Automatic inductance and elastic sheet testing mechanism for magnetic device

Abstract

The utility model relates to the technical field of magnetic device testing, in particular to an automatic inductance and elastic sheet testing mechanism for a magnetic device, which comprises a testing jig, an upper testing module and a lower testing module, and is characterized in that the testing jig is arranged between the upper testing module and the lower testing module and is used for fixing the tested magnetic device; the upper test module comprises an upper support, an upper driving assembly, a first contact assembly, a second contact assembly and a pressing assembly, the upper driving assembly and the pressing assembly are both arranged on the upper support, and the first contact assembly and the second contact assembly are both arranged on the upper driving assembly; the upper driving assembly is used for driving the first contact assembly and the second contact assembly to make conductive contact with the magnetic device. The lower test module is used for conducting contact with an elastic sheet on the lower surface of the magnetic device. According to the utility model, the comprehensiveness and the reliability of the performance test of the inductance and the elastic sheet of the magnetic device are improved, and the higher requirement on the quality control of the magnetic device under the scenes of industrial production and the like can be met.

Description

Automatic Inductance and Spring Testing Mechanism for Magnetic Devices Technical Field

[0001] This utility model relates to the field of magnetic device testing technology, and in particular to an automatic inductance and spring testing mechanism for magnetic devices. Background Technology

[0002] As one of the core components of a new energy vehicle, the performance and reliability of the controller directly affect the overall safety and efficiency of the vehicle. Magnetic electronic components, as a key part of the new energy vehicle controller, play an indispensable role in many functions such as current control and signal transmission. During the production process, magnetic electronic components need to undergo multiple rigorous tests to ensure that their performance indicators meet high standards.

[0003] Currently, testing primarily relies on manual or semi-automatic methods. Manual testing is not only inefficient and susceptible to subjective human error, leading to inaccurate results, but also prone to human error over extended periods, impacting product quality stability. Therefore, there is an urgent need to develop a highly automated and accurate testing system to improve the efficiency and reliability of testing magnetic electronic components and ensure the production quality of new energy vehicle controllers. Summary of the Invention

[0004] To address the aforementioned issues, this invention ensures that the position of the magnetic components remains relatively fixed during testing, preventing factors such as shaking from affecting the accuracy of the test results. It improves the comprehensiveness and reliability of testing the inductance and spring performance of magnetic components, and provides an automated inductance and spring testing mechanism for magnetic components that meets the high quality control requirements of industrial production and other scenarios.

[0005] The technical solution adopted by this utility model is: an automatic inductance and spring testing mechanism for magnetic devices, including a test fixture, an upper test module, and a lower test module. The test fixture is disposed between the upper test module and the lower test module and is used to fix the magnetic device to be tested. The upper test module includes an upper support, an upper driving component, a first contact component, a second contact component, and a clamping component. The upper driving component and the clamping component are both disposed on the upper support, and the first contact component and the second contact component are both disposed on the upper driving component. The upper driving component is used to drive the first contact component and the second contact component to make conductive contact with the magnetic device. The clamping component is used to press the magnetic device onto the test fixture during the testing process. The lower test module is used to make conductive contact with the spring on the lower surface of the magnetic device.

[0006] A further improvement to the above solution is that the upper drive assembly includes an upper end plate, an upper motor, an upper screw, an upper guide rail, and an upper sliding seat. The upper motor is mounted on the upper end plate, the upper end plate is mounted on the upper bracket, the upper screw is mounted on the upper end plate and connected to the upper motor, the upper sliding seat is connected to the upper guide rail and the upper screw, the upper screw is used to drive the upper sliding seat to slide along the upper guide rail, the upper sliding seat is provided with a connecting bracket, and the first contact component and the second contact component are both mounted on the connecting bracket.

[0007] A further improvement to the above solution is that the connecting bracket is provided with a spring contact element, which is used for spring conductive contact on the upper surface of the magnetic device.

[0008] A further improvement to the above solution is that the first contact assembly includes a first contact drive cylinder, a first contact slider, a first contact connecting frame, and a first contact terminal. The first contact drive cylinder is disposed on the upper drive assembly, the first contact connecting frame is disposed on the first contact slider and connected to the first contact drive cylinder, and the first contact terminal is disposed on the first contact connecting frame.

[0009] A further improvement to the above solution is that the first contact terminal includes a first front contact terminal and a first rear contact terminal, and the first front contact terminal and the first rear contact terminal are respectively disposed on the front and rear sides of the first contact connector.

[0010] A further improvement to the above solution is that the second contact assembly includes a second contact drive cylinder, a second contact slider, a second contact connecting frame, and a second contact terminal. The second contact drive cylinder is disposed on the upper drive assembly, the second contact connecting frame is disposed on the second contact slider and connected to the second contact drive cylinder, and the second contact terminal is disposed on the second contact connecting frame.

[0011] A further improvement to the above scheme is that the second contact terminal includes a second front contact terminal and a second rear contact terminal, and the second front contact terminal and the second rear contact terminal are respectively disposed on the front and rear sides of the second contact connector.

[0012] A further improvement to the above solution is that the clamping assembly includes a clamping slide cylinder, a clamping connecting frame, and a fixing block. The clamping slide cylinder is mounted on the upper support, the clamping connecting frame is mounted on the clamping slide cylinder, and the fixing block is mounted on the clamping connecting frame, for pressing the magnetic device onto the test fixture.

[0013] A further improvement to the above solution is that the test fixture is provided with a fixing groove for fixing magnetic devices, and a positioning baffle is provided at the end of the fixing groove for positioning the end of the magnetic devices. The test fixture is provided with a through groove, one end of which is connected to the lower test module.

[0014] A further improvement to the above solution is that the lower test module includes a lower drive assembly, a lower test bracket, and a lower contact terminal, wherein the lower test bracket is disposed on the lower drive assembly, and the lower contact terminal is disposed on the lower test bracket.

[0015] The beneficial effects of this utility model are:

[0016] Compared to existing magnetic device testing methods, this invention's test fixture, positioned between the upper and lower test modules, securely fixes the magnetic device under test, ensuring its relatively stable position during testing and preventing the accuracy of test results from being affected by factors such as shaking. The upper support, acting as a load-bearing component, provides a stable mounting platform for the upper drive assembly, first contact assembly, second contact assembly, and clamping assembly. The upper drive assembly precisely drives the first and second contact assemblies to achieve conductive contact with the magnetic device, ensuring effective connection of the test circuit and thus accurately acquiring inductance-related test data. The clamping assembly firmly presses the magnetic device onto the test fixture during testing, further enhancing test stability and preventing test errors caused by poor contact. The lower test module focuses on making conductive contact with the springs on the lower surface of magnetic devices, enabling comprehensive testing of the electrical performance of magnetic devices in different parts. In particular, for the springs, it can effectively determine whether their conductivity meets the requirements, and help to promptly detect potential problems such as poor contact and abnormal resistance. This improves the overall comprehensiveness and reliability of the inductance and spring performance testing of magnetic devices, and can meet the high quality control requirements of magnetic devices in industrial production and other scenarios. Attached Figure Description

[0017] Figure 1 is a three-dimensional schematic diagram of the automatic inductance and spring testing mechanism for magnetic devices of this utility model;

[0018] Figure 2 is a three-dimensional schematic diagram of the automatic inductance and spring testing mechanism for magnetic devices in Figure 1 from another perspective;

[0019] Figure 3 is a side view of the automatic inductance and spring test mechanism for magnetic devices in Figure 1.

[0020] Figure 4 is a three-dimensional view of the upper test module of the automatic inductance and spring test mechanism for magnetic devices in Figure 1;

[0021] Figure 5 is a three-dimensional view of the test fixture of the automatic inductance and spring testing mechanism for magnetic devices in Figure 1;

[0022] Figure 6 is a three-dimensional view of the lower test module of the automatic inductance and spring test mechanism for magnetic devices in Figure 1.

[0023] Explanation of reference numerals in the attached drawings: Test fixture 1, Fixing groove 11, Positioning baffle 12, Through groove 13, Upper test module 2, Upper bracket 21, Upper drive assembly 22, Upper end plate 221, Upper motor 222, Upper screw 223, Upper guide rail 224, Upper sliding seat 225, Connecting bracket 226, Spring contact element 227, First contact assembly 23, First contact drive cylinder 231, First contact slider 232, First contact connecting frame 233, First contact terminal 234, First front end connector Contact terminal 2341, first rear contact terminal 2342, second contact assembly 24, second contact drive cylinder 241, second contact slider 242, second contact connecting frame 243, second contact terminal 244, second front contact terminal 2441, second rear contact terminal 2442, clamping assembly 25, clamping slide cylinder 251, clamping connecting frame 252, fixing block 253, lower test module 3, lower drive assembly 31, lower test bracket 32, lower contact terminal 33. Detailed Implementation

[0024] To facilitate understanding of this utility model, a more complete description will be given below with reference to the accompanying drawings. Preferred embodiments of this utility model are shown in the drawings. However, this utility model can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of the disclosure of this utility model.

[0025] It should be noted that when a component is said to be "fixed to" another component, it can be directly attached to the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component.

[0026] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.

[0027] As shown in Figures 1 to 6, in one embodiment of this utility model, an automatic inductance and spring testing mechanism for magnetic devices is provided, including a test fixture 1, an upper test module 2, and a lower test module 3. The test fixture 1 is disposed between the upper test module 2 and the lower test module 3 and is used to fix the magnetic device to be tested. The upper test module 2 includes an upper support 21, an upper driving component 22, a first contact component 23, a second contact component 24, and a clamping component 25. The upper driving component 22 and the clamping component 25 are both disposed on the upper support 21, and the first contact component 23 and the second contact component 24 are both disposed on the upper driving component 22. The upper driving component 22 is used to drive the first contact component 23 and the second contact component 24 to make conductive contact with the magnetic device. The clamping component 25 is used to press the magnetic device onto the test fixture 1 during the testing process. The lower test module 3 is used to make conductive contact with the spring on the lower surface of the magnetic device. The test fixture 1 of this utility model is set between the upper test module 2 and the lower test module 3, which can stably fix the magnetic device under test, ensuring that the position of the magnetic device is relatively fixed during the test and avoiding the influence of shaking and other factors on the accuracy of the test results. The upper bracket 21, as a supporting component, provides a stable mounting platform for the upper drive assembly 22, the first contact assembly 23, the second contact assembly 24, and the clamping assembly 25. The upper drive assembly 22 can accurately drive the first contact assembly 23 and the second contact assembly 24 to make conductive contact with the magnetic device, ensuring the effective connection of the test circuit, thereby accurately obtaining test data related to inductance. During the test, the clamping assembly 25 can firmly press the magnetic device onto the test fixture 1, further enhancing the stability of the test and preventing test errors caused by poor contact and other problems. The lower test module 3 focuses on conducting conductive contact with the springs on the lower surface of magnetic devices, enabling comprehensive testing of the electrical performance of magnetic devices in different parts. In particular, for the springs, it can effectively determine whether their conductivity meets the requirements, and help to promptly detect potential problems such as poor contact and abnormal resistance. This improves the overall comprehensiveness and reliability of the inductance and spring performance testing of magnetic devices, and can meet the high requirements for quality control of magnetic devices in industrial production and other scenarios.

[0028] The upper drive assembly 22 includes an upper end plate 221, an upper motor 222, an upper screw 223, an upper guide rail 224, and an upper sliding seat 225. The upper motor 222 is mounted on the upper end plate 221, which is mounted on the upper bracket 21. The upper screw 223 is mounted on the upper end plate 221 and connected to the upper motor 222. The upper sliding seat 225 is connected to the upper guide rail 224 and the upper screw 223. The upper screw 223 drives the upper sliding seat 225 to slide along the upper guide rail 224. The upper sliding seat 225 is provided with a connecting bracket 226. The first contact component 23 and the second contact component 24 are both mounted on the connecting bracket 226. In this embodiment, the upper motor 222 is mounted on the upper end plate 221, and the upper end plate 221 is mounted on the upper bracket 21, ensuring the stability and reasonable layout of the overall structure. The upper screw 223 is connected to the upper motor 222 and mounted on the upper end plate 221, enabling precise operation under motor drive. The connection between the upper sliding seat 225, the upper guide rail 224, and the upper screw 223 allows the upper screw 223 to effectively drive the upper sliding seat 225 to slide stably along the upper guide rail 224, ensuring accurate and smooth movement and providing reliable displacement assurance for subsequent operations. Furthermore, the connecting bracket 226 on the upper sliding seat 225 provides mounting points for the first contact component 23 and the second contact component 24, allowing them to be precisely positioned for testing. This significantly improves the testing accuracy, operational stability, and overall efficiency of the automatic inductance and spring testing mechanism for magnetic devices.

[0029] A spring contact element 227 is provided on the connecting bracket 226. The spring contact element 227 is used for conductive contact with the spring contacts on the upper surface of the magnetic device. In this embodiment, the spring contact element 227 can accurately and stably achieve conductive contact with the spring contacts on the upper surface of the magnetic device. This ensures the high efficiency and stability of current transmission during inductance and spring contact testing, effectively avoiding test data deviations caused by poor contact, and greatly improving the accuracy of test results. The stable contact performance can adapt to the testing requirements of magnetic devices of different specifications, possessing good compatibility. It simplifies the overall electrical connection structure of the testing mechanism, reduces the risk of failure that may be caused by complex connections, and makes the testing process smoother.

[0030] The first contact assembly 23 includes a first contact drive cylinder 231, a first contact slider 232, a first contact connecting frame 233, and a first contact terminal 234. The first contact drive cylinder 231 is mounted on the upper drive assembly 22. The first contact connecting frame 233 is mounted on the first contact slider 232 and connected to the first contact drive cylinder 231. The first contact terminal 234 is mounted on the first contact connecting frame 233. Specifically, the first contact terminal 234 includes a first front contact terminal 2341 and a first rear contact terminal 2342, which are respectively mounted on the front and rear sides of the first contact connecting frame 233. In this embodiment, by mounting the first contact drive cylinder 231 on the upper drive assembly 22, the movement of the first contact slider 232 and the connecting frame can be precisely controlled, enabling precise adjustment of the contact terminal position and ensuring accurate docking with each part of the magnetic device under test, thereby improving test accuracy. The first contact connector 233 connects the first contact drive cylinder 231 and the first contact terminal 234, serving to stabilize the transmission of power, ensuring stable and reliable contact action, and preventing test data deviations due to unstable connection. The first contact terminal 234 is divided into a first front contact terminal 2341 and a first rear contact terminal 2342 on the front and rear sides of the connector, allowing contact with magnetic devices from different directions. This enables more comprehensive and detailed testing of their inductance and spring contacts, effectively covering key parts of the device and improving the completeness and effectiveness of the overall test.

[0031] The second contact assembly 24 includes a second contact drive cylinder 241, a second contact slider 242, a second contact connecting frame 243, and a second contact terminal 244. The second contact drive cylinder 241 is mounted on the upper drive assembly 22. The second contact connecting frame 243 is mounted on the second contact slider 242 and connected to the second contact drive cylinder 241. The second contact terminal 244 is mounted on the second contact connecting frame 243. Specifically, the second contact terminal 244 includes a second front contact terminal 2441 and a second rear contact terminal 2442, which are respectively mounted on the front and rear sides of the second contact connecting frame 243. In this embodiment, the second contact drive cylinder 241 is mounted on the upper drive assembly 22. Through its driving action, it can precisely drive the connected second contact slider 242 and second contact connecting frame 243 to move, ensuring the stability and accuracy of the entire contact process. The second contact terminal 244 is disposed on the second contact connector 243, and the second front contact terminal 2441 and the second rear contact terminal 2442 contained therein are located on the front and rear sides of the connector 243 respectively, realizing effective contact at different positions of the magnetic device. During the test, the inductance and spring-related parameters of the magnetic device can be obtained more comprehensively and accurately.

[0032] The clamping assembly 25 includes a clamping slide cylinder 251, a clamping connecting frame 252, and a fixing block 253. The clamping slide cylinder 251 is mounted on the upper support 21, the clamping connecting frame 252 is mounted on the clamping slide cylinder 251, and the fixing block 253 is mounted on the clamping connecting frame 252, for clamping the magnetic device onto the test fixture 1. In this embodiment, the clamping assembly 25 consists of the clamping slide cylinder 251, the clamping connecting frame 252, and the fixing block 253. The clamping slide cylinder 251 is mounted on the upper support 21, providing the power source for the entire clamping action, and possesses good stability and precise driving capability. The clamping connecting frame 252 is mounted on the clamping slide cylinder 251, which can effectively transmit the power generated by the cylinder, ensuring the continuity and coordination of the action. The fixing block 253 is located on the clamping connecting frame 252. Through the coordinated operation of the above-mentioned components, the magnetic device can be accurately and firmly clamped onto the test fixture 1. The clamping operation not only ensures that the magnetic device is in the accurate position during the test, avoiding test errors caused by loosening, but also greatly improves the accuracy and reliability of the test.

[0033] The test fixture 1 is provided with a fixing groove 11 for fixing magnetic components. A positioning baffle 12 is provided at the end of the fixing groove 11 for positioning the end of the magnetic components. The test fixture 1 is also provided with a through groove 13, one end of which connects to the lower test module 3. In this embodiment, the fixing groove 11 of the test fixture 1 can accurately and stably fix the magnetic components, effectively preventing displacement of the components during testing and ensuring the accuracy and stability of the test. The positioning baffle 12 at the end of the fixing groove 11 provides a reliable positioning function for the end of the magnetic components. This ensures that the magnetic components are in a standard and consistent position each time they are installed in the fixing groove 11, guaranteeing the consistency of test conditions and thus improving the repeatability and comparability of test results. The through groove 13 on the test fixture 1 facilitates the effective transmission of test contacts, ensuring the smoothness of the entire test process and enabling efficient and accurate completion of tests related to inductors, springs, etc.

[0034] The lower test module 3 includes a lower drive assembly 31, a lower test bracket 32, and a lower contact terminal 33. The lower test bracket 32 ​​is mounted on the lower drive assembly 31, and the lower contact terminal 33 is mounted on the lower test bracket 32. In this embodiment, the lower test bracket 32 ​​is positioned on the lower drive assembly 31, enabling the entire module to have precise position control capabilities and accurately reach the required test location. The lower contact terminal 33, mounted on the lower test bracket 32, allows for effective electrical connection with the magnetic device under test. In actual automatic inductor and spring testing, the lower drive assembly 31 can stably and accurately drive the lower test bracket 32 ​​to perform corresponding actions, ensuring the reliability of the contact between the lower contact terminal 33 and the device.

[0035] The above embodiments only illustrate several implementation methods of this utility model, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of this utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. An automatic inductance and spring testing mechanism for magnetic devices, characterized in that: The system includes a test fixture, an upper test module, and a lower test module. The test fixture is disposed between the upper and lower test modules and is used to fix the magnetic device under test. The upper test module includes an upper support, an upper drive assembly, a first contact assembly, a second contact assembly, and a clamping assembly. The upper drive assembly and the clamping assembly are both disposed on the upper support, and the first and second contact assemblies are both disposed on the upper drive assembly. The upper drive assembly is used to drive the first and second contact assemblies to make conductive contact with the magnetic device. The clamping assembly is used to press the magnetic device onto the test fixture during the test process. The lower test module is used to make conductive contact with the spring contacts on the lower surface of the magnetic device.

2. The automatic inductance and spring testing mechanism for magnetic devices according to claim 1, characterized in that: The upper drive assembly includes an upper end plate, an upper motor, an upper screw, an upper guide rail, and an upper sliding seat. The upper motor is mounted on the upper end plate, and the upper end plate is mounted on an upper bracket. The upper screw is mounted on the upper end plate and connected to the upper motor. The upper sliding seat is connected to the upper guide rail and the upper screw. The upper screw is used to drive the upper sliding seat to slide along the upper guide rail. The upper sliding seat is provided with a connecting bracket, and the first contact component and the second contact component are both mounted on the connecting bracket.

3. The automatic inductance and spring testing mechanism for magnetic devices according to claim 2, characterized in that: The connecting bracket is provided with a spring contact element, which is used for the spring conductive contact on the upper surface of the magnetic device.

4. The automatic inductance and spring testing mechanism for magnetic devices according to claim 1, characterized in that: The first contact assembly includes a first contact drive cylinder, a first contact slider, a first contact connecting frame, and a first contact terminal. The first contact drive cylinder is disposed on the upper drive assembly, the first contact connecting frame is disposed on the first contact slider and connected to the first contact drive cylinder, and the first contact terminal is disposed on the first contact connecting frame.

5. The automatic inductance and spring testing mechanism for magnetic devices according to claim 4, characterized in that: The first contact terminal includes a first front contact terminal and a first rear contact terminal, which are respectively disposed on the front and rear sides of the first contact connector.

6. The automatic inductance and spring testing mechanism for magnetic devices according to claim 5, characterized in that: The second contact assembly includes a second contact drive cylinder, a second contact slider, a second contact connecting frame, and a second contact terminal. The second contact drive cylinder is disposed on the upper drive assembly, the second contact connecting frame is disposed on the second contact slider and connected to the second contact drive cylinder, and the second contact terminal is disposed on the second contact connecting frame.

7. The automatic inductance and spring testing mechanism for magnetic devices according to claim 6, characterized in that: The second contact terminal includes a second front contact terminal and a second rear contact terminal, which are respectively disposed on the front and rear sides of the second contact connector.

8. The magnetic device automatic inductance and spring test mechanism of claim 1, wherein: The clamping assembly includes a clamping slide cylinder, a clamping connecting frame, and a fixing block. The clamping slide cylinder is mounted on the upper support, the clamping connecting frame is mounted on the clamping slide cylinder, and the fixing block is mounted on the clamping connecting frame, for clamping the magnetic device onto the test fixture.

9. The magnetic device automatic inductance and spring test mechanism of claim 1, wherein: The test fixture is provided with a fixing groove for fixing magnetic devices. A positioning baffle is provided at the end of the fixing groove for positioning the end of the magnetic devices. The test fixture is provided with a through groove, one end of which is connected to the lower test module.

10. The automatic inductance and spring testing mechanism for magnetic devices according to claim 1, characterized in that: The lower test module includes a lower drive assembly, a lower test bracket, and a lower contact terminal. The lower test bracket is disposed on the lower drive assembly, and the lower contact terminal is disposed on the lower test bracket.

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