Fourier infrared spectrometer device
By designing a Fourier transform infrared spectrometer device with rotating components and a magnetic fixing structure, the problems of incident light angle limitation and substrate tipping were solved, enabling multi-angle incident light testing and stable fixing, thus improving testing efficiency and substrate protection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- ANHUI JINGWEI TECHNOLOGY CO LTD
- Filing Date
- 2025-06-05
- Publication Date
- 2026-04-24
AI Technical Summary
Existing Fourier transform infrared spectrometers cannot measure incident light at angles other than 0°, and large-aperture substrates are easily damaged by being dropped during testing.
A Fourier transform infrared spectrometer device was designed, comprising a rotating component, a fixed structure, a light generator, and a light receiver. The device rotates a turntable to drive the workpiece to be tested by incident light at different angles, and uses magnetic blocks and a fixed clamping structure to stabilize the workpiece.
It achieves imaging effects of incident light at different angles, improves testing efficiency and workpiece fixation stability, and avoids substrate damage.
Smart Images
Figure CN224163254U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of instrumentation engineering technology, and in particular to a Fourier transform infrared spectrometer device. Background Technology
[0002] In related technologies, Fourier transform infrared spectrometers can perform incident light tests with an incident angle of 0°, but cannot measure incident light with other angles. Furthermore, when testing the transmittance of large-aperture substrates, the substrates are prone to tipping over during the test, causing surface damage. Utility Model Content
[0003] This application aims to address at least one of the technical problems existing in the prior art. To this end, this application proposes a Fourier transform infrared spectrometer device capable of testing an infrared detector chip with incident light at different angles.
[0004] An embodiment of this application provides a Fourier transform infrared spectrometer device, comprising:
[0005] A rotating assembly includes a turntable and a baffle, the baffle being mounted on the turntable, and the rotation axis of the turntable coinciding with the rotation axis of the baffle. The baffle is provided with a through hole located on the rotation axis of the turntable.
[0006] A fixing structure for fixing the workpiece to the baffle;
[0007] A light generator is disposed on one side of the baffle, wherein the through hole is used to allow light emitted by the light generator to pass through;
[0008] A light receiver is disposed on the other side of the baffle, and the light receiver is used to receive the light emitted by the light generator.
[0009] Furthermore, the turntable is made of metal, and the fixing structure includes a magnetic block, which is disposed on the turntable and magnetically connected to the turntable.
[0010] Furthermore, the end face of the magnetic block near the baffle is a supporting end face, and the supporting end face is arranged parallel to the baffle.
[0011] Furthermore, the end face of the magnetic block that abuts against the turntable is the bottom surface, and the bottom surface is a plane.
[0012] Furthermore, the height of the magnetic block is less than the height of the through hole.
[0013] Furthermore, the turntable has scale lines on its outer periphery.
[0014] Furthermore, the through hole is a round hole.
[0015] Furthermore, it also includes a locking structure, which is disposed on one side of the turntable and is used to restrict the rotation of the turntable.
[0016] Furthermore, the fixing structure includes a support block and an adjustment component. The support block is disposed on one side of the baffle, and the adjustment component is used to adjust the interval between the support block and the baffle.
[0017] Furthermore, the fixing structure includes a fixing clamp, which is mounted on the baffle and used to clamp the workpiece on the baffle.
[0018] As can be seen from the above technical solutions, the embodiments of this application have at least the following beneficial effects:
[0019] In the Fourier transform infrared spectrometer device provided in this application embodiment, by driving the turntable to rotate, the workpiece fixed to one side of the baffle can be rotated, thereby enabling the workpiece to be tested with incident light at different angles, so as to obtain the imaging effect of incident light at different angles. Attached Figure Description
[0020] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0021] Figure 1 A front view schematic diagram of a Fourier transform infrared spectrometer device provided in one embodiment of this application;
[0022] Figure 2 This is a schematic diagram of the left-hand structure of a Fourier transform infrared spectrometer device provided in one embodiment of this application. In the figure, the light generator and the light receiver are not shown.
[0023] Figure 3 This is a top view of a Fourier transform infrared spectrometer device provided in one embodiment of this application. In the figure, the light generator and the light receiver are not shown.
[0024] Figure 4 This is a schematic diagram of the angle between the incident light and the baffle in a Fourier transform infrared spectrometer device provided in one embodiment of this application;
[0025] Figure 5 This is a schematic diagram illustrating the application of a Fourier transform infrared spectrometer device provided in one embodiment of this application.
[0026] Figure 6This is a schematic diagram illustrating the application of a Fourier transform infrared spectrometer device provided in one embodiment of this application.
[0027] Figure 7 This is a schematic diagram illustrating the application of a Fourier transform infrared spectrometer device provided in one embodiment of this application.
[0028] Figure label:
[0029] 110. Turntable; 120. Baffle; 121. Through hole;
[0030] 200. Fixed structure; 210. Support end face; 220. Bottom surface;
[0031] 300. Light generator;
[0032] 400. Optical receiver. Detailed Implementation
[0033] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0034] In related technologies, Fourier transform infrared spectrometers can perform incident light tests with an incident angle of 0°, but cannot measure incident light with other angles. Furthermore, when testing the transmittance of large-aperture substrates, the substrates are prone to tipping over during the test, causing surface damage.
[0035] See Figures 1 to 3 As shown, an embodiment of this application discloses a Fourier transform infrared spectrometer device, including a rotating assembly, a fixed structure 200, a light generator 300, and a light receiver 400.
[0036] Specifically, the rotating assembly includes a turntable 110 and a baffle 120. The baffle 120 is mounted on the turntable 110, and the rotation axis of the turntable 110 coincides with the rotation axis of the baffle 120. The baffle 120 is provided with a through hole 121, which is located on the rotation axis of the turntable 110. The fixing structure 200 is used to fix the workpiece on the baffle 120 so that the workpiece can rotate synchronously with the turntable 110 and the baffle 120. The light generator 300 is disposed on one side of the baffle 120, and the light emitted by the light generator 300 can pass through the through hole 121 in the baffle 120. The light receiver 400 is disposed on the other side of the baffle 120 and is used to receive the light signal emitted by the light generator 300.
[0037] It is worth understanding that the angle between the line connecting the light generator 300 and the light receiver 400 and the normal direction of the baffle 120 (i.e., the direction perpendicular to the baffle 120) is the angle of incidence.
[0038] For example, see Figure 4 In the diagram, the dashed line represents the line connecting the light generator 300 and the light receiver 400, representing the incident light. The incident direction of the incident light is perpendicular to the baffle 120, and at this time, the incident angle is zero.
[0039] In this embodiment of the application, when the turntable 110 is rotated, the light generator 300 and the light receiver 400 are relatively stationary, that is, the light generator 300 and the light receiver 400 do not move with the rotation of the turntable 110 and the baffle 120.
[0040] In the Fourier transform infrared spectrometer device provided in this application embodiment, by driving the turntable 110 to rotate, the workpiece fixed on one side of the baffle 120 can be rotated, thereby realizing incident light testing on the workpiece with incident light at different angles, so as to obtain the imaging effect of incident light at different angles. This helps to determine the number of infrared detectors that need to be installed in the installation area based on the imaging effect.
[0041] In one embodiment, the light generator 300, the through-hole 121, and the light receiver 400 are located on the same straight line.
[0042] In some embodiments of this application, the turntable 110 is made of metal, and the fixing structure 200 includes a magnetic block disposed on and magnetically connected to the turntable 110. That is, the magnetic block can be attracted to the turntable 110, thereby achieving rapid fixing. In practical applications, after the workpiece is placed against one side of the baffle 120 and its position adjusted, the magnetic block presses the workpiece against the baffle 120, preventing the workpiece from moving relative to the baffle 120; simultaneously, the magnetic block can be magnetically connected to the turntable 110 for fixing, thus facilitating workpiece fixing and improving testing efficiency.
[0043] In some embodiments of this application, see Figure 1 and Figure 3 The end face of the magnetic block near the baffle 120 is the support end face, and the support end face is set parallel to the baffle 120. This facilitates full contact between the magnetic block and the workpiece, thereby ensuring the fixing effect.
[0044] It is worth understanding that the support end face can be a plane or a plane composed of multiple support points of the magnetic block closest to the baffle 120, and there is no limitation here.
[0045] In one possible implementation, see Figure 1 and Figure 3 The support end face is a plane and is used to abut against the workpiece.
[0046] In other embodiments, the magnetic block can also fix the workpiece via a support point. Specifically, the magnetic block can press the workpiece onto the baffle 120 via a fulcrum, and since the turntable 110 can provide support for the workpiece, the workpiece can be fixed onto the baffle 120.
[0047] In some embodiments of this application, see Figure 1 The end face of the magnetic block that abuts against the turntable 110 is the bottom surface, which is a plane. This increases the contact stability between the magnetic block and the turntable 110, thereby helping to ensure the stability of the workpiece fixation.
[0048] In some embodiments of this application, see Figure 1 and Figure 2 The height of the magnetic block is less than the height of the through hole 121, therefore, the magnetic block will not block the light emitted by the light generator 300. In this way, the light emitted by the light generator 300 can pass through the through hole 121 on the baffle 120 and be received by the light receiver 400.
[0049] In some embodiments of this application, see Figure 3 The turntable 110 has graduations on its outer circumference. When the turntable 110 rotates, the baffle 120 rotates with it, while the graduations remain stationary. This allows for the rapid determination of the angle through which the turntable 110 has rotated, facilitating experiments at different incident angles.
[0050] In some embodiments of this application, see Figure 1 and Figure 2 Through hole 121 is a round hole.
[0051] In some embodiments of this application, the Fourier transform infrared spectrometer device further includes a locking structure disposed on one side of the turntable 110. The locking structure is used to restrict the rotation of the turntable 110. Thus, after the rotation angle of the turntable 110 is adjusted, the locking structure can be used to lock the turntable 110 to restrict the turntable 110 from continuing to rotate.
[0052] In some other embodiments of this application, the fixing structure 200 includes a support block and an adjustment component. The support block is disposed on one side of the baffle 120, and the adjustment component is used to adjust the gap between the support block and the baffle 120 to press the workpiece onto the baffle 120, thereby fixing the workpiece.
[0053] In some other embodiments of this application, the fixing structure 200 includes a fixing clamp, which is mounted on the baffle 120 and used to clamp the workpiece on the baffle 120.
[0054] In one possible application scenario, this embodiment tests the infrared detector chip with incident light at different angles. Since the transmittance of incident light at different angles is different, the imaging effect of incident light at different angles can be obtained, which makes it easier to determine the number of infrared detectors that need to be installed in the installation area.
[0055] The Fourier transform infrared spectrometer device of this application is described in detail below with specific embodiments. It should be noted that the following embodiments are merely illustrative and should not be construed as limiting the embodiments of this application.
[0056] In one embodiment, see Figure 4 As shown, the line connecting the light generator 300 and the light receiver 400 is perpendicular to the baffle 120, and at this time, the incident angle of the light is 0°.
[0057] In one embodiment, see Figure 5 As shown, the angle between the line connecting the light generator 300 and the light receiver 400 and the baffle 120 is 75°, and at this time, the incident angle of the light is 15°.
[0058] In one embodiment, see Figure 6 As shown, the angle between the line connecting the light generator 300 and the light receiver 400 and the baffle 120 is 60°, and at this time, the incident angle of the light is 30°.
[0059] In one embodiment, see Figure 7 As shown, the angle between the line connecting the light generator 300 and the light receiver 400 and the baffle 120 is 45°, and at this time, the incident angle of the light is 45°.
[0060] It is worth noting that in some other embodiments, the incident angle of the light can be set from 0 to 90° as needed, and is not limited here.
[0061] In the description of this application, it should be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.
[0062] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, unless otherwise stated, "a plurality of" means two or more.
[0063] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0064] In the description of this specification, specific features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments or examples.
[0065] It should be understood that although the steps in the flowcharts of the accompanying figures are shown sequentially as indicated by the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the accompanying figures may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.
Claims
1. A Fourier transform infrared spectrometer device, characterized in that, include: A rotating assembly includes a turntable and a baffle, the baffle being mounted on the turntable, and the rotation axis of the turntable coinciding with the rotation axis of the baffle. The baffle is provided with a through hole located on the rotation axis of the turntable. A fixing structure for fixing the workpiece to the baffle; A light generator is disposed on one side of the baffle, wherein the through hole is used to allow light emitted by the light generator to pass through; A light receiver is disposed on the other side of the baffle, and the light receiver is used to receive the light emitted by the light generator.
2. The Fourier transform infrared spectrometer device according to claim 1, characterized in that, The turntable is made of metal, and the fixing structure includes a magnetic block, which is disposed on the turntable and magnetically connected to the turntable.
3. The Fourier transform infrared spectrometer device according to claim 2, characterized in that, The end face of the magnetic block near the baffle is a supporting end face, and the supporting end face is arranged parallel to the baffle.
4. The Fourier transform infrared spectrometer device according to claim 2, characterized in that, The end face of the magnetic block that abuts against the turntable is the bottom surface, and the bottom surface is a plane.
5. The Fourier transform infrared spectrometer apparatus according to any one of claims 2 to 4, characterized in that, The height of the magnetic block is less than the height of the through hole.
6. The Fourier transform infrared spectrometer device according to claim 1, characterized in that, The turntable has scale lines on its outer circumference.
7. The Fourier transform infrared spectrometer device according to claim 1, characterized in that, The through hole is a round hole.
8. The Fourier transform infrared spectrometer device according to claim 1, characterized in that, It also includes a locking structure, which is disposed on one side of the turntable and is used to restrict the rotation of the turntable.
9. The Fourier transform infrared spectrometer device according to claim 1, characterized in that, The fixing structure includes a support block and an adjustment component. The support block is disposed on one side of the baffle, and the adjustment component is used to adjust the interval between the support block and the baffle.
10. The Fourier transform infrared spectrometer device according to claim 1, characterized in that, The fixing structure includes a fixing clamp, which is mounted on the baffle and used to clamp the workpiece on the baffle.