Test device

Abstract

The utility model provides a test device, the test device comprises a connecting piece and a test assembly, the connecting piece is provided with a guide piece, and the connecting piece is configured to be connected to a to-be-tested circuit board; the test assembly comprises a test frame and a test device, the test device is arranged on the test frame, and the test frame is movably connected to the connecting piece through a guide piece; the test frame can be close to or away from the to-be-tested circuit board along the guide piece, so that the test device is in contact with the to-be-tested circuit board or is separated from the to-be-tested circuit board. When the test equipment is used for testing the circuit board to be tested, the connecting piece can be directly connected to the circuit board to be tested, so that the relative precision between the test equipment and the circuit board to be tested is ensured; and meanwhile, the guide piece can provide a guide path for the movement of the test device, so that the accuracy of the movement position of the test device is ensured.

Description

TECHNICAL FIELD

[0001] The utility model belongs to the test technical field, specifically, the utility model relates to a test equipment. BACKGROUND

[0002] The function test of the circuit board in various devices becomes the key link to ensure product reliability, taking the domain controller device as an example, the circuit board in the domain controller needs to pass through electrical property test before factory shipment to verify the performance integrity of the circuit board.

[0003] The related art adopts the needle plate type test device to carry out the electrical property test on the circuit board, specifically by fixing the circuit board on the base of the test device, then connecting the needle plate to the base through the lifting structure. The lifting structure drives the needle plate to descend, makes the probe on the needle plate contact with the preset test site of the circuit board, and then completes the conduction test of the circuit board.

[0004] However, the fixation of the circuit board has certain error, and the lifting structure of the needle plate mostly depends on single guide column or simple slide rail design, resulting in horizontal deviation or inclination of the needle plate in the descending process, which affects the precision of the probe contacting with the circuit board, and reduces the test efficiency of the circuit board. UTILITY MODEL CONTENTS

[0005] One object of the utility model is to provide a new technical scheme of test equipment, which can solve the problem of low test efficiency of the circuit board.

[0006] According to the first aspect of the utility model, a test equipment is provided for the test of the circuit board, comprising:

[0007] A connecting piece is provided with a guide piece;

[0008] A test assembly comprises a test frame and a test device, the test device is arranged on the test frame, and the test frame is movably connected to the connecting piece through the guide piece;

[0009] The connecting piece is configured to be connected to the circuit board to be tested, and the test frame can approach or move away from the circuit board to be tested along the guide piece, so that the test device contacts or separates from the circuit board to be tested.

[0010] Optionally, the connecting piece is provided with a connecting point, which is configured to be connected with a matching point on the circuit board to be tested.

[0011] Optionally, one end of the guide piece is fixed to the connecting piece, and the other end of the guide piece has a stop portion.

[0012] The test frame comprises a movable plate, which is sleeved on the guide member and located between the connecting member and the stopper.

[0013] Optionally, a bearing is arranged on the movable plate, and the movable plate is sleeved on the guide member through the bearing.

[0014] Optionally, the test frame comprises an elastic member, which is arranged between the movable plate and the connecting member; or,

[0015] The elastic member is arranged between the movable plate and the stopper.

[0016] Optionally, the test device further comprises a driving member, and the test frame comprises an operating frame, which is connected to the movable plate and extends towards the driving member.

[0017] The driving member is configured to drive the operating frame to move, so as to drive the movable plate to move along the guide member.

[0018] Optionally, the test frame comprises a movable plate, and the testing device comprises a test plate and a probe, the test plate is arranged on the side of the movable plate away from the connecting member, and the probe is fixed to the movable plate and electrically connected with the test plate.

[0019] The probe is used for contacting test points on the circuit board to be tested.

[0020] Optionally, the testing device comprises a flexible connecting member, one end of the flexible connecting member is connected to the test plate, and the other end of the flexible connecting member is connected to the probe.

[0021] Optionally, a positioning column is arranged on the connecting member, and the positioning column is configured to be embeddedly matched with a positioning hole on the circuit board to be tested.

[0022] Optionally, the test device further comprises a bearing member, and the bearing member is configured to support a shell, and the shell is used for mounting the circuit board to be tested.

[0023] One technical effect of the utility model lies in:

[0024] The embodiment of the present application provides a test device, the test device comprises a connecting piece and a test assembly, a guide piece is arranged on the connecting piece, and the connecting piece is configured to be connected to a circuit board to be tested; the test assembly comprises a test frame and a test device, the test device is arranged on the test frame, and the test frame is movably connected to the connecting piece through the guide piece; the test frame can be close to or away from the circuit board to be tested along the guide piece, so that the test device contacts the circuit board to be tested or is separated from the circuit board to be tested. When the test device tests the circuit board to be tested, the connecting piece can be directly connected to the circuit board to be tested, so that the relative precision between the test device and the circuit board to be tested is ensured; meanwhile, the guide piece can provide a guiding path for the movement of the test device, so that the position accuracy of the movement of the test device is ensured.

[0025] Other features and advantages of the present application will be apparent from the following detailed description of exemplary embodiments thereof, taken in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0026] The accompanying drawings incorporated in and forming a part of the specification illustrate embodiments of the present application and, together with the description, serve to explain the principles of the present application.

[0027] Figure 1 A schematic view of a test device provided for an embodiment of the present application;

[0028] Figure 2 A schematic view of a test device and a circuit board to be tested in relative cooperation provided for an embodiment of the present application;

[0029] Figure 3 A partial sectional view of a test device and a circuit board to be tested in relative cooperation provided for an embodiment of the present application;

[0030] Figure 4 A schematic view of a circuit board to be tested and a shell being fixed provided for an embodiment of the present application;

[0031] Figure 5 A top view of a circuit board to be tested and a shell provided for an embodiment of the present application;

[0032] Figure 6 A sectional view of a circuit board to be tested and a shell provided for an embodiment of the present application.

[0033] Wherein:

[0034] 1, connecting piece; 11, connecting point; 12, positioning column; 2, guide; 21, stop; 3, test assembly; 31, test frame; 311, movable plate; 312, bearing; 313, elastic member; 314, operating frame; 32, test device; 321, test plate; 322, probe; 323, flexible connecting piece; 4, driving piece; 5, bearing piece;

[0035] 100, housing; 101, support column; 200, cover plate; 300, circuit board to be tested; 301, matching point; 302, positioning hole; 303, test point. DETAILED DESCRIPTION

[0036] Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. Note that the relative arrangement, numerical expressions, and numerical values of components and steps set forth in these embodiments are not limiting to the scope of the present application unless otherwise specifically stated.

[0037] Embodiments of the present application will be described in detail below, examples of which are shown in the accompanying drawings. The embodiments described below by reference to the accompanying drawings are exemplary and are only used to explain the present application and cannot be understood as limiting the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0038] The terms "first", "second" in the specification and claims of the present application can explicitly or implicitly include one or more features. In the description of the present application, the meaning of "a plurality of" is two or more, unless otherwise stated. In addition, "and / or" in the specification and claims means at least one of the connected objects, and the character " / ", generally indicates that the front and rear associated objects are in an "or" relationship.

[0039] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0040] In the description of the application, it should be noted that unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connecting" should be understood broadly, for example, it can be fixed connection, or detachable connection, or integrally connected; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through intermediate medium, or the communication inside two elements. For those skilled in the art, the specific meaning of the above terms in the application can be understood according to the specific circumstances.

[0041] It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0042] In the related art, the electrical test of the circuit board is generally performed by fixing the circuit board on the base of the test device, and then connecting the needle plate to the base through the lifting structure. However, in the related structure, the fixing of the circuit board on the test device has certain error, and the needle plate driven by the lifting structure is prone to horizontal deviation or tilting during the descending process, which affects the precision of the contact between the probe and the circuit board, and reduces the test efficiency of the circuit board.

[0043] The embodiment of the application provides a test device, which can directly connect to the circuit board to be tested when testing the circuit board to be tested, so as to ensure the relative precision between the test device and the circuit board to be tested; at the same time, the test device can contact the test point on the circuit board to be tested after gradually approaching the circuit board to be tested, so as to test and analyze the circuit board to be tested through the test device, and the guide member can provide a guiding path for the movement of the test device, so as to avoid deviation of the test device during the approach to the circuit board to be tested, ensure the positional accuracy of the movement of the test device, and improve the precision and efficiency of the test device in testing the circuit board to be tested.

[0044] Reference Figure 1 The test device provided by the embodiment of the application is used for testing the circuit board, and the test device comprises:

[0045] A connecting member 1 is provided with a guide member 2, and the connecting member 1 is configured to be connected to the circuit board 300 to be tested;

[0046] A test assembly 3 comprises a test frame 31 and a test device 32, the test device 32 is arranged on the test frame 31, and the test frame 31 is movably connected to the connecting member 1 through the guide member 2;

[0047] The test frame 31 can approach or move away from the circuit board 300 to be tested along the guide member 2, so that the test device 32 contacts or separates from the circuit board 300 to be tested.

[0048] In this embodiment, the connecting member 1 can be a connecting plate or a connecting table of the testing device, so as to be connected to the circuit board 300 to be tested while carrying the testing assembly 3, and ensure the structural compactness between the testing device and the circuit board 300 to be tested during testing.

[0049] The circuit board 300 to be tested is provided with test points 303, and the testing device tests and analyzes the circuit board 300 to be tested by contacting the test points 303. For example, the test points 303 on the circuit board 300 to be tested can be debug test points. By contacting the debug test points, the testing device can locate the circuit problem on the circuit board 300 to be tested, and not only can determine whether the test points 303 of the circuit board 300 to be tested are qualified, but also can accurately determine the fault points on the circuit board 300 to be tested, thereby facilitating the maintenance or replacement of the circuit board 300 to be tested.

[0050] Participation Figure 1 And Figure 2 When the testing device tests the circuit board 300 to be tested, the connecting member 1 can be connected to the circuit board 300 to be tested to form a whole with the testing device and the circuit board 300 to be tested, thereby ensuring the relative accuracy between the testing device and the circuit board 300 to be tested.

[0051] Reference Figure 1 The testing device 32 is arranged on the testing frame 31, and the testing frame 31 is movably connected to the connecting member 1 through the guide member 2. The guide member 2 can extend in a direction perpendicular to the circuit board 300 to be tested, so that when the testing frame 31 moves towards or away from the circuit board 300 to be tested along the guide member 2, the testing frame 31 can drive the testing device 32 to move towards or away from the circuit board 300 to be tested.

[0052] When the testing frame 31 drives the testing device 32 to move towards the circuit board 300 to be tested, the testing device 32 can contact the test points 303 on the circuit board 300 to be tested after gradually approaching the circuit board 300 to be tested, so as to test and analyze the circuit board 300 to be tested by the testing device 32. The guide member 2 can provide a guiding path for the movement of the testing device 32, so as to avoid the deviation of the testing device 32 during the process of approaching the circuit board 300 to be tested, ensure the position accuracy of the movement of the testing device 32, and improve the testing accuracy and efficiency of the testing device on the circuit board 300 to be tested.

[0053] When the testing device 32 finishes testing the circuit board 300 to be tested, the testing device 32 can be driven away from the circuit board 300 to be tested by the testing frame 31, so as to separate the testing device 32 from the circuit board 300 to be tested, and facilitate the testing device 32 to test the replaced circuit board 300 to be tested again.

[0054] The testing device provided by the embodiment of the present application is connected and fixed with the circuit board 300 to be tested through the connecting piece 1, and the testing frame 31 and the testing device 32 are matched with the movement along the guide piece 2, so as to ensure the accurate positioning between the testing device and the circuit board 300 to be tested. Moreover, the assembly between the testing device and the circuit board 300 to be tested is simple, and the convenience and efficiency of the testing are improved.

[0055] In some embodiments, the number of the guide pieces 2 can be one or more. For example, two guide pieces 2 of the positioning pin structure are fixed on the connecting piece 1, the two guide pieces 2 are arranged at two pairs of two sides on the connecting piece 1, and the testing frame 31 is movably connected to the connecting piece 1 through the two guide pieces 2, so as to improve the stability of the movement of the testing frame 31 and the testing device 32 along the guide piece 2.

[0056] In an embodiment, the circuit board 300 to be tested can be a circuit board in a domain controller, and the circuit board 300 to be tested is fixed in a shell of the domain controller. When the circuit board 300 to be tested is tested, only a part of the shell of the domain controller can be disassembled, for example, a cover plate 200 of the shell is disassembled to expose a testing area of the circuit board 300 to be tested, and then a shell body 100 in which the circuit board 300 to be tested is fixed is directly fixed, that is, the circuit board 300 to be tested can be directly tested without disassembling the circuit board 300 to be tested from the shell body 100, as shown in Figure 4 The circuit board 300 to be tested is tested, so as to avoid the damage of the circuit board 300 to be tested in the disassembly process, and ensure the structural integrity of the circuit board 300 to be tested.

[0057] In some embodiments, referring to Figure 1 、 Figure 2 and Figure 5 , the connecting piece 1 is provided with a connecting point 11, and the connecting point 11 is configured to be connected with a matching point 301 on the circuit board 300 to be tested.

[0058] In the above embodiment, the connecting piece 1 can be detachably connected to the circuit board 300 to be tested by the cooperation of the connecting point 11 and the cooperating point 301. For example, the connecting point 11 can be a buckle or a hook, and the cooperating point 301 can be a hook or a buckle. The detachable connection of the test device to the circuit board 300 to be tested is achieved by the clamping cooperation between the buckle and the hook. Alternatively, the connecting point 11 is a connecting block with a first threaded hole, and the cooperating point 301 has a second threaded hole. The locking piece is locked and cooperated with the first threaded hole and the second threaded hole to achieve the detachable connection of the test device to the circuit board 300 to be tested. The stability of the connection of the test device to the circuit board 300 to be tested is ensured, and the test device can be easily detached from the circuit board 300 to be tested.

[0059] In some embodiments, referring to Figure 1 and Figure 2 , one end of the guide piece 2 is fixed to the connecting piece 1, and the other end of the guide piece 2 has a stop portion 21.

[0060] The test frame 31 includes a movable plate 311, which is sleeved on the guide piece 2 and located between the connecting piece 1 and the stop portion 21.

[0061] In the above embodiment, the guide piece 2 provides a clear movement path for the movable plate 311 of the test frame 31. The test device 32 is connected to the movable plate 311, which ensures the accuracy of the movement direction of the movable plate 311 when it moves close to or away from the circuit board 300 to be tested.

[0062] The stop portion 21 is located at the end of the guide piece 2 away from the connecting piece 1. For example, the stop portion 21 is arranged at the top end of the guide piece 2, which limits the movement range of the movable plate 311 and prevents the movable plate 311 from moving excessively and separating from the guide piece 2, thereby providing an effective movement range for the movable plate 311.

[0063] In some embodiments, referring to Figure 1 and Figure 2 , a bearing 312 is arranged on the movable plate 311, and the movable plate 311 is sleeved and cooperated with the guide piece 2 through the bearing 312.

[0064] In the above embodiment, the bearing 312 can be a sliding bearing or a linear bearing. The arrangement of the bearing 312 can reduce the frictional resistance of the movable plate 311 when it moves on the guide piece 2, thereby reducing the structural wear caused by friction. Moreover, the installation of the bearing 312 can ensure the accuracy and stability of the movement trajectory of the movable plate 311 on the guide piece 2, thereby improving the test precision of the test device 32 on the circuit board 300 to be tested.

[0065] In some embodiments, referring to Figure 1 andFigure 2 The test frame 31 comprises an elastic member 313 arranged between the movable plate 311 and the connecting member 1, or

[0066] The elastic member 313 is arranged between the movable plate 311 and the stop portion 21.

[0067] In the above embodiment, referring to Figure 2 In the case that the elastic member 313 is arranged between the movable plate 311 and the connecting member 1, when the movable plate 311 drives the test device 32 to approach the circuit board 300 to be tested, the elastic member 313 is compressed, and the elastic member 313 can absorb the impact and vibration generated by the movable plate 311 when moving or subjected to external force, thereby playing a role of buffering and shock absorption, and ensuring the stability of the movable plate 311 during movement; after the test of the circuit board 300 to be tested by the test device 32 is completed, the elastic potential energy accumulated after compression of the elastic member 313 can lift the movable plate 311, so as to reset the test device 32 and the movable plate 311, and then separate the test device 32 from the circuit board 300 to be tested.

[0068] In the case that the elastic member 313 is arranged between the movable plate 311 and the stop portion 21, when the movable plate 311 drives the test device 32 to approach the circuit board 300 to be tested, the elastic member 313 is stretched, and the elastic member 313 can buffer the impact and vibration generated by the movable plate 311 when moving or subjected to external force, thereby ensuring the stability of the movable plate 311 during movement; after the test of the circuit board 300 to be tested by the test device 32 is completed, the elastic potential energy accumulated after stretching of the elastic member 313 can lift the movable plate 311, so as to reset the test device 32 and the movable plate 311, and then separate the test device 32 from the circuit board 300 to be tested.

[0069] In some embodiments, referring to Figure 2 The test device further comprises a driving member 4, and the test frame 31 comprises an operating frame 314 connected to the movable plate 311 and extending towards the driving member 4.

[0070] The driving member 4 is configured to drive the operating frame 314 to act, so as to drive the movable plate 311 to move along the guide member 2.

[0071] In the above embodiment, the driving member 4 can be driven in a manual, electric or starting manner, and a driving head of the driving member 4 applies a driving force to the operating frame 314, so that the operating frame 314 drives the movable plate 311 to move, and the operating frame 314 can be used as a bridge, so as to improve the efficiency of the driving member 4 in driving the movable plate 311 to move.

[0072] In one embodiment, the driving member 4 can have a positioning and locking function, for example, the driving head of the driving member 4 is adsorbed to the operating frame 314, and the movement distance of the movable plate 311 can be controlled by controlling the movement stroke of the driving head.

[0073] In one embodiment, the operating frame 314 has a plurality of connecting arms connected to the movable plate 311, so as to improve the firmness of the connection between the operating frame 314 and the movable plate 311, and ensure the stability of the driving member 4 driving the movable plate 311 to move through the operating frame 314.

[0074] In some embodiments, referring to Figure 1 , Figure 2 and Figure 5 , the test frame 31 includes the movable plate 311, and the test device 32 includes the test plate 321 and the probe 322, the test plate 321 is arranged on the side of the movable plate 311 away from the connecting member 1, and the probe 322 is fixed to the movable plate 311 and electrically connected to the test plate 321.

[0075] The probe 322 is used to contact the test point 303 on the circuit board 300 to be tested.

[0076] In the above embodiment, the probe 322 is directly fixed to the movable plate 311 and electrically connected to the test plate 321, which simplifies the transmission path of the probe 322 to obtain the test signal, reduces the possibility of signal attenuation and interference, and thus improves the test speed and accuracy.

[0077] In this embodiment, referring to Figure 5 , when the test equipment tests the circuit board 300 to be tested, the movable plate 311 can drive the probe 322 to move together, so that the probe can quickly and accurately position the test point 303 on the circuit board 300 to be tested, forming a complete test path; at the same time, through the external signal on the test plate 321, the signal of the test point 303 on the circuit board 300 to be tested can be read and analyzed to locate the test fault of the circuit board 300 to be tested, facilitating the maintenance of the circuit board 300 to be tested.

[0078] In one embodiment, the test plate 321 is arranged away from the movable plate 311, for example, the test plate 321 is arranged on the side of the movable plate 311 away from the circuit board 300 to be tested. By arranging the test plate 321 away from the circuit board 300 to be tested, on the one hand, the influence of the mutual interference between the test plate 321 and the circuit board 300 to be tested on the test result is reduced, and the test accuracy is further improved, and on the other hand, the test plate 321 can also avoid the guide member 2, providing space for the movement of the movable plate 311.

[0079] In the above embodiments, the probe 322 can pass through the through hole on the connecting piece 1, or the probe 322 contacts the test point 303 on the circuit board 300 to be tested after passing from the outer peripheral side of the connecting piece 1, both of which can realize the positioning and testing of the fault on the circuit board 300 to be tested.

[0080] In some embodiments, referring to Figure 1 and Figure 2 , the testing device 32 comprises a flexible connecting piece 323, one end of the flexible connecting piece 323 is connected to the test plate 321, and the other end of the flexible connecting piece 323 is connected to the probe 322.

[0081] In the above embodiments, the flexible connecting piece 323 can be a solder wire, a FPC (Flexible Printed Circuit) or a cable, and the flexible connecting piece 323 connects each pin on the test plate 321 to the probe 322 on the movable plate 311, which not only can absorb the installation error of the test plate 321 and the probe 322, but also can help to ensure the stable connection between the test plate 321 and the probe 322, and ensure the reliability of signal transmission.

[0082] Moreover, the flexible connecting piece 323 has the characteristics of easy bending and scalability, so that the installation of the flexible connecting piece 323 is more flexible and convenient. In the maintenance process of the testing equipment, if the test plate 321 or the probe 322 needs to be replaced or adjusted, the flexible connecting piece 323 can also provide more operation space, reducing the difficulty of maintenance.

[0083] In some embodiments, referring to Figures 1 to 3 , the connecting piece 1 is provided with a positioning column 12, and the positioning column 12 is configured to be embeddedly matched with the positioning hole 302 on the circuit board 300 to be tested.

[0084] In the above embodiments, when the connecting piece 1 is connected to the circuit board 300 to be tested, the positioning column 12 on the connecting piece 1 can be aligned with the positioning hole 302 on the circuit board 300 to be tested first, and the embedded matching of the positioning column 12 and the positioning hole 302 provides accurate positioning for the installation of the testing equipment on the circuit board 300 to be tested, ensuring the positional accuracy of the circuit board 300 to be tested during the testing process. Moreover, the alignment of the positioning column 12 and the positioning hole 302 simplifies the assembly process of the testing equipment on the circuit board 300 to be tested, thereby improving the testing efficiency.

[0085] In one embodiment, referring to Figure 2 , the connecting piece 1 has four corners, and a group of opposite corners are provided with the positioning column 12 to facilitate the accurate positioning of the testing equipment on the circuit board 300 to be tested; and the other group of opposite corners are provided with the connecting point 11 to facilitate the detachable connection of the testing equipment on the circuit board 300 to be tested.

[0086] In some embodiments, referring to Figure 4 and Figure 5 The test device further comprises a carrier 5 configured to support the housing 100 for mounting the circuit board 300 to be tested.

[0087] In the above embodiments, the carrier 5 can be a base of the test device to provide stable support for the housing 100 to ensure the stability of the entire test process.

[0088] When testing the circuit board 300 to be tested, only a part of the shell mounting the circuit board 300 to be tested can be disassembled, such as the shell comprising the housing 100 and the cover plate 200, only the cover plate 200 of the shell is disassembled to expose the test area of the circuit board 300 to be tested, and then the housing 100 in which the circuit board 300 to be tested is fixed is directly fixed, that is, the test of the circuit board 300 to be tested can be realized without disassembling the circuit board 300 to be tested from the housing 100, avoiding damage to the circuit board 300 to be tested during disassembly, and ensuring the structural integrity of the circuit board 300 to be tested.

[0089] In one embodiment, the circuit board 300 to be tested can be a circuit board in a domain controller, and the circuit board 300 to be tested is arranged in a shell of the domain controller, specifically, the circuit board 300 to be tested is fixed in the housing 100 of the shell, and the circuit board 300 to be tested is still mounted in the housing 100 of the domain controller when tested, ensuring the structural integrity of the domain controller.

[0090] In one embodiment, referring to Figure 6 , a support column 101 is arranged in the housing 100, one side of the circuit board 300 to be tested is fixed in the housing 100 through the support column 101, ensuring the stability of the arrangement of the circuit board 300 to be tested, and the other side of the circuit board 300 to be tested faces the detachable cover plate 200, the other side of the circuit board 300 to be tested can be provided with test points 303, so that the test of the circuit board 300 to be tested can be realized only by disassembling the cover plate 200.

[0091] Although some specific embodiments of the present application have been described in detail by examples, those skilled in the art should understand that the above examples are only for illustration, not for limiting the scope of the present application. Those skilled in the art should understand that the above embodiments can be modified without departing from the scope and spirit of the present application. The scope of the present application is defined by the appended claims.

Claims

1. A test apparatus for testing of a circuit board, characterized in that The utility model relates to a test device for circuit board, which comprises: a connecting piece (1) provided with a guide piece (2); a test assembly (3) comprising a test frame (31) and a test device (32), the test device (32) is arranged on the test frame (31), and the test frame (31) is movably connected to the connecting piece (1) through the guide piece (2); the connecting piece (1) is configured to be connected to a circuit board (300) to be tested, and the test frame (31) can move towards or away from the circuit board (300) to be tested along the guide piece (2) so that the test device (32) contacts or separates from the circuit board (300) to be tested.

2. The test apparatus of claim 1, wherein, The connecting piece (1) is provided with a connecting point (11) configured to be connected with a matching point (301) on the circuit board (300) to be tested.

3. The test apparatus of claim 1, wherein, One end of the guide piece (2) is fixed to the connecting piece (1), and the other end of the guide piece (2) has a stop portion (21); The test frame (31) comprises a movable plate (311) sleeved on the guide piece (2) and located between the connecting piece (1) and the stop portion (21).

4. The test apparatus of claim 3, wherein, The movable plate (311) is provided with a bearing (312), and the movable plate (311) is sleeved and matched with the guide piece (2) through the bearing (312).

5. The test apparatus of claim 3, wherein, The test frame (31) comprises a resilient member (313) arranged between the movable plate (311) and the connecting piece (1); or, The resilient member (313) is arranged between the movable plate (311) and the stop portion (21).

6. The test apparatus of claim 3, wherein, Further comprising a driving member (4), the test frame (31) comprises an operating frame (314) connected to the movable plate (311) and extending towards the driving member (4); The driving member (4) is configured to drive the operating frame (314) to act, so as to drive the movable plate (311) to move along the guide piece (2).

7. The test apparatus of claim 1, wherein, The test frame (31) comprises a movable plate (311), the test device (32) comprises a test plate (321) and a probe (322), the test plate (321) is arranged on the side of the movable plate (311) away from the connecting piece (1), and the probe (322) is fixed to the movable plate (311) and electrically connected with the test plate (321); The probe (322) is used for contacting a test point (303) on the circuit board (300) to be tested.

8. The test apparatus of claim 7, wherein, The test device (32) comprises a flexible connecting piece (323), one end of the flexible connecting piece (323) is connected to the test plate (321), and the other end of the flexible connecting piece (323) is connected to the probe (322).

9. The test apparatus of claim 1, wherein, The connecting piece (1) is provided with a positioning column (12) configured to be embedded and matched with a positioning hole (302) on the circuit board (300) to be tested.

10. The test apparatus of claim 1, wherein, Also included is a carrier (5) configured to support a housing (100) for mounting the circuit board (300) to be tested.

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