaped guide blocks 55 helps to position the test piece 7, and the grooves 57 between the petal-shaped guide blocks 55 expose the sides of the test piece 7, facilitating CCD testing.
[0030] Because the pin types and internal circuits of each integrated circuit are different, the integrated circuit package test board can only test one type of test piece 7. That is, each pad 51 is only designed for one type of integrated circuit with contact 52, and the circuit board 1 is only developed for one type of integrated circuit. When the integrated circuit of that type is discontinued, the test box 2 can be removed from the circuit board 1, the circuit board 1 can be redeveloped and reassembled, and the matching pad 51 can be replaced. This allows the test box 2 to be reused, reducing the testing cost.
[0031] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. An integrated circuit packaging and testing board, characterized in that, The device includes a circuit board and a test box soldered onto the circuit board. The test box includes a bottom box and a flip cover. The cavity of the bottom box is provided with a holder for placing test pieces. The flip cover is provided with a CCD camera with a lens facing the holder. The CCD camera is electrically connected to the circuit board. The card holder is provided with a replaceable pad, and the pad is provided with a plurality of contacts that are connected to the pins of the detection component one by one. The contacts are electrically connected to the circuit board.
2. The integrated circuit packaging and testing board as described in claim 1, characterized in that, The card holder has a ring of fill light grooves around its periphery, and the flip cover has several LED beads for fill light during shooting. When the flip cover is closed, the LED beads are located in the fill light grooves.
3. The integrated circuit packaging and testing board as described in claim 2, characterized in that, The bottom box is equipped with a limit switch for controlling the LED beads to turn on, and the limit switch is opened by squeezing when the flip cover is closed.
4. The integrated circuit packaging and testing board as described in claim 3, characterized in that, The base box is equipped with a lifting mechanism for adjusting the height of the card holder.
5. The integrated circuit packaging and testing board as described in claim 4, characterized in that, The lifting mechanism includes a sleeve gear and a handwheel. The inner cavity of the base box is divided into a detection cavity and a bottom cavity by a partition. The card seat is located in the detection cavity. The sleeve gear is rotatably located in the bottom cavity directly below the card seat. A screw is provided at the bottom of the card seat. The screw passes downward through the partition and is inserted into the sleeve hole in the middle of the sleeve gear. The inner wall of the sleeve hole is provided with an internal thread that mates with the screw. The handwheel is rotatably disposed in the bottom cavity, and an opening is provided on one side of the bottom cavity. One side of the handwheel protrudes from the opening, and the teeth on the other side mesh with the sleeve gear.
6. The integrated circuit packaging and testing board as described in claim 5, characterized in that, The bottom of the flip cover has a light-shielding strip near the edge, and the top wall of the bottom box has a groove for accommodating the light-shielding strip.
7. The integrated circuit packaging and testing board as described in claim 6, characterized in that, The card holder has a detection position for placing the test piece at the top center. Around the detection position are four petal-shaped guide blocks. Each petal-shaped guide block has a guide slope that slopes towards the center, and grooves are provided between the petal-shaped guide blocks.
8. The integrated circuit packaging and testing board as described in claim 7, characterized in that, The screw has a through hole, and the connecting wire of the pad passes through the through hole and is soldered onto the circuit board.