A device for improving the voltage resistance test efficiency of an RJ45 cable assembly by parallel method

Abstract

The utility model discloses a device of parallel method improves RJ45 cable assembly pressure resistance test efficiency, including a plurality of point position knob switch, main knob switch, a plurality of RJ45 connector interface and a plurality of banana head interface, through the point position of RJ45 interface parallel connection to corresponding knob switch, realize a test many products, significantly reduce test time.

Description

Technical Field

[0001] This utility model relates to the field of target detection, specifically to a device for improving the withstand voltage test efficiency of RJ45 cable assemblies using a parallel method. Background Technology

[0002] RJ45 cable assemblies are increasingly widely used and produced in the field of electronic communication. Due to design requirements, RJ45 cable assemblies need to undergo withstand voltage testing. Each independent circuit must be tested at AC500V for one minute without any breakdown or arcing. Utility Model Content

[0003] To address the aforementioned shortcomings in the existing technology, this utility model provides a device for improving the withstand voltage testing efficiency of RJ45 cable assemblies using a parallel method.

[0004] To achieve the aforementioned objectives, the technical solution adopted by this utility model is as follows:

[0005] A device for improving the withstand voltage testing efficiency of RJ45 cable assemblies using a parallel method includes: multiple point-position rotary switches, a main rotary switch, multiple RJ45 connector interfaces, a first banana head interface, a second banana head interface, a third banana head interface, and a fourth banana head interface, wherein:

[0006] The plurality of point-position rotary switches includes a first point-position rotary switch to a ninth point-position rotary switch;

[0007] Each of the RJ45 connector interfaces includes a first point through a ninth point;

[0008] Each of the first to ninth position rotary switches is connected to the corresponding position of all RJ45 connector interfaces.

[0009] The designated pin of the main rotary switch is connected to the designated pins of the first position rotary switch to the ninth position rotary switch.

[0010] The first banana head interface, the second banana head interface, the third banana head interface, and the fourth banana head interface are respectively connected to the pins of the main rotary switch.

[0011] Furthermore, for each point rotary switch, the corresponding point of all RJ45 connector interfaces is connected to pins 11 and 13 of the corresponding point rotary switch.

[0012] Furthermore, the fourteenth and twenty-fourth pins of the main rotary switch are connected to the fourteenth pins of the first to ninth position rotary switches.

[0013] Furthermore, the twelfth and twenty-second pins of the main rotary switch are connected to the twenty-first pin of the rotary switches from the first position to the ninth position.

[0014] Furthermore, the twelfth and twenty-second pins of each rotary switch are connected.

[0015] Furthermore, the first banana head interface is connected to the eleventh pin of the main rotary switch, the second banana head interface is connected to the twenty-third pin of the main rotary switch, the third banana head interface is connected to the thirteenth pin of the main rotary switch, and the fourth banana head interface is connected to the twenty-first pin of the main rotary switch.

[0016] Furthermore, the number of the plurality of RJ45 connector interfaces is multiple, and each RJ45 connector interface has the same structure.

[0017] This utility model has the following beneficial effects:

[0018] To improve testing efficiency, this invention relates to a device for improving the withstand voltage testing efficiency of RJ45 cable assemblies using a parallel method. It can test 38 products at once in just 9 minutes, compared to 4.8 hours for testing 32 products using traditional methods. The new testing device saves 4.65 hours of testing time per group of 32 products compared to traditional methods, increasing work efficiency by 10 times. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the device structure for improving the withstand voltage test efficiency of RJ45 cable assemblies using the parallel method of this utility model. Detailed Implementation

[0020] The specific embodiments of this utility model are described below to enable those skilled in the art to understand this utility model. However, it should be understood that this utility model is not limited to the scope of the specific embodiments. For those skilled in the art, as long as various changes are within the spirit and scope of this utility model as defined and determined by the appended claims, these changes are obvious. All utility model creations utilizing the concept of this utility model are within the scope of protection.

[0021] like Figure 1 As shown, this utility model comprises rotary switches 1 to 8, RJ45 connector network cable interfaces 1 to 32, rotary switch 10, and banana plugs 1 to 4.

[0022] The connection method is as follows:

[0023] Connect the RJ45 connector network cable interface 1 to network cable interface 32 to pins 11 and 13 of the rotary switch 1 respectively.

[0024] Connect the two points from RJ45 connector network cable interface 1 to network cable interface 32 respectively, and then connect them to pins 11 and 13 of rotary switch 2.

[0025] Connect the three points from RJ45 connector network cable interface 1 to network cable interface 32 respectively, and then connect them to pins 11 and 13 of rotary switch 3.

[0026] Connect the four points from network cable interface 1 to network cable interface 32 of the RJ45 connector to pins 11 and 13 of the rotary switch 4 respectively.

[0027] Connect the five points from RJ45 connector network cable interface 1 to network cable interface 32 respectively, and then connect them to pins 11 and 13 of rotary switch 5.

[0028] The RJ45 connector connects the six points from network cable interface 1 to network cable interface 32, and then connects them to pins 11 and 13 of the rotary switch 6.

[0029] Connect the RJ45 connector network cable interface 1 to network cable interface 32 at points 7 respectively, and then connect them to pins 11 and 13 of the rotary switch 7.

[0030] The RJ45 connector connects the eight points from network cable interface 1 to network cable interface 32, and then connects them to pins 11 and 13 of the rotary switch 8.

[0031] Connect the RJ45 connector network cable interface 1 to network cable interface 32 at points 9 respectively, and then connect them to pins 11 and 13 of the rotary switch 9.

[0032] After connecting pins 14 and 24 of rotary switch 10, connect rotary switch 1 to pin 14 of rotary switch 9.

[0033] After connecting pins 12 and 22 of rotary switch 10, connect rotary switch 1 to pin 21 of rotary switch 9.

[0034] Connect pins 12 and 22 of rotary switch 1, rotary switch 2, rotary switch 3, rotary switch 4, rotary switch 5, rotary switch 6, rotary switch 7, rotary switch 8, and rotary switch 9.

[0035] Banana head 1 is connected to pin 11 of rotary switch 10, banana head 2 is connected to pin 23 of rotary switch 10, banana head 3 is connected to pin 13 of rotary switch 10, and banana head 4 is connected to pin 21 of rotary switch 10.

[0036] Operating Step 1: Banana head 1 and banana head 2 are continuity test ports, connected to an external digital multimeter. Banana head 3 and banana head 4 are insulation withstand voltage test ports, connected to an external insulation withstand voltage tester. Rotary switch 10 has three positions. When the knob indicates the middle position, all four sets of switch contacts (switches 23 and 24, 11 and 12, 13 and 14, 21 and 22) are in the open state, the device is powered off, and the output interfaces of the continuity tester and withstand voltage tester are left unconnected to the test circuit. When rotary switch 10 indicates the left position, the device is in the insulation withstand voltage test mode. The insulation withstand voltage tester's test signal is conducted through the internal contacts 21 and 22 and contacts 13 and 14 of rotary switch 10, connecting the test source to the test circuit. The positive test signal is connected to pin 21 of rotary switches 1 to 9, and the negative test signal is connected to pin 14 of rotary switches 1 to 9.

[0037] Operation Step 2: Before testing, the knobs of rotary switches 1 to 9 are all in the reset mode with their knobs in the right position. Their internal switch actions are as follows: (switches 23 and 24 are off, switches 13 and 14 are on, switches 11 and 12 are off, and switches 21 and 22 are on). At this time, all points 1 to 9 of network cable interfaces 1 to 32 are connected to the negative test signal of the insulation withstand voltage test source.

[0038] Operation Step 3: During testing, when the knob of rotary switch 1 is in the middle position, it is in test mode. Its internal switch action is as follows (switches 23 and 24 are off, switches 13 and 14 are off, switches 11 and 12 are on, and switches 21 and 22 are on). At this time, the positive test signal of the test source is connected to one point from network cable interface 1 to network cable interface 32 to complete the withstand voltage test of the remaining points.

[0039] Operation Step 4: Repeat Step 3 for each of the knob switches 2 through 9. Complete the test at all 9 points.

[0040] Operation Step 5: When the rotary switch 10 indicates the right position, the device is in the continuity test mode. The digital multimeter is turned on through the internal contact switches 23 and 24 and contact switches 11 and 12 of the rotary switch 10, and the test source is connected to the test circuit to complete the continuity test before the insulation withstand voltage test.

[0041] This utility model uses specific embodiments to illustrate the principle and implementation of the utility model. The above description of the embodiments is only for the purpose of helping to understand the method and core idea of ​​the utility model. At the same time, for those skilled in the art, there will be changes in the specific implementation and application scope based on the idea of ​​the utility model. Therefore, the content of this specification should not be construed as a limitation of the utility model.

[0042] Those skilled in the art will recognize that the embodiments described herein are intended to help the reader understand the principles of this invention, and should be understood that the scope of protection of this invention is not limited to such specific statements and embodiments. Those skilled in the art can make various other specific modifications and combinations based on these technical teachings disclosed in this invention without departing from the essence of this invention, and these modifications and combinations are still within the scope of protection of this invention.

Claims

1. A device for improving the withstand voltage testing efficiency of RJ45 cable assemblies using a parallel method, characterized in that, include: Multiple point-position rotary switches, one main rotary switch, multiple RJ45 connector interfaces, a first banana head interface, a second banana head interface, a third banana head interface, and a fourth banana head interface, wherein: The plurality of point-position rotary switches includes a first point-position rotary switch to a ninth point-position rotary switch; Each of the RJ45 connector interfaces includes a first point through a ninth point; Each of the first to ninth position rotary switches is connected to the corresponding position of all RJ45 connector interfaces. The designated pin of the main rotary switch is connected to the designated pins of the first position rotary switch to the ninth position rotary switch. The first banana head interface, the second banana head interface, the third banana head interface, and the fourth banana head interface are respectively connected to the pins of the main rotary switch.

2. The apparatus for improving the withstand voltage test efficiency of RJ45 cable assemblies using the parallel method according to claim 1, characterized in that, For each point rotary switch, the corresponding point of all RJ45 connector interfaces is connected to pins 11 and 13 of the corresponding point rotary switch.

3. The apparatus for improving the withstand voltage test efficiency of RJ45 cable assemblies using the parallel method according to claim 1, characterized in that, The fourteenth and twenty-fourth pins of the main rotary switch are connected to the fourteenth pin of the rotary switches from the first position to the ninth position.

4. The apparatus for improving the withstand voltage test efficiency of RJ45 cable assemblies using the parallel method according to claim 1, characterized in that, The twelfth and twenty-second pins of the main rotary switch are connected to the twenty-first pin of the rotary switches from the first position to the ninth position.

5. The apparatus for improving the withstand voltage test efficiency of RJ45 cable assemblies using the parallel method according to claim 1, characterized in that, Connect pin 12 and pin 22 of each rotary switch.

6. The apparatus for improving the withstand voltage test efficiency of RJ45 cable assemblies using the parallel method according to claim 1, characterized in that, The first banana head interface is connected to the eleventh pin of the main rotary switch, the second banana head interface is connected to the twenty-third pin of the main rotary switch, the third banana head interface is connected to the thirteenth pin of the main rotary switch, and the fourth banana head interface is connected to the twenty-first pin of the main rotary switch.

7. The apparatus for improving the withstand voltage test efficiency of RJ45 cable assemblies using the parallel method according to claim 1, characterized in that, The number of RJ45 connector interfaces is multiple, and each RJ45 connector interface has the same structure.

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