Microwave dielectric material loss measuring device

Abstract

The utility model relates to the technical field of microwave material testing, and discloses a microwave dielectric material loss measuring device which comprises a lower conductive plate, an upper conductive plate, two low-loss dielectric blocks, an input probe, a receiving probe and a vector network analyzer. The center of the lower current-conducting plate is provided with a positioning mark for placing a sample to be tested, and the two low-loss dielectric blocks are symmetrically arranged on two sides of the sample and form a closed dielectric resonant cavity together with the upper and lower current-conducting plates. The input probe and the receiving probe are connected to the vector network analyzer and can move in the radial direction of the sample to adjust the coupling degree. According to the device, the dielectric loss of the microwave dielectric material is efficiently and accurately measured through structural optimization of the resonant cavity and dynamic adjustment of the probe, and the problems that a traditional method is low in testing efficiency and difficult in consistency evaluation are solved.

Description

Technical Field

[0001] This application relates to the field of microwave material testing technology, specifically to a microwave dielectric material loss measurement device. Background Technology

[0002] Microwave dielectric materials play a crucial role in microwave devices such as filters, resonators, and antennas. Their dielectric loss characteristics directly affect the insertion loss, quality factor, and signal stability of these devices. Existing measurement devices generally suffer from complex and time-consuming testing processes, and can only measure a single location or a single sample, making it difficult to comprehensively assess the loss consistency of material batches or different regions of the same sample. Furthermore, traditional measurement devices have stringent environmental requirements; even slight temperature or process fluctuations can easily lead to measurement errors, severely hindering the optimization of microwave component performance and the improvement of reliability.

[0003] Therefore, there is an urgent need for a microwave dielectric material loss measurement device that can quickly and accurately assess the consistency of material loss characteristics, simplify the testing process, and reduce environmental sensitivity. Utility Model Content

[0004] In view of this, this application provides a microwave dielectric material loss measurement device to solve the problems of low testing efficiency, difficulty in consistency assessment, and sensitivity to the testing environment in the prior art.

[0005] This application provides a microwave dielectric material loss measurement device, which includes a lower conductive plate, an upper conductive plate, two low-loss dielectric blocks, an input probe, a receiving probe, and a vector network analyzer;

[0006] The upper surface of the lower conductive plate has a positioning mark at its center for placing the sample to be tested;

[0007] Low-loss dielectric blocks are symmetrically arranged on both sides of the sample to be tested;

[0008] The upper conductive plate covers two low-loss dielectric blocks and together with the lower conductive plate, forms a closed dielectric resonant cavity.

[0009] The input probe and the receiving probe are connected to the vector network analyzer, and the input probe and the receiving probe can move radially along the sample to be tested.

[0010] The microwave dielectric material loss measurement device provided in this application ensures the repeatability and consistency of sample placement through a positioning mark at the center of the lower conductive plate, avoiding measurement errors caused by positional offset. Symmetrically arranged low-loss dielectric blocks and the upper conductive plate together form a closed dielectric resonant cavity, effectively shielding external electromagnetic interference and maintaining the uniformity of the electromagnetic field distribution within the cavity, reducing interference from field distribution distortion on the measurement results. The input and receiving probes are connected to a vector network analyzer and can move radially along the sample. By dynamically adjusting the coupling degree between the probe and the resonant cavity, the injection efficiency of the microwave signal and the receiving sensitivity of the response signal are optimized, avoiding signal distortion caused by insufficient or excessive coupling. The vector network analyzer analyzes parameters such as the resonant frequency, quality factor, and insertion loss of the resonant cavity, and accurately calculates the dielectric loss of the material by combining calibration data. This device, through structural optimization and the integration of operating mechanisms, systematically solves the problems of low testing efficiency, difficulty in consistency assessment, and environmental sensitivity in traditional solutions, significantly improving the accuracy and reliability of microwave dielectric material loss measurement.

[0011] In one alternative embodiment, the surfaces of the lower conductive plate and the upper conductive plate are covered with a conductive layer, which is a silver-plated layer or a gold-plated layer.

[0012] The microwave dielectric material loss measurement device provided in this application significantly reduces the surface resistance of the conductive plate by using a silver-plated or gold-plated conductive layer, thereby reducing the reflection loss of microwave signals on the surface of the conductive plate, ensuring efficient transmission of electromagnetic fields in the resonant cavity, improving the signal-to-noise ratio of the measurement signal, and enhancing the corrosion resistance and long-term stability of the conductive plate.

[0013] In one alternative implementation, the low-loss dielectric block is semi-cylindrical in shape, and the radius of curvature of the semi-cylindrical shape matches the edge of the sample to be tested.

[0014] The microwave dielectric material loss measurement device provided in this application has a semi-cylindrical dielectric block whose curvature matches the sample edge, forming a smooth electromagnetic field transition. This reduces field distribution distortion and edge effects caused by the gap between the sample edge and the dielectric block, optimizes the electromagnetic field uniformity in the resonant cavity, and improves measurement accuracy.

[0015] In one alternative implementation, the low-loss dielectric block is made of a ceramic material with a low dielectric constant.

[0016] The microwave dielectric material loss measurement device provided in this application uses low dielectric constant ceramics (e.g., dielectric constant < 5) to reduce the interference of the dielectric block itself on the electromagnetic field of the resonant cavity, avoid parasitic resonance and additional energy loss, and ensure that the measurement results truly reflect the dielectric properties of the sample under test.

[0017] In one alternative implementation, the input probe and the receiving probe move radially along the sample to be tested via a slide rail mechanism, which includes a guide rail and a slider.

[0018] The microwave dielectric material loss measurement device provided in this application uses a slide rail mechanism that provides precise guidance and stable adjustment for the radial movement of the probe through the mechanical cooperation of the guide rail and the slider. This avoids coupling deviation caused by manual operation, ensures the repeatability of the probe position, and improves measurement consistency.

[0019] In one alternative implementation, the input probe and the receiver probe are connected to the vector network analyzer via a coaxial cable.

[0020] The microwave dielectric material loss measurement device provided in this application uses a coaxial cable (e.g., 50Ω impedance) to achieve low-loss transmission of microwave signals, reduce signal attenuation and reflection during transmission, ensure signal integrity, and reduce the impact of external electromagnetic interference on the measurement results.

[0021] In one alternative embodiment, the device further includes a temperature control module, to which the vector network analyzer is connected, and the temperature control module is attached to the housing of the vector network analyzer via a heat-conducting sheet.

[0022] The microwave dielectric material loss measurement device provided in this application uses a constant temperature module to maintain the stable operating temperature of the vector network analyzer through a heat-conducting sheet, suppressing thermal drift of the internal circuit of the instrument, reducing frequency offset and noise caused by temperature fluctuations, and ensuring the long-term stability of measurement data.

[0023] In one alternative implementation, the vector network analyzer is connected to a temperature sensor, which is fixed at a positioning mark on the lower conductive plate and connected to the input terminal of the vector network analyzer via a data cable.

[0024] The microwave dielectric material loss measurement device provided in this application uses a temperature sensor to monitor the temperature change at the location of the sample in real time and feeds the temperature data back to the vector network analyzer via a data line. It supports dynamic calibration algorithms to compensate for the temperature of the measured values ​​and eliminates the influence of ambient temperature fluctuations on the dielectric loss calculation results.

[0025] In one alternative embodiment, the positioning mark of the lower conductive plate is a groove structure, the size of which is adapted to the shape of the sample to be tested.

[0026] The microwave dielectric material loss measurement device provided in this application uses a groove structure to precisely fix the position of the sample under test through physical limiting, preventing the sample from sliding or rotating during the test, ensuring the consistency of position during multiple measurements or tests of different samples, and improving the reproducibility of test results.

[0027] In one alternative embodiment, the device further includes a clamping mechanism comprising a spring clamp and a locating pin for securing the low-loss dielectric block and the conductive plate in position when changing samples.

[0028] The microwave dielectric material loss measurement device provided in this application uses a clamping mechanism that locks the relative position of the dielectric block and the conductive plate when changing samples through the cooperation of spring clamps and positioning pins. This prevents the structural components from shifting due to operational vibrations or external forces, ensuring the stability of the resonant cavity structure and guaranteeing the repeatability of the measurement process.

[0029] In summary, the microwave dielectric material loss measurement device provided in this application ensures the repeatability of sample placement and eliminates positional offset errors through the positioning mark and groove structure at the center of the lower conductive plate; symmetrically arranged low-dielectric-constant ceramic dielectric blocks form a uniform electromagnetic field distribution, and the semi-cylindrical curvature design reduces edge effect interference; silver-plated or gold-plated conductive layers reduce surface resistance and signal reflection loss, ensuring efficient transmission of microwave signals within the resonant cavity; input and receiving probes move radially along the sample via a slide rail mechanism, dynamically adjusting the coupling degree between the probes and the resonant cavity, and achieving low-loss signal transmission with the help of coaxial cables; the constant temperature module and temperature sensor suppress thermal drift errors and compensate for the influence of temperature fluctuations on the measurement in real time; the clamping mechanism fixes the position of the dielectric block and conductive plate, ensuring structural stability when changing samples. By systematically integrating structural optimization (enclosing the resonant cavity to shield interference), material selection (low-loss ceramics to reduce parasitic effects), and operating mechanisms (dynamic probe adjustment and temperature compensation), the core defects of traditional solutions, such as low testing efficiency, difficulty in consistency evaluation, and environmental sensitivity, have been solved. This has enabled high-precision and high-reliability measurement of the dielectric loss of microwave dielectric materials, significantly improving the performance evaluation capability and large-scale production efficiency of microwave communication devices. Attached Figure Description

[0030] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0031] Figure 1 This is a schematic diagram of a system for measuring the loss uniformity of microwave dielectric materials according to an embodiment of this application;

[0032] Explanation of reference numerals in the attached figures:

[0033] 1. Vector Network Analyzer;

[0034] 2. Lower conductive plate;

[0035] 3. Install the upper conductive plate;

[0036] 4. The first semi-cylindrical medium block;

[0037] 5. The second semi-cylindrical medium block;

[0038] 6. Input coaxial cable;

[0039] 7. Receive coaxial cable;

[0040] 8. First probe;

[0041] 9. Second probe. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0043] Microwave dielectric materials are core functional materials for high-frequency devices such as microwave filters, resonators, and antennas. Their dielectric constant and dielectric loss characteristics directly determine the insertion loss, quality factor, and signal transmission stability of the devices. With the increasing demand for high-frequency, highly integrated microwave devices in fields such as 5G communication and satellite navigation, accurately evaluating the dielectric loss characteristics of materials has become crucial for optimizing device performance. However, existing measurement methods (such as the resonant method and transmission line method) have significant limitations: the testing process is complex and time-consuming, requiring multiple calibrations for a single measurement, making it difficult to meet the needs of large-scale production; measurements can only be performed on a single location or a single sample, failing to comprehensively assess the loss consistency of batches of materials or different regions of the same sample; and test results are easily affected by environmental temperature fluctuations, electromagnetic interference, and probe coupling deviations, leading to insufficient data reliability.

[0044] The design of existing devices further exacerbates these problems. For example, the open resonant cavity structure lacks sufficient shielding, making it susceptible to interference from external noise with the electromagnetic field distribution within the cavity; the fixed probe design cannot adjust the coupling, resulting in limited signal injection efficiency; and the lack of a standardized positioning mechanism leads to frequent sample placement misalignment, making it difficult to guarantee measurement repeatability. These problems severely restrict the optimization of microwave device performance and the improvement of high-frequency communication system reliability.

[0045] Therefore, there is an urgent need for a new microwave dielectric material loss measurement device that can significantly improve testing efficiency and consistency assessment capabilities while ensuring measurement accuracy and reducing dependence on the testing environment.

[0046] This application provides a microwave dielectric material loss measurement device, which includes a lower conductive plate, an upper conductive plate, two low-loss dielectric blocks, an input probe, a receiving probe, and a vector network analyzer.

[0047] The lower conductive plate has a positioning mark at the center of its upper surface for placing the sample to be tested.

[0048] The lower conductive plate serves as the basic support structure of the device, supporting the sample to be tested. A positioning mark is located at the center of the upper surface of the lower conductive plate to precisely fix the position of the sample, ensuring repeatability and consistency of sample placement during each measurement and avoiding measurement errors caused by positional deviations.

[0049] Two low-loss dielectric blocks are symmetrically arranged on both sides of the sample under test. They support the upper conductive plate and participate in forming the resonant cavity structure.

[0050] Two dielectric blocks are symmetrically distributed around the sample to ensure a uniform electromagnetic field distribution within the resonant cavity, reducing field distortion. Made of low-loss materials (such as low-dielectric-loss ceramics), they exhibit minimal interference with microwave signals, thus avoiding the influence of parasitic resonances on measurement results.

[0051] The upper conductive plate covers two low-loss dielectric blocks, forming a closed dielectric resonant cavity with the lower conductive plate.

[0052] The upper conductive plate covers two low-loss dielectric blocks, and the cooperation of the upper and lower conductive plates forms a closed resonant cavity, which shields external electromagnetic interference and maintains the stability of the electromagnetic field inside the cavity.

[0053] The input probe and the receiving probe are connected to the vector network analyzer, and the input probe and the receiving probe can move radially along the sample to be tested.

[0054] The input probe injects a microwave signal from the vector network analyzer into the resonant cavity, while the receiving probe transmits the cavity's response signal back to the analyzer. The probe can move radially along the sample under test, and by adjusting the distance or angle between the probe and the resonant cavity, the coupling degree (energy exchange efficiency) can be dynamically controlled, optimizing the sensitivity of signal excitation and reception.

[0055] Vector network analyzers are used to analyze the transmission and reflection characteristics of microwave signals. A swept-frequency microwave signal is injected through an input probe, and the response signal of the resonant cavity is collected by a receiving probe. Parameters such as resonant frequency, quality factor (Q value), and insertion loss are analyzed, and then the dielectric loss of the material is calculated.

[0056] Optionally, the surfaces of the lower and upper conductive plates are covered with a conductive layer, which may be a silver-plated or gold-plated layer. The silver-plated or gold-plated conductive layer significantly reduces the surface resistance of the conductive plates, reduces microwave signal reflection loss on the conductive plate surface, ensures efficient transmission of the electromagnetic field within the resonant cavity, improves the signal-to-noise ratio of the measurement signal, and enhances the corrosion resistance and long-term stability of the conductive plates.

[0057] The low-loss dielectric block is semi-cylindrical in shape, with its radius of curvature matching the edge of the sample under test. This creates a smooth electromagnetic field transition, reducing field distribution distortion and edge effects caused by the gap between the sample edge and the dielectric block. This optimizes the electromagnetic field uniformity within the resonant cavity and improves measurement accuracy. Furthermore, the low-loss dielectric block is made of a low-dielectric-constant ceramic material. Low-dielectric-constant ceramics (e.g., dielectric constant < 5) reduce the interference of the dielectric block itself on the electromagnetic field of the resonant cavity, avoiding parasitic resonances and additional energy losses, ensuring that the measurement results accurately reflect the dielectric properties of the sample under test.

[0058] Optionally, the input and receiving probes move radially along the sample under test via a slide rail mechanism, which includes a guide rail and a slider. The slide rail mechanism, through the mechanical cooperation of the guide rail and slider, provides precise guidance and stable adjustment for the radial movement of the probes, avoiding coupling deviations caused by manual operation, ensuring the repeatability of probe position, and improving measurement consistency. The input and receiving probes are connected to the vector network analyzer via a coaxial cable. The coaxial cable (e.g., with a 50Ω impedance) enables low-loss transmission of microwave signals, reducing signal attenuation and reflection during transmission, ensuring signal integrity, and minimizing the impact of external electromagnetic interference on the measurement results.

[0059] Optionally, the device also includes a temperature control module. The vector network analyzer is connected to the temperature control module, which is attached to the housing of the vector network analyzer via a heat-conducting plate. The temperature control module maintains a stable operating temperature for the vector network analyzer through the heat-conducting plate, suppresses thermal drift of the internal circuitry, reduces frequency shift and noise caused by temperature fluctuations, and ensures long-term stability of the measurement data.

[0060] Optionally, the vector network analyzer is connected to a temperature sensor, which is fixed at the positioning mark on the lower conductive plate and connected to the input terminal of the vector network analyzer via a data cable. The temperature sensor monitors the temperature change at the location of the sample under test in real time and feeds the temperature data back to the vector network analyzer via the data cable. It supports dynamic calibration algorithms to perform temperature compensation on the measured values, eliminating the influence of ambient temperature fluctuations on the dielectric loss calculation results.

[0061] Optionally, the positioning mark of the lower conductive plate is a groove structure, the size of which is adapted to the shape of the sample to be tested. The groove structure precisely fixes the position of the sample to be tested through physical limiting, preventing the sample from sliding or rotating during the test, ensuring positional consistency during multiple measurements or tests of different samples, and improving the reproducibility of test results.

[0062] Optionally, the device also includes a clamping mechanism, which comprises a spring clamp and a locating pin, for fixing the position of the low-loss dielectric block and the conductive plate when changing samples. The clamping mechanism, through the cooperation of the spring clamp and the locating pin, locks the relative position of the dielectric block and the conductive plate when changing samples, preventing displacement of the structural components due to operational vibrations or external forces, ensuring the stability of the resonant cavity structure, and guaranteeing the repeatability of the measurement process.

[0063] The specific measurement process of the microwave dielectric material loss measurement device provided in this embodiment includes the following steps:

[0064] Start the vector network analyzer and the temperature control module. The temperature control module is attached to the outer shell of the vector network analyzer through a heat-conducting plate to maintain the instrument's stable operating temperature. Preheat for 30 to 40 minutes to suppress frequency shift and noise caused by thermal drift and ensure the stability of measurement data.

[0065] A standard microwave dielectric material sample (with known dielectric parameters) is placed at the groove positioning mark in the center of the lower conductive plate, and the sample position is fixed by the physical limitation of the groove; the upper conductive plate is covered, forming a closed dielectric resonant cavity with the lower conductive plate and the semi-cylindrical low-loss dielectric blocks on both sides; the input probe and the receiving probe are moved radially along the sample, and the probe position is adjusted by the guide rail and slider of the slide rail mechanism to achieve a predetermined coupling degree (e.g., 35dB); a vector network analyzer injects a swept-frequency microwave signal, and the receiving probe collects the response signal of the resonant cavity, recording the resonant frequency, quality factor and insertion loss of the standard sample as reference data.

[0066] Remove the standard sample and precisely place the sample to be tested at the groove positioning mark on the lower conductive plate to ensure positional consistency. Use the spring clamps and positioning pins of the clamping mechanism to fix the position of the low-loss dielectric block and the conductive plate to prevent structural displacement when changing samples. Repeat the probe adjustment steps to ensure that the coupling is still 35dB. Use a vector network analyzer to measure the resonant frequency, quality factor and insertion loss of the sample to be tested and acquire data in real time.

[0067] During the measurement and analysis process, the temperature sensor monitors the temperature at the positioning mark on the lower conductive plate in real time and transmits the temperature data to the vector network analyzer via a data cable. The vector network analyzer automatically corrects the resonant frequency and quality factor based on the temperature data to eliminate the influence of ambient temperature fluctuations on the measurement.

[0068] The measurement data of the sample under test are compared with the reference data of the standard sample; the dielectric loss of the sample under test is calculated and its dielectric constant is evaluated to ensure consistency with the standard sample; the final test report is output, including resonance parameters, loss values ​​and consistency evaluation results.

[0069] When it is necessary to change the sample to be tested, loosen the clamping mechanism and take out the sample to be tested; replace with a new sample for continuous measurement; after each sample change, the positioning marks and groove structure ensure that the placement position is consistent, thus ensuring the reproducibility of the test results.

[0070] In summary, the microwave dielectric material loss measurement device provided in this application ensures the repeatability of sample placement and eliminates positional offset errors through the positioning mark and groove structure at the center of the lower conductive plate; symmetrically arranged low-dielectric-constant ceramic dielectric blocks form a uniform electromagnetic field distribution, and the semi-cylindrical curvature design reduces edge effect interference; silver-plated or gold-plated conductive layers reduce surface resistance and signal reflection loss, ensuring efficient transmission of microwave signals within the resonant cavity; input and receiving probes move radially along the sample via a slide rail mechanism, dynamically adjusting the coupling degree between the probes and the resonant cavity, and achieving low-loss signal transmission with the help of coaxial cables; the constant temperature module and temperature sensor suppress thermal drift errors and compensate for the influence of temperature fluctuations on the measurement in real time; the clamping mechanism fixes the position of the dielectric block and conductive plate, ensuring structural stability when changing samples. By systematically integrating structural optimization (enclosing the resonant cavity to shield interference), material selection (low-loss ceramics to reduce parasitic effects), and operating mechanisms (dynamic probe adjustment and temperature compensation), the core defects of traditional solutions, such as low testing efficiency, difficulty in consistency evaluation, and environmental sensitivity, have been solved. This has enabled high-precision and high-reliability measurement of the dielectric loss of microwave dielectric materials, significantly improving the performance evaluation capability and large-scale production efficiency of microwave communication devices.

[0071] The microwave dielectric material loss measurement device provided in the above embodiments will be described in detail below using a specific example.

[0072] This embodiment also provides a system for measuring the loss uniformity of microwave dielectric materials, the structure of which is as follows: Figure 1 As shown, the system includes a vector network analyzer, a lower conductive plate, an upper conductive plate, a first semi-cylindrical dielectric block, a second semi-cylindrical dielectric block, an input coaxial cable, a receiving coaxial cable, a first probe, and a second probe. The upper and lower conductive plates are made of copper plates with a silver-plated surface. The two semi-cylindrical dielectric blocks are made of dielectric ceramic with low dielectric loss and low dielectric constant. The first probe is connected to the vector network analyzer via the input coaxial cable as an input probe, and the second probe is connected to the vector network analyzer via the receiving coaxial cable as a receiving probe.

[0073] The structure and function of this system are the same as those of the microwave dielectric material loss measurement device in the above embodiment, and will not be described again here.

[0074] The specific operation procedure of this system is as follows:

[0075] Place the vector network analyzer and measurement system stably on the worktable and connect them as required. Place the sample to be tested at the center of the lower conductive plate, place two semi-cylindrical dielectric blocks on both sides of the sample, and cover the two semi-cylindrical dielectric blocks with the upper conductive plate to form a dielectric resonant cavity.

[0076] The initial positions of the two probes are marked on the lower conductive plate. Excitation and detection coupling of the resonant system are achieved by moving the two probes. Both probes can be moved closer to or further away radially along the sample under test to change their coupling degree. A positioning mark is placed at the center of the lower conductive plate.

[0077] Connect the power cord and turn on the vector network analyzer. After powering on or pressing the reset button, allow the instrument to warm up for 30 to 40 minutes before measurement.

[0078] Adjust the frequency of the vector network analyzer to make the resonant cavity resonate. The detailed operation is as follows:

[0079] Calibrate the vector network analyzer;

[0080] Prepare a standard microwave dielectric material sample and place the sample at the center positioning mark of the conductive plate.

[0081] The probe is moved radially along the sample to make the coupling degree of the sample 35dB during the vector network analyzer test. The resonant cavity is then calibrated and measured, and the resonant frequency, quality factor and insertion loss are recorded.

[0082] The sample to be tested is placed in the resonant cavity, and the probe is moved radially along the sample so that the coupling degree of the sample is 35dB when tested by the vector network analyzer. The resonant frequency, quality factor and insertion loss of the sample to be tested are then measured.

[0083] By comparing the two sets of measurement data, it can be determined whether the dielectric loss and dielectric constant of the sample under test are consistent with those of the standard sample.

[0084] If continuous operation is required, change the sample and repeat the operation.

[0085] In summary, the system for measuring the loss consistency of microwave dielectric materials provided in this example effectively shields external electromagnetic interference and maintains the stability of the electromagnetic field distribution within the cavity through the closed structure design of the dielectric resonant cavity (upper and lower conductive plates and a semi-cylindrical dielectric block). Combined with a movable probe to dynamically adjust the coupling degree, it optimizes signal injection and reception efficiency, thereby significantly improving the accuracy of dielectric loss measurement. By calibrating with standard samples and comparing data with the test sample, it achieves consistency assessment of material batches or different locations of the same sample, solving the problems of low testing efficiency and difficulty in consistency assessment in traditional methods. The preheating mechanism and the standardized positioning design of the resonant cavity further reduce the impact of environmental temperature fluctuations and human error on the measurement, ensuring the reliability and repeatability of the test results. This solution systematically solves the core defects of existing technologies, such as low efficiency, insufficient accuracy, and environmental sensitivity.

[0086] Although embodiments of this application have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of this application, and such modifications and variations all fall within the scope defined by the appended claims.

Claims

1. A microwave dielectric material loss measuring device, characterized in that, The device includes a lower conductive plate, an upper conductive plate, two low-loss dielectric blocks, an input probe, a receiving probe, and a vector network analyzer; wherein... The upper surface of the lower conductive plate is provided with a positioning mark for placing the sample to be tested at its center. The low-loss dielectric blocks are symmetrically arranged on both sides of the sample to be tested. The upper conductive plate covers the two low-loss dielectric blocks and together with the lower conductive plate, forms a closed dielectric resonant cavity. The input probe and the receiving probe are respectively connected to the vector network analyzer, and the input probe and the receiving probe can move radially along the sample to be tested.

2. The apparatus according to claim 1, characterized in that, The surfaces of the lower and upper conductive plates are covered with a conductive layer, which is a silver-plated layer or a gold-plated layer.

3. The apparatus according to claim 2, characterized in that, The low-loss dielectric block is semi-cylindrical in shape, and the radius of curvature of the semi-cylindrical shape matches the edge of the sample to be tested.

4. The apparatus according to claim 3, characterized in that, The low-loss dielectric block is made of a ceramic material with a low dielectric constant.

5. The apparatus according to claim 4, characterized in that, The input probe and the receiving probe move radially along the sample to be tested via a slide rail mechanism, which includes a guide rail and a slider.

6. The apparatus according to claim 5, characterized in that, The input probe and the receiving probe are connected to the vector network analyzer via a coaxial cable.

7. The apparatus according to claim 6, characterized in that, The device also includes a temperature control module, the vector network analyzer is connected to the temperature control module, and the temperature control module is attached to the housing of the vector network analyzer via a heat-conducting sheet.

8. The apparatus according to claim 7, characterized in that, The vector network analyzer is connected to a temperature sensor, which is fixed at the positioning mark on the lower conductive plate and connected to the input terminal of the vector network analyzer via a data cable.

9. The apparatus according to claim 8, characterized in that, The positioning mark of the lower conductive plate is a groove structure, and the size of the groove is adapted to the shape of the sample to be tested.

10. The apparatus according to any one of claims 1 to 9, characterized in that, The device also includes a clamping mechanism comprising a spring clamp and a positioning pin for fixing the position of the low-loss dielectric block and the conductive plate when changing samples.

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