Sample swabs and production methods

Abstract

A sample swab and a method for producing a sample swab for collecting a sample for delivery to a detector are provided. The method for producing a sample swab for collecting a sample for delivery to a detector includes providing a swab substrate in the form of a sheet and stamping the swab substrate in a press having surface protrusions to form one or more raised portions in the sample collection area of ​​the swab substrate, wherein the one or more raised portions protrude from the surface of the sheet by a distance greater than 0.1 mm and less than or equal to 1.0 mm.

Description

Technical Field

[0001] The present disclosure relates to a sample swab and a method of producing a sample swab for collecting a sample for delivery to a detector. In particular, the present disclosure relates to a sample swab and a method of producing a sample swab, where the sample swab is formed by stamping a swab surface to provide surface protrusions.

Background Art

[0002] Sample swabs are used for sample collection for trace analyte detectors to deliver a sample from a target, such as a surface to be analyzed, to the inlet of a detector. Sample collection efficiency is important in such applications to ensure that trace substances such as explosives and drugs can be detected. Therefore, it is desirable to improve the collection efficiency of the same sample collection swab.

[0003] Furthermore, as a result of the use of the same swab when only trace amounts of the collected substance are to be detected, sample collection swabs are typically disposable in order to avoid contamination and false positives. Therefore, sample swabs need to be suitable for efficient mass production in order to provide a practical and economical production of the same swab.

[0004] Aspects and embodiments of the present disclosure aim to address the above technical problems.

Summary of the Invention

[0005] Embodiments of the present disclosure relate to a sample swab and a method of producing a sample swab for collecting a sample for delivery to a detector.

[0006] Trace detectors, such as those used in ion mobility spectroscopy and mass spectroscopy, are configured to detect very low concentrations of a target substance, but this trace detection also relies on reliable sample delivery to the detector. Therefore, sample collection efficiency when using swabs to collect samples is crucial in providing a reliable detection system.

[0007] A sample collection swab may, appropriately, comprise a substrate in contact with the surface to collect trace amounts of the target substance present on the surface. The swab may generally be provided with an adhesive or other chemical coating on the swab to improve collection efficiency and / or to provide specific chemical compatibility with the target trace material. However, post-processing of such swabs may require complex additional processes that can add significant costs to the production process when carried out on a large scale, making it difficult to scale efficiently in large quantities for mass production.

[0008] Embodiments of this disclosure aim to address such problems by providing a method for producing sample swabs toward improved collection efficiency, which can be easily scaled up for efficient mass production.

[0009] The aspects of this disclosure are described in the independent claims, and any optional features are described in the dependent claims. The aspects of this disclosure may be provided in relation to one another, and features of one aspect may be applied to other aspects.

[0010] In one embodiment, a method for producing a sample swab for collecting a sample to be delivered to a detector includes providing a swab substrate in the form of a sheet, and stamping the swab substrate in a press having surface protrusions to form one or more raised portions in the sample collection area of ​​the swab substrate, wherein the one or more raised portions protrude from the surface of the sheet by a distance greater than 0.1 mm and less than or equal to 1.0 mm.

[0011] By using a press to deform a sheet of swab substrate, the method can be applied efficiently on a large scale to produce swabs having raised areas on the surface of the swab substrate. The raised areas formed by the stamping step may, appropriately, be formed to protrude more than 0.1 mm from the surface of the swab substrate. Thus, raised areas that can help collect the target material in the swab may be formed in a more efficient manner compared, for example, surface coating and chemical treatment. Using a press to stamp the swab to provide one or more raised areas can allow the process to be carried out on an efficient and consistent scale.

[0012] The swab substrate is preferably in the form of a sheet. The sheet for the swab substrate may be provided in any suitable form for use in this process. The swab substrate may be used in a form in which the sheet material may be provided. For example, the material for the swab substrate may be provided in the form of a roll of sheet material, or the swab substrate in sheet form may be sheet material provided by an extrusion process and / or a sheet rolling process such as calendering.

[0013] The swab base material may be made from any suitable sheet material. In a preferred embodiment, the swab base material may comprise a woven or nonwoven sheet material. Any material may include cellulosic materials (e.g., paper), polymer fibers (e.g., polyamides such as PTFE and aramid polymers), glass fibers, and natural fibers such as cotton, which may be used to form a woven or nonwoven sheet material. For example, the swab base material may comprise any one of paper, polymer material, glass fiber, or a mixture thereof, or may consist substantially of any one of them. Preferably, the swab base material comprises paper or an aramid polymer, such as a metharamid polymer such as Nomex®, or is substantially composed of these. The swab material may be processed, for example, calendered, to provide the swab base material in sheet form.

[0014] The swab substrate has one or more ridges in the sample collection area, the one or more ridges protruding from the sheet surface of the swab substrate. The protrusions of the one or more ridges from the sheet surface (at the peaks of the one or more ridges) may appropriately define perpendicular protrusions of the swab surface from the surface including the undeformed portion of the swab substrate (i.e., the portion pressed between portions of the pressed surface that do not have surface protrusions). For example, the protrusions of the one or more ridges from the sheet surface may appropriately define perpendicular protrusions of the swab surface from the remaining undeformed swab surface when the undeformed portion substantially defines a plane. Furthermore, the pressing step may optionally include providing protrusions from the surface of the swab surface in both directions, such that, as described herein, the thickness of the swab may be considered to be from the peak of the ridge on one side of the substrate to the peak on the opposite side of the swab substrate, and thus protrusions of the swab surface from the sheet surface that are greater than 0.1 mm and less than or equal to 1.0 mm.

[0015] One or more ridges protrude from the sheet surface by more than 0.1 mm and less than or equal to 1.0 mm. Surface ridges greater than 0.1 mm can provide surface texture to the swab, enabling improved sample collection from the surface the swab contacts, while also allowing for economical production of the swabs. For example, larger surface ridges greater than 1.0 mm may deform more easily with use of the swab for sampling, and excessive deformation of the swab during stamping may make the swab material brittle, potentially leading to undesirable breakage during use.

[0016] One or more protrusions may appropriately protrude 0.2 mm or more, for example, 0.3 mm or more, from the surface of the swab base sheet. Similarly, one or more protrusions may protrude 0.8 mm or less, for example, 0.6 mm or less, from the surface of the sheet. In embodiments, one or more protrusions may protrude at least 0.5 mm, for example, at least 0.7 mm, from the surface of the swab base sheet.

[0017] It will be understood that the size of the surface ridge may be appropriately determined based on the size of the protrusion on the surface of the press used. Furthermore, the height of the ridge on the swab may also be appropriately measured by microscopy, such as optical microscopy, or any other appropriate method known in the art.

[0018] The thickness of the swab base sheet may appropriately range, for example, from 0.02 mm to 2.0 mm, for example, from 0.04 mm to 1.0 mm, for example, from 0.05 mm to 0.5 mm, for example, 0.3 mm or less, for example, 0.2 mm or less. It will be understood that the thickness of the swab base may be changed depending on the specific material used. For example, a paper swab base may have a thickness of 0.02 mm to 0.1 mm, for example, from 0.04 mm to 0.08 mm, in some embodiments, and an aramid polymer swab may have a thickness of 0.06 mm to 0.14 mm, for example, from 0.08 mm to 0.12 mm, in some embodiments.

[0019] The ratio of the protrusions of one or more raised parts to the swab thickness may be appropriately from 0.2 to 50, for example from 1 to 10, for example from 2 to 6. In some preferred embodiments, the size of the surface protrusions of one or more raised parts may be at least the same as the thickness of the swab, for example, the surface protrusions of one or more raised parts may preferably be larger than the thickness of the swab.

[0020] The swab substrate may have ridges formed by deformation of the swab substrate over the entire cross-section of the swab substrate. For example, the swab substrate sheet may be defined by a surface, and the ridges comprise deformation of the surface from an undeformed portion, e.g., a flat portion of the swab. Thus, in a preferred embodiment, one or more ridges may correspond to depressions on the opposite surface of the swab substrate, for example, the swab having a substantially uniform thickness and / or the ridges being formed by deformation of the swab substrate material over the entire thickness of the swab substrate material. In particular, when the swab thickness is less than the height of the ridge projections from the surface of the swab, one or more ridges may correspond to depressions on the opposite surface of the swab substrate. In other embodiments, the ridges formed in the swab may protrude from one side of the swab substrate. For example, if the swab substrate is thicker than the protrusion of the ridge from the surface, the ridges may be formed without deformation of the side of the swab substrate opposite to the side on which the ridge is provided.

[0021] The method includes stamping a swab substrate in a press having surface protrusions to form a raised portion in the swab. Stamping the swab substrate in a press appropriately includes applying pressure to the swab substrate sheet between two surfaces, at least one of which may be shaped to deform the swab substrate to provide a raised portion, for example, both surfaces of the press in contact with the opposing surfaces of the swab substrate may appropriately be shaped to stamp the swab substrate. For example, the press may have two surfaces having corresponding surface contours such that a protrusion from one surface aligns with a recess in the opposing surface of the press. Thus, the press may comprise a first plate and a second plate, the first plate and the second plate each having a surface protrusion and a corresponding surface recess, and the swab substrate is pressed between the first plate and the second plate. The stamping step may include, for example, forming a cut portion that penetrates the sheet of swab material adjacent to at least a portion of one or more raised areas, such that the cut edge of the swab material forms the peak of the corresponding raised area.

[0022] The press used in this process may appropriately include a mold, such as a molding die. The press may be configured in any suitable way to provide a raised portion corresponding to a desired raised shape in the swab substrate. The press may include a press die having a projection on one surface of the press and a corresponding recess on the opposite surface. If a cut portion penetrating the material of the swab substrate is desired, the press may include a mold configured to cut the sheet of the swab substrate, thereby forming a raised portion in the material adjacent to the cut portion that protrudes from the swab surface. A press configured to produce a cut portion in the swab substrate may also appropriately be configured to form a non-cut raised portion, such as an imprinted portion of the swab substrate.

[0023] The press may take any suitable form, for example, comprising two surfaces on which the swab substrate sheet is pressed, each surface being provided by a substantially flat plate, a curved surface of a roller, or a combination thereof (e.g., one flat surface and one roller).

[0024] In embodiments, multiple sample swabs may be produced by the same stamping step, if appropriate. For example, the stamping may include providing multiple separate sample collection areas, each of which has a raised portion in the same sample substrate sheet as defined herein. The stamping step may also include cutting the swab substrate sheet to separate the multiple sample collection areas and form multiple sample swabs. This may be achieved, for example, by using a mold configured to cut the swab substrate around a predetermined boundary between each of the swabs present in the swab substrate sheet. Within each cutting portion of the mold, the press or mold may be configured to provide a raised portion to be stamped in the sample collection area of ​​each separate swab, if appropriate. Thus, multiple swabs can be stamped and separated from each other in a single step.

[0025] One or more raised portions formed by the stamping step may have any suitable dimensions or shape in terms of the arrangement of one or more such portions on the surface of the swab, for example, the location and dimensions of one or more such portions in the plane of the swab substrate. For example, the raised portions may be provided in the form of lines on the swab substrate, which may include straight and / or curved lines. The raised portions may form a closed shape on the surface of the swab, for example, a circular raised portion or any other shape, and / or the raised portions may comprise one or more lines that do not form a closed shape. If there are raised portions adjacent to a cut portion on the swab substrate, it will be understood that these raised portions are not usually positioned to form a closed shape, as this separates the material inside the closed shape from the rest of the swab substrate. Therefore, if multiple raised portions provide adjacent cut portions on the swab substrate, the raised portions may be positioned so as not to intersect (however, the raised portions may be positioned to intersect with raised portions that do not have cut portions). In the embodiment, one or more protrusions may include points rather than lines, so as to form generally conical or hemispherical projections on the swab substrate.

[0026] Preferably, one or more raised portions are formed in a symmetrical pattern on the swab. For example, the sample collection area may comprise one or more raised portions arranged in a symmetrical pattern. The symmetrical pattern may have any desired level of symmetry. For example, the symmetrical pattern may have at least twofold symmetry, e.g., at least threefold symmetry, e.g., at least fourfold symmetry or more, e.g., at least sixfold symmetry. The symmetrical pattern may comprise all or only some of the raised portions formed on the swab. For example, the swab may be formed having a mixture of different patterns having different degrees of symmetry. In some embodiments, the raised portions may comprise a combination of (i) raised portions having cuts that penetrate the swab material and (ii) raised portions without cuts, where (i) and (ii) together form a symmetrical pattern, or each forms separate patterns, where one or both of the separate identical patterns may be symmetrical and have different degrees of symmetry. The symmetrical arrangement of raised areas in a swab can help reduce anisotropy related to sample collection efficiency. For example, since users do not always wipe the sampled surface in the same direction, or in the direction intended according to the swab design, providing symmetry in the sample collection area can help ensure effective and consistent sample collection.

[0027] The method may include applying a coating configured to improve sample collection efficiency to at least the sample collection area of ​​the swab substrate. For example, an adhesive coating may be applied to the swab substrate, and the adhesive coating may be applied to the entire swab surface or only to the sample collection area. The coating may include any suitable coating material, preferably a non-volatile coating that does not result in gas release or decomposition of the coating when heated to adsorb the collected sample for analysis by a detector. The coating may preferably include a non-volatile polymer coating. In embodiments, the coating includes polyisobutylene.

[0028] The coating may be applied to the swap substrate before or after the stamping step. In an embodiment, the coating is applied before the stamping step, whereby the coating can be avoided from covering the raised portions formed in the swap substrate. Thus, the raised portions may be formed by the deformation of both the material of the swap substrate and the material coated on the swap substrate. In other embodiments, the coating may be applied after the stamping step and may be applied to retain the surface profile of the raised portions. For example, the coating may be applied in a thin layer relative to the size of the raised portions. For example, the thickness of the coating may be less than the size of the raised portions. For example, the protrusion of the raised portions before the coating may be at least twice the thickness of the coating, for example, at least five times the thickness of the coating.

[0029] The stamping step may further include stamping raised portions on the swap substrate outside the sample collection region. For example, additional raised portions may be applied to the swap to provide increased rigidity to the swap to assist in inserting the swap into the detector. Further raised portions may be stamped on the swap to provide a visual marker such as an identification number or to add the name or logo of the manufacturer. Preferably, this may be done simultaneously with the provision of the raised portions for improving sample collection as described above.

[0030] The method provides a sample swab for collecting a sample for delivery to a detector. The detector may be any suitable detector capable of obtaining an analytical sample from the sample collection swab and may comprise a trace analyte detector. For example, the detector may comprise an ion mobility spectrometry (IMS), mass spectrometry (MS), a chromatography device such as a gas chromatography (GC) device, or a liquid chromatography device such as an HPLC device, or combinations thereof such as IMS-MS or GC-MS. Delivery of the sample from the sample swab to the detector may suitably be by heating the swab to adsorb the sample of interest collected in the swab for analysis. Formation of the raised portion provided by the swab material itself may be advantageous in that it may avoid the need for the use of an adhesive coating that may release interfering substances when heated in this way.

[0031] Providing a raised portion in the swab to provide a sample collection area may be configured such that the sample collection area, for example, is aligned with the inlet of a detector that draws in the vaporized sample, depending on the size and / or shape of the same sample collection area, thereby, for example, improving the collection of the material of interest collected in the swab into the inlet. The sample collection area may have a size and / or shape configured to be aligned with a heater operable to adsorb the sample from the swab, for example, a heater at the inlet of the detector.

[0032] In embodiments, the stamping step may provide boundary ridges to provide the user with guidance on where the sample collection area is positioned on the swab, without requiring other visual marks that may add cost and complexity to the process or introduce additional contaminants that may interfere with later trace detection. Thus, in embodiments, one or more boundary ridges are formed on the swab substrate, and the one or more boundary ridges define, for example, the periphery of the sample collection area (e.g., the periphery of the ridges formed in the sample collection area). The one or more boundary ridges may protrude more than the one or more ridges in the sample collection area from the surface of the swab substrate sheet to provide a visual guide for the sample collection area and / or to help retain the concentration of the sample in the sample collection area.

[0033] The boundary ridge and the sample collection area may be configured to correspond to the detector entrance; for example, the boundary ridge may be sized to correspond to the detector entrance or a heater at the detector entrance. In this way, sample collection may be more easily concentrated by the user in a region of the swab where the sample can be efficiently transferred to the detector. This may be achieved without adding significant processing complexity by creating one or more boundary ridges during the stamping step as described above, which can be done simultaneously with stamping one or more ridges onto the swab in the sample collection area.

[0034] A further embodiment provides a sample swab comprising a swab substrate in the form of a sheet, wherein the sample swab has one or more protrusions protruding from the surface of the sheet in the sample collection area, the protrusions being greater than 0.1 mm and less than or equal to 1.0 mm from the surface of the swab.

[0035] It will be understood that the sample swab may be substantially as defined elsewhere in this specification, and may, appropriately, be a swab prepared by any of the methods defined herein.

[0036] For example, one or more raised portions may protrude from the surface of the sheet by 0.2 mm or more, for example, 0.3 mm or more. Alternatively, one or more raised portions may protrude from the surface of the sheet by 0.8 mm or less, for example, 0.6 mm or less. In the embodiment, one or more raised portions may protrude from the surface of the swab base sheet by at least 0.5 mm, for example, at least 0.7 mm.

[0037] One or more ridges may correspond to depressions on the opposite surface of the swab substrate, as described elsewhere in this specification, such that the ridges are formed not by a single surface deformation but by deformation of the surface of the swab substrate sheet.

[0038] The swab may have a cut portion that penetrates the sheet of the swab material adjacent to at least a portion of one or more raised areas, as described elsewhere herein, such that the cut edge of the swab material forms the peak of the corresponding raised area.

[0039] One or more raised areas may be arranged in a symmetrical pattern within the sample collection area, as described elsewhere in this specification.

[0040] The swab may have a sample collection area, for example, one or more boundary ridges defining the periphery of the sample collection area, as described elsewhere in this specification. For example, one or more boundary ridges may protrude more than one or more ridges in the sample collection area from the surface of the sheet.

[0041] As described elsewhere in this specification, the swab may include a coating, such as a polyisobutylene coating, configured to improve sample collection efficiency in at least the sample collection area of ​​the swab substrate.

[0042] As mentioned above, the swab base material may appropriately include a woven or nonwoven sheet material. For example, the swab base material may include paper, a polymer material, or glass fiber, preferably paper or an aramid polymer.

[0043] A further embodiment provides a system comprising one or more sample swabs as defined herein and a detector, wherein, for example, the size and / or shape of the sample collection area of ​​the sample swab, and / or the size and / or shape of the sample swab, are configured to correspond to the entrance of the detector configured to receive the swab. [Brief explanation of the drawing]

[0044] Herein, examples of the present disclosure are described for illustrative purposes only with reference to the attached drawings. [Figure 1A] Figure 1A shows a schematic diagram of the stamping process that forms raised areas in the swab. [Figure 1B] Figure 1B shows a schematic diagram of the stamping process that forms raised areas in the swab. [Figure 1C] Figure 1C shows a schematic diagram of the stamping process that forms raised areas in the swab. [Figure 2A] Figure 2A shows a schematic diagram of the stamping process that forms raised and cut sections in the swab. [Figure 2B] Figure 2B shows a schematic diagram of the stamping process that forms raised and cut sections in the swab. [Figure 2C] Figure 2C shows a schematic diagram of the stamping process that forms raised and cut sections in the swab. [Figure 2D] Figure 2D shows a schematic diagram of the stamping process that forms raised and cut sections in the swab. [Figure 2E] Figure 2E shows a schematic diagram of the stamping process that forms raised and cut sections in the swab. [Figure 3A]Figure 3A shows a schematic diagram of the arrangement of raised and / or cut sections on the surface of the swab. [Figure 3B] Figure 3B shows a schematic diagram of the arrangement of raised and / or cut sections on the surface of the swab. [Figure 3C] Figure 3C shows a schematic diagram of the arrangement of raised and / or cut sections on the surface of the swab. [Figure 4A] Figure 4A shows a schematic diagram of the boundary elevation around the sample collection area of ​​the swab. [Figure 4B] Figure 4B shows a schematic diagram of the boundary elevation around the sample collection area of ​​the swab. [Figure 4C] Figure 4C shows a schematic diagram of the boundary elevation around the sample collection area of ​​the swab.

[0045] In drawings, the same reference numeral is used to indicate the same element. [Modes for carrying out the invention]

[0046] This disclosure relates to a sample swab and a method for producing a sample swab for collecting a sample for delivery to a detector.

[0047] Figures 1A, 1B, and 1C show the production of sample swabs 106 by stamping the swab substrate 100 using a press.

[0048] As shown in Figure 1A, the swab substrate 100 in sheet form is provided between a first die 110 and a second die 120 of a press. The press is shown using a first flat die 110 and a second flat die 120 (210 / 220 in Figure 2), but it will be understood that any suitable configuration, e.g., two roller dies, or a combination of roller dies and flat dies, may be used. The first die 110 includes a surface projection 112 configured to deform the swab substrate 100 when the swab substrate is pressed between the first die 110 and the second die 120. The second die 120 includes a surface recess 122, which corresponds to the projection 112 so that when the press operates, the projection 112 deforms and presses the swab substrate 100 into the recess 122. The deformation of the swab substrate 100 is shown in Figure 1B, where stamping of the swab substrate 100 during pressing forms a raised portion 102 that protrudes from the surface 103 of the swab substrate sheet 100.

[0049] Figure 1C shows a sample swab 106 formed by stamping the swab substrate 100 in a press. The sample swab 106 has a raised portion 102 that protrudes from the surface 103 of the sample substrate sheet 100 by a height h. Although not labeled in Figures 1A and 1B, it will be understood that the height h also corresponds to the height of the surface protrusion 112 and the depth of the recess 122. Figure 1C also shows that the raised portion 102 corresponds to a recess 104 on the opposite surface 105 of the swab substrate sheet 100. As can be seen in Figures 1A-1C, the raised portion 102 in the swab 106 is formed by the deformation of the surface defined by the swab substrate 100.

[0050] Figures 2A-2C show an example of forming a raised portion on the swab substrate along with the cut portion of the swab substrate. As shown in Figure 2A, the swab substrate 200 is provided between a first die 210 and a second die 220 of a press. The first die 210 includes a surface projection 212 configured to deform and cut the swab substrate 200 when it is pressed between the first die 210 and the second die 220. The second die 220 includes a surface recess 222 corresponding to the projection 212, so that when the press is operated, the projection 212 deforms the swab substrate 200 and pushes it into the recess 222 in order to cut the swab substrate 200. The deformation of the swab substrate 200 is shown in Figure 2B, where stamping of the swab substrate 200 in the press forms a raised portion 202 protruding from the surface 203 of the swab substrate sheet 200.

[0051] Figure 2C shows a sample swab 206 formed by stamping the swab substrate 200 in a press. The sample swab 206 has a raised portion 202 that protrudes from the surface 203 of the sample substrate sheet 200 by a height h. Although not labeled in Figures 2A and 2B, it will be understood that the height h also corresponds to the height of the surface protrusion 212 and the depth of the recess 222. Figure 1C also shows that the raised portion 202 corresponds to a recess 204 on the opposite surface 205 of the swab substrate sheet 200. As can be seen in Figures 2B and 2C, the raised portion 202 in the swab 206 is formed by cutting the swab substrate 200 to provide the cutting edge 208a / 208b of the swab substrate 200. As can be seen in Figure 2C, the raised portion 202 is formed adjacent to the cutting edge 208. The peak of the raised portion 202 may be formed by the cutting edge 208b of the swab substrate 200 being pressed away from the surface 203 of the swab substrate 200. The other cutting edge 208a is left on the undeformed surface of the swab substrate 200. Figure 2 shows a cross-sectional view of the press and the swab 206, and it will be understood that the raised portion 202 may appropriately form a peak at height h, reducing the height in the direction perpendicular to the cross-section shown in Figure 2C. Thus, in three dimensions, the raised portion 202 may generally be semiconical, hemispherical, semipyramidal, or any other shape. Figures 2D and 2E show a possible cross-section of the raised portion 202 formed by cutting the swab substrate 200 and stamping the raised portion 202 adjacent to the cut, with an exemplary projection along the direction AB shown in Figure 2C. Figures 2D and 2E show the contours of the cutting edges 208b that form the raised portion 202. The triangular contour and the generally hemispherical contour shown in Figures 2D and 2E are merely examples, and it will be understood that any contour may be formed depending on the shape of the press protrusion 212 and recess 222.

[0052] Figures 1A-1C and 2A-2E are for illustrative purposes only, and it will be understood that numerous variations of the processes shown are conceivable. For example, while Figures 1 and 2 show the formation of two ridges 102 / 202 on the swab 106 / 206, this is for illustrative purposes only, and it will be understood that any number or configuration of ridges may be formed by the methods of the present disclosure. Similarly, while Figures 1 and 2 show a swab substrate wider than the press, this is for illustrative purposes only, and the swab substrate may have a surface area relative to the press such that it is appropriately covered by the press surface during pressing.

[0053] Figure 3 shows the arrangement of the raised portions on the swab as viewed from above, i.e., along direction AC shown in Figure 2C (however, it will be understood that the arrangement shown in Figure 3 does not necessarily correspond to the swab shown in Figure 2C). Figure 3A shows the arrangement of the raised portions 302a on the surface of the swab substrate 300. The raised portions may be formed, for example, as shown up to Figures 1A-1C. The arrangement in Figure 3A consists of connected hexagonal raised portions 302a and exhibits six-fold symmetry. The symmetrical nature of the arrangement can help ensure that sample collection is efficient and consistent, independent of the direction in which the swab is wiped against the surface. The use of this symmetry can help eliminate user error in sample collection to provide improved reliability compared to, for example, when the swab has a specific orientation regarding optimal swab sampling (which the user may not consistently follow). The hexagonal shape and six-fold symmetry are merely examples, and it will be understood that other arrangements may be used.

[0054] Figure 3B shows an alternative arrangement in which multiple ridges 302b are formed adjacent to the cut portion in the swab substrate 300, for example, as shown in Figures 2A-2C. As can be understood, when ridges with cut portions are used in the swab substrate, the ridges are appropriately separated to maintain the integrity of the swab substrate 300. The arrangement in Figure 3B simply exhibits twofold symmetry, but it will be understood that higher levels of symmetry may also be used.

[0055] As shown in Figure 3C, the arrangement may provide a combination of a ridge without a cut (302a) and a ridge with a cut (302b). As can be recognized, the arrangement comprises a symmetrical hexagonal arrangement of ridges 302a and 302b (in addition to the ridges 302b with cuts at the center of each hexagon) similar to that shown in Figure 3A, but comprising a combination of ridges with cuts 302b and ridges without cuts 302a. The combination of ridges with cuts and ridges without cuts allows for the use of ridges with cuts, while also allowing for the use of more complex and interconnected arrangements of ridges (without compromising the structural integrity of the swab by using intersecting ridges with cuts 302b).

[0056] Figures 3A and 3B show arrangements created using straight lines, but it will be understood that more complex arrangements and / or arrangements involving curved lines are also conceivable.

[0057] Figures 4A–4C show examples of sample collection areas comprising a ridge 402 along with a boundary ridge 404. As can be seen in Figure 4A, the boundary ridge 404 may protrude further from the surface of the swab substrate than the ridge 402 so that the boundary ridge 404 is more prominent and provides visual assistance regarding where the sample collection area is positioned in the swab. This may help the user when concentrating sample collection in a sample collection area that may correspond in size and / or shape to the detector entrance and / or heater to maximize the delivery of the collected sample to the detector. As shown in Figure 4B, the boundary ridge 404 may surround the ridge 402 provided in the sample collection area of ​​the swab. Figure 4C shows an example of a rectangular sample swab 406 having a sample collection area comprising the ridge 402 and boundary ridge 404 as shown in Figure 4B.

[0058] Generally, the features of an apparatus described herein may also be provided as features of a method, and vice versa.

[0059] It should also be understood that certain combinations of the various features described and defined in any aspect of the present invention may be independently implemented and / or provided and / or used. Other examples and variations will be apparent to those skilled in the art in the context of this disclosure.

Claims

1. A method for producing a sample swab for collecting a sample to be delivered to a detector, To provide a swab base material in sheet form, To form one or more raised portions in the sample collection area of ​​the swab substrate, the swab substrate is stamped in a press equipped with surface protrusions, Includes, One or more of the aforementioned protrusions protrude from the surface of the sheet by a distance greater than 0.1 mm and less than or equal to 1.0 mm. A method characterized by the following:

2. One or more of the aforementioned protrusions protrude from the surface of the sheet by 0.2 mm or more, for example, 0.3 mm or more. The method according to claim 1.

3. One or more of the aforementioned protrusions protrude from the surface of the sheet by 0.8 mm or less, for example, 0.6 mm or less. The method according to claim 1 or 2.

4. One or more of the aforementioned protrusions correspond to depressions on the opposite surface of the swab substrate. The method according to any one of claims 1 to 3.

5. The aforementioned stamping is For example, the cutting edge of the swab substrate is formed to form a cutting portion that penetrates the sheet of the swab substrate adjacent to at least a portion of one or more of the raised portions, such that the cutting edge of the swab substrate forms the peak of the corresponding raised portion. including, The method according to any one of claims 1 to 4.

6. One or more of the aforementioned raised portions are formed in a symmetrical pattern within the sample collection area. The method according to any one of claims 1 to 5.

7. One or more boundary ridges are formed in the swab substrate, One or more of the boundary elevations define, for example, the periphery of the sample collection area. The method according to any one of claims 1 to 6.

8. One or more of the boundary ridges protrude more than one or more of the ridges in the sample collection area from the surface of the sheet. The method according to claim 7.

9. The aforementioned stamping is To provide multiple separate sample collection areas on the same sample substrate sheet, including, The method according to any one of claims 1 to 8.

10. The stamping step described above is: Cutting the swab base sheet in order to separate the multiple sample collection areas and form multiple sample swabs, including, The method according to claim 9.

11. The aforementioned press release, The first plate and, The second plate and Equipped with, The first plate and the second plate are, Surface protrusions and, Corresponding surface indentations, Equipped with, The method according to any one of claims 1 to 10.

12. The aforementioned press release, Two surfaces, Equipped with, The swab substrate sheet is pressed between the two surfaces, Each of the aforementioned surfaces is provided by a substantially flat plate or a curved surface of a roller. The method according to any one of claims 1 to 11.

13. A coating configured to improve sample collection efficiency, such as a polyisobutylene coating, is applied to at least the sample collection area of ​​the swab substrate. including, The method according to any one of claims 1 to 12.

14. The coating is applied before the stamping step. The method according to claim 13.

15. The swab substrate is Woven or nonwoven sheet material, including, The method according to any one of claims 1 to 14.

16. The swab substrate is Paper, polymer material, or glass fiber, preferably paper or aramid polymer, including, The method according to claim 15.

17. A sample swab comprising a swab substrate in the form of a sheet, One or more protrusions protruding from the surface of the sheet in the sample collection area, It has, The raised portion protrudes above the surface of the swab by a distance greater than 0.1 mm and less than or equal to 1.0 mm. A sample swab characterized by the following features.

18. One or more of the aforementioned protrusions protrude from the surface of the sheet by 0.2 mm or more, for example, 0.3 mm or more. The swab according to claim 17.

19. One or more of the aforementioned protrusions correspond to depressions on the opposite surface of the swab substrate. The swab according to claim 17 or 18.

20. For example, the cutting edge of the swab substrate penetrates the sheet of the swab substrate adjacent to at least a portion of one or more of the raised portions, such that the cutting edge of the swab substrate forms the peak of the adjacent raised portion. Having, The swab according to any one of claims 17 to 19.

21. One or more of the aforementioned raised portions are arranged in a symmetrical pattern within the sample collection area. A swab according to any one of claims 17 to 20.

22. The sample collection area, for example, one or more boundary elevations that define the periphery of the sample collection area, Having, A swab according to any one of claims 17 to 21.

23. One or more of the boundary ridges protrude more than one or more of the ridges in the sample collection area from the surface of the sheet. The swab according to claim 22.

24. A coating configured to improve the sample collection efficiency in at least the sample collection area of ​​the swab substrate, for example, a polyisobutylene coating, Having, A swab according to any one of claims 17 to 23.

25. The swab substrate is Woven or nonwoven sheet material, Equipped with, A swab according to any one of claims 17 to 24.

26. The swab substrate is Paper, polymer material, or glass fiber, preferably paper or aramid polymer, Equipped with, The swab according to claim 25.

27. The sample swab is prepared by the method described in any one of claims 1 to 16. The swab according to claim 17.

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