Standard device for DIC system calibration
By designing clamping structures and diverse force application modes to adapt to different samples, and combining them with high-precision strain detection, the measurement accuracy and versatility issues of the DIC system calibration device have been solved, enabling precise calibration and diversified testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- XIAMEN METROLOGICAL VERIFICATION & TESTING INST
- Filing Date
- 2025-05-20
- Publication Date
- 2026-05-12
AI Technical Summary
Existing DIC system calibration devices have limitations in sample fixation, load application, and data benchmark acquisition, resulting in low measurement accuracy, poor versatility, and difficulty in meeting the requirements for simulation and high-precision calibration under complex stress conditions.
The design incorporates a clamping structure adaptable to different samples, diverse force application modes, and a high-precision strain detection module, including clamping arms, force transmission components, and strain gauges. It achieves precise clamping and force application through a tubular linear motor, combined with real-time data acquisition by a strain gauge.
It enables precise calibration of the DIC system, improves measurement reliability and applicability, avoids sample damage, adapts to samples of different sizes, and meets various testing needs.
Smart Images
Figure CN224231539U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of mechanical measurement and calibration, and in particular to a standard device for calibrating DIC systems. Background Technology
[0002] Digital image correlation (DIC) technology, with its advantages of non-contact and full-field measurement, is widely used in fields such as material mechanical property testing and structural deformation analysis.
[0003] However, the measurement accuracy of the DIC system depends on the reliability of the calibration process. Existing calibration devices have certain limitations in sample fixation, load application, and data benchmark acquisition: traditional clamping methods are prone to causing edge crushing damage or insecure fixation to samples such as flexible screens and ultra-thin devices, affecting test consistency; a single force application structure is difficult to simulate the complex three-point bending, four-point bending, or cantilever beam stress states in actual working conditions, resulting in insufficient calibration coverage scenarios; for samples of different sizes and specifications, it is necessary to frequently change special fixtures or devices, resulting in poor versatility; at the same time, the lack of high-precision real-time strain acquisition methods makes it difficult to guarantee the accuracy and completeness of calibration benchmark data, which restricts the application and promotion of the DIC system in precision measurement.
[0004] To address the aforementioned issues, this application proposes a standard device for calibrating DIC systems. By designing a clamping structure adaptable to different samples, diverse force application modes, and a high-precision strain detection module, it achieves accurate calibration of DIC systems, effectively improving measurement reliability and applicability. Utility Model Content
[0005] In view of the problems existing in the prior art, this utility model proposes a standard device for DIC system calibration to solve the above problems.
[0006] This application proposes a standard device for DIC system calibration, including a base, a drive device, and a sample to be tested. The drive device is fixed to the back of the base, and the output end of the drive device extends to the front of the base. A clamping arm is vertically arranged on the front edge of the base. The clamping arm has a clamping part for clamping the edge of the sample to be tested, and the output end abuts against the back of the sample to be tested and pushes the sample to be tested to deform.
[0007] By adopting the above technical solution, the edge of the sample to be tested is fixed by the clamping part, and then the output end of the driving device pushes the sample to be tested from the back to the front, causing it to deform. The stress generated is then measured by other strain detection devices, and the DIC system further measures the deformed sample to be tested. The stress value measured by the standard device is used as a reference. If the two results are equal, no calibration is required; otherwise, calibration is required.
[0008] Preferably, the clamping arms are symmetrically arranged on the upper and lower sides of the front of the base, and the output end penetrates the middle of the base and abuts against the center of the back of the sample to be tested.
[0009] By adopting the above technical solution, the output end pushes the center of the back side of the sample to be tested to bulge and deform in the front direction. This deformation, combined with the upper and lower clamping arms, forms a three-point deformation. The symmetrical three-point force structure can accurately simulate the stress state of the sample in actual application scenarios, making it easy to collect data such as deformation and stress distribution at various points on the sample surface in real time through the strain detection device.
[0010] In a further preferred embodiment, a force transmission component is detachably installed on the output end. The force transmission component includes a base and a force transmission arm. The center of the back of the base is connected to the output end and is vertically arranged on the front of the base, and is symmetrically distributed on the upper and lower edges of the base.
[0011] By adopting the above technical solution, an additional force transmission component is installed on the output end. Using symmetrical force transmission arms and symmetrical clamping arms, when the output end pushes the sample to be tested in the forward direction, the two force transmission arms push the sample to be tested to bulge forward and deform, forming a four-point deformation with the clamping arms. Compared with the three-point structure, the four-point deformation structure can more accurately simulate the mechanical response of materials under complex stress conditions. Furthermore, by adjusting the relative position and force magnitude of the force transmission arms and clamping arms, various testing requirements can be met.
[0012] Preferably, the clamping arm is located at the lower edge of the front of the base, and the output end abuts against the upper back of the sample to be tested.
[0013] By adopting the above technical solution, the clamping arm clamps the lower edge of the sample to be tested, and then the output end pushes the upper part to produce a convex deformation. This structure is similar to a cantilever beam structure. For different samples to be tested, the deformation law of the sample under different stress states can be systematically studied by adjusting the loading force and loading speed of the output end. In the process of calibrating the DIC system, the standard device of the above three force application methods is required to deform the sample to be tested and measure the stress. Then the DIC system measures the sample to be tested under the three force application methods, and determines whether it needs to be calibrated based on the measurement results of the DIC system.
[0014] Preferably, the clamping part is a clamping groove formed in the middle of the clamping arm, and the width of the clamping groove is adapted to the thickness of the sample to be tested.
[0015] By adopting the above technical solution, the sample to be tested can be directly inserted into the clamping slot for fixation without the need for additional fixing devices. This allows for rapid fixation of samples such as flexible screens, effectively improving testing efficiency. The clamping slot's design, which is adapted to the sample thickness, ensures uniform force on the contact surface. This prevents the sample from slipping due to excessively loose clamping, which could affect testing accuracy, while also avoiding edge damage caused by excessively tight clamping. This is particularly suitable for flexible electronic devices with high surface quality requirements.
[0016] Preferably, the clamping part is a gripper located at the end of the clamping arm.
[0017] By adopting the above technical solution, the edge of the sample to be tested is accurately positioned by the gripper, and the adjustable clamping force adapts to materials with different thicknesses and hardnesses. It is especially suitable for fixing ultra-thin flexible screens or irregularly shaped structural parts, avoiding damage to the sample surface caused by traditional clamps.
[0018] Preferably, the front of the base is also provided with a size adjustment mechanism that guides the upper and lower parts, and the clamping arm is slidably connected to the size adjustment mechanism.
[0019] By adopting the above technical solution, when clamping samples of different sizes, the clamping position of the clamping arm can be adjusted by the size adjustment mechanism, so that the standard device can adapt to more types of samples and there is no need to design standard devices of different sizes for different samples.
[0020] In a further preferred embodiment, the size adjustment mechanism includes a slide rail and a slider, the back of the slide rail being connected to the front of the base, and the clamping arm cooperating with the slider and sliding along the slide rail.
[0021] By adopting the above technical solution, the sliding cooperation between the slider and the slide rail allows the clamping arm to slide up and down along the slide rail on the front of the base, which facilitates quick adjustment of the clamping size. In addition, a displacement locking structure can be set between the slider and the rail to slide the clamping arm to a suitable size position and prevent it from deviating.
[0022] Preferably, the driving device is a tubular linear motor.
[0023] By adopting the above technical solution, the tubular linear motor directly generates linear motion without the need for a transmission conversion mechanism, which can achieve high positioning accuracy and stable speed control, ensuring that precise displacement or force load is applied to the sample to be tested, and significantly improving the measurement accuracy of the standard device.
[0024] Preferably, it also includes a strain gauge attached to the front of the sample to be tested, and the strain gauge is connected to the strain gauge via a circuit.
[0025] By adopting the above technical solution, the strain gauge can directly sense the minute deformation of the sample surface and convert it into an electrical signal. After high-speed acquisition and amplification by the strain gauge, the strain data can be output in real time with extremely high temporal and spatial resolution, providing accurate reference values for DIC system calibration and effectively reducing calibration errors.
[0026] Compared with the prior art, the beneficial effects of this application are as follows:
[0027] The standard device of this application utilizes a combination of clamping arms and various clamping parts to quickly and non-destructively fix different types of test samples, avoiding surface damage; multiple force application methods (three-point, four-point, cantilever beam structure) accurately simulate actual stress conditions to meet diverse testing needs; the size adjustment mechanism allows the device to adapt to samples of different sizes, improving versatility; strain gauges and strain meters collect sample strain data in real time, providing a reliable benchmark for calibration. Attached Figure Description
[0028] The accompanying drawings are included to provide a further understanding of the embodiments and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments and, together with the description, serve to explain the principles of the present invention. Other embodiments and many anticipated advantages of the embodiments will be readily recognized as they become better understood through reference to the following detailed description. Elements in the drawings are not necessarily to scale. The same reference numerals refer to corresponding similar parts.
[0029] Figure 1 This is a schematic diagram of a three-point bending standard device according to an embodiment of this application;
[0030] Figure 2 This is a schematic diagram of a four-point bending standard device structure according to a specific embodiment of this application;
[0031] Figure 3 This is a schematic diagram of a cantilever beam standard device structure according to a specific embodiment of this application;
[0032] Figure 4 This is a schematic diagram of another clamping arm structure according to a specific embodiment of this application;
[0033] Figure 5 This is a schematic diagram of the clamping arm installation according to a specific embodiment of this application.
[0034] The meaning of each number in the diagram:
[0035] Base 01, drive device 02, sample to be tested 03, output end 04, clamping arm 05, clamping part 06, strain gauge 07, strain meter 08, base 09, force transmission arm 10, clamping groove 11, gripper 12, slide rail 13, slider 14. Detailed Implementation
[0036] In the following detailed description, reference is made to the accompanying drawings, which form part of the detailed description and illustrate illustrative specific embodiments in which the present invention may be practiced. In this regard, directional terms such as “top,” “bottom,” “left,” “right,” “up,” “down,” etc., are used with reference to the orientation of the described figures. Because components of the embodiments can be positioned in several different orientations, directional terms are used for illustrative purposes and are by no means limiting. It should be understood that other embodiments may be utilized or logical changes may be made without departing from the scope of the present invention. Therefore, the following detailed description should not be taken in a limiting sense, and the scope of the present invention is defined by the appended claims.
[0037] This application proposes a standard apparatus for calibrating DIC systems. Figure 1 A schematic diagram of a three-point bending standard device structure according to an embodiment of this application is shown, as follows: Figure 1 As shown, the device includes a base 01, a driving device 02, and a sample 03 to be tested. The driving device 02 is fixed to the back of the base 01, and the output end 04 of the driving device 02 penetrates to the front of the base 01. A clamping arm 05 is vertically arranged on the front edge of the base 01. The clamping arm 05 has a clamping part 06 for clamping the edge of the sample 03 to be tested. The output end 04 abuts against the back of the sample 03 to be tested and pushes the sample 03 to be tested to deform.
[0038] Preferably, the drive device 02 is a tubular linear motor, which directly generates linear motion without the need for a transmission conversion mechanism, thus achieving high positioning accuracy and stable speed control.
[0039] Preferably, it also includes a strain gauge 07 attached to the front of the sample 03 to be tested. The strain gauge 07 is connected to the strain meter 08 through a circuit. The strain gauge 07 can directly sense the minute deformation of the sample surface and convert it into an electrical signal. After being acquired and amplified by the strain meter 08 at high speed, the strain data can be output in real time with extremely high time and spatial resolution, providing accurate reference values for the calibration of the DIC system.
[0040] In use, the edge of the sample 03 to be tested (a flexible screen in this embodiment) is clamped by the clamping part 06. The output end 04 of the driving device 02 pushes the sample 03 to deform to the right in the figure. At this time, the strain gauge 07 attached to the front of the sample 03 can convert the stress generated by the deformation into an electrical signal. After being collected and processed by the strain gauge 08, the strain data is output in real time. Then, the DIC system is used to measure the sample 03 tested by the calibration device. The stress value measured by the standard device is used as a reference. If the two results are equal, no calibration is required; otherwise, calibration is required.
[0041] Figure 2A schematic diagram of a four-point bending standard device structure according to a specific embodiment of this application is shown, such as... Figure 1-2 As shown, the clamping arms 05 are symmetrically arranged on the upper and lower sides of the front of the base 01, and the output end 04 penetrates the middle of the base 01 and abuts against the center of the back of the sample 03 to be tested.
[0042] Preferably, a force transmission component is detachably installed on the output end 04. The force transmission component includes a base 09 and a force transmission arm 10. The center of the back of the base 09 is connected to the output end 04 and is vertically arranged on the front of the base 09 and symmetrically distributed on the upper and lower edges of the base 09.
[0043] The base 09 and the output end 04 are detachable. When the base 09 is installed, the standard device is a four-point bending type. When the base 09 is removed, the standard device is a three-point bending type.
[0044] When using the force transmission components, the two force transmission arms 10 push the sample 03 to be tested to bulge and deform in front, forming a four-point deformation with the clamping arm 05. Compared with the three-point structure, the four-point deformation structure can more accurately simulate the mechanical response of materials under complex stress conditions. Furthermore, by adjusting the relative position and the magnitude of the force between the force transmission arm 10 and the clamping arm 05, various testing requirements can be met.
[0045] Figure 3 A schematic diagram of a cantilever beam standard device structure according to a specific embodiment of this application is shown, such as... Figure 1-3 As shown, the clamping arm 05 is located on the lower edge of the front of the base 01, and the output end 04 abuts against the upper back of the sample 03 to be tested.
[0046] The clamping arm 05 clamps the lower edge of the sample 03 to be tested, and then the output end 04 pushes the upper part to produce a convex deformation. This structure is similar to a cantilever beam structure. For different samples 03 to be tested, the deformation law of the sample under different stress states can be studied by adjusting the loading force and loading speed of the output end 04. During the calibration of the DIC system, the standard device of the above three force application methods is required to deform the sample 03 to be tested and measure the stress. Then the DIC system measures the sample 03 under the three force application methods. Based on the measurement results of the DIC system, it is determined whether it needs to be calibrated.
[0047] Preferably, the clamping part 06 is a clamping groove 11 formed in the middle of the clamping arm 05, and the width of the clamping groove 11 is adapted to the thickness of the sample 03 to be tested.
[0048] Specifically, the sample 03 to be tested can be directly inserted into the clamping slot 11 for fixation without the need for additional fixing devices. This allows for quick fixation of the sample 03, which is designed for flexible screens. This prevents the sample from sliding due to loose clamping, which could affect the test accuracy, and also avoids damage to the sample edges due to excessive clamping.
[0049] Figure 4 A schematic diagram of another clamping arm structure according to a specific embodiment of this application is shown, such as... Figure 1-4 As shown, the clamping part 06 is a jaw 12 located at the end of the clamping arm 05. The jaw 12 has an adjustable clamping force structure. This structure can adopt a spiral clamping structure, which is existing technology and will not be described in detail here. The jaw 12 is used to accurately position the edge of the sample 03 to be tested. The adjustable clamping force adapts to materials with different thicknesses and hardnesses. It is especially suitable for fixing ultra-thin flexible screens or irregularly shaped structural parts, avoiding damage to the sample surface caused by traditional clamps.
[0050] Figure 5 A schematic diagram of the clamping arm installation according to a specific embodiment of this application is shown, such as... Figure 1-5 As shown, the front of the base 01 is also provided with a size adjustment mechanism that guides the upper and lower parts. The clamping arm 05 is slidably connected to the size adjustment mechanism. When clamping samples 03 of different sizes, the clamping position of the clamping arm 05 can be adjusted by the size adjustment mechanism, so that the standard device can adapt to more types of samples 03. There is no need to design standard devices of different sizes for different samples 03, saving costs.
[0051] Preferably, the size adjustment mechanism includes a slide rail 13 and a slider 14. The back of the slide rail 13 is connected to the front of the base 01, and the clamping arm 05 cooperates with the slider 14 and slides along the slide rail 13.
[0052] Specifically, by utilizing the sliding engagement between the slider 14 and the slide rail 13, the clamping arm 05 can slide up and down along the slide rail 13 on the front of the base 01, which facilitates quick adjustment of the clamping size. Furthermore, a displacement locking structure can be set between the slider 14 and the rail. By locking the relative position of the slider 14 and the slide rail 13, the clamping arm 05 can be slid to a suitable size position to prevent it from shifting.
[0053] Obviously, those skilled in the art can make various modifications and changes to the embodiments of this utility model without departing from the spirit and scope of this utility model. In this way, this utility model is also intended to cover such modifications and changes if they fall within the scope of the claims of this utility model and their equivalents. The word "comprising" does not exclude the presence of other elements or steps not listed in the claims. The simple fact that certain measures are described in mutually different dependent claims does not indicate that a combination of these measures cannot be used for profit. Any reference numerals in the claims should not be considered as limiting the scope.
Claims
1. A standard device for DIC system calibration, characterized in that, Including base, drive device and sample to be measured, the drive device is fixed on the back of the base, and the output end of the drive device penetrates to the front of the base; The edge of the front of the base is vertically provided with a clamping arm, the clamping arm has a clamping part for clamping the edge of the sample to be measured, and the output end abuts against the back of the sample to be measured and pushes the sample to be measured to deform.
2. The apparatus of claim 1, wherein, The clamping arm is symmetrically arranged on the upper and lower edges of the front of the base, and the output end penetrates the middle of the base and abuts against the center of the back of the sample to be measured.
3. The apparatus of claim 2, wherein, The output end is detachably provided with a force transmitting member, the force transmitting member comprises a base and a force transmitting arm, the back center of the base is connected with the output end, and the front of the base is vertically arranged, and the upper and lower edges of the base are symmetrically distributed.
4. The apparatus of claim 1, wherein, The clamping arm is arranged on the lower edge of the front of the base, and the output end abuts against the upper part of the back of the sample to be measured.
5. The apparatus of claim 1, wherein, The clamping part is a clamping groove opened in the middle of the clamping arm, and the width of the clamping groove is matched with the thickness of the sample to be measured.
6. The apparatus of claim 1, wherein, The clamping part is a clamping jaw arranged at the end of the clamping arm.
7. The apparatus of claim 1, wherein, The front of the base is also provided with an up-and-down guiding size adjusting mechanism, and the clamping arm is slidably connected with the size adjusting mechanism.
8. The apparatus of claim 7, wherein, The size adjusting mechanism comprises a sliding rail and a sliding block, the back of the sliding rail is connected with the front of the base, and the clamping arm is matched with the sliding block and slides along the sliding rail.
9. The apparatus of claim 1, wherein, The drive device is a tubular linear motor.
10. The apparatus of claim 1, wherein, A strain gauge is also attached to the front of the sample to be measured, and the strain gauge is connected with a strain meter through a circuit.