A kind of potting type LC power filter medium withstand voltage test tooling

CN224696009UActive Publication Date: 2026-08-28BEIJING YUAN LIU HONG YUAN ELECTRONIC TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202521732101.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-08-14
Publication Date
2026-08-28
Estimated Expiration
2035-08-14

AI Technical Summary

Technical Problem

这种方式虽能满足基本的试验流程要求,实现对产品介质耐电压性能的检测,但存在一个显著局限:单次测试仅能针对一只产品进行,在需要对批量产品进行测试时,效率低下的问题尤为突出,难以适应规模化生产中的快速检测需求

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Abstract

The utility model discloses a kind of LC power supply filter medium dielectric voltage withstand test tool, including circuit board and buckle socket. Circuit board is arranged in multiple rows of test area array, multiple buckle sockets are installed with interval in each test area, and the socket lead-out end corresponding to each buckle socket is provided with through-hole pad;Buckle socket is connected to be measured filter, its lead-out end is correspondingly conductive with filter pin, and is conducted through through-hole pad;The first, second copper conductor on circuit board respectively short-circuit the positive, negative electrode lead-out end of each test area and are summarized to form positive, negative electrode passage, then through high temperature wire connection voltage withstand equipment.The utility model realizes the synchronous test of multiple products, improves efficiency, and connection is stable, easy to operate, guarantee test accuracy and tool reliability.
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Claims

1. A fixture for dielectric withstand voltage testing of a potted LC power filter, characterized in that, include: The circuit board has multiple rows of test areas arranged in an array. Each row of test areas is equipped with multiple snap-fit ​​sockets at intervals. The circuit board has through-hole pads at the socket lead-out end corresponding to each snap-fit ​​socket. A snap-on socket is attached to an LC power filter under test. The socket leads correspond one-to-one with the pins of the LC power filter and are electrically connected, and electrical conduction is achieved through the through-hole pads. The first copper-clad conductor, which is set on the circuit board, is used to short-circuit the positive leads of each through-hole pad in each row of test areas and then combine them to form a positive path. The second copper-clad conductor is disposed on the circuit board and is used to short-circuit the negative leads of each through hole pad in each row of test areas to form a negative electrode path. The positive and negative electrode paths are respectively connected to voltage-resistant equipment via high-temperature wires.

2. The fixture for dielectric withstand voltage testing of potted LC power filters according to claim 1, characterized in that, The snap-fit ​​socket includes a socket base, a slider, and a locking handle; The upper part of the socket base is recessed to form a groove, and multiple rows of socket leads are arranged in the groove. The upper end of the socket lead is a spring part that protrudes from the bottom plate of the groove, and the lower end of the socket lead is a lead that extends out of the socket base. The slider is slidably installed in the groove. A spring is provided between the inner wall of the groove on one side along the sliding direction of the slider and the slider. The socket base is provided with a notch on the side away from the spring that communicates with the groove. The locking handle can be folded and installed in the notch. The slider has multiple rows of rectangular through holes, and each row of rectangular through holes has a conductive sheet on the inner wall away from the spring that corresponds to the spring plate. Folding the locking handle can push the slider to slide, so that the spring plate cooperates with the conductive sheet to clamp or release the pins of the LC power filter.

3. The tooling for dielectric withstand voltage testing of potted LC power filters according to claim 2, characterized in that, The snap-fit ​​socket also includes a socket panel; the socket panel is detachably mounted on the socket base by bolts; the socket panel is provided with pin holes for the pins of the LC power filter to pass through, and the socket panel is provided with a notch on the side corresponding to the locking handle, the notch facilitating the upward folding of the locking handle.

4. The tooling for dielectric withstand voltage testing of potted LC power filters according to claim 2, characterized in that, A pivot is provided across the notch along the sliding direction perpendicular to the slider. One end of the locking handle is mounted on the pivot and can be folded up and down by the pivot. When the locking handle is folded down, the bottom end of the locking handle pushes the slider to compress the spring, so that the conductive sheet and the corresponding spring part clamp the pin of the LC power filter under test to achieve electrical connection. When the locking handle is flipped upwards, the spring returns to its original position, causing the slider to move toward the locking handle side, thus releasing the conductive sheet from the corresponding spring portion of the LC power filter under test and disconnecting the electrical connection.

5. The fixture for dielectric withstand voltage testing of potted LC power filters according to claim 1, characterized in that, The first copper-clad conductor includes a first copper-clad branch conductor and a first copper-clad main conductor. Multiple rows of the first copper-clad branch conductors are respectively short-circuited to the positive terminals of multiple through-hole pads in each row of the test area. One end of each row of the first copper-clad branch conductors is connected in parallel to the first copper-clad main conductor. The multiple rows of the first copper-clad branch conductors and the first copper-clad main conductor constitute the positive electrode path. The second copper-clad conductor includes a second copper-clad branch conductor and a second copper-clad main conductor. Multiple rows of the second copper-clad branch conductors are respectively short-circuited to the negative terminals of multiple through-hole pads in each row of the test area. One end of each row of the second copper-clad branch conductors is connected in parallel to the second copper-clad main conductor. The multiple rows of the second copper-clad branch conductors and the second copper-clad main conductor constitute the negative electrode path.

6. The fixture for dielectric withstand voltage testing of potted LC power filters according to claim 5, characterized in that, The first copper-clad main conductor and the second copper-clad main conductor are respectively disposed on both sides of the multiple rows of the first copper-clad branch conductors and the second copper-clad branch conductors; The laying directions of the first copper-clad main conductor and the second copper-clad main conductor are both perpendicular to the laying directions of the first copper-clad branch conductor and the second copper-clad branch conductor.

7. The fixture for dielectric withstand voltage testing of potted LC power filters according to claim 1, characterized in that, The wiring width of the first copper-clad conductor and the second copper-clad conductor is 10mm~12mm.

8. The fixture for dielectric withstand voltage testing of potted LC power filters according to claim 1, characterized in that, The diameter of the through-hole pad is 1.6mm to 2mm.

9. The fixture for dielectric withstand voltage testing of potted LC power filters according to claim 1, characterized in that, The surface of the circuit board is coated with a green solder resist layer, which covers the exposed portions of the first copper-clad conductor and the second copper-clad conductor.