IGBT (Insulated Gate Bipolar Translator) driver test positioning table

Abstract

The utility model provides an IGBT driver test positioning table, and relates to the technical field of IGBT driver test. The supporting assembly has a detection area. The detection assembly is located on one side of the detection area. The storage box is fixed to the supporting assembly, the IGBT drivers are borne by the placement vehicles, the multiple placement vehicles are stacked in the storage box in the first direction, the first direction is parallel to the gravity direction, the storage box is provided with an opening, and the push rod can apply force to the placement vehicle located at the bottom in the gravity direction so that the placement vehicle located at the bottom in the gravity direction can be moved out through the opening; the conveying mechanism is arranged on the supporting assembly, the IGBT driver, moved out of the storage box, on the containing vehicle can be transferred to the conveying mechanism, and the conveying mechanism can convey the IGBT driver to a detection area. The utility model can solve the problems that the manual carrying efficiency is lower, the manual placing accuracy is poorer, the adjustment of workers is needed, and the detection efficiency is reduced.

Description

Technical Field

[0001] This application relates to the field of IGBT driver testing technology, and in particular to an IGBT driver testing positioning platform. Background Technology

[0002] An IGBT (Insulated-Gate Bipolar Transistor) is an electronic device used to drive an Insulated-Gate Bipolar Transistor (IGBT). The main function of an IGBT driver is to amplify and process the control signal to generate appropriate voltage and current signals to control the IGBT's on and off states, enabling the IGBT to operate stably and efficiently. IGBT drivers are widely used in new energy power generation, locomotive traction, and power grid transmission.

[0003] After manufacturing, IGBT drivers require comprehensive testing by staff to prevent malfunctions during use. First, staff inspect the IGBT driver for visible physical damage such as burns, and check for any loose parts or poor contact. Then, a comprehensive testing process is performed using a diagnostic instrument.

[0004] The testing process for IGBT drivers using a comprehensive test platform is quite cumbersome. Workers take one IGBT driver to the platform for testing, and then move on to the next. However, manually moving IGBT drivers is inefficient, and the accuracy of driver placement is poor, requiring adjustments and further reducing testing efficiency. Utility Model Content

[0005] In view of this, this application provides an IGBT driver test positioning platform to solve the problems of low efficiency in manually handling IGBT drivers and poor accuracy in the position of IGBT drivers when placed manually by staff, which requires staff to make adjustments and reduces testing efficiency.

[0006] This application provides an IGBT driver test positioning stage, which includes a support component, a storage component, a detection component, and a transmission mechanism. The support component has a detection area, and the detection component is fixed on the support component and located on one side of the detection area.

[0007] The storage assembly includes a storage box, a push rod, and multiple placement carts. The storage box is fixed to the support assembly. The placement carts are used to carry IGBT drivers. The multiple placement carts are stacked in the storage box along a first direction, which is parallel to the direction of gravity. The storage box has an opening. The push rod can apply force to the placement cart located at the bottom in the direction of gravity, so that the placement cart located at the bottom in the direction of gravity moves out through the opening.

[0008] The conveying mechanism is mounted on the support assembly, with one end of the conveying mechanism facing the opening and the other end facing the detection area. The placement vehicle, which is removed from the storage box, can transfer the IGBT driver it carries onto the conveying mechanism, and the conveying mechanism can transport the IGBT driver to the detection area.

[0009] Preferably, the storage box has a sliding groove on one side in the second direction, the sliding groove extends along the third direction, a portion of the push rod extends into the storage box through the sliding groove and abuts against the placement vehicle located at the bottom in the gravity direction, the push rod can slide in the sliding groove along the third direction, the first direction, the second direction and the third direction are perpendicular to each other.

[0010] Preferably, the storage assembly further includes a push-pull member slidably connected to the storage box so that the push-pull member can move relative to the storage box in the second direction, and the push-pull member can support a second placement vehicle in the opposite direction of the gravity direction.

[0011] Preferably, the IGBT driver test positioning platform further includes a recycling box and a guide plate, the support component has a drop groove, the recycling box is connected to the drop groove, and the drop groove is located between the storage component and the conveying mechanism;

[0012] The guide plate is fixed to the wall of the drop trough, the guide plate extends above the drop trough, and a portion of the guide plate can extend between the placement vehicle and the IGBT driver.

[0013] Preferably, the storage assembly further includes a first mounting plate and a second mounting plate, the second mounting plate being connected to the first mounting plate on the side facing the conveying mechanism in the second direction, and the storage box being fixed on the first mounting plate;

[0014] The first mounting plate points in the direction of the second mounting plate, and the second mounting plate is tapered in size in the first direction.

[0015] Preferably, the placement vehicle includes a mounting frame and multiple wheels, all of which are fixed to the mounting frame, which is used to engage with the IGBT driver.

[0016] Preferably, for two adjacent placement vehicles among the plurality of placement vehicles, the plurality of wheels in one placement vehicle correspond one-to-one with the plurality of wheels in the other placement vehicle, the wheels in one placement vehicle form a limiting groove, and the portion of the corresponding wheel in the other placement vehicle is located within the limiting groove.

[0017] Preferably, the IGBT driver test positioning stage further includes a driving component, the detection component includes a multimeter, the driving component is fixed on the support component, the multimeter is connected to the driving component, and the driving component can drive the multimeter to move along the third direction so that the multimeter can move above the detection area.

[0018] Preferably, the mounting frame includes a support surface for supporting the IGBT driver, and the mounting frame has an extension groove that is recessed from the support surface toward the interior of the mounting frame, and a portion of the guide plate can extend into the extension groove.

[0019] Preferably, the IGBT driver test positioning stage further includes a guide frame and a guide roller. The guide frame is mounted on the support assembly and is located on one side of the conveying mechanism. The guide roller is located on the side of the guide frame facing the conveying mechanism and is rotatable relative to the guide frame.

[0020] During the use of the IGBT driver test positioning platform of this application, a push rod can apply force to the placement cart located at the bottom in the first direction, causing the placement cart at the bottom in the first direction to move out through the opening. The placement cart removed from the storage box can transfer the IGBT driver it carries to the conveyor mechanism, which can then transport the IGBT driver to the testing area for testing. Thus, by using a conveyor belt and placement cart in conjunction to move the IGBT driver to the testing area, the handling efficiency of the IGBT driver is improved. Furthermore, compared to manual placement of the IGBT driver by personnel, the conveyor mechanism can transport the IGBT driver to the testing area, improving the accuracy of IGBT driver placement and thus increasing testing efficiency. Attached Figure Description

[0021] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 A three-dimensional structural diagram of the IGBT driver test positioning stage is shown from one perspective.

[0023] Figure 2 Show Figure 1 Enlarged view of section A;

[0024] Figure 3 A three-dimensional structural diagram of the IGBT driver test positioning platform is shown from another perspective.

[0025] Figure 4 A three-dimensional structural diagram of the storage component is shown from one perspective;

[0026] Figure 5 A three-dimensional structural diagram of the storage component is shown from another perspective;

[0027] Figure 6 A partial structural diagram of the storage component is shown;

[0028] Figure 7 The diagram shows the relative positions of the two vehicles.

[0029] Figure 8 The diagram shows the relative positions of the guide plate and the drop trough.

[0030] Icons: 1-Support component; 11-Positioning platform; 12-Support base; 13-Groove; 14-Drop groove; 2-Storage component; 21-Storage box; 211-Main body; 212-Door; 213-Opening; 214-Sliding groove; 22-Push rod; 23-Placing cart; 231-Mounting frame; 232-Wheel; 233-Extension groove; 234-Abutting block; 235-Supporting surface; 24-First mounting plate; 241-First slide rail; 25-Second mounting plate; 251-Second slide rail; 26-Push-pull component; 261-Connection 262-Push-pull section; 27-Reset spring; 28-Lifting component; 281-Lifting rod; 282-Connecting rod; 283-Supporting rod; 31-Multimeter; 32-Detector; 4-Transfer mechanism; 41-First transfer section; 42-Second transfer section; 5-Recycling box; 61-Guide frame; 62-Guide roller; 63-Fixed frame; 64-Driver; 71-Qualified product collection box; 72-Unqualified product collection box; 8-Guide plate; 9-IGBT driver; L1-First direction; L2-Second direction; L3-Third direction. Detailed Implementation

[0031] The following detailed embodiments are provided to help the reader gain a comprehensive understanding of the methods, apparatus, and / or systems described herein. However, various changes, modifications, and equivalents of the methods, apparatus, and / or systems described herein will be apparent after understanding the disclosure of this application. For example, the order of operations described herein is merely illustrative and is not limited to the order set forth herein; changes that will be apparent after understanding the disclosure of this application are possible, except for operations that must occur in a specific order. Furthermore, for clarity and brevity, descriptions of features known in the art may be omitted.

[0032] The features described herein may be implemented in different forms and should not be construed as being limited to the examples described herein. Rather, the examples described herein have been provided merely to illustrate some of the many feasible ways of implementing the methods, apparatus, and / or systems described herein that will be apparent upon understanding the disclosure of this application.

[0033] Throughout the specification, when an element (such as a layer, region, or substrate) is described as being "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, it may be directly "on" another element, "connected to" another element, "bonded to" another element, "on" another element, or "covering" another element, or there may be one or more other elements in between. In contrast, when an element is described as being "directly on" another element, "directly connected to" another element, "directly bonded to" another element, "directly on" another element, or "directly covering" another element, there may be no other elements in between.

[0034] As used herein, the term “and / or” includes any one of the relevant items listed and any combination of any two or more items.

[0035] Although terms such as “first,” “second,” and “third” may be used herein to describe individual components, assemblies, regions, layers, or parts, these components, assemblies, regions, layers, or parts are not limited by these terms. Rather, these terms are used only to distinguish one component, assembly, region, layer, or part from another. Therefore, without departing from the teachings of the examples described herein, the first component, assembly, region, layer, or part referred to as the second component, assembly, region, layer, or part may also be referred to as the second component, assembly, region, layer, or part.

[0036] For ease of description, spatial relation terms such as “above,” “upper,” “below,” and “lower” are used herein to describe the relationship between one element and another, as shown in the accompanying drawings. Such spatial relation terms are intended to include not only the orientation depicted in the drawings but also different orientations of the device during use or operation. For example, if the device in the drawings is flipped, an element described as being “above” or “upper” relative to another element will subsequently be “below” or “lower” relative to that other element. Therefore, the term “above” includes both “above” and “below” orientations depending on the spatial orientation of the device. The device may also be positioned in other ways (e.g., rotated 90 degrees or in other orientations), and the spatial relation terms used herein will be interpreted accordingly.

[0037] The terminology used herein is for the purpose of describing various examples only and is not intended to limit this disclosure. Unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. The terms “comprising,” “including,” and “having” enumerate the stated features, quantities, operations, components, elements, and / or combinations thereof, but do not exclude the presence or addition of one or more other features, quantities, operations, components, elements, and / or combinations thereof.

[0038] Variations in the shapes shown in the accompanying drawings may occur due to manufacturing techniques and / or tolerances. Therefore, the examples described herein are not limited to the specific shapes shown in the accompanying drawings, but include changes in shape that may occur during manufacturing.

[0039] The features of the examples described herein can be combined in various ways that will be apparent upon understanding the disclosure of this application. Furthermore, although the examples described herein have a wide variety of constructions, other constructions are possible, as will be apparent upon understanding the disclosure of this application.

[0040] The following will combine Figures 1 to 7 The IGBT driver test positioning platform of this application is described below. Figures 1 to 7 In the middle, the first direction L1, the second direction L2, and the third direction L3 are perpendicular to each other. When the IGBT driver test positioning stage is in use, the first direction L1 is parallel to the direction of gravity.

[0041] like Figures 1 to 7As shown, the IGBT driver test positioning stage includes a support assembly 1, a storage assembly 2, a detection assembly, and a transfer mechanism 4. The support assembly 1 has a detection area, and the detection assembly is fixed on the support assembly 1 and located on one side of the detection area. The storage assembly 2 includes a storage box 21, a push rod 22, and multiple placement carts 23. The storage box 21 is fixed on the support assembly 1, and the placement carts 23 are used to carry IGBT drivers 9. The multiple placement carts 23 are stacked in the storage box 21 along a first direction L1. The storage box 21 has an opening 213. The push rod 22 can apply force to the placement cart 23 located at the bottom in the direction of gravity, so that the placement cart 23 located at the bottom in the direction of gravity moves out through the opening 213. The transfer mechanism 4 is disposed on the support assembly 1. One end of the transfer mechanism 4 faces the opening 213, and the other end of the transfer mechanism 4 faces the detection area. The placement cart 23 moved out of the storage box 21 can transfer the carried IGBT driver 9 to the transfer mechanism 4, and the transfer mechanism 4 can transfer the IGBT driver 9 to the detection area.

[0042] During the use of the IGBT driver test positioning platform of this application, the push rod 22 applies force to the placement cart 23 located at the bottom in the direction of gravity, causing the placement cart 23 located at the bottom in the direction of gravity to move out through the opening 213. The placement cart 23, which is removed from the storage box 21, can transfer the IGBT driver 9 it carries to the conveyor mechanism 4, which can then transport the IGBT driver 9 to the testing area for testing. In this way, by using the conveyor belt and the placement cart 23 to move the IGBT driver 9 to the testing area, the handling efficiency of the IGBT driver 9 is improved. At the same time, compared to manual placement of the IGBT driver 9 by personnel, the conveyor mechanism 4 can transport the IGBT driver 9 to the testing area, improving the accuracy of the IGBT driver 9 placement and thus improving the testing efficiency.

[0043] In addition, the storage box 21 can quickly store a large quantity of IGBT drivers 9, avoiding the phenomenon of dropping caused by manual handling, and also preventing damage to the IGBT drivers 9 caused by the external environment.

[0044] In the embodiments of this application, such as Figure 1 and Figure 3 As shown, the support assembly 1 includes a positioning platform 11 and multiple support seats 12. The multiple support seats 12 are all fixed to the bottom of the positioning platform 11. A groove 13 is formed on the positioning platform 11, located at the end of the conveying mechanism 4. The area where the groove 13 is located is the detection area. The multiple support seats 12 can provide sufficient stability for the positioning platform 11, preventing instability of the positioning platform 11 during the detection process.

[0045] like Figure 7As shown, the placement vehicle 23 includes a mounting frame 231 and multiple wheels 232. The mounting frame 231 includes a support surface 235, and an extension groove 233 is formed on the mounting frame 231 that extends inward from the support surface 235 toward the interior of the mounting frame 231. The support surface 235 is used to support the IGBT driver 9, and a portion of the guide plate 8 described below can extend into the extension groove 233. The multiple wheels 232 are all fixed to the mounting frame 231 to facilitate the movement of the placement vehicle 23. An abutment block 234 is provided on one side of the mounting frame 231. The abutment block 234 can abut against the push rod 22, which allows the push rod 22 to apply force to the abutment block 234, thereby realizing the movement of the placement vehicle 23.

[0046] Preferably, there are four wheels 232, with two wheels 232 located on the same side of the mounting frame 231 and the other two wheels 232 located on the other side of the mounting frame 231.

[0047] Furthermore, for two adjacent placement vehicles 23, the multiple wheels 232 in one placement vehicle 23 correspond one-to-one with the multiple wheels 232 in the other placement vehicle 23. Taking two corresponding wheels 232 in two adjacent placement vehicles 23 as an example, one wheel 232 forms a limiting groove, and part of the other wheel 232 is located in the limiting groove, so as to facilitate the stacking of multiple placement vehicles 23.

[0048] Optionally, the wheel 232 forming the limiting groove includes two movable wheels with a limiting groove between them, and the other wheel 232 includes only one support wheel with the position of the support wheel corresponding to the position of the limiting groove formed between the two movable wheels.

[0049] Preferably, the four wheels 232 of the first placement vehicle 23 at the bottom form a limiting groove, and so on, with multiple placement vehicles 23 stacked inside the storage box 21.

[0050] In the embodiments of this application, such as Figure 4 and Figure 5 As shown, the storage box 21 includes a main body 211 and a door 212. The main body 211 has an opening, and the door 212 is disposed on the opening. The door 212 can also be moved out from the opening to facilitate the placement of multiple storage carts 23 inside the storage box 21. The main body 211 has an opening 213 on the side facing the door 212 in the third direction L3.

[0051] Furthermore, the storage assembly 2 also includes a first mounting plate 24 and a second mounting plate 25. The second mounting plate 25 is connected to the first mounting plate 24 on the side facing the conveying mechanism 4 in the second direction L2. The storage box 21 is fixed on the first mounting plate 24. The first mounting plate 24 points in the direction of the second mounting plate 25, and the second mounting plate 25 tapers in size in the first direction L1. Thus, when part of the placement vehicle 23 moves from the storage box 21 to the second mounting plate 25, the placement vehicle 23 can continue to move towards the conveying mechanism 4 under the action of gravity, so as to transfer the IGBT driver 9 on the placement vehicle 23 to the conveying mechanism 4.

[0052] In addition, two first slide rails 241 are provided on the first mounting plate 24, and two second slide rails 251 are provided on the second mounting plate 25. The two first slide rails 241 are respectively connected to the two second slide rails 251. The positions of the two first slide rails 241 correspond to the positions of the wheels 232 located on both sides of the mounting frame 231, so as to guide the movement of the wheels 232.

[0053] like Figure 4 and Figure 6 As shown, a sliding groove 214 is provided on one side of the storage box 21 in the second direction L2. The sliding groove 214 extends along the third direction L3. A portion of the push rod 22 extends the sliding groove 214 into the storage box 21 and abuts against the abutting block 234 of the placement cart 23 located at the bottom in the gravity direction on the side opposite to the opening 213 in the third direction L3. The push rod 22 can slide in the sliding groove 214 along the third direction L3, thereby pushing the placement cart 23 located at the bottom out of the storage box 21.

[0054] In addition, the storage assembly 2 also includes a push-pull member 26, which includes a connecting portion 261 and two push-pull portions 262. Both push-pull portions 262 extend along a second direction L2 and are spaced apart along a third direction L3. The two push-pull portions 262 are connected by the connecting portion 261, and a portion of the push-pull portion 262 extends into the interior of the storage box 21. The entire push-pull member 26 is slidably connected to the storage box 21, allowing the push-pull member 26 to move relative to the storage box 21 along the second direction L2. When the first placement cart 23 at the bottom is pushed out by the push rod 22, the push-pull portion 262 can support the second placement cart 23 moving upwards. When the first placement cart 23 at the bottom is completely removed, the push-pull member 26 moves toward the outside of the storage box 21, so that the push-pull part 262 no longer supports the second placement cart 23 from bottom to top, so that the remaining placement carts 23 in the storage box 21 move downward as a whole, so as to push out the next placement cart 23. After that, the push-pull member 26 returns to its original position, so that the push-pull part 262 supports the second placement cart 23 from bottom to top in the storage box 21.

[0055] Preferably, a return spring 27 is provided between the connecting part 261 and the storage box 21. When the push-pull member 26 is moved to the outside of the storage box 21, the return spring 27 is stretched. After the remaining placement cart 23 in the storage box 21 moves downward as a whole, the push-pull member 26 is released. Under the action of the return spring 27, the push-pull member 26 returns to its original position, so that the push-pull part 262 supports the second placement cart 23 moving upward from the bottom in the storage box 21.

[0056] Furthermore, the storage box 21 has an installation port on the second direction L2, which extends along the first direction L1. A lifting member 28 is provided on the installation port. The lifting member 28 includes a lifting rod 281, multiple support rods 283, and multiple connecting rods 282. Adjacent support rods 283 are connected by connecting rods 282. The lifting rod 281 can be connected to two support rods 283. The support rods 283 can be inserted between two placement carts 23 and contact the mounting frame 231 of the placement cart 23. When placing the placement cart 23 supporting the IGBT driver 9 into the storage box 21, if there are many placement carts 23 in the storage box 21, the lifting member 28 can be installed inside the installation port, so that the bottom of each placement cart 23 in the storage box 21 is correspondingly provided with a support rod 283. Then, by manually lifting the lifting member 28, the placement cart 23 in the storage box 21 can be lifted, and the operator can then place the placement cart 23 into the bottom of the storage box 21. After the operator has placed all the placement vehicles 23, the lifting component 28 can be removed from the installation port.

[0057] In the embodiments of this application, such as Figure 1 , Figure 2 and Figure 3 As shown, the IGBT driver test positioning stage 11 also includes a recycling box 5 and a guide plate 8. A drop groove 14 is provided on the support assembly 1, and the recycling box 5 communicates with the drop groove 14. The drop groove 14 is located between the storage assembly 2 and the conveying mechanism 4. The guide plate 8 is fixed to the groove wall of the drop groove 14 away from the storage box 21, extends above the drop groove 14, and a portion of the guide plate 8 can extend into the extension groove 233. Figure 8 As shown, after the placement cart 23 is removed from the storage box 21, part of the guide plate 8 extends into the extension groove 233. Then, guided by the second slide rail 251, the placement cart 23 tilts downward. Under the action of the guide plate 8, the placement cart 23 separates from the IGBT driver 9. As the placement cart 23 moves, it falls into the recycling box 5 through the drop groove 14 for the next use of the placement cart 23. Meanwhile, the IGBT driver 9 moves along the guide plate 8 to the conveying mechanism 4.

[0058] Optionally, the conveyor mechanism 4 is an omnidirectional ball bearing conveyor belt.

[0059] Furthermore, the IGBT driver test positioning stage also includes a guide frame 61 and a guide roller 62. The guide frame 61 is mounted on the support assembly 1 and is located on one side of the transmission mechanism 4. Part of the guide frame 61 is perpendicular to the second direction L2, and the other part is perpendicular to the third direction L3. The guide roller 62 is provided on the side of the guide frame 61 facing the transmission mechanism 4. The guide roller 62 can rotate relative to the guide frame 61, thereby guiding the movement of the IGBT driver 9.

[0060] Preferably, the guide frame 61 extends from the side where the first conveying section 41 is located to the end of the second conveying section 42 facing the detection area.

[0061] In addition, the IGBT driver test positioning platform also includes a mounting bracket 63 and a drive unit 64. The drive unit 64 is mounted on the positioning platform via the mounting bracket 63. The testing components include a multimeter 31, which is connected to the drive unit 64. The drive unit 64 can drive the multimeter 31 to move along a third direction L3, allowing the multimeter 31 to move above the testing area for IGBT testing. During testing, the operator activates the drive unit 64 to move the multimeter 31 above the testing area, facilitating rapid testing of the IGBT driver 9's ports. If the test passes, the driver is placed in the testing instrument 32 for comprehensive testing. If the test fails, the operator places the defective IGBT driver 9 in the defective product collection box 72. If the test fails after being tested by the testing instrument 32, the operator places the defective IGBT driver 9 in the defective product collection box 72. If the test passes after being tested by the testing instrument 32, the operator places the qualified IGBT driver 9 in the qualified product collection box 71. Pre-testing the IGBT driver 9 using multimeter 31 can both avoid wasting the testing resources of the tester 32 and improve the work efficiency of the staff.

[0062] Optionally, the drive component 64 can be a cylinder, an electric telescopic rod, or other telescopic component. Preferably, the drive component 64 is a cylinder.

[0063] The usage process of the IGBT driver test positioning platform of this application is as follows: The operator places the IGBT driver 9 to be tested on the placement cart 23, then stacks multiple placement carts 23 in the storage box 21. Pushing the push rod 22 causes the first placement cart 23 at the bottom to be pushed out of the storage box 21, subsequently falling into the recycling box 5. The IGBT driver 9 then slides onto the conveying mechanism 4 and is transported to the testing area by the conveying mechanism 4. The operator then activates the drive unit 64, bringing the multimeter 31 closer to the operator. The operator uses the multimeter 31 to perform a preliminary test on the IGBT driver 9. Qualified IGBT drivers 9 are placed in the testing instrument 32 for testing, while those that fail are placed in the defective product collection box 72. Afterwards, the testing instrument 32 performs the test. IGBT drivers 9 that pass the test are placed in the qualified product collection box 71, and those that fail are placed in the defective product collection box 72.

[0064] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this utility model.

Claims

1. An IGBT driver test positioning platform, characterized in that, The IGBT driver test positioning platform includes a support component, a storage component, a detection component, and a transmission mechanism. The support component has a detection area, and the detection component is fixed on the support component and located on one side of the detection area. The storage assembly includes a storage box, a push rod, and multiple placement carts. The storage box is fixed to the support assembly. The placement carts are used to carry IGBT drivers. The multiple placement carts are stacked in the storage box along a first direction, which is parallel to the direction of gravity. The storage box has an opening. The push rod can apply force to the placement cart located at the bottom in the direction of gravity, so that the placement cart located at the bottom in the direction of gravity moves out through the opening. The conveying mechanism is mounted on the support assembly, with one end of the conveying mechanism facing the opening and the other end facing the detection area. The placement vehicle, which is removed from the storage box, can transfer the IGBT driver it carries onto the conveying mechanism, and the conveying mechanism can transport the IGBT driver to the detection area.

2. The IGBT driver test positioning platform according to claim 1, characterized in that, The storage box has a sliding groove on one side in the second direction. The sliding groove extends along the third direction. A portion of the push rod extends into the storage box through the sliding groove and abuts against the placement vehicle located at the bottom in the gravity direction. The push rod can slide in the sliding groove along the third direction. The first direction, the second direction, and the third direction are perpendicular to each other.

3. The IGBT driver test positioning platform according to claim 2, characterized in that, The storage assembly further includes a push-pull member that is slidably connected to the storage box so that the push-pull member can move relative to the storage box in the second direction and can support a second placement vehicle in the opposite direction of the gravity direction.

4. The IGBT driver test positioning platform according to claim 2, characterized in that, The IGBT driver test positioning platform also includes a recycling box and a guide plate. The support component has a drop groove, the recycling box is connected to the drop groove, and the drop groove is located between the storage component and the conveying mechanism. The guide plate is fixed to the wall of the drop trough, extends above the drop trough, and a portion of the guide plate can extend between the placement vehicle and the IGBT driver.

5. The IGBT driver test positioning platform according to claim 2, characterized in that, The storage assembly further includes a first mounting plate and a second mounting plate, the second mounting plate being connected to the first mounting plate on the side facing the conveying mechanism in the second direction, and the storage box being fixed on the first mounting plate; The first mounting plate points in the direction of the second mounting plate, and the second mounting plate is tapered in size in the first direction.

6. The IGBT driver test positioning platform according to claim 4, characterized in that, The placement vehicle includes a mounting frame and multiple wheels, all of which are fixed to the mounting frame, which is used to support the IGBT driver.

7. The IGBT driver test positioning platform according to claim 6, characterized in that, For two adjacent placement vehicles among the plurality of placement vehicles, the plurality of wheels in one placement vehicle correspond one-to-one with the plurality of wheels in the other placement vehicle, the wheels in one placement vehicle form a limiting groove, and the portion of the corresponding wheel in the other placement vehicle is located within the limiting groove.

8. The IGBT driver test positioning platform according to claim 2, characterized in that, The IGBT driver test positioning platform also includes a driving component, and the detection component includes a multimeter. The driving component is fixed on the support component, and the multimeter is connected to the driving component. The driving component can drive the multimeter to move along the third direction so that the multimeter can move above the detection area.

9. The IGBT driver test positioning platform according to claim 6, characterized in that, The mounting frame includes a support surface for supporting the IGBT driver. The mounting frame has an extension groove that is recessed from the support surface toward the interior of the mounting frame. A portion of the guide plate can extend into the extension groove.

10. The IGBT driver test positioning platform according to claim 2, characterized in that, The IGBT driver test positioning platform also includes a guide frame and a guide roller. The guide frame is mounted on the support assembly and is located on one side of the conveying mechanism. The guide roller is located on the side of the guide frame facing the conveying mechanism and is rotatable relative to the guide frame.

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