Auxiliary device for testing drawing force of chip

Abstract

The utility model discloses an auxiliary device for testing the drawing force of a chip. The chip drawing force testing auxiliary device comprises a force sensing module, a limiting protection mechanism and a testing mechanism, one end of the testing mechanism is connected with the force sensing module, the other end of the testing mechanism is used for being connected with a chip to be tested, and the limiting protection mechanism comprises a limiting base and a limiting locking piece. The limiting base and the limiting locking piece can be configured to be in a locking state and an unlocking state, and when the limiting base and the limiting locking piece are configured to be in the unlocking state, the testing mechanism and the limiting base are separated, and drawing force testing is conducted on the chip to be tested; when the limiting base and the limiting locking piece are configured to be in the locking state, the testing mechanism is fixed to the limiting base, displacement of the testing mechanism is limited, the force sensing module can be better protected, the force sensing module is prevented from being damaged due to accidental mistaken touch or collision, and the accuracy and reliability of the testing result can be guaranteed.

Description

Technical Field

[0001] This utility model relates to the field of chip pull-out force testing technology, and in particular to an auxiliary device for chip pull-out force testing. Background Technology

[0002] With the rapid development of the social economy, the consumer electronics field is iterating at an increasingly rapid pace, and the design and manufacturing of display modules are constantly evolving towards thinner, lighter, and more intelligent designs. In this process, the screens of traditional 3C electronic products have shifted from LCD backlight modules to OLED screens. This shift has not only significantly improved display effects and color saturation but also greatly enhanced the user's visual experience. With the shift from LCD to OLED screens, the entire display module has also changed. What was originally a single light strip has become an entire screen composed of very small LED beads, resulting in a more uniform and delicate display effect. However, this has brought about changes in the manufacturing process, requiring the precise assembly of each LED bead onto the backplane. Under the new process, the chip may not be able to successfully detach from the UV film, necessitating a method to quickly assess the adhesion between the chip and the UV film.

[0003] In traditional testing, tape adhesion is typically assessed using standard 90° or 180° peel strength tests, evaluating the adhesion at a width of 25mm. However, with advancements in display technology, MiniLEDs have reached sizes of 0.2*0.2mm, necessitating adhesion testing for smaller dimensions.

[0004] While initial testing was feasible, further technological advancements and the miniaturization of chip sizes, coupled with the evolution of LED technology from MiniLED to even smaller MicroLEDs (measuring only 0.05*0.1mm), have highlighted the limitations of traditional peel force testing (for 25mm wide tape). More critically, due to the extremely small chip size, typical testing equipment lacks adequate sensor protection structures. When performing pull-out force tests on micron-sized chips, the sensors, lacking buffering designs or miniaturized protective components, are highly susceptible to malfunction upon contact with the chip, leading to inaccurate force measurements. This lack of sensor protection results in inaccurate measurements, not only hindering reliable assessment of the adhesion between the MicroLED chip and the UV film but also making it difficult to standardize downstream assembly processes and depriving incoming material inspection of quantitative references.

[0005] Therefore, there is an urgent need for a testing solution for micron-sized chips, which can solve the measurement failure problem caused by the reduction in chip size by optimizing the design of sensor protection structure. Utility Model Content

[0006] The main purpose of this invention is to provide an auxiliary device for chip pull-out force testing, thereby overcoming the shortcomings of the prior art.

[0007] To achieve the aforementioned objectives, the technical solution adopted by this utility model includes:

[0008] This utility model provides an auxiliary device for chip pull-out force testing, including a force sensing module, a limit protection mechanism, and a testing mechanism. One end of the testing mechanism is connected to the force sensing module, and the other end is used to connect to the chip under test. The limit protection mechanism includes a limit base and a limit locking component, which can be configured to a locked state and an unlocked state. When the limit base and limit locking component are configured to the locked state, the testing mechanism is fixed to the limit base; when the limit base and limit locking component are configured to the unlocked state, the testing mechanism is separated from the limit base, and the pull-out force test is performed on the chip under test.

[0009] In some more specific embodiments, the chip pull-out force testing auxiliary device further includes a supporting top plate. The force sensing module is disposed on the lower surface of the supporting top plate. The limiting base includes a fixed part and a limiting part connected together. The fixed part is connected to the supporting top plate, and the limiting part is located below the force sensing module. The limiting part has a limiting channel along a first direction. The limiting locking member passes through the limiting channel along a second direction and can be configured to be in a locked and unlocked state with the limiting part. The testing mechanism passes through the limiting channel, with one end connected to the force sensing module and the other end used to connect to the chip under test. The first direction is perpendicular to the lower surface of the supporting top plate, and the second direction is parallel to the lower surface of the supporting top plate. The force sensing module can be a force sensor.

[0010] In some more specific solutions, the fixing part extends along a first direction and is fixedly connected to the lower surface of the supporting top plate. The length of the fixing part along the first direction is greater than the length of the force sensing module along the first direction. The limiting part extends along a second direction and is disposed in the area below the force sensing module. The force sensing module is connected to the supporting top plate by a first fastener.

[0011] In some more specific solutions, the fixing part includes a first fixing member and a second fixing member that are connected to each other. The first fixing member, the second fixing member, and the limiting part are integrally connected in a Z-shape. The first fixing member is connected to the supporting top plate by a second fastener.

[0012] In some more specific solutions, the testing mechanism includes a force transmitter and a test probe assembly. The force transmitter passes through the limiting channel, with one end connected to the force sensing module and the other end connected to the test probe assembly. When the limiting part and the limiting locking member are configured in a locked state, the limiting locking member inserts into the limiting channel and locks the force transmitter with the force transmitter, thus locking the force transmitter to the limiting part. The end of the test probe assembly away from the force transmitter is used to connect to the chip under test. The force transmitter can be a force transmission connecting pin.

[0013] In some more specific embodiments, the force transmission component includes a first connecting part, a locking part, and a second connecting part connected in sequence. The first connecting part is connected to the force sensing module, and the second connecting part is connected to the test probe assembly. The locking part has a first through hole along a second direction. When the limiting part and the limiting locking member are configured in a locked state, the limiting locking member passes through the first through hole in the limiting channel and locks with the locking part. The cross-sectional width of the first connecting part and the second connecting part along the second direction is smaller than the cross-sectional width of the locking part along the second direction.

[0014] In some more specific solutions, the first connecting part is provided with a thread at one end near the force sensing module, and the force sensing module has a threaded hole, and the first connecting part is threadedly connected to the force sensing module.

[0015] In some more specific embodiments, the test probe assembly is connected to the second connecting part via a third fastener. The test probe assembly includes a test probe base and a test probe tip that are connected together. A second through hole is formed on the test probe base, and the third fastener passes through the second through hole to connect the test probe base to the second connecting part.

[0016] In some more specific designs, the test needle is detachably connected to the test needle base, and the test needle has a rounded end face.

[0017] Compared with the prior art, the advantages of this utility model include at least the following:

[0018] First, the auxiliary device for chip pull-out force testing provided by this utility model achieves dual protection for the force sensing module through the combination design of the limiting base and the limiting locking pin. In the standby state, the limiting locking pin is inserted into the limiting channel, which can prevent the force sensor from being damaged due to accidental touch, collision or other accidents, and extend the life of the equipment.

[0019] Secondly, in the auxiliary device for chip pull-out force testing provided by this utility model, the force transmission component is divided into a first connecting part, a locking part, and a second connecting part. The locking part has a larger cross-sectional width, which not only enhances the structural strength, but also forms a stable constraint with the limiting locking pin through the first through hole, ensuring the accuracy of force transmission.

[0020] Third, the auxiliary device for chip pull-out force testing provided by this utility model has a test needle and a test needle base that are detachably connected, and the end of the needle is designed with a round end face, the diameter of which can be flexibly adjusted according to the chip size, thus solving the problem that traditional peel force testing cannot be adapted to small-sized chips. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the chip pull-out force testing auxiliary device provided in this embodiment of the utility model;

[0022] Figure 2 This is a schematic diagram of the structure of the limiting base provided in this embodiment of the utility model;

[0023] Figure 3 This is a schematic diagram of the structure of the limiting base provided in this embodiment of the utility model;

[0024] Figure 4 This is a schematic diagram of the force transmission connecting pin provided in an embodiment of the present invention;

[0025] Figure 5 This is a schematic diagram of the structure of the test needle base and test needle provided in this embodiment of the utility model;

[0026] Figure 6 This is an application diagram of the chip pull-out force testing auxiliary device provided in this embodiment of the utility model;

[0027] Figure 7 This is a schematic diagram of the force value of the force sensor provided in this embodiment at different stages. Attached image description:

[0029] 100. Auxiliary device for chip pull-out force testing;

[0030] 1. Fastening bolt; 2. Supporting top plate; 3. Force sensor; 4. Limiting base; 41. First fixing component; 42. Second fixing component; 43. Limiting part; 5. Limiting locking pin; 6. Force transmission connecting pin; 61. First connecting part; 62. Locking part; 621. First through hole; 63. Second connecting part; 7. Test probe base; 71. Second through hole; 8. Test probe;

[0031] 200, Chip under test; 300, UV anti-adhesion tape; 400, Process testing platform. Detailed Implementation

[0032] In view of the shortcomings of the prior art, the inventor of this case, through long-term research and extensive practice, has come up with the technical solution of this utility model. The following will further explain the technical solution, its implementation process, and its principles.

[0033] Please refer to Figures 1-5 An auxiliary device 100 for chip pull-out force testing includes a support top plate 2, a force sensor 3, a limiting base 4, a limiting locking pin 5, a force transmission connecting pin 6, a test needle base 7, and a test needle 8.

[0034] In this design, the force sensor 3 is fixedly connected to the lower surface of the supporting top plate 2 via a first fastener, ensuring the stability and accuracy of the force sensor 3 during testing. The first fastener is a bolt structure, including a fastening bolt 1.

[0035] Please refer to this plan. Figure 3 The limiting base 4 consists of a first fixing member 41, a second fixing member 42, and a limiting part 43 integrally connected in a Z-shape. The first fixing member 41 extends along a second direction and is fixedly connected to the lower surface of the supporting top plate 2 by a second fastener. This second fastener is a bolt structure and is not shown in the figure. The second fixing member 42 extends along a first direction, its length exceeding the length of the force sensor 3 along the same direction. This design provides sufficient space for installing and adjusting the force sensor 3. The limiting part 43 also extends along the second direction and is located in the area below the force sensor 3 to effectively limit and protect the force sensor. The first direction is perpendicular to the lower surface of the supporting top plate 2, and the second direction is parallel to the lower surface of the supporting top plate 2. In summary, the limiting base provides sufficient space for the installation and adjustment of the force sensor and, through the optimized position of the limiting part, achieves precise limiting of the force sensor 3.

[0036] Furthermore, the limiting part 43 has a limiting channel in the first direction, and the limiting locking pin 5 passes through the limiting channel in the second direction and can be detachably connected to the limiting part 43. This design allows the limiting locking pin 5 to be easily installed or removed when needed for maintenance or adjustment. The force transmission connecting pin 6 passes through the limiting channel, with one end connected to the force sensor 3 and the other end detachably connected to the test needle base 7.

[0037] In this design, the limiting part 43 and the limiting locking pin 5 can be configured to be in a locked state and an unlocked state. When the device is in standby mode, the limiting part 43 and the limiting locking pin 5 are configured to be in the locked state, with the limiting locking pin 5 inserted into the limiting channel and locked to the limiting part 43. Simultaneously, the limiting locking pin 5 also locks with the force transmission connecting pin 6, restricting the displacement of the force transmission connecting pin 6, thus better protecting the force sensor 3 and preventing damage due to accidental contact or collision.

[0038] During the pull-out force test, the limiting part 43 and the limiting locking pin 5 are configured to be unlocked. The limiting locking pin 5 is pulled out of the limiting channel, thus creating a certain separation space between the limiting part 43 and the force transmission connecting pin 6. This operation allows the pull-out force test of the chip under test to begin, ensuring that the force transmission function of the force transmission connecting pin 6 is not interfered with during the test, thus helping to guarantee the accuracy and reliability of the test results.

[0039] It is important to note that when the device is in standby mode, the limit locking pin 5 is locked to the limit part 43 and the force transmission connecting pin 6, ensuring that the force sensor 3 and the force transmission connecting pin 6 will not loosen under any circumstances. Thus, when chip testing is required, it is simply a matter of connecting the pre-selected size test probe base 7 and test probe 8 to the force transmission connecting pin 6. The force transmission connecting pin 6 remains locked throughout the entire process, ensuring that the accuracy of the sensor 3 is not affected.

[0040] Please refer to this plan. Figure 4 The force transmission connecting pin 6 is anodized aluminum and includes a first connecting part 61, a locking part 62, and a second connecting part 63 connected in sequence. The first connecting part 61 is used to connect with the force sensor 3. Specifically, the end of the first connecting part 61 near the force sensor 3 is designed with a threaded structure. At the same time, a matching threaded hole is also provided at the corresponding position of the force sensor 3. Through the threaded connection, the first connecting part 61 can be firmly connected to the force sensor 3. The force sensor 3 has the function of connecting to a computer and a data acquisition card, and can detect changes in force in real time and output these data for further analysis and processing.

[0041] Please refer to Figure 5The second connecting part 63 is connected to the test needle base 7. Specifically, a second through hole 71 is specially formed on the test needle base 7. Through the second through hole 71, a third fastener can pass through and connect to the second connecting part 63, thereby ensuring a secure connection between the second connecting part 63 and the test needle base 7. The third fastener here is a bolt structure, not shown in the figure. The locking part 62 is provided with a first through hole 621 in the second direction. The limiting locking pin 6 passes through the first through hole 621 through the locking part 62 and locks with it. In terms of dimensions, the cross-sectional width of the first connecting part 61 and the second connecting part 63 along the second direction is smaller than the cross-sectional width of the locking part 62. This design helps to maintain the strength and stability of the overall structure.

[0042] The test probe 8 is detachably connected to the test probe base 7. The end of the test probe 8 furthest from the test probe base 7 is designed with a rounded end face. The diameter of this rounded end face is adjusted according to different chip sizes to adapt to different testing requirements. For example, when the MiniLED chip size is 0.2*0.2mm, the diameter of the rounded end face of the test probe 8 is designed to be 0.8mm; while for a MicroLED chip with a size of 0.05mm*0.1mm, the diameter of the rounded end face of the test probe 8 is adjusted to 0.4mm. The diameter of the rounded end face of the test probe 8 can be flexibly adjusted according to changes in chip size and is not limited here.

[0043] The overall device manufacturing process is as follows: First, the force sensor 3 is fixed to the support top plate 2 using fastening bolts 1. Next, the limiting base 4 is also fixed to the support top plate 2. Then, one threaded end of the force transmission connecting pin 6 is fixed to the force sensor 3, while the other end is inserted into the test needle base 7 and secured to the test needle base 7 using set screws. After that, the test needle 8 is installed on the test needle base 7. Finally, the limiting locking pin 5 is pulled out of the limiting channel, and testing can begin. This test fixture is suitable for testing the force required to pull a microLED chip off the UV film after UV debonding, and can quickly evaluate the performance of the tape.

[0044] Please refer to Figure 6 The specific testing process includes the following steps:

[0045] Preparation: First, prepare UV anti-adhesion tape 300 and chip under test 200. After the chip under test 200 is subjected to film expansion treatment, it is irradiated with UV to achieve the anti-adhesion effect. Then, fix the treated chip under test 200 on the process test platform 400 to prepare for the next step of testing.

[0046] Step 1: Move the chip pull-out force testing auxiliary device 100 above the chip under test 200, which is a MicroLED chip.

[0047] Step 2: Start the equipment and lower the test probe 8 at a constant speed of 5 mm / min until it contacts the chip under test 200, and stop lowering after reaching the set force value of 1g. Then let it stand for 2 seconds to ensure that the test probe 8 and the chip under test 200 are fully wetted, in preparation for the next pull-out test;

[0048] Step 3: Pull the chip under test off the UV film by rapidly stretching it with a reverse force of 40 mm / min;

[0049] Step Four: Please refer to Figure 7 After the chip is pulled off, the peak maximum force recorded by force sensor 3 is read and recorded for subsequent analysis.

[0050] exist Figure 7 In the diagram, the vertical axis is labeled "Pull Force," representing the pulling force. A larger value indicates that more force is required to pull the chip off the tape, thus determining the adhesive strength between the chip and the tape. Below the diagram, "Fixture" represents the fixture, which is the testing auxiliary device 100 of this invention. "SG Tape" represents SG adhesive tape, a double-sided tape. "LED" represents the chip under test 200, and "UV Dicing Tape" represents UV anti-adhesion tape 300. One side of the SG tape is bonded to the testing auxiliary device 100, and the other side is bonded to the chip under test 200. After fixing, the chip under test 200 can be pulled off the UV anti-adhesion tape 300 by reverse pulling the testing auxiliary device 100.

[0051] The specific operating steps are as follows:

[0052] First, the clamp, with the SG Tape attached, presses downwards to contact the LED chip, aligning and adhering it to prepare for the subsequent pull-out process. The clamp continues to press down slightly, or maintains contact, at which point the force value will change slightly, and the tension on the vertical axis will fluctuate slightly. This is to stabilize the chip and prepare for the next pull-out action. Then, the clamp begins to pull upwards (arrow pointing upwards), at which point the tension will rise rapidly (the diagonal line on the vertical axis rises sharply) because it needs to overcome the adhesive force between the chip and the UV tape to pull the chip off. The stronger the chip is adhered, the higher the peak tension will be. When the tension reaches its peak, the value will suddenly drop back to 0, indicating that the chip has been successfully removed. Afterwards, the clamp continues to move upwards, while the tension remains at 0, indicating that the test is complete.

[0053] It should be understood that the above embodiments are merely illustrative of the technical concept and features of this utility model, and are intended to enable those skilled in the art to understand the content of this utility model and implement it accordingly. They should not be construed as limiting the scope of protection of this utility model. All equivalent changes or modifications made in accordance with the spirit and essence of this utility model should be included within the scope of protection of this utility model.

Claims

1. A chip pull force test assist device, characterized by, The device includes a force sensing module, a limit protection mechanism, and a testing mechanism. One end of the testing mechanism is connected to the force sensing module, and the other end is used to connect to the chip under test. The limit protection mechanism includes a limit base and a limit locking component. The limit base and the limit locking component can be configured to a locked state and an unlocked state. When the limit base and the limit locking component are configured to the locked state, the testing mechanism is fixed to the limit base. When the limit base and the limit locking component are configured to the unlocked state, the testing mechanism is separated from the limit base and performs a pull-out force test on the chip under test.

2. The chip pull force test assist device of claim 1, wherein, It also includes a supporting top plate, the force sensing module is disposed on the lower surface of the supporting top plate, the limiting base includes a fixed part and a limiting part connected to each other, the fixed part is connected to the supporting top plate, the limiting part is located below the force sensing module, the limiting part has a limiting channel opened along a first direction, the limiting locking member passes through the limiting channel along a second direction and can be configured with the limiting part to be in a locked state and an unlocked state, the testing mechanism passes through the limiting channel, one end is connected to the force sensing module, and the other end is used to connect to the chip under test, wherein the first direction is perpendicular to the lower surface of the supporting top plate, and the second direction is parallel to the lower surface of the supporting top plate.

3. The chip pull force test assist device of claim 2, wherein, The fixing part extends along a first direction and is fixedly connected to the lower surface of the supporting top plate. The length of the fixing part along the first direction is greater than the length of the force sensing module along the first direction. The limiting part extends along a second direction and is disposed in the area below the force sensing module. And / or, the force sensing module is connected to the supporting top plate via a first fastener.

4. The chip pull-out force testing auxiliary device according to claim 2, characterized in that, The fixing part includes a first fixing member and a second fixing member that are connected to each other. The first fixing member, the second fixing member, and the limiting part are integrally connected in a Z-shape. The first fixing member is connected to the supporting top plate through a second fastener.

5. The chip pull-out force testing auxiliary device according to claim 2, characterized in that, The testing mechanism includes a force transmitting element and a test probe assembly. The force transmitting element passes through the limiting channel, with one end connected to the force sensing module and the other end connected to the test probe assembly. When the limiting part and the limiting locking element are configured to a locked state, the limiting locking element inserts into the limiting channel and locks the force transmitting element, thus locking the force transmitting element to the limiting part. The end of the test probe assembly away from the force transmitting element is used to connect to the chip under test.

6. The chip pull-out force testing auxiliary device according to claim 5, characterized in that, The force transmission component includes a first connecting part, a locking part, and a second connecting part connected in sequence. The first connecting part is connected to the force sensing module, and the second connecting part is connected to the test probe assembly. The locking part has a first through hole along a second direction. When the limiting part and the limiting locking member are configured to a locked state, the limiting locking member passes through the first through hole in the limiting channel and locks with the locking part. And / or, the cross-sectional width of the first connecting portion and the second connecting portion along the second direction is smaller than the cross-sectional width of the locking portion along the second direction.

7. The chip pull-out force testing auxiliary device according to claim 6, characterized in that, The first connecting part has a thread at one end near the force sensing module, and the force sensing module has a threaded hole. The first connecting part is threadedly connected to the force sensing module.

8. The chip pull-out force testing auxiliary device according to claim 6, characterized in that, The test probe assembly is connected to the second connecting part via a third fastener.

9. The chip pull-out force testing auxiliary device according to claim 8, characterized in that, The test probe assembly includes a test probe base and a test probe tip connected together. A second through hole is formed on the test probe base, and a third fastener passes through the second through hole to connect the test probe base to the second connecting part.

10. The chip pull-out force testing auxiliary device according to claim 9, characterized in that, The test probe is detachably connected to the test probe base. And / or, the test needle has a rounded end face.

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