Double-layer probe connector detection device

Abstract

The utility model discloses a double-layer probe connector detection device. A module body is provided with a test workpiece cavity. A first-layer needle seat is fixed below the module body, a plurality of first needle holes and second needle holes are formed in the first-layer needle seat, the first needle holes and the second needle holes are arranged at intervals, a plurality of first-layer probes are mounted on the first-layer needle seat, the lower ends of the first-layer probes are connected with external detection equipment, and first needle heads are arranged at the upper ends of the first-layer probes and extend into a test workpiece cavity; a secondary-layer needle seat is fixed below the first-layer needle seat, a plurality of secondary-layer probes are mounted on the secondary-layer needle seat, the lower ends of the secondary-layer probes are connected with external detection equipment, the upper ends of the secondary-layer probes are connected with extension rods, the extension rods extend upwards to be inserted into the second needle holes, and the upper ends of the extension rods are provided with second needle heads and extend into the test workpiece cavity. The device is compact in structure, and can be used for detecting small-spacing connectors.

Description

Technical Field

[0001] This utility model relates to the technical field of connector testing, and more specifically, to a double-layer probe connector testing device. Background Technology

[0002] As is well known, connectors are components frequently encountered by electronic engineers. Their function is quite simple: to bridge gaps in circuits or between isolated circuits, allowing current to flow and enabling the circuit to perform its intended function. Connectors are indispensable components in electronic devices; following the path of current flow, one or more connectors will always be found. After connector assembly, it is necessary to check whether the terminals are installed, whether the installation position is accurate, and whether the terminals are deformed, etc.

[0003] A conventional connector testing device consists of a probe mounted at the bottom of the test workpiece cavity. The lower end of the probe is connected to external testing equipment via a lead wire. The probe contains a spring, and its upper end has a needle tip that can move axially and extends into the test workpiece cavity under the action of the spring. During testing, the connector is inserted into the test workpiece cavity with its conductive terminals aligned with the probe tip. The needle tip moves downward under pressure, activating the external testing equipment to test the connector, such as checking whether the conductive terminals are in place or properly installed. After testing, the connector is removed, and the needle tip returns to its original position due to the spring force. The position detection probe may also contain a coil or other mechanism.

[0004] Due to variations in application, frequency, power, and environment, connectors come in a wide variety of forms and structures, resulting in a diverse array of connector types. Furthermore, an increasing number of connector designs are moving towards multi-functionality and miniaturization, leading to increasingly smaller spacing between connector terminals. However, probes, limited by their internal structure, cannot meet the ever-shrinking terminal spacing requirements. Therefore, the development and design of new detection devices is imperative. Utility Model Content

[0005] The purpose of this invention is to provide a double-layer probe connector testing device with a compact structure that can meet the testing requirements of small-pitch connectors.

[0006] To achieve the above objectives, the solution of this utility model is:

[0007] A double-layer probe connector testing device includes a module body with a test workpiece cavity for connector insertion. A first-layer probe seat is fixed below the module body, and a plurality of first pin holes and second pin holes are formed on the first-layer probe seat. The first pin holes and second pin holes are arranged alternately, and each second pin hole is only adjacent to a first pin hole. A plurality of first-layer probes are installed on the first-layer probe seat. The lower end of the first-layer probes is connected to an external testing device via a lead wire. The upper end of the first-layer probe has a first needle tip, which passes through the first pin hole and extends into the test workpiece cavity under the action of a spring inside the first-layer probe. A second-layer probe seat is fixed below the first-layer probe seat, and a plurality of second-layer probes are installed on the second-layer probe seat. The lower end of the second-layer probes is also connected to an external testing device via a lead wire. An extension rod is connected to the upper end of the second-layer probe. The extension rod extends upward and passes through the second pin hole of the first-layer probe seat. The upper end of the extension rod has a second needle tip, which extends into the test workpiece cavity under the action of a spring inside the second-layer probe.

[0008] The upper end of the secondary probe has a cup-shaped needle, and an extension rod is inserted into the cup-shaped needle.

[0009] The lower ends of the first needle and the extension rod are concealed within the corresponding probe tube and connected to the internal needle within the probe tube.

[0010] The upper end of the first-layer probe has a cup-shaped needle, into which a first needle is inserted.

[0011] A probe plate is installed at the bottom of the test workpiece cavity (which can be the bottom surface of the module body or the top surface of the first probe). A through hole is opened on the probe plate corresponding to the first and second pin holes. The diameter of the through hole is smaller than the diameter of the anti-detachment platform of the first and second pins. With the help of the anti-detachment platform and the through hole, the probe plate can conveniently fix the pin and conveniently replace the pin.

[0012] The secondary probe holder is H-shaped, leaving upper and lower spaces. The lower end of the first-layer probe is located in the upper space of the secondary probe holder, and the lower end of the secondary probe is located in the lower space of the secondary probe holder, which facilitates the connection of the first-layer probe and the secondary probe with the soldered leads to the external testing equipment.

[0013] The cup-shaped needle and the extension rod are fixedly connected as a whole, preventing the extension rod from falling off.

[0014] The module body, the first-layer needle holder, and the second-layer needle holder are respectively formed with needle holder fixing holes, and the module body, the first-layer needle holder, and the second-layer needle holder are fixed together by means of fasteners such as bolts.

[0015] After adopting the above solution, when this utility model is used for testing, the connector is inserted into the cavity of the test workpiece, and the conductive terminals of the connector press down the first needle of the first layer probe and the second needle of the second layer probe to conduct external testing equipment to test the connector. After the test is completed, the connector is pulled out, and the first and second needles are reset by the force of the spring.

[0016] This invention arranges the first and second pin holes of the first-layer probes alternately, with each second pin only adjacent to the first pin. Adjacent test probes are distributed on the upper and lower pin holders. The second-layer probes corresponding to the second pins are transferred to the next working layer (second-layer pin holder). At the same time, the second-layer probes of the second-layer pin holder are connected by a thinner extension rod. In this way, the structure is compact, and the distance between the first-layer probes and the extension rods on the first-layer pin holder can be greatly reduced. The distance between the pins in the test workpiece cavity also becomes smaller, thereby reducing the test spacing of the probes and meeting the testing requirements of increasingly smaller connectors.

[0017] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model, the accompanying drawings used in the description of the embodiments are briefly described below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained from these drawings without creative effort.

[0019] Figure 1 This is a simplified structural diagram of the present invention;

[0020] Figure 2 This is a top view of the structure of this utility model;

[0021] Figure 3 yes Figure 1 AA section diagram;

[0022] Figure 4 yes Figure 1 BB cross-section diagram;

[0023] Figure 5 This is a simplified structural diagram of another embodiment of the present invention.

[0024] Label Explanation

[0025] Module body 1, test workpiece cavity 11, needle holder fixing hole 12;

[0026] First layer needle base 2, first layer probe 21, first needle 22, second needle hole 23, needle base fixing hole 24, first needle hole 25, cup-shaped needle 26;

[0027] Secondary needle hub 3, secondary probe 31, cup-shaped needle 32, extension rod 33, second needle 34, needle hub fixing hole 35, upper space 36, lower space 37.

[0028] Probe plate 4, through hole 41. Detailed Implementation

[0029] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this utility model, not all of them. Therefore, the following detailed description of the embodiments of this utility model provided in the accompanying drawings is not intended to limit the scope of the claimed utility model, but merely to represent selected embodiments of this utility model. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without inventive effort are within the scope of protection of this utility model.

[0030] It should be noted that the terms front, back, front, back, inside, outside, top, bottom, left, right, first, second, third, first, second, etc. are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the technical features indicated, unless otherwise clearly and specifically defined.

[0031] like Figures 1 to 4 As shown, this utility model discloses a double-layer probe connector testing device, including a module body 1, a first-layer probe seat 2, and a second-layer probe seat 3.

[0032] The module body 1 has a test workpiece cavity 11, which is used for the connector to be inserted during testing.

[0033] A first-layer pin holder 2 is fixed below the module body 1. The first-layer pin holder 2 has several first pin holes 25 and second pin holes 23, arranged at intervals. That is, a second pin hole 23 separates two adjacent first pin holes 25, ensuring that each second pin hole 23 is only adjacent to a first pin hole 25. Several first-layer probes 21 are mounted on the first-layer pin holder 2. The lower end of each first-layer probe 21 is connected to an external testing device via a lead wire. The external testing device is a conventional device and is not shown in the figure. The upper end of each first-layer probe 21 has a first needle tip 22 for testing. The first needle tip 22, under the action of a spring inside the first-layer probe 21, passes through the first pin hole and extends into the cavity 11 of the test workpiece. The first needle tip 22 of the first-layer probe 21 is directly used for connector testing.

[0034] A secondary needle holder 3 is fixed below the primary needle holder 2. Several secondary probes 31 are installed on the secondary needle holder 3. The lower end of the secondary probes 31 is also connected to an external testing device via a lead wire. The upper end of the secondary probes 31 has a cup-shaped needle 32. An extension rod 33 is inserted into the cup-shaped needle 32. The extension rod 33 extends upward and passes through the second needle hole 23 of the primary needle holder 2. The upper end of the extension rod 33 has a second needle 34 for testing. The second needle 34 extends into the test workpiece cavity 11 under the action of a spring inside the secondary probe 31. Each second needle 34 is only adjacent to the first needle 22.

[0035] This invention divides adjacent test probes into first-layer probes 21 and second-layer probes 31, which are distributed on two upper and lower pin holders (first-layer pin holder 2 and second-layer pin holder 3). In this way, the second-layer probes 31 are transferred to the second-layer pin holder 3 of the next working layer, and then the second-layer probes 31 are connected to a thinner extension rod 33. When the thin extension rod 33 passes through the first-layer pin holder 2, the diameter of the extension rod 33 is significantly reduced, and the distance between the first-layer probes 21 and the extension rod 33 on the first-layer pin holder 2 can be greatly reduced. This makes the distance between the first needle 22 and the second needle 34 in the test workpiece cavity 11 also smaller, thereby reducing the test spacing of the probes and meeting the testing requirements of increasingly smaller connectors.

[0036] To facilitate the connection of the probes with external testing equipment, the present invention further designs the secondary probe holder 3 in an H-shape, leaving an upper space 36 and a lower space 37 in the secondary probe holder 3. The lower end of the first-layer probe 21 is located in the upper space 36 of the secondary probe holder 3, and the lower end of the secondary probe 31 is located in the lower space 37 of the secondary probe holder 3. In this way, it is convenient to weld the leads of the first-layer probe 21 and the secondary probe 31 to connect with the external testing equipment.

[0037] Furthermore, this invention can fix the cup-shaped needle 32 and the extension rod 33 into a whole, thereby preventing the extension rod 33 from falling off. Alternatively, the anti-detachment platform of the second needle 34 can cooperate with the second needle hole 23 to prevent the extension rod 33 from falling off. Of course, for the extension rod 33 that moves up and down as shown in the figure, its own gravity can also be used to prevent it from falling off.

[0038] There are many ways to fix the module body 1, the first-layer needle seat 2, and the second-layer needle seat 3 described in this utility model. As shown in the figure, needle seat fixing holes 12, 24, and 35 are formed on the module body 1, the first-layer needle seat 2, and the second-layer needle seat 3 respectively, and the module body 1, the first-layer needle seat 2, and the second-layer needle seat 3 are fixed together by means of fasteners such as bolts.

[0039] When using this invention for testing, the connector is inserted into the cavity 11 of the test workpiece. The conductive terminals of the connector press down on the first pin 22 of the first-layer probe 21 and the second pin 34 of the second-layer probe 31, thus connecting the external testing equipment for testing. After testing, the connector is removed, and the first pin 22 and the second pin 34 return to their original positions due to the force of the springs inside their respective first-layer probe 21 and second-layer probe 31.

[0040] like Figure 5 The image shown is another embodiment of this utility model, which is similar to... Figure 1 The structural difference shown is that the upper end of the first-layer probe 21 has a cup-shaped needle 26, into which a first needle 22 is inserted. The cup-shaped needle 26 and cup-shaped needle 32 can also be tubular cavities. In this way, both the first-layer probe 21 and the second-layer probe 31 can be separate probes; when a probe is damaged, only the needle needs to be replaced, without replacing the entire probe. Furthermore, using a cup-shaped or tubular probe housing allows for the installation of various needles at the front end of the housing, reducing the number of probe models.

[0041] The present invention further installs a probe pressure plate 4 at the bottom of the test workpiece cavity 11. Specifically, the probe pressure plate 4 can be installed on the bottom surface of the module body 1 or the top surface of the first probe 2. A through hole 41 is opened on the probe pressure plate 4 corresponding to the first pin hole 25 and the second pin hole 23. The diameter of the through hole 41 is smaller than the diameter of the anti-detachment platform of the first needle 22 and the second needle 34. The anti-detachment platform and the through hole 41 can be used to fix the first needle 22 and the second needle 34. The probe pressure plate 4 also facilitates the replacement of the needle.

[0042] In addition, the connection between the first layer probe 21 and the first needle 22, and the connection between the second layer probe 31 and the extension rod 33 of this utility model can also be in other ways. For example, the lower ends of the first needle 22 and the extension rod 33 are hidden inside the probe tube of the corresponding first layer probe 21 or second layer probe 31, and connected to the internal needle inside the probe tube.

[0043] The embodiments described above are only for illustrating the technical ideas and features of this utility model. Their purpose is to enable those skilled in the art to understand the content of this utility model and implement it accordingly, but they do not limit the patent scope of this utility model. All equivalent changes or modifications made in accordance with the spirit disclosed in this utility model should still be covered within the patent scope of this utility model.

Claims

1. A double-layer probe connector testing device, characterized in that: The system includes a module body with a test workpiece cavity for connector insertion. A first-layer pin seat is fixed below the module body, with several first and second pin holes spaced apart. Each second pin hole is adjacent only to a first pin hole. Several first-layer probes are mounted on the first-layer pin seat, their lower ends connected to external testing equipment via leads, and their upper ends having first needle tips that, under the action of a spring inside the probe, pass through the first pin hole and extend into the test workpiece cavity. A second-layer pin seat is fixed below the first-layer pin seat, with several second-layer probes mounted on it. The lower ends of the second-layer probes are also connected to external testing equipment via leads, and their upper ends are connected to extension rods that extend upwards and pass through the second pin holes of the first-layer pin seat. The upper ends of the extension rods have second needle tips that, under the action of a spring inside the probe, extend into the test workpiece cavity.

2. The double-layer probe connector testing device according to claim 1, characterized in that: The lower ends of the first needle and the extension rod are concealed within the corresponding probe tube and connected to the internal needle within the probe tube.

3. The double-layer probe connector testing device according to claim 1, characterized in that: The upper end of the secondary probe has a cup-shaped needle, and an extension rod is inserted into the cup-shaped needle.

4. The double-layer probe connector testing device according to claim 3, characterized in that: The cup-shaped needle and the extension rod are fixedly connected as a whole.

5. The double-layer probe connector testing device according to claim 1, characterized in that: The secondary probe holder is H-shaped, leaving upper and lower spaces. The lower end of the first-layer probe is located in the upper space of the secondary probe holder, and the lower end of the secondary probe is located in the lower space of the secondary probe holder, which facilitates the connection of the first-layer probe and the secondary probe with the soldered leads to the external testing equipment.

6. The double-layer probe connector testing device according to claim 1, characterized in that: The upper end of the first-layer probe has a cup-shaped needle, into which a first needle is inserted.

7. The double-layer probe connector testing device according to claim 1, characterized in that: A probe plate is installed at the bottom of the cavity of the test workpiece. A through hole is opened on the probe plate corresponding to the first and second pin holes. The diameter of the through hole is smaller than that of the first and second pin holes. A slightly larger anti-detachment platform is formed on the first and second pin heads.

8. The double-layer probe connector testing device according to claim 1, characterized in that: The module body, the first-layer needle holder, and the second-layer needle holder are respectively formed with needle holder fixing holes, and the module body, the first-layer needle holder, and the second-layer needle holder are fixed together by means of fasteners.

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