SYSTEM AND METHOD FOR MOUNTING GRINDER / POLISHER SPECIMEN HOLDERS - Patent application

Abstract

Exemplary systems and methods are provided for a system for mounting a grinder / polisher specimen holder. The system includes a platform having one or more fasteners on which one or more mounting fixtures are disposed and mounted. The one or more mounting fixtures are configured to secure the specimen holder in place for testing of the specimen, such as hardness testing. One or more of the mounting fixtures can include a mounting bracket that supports the specimen holder and fixes the orientation and / or position of the specimen holder. In an example, the mounting fixture has an interface that contacts and supports the specimen holder when the specimen holder is disposed within the system.

Description

[Technical field]

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS This application claims priority to and the benefit of U.S. Provisional Patent Application No. 63 / 238,861, filed August 31, 2021, entitled "Systems And Methods For Mounting A Grinder / Polisher Sample Holder." The above-listed U.S. patent applications are hereby incorporated by reference in their entireties for all purposes. [Background technology]

[0002] background Grinding and polishing operations are performed on specimens for many purposes and across a vast number of sectors and industries. In some applications, surface preparation of the specimen by grinding / polishing operations is performed in a grinding / polishing device that is capable of performing both grinding and polishing operations to process the specimen housed in a specimen holder. If additional tests are to be performed on the specimen, the specimen must be removed from the specimen holder. Summary of the Invention

[0003] overview As fully set forth in the claims, a system and method are disclosed for a system for mounting a grinder / polisher specimen holder, substantially as shown by and substantially as described in connection with at least one of the drawings. [Brief description of the drawings]

[0004] [Figure 1] FIG. 1 illustrates an exemplary system for mounting a grinder / polisher specimen holder according to an aspect of the present disclosure.

[0005] [Figure 2A] FIG. 2 is a side view of the example system of FIG. 1.

[0006] [Figure 2B] FIG. 2 is an exploded view of the example system of FIG. 1.

[0007] [Figure 3A] FIG. 2 is a top view of the example system of FIG. 1.

[0008] [Figure 3B] 2 is a cross-sectional view of an exemplary mounting fixture of the exemplary system of FIG. 1.

[0009] [Figure 4] FIG. 2 is a perspective view of the example system of FIG. 1.

[0010] [Figure 5A] 2A-2C are various views illustrating an example system for mounting the grinder / polisher specimen holder of FIG. 1 employed with a hardness testing machine according to an embodiment of the present disclosure. [Figure 5B] 2A-2C are various views illustrating an example system for mounting the grinder / polisher specimen holder of FIG. 1 employed with a hardness testing machine according to an embodiment of the present disclosure. [Figure 5C] 2A-2C are various views illustrating an example system for mounting the grinder / polisher specimen holder of FIG. 1 employed with a hardness testing machine according to an embodiment of the present disclosure. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011] The figures are not necessarily to scale. Where appropriate, similar or identical reference numbers are used to refer to similar or identical components.

[0012] Detailed Description Systems and methods are disclosed relating to a system for mounting grinder / polisher specimen holders. In particular, the system includes a platform having one or more fasteners on which one or more mounting fixtures are disposed and mounted. The one or more mounting fixtures are configured to secure the specimen holder in place for testing of the specimens, such as hardness testing. One or more of the mounting fixtures can include a mounting bracket that supports the specimen holder and fixes the orientation and / or position of the specimen holder. In an example, the mounting fixture has an interface (e.g., hardened pins, contact tips, etc.) that contacts and supports the specimen holder when the specimen holder is placed in the system.

[0013] As disclosed in this disclosure, the mounting system provides a specimen holding fixture that can be used with the grinding / polishing system as well as the hardness tester. For example, the specimen holder is a disk tray that holds multiple mounted specimens or specimens in place (e.g., in a housed cartridge secured within the specimen holder) for simultaneous grinding and / or polishing operations. The grinding / polishing system involves grinding and / or polishing the specimens using one or more motors or other actuators. After polishing, the polished specimens can then be used to test the manufacturing or other process that produced the specimens, such as by performing visual inspection, hardness or density testing, and / or other desired tests.

[0014] Previously, an operator had to, for example, remove each individual specimen from a specimen holder and individually load the specimen into a separate holding platform for hardness testing, resulting in additional time and resources spent isolating and positioning the specimens rather than testing.

[0015] The disclosed specimen holding fixtures and systems allow an operator to move the entire specimen holder tray and mount it directly onto a hardness tester without having to remove individual specimens, which significantly reduces the amount of labor required to test multiple specimens and reduces the chance of accidental scratching and / or other damage to the specimens.

[0016] In a disclosed example, a system for mounting a grinder / polisher specimen holder includes a platform having one or more fasteners and one or more mounting fixtures disposed on and attached to the platform, the one or more mounting fixtures configured to secure the specimen holder, each mounting fixture including one or more mounting brackets that fix the orientation or position of the specimen holder and one or more interfaces that contact and support the specimen holder when the specimen holder is positioned within the system.

[0017] In some examples, the one or more mounting fixtures include three or more fixtures distributed around the platform at equal radial distances from a center point, hi examples, each fixture of the one or more fixtures is separated by an equal distance between axial positions.

[0018] In some instances, the location of one or more mounting fixtures on the platform can be adjusted based on the size or shape of the specimen holder.

[0019] In some examples, one of the one or more mounting brackets is configured as an adjustable mounting bracket, and the system further includes a bracket lock for adjusting the position or orientation of the adjustable mounting bracket to release the test specimen holder and secure the test specimen holder to the system.

[0020] In some examples, each mounting fixture further comprises a base that couples to the platform and a column extending from the base to support the interfaces. In examples, one or more of the interfaces are attached to an extension post extending from the column. In examples, the base is configured to be secured to the platform via one or more fasteners.

[0021] In some examples, the one or more mounting brackets are secured to one or more mounting fixtures via one or more bracket fasteners.

[0022] In some examples, the one or more interfaces are positioned to contact a first surface of the test specimen holder to limit movement of the test specimen holder in a first direction, and the bracket is configured to contact a second surface of the test specimen holder to limit movement of the test specimen holder in a second direction.

[0023] In some examples, one or more of the mounting fixtures are formed from a metal, such as stainless steel.

[0024] In some instances, one or more of the interfaces are formed from a hardened material, such as carbide or steel.

[0025] In some examples, the one or more mounting fixtures support the specimen holder at a distance from the surface of the platform that is greater than a length of the specimen holder drive adapter.

[0026] In some examples, the system is configured to be integrated into a hardness testing machine.

[0027] In some disclosed examples, a hardness testing system includes a grinder / polisher specimen holder and a system for mounting the grinder / polisher specimen holder, the system for mounting the grinder / polisher specimen holder including a platform having one or more fasteners and one or more mounting fixtures disposed on and attached to the platform, the one or more mounting fixtures configured to secure the specimen holder, each mounting fixture including one or more mounting brackets that fix an orientation or position of the specimen holder and one or more interfaces that contact and support the specimen holder when the specimen holder is positioned within the system.

[0028] In some examples, a platen configured to mount a system for mounting a grinder / polisher specimen holder is provided.

[0029] In an example, the system for mounting the grinder / polisher specimen holder further comprises one or more alignment devices configured to couple to the one or more alignment devices in the platen.

[0030] In some examples, an indentation device is provided that tests the hardness of a specimen in a specimen holder by applying an impact to the specimen.

[0031] In some examples, a movable stage is included to which the platen is secured, the movable stage configured to adjust the position or orientation of the test specimen relative to the indentation device.

[0032] In some examples, the platen further comprises one or more alignment devices for coupling to the platform.

[0033] As used in this disclosure, the word "exemplary" means "serving as an example, instance, or illustration." The embodiments described in this disclosure are not intended to be limiting, but merely illustrative. It is to be understood that the described embodiment is not necessarily to be construed as preferred or advantageous over other embodiments. Moreover, the term "embodiment" does not require that all disclosed embodiments include the discussed feature, advantage, or mode of operation.

[0034] As used in this disclosure, "and / or" means any one or more of the items in the list linked by "and / or". As an example, "x and / or y" means any element of the three-element set {(x), (y), (x,y)}. In other words, "x and / or y" means "one or both of x and y". As another example, "x, y and / or z" means any element of the seven-element set {(x), (y), (z), (x,y), (x,z), (y,z), (x,y,z)}. In other words, "x, y and / or z" means "one or more of x, y and z". As used in this disclosure, the term "exemplary" is meant to serve as a non-limiting example, instance or illustration. As used in this disclosure, the term "for example" begins a list of one or more non-limiting examples, instances or illustrations.

[0035] For the purposes of promoting an understanding of the principles of the claimed technology and setting out the best currently understood modes of operation, reference will now be made to the embodiments illustrated in the drawings and specific language will be used to describe the same, however, this is not intended to limit the scope of the claimed technology, and it is to be understood that such changes and further modifications in the devices shown, and such further applications of the principles of the claimed technology shown therein, are believed to be ordinarily contemplated by one of ordinary skill in the art to which the claimed technology pertains.

[0036] 1 illustrates one example fixture or system 100 for mounting a grinder / polisher specimen holder 130. The system 100 includes one or more mounting fixtures 102 disposed on and mounted to a platform 120. As shown, the mounting fixtures 102 are configured to secure the specimen holder 130, thereby fixing the orientation and / or position of the specimen holder 130 in preparation for an operation, such as hardness testing.

[0037] Each mounting fixture can include one or more mounting brackets 112 that can be removably secured to the column 104 of the mounting fixture 102. For example, the mounting fixture 102 can include one or more specimen mounting bracket fasteners 110, such as threaded holes that receive bolts. In some examples, the mounting brackets 112 can be adjusted relative to the mounting fixture 102 and / or specimen, such as by raising, lowering, tilting, and / or sliding laterally, by way of non-limiting examples. An example adjustable mounting lock bracket 114 is illustrated with a specimen mounting lock bracket 116, although any variety of fasteners or bolts can be used. As shown in FIG. 1, the mounting brackets 112 are configured to contact the sides of the specimen holder to limit lateral movement of the specimen holder. In some examples, the one or more mounting brackets 112 can be configured to contact one or more of the top and / or bottom surfaces of the specimen holder 130 and can be shaped (e.g., curved) to match the contours of the specimen holder 130.

[0038] In some examples, one or more interfaces 108 are formed on and / or secured to the column 118 to contact and support the specimen holder 130 when the specimen holder is positioned within the system 100, thereby limiting downward movement of the specimen holder 130. In some examples, the one or more interfaces 108 are integrally formed with the column 118. In some examples, the one or more interfaces 108 are separately formed (e.g., from a hardened material such as carbide or steel) and secured directly to the column 118, while in some examples, the extension post 106 is positioned to support the interface 108. In some examples, the extension post 106 and / or the interface 108 can be removably secured to the mounting fixture 102. For example, different extension posts 106 and / or interfaces 108 can have different characteristics (e.g., height, contact surface area, material composition, etc.) to accommodate different specimen holders 130. In some examples, the extension post 106 and / or the interface 108 can have fasteners or pins that connect to fasteners on the test specimen holder 130 to further help secure the test specimen holder 130 within the system 100.

[0039] The example mounting fixture 102 includes a base portion 103 with a column 118 extending from the base portion 103 to support an extension post 106, an interface 108, and a test specimen holder 130. In some examples, the base portion is configured to rest on a surface 122 of a platform 120. For example, one or more fasteners 124 are disposed on the platform 120 to receive posts, dowels, bolts, etc. to secure the base portion 103 to the platform 120.

[0040] 1, the mounting fixture 102 is configured to support the specimen holder 130 at a distance from the surface 122 of the platform 120 that is greater than the length of the specimen holder drive adapter 134. This configuration ensures that the specimen holder 130 can be removed from the grinding / polishing system and placed directly onto the mounting system 100 without requiring any modifications to the specimen holder 130.

[0041] In some examples, one or more of the mounting fixture 102, platform 120, fasteners, mounting brackets 112, 114, bracket locks 116, and / or extension posts are formed from a metal, such as stainless steel, and / or a composite material suitable for withstanding impacts from a hardness tester.

[0042] Although the mounting fixture 102 is shown having a particular geometric shape (e.g., substantially L-shaped), any other suitable geometric shape can be used. Additionally, although the mounting fixture 102 is shown as a single piece including a column and a base, in some examples the mounting fixture can be formed from two or more pieces.

[0043] 2A illustrates a side view of an example system 100 with certain features shown in cross section. As shown, the mounting fixture 102 is mounted on a platform 120 and disposed on or near a fastener 124. One or more bolts 124B may secure the mounting fixture 102 to the platform 120 to stabilize and / or secure the mounting fixture 102 relative to the platform 120. Additionally or alternatively, one or more posts 124A may be disposed adjacent the base 103 to limit movement of the mounting fixture 102.

[0044] In some examples, the platform 120 can include one or more alignment devices 140, for example, to ensure consistent orientation of the platform 120 and the system 100 in the hardness testing system. In examples, the alignment device 140 is a magnet configured to couple to a magnet of opposite polarity on a surface or platen of the hardness testing system. In some examples, one or more of magnets, posts, or apertures, by way of non-limiting examples, can be employed to align the system 100.

[0045] FIG 2B shows an exploded view of the example system of FIG 1. As shown, six mounting fixtures 102 are arranged around the platform center point 126 to fit the test specimen holder 130. Each mounting fixture 102 is paired with two posts 124A and a single bolt 124B to secure and / or stabilize the mounting fixture relative to the platform 120. In the example of FIG 2B, two mounting brackets 112 are secured (via bolts 110A) to two mounting fixtures 102, with the two mounting fixtures separated by adjacent mounting fixtures. A third mounting fixture 102 is separated from the two mounting fixtures by two mounting fixtures adjacent to the third mounting fixture, to which an adjustable mounting bracket 114 is releasably secured by a bracket lock 116.

[0046] Although illustrated with six mounting fixtures, the system may use as few as one mounting fixture or may use seven or more mounting fixtures depending on the size, shape, and / or geometry of the specimen holder and / or the particular application or test system. Although two mounting brackets and a single adjustable mounting bracket are illustrated, each mounting bracket used may be adjustable or no adjustable mounting brackets may be used. Although the mounting fixtures are shown around a center point on the platform, in some instances the mounting features may have an asymmetrical arrangement on the platform.

[0047] 3A shows a top view of an example system 100. As shown, the mounting fixtures 102 are distributed around the platform at equal radial distances 142 from a center point 126. For example, the interfaces 108 may be at equal distances from the center point to balance forces exerted on the system 100 from the specimen holder 130 during a testing operation (e.g., hardness testing). In some examples, the mounting fixtures are separated by equal distances 144 between axial positions.

[0048] FIG. 3B shows a cross-sectional view along line AA shown in FIG. 3A and provides a detailed view of fasteners 110, 110A for securing mounting bracket 112 to column 118, as well as fasteners 124 and 124B for securing base 103 to platform 120.

[0049] FIG. 4 is a perspective block image of the exemplary system 100 shown in FIG. 1 with the specimen holder 130 removed.

[0050] 5A-5C show various views of the system 100 for mounting a grinder / polisher specimen holder employed with a hardness tester 150. For example, the hardness tester 150 can include a platen 154 upon which the system 100 can be positioned. A hardness testing tool 152, such as an indentation device, is positioned above the platen 154 and configured to apply an impact to one or more of the specimens 132 in the specimen holder 130 to create an indentation in the specimen 132.

[0051] In some examples, the platen 154 includes one or more alignment devices 158 that couple to the platform 120. Once aligned, the positions of the test specimens 132 can be readily determined by the hardness tester so that the indentation device can apply an impact to one or more of the test specimens 132.

[0052] In some examples, the platen 154 is operatively connected to an actuator-driven moveable stage 156. The actuator can be controlled by a controller (e.g., a computing platform, processor, etc.) to move (e.g., shift, rotate, oscillate, etc.) the stage 156 relative to the indentation device 152 to move between and / or within the specimen.

[0053] In some examples, the actuator is configured to move the stage 156 toward and / or away from the specimen to adjust the load or force applied to the specimen (e.g., a linear type actuator that is controlled to move or drive the platen toward and away from the specimen). Many types of actuators can be used to facilitate the testing operation.

[0054] In some examples, test strip holder 130 includes a number of sample receiving slots configured to hold test strips 132 that can be removed from test strip holder 130 .

[0055] The above description and accompanying drawings illustrate the principles, preferred embodiments and modes of operation. However, the disclosure should not be construed as limited to the particular embodiments described above. Additional variations of the above-described embodiments will be appreciated by those skilled in the art.

[0056] Although the method and / or system have been described with reference to certain specific embodiments, those skilled in the art will recognize that various modifications and equivalents may be substituted without departing from the scope of the method and / or system. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the disclosure without departing from the scope of the disclosure. For example, blocks and / or components of the disclosed examples may be combined, divided, rearranged, and / or otherwise modified. Thus, the method and / or system is not limited to the particular embodiments disclosed. Instead, the method and / or system includes all embodiments falling within the scope of the appended claims, either literally or under the doctrine of equivalents. Although the controller and method are described as being used in conjunction with a grinding / polishing and / or hardness / density testing system, the teachings may be applied to other systems and operations as well.

[0057] All references referred to in this disclosure, including published journal articles or proceedings, published or corresponding U.S. or foreign patent applications, issued patents or foreign patents, or any other literature, are each incorporated by reference in their entirety, including all data, tables, figures, and text presented within the referenced documents.

Claims

1. 1. A system for mounting a grinder / polisher specimen holder, comprising: a platform comprising one or more fasteners; one or more mounting fixtures disposed on and attached to the platform, the one or more mounting fixtures configured to secure a test strip holder, each mounting fixture comprising: one or more mounting brackets that fix the orientation or position of the test specimen holder; one or more interfaces that contact and support the test strip holder when the test strip holder is placed within the system; one or more mounting fixtures comprising: A system comprising:

2. 1. A hardness testing system comprising: a grinder / polisher specimen holder; 1. A system for mounting a grinder / polisher specimen holder, comprising: a platform comprising one or more fasteners; one or more mounting fixtures disposed on and attached to the platform, the one or more mounting fixtures configured to secure a test strip holder, each mounting fixture comprising: one or more mounting brackets that fix the orientation or position of the test specimen holder; one or more interfaces that contact and support the test strip holder when the test strip holder is placed within the system; one or more mounting fixtures comprising: a system comprising: Equipped with Hardness testing system.

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