Power semiconductor dynamic tester
CN309701576SActive Publication Date: 2025-12-26CHONGQING YUNTONG CAR CORE ELECTRONIC TECH CO LTD
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Patent Information
- Application Number
- CN202530211325.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-18
- Publication Date
- 2025-12-26
- Estimated Expiration
- 2040-04-18
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: power semiconductor dynamic tester. 2. The use of the design product: used for dynamic double pulse test of power devices, power modules (MOSFET single tube, IGBT module, etc.), and evaluation of switching performance of power devices and power modules. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
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