A testing device for processing mechanical keyboard chips
The integrated detection device enables rapid movement and precise positioning of the mechanical keyboard chip, solving the problems of low detection efficiency and insufficient accuracy in existing technologies, and improving detection speed and accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- RUILIAN MICRO TECH (SHENZHEN) CO LTD
- Filing Date
- 2025-05-30
- Publication Date
- 2026-05-26
AI Technical Summary
Existing mechanical keyboard chip testing equipment is inefficient, labor-intensive, and lacks standardized testing criteria. It is difficult to test the deformation accuracy and compressive strength of the spring sheet, and the chip is prone to displacement during testing, leading to inaccurate test results.
An integrated testing device was designed, including a testing stage, a testing track, a testing mechanism, and a positioning gripper. The testing track enables rapid movement and positioning of the chip, the positioning gripper forms a positioning cavity for precise positioning, and a buffer structure and pressure sensor are combined to improve testing accuracy and efficiency.
This improves the detection rate and accuracy of mechanical keyboard chips, reduces chip offset and damage during testing, and ensures the accuracy and efficiency of testing.
Smart Images
Figure CN224286539U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of mechanical keyboard manufacturing technology, and in particular to a testing device for processing mechanical keyboard chips. Background Technology
[0002] The mechanical keyboard chip is a core component of the keyboard, and its manufacturing quality directly affects the keyboard's tactile feedback, response speed, and lifespan. Currently, the inspection of mechanical keyboard chips mainly relies on visual inspection or traditional optical inspection equipment. These methods suffer from low efficiency, high labor intensity, and inconsistent inspection standards, easily leading to missed or false detections. Furthermore, most existing automated inspection equipment only detects external defects (such as scratches and damage) and struggles to effectively inspect critical functional parameters such as spring deformation precision and chip compressive strength.
[0003] In addition, the existing testing equipment has a simple test stand structure. When the chip is placed on the test stand with the help of the grippers, there is a possibility of displacement. In this case, when the chip is subjected to deformation testing, the displacement will cause the pressure point to shift, which will affect the test structure. Furthermore, when the displaced chip is transferred away by the processing grippers after the test is completed, it needs to be readjusted, which will lead to a decrease in the processing and testing speed. Utility Model Content
[0004] The main objective of this invention is to provide a testing device for processing mechanical keyboard chips, which aims to achieve a high degree of integration in the testing device and improve the accuracy of the testing.
[0005] To achieve the above objectives, this utility model proposes a testing device for processing mechanical keyboard chips, including a testing table, a testing track and a testing mechanism on the testing table, a transfer unit connected to the testing track, a testing seat driven and connected on the testing track, the testing track passing through the testing mechanism, and a testing position provided on the testing seat facing the testing mechanism.
[0006] The end face of the detection seat facing the detection mechanism is provided with a positioning structure. The positioning structure includes multiple positioning claws, which are arranged opposite to each other. When the multiple positioning claws are closed, they are connected to the detection position and form a positioning cavity relative to the detection position.
[0007] In one embodiment of this application, the top of the detection seat is provided with a clearance groove relative to the detection mechanism. The clearance groove is located below the detection position. The bottom of the positioning gripper is connected to a buffer plate. When multiple positioning grippers are closed, the buffer plate is connected to the positioning cavity.
[0008] In one embodiment of this application, the detection seat is provided with a mounting part relative to the clearance groove, the mounting part is provided with a buffer structure facing the detection position, and the end face of the buffer structure facing the buffer plate is provided with a pressure sensor.
[0009] In one embodiment of this application, the buffer structure includes a support column and a buffer spring. The support column is rotatably connected to the mounting part, and the support column and the mounting part are clamped together to form a connecting part. The buffer spring passes through the connecting part and is connected to the support column.
[0010] In one embodiment of this application, the detection mechanism includes a mounting gantry, a detection cylinder, and a detection component. The mounting gantry surrounds the detection track, the detection cylinder is connected to the mounting gantry and is positioned toward the detection position, the detection cylinder is driven and connected to the detection component, and the detection component has a stabilizing structure away from the detection cylinder.
[0011] In one embodiment of this application, the stabilizing structure includes a stabilizing frame and a connecting plate. The connecting plate is connected to one end of the stabilizing frame facing the detection position. A plurality of guide posts are arranged in a peripheral array on the stabilizing frame. A reset spring is sleeved on the guide post. The connecting plate passes through the guide post and is connected to the reset spring.
[0012] The outer periphery of the connecting plate is provided with a clearance groove, the stabilizer is provided with a stabilizing part opposite to the clearance groove, and the end of the stabilizing part away from the stabilizer is provided with a limiting part opposite to the connecting plate.
[0013] By adopting the above technical solution, this utility model has the following advantages:
[0014] 1. The chip testing mechanism is located on the testing platform, and the testing platform is also equipped with a testing track. The testing holder for placing the chip to be tested can move between the testing mechanism and the transfer unit through the testing track. The testing holder can use the testing position to place the chip. The testing mechanism can quickly perform testing, and the transfer unit can quickly load and unload the chip. This allows the above mechanism to install its testing platform in a transitional part of the chip processing process. When the chip needs to be transferred during the processing, it can be transferred through the mechanism of this application, and chip testing can be performed at the same time as the transfer. This can effectively improve the integration of the whole machine and effectively improve the chip processing and testing speed.
[0015] 2. The top of the detection seat is equipped with a positioning structure relative to the detection mechanism. The positioning structure itself includes multiple positioning jaws. When the multiple positioning jaws are closed under the action of the cylinder, they will be connected to the detection position, and the multiple positioning jaws can form a positioning cavity. The shape of the positioning cavity can be designed according to the shape of the chip, so that when the positioning jaws are closed, its internal space can precisely restrict the chip. During the process of forming the positioning cavity, the positioning jaws can gradually push the chip to adjust the orientation of the chip and limit the chip. By positioning and limiting the chip through the above structure, the detection accuracy can be effectively guaranteed. After the chip is limited, its orientation will not change after the test is completed, and it can be quickly unloaded and quickly processed, which is conducive to improving detection accuracy and detection efficiency. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.
[0017] Figure 1 This is a schematic diagram of the structure of the testing device for processing mechanical keyboard chips according to this utility model;
[0018] Figure 2 This is a cross-sectional view of the testing device for processing mechanical keyboard chips according to this utility model;
[0019] Figure 3 This is a schematic diagram of the structure of the testing base of the testing device for processing mechanical keyboard chips according to this utility model.
[0020] Explanation of icon numbers:
[0021] 1. Testing table; 2. Testing track; 3. Testing seat; 31. Clearance groove; 32. Mounting part; 4. Buffer structure; 41. Support column; 42. Buffer spring; 5. Positioning structure; 51. Positioning gripper; 52. Buffer plate; 6. Testing mechanism; 61. Mounting gantry; 62. Testing cylinder; 63. Testing component; 7. Stabilizing structure; 71. Stabilizing frame; 72. Guide column; 73. Stabilizing part; 74. Connecting plate.
[0022] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation
[0023] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.
[0024] Reference Figures 1 to 3 To achieve the above objectives, this utility model proposes a testing device for processing mechanical keyboard chips, including a testing table 1, a testing track 2 and a testing mechanism 6 on the testing table 1, a transfer unit connected to the testing track 2, a testing seat 3 driven and connected to the testing track 2, the testing track 2 passing through the testing mechanism 6, and a testing position provided on the testing seat 3 facing the testing mechanism 6.
[0025] The end face of the detection seat 3 facing the detection mechanism 6 is provided with a positioning structure 5. The positioning structure 5 includes multiple positioning claws 51. The multiple positioning claws 51 are arranged opposite to each other. When the multiple positioning claws 51 are closed, the multiple positioning claws 51 are connected to the detection position and form a positioning cavity relative to the detection position.
[0026] The chip testing mechanism 6 is located on the testing station 1, and the testing station 1 is also equipped with a testing track 2. The testing seat 3, which is used to place the chip to be tested, can move between the testing mechanism 6 and the transfer unit through the testing track 2. The testing seat 3 can use the testing position to place the chip. The testing mechanism 6 can quickly perform testing, and the transfer unit can quickly load and unload the chip. This allows the above mechanism to install its testing station 1 in a transitional part of the chip processing process. When the chip needs to be transferred during the processing, it can be transferred through the mechanism of this application, and chip testing can be performed at the same time as the transfer. This can effectively improve the integration of the whole machine and effectively improve the chip processing and testing speed.
[0027] The top of the detection seat 3 is provided with a positioning structure 5 relative to the detection mechanism 6. The positioning structure 5 itself includes multiple positioning jaws 51. When the multiple positioning jaws 51 are closed under the action of the cylinder, they will be connected to the detection position, and the multiple positioning jaws 51 can form a positioning cavity. The shape of the positioning cavity can be designed according to the shape of the chip, so that when the positioning jaws 51 are closed, their internal space can just restrict the chip. During the process of forming the positioning cavity, the positioning jaws 51 can gradually push the chip to adjust the orientation of the chip and limit the chip. By positioning and limiting the chip through the above structure, the detection accuracy can be effectively guaranteed. After the chip is limited, its orientation will not change after the test is completed. It can be quickly unloaded and quickly processed, which is conducive to improving detection accuracy and detection efficiency.
[0028] See also Figures 2 to 3In one embodiment of this application, the top of the detection seat 3 is provided with a clearance groove 31 relative to the detection mechanism 6. The clearance groove 31 is located below the detection position. The bottom of the positioning claw 51 is connected to a buffer plate 52. When multiple positioning claws 51 are closed, the buffer plate 52 is connected to the positioning cavity.
[0029] Because the chip itself only needs to have a certain deformation accuracy, the force it receives during pressure testing cannot be too great. Therefore, a clearance groove 31 is provided on the detection seat 3 so that the detection position can be suspended. A whole buffer plate 52 is provided at the bottom of the positioning gripper 51. The buffer plate 52 itself has a certain elasticity, which can reduce the impact received by the chip and avoid chip damage. It can quickly test while avoiding chip damage during testing.
[0030] See also Figures 2 to 3 In one embodiment of this application, the detection seat 3 is provided with a mounting part 32 relative to the clearance groove 31, the mounting part 32 is provided with a buffer structure 4 facing the detection position, and the end face of the buffer structure 4 facing the buffer plate 52 is provided with a pressure sensor.
[0031] The test fixture 3 is provided with a mounting part 32. A buffer structure 4 can be set relative to the buffer carrier plate 52 through the mounting part 32. A pressure sensor can be set on the buffer structure 4 to ensure test accuracy. The buffer structure 4 can serve as a support structure for the buffer carrier plate 52 to prevent the impact received by the chip from being completely absorbed by the buffer carrier plate 52, which would lead to inaccurate testing of the chip status.
[0032] See also Figures 2 to 3 In one embodiment of this application, the buffer structure 4 includes a support column 41 and a buffer spring 42. The support column 41 is rotatably connected to the mounting part 32. The support column 41 and the mounting part 32 are clamped together to form a connecting part. The buffer spring 42 passes through the connecting part and is connected to the support column 41.
[0033] The buffer structure 4 itself includes a support column 41 and a buffer spring 42. In one embodiment of this application, the support column 41 is a hexahedron, and the cross-section of the support column 41 is approximately a parallelogram. One end of the support column 41 is rotatably connected to the mounting part 32, and a pressure sensor is provided on the top of the support column 41. When the pressure sensor is facing the test position, the support column 41 and the mounting part 32 will naturally form an inclined surface, which facilitates the connection of the buffer spring 42 to the mounting part 32 and the support column 41. Through this structure, the pressure sensor can accurately test the pressure state, and in conjunction with the state of the chip itself, the test accuracy can be effectively improved.
[0034] See also Figure 1In one embodiment of this application, the detection mechanism 6 includes a mounting gantry 61, a detection cylinder 62, and a detection component 63. The mounting gantry 61 is wrapped around the detection track 2. The detection cylinder 62 is connected to the mounting gantry 61 and is positioned toward the detection position. The detection cylinder 62 is driven and connected to the detection component 63. The detection component 63 is provided with a stabilizing structure 7 away from the detection cylinder 62.
[0035] Installing the gantry 61 facilitates the installation of the testing cylinder 62 and the testing component 63, and allows the mounting base to be easily installed under the gantry 61 for rapid testing. The testing cylinder 62 can drive the testing component 63 to press down. The testing component 63 is positioned directly opposite the positioning cavity. The end of the testing component 63 is provided with a stabilizing structure 7 to ensure the stability of the force applied to the testing component 63 and to prevent the chip from being damaged due to improper testing methods.
[0036] See also Figure 1 In one embodiment of this application, the stabilizing structure 7 includes a stabilizing frame 71 and a connecting plate 74. The connecting plate 74 is connected to one end of the stabilizing frame 71 facing the detection position. The periphery of the stabilizing frame 71 is provided with a plurality of guide posts 72. A reset spring is sleeved on the guide post 72. The connecting plate 74 passes through the guide post 72 and is connected to the reset spring.
[0037] The outer periphery of the connecting plate 74 is provided with a clearance groove, and the stabilizing frame 71 is provided with a stabilizing part 73 opposite to the clearance groove. The end of the stabilizing part 73 away from the stabilizing frame 71 is provided with a limiting part opposite to the connecting plate 74.
[0038] The stabilizer 71 and the connecting plate 74 are connected to the detection piece 63. The stabilizer 71 and the connecting plate 74 are connected and restricted by the guide post 72 and the return spring. The various structures cooperate with each other to effectively restrict the movement direction of the detection piece 63 and ensure the accuracy of the landing point of the detection piece 63.
[0039] The strength of the stabilizing structure 7 itself can be further improved by the stabilizing part 73, which is arranged opposite to the detection part 63 on the outer periphery of the connecting plate 74 and the stabilizing frame 71. The end of the stabilizing part 73 is provided with a limiting part, which is used to prevent the connecting plate 74 from falling out of the stabilizing structure 7, thus effectively ensuring the structural stability of the entire stabilizing structure 7. The above structure can ensure the high integration of the whole machine and improve the testing accuracy.
[0040] In the accompanying drawings of this embodiment, the same or similar reference numerals correspond to the same or similar components. In the description of this application, it should be understood that if terms such as "upper," "lower," "left," and "right" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, they are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms used to describe positional relationships in the accompanying drawings are only for illustrative purposes and should not be construed as limiting this patent. For those skilled in the art, the specific meaning of the above terms can be understood according to the specific circumstances.
[0041] The above are merely preferred embodiments of this application and are not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.
Claims
1. A testing device for processing mechanical keyboard chips, comprising a testing table, characterized in that, The testing platform is equipped with a testing track and a testing mechanism. The testing track is connected to a transfer unit, and a testing seat is driven and connected to the testing track. The testing track passes through the testing mechanism, and the testing seat is provided with a testing position facing the testing mechanism. The end face of the detection seat facing the detection mechanism is provided with a positioning structure. The positioning structure includes multiple positioning claws, which are arranged opposite to each other. When the multiple positioning claws are closed, they are connected to the detection position and form a positioning cavity relative to the detection position.
2. The testing device for processing mechanical keyboard chips according to claim 1, characterized in that, The top of the detection seat has a clearance groove relative to the detection mechanism. The clearance groove is located below the detection position. The bottom of the positioning gripper is connected to a buffer plate. When multiple positioning grippers are closed, the buffer plate is connected to the positioning cavity.
3. The testing device for processing mechanical keyboard chips according to claim 2, characterized in that, The detection seat has an installation part relative to the clearance groove, the installation part has a buffer structure facing the detection position, and the end face of the buffer structure facing the buffer plate has a pressure sensor.
4. The testing device for processing mechanical keyboard chips according to claim 3, characterized in that, The buffer structure includes a support column and a buffer spring. The support column is rotatably connected to the mounting part, and the support column and the mounting part are clamped together to form a connecting part. The buffer spring passes through the connecting part and is connected to the support column.
5. The testing device for processing mechanical keyboard chips according to claim 1, characterized in that, The testing mechanism includes a mounting gantry, a testing cylinder, and a testing component. The mounting gantry is wrapped around the testing track. The testing cylinder is connected to the mounting gantry and is positioned towards the testing position. The testing cylinder is driven and connected to the testing component. The testing component has a stabilizing structure away from the testing cylinder.
6. The testing device for processing mechanical keyboard chips according to claim 5, characterized in that, The stabilizing structure includes a stabilizing frame and a connecting plate. The connecting plate is connected to one end of the stabilizing frame facing the detection position. The periphery of the stabilizing frame is provided with a plurality of guide posts. A reset spring is sleeved on the guide posts. The connecting plate passes through the guide posts and is connected to the reset spring. The outer periphery of the connecting plate is provided with a clearance groove, the stabilizer is provided with a stabilizing part opposite to the clearance groove, and the end of the stabilizing part away from the stabilizer is provided with a limiting part opposite to the connecting plate.