Inspection device of quartz crystal resonator

Abstract

The utility model relates to an inspection device of a quartz crystal resonator, which comprises a first turntable and a plurality of suction nozzles uniformly distributed along the circumferential direction of the first turntable, and the first turntable can rotate around the axis of the first turntable and drives the plurality of suction nozzles to rotate synchronously. The suction nozzle rotates to pass through a first positioning station, a first testing station, a second testing station, a third positioning station and a second detecting station which are sequentially arranged in the rotating direction of the first rotating disc. The positioning mechanism I is used for positioning the quartz crystal resonator positioned on the positioning station I; the testing mechanism I is used for testing electrical parameters of the quartz crystal resonator positioned on the testing station I; the testing mechanism II is used for testing the insulating property of the quartz crystal resonator positioned on the testing station II; the positioning mechanism III is used for positioning the quartz crystal resonator positioned on the positioning station III; the second detection mechanism carries out bottom visual detection on the quartz crystal resonator located on the second detection station. Through the arrangement, manual intervention is not needed, and the detection efficiency and accuracy are greatly improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to quartz crystal resonator processing technical field especially relates to a kind of quartz crystal resonator's testing device. BACKGROUND

[0002] Quartz crystal resonator is a kind of using quartz crystal material's inverse piezoelectric effect is made, to produce high-precision oscillation frequency electronic component. Quartz crystal resonator is widely used in electronic equipment, such as oscillator, timer, clock circuit and wireless communication system, to ensure accurate timing and frequency stability.

[0003] In the processing production process of quartz crystal resonator, some defective products will inevitably be produced, these defective products can exist some appearance defects such as crack, bending, and unqualified performance defects such as electrical parameter, insulation performance, leading to the oscillation frequency of quartz crystal resonator deviation, frequency stability reduces, signal transmission is easy to interrupt, and then leading to its frequency fluctuation is easy to exceed the allowed range in working process, cannot provide accurate clock signal for electronic equipment, life reduces and is easy to fail.

[0004] But in prior art, the defect detection of quartz crystal resonator is often artificial screening, and the efficiency is low, the cost is high, and the detection accuracy is poor. UTILITY MODEL CONTENTS

[0005] In order to solve the above-mentioned defects, the utility model provides a kind of quartz crystal resonator's testing device.

[0006] The technical scheme adopted by the utility model is a kind of quartz crystal resonator's testing device, including first rotating disc and the multiple suction nozzles of the equidistribution along the circumference of the first rotating disc, the first rotating disc can rotate around its axis, and multiple suction nozzles are driven synchronous rotation, the suction nozzle rotates through the positioning one work station, test one work station, test two work stations, positioning three work stations and detection two work stations arranged in turn along the rotating direction of the first rotating disc, and the suction nozzle is used to suck / release quartz crystal resonator;The testing device further includes:

[0007] Positioning mechanism one, which positions the quartz crystal resonator located on the positioning one work station;

[0008] Test mechanism one, which tests the electrical parameters of the quartz crystal resonator located on the test one work station;

[0009] Test mechanism two, which tests the insulation performance of the quartz crystal resonator located on the test two work station;

[0010] Positioning mechanism three, which positions the quartz crystal resonator located on the positioning three work station;

[0011] A second detection mechanism is arranged to detect the bottom of the quartz crystal resonator on the second detection station.

[0012] Further, a feeding station and a loading station are arranged between the first positioning station and the second detection station along the rotation direction of the first rotary table. The suction nozzle rotating to the loading station sucks the quartz crystal resonator output from the upstream process, and the suction nozzle rotating to the feeding station releases the qualified quartz crystal resonator to the downstream process.

[0013] Further, a plurality of temporary placement tables are arranged, and an exchange station is arranged between the first testing station and the second testing station along the rotation direction of the first rotary table. The suction nozzle rotating to the exchange station releases one quartz crystal resonator to the temporary placement table and sucks another quartz crystal resonator from the next temporary placement table.

[0014] Further, a second reject mechanism is arranged, and a second reject station is arranged between the second detection station and the feeding station along the rotation direction of the first rotary table. The quartz crystal resonator with unqualified electrical parameters, insulation performance or bottom vision is taken away by the second reject mechanism and discarded in the second reject station.

[0015] Further, the first positioning mechanism and / or the third positioning mechanism each include a transmission-connected positioning motor and a positioning cam mechanism, and four positioning claws arranged orthogonally. The positioning motor drives the positioning cam mechanism to rotate, and the positioning cam mechanism drives the four positioning claws to open / close to correct the position of the quartz crystal resonator.

[0016] Further, the first testing mechanism includes:

[0017] A probe testing mechanism mounting seat;

[0018] A test probe for contacting the electrode of the quartz crystal resonator and obtaining an electrical parameter signal;

[0019] A test probe plate arranged on the probe testing mechanism mounting seat. A plurality of test probes are fixed and signal-connected on the test probe plate. The test probe plate outputs an electrical parameter signal through a test probe plate connecting lead wire.

[0020] Further, the second testing mechanism includes one of an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacity scanning tester.

[0021] Further, the second detection mechanism includes:

[0022] A camera part includes a camera adjusting mount for adjusting the position and shooting angle of a camera, and the camera disposed on the camera adjusting mount;

[0023] A light source irradiation part includes a light source mount, a reflecting prism and a ring-shaped light source disposed on the light source mount, the reflecting prism reflects the light irradiated from the ring-shaped light source to the bottom of the quartz crystal resonator at 45 degrees to the camera, and the center of the camera and the center of the reflecting prism are on the same horizontal line.

[0024] Further, the scrap mechanism two each includes a second air nozzle and a collection mechanism, the air flow blown by the second air nozzle has a blowing force greater than the suction force of the suction nozzle; the quartz crystal resonator with unqualified test results in the electrical parameter test, the insulation performance test or the bottom visual inspection is blown by the second air nozzle into the collection mechanism in the scrap two station.

[0025] Further, the collection mechanism includes a collection mechanism mount, and a defective material cup and a material passing pipe disposed on the collection mechanism mount, the unqualified quartz crystal resonator falls into the defective material cup through the material passing pipe.

[0026] Compared with the prior art, the utility model has the following beneficial effects:

[0027] The inspection device in the utility model, through the combination of the first turntable and the suction nozzle, realizes the quick and accurate transfer of the quartz crystal resonator between different detection stations, without manual intervention, and greatly improves the detection efficiency. The entire detection process is automatically carried out according to the preset program, from positioning, electrical parameter test, insulation performance test to bottom visual inspection, each link is closely connected, the detection time is reduced, and the demand of large-scale inspection can be met. The twice positioning operation of the positioning mechanism one and the positioning mechanism three ensures the position accuracy of the quartz crystal resonator in each test / detection station, avoids the inspection error caused by the position deviation, and thus guarantees the accuracy and reliability of the inspection result.

[0028] The inspection device integrates various detection means such as electrical parameter test, insulation performance test and bottom visual inspection, can comprehensively and comprehensively evaluate the performance and appearance of the quartz crystal resonator, ensures that only the products with qualified quality can enter the subsequent production link or market, improves the quality level of the entire product, enhances the competitiveness of the product in the market, and at the same time reduces the after-sales maintenance and recall cost caused by product quality problems. The design of each detection mechanism and station has certain universality and flexibility, and can be adjusted and optimized according to different models and specifications of the quartz crystal resonator. BRIEF DESCRIPTION OF DRAWINGS

[0029] The utility model is below combined with embodiment and drawing carries out detailed explanation, wherein,

[0030] Figure 1 It is the whole structure schematic diagram of quartz crystal resonator test, marking, detection, packaging equipment;

[0031] Figure 2 It is the top view of quartz crystal resonator test, marking, detection, packaging equipment;

[0032] Figure 3 It is the partial structure schematic diagram of inspection device;

[0033] Figure 4 It is the schematic diagram of first turntable;

[0034] Figure 5 It is the schematic diagram of positioning mechanism one;

[0035] Figure 6 It is the schematic diagram of test mechanism one;

[0036] Figure 7 It is the schematic diagram of detection mechanism two;

[0037] Figure 8 It is the schematic diagram of collection mechanism;

[0038] 200, inspection device;

[0039] 211, first turntable;214, insulation tester;

[0040] 220, collection mechanism;221, collection mechanism mounting seat;222, bad material cup;223, pass material pipe;

[0041] 230, suction nozzle;231, filter;232, vacuum breaking structure;233, electromagnetic valve;

[0042] 240, positioning mechanism one;241, positioning claw piece;242, positioning cam mechanism;243, positioning motor one;

[0043] 260, test mechanism one;261, test probe;262, test probe board;263, test probe board connecting wire;264, probe test mechanism mounting seat;265, industrial control host computer;

[0044] 290, detection mechanism two;291, camera adjustment mounting seat;292, camera;293, protective cover;294, light source mounting seat;295, reflecting prism;296, annular light source;

[0045] 410, loading station; 420, positioning one station; 430, testing one station; 440, testing two station; 450, positioning three station; 460, detecting two station; 470, discarding two station; 480, material identification four station; 490, feeding station;

[0046] 510, exchange station;

[0047] 700, quartz crystal resonator. DETAILED DESCRIPTION

[0048] In order to make the purpose, technical scheme and advantages of the utility model more clear, the following will combine with the drawings to make the utility model embodiment further detailed description. The examples of the embodiments are shown in the drawings, wherein the same or similar reference numerals represent the same or similar parts or parts with the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary, only for explaining the utility model, and cannot be explained as the limitation of the utility model.

[0049] In one embodiment, a quartz crystal resonator inspection device 200, see Figures 1-2 , can be used in quartz crystal resonator testing, marking, detection, packaging equipment. The inspection device 200 comprises a first turntable 211 and a plurality of suction nozzles 230 fixed on the first turntable 211, and the plurality of suction nozzles 230 are uniformly arranged along the circumference of the first turntable 211. The first turntable 211 can rotate around its axis, and the plurality of suction nozzles 230 on it can rotate synchronously around the axis of the first turntable 211. As shown in Figure 3 , the positioning one station 420, the testing one station 430, the testing two station 440, the positioning three station 450 and the detecting two station 460 are arranged in sequence along the rotation direction of the first turntable 211, and each suction nozzle 230 rotates through the positioning one station 420, the testing one station 430, the testing two station 440, the positioning three station 450 and the detecting two station 460 in sequence. The suction nozzle 230 is used for sucking / releaseing the quartz crystal resonator 700, so that the suction nozzle 230 can drive the quartz crystal resonator 700 to rotate through the positioning one station 420, the testing one station 430, the testing two station 440, the positioning three station 450 and the detecting two station 460 in sequence, and the positioning, testing and detection of the quartz crystal resonator 700 can be carried out.

[0050] Specifically, the first turntable 211 can be a protractor disc or other rotatable disc. As shown in Figure 4 , the suction nozzle 230 is connected to the negative pressure vacuum air pipe to suck and release materials, and a filter 231 can be arranged in the middle to filter the air entering the negative pressure vacuum air pipe to remove dust and impurities. The automatic suction and release operation can also be realized through the vacuum breaking structure 232, which can improve the production efficiency and reduce the error of manual operation. The specific vacuum breaking structure 232 can be controlled to start and stop by the electromagnetic valve 233.

[0051] The testing device 200 of the quartz crystal resonator 700 further comprises a positioning mechanism one 240, a testing mechanism one 260, a testing mechanism two, a positioning mechanism three, and a detecting mechanism two 290. The positioning mechanism one 240 corresponds to a positioning one station 420, and the positioning mechanism one 240 positions the quartz crystal resonator 700 located on the positioning one station 420. The testing mechanism one 260 corresponds to a testing one station 430, and the testing mechanism one 260 tests the electrical parameters of the quartz crystal resonator 700 located on the testing one station 430. The testing mechanism two corresponds to a testing two station 440, and the testing mechanism two tests the insulation performance of the quartz crystal resonator 700 located on the testing two station 440. The positioning mechanism three corresponds to a positioning three station 450, and the positioning mechanism three positions the quartz crystal resonator 700 located on the positioning three station 450. The detecting mechanism two 290 corresponds to a detecting two station 460, and the detecting mechanism two 290 detects the bottom of the quartz crystal resonator 700 located on the detecting two station 460.

[0052] Under the rotation of the first turntable 211, the suction nozzle 230 rotates to the positioning one station 420, and the positioning mechanism one 240 positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the positioning one station 420, so as to ensure that the quartz crystal resonator 700 is in an ideal standard position during the subsequent electrical parameter test and insulation performance test, and to ensure the accuracy and reliability of the test results. Then the first turntable 211 drives the suction nozzle 230 to rotate to the testing one station 430, and the testing mechanism one 260 tests the electrical parameters of the quartz crystal resonator 700 sucked by the suction nozzle 230 at the testing one station 430, so as to distinguish the quartz crystal resonator 700 with qualified electrical parameters from the quartz crystal resonator 700 with unqualified electrical parameters. Then the first turntable 211 drives the suction nozzle 230 to rotate to the testing two station 440, and the testing mechanism two tests the insulation performance of the quartz crystal resonator 700 sucked by the suction nozzle 230 at the testing two station 440, so as to distinguish the quartz crystal resonator 700 with qualified insulation performance from the quartz crystal resonator 700 with unqualified insulation performance. Then the first turntable 211 drives the suction nozzle 230 to rotate to the positioning three station 450, and the positioning mechanism three positions the quartz crystal resonator 700 sucked by the suction nozzle 230 at the positioning three station 450, so as to ensure that the quartz crystal resonator 700 is still in an accurate position after the previous test process, to provide a stable detection object for the subsequent bottom visual detection, and to ensure the consistency and accuracy of the detection image. Then the first turntable 211 drives the suction nozzle 230 to rotate to the detecting two station 460, and the detecting mechanism two 290 detects the bottom of the quartz crystal resonator 700 sucked by the suction nozzle 230 at the detecting two station 460, so as to distinguish the quartz crystal resonator 700 with appearance defects at the bottom.

[0053] The test device 200 in this embodiment realizes the rapid and accurate transfer of the quartz crystal resonator 700 between different test stations through the combination of the first turntable 211 and the suction nozzle 230, without manual intervention, greatly improving the detection efficiency. The entire detection process is automatically carried out according to the preset program, from positioning, electrical parameter testing, insulation performance testing to bottom visual detection, each link is closely connected, reducing the detection time, which can meet the demand of large-scale inspection. The two positioning operations of the positioning mechanism one 240 and the positioning mechanism three ensure the position accuracy of the quartz crystal resonator 700 in each test / detection station, avoid the inspection error caused by the position deviation, and thus ensure the accuracy and reliability of the inspection result.

[0054] The test device 200 integrates various detection means such as electrical parameter testing, insulation performance testing and bottom visual detection, which can comprehensively and comprehensively evaluate the performance and appearance of the quartz crystal resonator 700, ensure that only the products with qualified quality can enter the subsequent production link or market, improve the overall product quality level, enhance the competitiveness of the product in the market, and also reduce the after-sales maintenance and recall cost caused by product quality problems.

[0055] The design of each detection mechanism and station has certain universality and flexibility, which can be adjusted and optimized according to different models and specifications of the quartz crystal resonator 700. For example, the test parameters of the test mechanism one 260 and the test mechanism two can be set and modified through software to adapt to the test requirements of different products; the camera 292 and the light source system of the detection mechanism two 290 can also be adjusted according to the characteristics of the product to ensure that various possible defects can be accurately detected, so that the test device 200 can be widely applied to the production and detection process of different types of quartz crystal resonator 700.

[0056] In one embodiment, as shown in Figure 5 The positioning mechanism one 240 includes a transmission connection of a positioning motor one 243 and a positioning cam mechanism 242, and four positioning claw pieces 241 arranged orthogonally, and the four positioning claw pieces 241 calibrate the position of the quartz crystal resonator 700 located in the middle. The positioning motor one 243 drives the positioning cam mechanism 242 to rotate, and the positioning cam mechanism 242 drives the four positioning claw pieces 241 to open / close to correct the position of the quartz crystal resonator 700.

[0057] The positioning motor 243 is usually a high-precision servo motor or a stepper motor. Its output shaft is rigidly connected to the input shaft of the positioning cam mechanism 242 through a coupling or a synchronous belt, ensuring stable power transmission and precise transmission ratio. The rotation angle and speed of the motor can be precisely programmed and controlled by the controller, providing a reliable power source for the precise movement of the positioning cam mechanism 242. The positioning cam mechanism 242 is composed of a cam and a follower. The profile curve of the cam is designed according to the opening and closing action requirements of the four positioning claws 241. When the positioning motor 243 rotates, it drives the cam to rotate, and the cam profile contacts the follower, converting the rotary motion of the motor into the linear reciprocating motion of the follower.

[0058] The four positioning claws 241 are connected to the follower of the positioning cam mechanism 242 through a linkage or a slider mechanism, forming a linkage system. When the cam rotates, the linear motion of the follower drives the four positioning claws 241 to open or close simultaneously. For example, the rising section of the cam profile pushes the follower to move outward, driving the positioning claws 241 to open, so that the quartz crystal resonator 700 can smoothly enter the positioning area; the descending section of the cam profile makes the follower retract inward, pulling the positioning claws 241 to close, and accurately correcting the position of the quartz crystal resonator 700 from four directions.

[0059] The inner side of the positioning claw 241 is usually designed with soft cushioning materials such as rubber pads or silicone pads, which can provide sufficient clamping force to ensure the stability of the position of the quartz crystal resonator 700, and avoid scratching or damaging the surface of the resonator.

[0060] Further, the rotation position of the first turntable 211 can also be monitored in real time by a high-precision sensor such as an encoder. When the quartz crystal resonator 700 sucked by the suction nozzle 230 rotates to the working area of the positioning mechanism 240, the sensor feeds back the signal to the control system, and the control system immediately starts the positioning motor 243.

[0061] The suction nozzle 230 places the quartz crystal resonator 700 near the center of the four positioning claws 241. The positioning claws 241 complete the opening and closing action under the drive of the motor and the cam mechanism, adjust the position of the resonator, make its center coincide with the pre-set standard position, and control the error within a very small range. Then the suction nozzle 230 sucks and transports the positioned resonator to the next station.

[0062] With the precise control of the positioning motor 243 and the design of the positioning cam mechanism 242, high-precision positioning of the quartz crystal resonator 700 can be achieved, with the position deviation of the resonator controlled at the micron or even sub-micron level, ensuring that all subsequent operations such as testing and processing can be performed at the accurate position, greatly improving the consistency and performance stability of the product. For example, for electrical parameter testing, accurate positioning can ensure good contact between the test probe and the resonator pins, thereby obtaining accurate test data. The positioning mechanism 240 has a certain universality and can achieve precise positioning for quartz crystal resonators 700 of different sizes and shapes by adjusting the initial position of the positioning claw 241 and the profile curve of the cam. At the same time, due to its relatively simple structure and firm connection of components, it has high reliability during long-term production operation, reducing downtime and product defect rate caused by positioning mechanism failure, and reducing production and maintenance costs.

[0063] The structure of the third positioning mechanism can be the same as that of the first positioning mechanism 240. In other embodiments, the first positioning mechanism 240 and the third positioning mechanism can also be designed as other positioning structures, such as pneumatic jaw positioning structure, electromagnetic adsorption positioning structure, visual recognition and mechanical arm positioning structure, etc.

[0064] In one embodiment, as shown in Figure 6 The test mechanism 260 includes a probe test mechanism mounting seat 264, a test probe 261, and a test probe plate 262. The test probe 261 is used to contact the electrodes of the quartz crystal resonator 700 and obtain electrical parameter signals. The test probe 261 is usually made of a highly conductive and elastic metal material, such as beryllium copper alloy, and its head is specially treated to ensure good electrical contact with the electrodes of the quartz crystal resonator 700 while avoiding scratching the electrode surface.

[0065] The probe test mechanism mounting seat 264 can be made of metal or high-strength engineering plastic, with sufficient rigidity and stability to resist external vibration and impact, ensuring that the test probe plate 262 and its components do not shift or wobble during testing. The test probe plate 262 is fixed and signal-connected to multiple test probes 261 on the probe test mechanism mounting seat 264. The test probes 261 are fixed on the test probe plate 262 by precise welding or crimping process, ensuring that they do not loosen or shift during long-term use, maintaining stable contact performance.

[0066] After the test probe 261 contacts the electrodes of the quartz crystal resonator 700, it acquires the electrical parameter signals and then transmits these signals to the test probe board 262 connected to it. The test probe board 262 then outputs the electrical parameter signals through the test probe board connecting wire 263 and transmits them to subsequent test boards and other equipment. The test board displays and records the electrical parameter test results through the industrial control host 265 software, acquires the test results, and thus determines whether the electrical parameters of the quartz crystal resonator 700 are qualified, ensuring that each packaged quartz crystal resonator 700 meets the electrical performance requirements.

[0067] In other embodiments, the test mechanism 260 can also be configured as other structures, such as a capacitive coupling test structure, an electromagnetic induction test structure, a microelectromechanical system (MEMS) test structure, a system-on-a-chip (SoC) test structure, a laser interferometry test structure, a spectral analysis test structure, etc.

[0068] In one embodiment, the testing mechanism 2 may include common insulation testers 214 such as insulation resistance testers, leakage current testers, LC comprehensive testers or electrostatic capacitance scanning testers, for performing insulation performance tests on quartz crystal resonators 700, ensuring that the insulation performance of each quartz crystal resonator 700 meets the standards, and providing reliable quality assurance for subsequent use.

[0069] In one embodiment, such as Figure 7 As shown, the inspection mechanism 290 includes a camera 292 and a light source illumination part. The camera 292 includes a camera adjustment mounting base 291 and a camera 292 mounted on the camera adjustment mounting base 291. The camera adjustment mounting base 291 is used to adjust the position and shooting angle of the camera 292. The light source illumination part includes a light source mounting base 294 and a reflecting prism 295 and a ring light source 296 mounted on the light source mounting base 294. First, the camera 292, the camera adjustment base, and the protective cover 293 are assembled into a whole. Then, the light source mounting base 294, the reflecting prism 295, and the ring light source 296 are assembled into another whole. The inspection mechanism 290 can perform real-time and accurate bottom visual inspection during the production process to ensure that the bottom quality of each quartz crystal resonator 700 meets the standards, providing reliable quality assurance for subsequent processes.

[0070] Among them, the reflecting prism 295 reflects the light from the ring light source 296 that is illuminating the bottom of the quartz crystal resonator 700 at a 45-degree angle to the camera 292, and the center of the camera 292 and the center of the reflecting prism 295 are on the same horizontal line.

[0071] Specifically, the camera adjusting mount 291 is generally composed of guide rails, sliders, rotary joints, adjusting screws and the like. Through these components, the position of the camera 292 can be accurately adjusted in three-dimensional space, including translation along the X, Y and Z axes and rotation around the axes, so that the camera 292 can be accurately aligned with the bottom of the quartz crystal resonator 700, ensuring that a clear, complete and detection-demand-compliant image is captured. The camera 292 can be an industrial camera with high resolution and high frame rate. The focal length and aperture of the lens and other parameters can be adjusted according to actual detection requirements. The camera 292 is fixed on the camera adjusting mount 291 and is stably connected through screws or bayonets, ensuring that it will not displace during detection.

[0072] Further, the camera 292 part can also include a protective cover 293, which is tightly installed around the camera 292 and is fixed on the camera adjusting mount 291 through a clamping groove or a screw. It can not only prevent dust, debris, water vapor and other impurities in the production environment from polluting the camera 292 lens and affecting the shooting effect, but also to a certain extent, protect the camera 292 from collision and accidental damage, while not affecting the normal shooting angle and light reception of the camera 292.

[0073] The light source mount 294 is generally made of metal, such as stainless steel, to ensure its sufficient strength and stability. The light source mount 294 is designed with precise mounting holes and positioning structures for fixing the annular light source 296 and the reflecting prism 295, so that their relative positions remain accurate and stable during detection. At the same time, the light source mount 294 can also be equipped with heat dissipation structures, such as heat sinks or fans, to dissipate the heat generated by the annular light source 296 during operation, ensuring that the light intensity and stability of the light source are not affected.

[0074] The reflecting prism 295 can be made of high-reflectivity optical glass material, and its surface is precisely polished to ensure the reflectivity and accuracy of light. The reflecting prism 295 is fixed on the light source mount 294 through special clamps or glue, ensuring that its relative position with the annular light source 296 and the camera 292 is accurate. Its reflecting surface is at a 45-degree angle with the light emission direction of the annular light source 296, which can accurately reflect the light emitted by the annular light source 296 to the bottom of the quartz crystal resonator 700, and reflect the light reflected from the bottom to the camera 292 at a 45-degree angle, achieving efficient use and accurate guidance of light.

[0075] The ring-shaped light source 296 usually adopts a light-emitting diode (LED) as a light-emitting element, and the light-emitting color and intensity thereof can be selected and adjusted according to the material of the bottom of the quartz crystal resonator 700 and the detection requirements, for example, the ring-shaped light source 296 can emit light of different colors such as white, blue, red, etc., and have different brightness levels. The ring-shaped light source 296 is firmly mounted on the light source mounting seat 294 by screws or buckles, etc., and the internal circuit thereof is connected with an external power supply controller. Through the power supply controller, the brightness, switching time, etc. of the ring-shaped light source 296 can be accurately adjusted to adapt to different detection scenes and requirements, so as to provide uniform, stable and appropriate illumination conditions for the bottom of the quartz crystal resonator 700, enhance the contrast and clarity of the image, and facilitate the camera 292 to capture clear bottom features.

[0076] Due to the precise position and angle adjustment of the camera adjustment mounting seat 291 to the camera 292, and the precise optical matching relationship between the reflecting prism 295 and the ring-shaped light source 296 and the camera 292, the detection mechanism two 290 can obtain high-definition and high-resolution images of the bottom of the quartz crystal resonator 700, so as to accurately detect subtle quality problems such as micro-cracks, scratches, impurities, packaging defects, etc., which helps to improve the quality standard of the product, reduce the outflow of defective products, and ensure the reliability and stability of the product in some application fields with extremely high quality requirements, such as the production of quartz crystal resonators 700 in the fields of aerospace, medical equipment, etc., to avoid serious consequences caused by micro-defects.

[0077] In other embodiments, the detection mechanism two 290 can also be provided in other structures, such as a line scan camera 292 detection structure, a binocular stereo vision detection structure, a multi-spectral detection structure based on machine vision, etc.

[0078] In one embodiment, a feeding station 490 and a loading station 410 are further provided between the positioning station 420 and the detecting station 460 along the rotation direction of the first turntable 211. The suction nozzle 230 rotating to the loading station 410 picks up the quartz crystal resonator 700 output by the upstream process, and the suction nozzle 230 rotating to the feeding station 490 releases the qualified quartz crystal resonator 700 to the downstream process. Specifically, when the suction nozzle 230 rotates to the loading station 410, it is accurately aligned with the output end of the upstream process. The quartz crystal resonator 700 is gently and firmly picked up from the output position of the upstream process by vacuum suction or other suitable picking-up method, ensuring that the resonator is not damaged during the transfer process. The suction nozzle 230 picking up the quartz crystal resonator 700 rotates with the first turntable 211 to the positioning station 420, where the quartz crystal resonator 700 is accurately positioned, preparing for the subsequent detection process. After a series of detection processes, when the suction nozzle 230 rotates to the feeding station 490, it is also accurately matched with the input end of the downstream process. At this time, the suction nozzle 230 releases the detected and determined qualified quartz crystal resonator 700 to the receiving position of the downstream process, completing the handover of the product.

[0079] By providing the loading station 410 and the feeding station 490 on the first turntable 211, seamless connection with the upstream and downstream processes is achieved, and the detection process of the quartz crystal resonator 700 is integrated into the entire production process, making the material transfer on the production line smoother and more efficient, reducing the stagnation and waiting time of intermediate links, improving the overall production efficiency, and meeting the needs of large-scale and continuous production. By adjusting the rotation speed of the first turntable 211, the picking-up and releasing time of the suction nozzle 230, and other parameters, different production rhythms and product model switching can be adapted to, while facilitating real-time monitoring and management of the production process, timely discovery and solution of possible problems, and improvement of the intelligent and automated level of the production process.

[0080] The accurate picking-up of the loading station 410 and the accurate release of the feeding station 490 ensure the stable state of the quartz crystal resonator 700 when entering and leaving the detection process, avoiding product damage or position deviation caused by improper human operation or material transfer, and helping to ensure the accuracy and reliability of the detection results. Only products that have passed strict detection and are qualified in quality will enter the downstream process, thereby effectively ensuring the stability and consistency of the product quality of the entire production line, reducing the rate of defective products and waste products, and improving the rate of good products and market competitiveness.

[0081] In one embodiment, the testing device 200 further comprises a plurality of temporary holding stations, and a switching station 510 is further arranged between the first testing station 430 and the second testing station 440 along the rotation direction of the first rotary disc 211, the suction nozzle 230 rotating to the switching station 510 releases a quartz crystal resonator 700 to a temporary holding station, and the suction nozzle 230 sucks a quartz crystal resonator 700 from the next temporary holding station.

[0082] In operation, the first rotary disc 211 drives the suction nozzle 230 on the first testing station 430 to rotate to the switching station 510; at the switching station 510, the suction nozzle 230 releases a quartz crystal resonator 700 to a temporary holding station, and then the first rotary disc 211 remains stationary until the next temporary holding station reaches the switching station 510, and the suction nozzle 230 sucks a quartz crystal resonator 700 from the next temporary holding station at the switching station 510; then the first rotary disc 211 drives the suction nozzle 230 at the switching station 510 to rotate to the second testing station 440 to perform the insulation performance test of the quartz crystal resonator 700.

[0083] At the switching station 510, the quartz crystal resonator 700 released by the suction nozzle 230 to the temporary holding station moves synchronously with the temporary holding station to perform other processes such as positioning, marking, and front visual inspection, and the quartz crystal resonator 700 processed in other processes is moved back to the switching station 510 under the driving of the temporary holding station, and is sucked by the suction nozzle 230 on the first rotary disc 211 to complete the remaining processes on the first rotary disc 211. The temporary holding station can be driven to rotate by a second rotary disc or can be driven to move circularly by other driving structures.

[0084] The testing device 200 in this embodiment enables the first rotary disc 211 and other related equipment to work in parallel between different processes, realizes multi-process parallel operation, shortens the total production cycle, reduces idle time, improves utilization, and thus reduces production cost. The temporary holding station can adapt to other additional processes (such as marking) and provide flexibility for functional expansion of the device. Through the cooperation of the switching station 510 and the temporary holding station, the device can flexibly schedule the flow direction of the quartz crystal resonator 700 and facilitate the adjustment of the process for special processes (such as repair or repeated detection). By sharing part of the processing work of the quartz crystal resonator 700 through the temporary holding station, the mechanical load on the first rotary disc 211 is reduced, which helps to prolong the service life of the equipment, and the temporary holding station works independently, which is convenient for maintenance or replacement and does not affect the continuous operation of the first rotary disc 211.

[0085] In one embodiment, the inspection device 200 further comprises a second reject mechanism, and a second reject station 470 is arranged between the second detection station 460 and the feeding station 490 along the rotation direction of the first rotary disc 211; the quartz crystal resonator 700 that fails the electrical parameter test, the insulation performance test and / or the bottom visual inspection is taken away by the second reject mechanism and discarded at the second reject station 470, and the qualified quartz crystal resonator 700 is driven by the suction nozzle 230 to the feeding station 490, and then the quartz crystal resonator 700 is sent to the downstream process at the feeding station 490.

[0086] In one embodiment, the second reject mechanism comprises a second air nozzle and a collection mechanism 220, and the quartz crystal resonator 700 that fails the electrical parameter test, the insulation performance test and / or the bottom visual inspection is blown by the second air nozzle into the collection mechanism 220 at the second reject station 470. The blowing force of the air flow sprayed by the second air nozzle is greater than the suction force of the suction nozzle 230, so that the second air nozzle can easily blow away the unqualified product sucked by the suction nozzle 230.

[0087] In other embodiments, the inspection device 200 can further comprise a first reject mechanism, and a first reject station is arranged between the first detection station and the second detection station, and the quartz crystal resonator 700 that fails the electrical parameter test can be directly taken away by the first reject mechanism and discarded at the first reject station. The first reject mechanism and the second reject mechanism can be arranged in the same structure, and the first reject mechanism and the second reject mechanism can also be arranged in other structures with the same function, such as a mechanical gripper type reject structure, a vacuum suction type reject structure, an inclined chute type reject structure, etc.

[0088] In one embodiment, as shown in FIG. 1, the inspection device 200 further comprises a first reject mechanism, and a first reject station 450 is arranged between the first detection station 410 and the second detection station 420 along the rotation direction of the first rotary disc 211; the quartz crystal resonator 700 that fails the electrical parameter test is taken away by the first reject mechanism and discarded at the first reject station 450. Figure 8As shown, the collection mechanism 220 includes a collection mechanism mounting seat 221, and an unqualified material cup 222 and a material passing pipe 223 arranged on the collection mechanism mounting seat 221, and the unqualified quartz crystal resonator 700 falls into the unqualified material cup 222 through the material passing pipe 223. The collection mechanism mounting seat 221 is a basic supporting part of the entire collection mechanism 220, has sufficient strength to withstand the weight of the unqualified material cup 222 and the material passing pipe 223 and the impact force generated by the unqualified quartz crystal resonator 700 in the falling process, and ensures that the entire collection mechanism 220 does not shake or displace during the working process. The unqualified material cup 222 is usually made of transparent or translucent plastic material (such as polycarbonate), so that the operator can directly observe the number and state of the collected unqualified quartz crystal resonator 700, clean the material cup in time, and avoid the material cup overflowing to cause the collection system to be blocked or malfunction. The material passing pipe 223 is made of metal or plastic material (such as a stainless steel pipe or a hard plastic pipe) with a smooth inner wall, and the inner diameter thereof is slightly larger than the maximum size of the quartz crystal resonator 700, so as to ensure that the unqualified product can smoothly pass through under the action of air flow or gravity, while minimizing the friction and collision of the product in the pipe, preventing the surface of the product from being damaged or the pipe from being blocked due to jamming.

[0089] In other embodiments, the collection mechanism 220 further includes a pneumatic cylinder, and the unqualified material cup 222 includes two, and the two unqualified material cups 222 of the second material discarding mechanism are respectively loaded with quartz crystal resonators 700 that fail the insulation performance test and quartz crystal resonators 700 that fail the bottom vision detection, so as to subsequently detect and analyze or recycle different unqualified products. The material passing pipe 223 includes two pipes and a pipe head, and the quartz crystal resonator 700 enters the different unqualified material cups 222 from the pipe head and the pipes. The pipe connected with the pipe head is switched according to the detection result of the pneumatic cylinder, so as to realize the classified collection of different unqualified products.

[0090] In one embodiment, the inspection device 200 further includes a plurality of optical fiber detection mechanisms for detecting whether there is a quartz crystal resonator 700 on the suction nozzle 230. For example, the material recognition four station 480 is arranged between the second discarding station 470 and the feeding station 490 of the first turntable 211, and the optical fiber detection mechanism detects whether there is a quartz crystal resonator 700 on the suction nozzle 230 in the material recognition four station 480. If there is, the suction nozzle 230 rotates to the subsequent station to perform the subsequent station unloading, etc. If there is not, the suction nozzle 230 idles.

[0091] The optical fiber detection mechanism can include a light source, an optical fiber, and a light detector, etc. The light emitted by the light source is transmitted to the detection point corresponding to the material identification station through the optical fiber. When there is a quartz crystal resonator, the light signal will change (such as reflection, refraction, scattering, etc.), and then the changed light signal is transmitted back to the light detector through the optical fiber. The light detector converts the change of the light signal into an electrical signal, so as to judge whether there is a quartz crystal resonator. For example, in a reflective optical fiber sensor, if the quartz crystal resonator is at the detection position, the intensity and other characteristics of the reflected light will be changed, thereby achieving detection. The plurality of optical fiber detection mechanisms can detect whether the material exists or not, control the operation of the subsequent station, avoid unnecessary operation, and improve the production efficiency.

[0092] In the description of the present specification, if the terms "embodiment one", "the present embodiment", "in one embodiment", and the like are described, it means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the invention or utility model. In the present specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example; moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in an appropriate manner.

[0093] In the description of the present specification, the terms "connection", "installation", "fixation", "setting", "having", and the like are understood in a broad sense, for example, "connection" can be fixed connection, or detachable connection, or integrally connected; can be mechanical connection, or electrical connection; can be directly connected, or indirectly connected through an intermediate medium, or can be the communication inside two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0094] In the description of the present specification, the relationship terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between the entities or operations. Moreover, the terms "include", "contain" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or includes elements inherent to such process, method, article or device. Without more limitations, the element defined by the statement "including a…" does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0095] The above description of the embodiments is to facilitate the ordinary skilled in the art to understand and apply the technology, the person skilled in the art can easily make various modifications to these examples, and apply the general principles described herein to other embodiments without the need for creative labor. Therefore, the present application is not limited to the above embodiments, the following modifications should be within the scope of protection: ① based on the technical scheme of the utility model and combined with the existing common knowledge of the new technical scheme, the technical effect produced by the new technical scheme does not exceed the technical effect of the utility model; ② the equivalent replacement of part of the features of the utility model technical scheme by using known technology, the technical effect is the same as the utility model technical effect; ③ the utility model technical scheme is expandable, and the essential content of the expanded technical scheme does not exceed the utility model technical scheme; ④ equivalent transformation is made by using the contents of the utility model specification and drawings, which is directly or indirectly used in other related technical fields.

Claims

1. A testing device for a quartz crystal resonator, characterized in that, The quartz crystal resonator testing device comprises a first rotating disc and a plurality of suction nozzles arranged along the circumference of the first rotating disc, the first rotating disc is rotatable about its axis and drives the plurality of suction nozzles to rotate synchronously, the suction nozzles rotate through a first positioning station, a first testing station, a second testing station, a third positioning station and a second detection station arranged in sequence along the rotating direction of the first rotating disc, and the suction nozzles are used for sucking and releasing quartz crystal resonators; the testing device further comprises: a first positioning mechanism for positioning the quartz crystal resonator at the first positioning station; a first testing mechanism for testing the electrical parameters of the quartz crystal resonator at the first testing station; a second testing mechanism for testing the insulation performance of the quartz crystal resonator at the second testing station; a third positioning mechanism for positioning the quartz crystal resonator at the third positioning station; a second detection mechanism for bottom visual detection of the quartz crystal resonator at the second detection station.

2. The inspection apparatus of claim 1, wherein A feeding station and a feeding station are further arranged between the first positioning station and the second detection station along the rotating direction of the first rotating disc, the suction nozzles rotating to the feeding station release the qualified quartz crystal resonators to a downstream process, and the suction nozzles rotating to the feeding station suck the quartz crystal resonators output by an upstream process.

3. The inspection apparatus of claim 2, wherein A plurality of temporary placement tables are further included; an exchange station is further arranged between the first testing station and the second testing station along the rotating direction of the first rotating disc; the suction nozzles rotating to the exchange station release one quartz crystal resonator to the temporary placement table and suck one quartz crystal resonator from the next temporary placement table.

4. The inspection apparatus of claim 3, wherein A second reject mechanism is further included; a second reject station is further arranged between the second detection station and the feeding station along the rotating direction of the first rotating disc; the quartz crystal resonator with unqualified electrical parameters, insulation performance or bottom visual detection is taken away by the second reject mechanism at the second reject station and discarded.

5. The testing device according to any one of claims 1-4, characterized in that, The first positioning mechanism and / or the third positioning mechanism each comprises a first positioning motor and a positioning cam mechanism in transmission connection, and four positioning claws arranged orthogonally, the first positioning motor drives the positioning cam mechanism to rotate, and the positioning cam mechanism drives the four positioning claws to open / close to correct the position of the quartz crystal resonator.

6. The testing device of any one of claims 1-4, wherein, The first testing mechanism comprises: a probe testing mechanism mounting seat; a test probe for contacting the electrode of the quartz crystal resonator and obtaining an electrical parameter signal; a test probe plate arranged on the probe testing mechanism mounting seat, a plurality of test probes being fixed and signal-connected on the test probe plate, and the test probe plate outputting an electrical parameter signal through a test probe plate connecting lead wire.

7. The inspection apparatus according to any one of claims 1 to 4, characterized by The second testing mechanism comprises one of an insulation resistance tester, a leakage current tester, an LC comprehensive tester or an electrostatic capacity scanning tester.

8. The inspection apparatus according to any one of claims 1 to 4, characterized by, The second detection mechanism comprises: a camera part comprising a camera adjusting mounting seat and a camera arranged on the camera adjusting mounting seat, the camera adjusting mounting seat being used for adjusting the position and shooting angle of the camera; The light source irradiation part comprises a light source mounting seat, a reflecting prism and a ring-shaped light source arranged on the light source mounting seat, the reflecting prism reflects the light from the ring-shaped light source to the bottom of the quartz crystal resonator at 45 degrees to the camera, and the center of the camera and the center of the reflecting prism are on the same horizontal line.

9. The inspection apparatus of claim 4, wherein, The waste mechanism two each comprises a second air nozzle and a collection mechanism, the blowing force of the air flow sprayed by the second air nozzle is greater than the suction force of the suction nozzle; the quartz crystal resonator with unqualified electric parameter test, insulation performance test or bottom visual detection is blown into the collection mechanism by the second air nozzle at the waste two station.

10. The inspection apparatus of claim 9, wherein, The collection mechanism comprises a collection mechanism mounting seat, a defective material cup and a material passing pipe arranged on the collection mechanism mounting seat, and the unqualified quartz crystal resonator falls into the defective material cup through the material passing pipe.

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