High-voltage device for testing and power module testing equipment
By designing a high-voltage testing device, flexible switching of voltage modes was achieved, solving the problem that traditional high-voltage distribution boxes could not simultaneously test two-level and three-level modules, thus improving testing efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN YUANLICHUANG TECH CO LTD
- Filing Date
- 2025-05-27
- Publication Date
- 2026-04-28
AI Technical Summary
Traditional high-voltage distribution boxes can only test two-level modules. Switching to test three-level modules requires replacing the entire high-voltage distribution box, which is cumbersome and reduces testing efficiency.
Design a high-voltage testing device that accepts a two-level voltage through the first and third input modules, and a three-level voltage through the first, second, and third input modules. Detect the voltage using a voltage detection module and discharge the voltage using a discharge module, thus achieving flexible voltage switching.
It simplifies the voltage mode switching process, improves testing efficiency, and makes operation simple and quick to meet different testing needs.
Smart Images

Figure CN224176608U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of semiconductor testing technology, and in particular to a high-voltage testing device and a power module testing equipment. Background Technology
[0002] When performing high-voltage testing on power modules, it is necessary to switch the voltage supplied to the power modules to either a three-level or two-level mode to meet actual testing requirements. Traditional high-voltage distribution boxes can only provide power for testing two-level modules. If switching to testing three-level modules is required, the high-voltage distribution box needs to be replaced, which is cumbersome in practice and reduces testing efficiency. Utility Model Content
[0003] Therefore, it is necessary to provide a high-voltage testing device and power module testing equipment that can improve testing efficiency to address the above problems.
[0004] The first aspect of this application provides a high-voltage testing device, comprising:
[0005] The first input module is connected to the positive output terminal of the first high-voltage power supply;
[0006] The second input module is connected to the negative output terminal of the first high-voltage power supply and the positive output terminal of the second high-voltage power supply.
[0007] The third input module is connected to the negative output terminal of the second high-voltage power supply;
[0008] The first output module is connected to the first input module and the device under test.
[0009] The second output module is connected to the second input module and the device under test.
[0010] The third output module connects the third input module and the device under test.
[0011] When the second input module is disconnected, a two-level voltage for testing is connected through the first input module and the third input module, and then transmitted to the device under test through the first output module and the third output module; when the second input module is closed, a three-level voltage for testing is connected through the first input module, the second input module and the third input module, and then transmitted to the device under test through the first output module, the second output module and the third output module.
[0012] In one embodiment, the first input module includes a connector X201, a high-voltage positive contactor, a high-voltage precharge contactor, and a resistor R1; the first end of the high-voltage positive contactor is connected to the positive output terminal of the first high-voltage power supply through the connector X201, and the second end of the high-voltage positive contactor is connected to the first output module; the high-voltage precharge contactor and the resistor R1 are connected in series and then in parallel with the high-voltage positive contactor;
[0013] The second input module includes connector X205, a three-level high-voltage positive contactor, a three-level high-voltage pre-charge contactor, and resistor R2; the first end of the three-level high-voltage positive contactor is connected to the negative output terminal of the first high-voltage power supply and the positive output terminal of the second high-voltage power supply through connector X205, and the second end of the three-level high-voltage positive contactor is connected to the second output module; the three-level high-voltage pre-charge contactor and the resistor R2 are connected in series and then in parallel with the three-level high-voltage positive contactor;
[0014] The third input module includes a connector X209 and a high-voltage negative contactor; the first end of the high-voltage negative contactor is connected to the negative output terminal of the second high-voltage power supply through the connector X209, and the second end of the high-voltage negative contactor is connected to the third output module.
[0015] In one embodiment, the high-voltage testing device further includes a voltage detection module, which is connected to the first output module, the second output module, the third output module and the host computer, to detect the transmitted two-level voltage or three-level voltage and output the acquired voltage to the host computer.
[0016] In one embodiment, the voltage detection module includes a first voltage transmitter, a second voltage transmitter, and a third voltage transmitter. The first voltage transmitter is connected to the host computer, the first output module, and the third output module. The second voltage transmitter is connected to the host computer, the first output module, and the second output module. The third voltage transmitter is connected to the host computer, the second output module, and the third output module.
[0017] In one embodiment, the high-voltage testing device further includes:
[0018] The first discharge module is connected to the first output module and the second output module. After the test is completed on the device under test, it is turned on to discharge voltage.
[0019] The second discharge module is connected to the second output module and the third output module. After the device under test is tested, it is turned on to discharge voltage.
[0020] In one embodiment, the first discharge module includes a discharge contactor K6 and a resistor R5 connected in series; and / or, the second discharge module includes a discharge contactor K7 and a resistor R6 connected in series.
[0021] In one embodiment, the high-voltage testing device further includes resistors R3 and R4; a first end of resistor R3 is connected to a common terminal of the first input module and the first output module, and a second end of resistor R3 is connected to a common terminal of the second input module and the second output module; a first end of resistor R4 is connected to a common terminal of the second input module and the second output module, and a second end of resistor R4 is connected to a common terminal of the third input module and the third output module.
[0022] In one embodiment, the first output module includes a fuse FU1, a connector X202, a connector X203, and a connector X204. The first end of the fuse FU1 is connected to the first input module through the connector X202, and the second end of the fuse FU1 is connected to the connector X204 through the connector X203. The connector X204 is connected to the device under test.
[0023] The second output module includes a fuse FU2, a connector X206, a connector X207, and a connector X208. The first end of the fuse FU2 is connected to the second input module through the connector X206, and the second end of the fuse FU2 is connected to the connector X208 through the connector X207. The connector X208 is connected to the device under test.
[0024] The third output module includes a connector X210, which connects the third input module and the device under test.
[0025] In one embodiment, the high-voltage test device further includes a housing and a heat dissipation device. The first input module, the second input module, the third input module and the heat dissipation device are disposed in the housing, each connector is disposed on the housing, and the fuse FU1 and the fuse FU2 are disposed outside the housing.
[0026] In one embodiment, the high-voltage test device further includes a pluggable connector, wherein when the connector X208 is inserted into the pluggable connector, the three-level high-voltage precharge contactor in the second input module is engaged, and when the connector X208 is removed from the pluggable connector, the three-level high-voltage precharge contactor in the second input module is disengaged.
[0027] In one embodiment, the high-voltage testing device further includes a copper busbar. The first end of the high-voltage positive contactor in the first input module is connected to connector X201 via the copper busbar, and the second end of the high-voltage positive contactor is connected to connector X202 via the copper busbar. The first end of the three-level high-voltage positive contactor in the second input module is connected to connector X205 via the copper busbar, and the second end of the three-level high-voltage positive contactor is connected to connector X206 via the copper busbar. The first end of the high-voltage negative contactor in the third input module is connected to connector X209 via the copper busbar, and the second end of the high-voltage negative contactor is connected to connector X210. Connector X203 is connected to connector X204 via the copper busbar, and connector X207 is connected to connector X208 via the copper busbar.
[0028] A second aspect of this application provides a power module testing device, including a host computer, a first high-voltage power supply, a second high-voltage power supply, and the aforementioned high-voltage testing device, wherein the high-voltage testing device is connected to the power module.
[0029] The aforementioned high-voltage device and power module testing equipment allows for the following configuration: When the second input module is open, a two-level voltage for testing is supplied through the first and third input modules, and then transmitted to the device under test (DUT) via the first and third output modules. When the second input module is closed, a three-level voltage for testing is supplied through the first, second, and third input modules, and then transmitted to the DUT via the first, second, and third output modules. By controlling the on / off state of the second input module, the supply of either a two-level or three-level voltage from the high-voltage device to the DUT can be adjusted, meeting different testing requirements. This method is simple, quick, and improves testing efficiency. Attached Figure Description
[0030] Figure 1 This is a structural block diagram of a high-voltage test device in one embodiment;
[0031] Figure 2 and Figure 3 This is a schematic diagram of the high-voltage device used for testing in one embodiment;
[0032] Figure 4 This is a schematic diagram of the device layout on the housing in one embodiment;
[0033] Figure 5 This is a schematic diagram of the structure of the box in one embodiment;
[0034] Figure 6 This is a schematic diagram of the structure inside the box in one embodiment. Detailed Implementation
[0035] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.
[0036] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the specification of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of this application.
[0037] It is understood that the term "connection" in the following embodiments should be understood as "electrical connection," "communication connection," etc., if the connected circuits, modules, units, etc., have electrical signal or data transmission with each other.
[0038] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising,” “including,” or “having,” etc., specify the presence of the stated feature, whole, operation, component, part, or combination thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, operations, components, parts, or combinations thereof.
[0039] In one embodiment, such as Figure 1 As shown, a high-voltage testing device is provided, including a first input module 110, a second input module 120, a third input module 130, a first output module 140, a second output module 150, and a third output module 160. The first input module 110 is connected to the positive output terminal of a first high-voltage power supply, the second input module 120 is connected to the negative output terminal of the first high-voltage power supply and the positive output terminal of a second high-voltage power supply, and the third input module 130 is connected to the negative output terminal of the second high-voltage power supply. The first output module 140 is connected to the first input module 110 and the device under test (DUT), the second output module 150 is connected to the second input module 120 and the DUT, and the third output module 160 is connected to the third input module 130 and the DUT. When the second input module 120 is disconnected, a two-level voltage for testing is connected through the first input module 110 and the third input module 130, and then transmitted to the device under test through the first output module 140 and the third output module 160; when the second input module 120 is closed, a three-level voltage for testing is connected through the first input module 110, the second input module 120 and the third input module 130, and then transmitted to the device under test through the first output module 140, the second output module 150 and the third output module 160.
[0040] The output voltage amplitudes of the first and second high-voltage power supplies are not unique and can be set according to the testing requirements of the device under test (DUT). The DUT can be a power module such as an IGBT switch, or other electronic devices requiring high-voltage testing. By controlling the on / off state of the second input module 120, the voltage supplied to the DUT by the high-voltage testing device can be adjusted to be either a two-level or a three-level voltage, meeting different testing requirements of the DUT. The operation is simple and quick. The first input module 110 and the second input module 120 can be configured as a single-switch channel, directly outputting high voltage to the DUT for testing; or they can be configured as dual-switch channels, such as including a main switch channel and a current-limiting switch channel. First, the current-limiting switch channel is controlled to conduct for voltage detection. After the voltage detection is passed, the main switch channel is then turned on to output high voltage to the DUT for testing.
[0041] In one embodiment, such as Figure 2 As shown, the first input module includes a connector X201, a high-voltage positive contactor K1, a high-voltage pre-charge contactor K4, and a resistor R1. The first end of the high-voltage positive contactor K1 is connected to the positive output terminal of the first high-voltage power supply via connector X201, and the second end of the high-voltage positive contactor K1 is connected to the first output module 140. The high-voltage pre-charge contactor K4 and the resistor R1 are connected in series and then in parallel with the high-voltage positive contactor K1. Specifically, after the high-voltage pre-charge contactor K4 and the resistor R1 are connected in series, the other end of the high-voltage pre-charge contactor K4 is connected to the first end of the high-voltage positive contactor K1, and the other end of the resistor R1 is connected to the second end of the high-voltage positive contactor K1.
[0042] The second input module 120 includes a connector X205, a three-level high-voltage positive contactor K2, a three-level high-voltage pre-charge contactor K5, and a resistor R2. The first end of the three-level high-voltage positive contactor K2 is connected to the negative output terminal of the first high-voltage power supply and the positive output terminal of the second high-voltage power supply via connector X205, and the second end of the three-level high-voltage positive contactor K2 is connected to the second output module 150. The three-level high-voltage pre-charge contactor K5 and the resistor R2 are connected in series and then connected in parallel with the three-level high-voltage positive contactor K2. Specifically, after the three-level high-voltage pre-charge contactor K5 and the resistor R2 are connected in series, the other end of the three-level high-voltage pre-charge contactor K5 is connected to the first end of the three-level high-voltage positive contactor K2, and the other end of the resistor R2 is connected to the second end of the three-level high-voltage positive contactor K2.
[0043] The third input module 130 includes a connector X209 and a high-voltage negative contactor K3; the first end of the high-voltage negative contactor K3 is connected to the output negative terminal of the second high-voltage power supply through the connector X209, and the second end of the high-voltage negative contactor K3 is connected to the third output module 160.
[0044] When the high-voltage negative contactor K3 is closed and the high-voltage precharge contactor K4 / three-level high-voltage precharge contactor K5 is closed, voltage detection can be performed after current limiting by resistor R1 / resistor R2. When the voltage meets the requirements, the high-voltage precharge contactor K4 / three-level high-voltage precharge contactor K5 is opened, and the high-voltage positive contactor K1 / three-level high-voltage positive contactor K2 is closed, outputting high voltage to the device under test for testing.
[0045] In one embodiment, continue to refer to Figure 2 The first output module 140 includes a fuse FU1, a connector X202, a connector X203, and a connector X204. The first end of the fuse FU1 is connected to the first input module 110 through the connector X202, specifically to the second end of the high-voltage positive contactor K1. The second end of the fuse FU1 is connected to the connector X204 through the connector X203. The connector X204 is connected to the device under test.
[0046] The second output module 150 includes a fuse FU2, connector X206, connector X207, and connector X208. The first end of the fuse FU2 is connected to the second input module 120 through connector X206, specifically to the second end of the three-level high-voltage positive contactor K2. The second end of the fuse FU2 is connected to connector X208 through connector X207, and connector X208 is connected to the device under test.
[0047] The third output module 160 includes connector X210. The first end of connector X210 is connected to the third input module 130, specifically to the second end of the high-voltage negative contactor K3 in the third input module 130. The second end of connector X210 is connected to the device under test. By setting connectors X202, X203, X206, and X207, it is convenient to install and replace fuses FU1 and FU2.
[0048] Furthermore, the high-voltage testing device also includes a voltage detection module. This module connects to the first output module 140, the second output module 150, the third output module 160, and the host computer. It detects the transmitted two-level or three-level voltage and outputs the acquired voltage to the host computer. For example... Figure 2 and Figure 3 As shown, the voltage detection module may include a first voltage transmitter T1, a second voltage transmitter T2, and a third voltage transmitter T3. The first voltage transmitter T1 is connected to the host computer, the first output module 140, and the third output module 160. The second voltage transmitter T2 is connected to the host computer, the first output module 140, and the second output module 150. The third voltage transmitter T3 is connected to the host computer, the second output module 150, and the third output module 160.
[0049] Specifically, the female connector X200 connects to pins 15 and 16 of the first voltage transmitter T1, the second voltage transmitter T2, and the third voltage transmitter T3, supplying external voltage to these transmitters for power. Pins 1 and 4 of the first voltage transmitter T1 are connected to the second terminal of fuse FU1 and the first terminal of connector X210, respectively, for voltage sampling. Pins 9 and 10 of the first voltage transmitter T1 are connected to the host computer via the female connector X200, uploading the sampled voltage to the host computer. Pins 1 and 4 of the second voltage transmitter T2 are connected to the second terminal of fuse FU1 and the first terminal of fuse FU2, respectively, for voltage sampling. Pins 9 and 10 of the second voltage transmitter T2 are connected to the host computer via the female connector X200, uploading the sampled voltage to the host computer. Pins 1 and 4 of the third voltage transmitter T3 are connected to the second end of fuse FU2 and the first end of connector X210 respectively for voltage sampling. Pins 9 and 10 of the third voltage transmitter T3 are connected to the host computer through the female connector X200 to upload the sampled voltage to the host computer.
[0050] In one embodiment, such as Figure 2 As shown, the high-voltage testing device also includes a first discharge module 170 and a second discharge module 180. The first discharge module 170 is connected to the first output module 140 and the second output module 150, and is turned on to discharge voltage after the device under test is tested. The second discharge module 180 is connected to the second output module 150 and the third output module 160, and is turned on to discharge voltage after the device under test is tested. Specifically, the first discharge module 170 may include a discharge contactor K6 and a resistor R5 connected in series. The other end of the discharge contactor K6 is connected to connector X202, and the other end of the resistor R5 is connected to connector X206. Further, the second discharge module 180 may include a discharge contactor K7 and a resistor R6 connected in series. The other end of the discharge contactor K7 is connected to connector X206, and the other end of the resistor R6 is connected to connector X210.
[0051] In addition, the high-voltage testing device also includes resistors R3 and R4. The first end of resistor R3 is connected to the common terminal of the first input module 110 and the first output module 140, specifically connected to the second terminal of the high-voltage positive contactor K1 and connector X202. The second end of resistor R3 is connected to the common terminal of the second input module 120 and the second output module 150, specifically connected to the second terminal of the three-level high-voltage positive contactor K2 and connector X206. The first end of resistor R4 is connected to the common terminal of the second input module 120 and the second output module 150, specifically connected to the second terminal of the three-level high-voltage positive contactor K2 and connector X206. The second end of resistor R4 is connected to the common terminal of the third input module 130 and the third output module 160, specifically connected to the second terminal of the high-voltage negative contactor K3 and connector X210.
[0052] In one embodiment, the high-voltage testing device further includes a housing and a heat dissipation device. The first input module 110, the second input module 120, the third input module 140, and the heat dissipation device are disposed inside the housing. Each connector is disposed on the housing, while fuses FU1 and FU2 are disposed outside the housing for easy installation and replacement. Furthermore, the voltage detection module, resistors R3 and R4, the first discharge module 170, and the second discharge module 180 are all disposed inside the housing, and the female connector X200 is also disposed on the housing.
[0053] like Figure 2 As shown, the heat dissipation device may include fan M1 and fan M2. Fans M1 and M2 are connected to female connector X200. External voltage can be supplied to fans M1 and M2 via female connector X200, or commands from a host computer can be sent to fans M1 and M2 to control their activation for heat dissipation. Figure 4 As shown, the female connector X200 and connectors X201 to X210 are all located on the same side panel of the enclosure. Connectors X201 to X208 can be designed to be the same color (e.g., red), and connectors X209 and X210 can be designed to be the same color (e.g., black) to facilitate wiring operations.
[0054] In one embodiment, such as Figure 5 As shown, the high-voltage test device also includes a pluggable connector 190. When connector X208 is inserted into pluggable connector 190, the three-level high-voltage pre-charge contactor K5 in the second input module 120 is engaged; when connector X208 is removed from pluggable connector 190, the three-level high-voltage pre-charge contactor K5 in the second input module 120 is disengaged. By changing whether pluggable connector 190 is configured, compatibility testing of two-level and three-level IGBTs can be achieved.
[0055] In one embodiment, the high-voltage testing device further includes a copper busbar for transmitting high voltage and high current during testing, ensuring test stability. Specifically, as shown... Figure 6 As shown, in the first input module 110, the first end of the high-voltage positive contactor K1 is connected to connector X201 via a copper busbar, and the second end of the high-voltage positive contactor K1 is connected to connector X202 via a copper busbar. In the second input module 120, the first end of the three-level high-voltage positive contactor K2 is connected to connector X205 via a copper busbar, and the second end of the three-level high-voltage positive contactor K2 is connected to connector X206 via a copper busbar. In the third input module 130, the first end of the high-voltage negative contactor K3 is connected to connector X209 via a copper busbar, and the second end of the high-voltage negative contactor K3 is connected to connector X210. Furthermore, connector X203 is also connected to connector X204 via a copper busbar, and connector X207 is also connected to connector X208 via a copper busbar.
[0056] Specifically, the working process of the aforementioned high-voltage testing device is as follows:
[0057] Two-level signal:
[0058] 1. The host computer disconnects the three-level high-voltage positive contactor K2 and the three-level high-voltage pre-charge contactor K5, controls the high-voltage negative contactor K3 to close, and the high-voltage pre-charge contactor K4 to close.
[0059] 2. The host computer communicates directly with the first and second high-voltage power supplies, controlling their output voltages. At this time, the current output from connectors X204 and X210 to the device under test is small and is not tested. The host computer compares the voltage values returned by the first and second high-voltage power supplies with the value collected by the first voltage transmitter T1. If the values are within the correct range (e.g., the difference between the collected value and the sum of the output voltage values of the two high-voltage power supplies is within the set range), the high-voltage pre-charge contactor K4 is disconnected, and the high-voltage positive contactor K1 is engaged. Connectors X204 and X210 output high voltage and a large current to apply voltage to the device under test, initiating the test process.
[0060] 3. Upon completion of the test, the host computer disconnects the high-voltage positive contactor K1 and the high-voltage negative contactor K3, and engages the discharge contactors K6 and K7. After confirming that the voltage has been discharged to a safe range, the host computer disconnects the discharge contactors K6 and K7.
[0061] Three-level:
[0062] 1. Insert the pluggable connector to engage the three-level high-voltage pre-charge contactor K5, and the host computer will control the high-voltage pre-charge contactor K4 and the high-voltage negative contactor K3 to engage.
[0063] 2. The host computer controls the output voltage of the first and second high-voltage power supplies, compares the voltage values returned by the first and second high-voltage power supplies with the values collected by the second voltage transmitter T2 and the third voltage transmitter T3. If the values are within the correct range (for example, the difference between the collected value and the corresponding high-voltage power supply output voltage value is within the set range), then the three-level high-voltage precharge contactor K5 and high-voltage precharge contactor K4 are disconnected, and the high-voltage positive contactor K1 and three-level high-voltage positive contactor K2 are engaged. Connectors X204, X208 and X210 output high voltage and high current to the power module to apply voltage, and the test process begins.
[0064] 3. Upon completion of the test, the host computer disconnects the high-voltage positive contactor K1, the high-voltage negative contactor K3, and the three-level high-voltage positive contactor K2, and engages the discharge contactors K6 and K7. After verifying that the voltage has been discharged to a safe range, the discharge contactors K6 and K7 are disconnected.
[0065] In one embodiment, a power module testing device is also provided, including a host computer, a first high-voltage power supply, a second high-voltage power supply, and the aforementioned high-voltage testing device, wherein the high-voltage testing device is connected to the power module. The power module may be an IGBT switch, and the host computer may be, but is not limited to, various personal computers, laptops, smartphones, tablets, and portable wearable devices, such as smartwatches, smart bracelets, and head-mounted devices.
[0066] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0067] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. A high-voltage testing device, characterized in that, include: The first input module is connected to the positive output terminal of the first high-voltage power supply; The second input module is connected to the negative output terminal of the first high-voltage power supply and the positive output terminal of the second high-voltage power supply. The third input module is connected to the negative output terminal of the second high-voltage power supply; The first output module is connected to the first input module and the device under test. The second output module is connected to the second input module and the device under test. The third output module connects the third input module and the device under test. When the second input module is disconnected, a two-level voltage for testing is connected through the first input module and the third input module, and then transmitted to the device under test through the first output module and the third output module; when the second input module is closed, a three-level voltage for testing is connected through the first input module, the second input module and the third input module, and then transmitted to the device under test through the first output module, the second output module and the third output module.
2. The high-voltage testing device according to claim 1, characterized in that, The first input module includes a connector X201, a high-voltage positive contactor, a high-voltage pre-charge contactor, and a resistor R1; the first end of the high-voltage positive contactor is connected to the positive output terminal of the first high-voltage power supply through the connector X201, and the second end of the high-voltage positive contactor is connected to the first output module; the high-voltage pre-charge contactor and the resistor R1 are connected in series and then in parallel with the high-voltage positive contactor; The second input module includes connector X205, a three-level high-voltage positive contactor, a three-level high-voltage pre-charge contactor, and resistor R2; the first end of the three-level high-voltage positive contactor is connected to the negative output terminal of the first high-voltage power supply and the positive output terminal of the second high-voltage power supply through connector X205, and the second end of the three-level high-voltage positive contactor is connected to the second output module; the three-level high-voltage pre-charge contactor and the resistor R2 are connected in series and then in parallel with the three-level high-voltage positive contactor; The third input module includes a connector X209 and a high-voltage negative contactor; the first end of the high-voltage negative contactor is connected to the negative output terminal of the second high-voltage power supply through the connector X209, and the second end of the high-voltage negative contactor is connected to the third output module.
3. The high-voltage testing device according to claim 1, characterized in that, The high-voltage testing device also includes a voltage detection module, which is connected to the first output module, the second output module, the third output module and the host computer. The voltage detection module detects the transmitted two-level voltage or three-level voltage and outputs the acquired voltage to the host computer.
4. The high-voltage testing device according to claim 3, characterized in that, The voltage detection module includes a first voltage transmitter, a second voltage transmitter, and a third voltage transmitter. The first voltage transmitter is connected to the host computer, the first output module, and the third output module. The second voltage transmitter is connected to the host computer, the first output module, and the second output module. The third voltage transmitter is connected to the host computer, the second output module, and the third output module.
5. The high-voltage testing device according to claim 1, characterized in that, The high-voltage testing equipment also includes: The first discharge module is connected to the first output module and the second output module. After the test is completed on the device under test, it is turned on to discharge voltage. The second discharge module is connected to the second output module and the third output module. After the device under test is tested, it is turned on to discharge voltage.
6. The high-voltage testing device according to claim 5, characterized in that, The first discharge module includes a discharge contactor K6 and a resistor R5 connected in series; and / or, the second discharge module includes a discharge contactor K7 and a resistor R6 connected in series.
7. The high-voltage testing device according to any one of claims 1-6, characterized in that, The high-voltage testing device also includes resistors R3 and R4; the first end of resistor R3 is connected to the common terminal of the first input module and the first output module, and the second end of resistor R3 is connected to the common terminal of the second input module and the second output module; the first end of resistor R4 is connected to the common terminal of the second input module and the second output module, and the second end of resistor R4 is connected to the common terminal of the third input module and the third output module.
8. The high-voltage testing device according to any one of claims 1-6, characterized in that, The first output module includes a fuse FU1, a connector X202, a connector X203, and a connector X204. The first end of the fuse FU1 is connected to the first input module through the connector X202, and the second end of the fuse FU1 is connected to the connector X204 through the connector X203. The connector X204 is connected to the device under test. The second output module includes a fuse FU2, a connector X206, a connector X207, and a connector X208. The first end of the fuse FU2 is connected to the second input module through the connector X206, and the second end of the fuse FU2 is connected to the connector X208 through the connector X207. The connector X208 is connected to the device under test. The third output module includes a connector X210, which connects the third input module and the device under test.
9. The high-voltage testing device according to claim 8, characterized in that, The high-voltage testing device also includes a housing and a heat dissipation device. The first input module, the second input module, the third input module and the heat dissipation device are disposed inside the housing, each connector is disposed on the housing, and the fuse FU1 and the fuse FU2 are disposed outside the housing.
10. The high-voltage testing device according to claim 8, characterized in that, The high-voltage testing device also includes a pluggable connector. When the connector X208 is inserted into the pluggable connector, the three-level high-voltage precharge contactor in the second input module is engaged. When the connector X208 is pulled out of the pluggable connector, the three-level high-voltage precharge contactor in the second input module is disengaged.
11. The high-voltage testing device according to claim 8, characterized in that, It also includes copper busbars. In the first input module, the first end of the high-voltage positive contactor is connected to connector X201 via a copper busbar, and the second end of the high-voltage positive contactor is connected to connector X202 via a copper busbar. In the second input module, the first end of the three-level high-voltage positive contactor is connected to connector X205 via a copper busbar, and the second end of the three-level high-voltage positive contactor is connected to connector X206 via a copper busbar. In the third input module, the first end of the high-voltage negative contactor is connected to connector X209 via a copper busbar, and the second end of the high-voltage negative contactor is connected to connector X210. Connector X203 is connected to connector X204 via a copper busbar, and connector X207 is connected to connector X208 via a copper busbar.
12. A power module testing device, characterized in that, It includes a host computer, a first high-voltage power supply, a second high-voltage power supply, and a high-voltage testing device as described in any one of claims 1 to 11, wherein the high-voltage testing device is connected to a power module.