Overlay measurement device and method for controlling focus, and program therefor

Abstract

To provide an overlay measuring device that controls the focus in order to shorten the measurement time for a wafer, and a method for controlling the focus of the overlay measuring device and a program therefor.SOLUTION: An overlay measuring device 100 includes: an objective lens 120; a memory 180; a lens focus actuator 125 operating the objective lens 120 to adjust a distance between the objective lens and a wafer 140 placed on a stage 190; and a processor 170 controlling operations of the memory 180 and the lens focus actuator 125. The processor 170 is configured to obtain a first height value in relation to each site of the wafer 140, match the obtained first height value and a corresponding site and store the same, and as initial measurement in relation to each site of the wafer 140 starts, control the lens focus actuator 125, on the basis of the stored first height value of the site, to control a Z-axis movement of the objective lens 120.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to an overlay measurement apparatus and method for controlling focus, and a program therefor. [Background technology]

[0002] Typically, as technology advances, the size of semiconductor wafers whose characteristics are to be measured decreases, and the density of integrated circuits in the measurement devices increases. To form integrated circuits on a wafer, the wafer must undergo multiple manufacturing steps to sequentially form the desired circuit structures and elements at specific locations. These manufacturing steps sequentially create patterned layers on the wafer.

[0003] These repeated stacking steps create electrically active patterns in an integrated circuit. If the structures are not aligned within the tolerances allowed by the manufacturing process, interference between the electrically active patterns can occur, which can cause problems in the performance and reliability of the manufactured circuit. Overlay metrology tools are used to measure and verify the alignment errors between these layers.

[0004] Common overlay metrology methods measure and verify whether the alignment between two layers is within a tolerance. One method is to form a structure called an overlay mark at a specific location on the substrate and then photograph the structure with an optical image capture device to measure the overlay.

[0005] Conventionally, for these measurements, the stage is moved in the X-axis and Y-axis (i.e., X-axis and Y-axis) directions, and then the objective lens is moved in the Z-axis direction.

[0006] However, in these conventional methods, the stage is moved along the XY axes to the position of the site to be measured, and then the objective lens is adjusted along the Z axis according to the height measured by the AF (Auto Focus) system. This increases the measurement time for the wafer (e.g. MAM (Move Acquire Measure) Time), which causes a problem of reduced work performance.

[0007] Therefore, there is a need to reduce the measurement time for the wafer by predicting the height of each site on the wafer in advance and moving the stage and the objective lens simultaneously. Summary of the Invention [Problem to be solved by the invention]

[0008] SUMMARY OF THE PRESENT EMBODIMENTS Accordingly, an object of the present invention is to provide an overlay measurement apparatus and method for controlling focus, and a program therefor.

[0009] Another object of the present invention is to provide an overlay measurement apparatus and method, and a program therefor, in which the stage and the objective lens are moved simultaneously.

[0010] The object of the present invention is not limited to the object mentioned above, and other objects and advantages of the present invention not mentioned can be understood from the following description and can be more clearly understood from the embodiments of the present invention. In addition, it is easy to understand that the object and advantages of the present invention can be realized by the means and combinations thereof described in the claims. [Means for solving the problem]

[0011] To achieve this object, an overlay measurement apparatus that controls focus according to one embodiment of the present invention includes an objective lens; a memory; a lens focus actuator that operates the objective lens to adjust a distance from a wafer; and a processor that controls the operation of the memory and the lens focus actuator, wherein the processor acquires a first height value for each site of the wafer, matches the acquired first height value with the site and stores it, and when an initial measurement for each site of the wafer begins, controls the lens focus actuator based on the stored first height value for the site to control Z-axis movement of the objective lens.

[0012] In addition, a method for controlling focus of an overlay measurement apparatus according to an embodiment of the present invention may include the steps of: acquiring a first height value for each site of a wafer; matching and storing the acquired first height value with the site; and, when an initial measurement for each site of the wafer begins, controlling a Z-axis movement of an objective lens based on the stored first height value of the site.

[0013] In addition, in a computer-readable storage medium having recorded thereon a program storing commands for controlling the focus of an overlay measurement apparatus according to an embodiment of the present invention, the program may include commands for acquiring a first height value for each site of the wafer; commands for matching and storing the acquired first height value with the site; and commands for controlling Z-axis movement of an objective lens based on the stored first height value of the site when an initial measurement for each site of the wafer begins. Effect of the Invention

[0014] The present invention can shorten the measurement time for the wafer by acquiring height values ​​for each site on the wafer, and when initial measurement for each site on the wafer begins, controlling the Z-axis movement of the objective lens based on the stored height value for that site.

[0015] Furthermore, the present invention can improve work efficiency by simultaneously moving the stage on which the wafer is placed in the XY axes and moving the objective lens in the Z axis, thereby shortening the measurement time.

[0016] In addition, the present invention obtains a second height value relative to the wafer when the Z-axis movement of the objective lens is completed based on a first height value, and models the difference between the first height value and the second height value, thereby efficiently controlling the Z-axis movement of the objective lens at the next site based on the predicted height value.

[0017] In addition, the present invention can predict the Z-axis movement of the objective lens in advance by storing the height value acquired at the current site of the wafer in memory or updating it to measure the height value of the next site, and applying the height value acquired at the current site to the next site.

[0018] In addition, the present invention improves prediction performance despite the many variations between wafers and Z-axis differences due to hardware conditions of the metrology tool by storing the height value acquired at the current site of the wafer in memory or updating it to measure the height value of the next site.

[0019] The above-mentioned effects and specific effects of the present invention will be described in conjunction with the following description of the preferred embodiment of the invention. [Brief description of the drawings]

[0020] [Figure 1] 1 is a conceptual diagram of an overlay measurement apparatus according to an embodiment of the present invention; [Diagram 2] 1 is a flow chart illustrating a process for predicting height values ​​for sites on a wafer according to an embodiment of the present invention. [Diagram 3] FIG. 1 is a flow chart illustrating a process for measuring a wafer based on prediction of height values ​​for sites on the wafer according to an embodiment of the present invention. [Figure 4] 1 is an exemplary view showing a state in which a wafer is placed on a stage according to an embodiment of the present invention; DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0021] The above-mentioned objects, features and advantages will be described in detail below with reference to the accompanying drawings, so that a person having ordinary skill in the art to which the present invention pertains can easily implement the technical idea of ​​the present invention. In describing the present invention, if a detailed description of a known technology according to the present invention is deemed to make the gist of the present invention unclear, the detailed description will be omitted. Hereinafter, a preferred embodiment according to the present invention will be described in detail with reference to the accompanying drawings. The same reference numerals in the drawings are used to indicate the same or similar components.

[0022] Although the terms "first", "second", etc. are used to describe various components, it is understood that these components are not limited by these terms. These terms are used merely to distinguish one component from another, and it is understood that a first component may also be a second component unless otherwise specified.

[0023] Hereinafter, when an arbitrary structure is arranged on the "top (or bottom)" of a component or "above (or below)" a component, it means that the arbitrary structure is not only arranged in contact with the upper surface (or lower surface) of the component, but also that other structures may be interposed between the component and the arbitrary structure arranged on (or below) the component.

[0024] In addition, when a component is described as being "coupled," "coupled," or "connected" to another component, it should be understood that the components may be directly coupled or connected to each other, but that other components may be "intervening" between each component, or each component may be "coupled," "coupled," or "connected" via other components.

[0025] Throughout the specification, unless otherwise specified to the contrary, each element may be singular or plural.

[0026] As used herein, singular expressions include plural expressions unless the context clearly indicates otherwise. Terms such as "comprise" or "include" in this application should not be interpreted as including all of the multiple components or multiple steps described in the specification, and should be interpreted as including some of the components or some steps that may not be included or may further include additional components or steps.

[0027] Throughout the specification, "A and / or B" means A, B, or A and B, unless otherwise specified, and "C to D" means C or more and D or less, unless otherwise specified.

[0028] Hereinafter, an overlay measurement apparatus and method for controlling focus according to some embodiments of the present invention, and a program therefor will be described.

[0029] FIG. 1 is a conceptual diagram of an overlay measurement apparatus according to an embodiment of the present invention.

[0030] Referring to FIG. 1, an overlay metrology apparatus 100 according to one embodiment of the present invention is an apparatus that measures an error between a first overlay mark (OM1) and a second overlay mark (OM2) formed on different layers formed on a wafer 140.

[0031] For example, the first overlay mark (OM1) may be an overlay mark formed on a previous layer, and the second overlay mark (OM2) may be an overlay mark formed on a current layer. The overlay marks are formed in a scribe lane while forming layers for forming a semiconductor device in a die area. For example, the first overlay mark (OM1) may be formed together with an insulating film pattern, and the second overlay mark (OM2) may be formed together with a photoresist pattern formed on the insulating film pattern.

[0032] In this case, the second overlay mark (OM2) is exposed to the outside, while the first overlay mark (OM1) is obscured by a photoresist layer and is made of an oxide having different optical properties from the second overlay mark (OM2) made of a photoresist material, and the focal planes of the first overlay mark (OM1) and the second overlay mark (OM2) may be the same or different.

[0033] The overlay measurement apparatus 100 according to one embodiment of the present invention may include a light source 110, a first beam splitter 112, a first mirror 113, a first color filter 114, a second color filter 115, a beam combiner 116, a second mirror 117, a relay lens 118, a polarizing filter 121, an aperture 151, a second detector 133, a focus actuator 134, a zoom lens 132, a first detector 131, a second beam splitter 130, an optical element 127, a third beam splitter 124, a lambda wave plate 122, an objective lens 120, a lens focus actuator 125, an aperture 151, an AF (Auto Focus) 161, a processor 170, and a memory 180.

[0034] The configuration of the overlay measurement apparatus 100 shown in Fig. 1 is according to one embodiment, and the components of the overlay measurement apparatus 100 are not limited to the embodiment shown in Fig. 1, and some components may be added, changed, or deleted as necessary. For example, the overlay measurement apparatus 100 may include a memory 180 that stores commands, programs, logic, etc. for controlling the operation of each component of the overlay measurement apparatus 100 by the processor 170.

[0035] According to one embodiment, the light source 110 may be a halogen lamp, a xenon lamp, a supercontinuum laser, a light emitting diode, a laser induced lamp, or the like.

[0036] According to one embodiment, the first beam splitter 112 is responsible for splitting the beam emitted from the light source 110 into two beams. The first beam splitter 112 transmits a portion of the beam emitted from the light source 110 and reflects a portion of the beam, thereby splitting the beam emitted from the light source 110 into two beams.

[0037] According to one embodiment, the first mirror 113 is disposed between the first beam splitter 112 and the second spectral filter 115 to redirect the beam reflected by the first beam splitter 112 towards the second spectral filter 115.

[0038] According to one embodiment, the first spectral filter 114 serves to adjust the central wavelength and bandwidth of the beam split by the first beam splitter 112 to be suitable for image acquisition of the second overlay mark (OM2) formed on the current layer. The spectral filter can be one of a filter wheel, a linear translation device, and a flipper device.

[0039] According to an embodiment, the second spectral filter 115 serves to adjust the central wavelength and bandwidth of the beam reflected by the first beam splitter 112 to be suitable for image acquisition of the first overlay mark (OM1) formed on the previous layer. The present invention allows the first and second spectral filters to be replaced with various filters, and the spectral filter may include at least one of a filter wheel, a linear translation device, and a flipper device.

[0040] According to an embodiment, the beam combiner 116 serves to combine the light that has passed through the first spectrum filter 114 and the second spectrum filter 115. The light that has passed through the first spectrum filter 114 passes through the beam combiner 116, and the beam that has passed through the second spectrum filter 115 has its path changed to be directed toward the beam combiner 116 by the second mirror 117, and is then reflected by the beam combiner 116 and further combined with the beam that has passed through the beam combiner 116, and passes through the aperture 151.

[0041] According to one embodiment, the aperture 151 serves to modify the beam transmitted by the beam combiner into a form suitable for imaging the first overlay mark (OM1).

[0042] According to one embodiment, the second detector 133 detects the beam reflected by the second beam splitter 130. The second detector 133 is mounted on a focus actuator 134 to adjust the distance between the second beam splitter 130 and the second detector 133. The second detector 133 captures an image of the first overlay mark (OM1).

[0043] According to one embodiment, the first detector 131 detects the beam that has passed through the second beam splitter 130. The first detector 131 can capture an image of the second overlay mark (OM2).

[0044] Alternatively, depending on the user's settings, the second detector can be deactivated and image acquisition of the first overlay mark (OM1) and the second overlay mark (OM2) can be performed only by the first detector.

[0045] According to an embodiment, the zoom lens 132 is disposed between the second beam splitter 130 and the focus actuator 134. The zoom lens 132 receives a position change value of the second detector 133 from the focus actuator 134, and serves to match the magnification of the image of the second overlay mark (OM2) and the image of the first overlay mark (OM1) based on the position change value. Due to the height difference between the first overlay mark (OM1) and the second overlay mark (OM2), the optical path distance between the second detector 133 and the second beam splitter 130 is different from the optical path distance between the first detector 131 and the second beam splitter 130, so that the magnification of the image acquired by the first detector 131 and the image acquired by the second detector 133 may be different. In order to measure the overlay error accurately, the magnification must be matched.

[0046] According to an embodiment, the second beam splitter 130 is responsible for splitting the beam collected by the objective lens 120 into two beams. The second beam splitter 130 may include a tube beam splitter and a dichroic filter. A dichroic filter is a filter that transmits a specific wavelength beam. The beam collected by the objective lens 120 passes through the lambda wave plate 122, the third beam splitter 124, and the optical element 127, and is then split into two beams by the second beam splitter 130, i.e., a beam suitable for detecting the first overlay mark (OM1) and a beam suitable for detecting the second overlay mark (OM2).

[0047] According to one embodiment, the optical element 127 may include a hot mirror and a cold mirror.

[0048] According to one embodiment, the third beam splitter 124 serves to further split the beam combined via the combiner 116 into two beams. The beam combined via the beam combiner 116 is polarized via the relay lens 118 and the polarizing filter 121 and then split into two beams by the third beam splitter 124.

[0049] According to one embodiment, the objective lens 120 serves to focus the circularly polarized beam, which is combined by the combiner 116, reflected by the third beam splitter 124, and passed through the lambda wave plate 122, onto a measurement position on the wafer 140, and to collect the reflected beam at the measurement position. The objective lens 120 is mounted on a lens focus actuator 125.

[0050] According to one embodiment, the lens focus actuator 125 can adjust the distance between the objective lens 120 and the wafer 140 so that the focal plane is located at the first overlay mark (OM1) or the second overlay mark (OM2). Under the control of the processor 170, the lens focus actuator 125 can move the objective lens 120 vertically towards the wafer (e.g., in the Y direction) to adjust the focal length.

[0051] According to an embodiment, when the lens focus actuator 125 adjusts the focal plane, the focal length can be adjusted not only at the position of the current layer or the previous layer, but also at other positions.

[0052] According to one embodiment, the optical element is positioned at 45° to the path of the beam transmitted through the beam splitter, for directing the beam to the autofocus module, and is characterized in that it reflects the long wavelength beam and transmits the short wavelength beam, or reflects the short wavelength beam and transmits the long wavelength beam. The optical element can be one of a hot mirror or a cold mirror.

[0053] According to an embodiment, the autofocus module is for adjusting the focus and serves to sense the distance between the objective lens and the wafer using a laser. That is, it serves to calculate the phase difference generated by the change in the focus position of the detector. The autofocus module can use an autofocus sensor module of a phase difference type. For example, if the focus acquired by the autofocus sensor module coincides with the "standard focus", the value of the phase difference calculated by the autofocus sensor module may be 0, and if it does not coincide, it may be a + or - value depending on the position of the focus. The "standard focus" is the focus of the first or second detector, the autofocus sensor, determined based on the laser signal imaged on the sensor. The "standard focus" may coincide with a "measurement focus" suitable for acquiring an actual alignment image, but is almost different when the height difference between the first overlay mark (OM1) and the second overlay mark (OM2) is large.

[0054] The autofocus sensor obtains a signal according to the focus position from the light reflected from the measurement area of ​​the wafer, and can adjust an actuator that adjusts the distance between the measurement area of ​​the wafer and the objective lens to adjust the focus position.

[0055] According to one embodiment, memory 180 may store instructions or data related to at least one other component of overlay metrology apparatus 100. Memory 180 may store information regarding height values ​​for each site on the wafer and the location of the site, and may store at least some of the instructions, algorithms, programs, and software required to obtain and store this information.

[0056] In addition, the memory 180 may store preset values ​​for the overlay measurement apparatus 100 and data (eg, height values ​​and position information) generated based on the operation of the processor 170 .

[0057] Additionally, the memory 180 can store positions measured on a first wafer, and these stored positions can be used to pre-move to positions to be measured on a second wafer after the first wafer.

[0058] In addition, the memory 180 may store commands and the like that can execute various functions that the overlay measurement apparatus 100 can perform.

[0059] According to one embodiment, the processor 170 may acquire a height value (e.g., a distance between an objective lens and a site, a first height value) for each site of the wafer placed on the stage 190, and match and store the acquired first height value with position information of the site (e.g., a position of the site on the wafer). The processor 170 may control the AF (Auto Focus) 161 to measure a height value for each site of the wafer placed on the stage 190.

[0060] According to one embodiment of the present invention, in order to reduce the measurement time for a wafer, the processor 170 stores the measurement position for a first wafer (e.g., the first wafer) in the memory 180, and when measuring a second wafer (e.g., a wafer measured after the first wafer), the processor 170 moves the objective lens to the stored measurement position for the first wafer to perform the measurement.

[0061] For example, a laser is used to determine measurement positions for the first wafer, and these measurement positions are transmitted to the GUI program in real time via an autofocus board and recorded.

[0062] After that, from the second wafer onwards, the objective lens moves in advance based on the recorded measurement position, and the measurement position difference between the first and second wafers is corrected by performing autofocus. The measurement position value for the second wafer is also transmitted to the GUI program in real time via the autofocus board.

[0063] The processor 170 can then execute an algorithm based on this information to correct for differences between the first and second wafers.

[0064] Although the Z-axis movement of the objective lens is described below based on the height between sites on one wafer, this is merely an embodiment and the present invention can also be applied between wafers (e.g., a first wafer and a second wafer).

[0065] A wafer may have multiple fields formed thereon, and a field may have multiple sites (e.g., four sites). The processor 170 may obtain information about the height value and the position of each site. The processor 170 may match the obtained height value and the position information and store them in the memory 180.

[0066] For example, the memory 180 may store a table including the coordinates of each site on the wafer, the sample height corresponding to each site coordinate, the predicted height, the measured height, and the Z-axis movement value. Table 1 below shows an example of such a table.

[0067] [Table 1]

[0068] As shown in Table 1, for example, if the height of the sample at a site with XY coordinates (0,0) is 99 and the actual height is 100, the Z axis of the objective lens moves by 1 (i.e., 100-99). Similarly, if the height of the sample at a site with XY coordinates (0,1) is 100 and the actual height is 100, the Z axis of the objective lens does not move.

[0069] Thus, the processor 170 measures and records in the table the sample height and the actual height for each coordinate of each site.

[0070] Then, with the sample height of a site with XY coordinates (N,N) being 98, the predicted height is 100 and the actual height is 101, the Z axis of the objective lens is moved by 1 (i.e., 101-100), where the predicted height (i.e., 100) for the XY coordinates (N,N) is a value modeled on previous data.

[0071] To this end, the processor 170 may perform a sampling operation (i.e., a preceding process) to obtain height values ​​for the sample sites of the wafer and corresponding position information of the sample sites and store the obtained values ​​in the memory 180. Through these sampling operations, height values ​​from 0 degrees to 180 degrees for the sample sites may be obtained.

[0072] According to one embodiment, when an initial measurement for each site on the wafer (i.e., the process of adjusting the focal length for the site at the predicted height after a previous process) begins, the processor 170 can control the lens focus actuator 125 to control the Z-axis movement of the objective lens 120 based on the stored first height value for that site.

[0073] The processor 170 can move the stage 190 on which the wafer is placed in the XY axes, and control the Z-axis movement of the objective lens 120. For example, the processor 170 can simultaneously control the XY axis movement of the stage 190 and the Z axis movement of the objective lens 120. That is, the processor 170 can adjust the focal length of the objective lens 120 while controlling the XY axis movement of the stage 190.

[0074] In this way, the present invention can efficiently shorten the time required to measure a site (for example, MAM (Move Acquire Measure) Time) by shortening the moving distance of the objective lens 120.

[0075] According to an embodiment, the processor 170 may obtain a second height value for the wafer (e.g., the site of the wafer) when the Z-axis movement of the objective lens 120 is completed, and may predict the height value of the next site by modeling the difference between the first height value and the second height value. The modeling refers to predicting the height value of the next site. For example, the processor 170 may predict the distance value at the next site using the distance value measured at the current site. Then, the processor 170 may check whether or not there is an error in the height value obtained by such prediction. The modeling may include various modeling methods in addition to modeling based on the least square method.

[0076] Then, processor 170 can control the Z-axis movement of objective lens 120 at the next site based on the predicted height value. For example, processor 170 can adjust the focus of objective lens 120 at the predicted height value to recognize the pattern of the next site.

[0077] In this manner, the processor 170 can simultaneously control the XY axis movement of the stage 190 and the Z axis movement of the objective lens 120 for each of a number of sites included in each of a number of fields configured on the wafer by applying the height value obtained at the current site to the next site.

[0078] Alternatively, the processor 170 can apply the height value acquired for the current wafer to the next wafer to simultaneously control the XY-axis movement of the stage 190 and the Z-axis movement of the objective lens 120. This allows the present invention to efficiently shorten the time required to measure a site (e.g., MAM Time).

[0079] The processor 170 may perform a process (e.g., PRU Grab) of controlling the XY-axis movement of the stage 190 to the center of a field of view (FOV) image by using a pattern recognition unit (PRU) for the wafer after simultaneously performing the XY-axis movement of the stage 190 and the Z-axis movement of the objective lens 120. The processor 170 may perform a measurement process (e.g., Measure) after performing a process (e.g., Measure Focus Move) of controlling the Z-axis movement of the objective lens 120 for measurement of the FOV image.

[0080] According to one embodiment, the processor 170 can include a Z-axis controller that can control the focal length of the objective lens 120 (e.g., Z-axis movement) based on control of the lens focus actuator 125, and an XY-axis controller that can control the movement of the stage 190 (e.g., XY-axis movement). The processor 170 can also store logic that can model, for each site, the difference between a first height value before the objective lens 120 and stage 190 move and a second height value after the objective lens 120 and stage 190 move.

[0081] The processor 170 may be separately configured within the overlay measurement device, or may be programmed and stored in other components.

[0082] As described above, the processor 170 acquires a first height value for each site of the wafer, matches the acquired first height value with the site and stores it, and when initial measurement for each site of the wafer begins, the processor 170 can control the Z-axis movement of the objective lens by controlling the lens focus actuator based on the stored first height value of the site.

[0083] In addition, the processor 170 acquires first position information for the first wafer and stores the acquired first position information in the memory, and when initial measurement for the second wafer begins after the first wafer, the processor 170 can control the lens focus actuator to control the Z-axis movement of the objective lens based on the stored first position information.

[0084] According to one embodiment, the processor 170 can simultaneously control the XY axis movement of a stage on which the second wafer is placed and the Z axis movement of the objective lens.

[0085] According to one embodiment, the processor 170 can obtain second position information for the second wafer upon completion of Z-axis movement of the objective lens, model a difference between a first height value of the first position information and a second height value of the second position information to predict a third height value of a third wafer after the second wafer, and control the Z-axis movement of the objective lens at the third wafer based on the predicted third height value.

[0086] As described above, the present invention can not only adjust the position of the objective lens based on height values ​​for each site on a wafer, but also obtain first position information for a first wafer, store it in memory 180, and then control the Z-axis movement of the objective lens based on the stored first position information when initial measurement for a second wafer begins after the first wafer.

[0087] The following describes adjusting the position of the objective lens based on height values ​​for each site on one wafer, but this is merely an embodiment, and the Z-axis movement of the objective lens can also be controlled based on first position information for a first wafer when initial measurement for a second wafer begins after the first wafer, using the first position information for the first wafer.

[0088] FIG. 2 is a flow chart illustrating a process for predicting height values ​​for sites on a wafer according to one embodiment of the present invention.

[0089] Hereinafter, a process of predicting height values ​​for sites on a wafer according to an embodiment of the present invention will be described in detail with reference to FIGS.

[0090] According to one embodiment, the processor 170 may obtain a first height value for each site of the wafer and store it in the memory 180 (S210). The processor 170 may obtain a height value (e.g., a distance between the objective lens 120 and the site) for each site of the wafer placed on the stage 190. The processor 170 may then match the obtained height value (e.g., a first height value) with position information of the site (e.g., a position of the site on the wafer) and store it in the memory 180.

[0091] According to one embodiment, the processor 170 can simultaneously control the XY-axis movement on the site and the Z-axis movement of the objective lens 120 (S212). The processor 170 can control the stage 190 and the lens focus actuator 125 so that the process of moving the stage 190 on which the wafer is placed in the XY-axis and the process of moving the objective lens 120 in the Z-axis based on the height value and position information stored in the memory 180 are performed simultaneously.

[0092] In this manner, processor 170 can simultaneously control the XY axis movement of stage 190 and the Z axis movement of objective lens 120 using control of lens focus actuator 125. That is, processor 170 can move stage 190 in the XY axes and also move objective lens 120 in the Z axis to adjust the focal length relative to the site.

[0093] According to one embodiment, the processor 170 may acquire a second height value for the site at the moved position (S214). After the XY axis movement of the stage 190 and the Z axis movement of the objective lens 120 are simultaneously completed, the processor 170 may acquire a second height value for the site at the moved position of the stage 190 and the objective lens 120. For example, the second height value may be greater than or less than the first height value.

[0094] Additionally, the processor 170 may store the second height value and location information for the site in the memory 180 .

[0095] According to an embodiment, the processor 170 may model the difference between the first height value and the second height value for each site to predict the height value of the site (S216). After the Z-axis movement of the objective lens 120 is completed, the processor 170 may obtain the second height value for the site on the wafer, and model the difference between the first height value before the Z-axis movement of the objective lens 120 and the second height value to predict the height value of the next site. In this way, the modeling refers to predicting the height value of the next site in advance.

[0096] 3 is a flowchart showing a process of measuring a wafer based on a prediction of height values ​​for sites on the wafer according to an embodiment of the present invention, and FIG 4 is an example view showing a state in which a wafer is seated on a stage according to an embodiment of the present invention.

[0097] Hereinafter, a process of measuring a wafer based on prediction of height values ​​for sites on the wafer according to an embodiment of the present invention will be described in detail with reference to FIGS. 1, 3 and 4. FIG.

[0098] According to an embodiment, when the wafer 140 is placed on the stage 190, the processor 170 may acquire a first height value for each site coordinate of the wafer 140 (S310, S312). When the wafer 140 is placed on the stage 190, the processor 170 may control the XY axis movement of the stage 190 and control the lens focus actuator 125 to position the objective lens 120 above the site. The processor 170 may then acquire a height value for the site to be measured and position information of the corresponding sample site.

[0099] 4, a wafer 140 may have a plurality of fields 410 arranged thereon, and each of the fields 410 may be arranged on the wafer 140 so as not to overlap with each other. Each of the fields 410 may have a plurality of sites 411, 412, 413, and 414, and each of the sites may be a point at which an FOV image can be acquired.

[0100] According to an embodiment, the processor 170 may match the acquired first height value to the site and store it (S314). A plurality of fields may be formed on one wafer, and a plurality of sites (e.g., four sites) may exist in one field. The processor 170 may match the height value for each site of the wafer with information indicating the position where the site is located on the wafer, and store it in the memory 180.

[0101] In this manner, the processor 170 can perform a sampling operation (ie, a preceding process) to obtain height values ​​for the sample sites on the wafer 140 and corresponding position information of the sample sites and store the height values ​​in the memory 180 .

[0102] According to one embodiment, when an initial measurement for each site of the wafer starts, the processor 170 may control the Z-axis movement of the objective lens based on the stored first height value for the site (S316, S318). When an initial measurement for each site of the wafer starts (i.e., a process of adjusting the focal length for the site at a predicted height after a previous process), the processor 170 may control the Z-axis movement of the objective lens 120 by controlling the lens focus actuator 125 based on the stored first height value.

[0103] For example, when an initial measurement starts, the processor 170 may control the XY axis movement of the stage 190 and then control the lens focus actuator 125 to position the objective lens 120 at the top of the site based on the first height value. Alternatively, the processor 170 may control the stage 190 and the lens focus actuator 125 so that the XY axis movement of the stage 190 and the Z axis movement of the objective lens 120 are performed simultaneously. In this way, the processor 170 may control the XY axis movement of the stage 190 and adjust the focal length of the objective lens 120.

[0104] According to an embodiment, the processor 170 may obtain a second height value between the site and the position to which the objective lens 120 has been moved (S320). The processor 170 may control the operation of the lens focus actuator 125 so that the focal length of the objective lens 120 becomes the second height value. Then, the processor 170 may obtain the second height value between the site and the position to which the objective lens 120 has been moved when the focal length of the objective lens is adjusted by controlling the operation of the lens focus actuator 125. For example, the processor 170 may store the second height value between the site and the position to which the objective lens 120 has been moved in the memory 180.

[0105] In this manner, the processor 170 can adjust the focal length of the objective lens 120 after the preceding process to complete the initial measurement process.

[0106] According to one embodiment, the processor 170 may model the difference between the first height value and the second height value for each site to predict the height value of the next site (S322). The processor 170 may predict the height value, i.e., the focal length, for the next site using the first height value obtained in the previous process and the second height value obtained in the initial measurement process.

[0107] For example, the processor 170 may predict the focal length for the next site by subtracting the second height value acquired in the initial measurement process from the first height value acquired in the preceding process and reflecting the subtracted height value in the height value of the next site. Alternatively, the processor 170 may predict the focal length for the next site by subtracting the first height value acquired in the preceding process from the second height value acquired in the initial measurement process and reflecting the subtracted height value in the height value of the next site.

[0108] According to one embodiment, the processor 170 can measure the wafer after controlling the Z-axis movement of the objective lens based on the predicted height value (S324). The processor 170 can reflect the subtracted height value in the height value of the next site, control the Z-axis movement of the objective lens 120 to adjust the focal length, and then perform measurement for that site of the wafer 140.

[0109] Then, the processor 170 can control the Z-axis movement of the objective lens based on the predicted height value, and then control the XY-axis movement of the stage 190 to move the measurement target to the center of the FOV image using the PRU for the wafer. The processor 170 can then control the Z-axis movement of the objective lens 120 to perform a measurement process for the FOV image.

[0110] As described above, the present invention predicts the focal length of the objective lens 120 relative to a site on the wafer in advance, and then reflects the predicted focal length in the XY axis movement of the stage 190 and the focal length of the objective lens 120, thereby efficiently shortening the time to measure the next site (e.g., MAM Time).

[0111] The steps in each of the above-described flow charts may be performed out of the order shown or may be performed simultaneously. Furthermore, at least one component of the present invention and at least one operation performed by the at least one component may be embodied in hardware and / or software.

[0112] Although the present invention has been described above with reference to the drawings illustrating the present invention, the present invention is not limited to the embodiments and drawings disclosed in this specification, and it is clear that various modifications can be made by those skilled in the art within the scope of the technical concept of the present invention. Furthermore, even if the effects of the configuration of the present invention are not explicitly described and explained while the embodiments of the present invention are described above, it is natural that the effects that can be predicted by the configuration should also be recognized. [Explanation of symbols]

[0113] 100 Overlay measurement device 110 Light source 112 First beam splitter 113 Mirror No. 1 114 1st Spectrum Filter 115 Second Spectrum Filter 116 Beam Combiner 117 2nd Mirror 118 Relay Lens 120 Objective Lens 121 Polarizing Filter 122 Lambda Wave Plate 124 3rd Beam Splitter 125 Lens Focus Actuator 127 Tube Lens 130 Second beam splitter 131 First detector 132 Zoom Lens 133 Second detector 134 Focal Actuator 151 Aperture 161AF 170 Processors 180 Memory

Claims

1. An overlay measurement device that controls focus, Objective lens; Memory; a lens focus actuator that moves the objective lens to adjust the distance between the objective lens and a wafer; and a processor for controlling operation of the memory and the lens focus actuator; The processor, obtaining a first height value for each site of the wafer; The acquired first height value is matched with the corresponding site and stored; a control unit configured to control the lens focus actuator to control a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when the initial measurement for the site of the wafer is started; and The XY-axis movement of the stage on which the wafer is placed and the Z-axis movement of the objective lens are simultaneously controlled. Overlay measurement equipment.

2. An overlay measurement device that controls focus, Objective lens; Memory; a lens focus actuator that moves the objective lens to adjust the distance between the objective lens and a wafer; and a processor for controlling operation of the memory and the lens focus actuator; The processor, obtaining a first height value for each site of the wafer; The acquired first height value is matched with the corresponding site and stored; a control unit configured to control the lens focus actuator to control a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when the initial measurement for the site of the wafer is started; and obtaining a second height value with respect to the wafer when the Z-axis movement of the objective lens is completed; modeling the difference between the first height value and the second height value to predict a height value for a next site; configured to control a Z-axis movement of the objective lens at the next site based on the predicted height value. Overlay measurement equipment.

3. An overlay measurement device that controls focus, Objective lens; Memory; a lens focus actuator that moves the objective lens to adjust the distance between the objective lens and a wafer; and a processor for controlling operation of the memory and the lens focus actuator; The processor, obtaining a first height value for each site of the wafer; The acquired first height value is matched with the corresponding site and stored; a control unit configured to control the lens focus actuator to control a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when the initial measurement for the site of the wafer is started; and storing the height value acquired at the current site of the wafer in the memory; configured to apply the height value acquired at the current site to a next site to control Z-axis movement of the objective lens; Overlay measurement equipment.

4. The processor, The focal length of the objective lens is adjusted at the time of the XY axis movement of the stage. The overlay metrology apparatus according to claim 1 .

5. An overlay measurement device that controls focus, Objective lens; Memory; a lens focus actuator that moves the objective lens to adjust the distance between the objective lens and a wafer; and a processor for controlling operation of the memory and the lens focus actuator; The processor, obtaining a first height value for each site of the wafer; The acquired first height value is matched with the corresponding site and stored; a control unit configured to control the lens focus actuator to control a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when the initial measurement for the site of the wafer is started; and a height value acquired at a current site is applied to a next site for each of a plurality of sites included in each of a plurality of fields configured on the wafer, to control a Z-axis movement of the objective lens; Overlay measurement equipment.

6. The first height value and the second height value are each calculated based on a phase difference due to a change in a focal position at the site. The overlay metrology apparatus according to claim 2 .

7. A method for controlling focus of an overlay metrology tool, comprising: obtaining a first height value for each site of the wafer; storing the acquired first height value in correspondence with the site; and controlling Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; The step of controlling the Z-axis movement of the objective lens includes: and simultaneously controlling XY axis movement of a stage on which the wafer is placed. method.

8. A method for controlling focus of an overlay metrology tool, comprising: obtaining a first height value for each site of the wafer; storing the acquired first height value in correspondence with the site; and controlling Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; obtaining a second height value with respect to the wafer when the Z-axis movement of the objective lens is completed; modeling the difference between the first elevation value and the second elevation value to predict an elevation value for a next site; and controlling a Z-axis movement of the objective lens at the next site based on the predicted height value. method.

9. A method for controlling focus of an overlay metrology tool, comprising: obtaining a first height value for each site of the wafer; storing the acquired first height value in correspondence with the site; and controlling Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; storing in memory the height value acquired at the current site of the wafer; and and applying the height value obtained at the current site to a next site to control a Z-axis movement of the objective lens. method.

10. A method for controlling focus of an overlay metrology tool, comprising: obtaining a first height value for each site of the wafer; storing the acquired first height value in correspondence with the site; and controlling Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; and controlling a Z-axis movement of the objective lens by applying a height value acquired at a current site to a next site for each of a plurality of sites included in each of a plurality of fields configured on the wafer. method.

11. A computer-readable storage medium having recorded thereon a program for storing instructions for controlling the focus of an overlay measurement device, comprising: The program is A command to obtain a first height value for each site of a wafer; A command for matching the acquired first height value with the site and storing the same; and a command for controlling a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; A command for simultaneously controlling the XY-axis movement of the stage on which the wafer is placed and the Z-axis movement of the objective lens is included. Computer-readable storage medium.

12. A computer-readable storage medium having recorded thereon a program for storing instructions for controlling the focus of an overlay measurement device, comprising: The program is A command to obtain a first height value for each site of a wafer; A command for matching the acquired first height value with the site and storing the same; and a command for controlling a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; a command to obtain a second height value with respect to the wafer when the Z-axis movement of the objective lens is completed; a command to model the difference between the first height value and the second height value to predict a height value for a next site; and commands for controlling a Z-axis movement of the objective lens at the next site based on the predicted height value; Computer-readable storage medium.

13. A computer-readable storage medium having recorded thereon a program for storing instructions for controlling the focus of an overlay measurement device, comprising: The program is A command to obtain a first height value for each site of a wafer; A command for matching the acquired first height value with the site and storing the same; and a command for controlling a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; a command to store in memory a height value acquired at the current site of the wafer; and a command for applying the height value obtained at the current site to a next site to control a Z-axis movement of the objective lens; Computer-readable storage medium.

14. A computer-readable storage medium having recorded thereon a program for storing instructions for controlling the focus of an overlay measurement device, comprising: The program is A command to obtain a first height value for each site of a wafer; A command for matching the acquired first height value with the site and storing the same; and a command for controlling a Z-axis movement of the objective lens based on the stored first height value of each site of the wafer when an initial measurement for the site of the wafer is started; a command for controlling a Z-axis movement of the objective lens by applying a height value acquired at a current site to a next site for each of a plurality of sites included in each of a plurality of fields formed on the wafer; Computer-readable storage medium.

15. In an overlay measurement apparatus that controls focus, Objective lens; Memory; a lens focus actuator that moves the objective lens to adjust the distance between the objective lens and a wafer; and a processor for controlling operation of the memory and the lens focus actuator; The processor, Obtaining first position information for a first wafer; storing the acquired first position information in the memory; and controlling the lens focus actuator to control a Z-axis movement of the objective lens based on the stored first position information when an initial measurement for a second wafer is started after the first wafer. Overlay measurement equipment.

16. The processor, configured to simultaneously control XY axis movement of a stage on which the second wafer is placed; The overlay metrology apparatus according to claim 15.

17. The processor, acquiring second position information for the second wafer when the Z-axis movement of the objective lens is completed; modeling a difference between a first height value of the first position information and a second height value of the second position information to predict a third height value of a third wafer after the second wafer; configured to control a Z-axis movement of the objective lens at the third wafer based on the predicted third height value. The overlay metrology apparatus according to claim 15.

18. The first height value and the second height value are each calculated based on a phase difference due to a change in a focal position at a site. The overlay metrology apparatus according to claim 17.

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