Support device shared by eddy current and photoelectric detection double probes

Abstract

The utility model discloses a support device shared by eddy current and photoelectric detection double probes. The support device comprises a preset base rod, a connecting frame, an adjusting structure and a supporting structure. The preset base rod serves as a supporting foundation, the connecting frame can slide on the base rod, and the adjusting structure and the supporting structure are connected through the first connecting sleeve and the second connecting sleeve respectively. The adjusting structure is composed of a longitudinal adjusting plate, an arc-shaped angle adjusting plate, an extending sliding plate and the like and is matched with a track plate to achieve multi-dimensional adjustment, and a transverse adjusting plate is connected with a supporting structure main rod through an electric protection hose. Adjusting rods of the supporting structure are connected in a hinged mode, angle locking is achieved through a locking pin, and the tightness degree between the adjusting rods and the supporting structure is controlled through a locking piece device. All parts of the device work cooperatively, and the problems that an existing support device is poor in installation adaptability, inflexible in adjustment and insufficient in stability are solved. Aluminum alloy or carbon steel can be selected as a preset base rod material to adapt to various scenes such as a machine tool and a production line.

Description

A shared support device for dual probes of eddy current and photoelectric detection Technical Field

[0001] This utility model provides a shared support device, and particularly relates to a shared support device for dual probes of eddy current and photoelectric detection. Background Technology

[0002] In the field of industrial inspection, eddy current and photoelectric detection technologies are widely used in material defect detection, dimensional measurement and other scenarios due to their high efficiency and accuracy. The dual-probe shared support device is a key auxiliary device that supports and flexibly adjusts the two detection probes. Its function is to ensure that the probes are in the appropriate detection position and angle, so as to ensure the accuracy and stability of the detection data.

[0003] Existing dual-probe support devices for eddy current and photoelectric detection mostly employ fixed connections or simple splicing structures. These supports typically consist of a single support column providing basic support, and a mounting plate with pre-defined mounting holes for securing the probe. However, this structure has significant drawbacks: First, the fixed mounting holes make it difficult to accommodate eddy current and photoelectric detection probes of different specifications and sizes, resulting in poor installation flexibility. Second, it cannot achieve fine adjustment of the probe in multiple dimensions such as longitudinal direction, angle, and extension direction, making it difficult to meet the precise requirements for detection position and angle in complex detection environments. Third, the overall structure lacks an effective tension adjustment mechanism, making it susceptible to probe position displacement due to external interference during detection, affecting detection accuracy and stability. Summary of the Invention

[0004] To address the aforementioned issues, this application provides a shared support device for dual probes of eddy current and photoelectric detection, which solves the problems of poor probe installation adaptability, inflexible adjustment, and insufficient stability, thereby improving detection accuracy and efficiency.

[0005] To solve the above-mentioned technical problems, this utility model provides the following technical solution: a dual-probe support device for eddy current and photoelectric detection, including a preset base rod, wherein an adjustment structure and a support structure are connected above the preset base rod by a plurality of connecting frames;

[0006] The adjustment structure includes a longitudinal adjustment plate that is movably connected to the connecting frame, an arc-shaped angle adjustment plate that is integrally connected above the longitudinal adjustment plate, and an extension sliding plate that is movably connected above the angle adjustment plate.

[0007] The support structure includes several adjusting rods connected in sequence, and a locking pin is provided at the end of the adjusting rod away from the preset base rod.

[0008] Preferably, the connecting frame is slidably connected on a preset base rod, and the connecting frame includes a first connecting sleeve corresponding to the adjustment structure and a second connecting sleeve corresponding to the support structure.

[0009] Preferably, a track plate is fixedly connected above the first connecting sleeve and the angle adjustment plate. The track plate is movably connected to the corresponding longitudinal adjustment plate and the extension sliding plate. The end of the extension sliding plate away from the angle adjustment plate is movably connected to the transverse adjustment plate.

[0010] Preferably, the two lateral adjustment plates are connected to a main rod on the support structure via a flexible electrical conduit on opposite sides; the main rod corresponds to a locking pin; and the adjustment rods are movably connected, forming a hinged support frame.

[0011] Preferably, the tension of both the adjustment structure and the support structure is adjusted via a locking device.

[0012] One or more technical solutions provided in the embodiments of this application have at least the following technical effects or advantages:

[0013] This utility model discloses a shared support device for dual probes of eddy current and photoelectric detection. A pre-set base rod serves as the primary load-bearing component. A first connecting sleeve corresponding to a connecting frame that slides on the base rod, and a second connecting sleeve corresponding to the supporting structure, allow for positional adaptation between the adjustment structure and the supporting structure on the base rod. In the adjustment structure, a longitudinal adjustment plate can be moved relative to the connecting frame for longitudinal position adjustment. An arc-shaped angle adjustment plate, based on an integrated connection, provides an angle adjustment basis for an extension sliding plate. The extension sliding plate slides in the extension direction via a movable connection to a track plate above the angle adjustment plate. A transverse adjustment plate is movably connected to the extension sliding plate and connected to the main rod on the supporting structure via an electrical protection flexible hose, further expanding the adjustment dimensions. In the supporting structure, several adjusting rods, sequentially movably connected in a hinged support frame, can adjust and lock the support angle using a locking pin at the end furthest from the base rod. The main rod and the locking pin correspond to achieve installation positioning. Simultaneously, the adjustment structure and the supporting structure, through a locking device, can be adjusted for tightness according to usage requirements. This achieves flexible adaptation and stable support for the installation, position, and angle of the dual probes of eddy current and photoelectric detection, ensuring the smooth operation of the detection work.

[0014] Other advantages, objectives and features of this invention will be set forth in part in the description which follows, and in part will be apparent to those skilled in the art from the following examination or study, or may be taught from the practice of this invention. Attached Figure Description

[0015] Figure 1 is a front perspective view of a dual-probe shared support device for eddy current and photoelectric detection according to the present invention.

[0016] Figure 2 is a three-dimensional back view of a dual-probe shared support device for eddy current and photoelectric detection according to the present invention.

[0017] Figure 3 is a partial enlarged view of the adjustment part of the shared support device for dual probes of eddy current and photoelectric detection according to this utility model.

[0018] Figure 4 is a partial enlarged view of the support part of the dual-probe shared support device for eddy current and photoelectric detection according to this utility model.

[0019] As shown in the figure:

[0020] 1. Pre-set base rod; 2. Adjustment structure; 3. Support structure; 4. Locking device;

[0021] 11. Connecting frame; 12. First connecting sleeve; 13. Second connecting sleeve;

[0022] 21. Longitudinal adjustment plate; 22. Angle adjustment plate; 23. Extension sliding plate; 24. Track plate; 25. Lateral adjustment plate; 26. Electrical protection flexible conduit;

[0023] 31. Adjusting rod; 32. Locking pin; 33. Main rod. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] It should be noted that the terms "vertical," "horizontal," "up," "down," "left," "right," and similar expressions used in this article are for illustrative purposes only and do not represent the only possible implementation.

[0026] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains; the terminology used herein in the description of this invention is for the purpose of describing particular embodiments only and is not intended to limit the invention; the term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0027] As shown in Figures 1 and 2, a shared support device for dual probes of eddy current and photoelectric detection includes a preset base rod 1, above which an adjustment structure 2 and a support structure 3 are connected via several connecting frames 11. The connecting frames 11 can slide on the preset base rod 1 and include a first connecting sleeve 12 corresponding to the adjustment structure 2 and a second connecting sleeve 13 corresponding to the support structure 3. The adjustment structure 2 has a longitudinal adjustment plate 21 movably connected to the connecting frames 11, with an arc-shaped angle adjustment plate 22 integrally connected above it. An extension sliding plate 23 is movably connected above the angle adjustment plate 22. Track plates 24 are fixedly connected to both the first connecting sleeve 12 and the angle adjustment plate 22, respectively, and movably cooperate with the longitudinal adjustment plate 21 and the extension sliding plate 23. The furthest end of the extension sliding plate 23 is movably connected to a transverse adjustment plate 25, which is connected to the main rod 33 on the support structure 3 via an electrical protection flexible hose 26. The support structure 3 includes adjusting rods 31 connected in sequence. The far end of the adjusting rod 31 is provided with a locking pin 32. The adjusting rods 31 are movably connected to form a hinged support frame. The main rod 33 corresponds to the locking pin 32. The adjusting structure 2 and the support structure 3 are adjusted by locking device 4.

[0028] In this implementation scheme, the base rod 1 serves as the basic support component, providing a stable load-bearing platform for the entire device. The sliding connecting frame 11 and its included first connecting sleeve 12 and second connecting sleeve 13 allow the adjustment structure 2 and support structure 3 to be flexibly adjusted on the base rod, enhancing the device's adaptability to different testing scenarios. The longitudinal adjustment plate 21, arc-shaped angle adjustment plate 22, and extension sliding plate 23 in the adjustment structure 2, together with the track plate 24, enable multi-dimensional precise adjustment of the probe in longitudinal height, testing angle, and horizontal extension direction. The lateral adjustment plate 25 and the electrical protection hose 26 further expand the adjustment range while effectively protecting the electrical circuits. The hinged adjustment rod 31 and locking pin 32 in the support structure 3 not only allow for flexible adjustment of the support angle but also provide a stable lock, ensuring the stability of the device during the testing process. The main rod 33 and locking pin 32 cooperate to provide precise positioning for probe installation. The locking device 4 between the adjustment structure 2 and support structure 3 can be flexibly controlled according to actual needs, ensuring that each component is stably fixed after adjustment. The components work together to innovatively solve the problems of poor installation adaptability, inflexible adjustment, and insufficient stability of existing support devices, significantly improving the installation efficiency and detection accuracy of the dual probes for eddy current and photoelectric detection, and greatly enhancing the versatility and practicality of the device in different detection environments.

[0029] As shown in Figures 3 and 4, this support device is based on a pre-set base rod 1. The sliding design of the connecting frame 11, in conjunction with the first and second connecting sleeves 12 and 13, enables the adjustment structure 2 and the support structure 3 to be adapted to each other on the base rod. In the adjustment structure 2, the longitudinal adjustment plate 21, the angle adjustment plate 22, and the extension sliding plate 23 rely on the track plate 24 to respectively complete the longitudinal, angular, and extension direction position adjustments. The transverse adjustment plate 25 works in conjunction with the electrical protection hose 26 to adapt to the installation requirements of the main rod 33. In the support structure 3, the hinged adjustment rod 31 is combined with the locking pin 32 to meet different support angles and locking requirements. Furthermore, the adjustment structure 2 and the support structure 3 can be flexibly controlled for tightness through the locking device 4, ensuring structural stability during use. This adapts to the installation and adjustment scenarios of dual probes for eddy current and photoelectric detection, enabling multi-dimensional adjustment and fixation of position, angle, and other dimensions.

[0030] In this implementation scheme, in actual use, this device needs to be combined with existing technologies such as locking mechanisms, probe fixing parts, and installation tools to achieve complete functionality. The locking device 4 can adopt existing technologies such as bolt and nut assemblies, eccentric wheel clamping mechanisms, or quick-release chucks. Taking the bolt and nut assembly as an example, it achieves tightness adjustment by passing through the connection between the adjusting structure 2 and the supporting structure 3 and using a spring washer: when the bolt is tightened, the friction between the two structures increases, achieving locking; loosening allows relative movement. The eccentric wheel clamping mechanism changes the clamping force by rotating the eccentric wheel, making it convenient to operate and allowing for quick locking. The quick-release chuck is suitable for scenarios requiring frequent adjustments, achieving rapid tightening and loosening through a handle. The material of the preset base rod 1 can be aluminum alloy profiles (such as 6063-T5) to balance strength and lightweight, or carbon steel (such as Q235) for high-load scenarios. Specific embodiments include:

[0031] 1) The guide rails or columns of the machine tool are connected to the machine tool through a fixture to enable the probe to perform online detection of the workpiece;

[0032] 2) The aluminum profile frame of the automated production line utilizes the sliding fit between the profile slot and the connecting frame 11;

[0033] 3) The stainless steel uprights of the outdoor testing platform are fixed to the base poles using a clamp structure;

[0034] 4) The square steel support frame of the laboratory testing table is installed by welding or bolting.

[0035] In addition, the probe mounting hardware can use clamps or pressure plates with anti-slip silicone pads to ensure the probe is securely installed and avoids damage; the installation tools need to be equipped with an Allen wrench (for M5-M8 bolts), a torque wrench (to control the tightening torque), and a measuring tape (to measure the installation dimensions). By combining the above-mentioned existing technologies with this device, flexible applications can be realized in various scenarios, from industrial machine tools to outdoor inspection.

[0036] Specifically, during installation, the pre-set base rod 1 can be first installed on the bearing surface such as the machine tool workbench or the frame of an automated production line using existing bolt fixing methods. If the pre-set base rod 1 is made of aluminum alloy profile, the T-slot of the profile can be used in conjunction with the slider nut to connect with the bearing surface; if it is made of carbon steel, a flange can be welded to the bottom of the base rod, and then fixed to the concrete platform with expansion bolts. The connecting frame 11 slides on the pre-set base rod 1 through the dovetail groove sliding mechanism of existing technology. During installation, the first connecting sleeve 12 and the second connecting sleeve 13 are aligned with the adjusting structure 2 and the supporting structure 3, respectively, and the fastening screws on the connecting frame are tightened with an Allen wrench to complete the initial positioning. In adjustment structure 2, the longitudinal adjustment plate 21 and the connecting frame 11 are movably connected using a linear guide slider mechanism, as described in the prior art. During installation, the slider is fixed to the bottom of the longitudinal adjustment plate 21, and the guide rail is embedded in the connecting frame 11. The longitudinal position is fixed by rotating the locking knob on the side of the guide rail. The movable connection between the angle adjustment plate 22 and the extension sliding plate 23 is a ball linear guide, as described in the prior art. The balls at the bottom of the extension sliding plate 23 engage with the grooves of the track plate 24, and the position is locked by a spring pin. When adjustment is needed, the pin can be pressed to slide. The transverse adjustment plate 25 and the extension sliding plate 23 are movably connected using a hinge mechanism, as described in the prior art. During use, the rotation resistance can be controlled by adjusting the damping knob on the hinge. The adjustment rods 31 in support structure 3 are movably connected using a butterfly hinge, as described in the prior art. During installation, the pin of the butterfly hinge is passed through the connecting hole of the adjustment rod 31, and the tightness is adjusted by tightening the butterfly nut. The locking pin 32 is a spring pin, as described in the prior art, which is inserted into the corresponding pin hole of the main rod 33 to achieve quick locking. For the locking device 4, if the existing bolt and nut assembly is used, a through hole is opened at the connection between the adjusting structure 2 and the supporting structure 3, the bolt is passed through the two structures and the nut is tightened, and the disc spring is used to achieve elastic pre-tightening to ensure that it does not loosen under vibration. If an eccentric wheel clamping mechanism is used, the eccentric wheel shaft is fixed on the adjusting structure 2, the clamping end of the eccentric wheel abuts against the supporting structure 3, and the eccentric wheel handle is rotated to achieve quick clamping. Before the inspection operation, the distance between the probe and the workpiece is measured using a laser rangefinder, the angle and height of the supporting structure 3 are adjusted by adjusting rod 31, the probe position is finely adjusted using adjusting structure 2, and finally the overall structure is fixed by the locking device 4, locking pin 32 and the locking mechanism of each component. During the inspection, the probe inspection status can be observed in real time with the help of an industrial camera, if the inspection position needs to be changed, the locking mechanism is loosened, quickly adjusted and then tightened again to achieve efficient inspection operation.

[0037] Although the present invention has been disclosed above with reference to preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make various modifications and alterations without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be determined by the claims.

Claims

1. A dual-probe support device for eddy current and photoelectric detection, comprising a pre-set base rod (1), characterized in that: The adjustment structure (2) and the support structure (3) are connected above the preset base rod (1) by a plurality of connecting frames (11); the adjustment structure (2) includes a longitudinal adjustment plate (21) movably connected to the connecting frame (11), an arc-shaped angle adjustment plate (22) integrally connected above the longitudinal adjustment plate (21), and an extension sliding plate (23) movably connected above the angle adjustment plate (22); the support structure (3) includes a plurality of adjustment rods (31) connected in sequence, and a locking pin (32) is provided at the end of the adjustment rod (31) away from the preset base rod (1).

2. The dual-probe support device for eddy current and photoelectric detection according to claim 1, characterized in that: The connecting frame (11) is slidably connected on the preset base rod (1). The connecting frame (11) includes a first connecting sleeve (12) corresponding to the adjustment structure (2) and a second connecting sleeve (13) corresponding to the support structure (3).

3. The dual-probe support device for eddy current and photoelectric detection according to claim 2, characterized in that: A track plate (24) is fixedly connected above the first connecting sleeve (12) and the angle adjustment plate (22). The track plate (24) is movably connected to the corresponding longitudinal adjustment plate (21) and the extension sliding plate (23). The end of the extension sliding plate (23) away from the angle adjustment plate (22) is movably connected to the transverse adjustment plate (25).

4. The dual-probe support device for eddy current and photoelectric detection according to claim 3, characterized in that: The two sides of the horizontal adjustment plates (25) that are far apart from each other are connected to the main rod (33) located on the support structure (3) through the electrical protection hose (26); the main rod (33) and the locking pin (32) correspond to each other; the adjustment rods (31) are movably connected and form a hinged support frame.

5. The dual-probe support device for eddy current and photoelectric detection according to claim 1, characterized in that: The adjustment structure (2) and the support structure (3) are both adjusted for tightness through a locking device (4).

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