Gripper for semiconductor transfer, grabbing mechanism and caching device

By designing a four-point gripping cavity structure for semiconductor transfer grippers, the problems of short clamping stroke and easy damage in existing wafer gripping modules are solved, realizing efficient and safe wafer transfer and multi-wafer gripping, meeting the needs of modern semiconductor production lines.

CN224124563UActive Publication Date: 2026-04-14HONG KONG UNIV OF SCI & TECH (GUANGZHOU)
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Patent Information

Application Number
CN202620213296.3
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2026-02-13
Publication Date
2026-04-14
Estimated Expiration
2036-02-13

AI Technical Summary

Technical Problem

Existing wafer gripping module designs suffer from problems such as short clamping stroke, insufficient operational flexibility, and easy damage to the wafer surface, which are particularly prominent in high-precision, large-size wafer production.

Method used

Design a semiconductor transfer gripper that employs first and second gripping components, including first and second gripping drivers. Through a four-point gripping cavity structure, it achieves coordinated control of multiple grippers, extends the clamping stroke, and disperses the clamping force application points to avoid wafer damage.

Benefits of technology

It improves wafer gripping efficiency, reduces wafer loss rate, adapts to the gripping needs of wafers and hoppers of different sizes, reduces equipment space occupation, facilitates integration and maintenance, and reduces costs.

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Abstract

The utility model discloses a gripper for semiconductor transfer, a gripping mechanism and a caching device, and relates to the technical field of semiconductor processing, and the gripper for semiconductor transfer comprises a carrier, a first gripping assembly and a second gripping assembly; the first grabbing assembly comprises a first grabbing driver, a first grabbing piece and a second grabbing piece. The first grabbing driver is provided with two driving free ends capable of being close to or away from each other for control. The first grabbing piece and the second grabbing piece are connected to the two driving free ends in a one-to-one correspondence mode. The second grabbing assembly comprises a second grabbing driver, a third grabbing piece and a fourth grabbing piece. The second grabbing driver is installed on the carrier and can be controlled in a telescopic mode. The second grabbing driver is connected with the first grabbing driver; the third grabbing piece is installed on the first grabbing driver. The fourth grabbing piece is mounted on the carrier; a four-point grabbing cavity is formed among the first grabbing piece, the second grabbing piece, the third grabbing piece and the fourth grabbing piece. The above design is helpful for improving the efficiency and reducing the wafer loss.
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