A simple fixture for holding a probe and a PCB under test

Abstract

This utility model discloses a simplified bracket for fixing a probe and a PCB under test, comprising: a first support rod with a first connecting part at one end and a first fixing part at a distance away from the first connecting part; the first fixing part is used to connect and fix the PCB under test; a second support rod with a second connecting part at one end and a second fixing part at a distance away from the second connecting part; the second fixing part is used to connect and fix the PCB under test; the first connecting part and the second connecting part are rotatably connected and have rotational damping; a probe adjustment and fixing frame is connected to the first support rod and / or the second support rod and is located at the rotatable connection between the first connecting part and the second connecting part; the probe adjustment and fixing frame includes a vertical rod, a connecting seat, a fixing member, and a connecting member; the connecting seat can move along the length direction of the vertical rod and can rotate relative to the vertical rod, and the fixing member secures the connecting seat to the vertical rod; the connecting member is used to adjust the movement of the probe relative to the connecting seat and to secure it.

Description

Technical Field

[0001] This application relates to the field of PCB connection and debugging device technology, specifically a simple bracket for fixing a probe and the PCB under test. Background Technology

[0002] The matching values ​​of RF circuits have a significant impact on the system's transmit and receive performance. Currently, in actual debugging, semi-rigid coaxial probes are used to connect to corresponding ground points on the PCB for measurement to determine the specific capacitance and inductance values ​​required for the matching circuit. During debugging, the tip of the semi-rigid coaxial probe needs to be soldered to the RF path, and the outer conductor of the probe needs to be connected to the PCB's ground; the other end of the probe is usually connected to a relatively heavy RF cable via an SMA connector. Therefore, the probe tip needs to withstand significant torque, which can easily cause the tip connection to tear and detach from the corresponding ground point on the PCB, resulting in PCB damage. Furthermore, the constant replacement of capacitors and inductors during debugging, along with repeated soldering and probe removal, can easily damage the PCB and cause poor connections, affecting the debugging progress. With the increasing application and promotion of 01005-sized and smaller materials, the solder connection between the probe and the PCB has become weaker, undoubtedly further increasing the aforementioned risks and difficulties.

[0003] In the prior art, for example, the simple fixture for manual PCB debugging disclosed in patent application CN201910196326.9 discloses a technical solution that uses a single specification of PCB under test to make pressure contact with probes for electrical connection testing. This fixture has poor versatility, the probe position is fixed and cannot be changed, and multiple probes are required. While the PCB board signal line loss testing device disclosed in patent application CN202010009371.1 improves the convenience of connecting probes to different specifications of PCBs with different contact potentials, its versatility is still relatively poor. When debugging the connection of probes to different contact potentials on the PCB, the probes can only move along the length of the first slide groove 201, and the lack of PCB fixation results in poor stability.

[0004] Therefore, there is an urgent need for an auxiliary tool that is easy to operate and versatile, and can fix the PCB under test and the probe so that the probe tip can be stably connected to the PCB at a potential. Utility Model Content

[0005] This utility model addresses the above-mentioned problems by proposing a simplified bracket for fixing the probe and the PCB under test, aiming to solve the technical problems in the background art.

[0006] To achieve the above objectives, this utility model provides a simplified bracket for fixing a probe and the PCB under test, comprising: The first support rod has a first connecting part at one end and a first fixing part at a location away from the first connecting part; the first fixing part is used to connect and fix the PCB under test. The second support rod has a second connecting part at one end and a second fixing part at a location away from the second connecting part; the second fixing part is used to connect and fix the PCB under test; the first connecting part is rotatably connected to the second connecting part and has rotational damping. A probe adjustment and fixing frame is connected to the first support rod and / or the second support rod, and is located at the rotatable connection between the first connecting part and the second connecting part; the probe adjustment and fixing frame includes a vertical rod, a connecting seat, a fixing member, and a connecting member; the connecting seat can move along the length direction of the vertical rod and can rotate relative to the vertical rod, and the fixing member is used to fasten the connecting seat to the vertical rod; the connecting member is used to adjust the movement of the probe relative to the connecting seat and to fasten it.

[0007] Furthermore, both the first and second support rods are telescopic rods with extendable lengths.

[0008] Furthermore, foot pads are provided on the end face of the first support rod opposite to the first connecting part and the end face of the second support rod opposite to the second connecting part.

[0009] Furthermore, the foot pads are distributed corresponding to the first fixing part, the second fixing part, and the rotatable connection between the first connecting part and the second connecting part.

[0010] Furthermore, the cross-sections of the first and second support rods are rectangular.

[0011] Furthermore, both the first fixing part and the second fixing part include a screw, a stud threadedly connected to the screw, and a nut threadedly connected to the screw; the stud is disposed at an open end away from the screw.

[0012] Furthermore, the upright is a threaded rod; the connecting seat is sleeved on the upright; the fixing member consists of two nuts respectively located on both sides of the connecting seat and threadedly connected to the upright.

[0013] Furthermore, the connector includes a clamping piece and a bolt passing through the clamping piece; the bolt is threadedly connected to the side wall of the connector seat.

[0014] Furthermore, it includes a stud threadedly connected to the upright; the stud abuts against the first support rod or the second support rod, and is used for the first connecting part to rotate relative to the second connecting part, and after the first support rod and the second support rod are opened relative to each other by a predetermined angle, the first support rod and the second support rod are kept fixed.

[0015] Furthermore, the components of the simplified bracket for fixing the probe and the PCB under test are all made of insulating material.

[0016] Compared with the prior art, the present invention provides a simple bracket for fixing probes and PCBs under test. The overall structure is simple and easy to operate. It can hold and fix the probes and the measured potentials of PCBs of various sizes and specifications, which can well meet the needs of users. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of a simplified bracket for fixing a probe and the PCB under test according to this application.

[0018] Figure 2 This is a schematic diagram of another perspective of the simplified bracket for fixing the probe and the PCB under test according to this application.

[0019] Figure 3 This is a schematic diagram of the structure of a simplified bracket for fixing a probe and a PCB under test, according to this application, when the first and second supports are adjusted to a certain position by relative rotation.

[0020] Figure 4 This is an exploded structural diagram of a simplified support for fixing a probe and the PCB under test according to this application.

[0021] The reference numerals in the figure are as follows: 1. First support rod; 110. First connecting part; 120. First fixing part; 171. Screw; 172. Stud; 173. Nut; 2. Second support rod; 210. Second connecting part; 220. Second fixing part; 3. Probe adjustment and fixing frame; 310. Upright rod; 320. Connecting seat; 330. Fixing component; 340. Connecting component; 341. Clamping piece; 342. Bolt; 4. Foot pad. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present utility model, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present utility model without creative effort are within the protection scope of the present utility model. It is understood that the accompanying drawings are provided for reference and illustration only and are not intended to limit the present utility model. The connection relationships shown in the drawings are only for clear description and do not limit the connection method.

[0023] It should be noted that when a component is considered to be "connected" to another component, it can be directly connected to the other component, or there may be an intervening component. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It should also be noted that, unless otherwise expressly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly, for example, as a fixed connection, a detachable connection, or an integral connection; as a mechanical connection or an electrical connection; or as a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the invention.

[0024] It should also be noted that in the description of this utility model, the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are used only for the convenience of describing this utility model and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0025] Please refer to Figures 1-4 This embodiment provides a simplified bracket for fixing the probe and the PCB under test, including: A first support rod 1 has a first connecting part 110 at one end and a first fixing part 120 at a distance away from the first connecting part 110; the first fixing part 120 is used to connect and fix the PCB under test. The second support rod 2 has a second connecting part 210 at one end and a second fixing part 220 at a distance away from the second connecting part 210. The second fixing part 220 is used to connect and fix the PCB under test. The first connecting part 110 is rotatably connected to the second connecting part 210 and has rotational damping. The first connecting part 110 and the second connecting part 210 can be through holes or threaded holes.

[0026] A probe adjustment and fixing frame 3 is connected to the first support rod 1 and / or the second support rod 2, and is located at the rotatable connection between the first connecting part 110 and the second connecting part 210. The probe adjustment and fixing frame 3 includes a vertical rod 310, a connecting seat 320, a fixing member 330, and a connecting member 340. The connecting seat 320 can move along the length direction of the vertical rod 310 and can rotate relative to the vertical rod 310. The fixing member 330 fastens the connecting seat 320 to the vertical rod 310. The connecting member 340 is used to adjust the movement of the probe relative to the connecting seat 320 and to fasten it.

[0027] When the upright 310 passes through and connects the first connecting part 110 and the second connecting part 210, it means that the probe adjustment and fixing frame 3 is connected to the first support rod 1 and the second support rod 2.

[0028] The first support rod 1 and the second support rod 2 can be stacked on top of each other, with the first support rod 1 or the second support rod 2 located on top. The upright rod 310 is only connected to the upper support rod, that is, the needle adjustment fixing bracket 3 is connected to the first support rod 1 or the second support rod 2.

[0029] In some embodiments, the first support rod 1 and the second support rod 2 are both telescopic rods with extendable length.

[0030] This design allows this minimalist bracket to hold and secure PCBs of a wider range of sizes.

[0031] Please refer to Figure 2 Foot pads 4 are provided on the end face of the first support rod 1 opposite to the end face of the first connecting part 110 and the end face of the second support rod 2 opposite to the end face of the second connecting part 210.

[0032] The feet 4 allow this minimalist stand to be placed stably on a desktop.

[0033] Please refer to Figure 2 The foot pads 4 are distributed at the rotatable connection points of the first fixing part 120, the second fixing part 220, the first connecting part 110, and the second connecting part 210.

[0034] In some embodiments, the cross-sections of the first support rod 1 and the second support rod 2 are rectangular.

[0035] Please refer to Figure 1 The first fixing part 120 and the second fixing part 220 each include a screw 171, a stud 172 threadedly connected to the screw 171, and a nut 173 threadedly connected to the screw 171; the stud 172 is disposed at an open end away from the screw 171.

[0036] Please refer to Figure 1The upright 310 is a threaded rod; the connecting seat 320 is sleeved on the upright 310; the fixing member 330 consists of two nuts respectively located on both sides of the connecting seat 320 and threadedly connected to the upright 310.

[0037] Please refer to Figure 1 The connector 340 includes a clamping piece 341 and a bolt 342 passing through the clamping piece 341; the bolt 342 is threadedly connected to the side wall of the connector 320.

[0038] Please refer to Figure 1 It includes a stud 172 that is threadedly connected to the upright 310; the stud 172 abuts against the first support rod 1 or the second support rod 2, and is used for the first connecting part 110 to rotate relative to the second connecting part 210, and after the first support rod 1 and the second support rod 2 are opened relative to each other at a predetermined angle, the first support rod 1 and the second support rod 2 are kept fixed.

[0039] The stud 172 is threadedly connected to the upright 310, which can abut against the first connecting part 110 or the second connecting part 210 below, adjust the relative angle of rotational damping between the first support rod 1 and the second support rod 2, or tighten it to fix the first support rod 1 and the second support rod 2 relative to each other.

[0040] In addition, the edge of the PCB near the upright 310 can also overlap the end face of the stud 171 that is threaded to the upright 310 to obtain further stable support.

[0041] Preferably, the components of the simplified bracket for fixing the probe and the PCB under test are made of insulating material.

[0042] Plastic materials can be selected.

[0043] The working principle of this simple support for fixing the probe and the PCB under test is as follows: The PCB is the board body. First, the first support rod 1 is rotated relative to the second support rod 2 so that the first fixing part 120 and the second fixing part 220 are aligned with the corresponding two side edges of the PCB. Then, the edge of the PCB is placed between the nut 173 and the stud 172 of the first fixing part 120. The nut 173 is operated to be turned on the screw 171 so that the nut 173 and the stud 172 clamp and fix the PCB.

[0044] The second fixing part 220 on the second support rod 2 also performs the same operation, so that the other edge of the PCB is also fixed. The stud 172 on the operating rod 310 keeps the first support rod 1 and the second support rod 2 fixed.

[0045] Operate the connector 320 and the fixing piece 330 to move them to the appropriate position along the upright 310. Adjust the angle and height of the connector 320, and then fix the connector 320 with the fixing piece 330. Pass the probe through the clamping area of ​​the clamping piece 341 and adjust the angle between the clamping piece 341 and the probe so that the tip of the probe can contact the connection potential that needs to be tested on the PCB. Then operate the bolt 342 to tighten the clamping piece 341 and the probe to the connector 320 to complete the debugging.

[0046] In summary, this simplified support for fixing the probe and the PCB under test has a simple overall structure, is easy to operate, and can hold and fix the probe and the measured potential for PCBs of various sizes, thus well meeting user needs.

[0047] In the specification and claims of this application, the terms "comprising / including" and "having / including" and variations thereof are used to specify the presence of the stated features, values, steps or components, but do not exclude the presence or addition of one or more other features, values, steps, components or combinations thereof.

[0048] Some features of this invention are described in different embodiments for clarity; however, these features may also be described in combination in a single embodiment. Conversely, some features of this invention are described only in a single embodiment for brevity; however, these features may also be described individually or in any suitable combination in different embodiments.

[0049] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A simple fixture for holding a probe and a PCB under test, characterized by, include: The first support rod has a first connecting part at one end and a first fixing part at a position away from the first connecting part; the first fixing part is used to connect and fix the PCB under test. The second support rod has a second connecting part at one end and a second fixing part at a location away from the second connecting part; the second fixing part is used to connect and fix the PCB under test; the first connecting part is rotatably connected to the second connecting part and has rotational damping. A probe adjustment and fixing frame is connected to the first support rod and / or the second support rod, and is located at the rotatable connection between the first connecting part and the second connecting part; the probe adjustment and fixing frame includes a vertical rod, a connecting seat, a fixing member, and a connecting member; the connecting seat can move along the length direction of the vertical rod and can rotate relative to the vertical rod, and the fixing member is used to fasten the connecting seat to the vertical rod; the connecting member is used to adjust the movement of the probe relative to the connecting seat and to fasten it.

2. The simple probe and PCB under test holder of claim 1, wherein, Both the first and second support rods are telescopic rods with extendable lengths.

3. The simple probe and PCB under test holder of claim 1, wherein, Foot pads are provided on the end face of the first support rod opposite to the first connecting part and on the end face of the second support rod opposite to the second connecting part.

4. The simple probe and PCB under test holder of claim 3, wherein, The foot pads are distributed corresponding to the first fixing part, the second fixing part, and the rotatable connection between the first connecting part and the second connecting part.

5. The simple probe and PCB under test holder of claim 1 wherein, The first and second support rods have rectangular cross-sections.

6. The simple probe and PCB under test fixture of claim 1 wherein, Both the first fixing part and the second fixing part include a screw rod, a stud threadedly connected to the screw rod, and a nut threadedly connected to the screw rod; the stud rod is located at an open end away from the screw rod.

7. The simple probe and PCB under test holder of claim 1 wherein, The upright is a threaded rod; the connecting seat is sleeved on the upright; the fixing component consists of two nuts respectively located on both sides of the connecting seat and threadedly connected to the upright.

8. The simple probe and PCB under test fixture of claim 1 wherein, The connector includes a clamping plate and a bolt passing through the clamping plate; the bolt is threaded to the side wall of the connector seat.

9. The simple probe and PCB under test fixture of claim 7, wherein, It includes a stud that is threadedly connected to the upright; the stud abuts against the first support rod or the second support rod, and is used for the first connecting part to rotate relative to the second connecting part, and after the first support rod and the second support rod are opened relative to each other by a predetermined angle, the first support rod and the second support rod are kept fixed.

10. The simple probe and PCB under test fixture of claim 1 wherein, The components of the simplified bracket for fixing the probe and the PCB under test are all made of insulating material.

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