Processing system, management device and log acquisition method

Abstract

To provide a technology capable of mitigating a work load in log acquisition by safely acquiring log information on a selected tester.SOLUTION: A processing system comprises: a plurality of testers for inspecting semiconductor devices; and a management device connected in a manner to be able to communicate information among the plurality of testers. Each of the plurality of testers includes a plurality of tester side storage units that are disposed in the height direction and store log information on the testers' states. The management device outputs a request command for requesting log information to one or more selected testers which are all of the plurality of testers or selected ones of the plurality of testers in a lump, and acquires log information from the selected testers receiving the request command. The management device acquires log information when an authentication unit determines that tester side identification information agrees with managed identification information, and disables acquisition of the log information to the management device when the authentication unit determines that the tester side identification information does not agree with the managed identification information.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present disclosure relates to a processing system, a management device, and a log acquisition method. [Background technology]

[0002] An inspection apparatus equipped with multiple testers for inspecting semiconductor devices stores multiple types of log information (event log, diagnostic log, system log, etc.) for each tester. For example, the log information is extracted from the tester by a user and used for troubleshooting the tester, maintenance, etc.

[0003] Patent Document 1 discloses a technique for storing logs from a storage unit of an inspection device to a USB memory (external storage device) having a log acquisition command by connecting the USB memory to the inspection device. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2014-22552 A Summary of the Invention [Problem to be solved by the invention]

[0005] The present disclosure provides a technique capable of safely acquiring log information of a selected tester and reducing the workload of acquiring logs. [Means for solving the problem]

[0006] According to one aspect of the present disclosure, there is provided a processing system including a plurality of testers that inspect semiconductor devices, and a management device that is connected to the plurality of testers so as to be capable of communicating information therebetween, wherein each of the plurality of testers is arranged in a height direction and has a tester-side memory unit that stores log information relating to a state of the tester, and the management device has a log request acquisition unit that outputs a request command requesting the log information collectively to one or more selected testers that select all or a portion of the plurality of testers, and acquires the log information from the selected testers that have received the request command, and A processing system is provided in which one of the devices has an authentication unit that determines whether tester side identification information held by the selected tester and management identification information of the selected tester held by the management device match, and the management device acquires the log information when the authentication unit of the selected tester or the authentication unit of the management device that has received the request command determines that the tester side identification information and the management identification information match, and does not allow the management device to acquire the log information when the authentication unit of the selected tester or the authentication unit of the management device that has received the request command determines that the tester side identification information and the management identification information do not match. Effect of the Invention

[0007] According to the present disclosure, log information of a selected tester can be safely acquired, thereby reducing the workload of acquiring logs. [Brief description of the drawings]

[0008] [Figure 1] 1 is a schematic explanatory diagram showing an overall configuration of a processing system according to a first embodiment of the present disclosure. [Diagram 2] 2 is a schematic cross-sectional view of the inspection device taken along a horizontal direction. FIG. [Diagram 3] 4 is a schematic cross-sectional view of a transport area and an inspection area taken along the vertical direction. FIG. [Figure 4] FIG. 2 is a block diagram showing the hardware connections of the processing system. [Diagram 5]FIG. 2 is a functional block diagram for acquiring logs formed in a management device. [Figure 6] FIG. 11 is an explanatory diagram showing an example of operation screen information. [Figure 7] 5 is a flowchart showing a process flow of an inspection device and a management device. [Figure 8] 11 is a block diagram showing transmission and reception of information between an inspection device and an information processing terminal via a management device. FIG. [Figure 9] FIG. 11 is an explanatory diagram showing an example of operation screen information on the information processing terminal side; [Figure 10] FIG. 11 is a schematic explanatory diagram showing an overall configuration of a processing system according to a second embodiment of the present disclosure. [Figure 11] FIG. 2 is an explanatory diagram showing a switch panel of each tester. [Figure 12] FIG. 13 is an explanatory diagram showing power operation screen information. [Figure 13] 10 is a flowchart showing an example of a method for operating a power supply of an inspection apparatus. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0009] Hereinafter, an embodiment of the present disclosure will be described with reference to the drawings. In the drawings, the same components are denoted by the same reference numerals, and duplicated descriptions may be omitted.

[0010] [First embodiment] Fig. 1 is a schematic explanatory diagram showing an overall configuration of a processing system 1 according to a first embodiment of the present disclosure. As shown in Fig. 1, the processing system 1 according to the first embodiment includes an inspection device 2 and a management device 3 connected to the inspection device 2 so as to be able to communicate with each other. The processing system 1 also has one or more information processing terminals 4 connected to both (or one of) the inspection device 2 and the management device 3 so as to be able to communicate with each other. Note that the information processing terminal 4 does not necessarily have to be connected to the processing system 1. The management device 3 may be disposed inside the inspection device 2 or outside the inspection device 2.

[0011] The inspection device 2 has a plurality of testers 20 for inspecting semiconductor wafers (hereinafter referred to as wafers W: see FIG. 2), which are an example of substrates. The inspection device 2 has a large housing 21 formed in a rectangular parallelepiped shape, and is placed in a processing chamber 10 such as a clean room. An inspection chamber 21a for actually inspecting the wafers W is provided inside the housing 21. The inspection device 2 also has, on the outer surface of the housing 21, a controller 22 for controlling the operation of the inspection device 2, and an operation terminal 23 for operation by a user of the inspection device 2.

[0012] Fig. 2 is a schematic cross-sectional view taken along the horizontal direction of the inspection device 2. As shown in Fig. 2, the inspection chamber 21a has a loading / unloading area 24 for loading / unloading a wafer W into / from the inspection chamber 21a, a transfer area 25 for transferring the wafer W loaded / unloaded from the loading / unloading area 24, and an inspection area 26 for inspecting the wafer W transferred from the transfer area 25.

[0013] The loading / unloading area 24 has a plurality of input / output compartments 240 arranged along the longitudinal direction of the housing 21 (see also FIG. 1). Each input / output compartment 240 is provided with a load port 241, an aligner 242, a loader 243, and the like. The load port 241 receives a FOUP, which is a container for accommodating a plurality of wafers W. The aligner 242 aligns the wafer W. The loader 243 loads and unloads a probe card (not shown).

[0014] The transfer area 25 has a transfer stage 250 that is movable between the load / unload area 24 and the inspection area 26. One transfer stage 250 is provided for each tester line 260 in the inspection area 26, which will be described later. The transfer stage 250 receives a wafer W from a load port 241 in the load / unload area 24 and transfers it to the inspection area 26, and also transfers a wafer W that has been inspected from the inspection area 26 to the load port 241.

[0015] FIG. 3 is a schematic cross-sectional view of the transfer area 25 and the inspection area 26 along the vertical direction. As shown in FIG. 3, the inspection area 26 has a plurality of testers 20 for inspecting the wafer W. Specifically, the plurality of testers 20 are arranged in a matrix in the horizontal direction (the longitudinal direction of the housing 21) and the vertical direction (the height direction). Hereinafter, the plurality of testers 20 arranged in the horizontal direction will be referred to as a tester line 260. The tester line 260 according to the first embodiment has four testers 20 in the horizontal direction, and the inspection device 2 has three stages (multiple stages) of this tester line 260 in the vertical direction. That is, the inspection device 2 includes 12 testers 20. It is needless to say that the number of testers 20 constituting the tester line 260 and the number of stages of the tester line 260 are not particularly limited in the inspection device 2.

[0016] The inspection area 26 also has one tester-side camera 261 for each of the multiple tester lines 260. Each tester-side camera 261 moves horizontally along the corresponding tester line 260, and captures an image of the position of the wafer W or the like transported by the transport stage 250 in front of each tester 20 constituting the tester line 260.

[0017] The tester 20 has a test head (not shown) to which a probe card is attached. The test head inspects the electrical characteristics of each semiconductor device on the wafer W by electrically contacting a plurality of contact probes (not shown) of the probe card to the semiconductor devices (electrode pads, solder bumps, etc.) on the wafer W.

[0018] 4 is a block diagram showing the connections of the hardware of the processing system 1. As shown in FIG. 4, each of the multiple testers 20 has a control board 200 therein for operating each component of the test head. The control board 200 is a board with a built-in computer for the tester, which has one or more processors 201, a memory 202, an input / output interface and an electronic circuit (not shown), and the like. The processor 201 processes a control command sent from the controller 22 to operate each component, thereby inspecting the wafer W, temporarily storing the inspection result, and transmitting the inspection result of the wafer W to the controller 22.

[0019] The one or more processors 201 of the control board 200 are one or a combination of a CPU, an ASIC, an FPGA, a circuit made up of a plurality of discrete semiconductors, and execute a program stored in the memory 202. The memory 202 includes a non-volatile memory and a volatile memory, and forms a tester-side storage unit (a storage unit of the control board 200). Note that a part of the memory 202 may be built into the one or more processors 201.

[0020] On the other hand, the controller 22 of the inspection device 2 is a control computer for the entire inspection device 2, which has one or more processors 221, a memory 222, an input / output interface 223, and an electronic circuit 224. The one or more processors 221 are one or a combination of a CPU, an ASIC, an FPGA, a circuit made of a plurality of discrete semiconductors, and executes and processes a program stored in the memory 222. The memory 222 includes a non-volatile memory and a volatile memory, and forms a storage unit of the controller 22. Note that a part of the memory 222 may be built into the one or more processors 221.

[0021] The controller 22 is connected to the aligner 242, the loader 243, the transfer stage 250, the tester 20, and the like via an input / output interface 223. For example, the controller 22 and each tester 20 are wired connected via a communication line (not shown). Note that the controller 22 and each tester 20 may have a communication module capable of being wirelessly connected to each other, and may transmit and receive information via wireless communication.

[0022] The controller 22 is connected to an operation terminal 23 provided in the housing 21 of the inspection device 2 via an input / output interface 223. The operation terminal 23 has a monitor 230, a keyboard 231, a mouse 232, etc., which constitute an input / output device 233 of the inspection device 2. The configuration of the operation terminal 23 is not particularly limited, and a touch panel (not shown) or the like may be applied. The processor 221 of the controller 22 receives the inspection contents of the inspection device 2 input by the user via the operation terminal 23, and outputs a control command to each component of the inspection device 2 based on the inspection contents, thereby inspecting the semiconductor devices of the wafer W. Furthermore, when the processor 221 receives the inspection results from each tester 20, it stores the inspection results in the memory 222 and displays the inspection results via the operation terminal 23.

[0023] The inspection device 2 described above extracts log information of each of the multiple testers 20 during operation of the inspection device 2. The "log information" of the tester 20 is information related to the state of the tester 20, which is different from the inspection result of the semiconductor device by the tester 20, and is linked to time information measured within the control board 200 and stored in the memory 202 of the control board 200. The log information includes an event log that is a record of abnormalities (trouble, operation errors, etc.) or other events that have occurred in the tester 20, a diagnosis log that is a record of self-diagnosis of the inside of the tester 20, a system log that is a record of the operation (startup, start-up shutdown, etc.) of the tester 20, etc.

[0024] For example, when the processor 201 of the control board 200 recognizes the occurrence of an abnormality in the tester 20 while the tester 20 is running, the processor 201 records a code corresponding to the abnormality. Also, for example, the processor 201 performs a self-diagnosis in the tester 20 automatically or manually by a user, and records the diagnosis result (normal, failure, etc.). The processor 201 acquires log information of the tester 20 over time, and continues to accumulate (store) the acquired log information in memory. Also, when the processor 201 receives a request command for log information, the processor 201 appropriately outputs the log information (including time information) accumulated in the memory 202 in response to the request command. When the processor 201 outputs log information, the processor 201 may erase the past log information that it output.

[0025] Furthermore, the control board 200 holds tester side identification information (hereinafter referred to as tester side ID 27) of the mounted tester 20 itself in the memory 202. The tester side ID 27 is unique information for each of the multiple testers 20, and is assigned in advance when the tester 20 (inspection device 2) is shipped from a factory, etc., and stored in the memory 202. When the processor 201 receives a request command requesting the tester side ID 27, it transmits the tester side ID 27 that it holds.

[0026] The management device 3 is a computer having one or more processors 31, a memory 32, an input / output interface 33, an electronic circuit 34, etc., for managing various devices in the processing chamber 10. The management device 3 has input / output devices 38 such as a monitor 35, a keyboard 36, and a mouse 37 connected via the input / output interface 33. Note that in the processing system 1, the controller 22 or the operation terminal 23 of the inspection device 2 may have the same functions as the management device 3.

[0027] The one or more processors 31 are one or a combination of a CPU, an ASIC, an FPGA, a circuit made up of a plurality of discrete semiconductors, and execute programs stored in the memory 32. The memory 32 includes a non-volatile memory and a volatile memory, and forms a storage unit of the management device 3. Note that a part of the memory 32 may be built into the one or more processors 31.

[0028] The management device 3 may be, for example, a laptop computer, mounted on a movable dolly (not shown), and movable within the processing chamber 10 under the user's operation. In this case, after the management device 3 is moved close to the inspection device 2, the management device 3 becomes capable of communicating with each tester 20 in the inspection device 2 based on the user's connection operation to the inspection device 2. The management device 3 may be connected to the inspection device 2 so as to be able to communicate with it at all times.

[0029] The processing system 1 may have a hub 28 that is wired directly (without going through the controller 22) to each tester 20 of the inspection device 2, and in the connection process, a communication line leading to the management device 3 may be connected to the hub 28. For example, the processing system 1 may be configured to communicate with each tester 20 via the controller 22 by connecting the management device 3 and the controller 22 by wire (communication line) in the connection process. Alternatively, the management device 3 may transmit and receive information to and from each tester 20 by wireless communication.

[0030] Based on a log acquisition operation by the user, the management device 3 collectively acquires log information stored in one or more target testers 20 among the multiple testers 20 of the inspection device 2 connected to the management device 3. For example, in a log acquisition operation, the user first executes a log acquisition program (application: not shown) stored in the memory 32 of the management device 3. By executing this log acquisition program, the processor 31 forms a functional block for log acquisition inside.

[0031] Fig. 5 is a functional block diagram for log acquisition formed in the management device 3. As shown in Fig. 5, the management device 3 includes a user request acquisition unit 310, an external storage device recognition processing unit 311, a log request acquisition unit 312, and an output unit 313.

[0032] The user request acquisition unit 310 is a functional unit that receives information from a user to acquire log information of each tester 20. Based on the start of a log acquisition program, the user request acquisition unit 310 displays operation screen information 5 (GUI: Graphical User Interface), which is a user interface for the user to operate, on the monitor 35. Based on the user performing a log acquisition operation on the operation screen information 5, the user request acquisition unit 310 outputs a trigger signal TS to the log request acquisition unit 312.

[0033] Fig. 6 is an explanatory diagram showing an example of the operation screen information 5. As shown in Fig. 6, the operation screen information 5 has a tester selection image 50, a log type selection image 51, a storage location setting image 52, a start setting image 53, an end setting image 54, and the like.

[0034] The tester selection image 50 is display information for selecting a plurality of testers 20, and has tester buttons 500 representing the individual testers 20 arranged in a matrix of four rows and three columns corresponding to the plurality of testers 20 possessed by the inspection device 2. The tester selection image 50 also has a collective selection button 501 for collectively selecting all the testers 20 in the inspection device 2, and a collective deselection button 502 for collectively deselecting the selected testers 20. The tester buttons 500, collective selection button 501, and collective deselection button 502 change to a different color from before selection when the user performs a selection operation (such as clicking a mouse), thereby enabling the user to recognize what selection has been made.

[0035] Also, the user request acquiring unit 310 may be configured to automatically acquire information on the number and arrangement of the testers 20 (or the model number of the inspection device 2, etc.) from the inspection device 2 when the management device 3 is connected to the inspection device 2 by a connection operation, and automatically generate the number and arrangement of the tester buttons 500. Alternatively, the user request acquiring unit 310 may set the number and arrangement of the tester buttons 500 according to the model number by having the model number, etc. of the inspection device 2 input by the user before displaying the operation screen information 5 of FIG.

[0036] The log type selection image 51 is placed adjacent to the tester selection image 50, and allows the user to select a type of log information (event log, diagnosis log, system log) (FIG. 6 shows a state in which a tester operation log that acquires all types of log information is displayed). For example, the log type selection image 51 has a log information type 510, and an on button 511 and an off button 512 adjacent to the type of log information. Only one of the on button 511 and the off button 512 can be selected, and the color of the button changes to a different color when the user performs a selection operation (such as clicking the mouse) from the color before selection, allowing the user to recognize what selection has been made.

[0037] The storage location setting image 52 is arranged above or below the tester selection image 50 and the log type selection image 51, and allows the user to set the storage location of the log information. The management device 3 automatically generates a directory (folder) in the storage location specified by the user via the storage location setting image 52, and stores the log information in this directory. For example, the storage location setting image 52 may have an input field 520 that allows the user to input from a keyboard, as well as a storage location selection button 521 that displays the directory location (including the hierarchy) and allows the user to select.

[0038] As shown in FIG. 4 and FIG. 5, the log information is preferably stored in a storage area of ​​the external storage device 6 (a storage device such as a USB memory). As an example, the user request acquisition unit 310 displays a message on the operation screen information 5 prompting the user to connect the external storage device 6 to the management device 3 when acquiring the log. When the external storage device recognition processing unit 311 recognizes the connection of the external storage device 6 to the management device 3, it outputs information indicating that the external storage device 6 is already connected to the user request acquisition unit 310. As a result, the user request acquisition unit 310 automatically sets the storage location of the log information to the external storage device 6. In addition, the management device 3 may store the log information only in the external storage device 6 designated in advance by authenticating the identification information of the external storage device 6. As a result, the processing system 1 can prevent the log information from being stored in a storage medium that is not designated, thereby improving security.

[0039] The log information may be stored in the memory 32 of the management device 3, or in the memory 42 (see FIG. 4) of the information processing terminal 4 as described later. In this case, the security of the log information can be ensured by authenticating the user's identification information when logging in to the management device 3 or the information processing terminal 4, so that the log information cannot be obtained only by specific users.

[0040] Returning to FIG. 6, the start setting image 53 is disposed below the storage location setting image 52, and allows the user to set the start time (start date) of log information acquisition. Similarly, the end setting image 54 is disposed below the start setting image 53, and allows the user to set the end time (end date) of log information acquisition. The start setting image 53 and the end setting image 54 may have input fields 530, 540 for the user to input from a keyboard, as well as calendar selection buttons 531, 541 that display a calendar listing the date and allow the user to select a date on the calendar. The start time and end time of acquisition are not limited to being set in days, and may be set in units of hours or minutes, etc.

[0041] 5, based on the log information acquisition conditions set by the user in the above-mentioned operation screen information 5, the user request acquisition unit 310 generates a trigger signal TS, and outputs this trigger signal TS to the log request acquisition unit 312. That is, the trigger signal TS includes the tester 20 selected by the user (hereinafter, referred to as the selected tester 20a), the type of log information, the storage location of the log information, and the acquisition period of the log information (the start time of acquisition, the end time of acquisition).

[0042] The log request acquisition unit 312 of the management device 3 stores in advance the IP addresses of all the testers 20 of the inspection device 2, and upon receiving a trigger signal TS from the user request acquisition unit 310, generates a request command RC to be transmitted to the selected tester 20a. The log request acquisition unit 312 then outputs the generated request command RC collectively for each selected tester 20a from which log information is to be acquired. Note that "collectively" in this disclosure means transmitting (outputting) to a plurality of selected testers 20a without requiring any particular operation from the user, and includes the concept of simultaneously transmitting a command to a plurality of selected testers 20a as well as sequentially transmitting a command to a plurality of selected testers 20a.

[0043] Then, the log request acquisition unit 312 of the management device 3 transmits and receives information multiple times to and from the selected tester 20a from which the log information is to be acquired. Specifically, the log request acquisition unit 312 generates a first request command as a first request command RC, the first request command including an IP address of the selected tester 20a and a code for requesting the selected tester 20a for the tester side ID 27. Upon receiving this first request command, the processor 201 of the selected tester 20a reads out the tester side ID 27 stored in the memory 202, and returns response information RI (first response information) including the tester side ID 27 to the management device 3.

[0044] After receiving the first response information, the log request acquisition unit 312 authenticates the tester side ID 27 by the authentication unit 314 in the log request acquisition unit 312. The memory 32 of the management device 3 holds in advance management identification information (hereinafter referred to as management ID 39) for each of the multiple testers 20 of the inspection device 2. For example, the processing system 1 is configured to connect the management device 3 to the inspection device 2 at the time of startup when the inspection device 2 is initially installed in the processing chamber 10, and store the IP addresses and tester side IDs 27 of all the testers 20 of the inspection device 2 in the management device 3. Alternatively, the management device 3 may acquire the IP addresses and tester side IDs 27 of the testers 20 of the installed inspection device 2 by information communication with the manufacturer of the inspection device 2 after the installation of the inspection device 2, etc.

[0045] The authentication unit 314 reads out the management ID 39 corresponding to the selected tester 20a from memory based on the trigger signal TS of the user request acquisition unit 310, and automatically starts authentication of the selected tester 20a when it receives the first response information. At this time, the authentication unit 314 judges whether the tester side ID 27 of the selected tester 20a matches the management ID 39 held by the authentication unit 314. If the tester side ID 27 matches the management ID 39, the authentication unit 314 judges that the authentication of the selected tester 20a is established. On the other hand, if the tester side ID 27 does not match the management ID 39, it judges that the authentication of the selected tester 20a is not established.

[0046] When it is determined that the authentication is successful, the log request acquisition unit 312 outputs a second request command RC (second request command) to the selected tester 20a. The second request command is actual request information for actually obtaining the log information of the selected tester 20a, and includes the IP address of the selected tester 20a, the authentication success information, and a code for obtaining the log information (including the type of log information and the acquisition period). When the processor 201 of the selected tester 20a recognizes the authentication success information, the processor 201 extracts the log information of the type and acquisition period corresponding to the code from the log information stored in the memory 202, generates response information RI (second response information), and transmits the second response information to the management device 3. On the other hand, when it is determined that the authentication is not successful, the log request acquisition unit 312 disables log acquisition of the selected tester 20a. At this time, the log request acquisition unit 312 may notify the user via the monitor 35 or the like that the selected tester 20a does not correspond to the tester 20 that can obtain the log information.

[0047] When the log information of the selected tester 20a is acquired, the log request acquisition unit 312 outputs a third request command RC (third request command) to the selected tester 20a from which the log information was acquired. The third request command is information for terminating the acquisition of log information, including the IP address of the selected tester 20a and an abort code for terminating the acquisition of the log information. When the processor 201 of the selected tester 20a receives the third request command, it terminates information communication with the management device 3, thereby restricting the transmission and reception of more information than necessary.

[0048] The authentication unit 314 may be formed in the processor 201 of the tester 20. In this case, the management device 3 transmits a first request command including the management ID 39 of the selected tester 20a to the selected tester 20a, and the processor 201 performs authentication upon receiving the first request command and returns the authentication result (authentication successful, authentication unsuccessful) to the management device 3 as first response information. As a result, if authentication is successful, the management device 3 outputs a second request command to the selected tester 20a in the same manner as above. On the other hand, if authentication is unsuccessful, the processor 201 of the selected tester 20a can reliably disable the transmission of log information to the management device 3.

[0049] When the log request acquisition unit 312 of the management device 3 receives the log information of the selected tester 20a acquired by the log request acquisition unit 312, the log information is stored in the memory 32 of the management device 3. At this time, the log request acquisition unit 312 may generate a tester directory for each selected tester 20a, and further generate a type directory for each type of log information below the tester directory. Alternatively, the log request acquisition unit 312 may generate a type directory in an upper layer, and a tester directory in a lower layer.

[0050] Furthermore, when the storage location set by the user in the user request acquisition unit 310 is set to the external storage device 6 (other than the memory 32 of the management device 3), the output unit 313 of the management device 3 stores the log information in the external storage device 6. At this time, it is preferable that the output unit 313 erases the log information stored in the memory 32 when the management device 3 receives the log information, so that the log information is not left in the management device 3. Note that when storing the log information in the external storage device 6, the management device 3 may directly store the log information in the external storage device 6 without first storing the log information in the memory 32 of the management device 3.

[0051] It is preferable that the external storage device recognition processor 311 monitors whether the output unit 313 has finished outputting the log information to the external storage device 6, and automatically disconnects the information communication between the management device 3 and the external storage device 6 when storage of the log information in the external storage device 6 is completed. In other words, the external storage device recognition processor 311 releases the connection so that the external storage device 6 can be removed from the management device 3. This allows the processing system 1 to store the log information in the external storage device 6 safely and stably.

[0052] Furthermore, when a user performs an operation to display the log information, the output unit 313 outputs the log information to the monitor 35. For example, the output unit 313 may generate screen information (not shown) on which the log information and time information associated with the log information are written in parallel for each selected tester 20a, and display the screen information on the monitor 35.

[0053] The processing system 1 and management device 3 according to this embodiment are basically configured as described above, and the process flow for log acquisition will be described below with reference to Fig. 7. Fig. 7 is a flowchart showing the process flow of the inspection device 2 (tester 20) and the management device 3.

[0054] In the management device 3, a log acquisition program is started by a user operation. Then, after the start-up, the user request acquisition unit 310 of the management device 3 displays operation screen information 5 as shown in FIG. 7 (step S1). The user operates the input / output device 38 based on this operation screen information 5 to select the tester 20 of the inspection device 2, set the type of log information, the storage location of the log information, and the acquisition period of the log information. When the log information is to be stored in the external storage device 6, the user connects the external storage device 6 to the management device 3.

[0055] Then, the user request acquisition unit 310 recognizes the contents of the log acquisition requested by the user based on the information input into the operation screen information 5 (step S2), generates a trigger signal TS according to the contents of the log acquisition, and outputs it to the log request acquisition unit 312.

[0056] The log request acquisition unit 312 of the management device 3 generates a request command RC based on the trigger signal TS, and transmits the request command RC to each of the one or more selected testers 20a. First, the log request acquisition unit 312 transmits a first request command including a code requesting an IP address and a tester side ID 27 to the selected tester 20a (step S3). The tester 20 (selected tester 20a) that receives this first request command outputs first response information including the tester side ID 27 to the management device 3 (step S4).

[0057] When the log request acquisition unit 312 receives the first response information, the authentication unit 314 performs ID authentication to determine whether the tester side ID 27 and the management ID 39 match (step S5).

[0058] If the tester side ID 27 and the management ID 39 do not match, the management device 3 and the selected tester 20a do not allow the management device 3 to acquire log information (log acquisition disabling step). On the other hand, if the tester side ID 27 and the management ID 39 match, the log request acquisition unit 312 transmits a second request command including an IP address, authentication success information, and a code requesting log information to the selected tester 20a (step S6). The tester 20 that receives this second request command outputs second response information including log information to the management device 3 (step S7).

[0059] When the management device 3 receives the second response information, the log request acquisition unit 312 extracts the log information included in the second response information and temporarily stores it in the memory 32 (step S8). When acquisition of the log information is completed, the log request acquisition unit 312 transmits a third request command including an IP address and an abort code to the selection tester 20a (step S9).

[0060] Furthermore, when the external storage device 6 is connected to the management device 3 for log acquisition, the output unit 313 of the management device 3 stores the acquired log information in the external storage device 6 (step S10) so as not to leave the log information in the management device 3. By the above-described log acquisition process flow, the processing system 1 can easily acquire the log information of the selected tester 20a of the inspection device 2 by the management device 3.

[0061] Here, a situation where a user acquires log information for each tester 20 of the inspection device 2 is considered as a comparative example. In this case, the user is required to perform a unit set work of inserting an external storage device 6 that acquires log information for each of the selected testers 20a. In particular, the inspection device 2 has a multi-stage structure (see Figs. 1 and 3) with multiple tester lines 260 in the vertical direction, and it is difficult to connect the external storage device 6 to the tester 20 located at a high place, which imposes a heavy workload on the user. In addition, in the unit set work, the user is likely to connect the external storage device 6 to the wrong selected tester 20a, so the user is required to confirm whether or not the log information has been acquired from the selected tester 20a. In other words, the unit set work makes it difficult to manage the log information.

[0062] In contrast, the processing system 1 and management device 3 according to this embodiment eliminate the need for a unit set operation of connecting the external storage device 6 to the tester 20. Therefore, the processing system 1 can reduce the burden on the user in acquiring logs. Furthermore, since the management device 3 requests log information from the selected tester 20a all at once, the user is less likely to mistake the target tester 20, and the log information can be managed safely and easily. In particular, the management device 3 can further facilitate the management of log information by automatically storing log information for each selected tester 20a or for each type of log information.

[0063] Furthermore, the processing system 1 is not limited to a configuration in which the management device 3 acquires the log information of each tester 20, and may acquire the log information in an information processing terminal 4 communicably connected to the inspection device 2 or the management device 3 as shown in Fig. 1 and Fig. 4. The information processing terminal 4 is connected to the inspection device 2 or the management device 3 via a network 49, such as an intranet (private network) or the Internet. In this case, the information processing terminal 4 may be one provided outside the processing chamber 10, and for example, the information processing terminal 4 of a maintenance worker or a manufacturer of the inspection device 2 may be used.

[0064] Like the management device 3, the information processing terminal 4 has one or more processors 41, a memory 42, an input / output interface 43, an electronic circuit 44, etc., and also has input / output devices 48 such as a monitor 45, a keyboard 46, and a mouse 47 connected via the input / output interface 43. The processor 41 executes a log acquisition program dedicated to the information processing terminal 4 stored in the memory 42, thereby enabling the information processing terminal 4 to selectively acquire log information of multiple testers 20 and appropriately manage the acquired log information.

[0065] When the information processing terminal 4 acquires a log, the following two patterns (a) and (b) are possible. (a) The inspection device 2 and the information processing terminal 4 communicate information directly. (b) The inspection device 2 and the information processing terminal 4 communicate with each other via the management device 3 .

[0066] In the pattern (a), the inspection device 2 and the information processing terminal 4 communicate with each other without going through the management device 3, and the information processing terminal 4 acquires the log information of the selected tester 20a set by the user on the information processing terminal 4. In this case, the information processing terminal 4 can have the same configuration as the management device 3 described above. In other words, the processing system 1 can use a computer located away from the processing chamber 10 as the management device 3.

[0067] On the other hand, in the pattern (b), the inspection device 2 and the information processing terminal 4 communicate with each other via the management device 3, and the information processing terminal 4 acquires the log information of the selected tester 20a set by the user on the information processing terminal 4. That is, in the pattern (b), the management device 3 serves as an FTP server for acquiring the log information, and the information processing terminal 4 serves as a client terminal for requesting and acquiring the log information.

[0068] When the information processing terminal 4 acquires the log, it is preferable that the processing system 1 judges whether or not the information processing terminal 4 is a legitimate information processing terminal that allows the transmission of log information when the information processing terminal 4 opens access to the inspection device 2 or the management device 3. For example, it is preferable that the inspection device 2 or the management device 3 is configured to request the information processing terminal 4 to input a predetermined password when accessed by the information processing terminal 4, and judge whether or not the information processing terminal 4 is allowed to access the inspection device 2 or the management device 3.

[0069] In the case of pattern (b), the information processing terminal 4 can be configured to acquire log information of the management device 3 in addition to log information of the tester 20 of the inspection device 2. Examples of the log information of the management device 3 include an event log that is a record of abnormalities (trouble, operation errors, etc.) or other events that have occurred in the management device 3, and a system log that is a record of the operations (startup, startup shutdown, etc.) of the management device 3.

[0070] Fig. 8 is a block diagram showing transmission and reception of information between the inspection device 2 and the information processing terminal 4 via the management device 3. When the execution of a log acquisition program dedicated to the information processing terminal 4 is operated, the information processing terminal 4 internally forms a user request acquisition unit 410, an external storage device recognition processing unit 411, a log request acquisition unit 412, and an output unit 413, as shown in Fig. 8. Of these functional units, the external storage device recognition processing unit 411, the log request acquisition unit 412, and the output unit 413 are approximately the same as the external storage device recognition processing unit 311, the log request acquisition unit 312, and the output unit 313 of the management device 3.

[0071] The user request acquisition unit 410 of the information processing terminal 4 displays the information processing terminal side operation screen information 7 on the monitor. FIG. 9 is an explanatory diagram showing an example of the information processing terminal side operation screen information 7. As shown in FIG. 9, the information processing terminal side operation screen information 7 has a tester selection image 70, a log type selection image 71, a storage location setting image 72, a start setting image 73, an end setting image 74, and the like. In addition to a plurality of testers 20 (tester buttons 700), a management device button 703 of the management device 3 is displayed on the tester selection image 70 as a target for acquiring log information. The collective selection button 701 selects all the testers 20 and the management devices 3 collectively when operated by the user. Similarly, the collective release button 702 releases the selection of all the testers 20 and the management devices 3 collectively when operated by the user.

[0072] The log type selection image 71 displays options for the types of log information of the management device 3 (event log, system log) in addition to the types of log information of the tester 20. Note that the memory location setting image 72, start setting image 73, and end setting image 74 are the same as the respective images of the operation screen information 5 of the management device 3.

[0073] 5 and 8, the user request acquisition unit 410 generates a trigger signal TS based on the log information acquisition conditions set by the user in the information processing terminal side operation screen information 7, and outputs this trigger signal TS to the log request acquisition unit 412. Upon receiving this trigger signal TS, the log request acquisition unit 412 of the information processing terminal 4 generates an information processing terminal side request command TRC to be transmitted to the management device 3, and outputs it to the management device 3. The information processing terminal side request command TRC includes the selected tester 20a selected by the user, the type of log information, the storage location of the log information, and the acquisition period of the log information (the start time of acquisition, the end time of acquisition).

[0074] When the processor 31 of the management device 3 receives the information processing terminal side request command TRC, it starts a log acquisition program and forms the above-mentioned log request acquisition unit 312, the log request acquisition unit 312, and the output unit 313. At this time, the log request acquisition unit 312 generates a request command to be transmitted to the selected tester 20a based on the information of the information processing terminal side request command TRC, and outputs the generated request command for each selected tester 20a from which log information is acquired. That is, the management device 3 substitutes for information communication between the inspection device 2 and the information processing terminal 4 by generating a request command RC using the information processing terminal side request command TRC instead of the trigger signal TS of the user request acquisition unit 310.

[0075] The operation of acquiring the log of the selected tester 20a by the log request acquiring unit 312 is the same as the process flow from steps S3 to S9 shown in Fig. 7, and detailed description thereof will be omitted. Upon receiving the log information of the selected tester 20a, the log request acquiring unit 312 of the management device 3 stores the log information of the selected tester 20a in the memory of the management device 3.

[0076] Then, the output unit 313 of the management device 3 transmits information having the acquired log information of the selected tester 20a to the information processing terminal 4 as management device side response information TRI to the information processing terminal side request command TRC. As a result, the log request acquisition unit 412 of the information processing terminal 4 acquires the log information of the selected tester 20a and stores the log information in a directory (PATH) set by the user. After transmitting the log information of the selected tester 20a to the information processing terminal 4, the management device 3 may delete the log information of the selected tester 20a in the management device 3 so that it is not left in the management device 3.

[0077] Furthermore, for example, the information processing terminal 4 (user request acquisition unit 410) may prompt the connection of the external storage device 6 to the information processing terminal 4 in log acquisition. Then, when the external storage device 6 is connected, the output unit 413 of the information processing terminal 4 stores the log information of the selected tester 20a in the external storage device 6. This makes it possible to prevent the log information of the selected tester 20a from remaining in the information processing terminal 4. Furthermore, when storage of the log information is completed, the external storage device recognition processing unit 411 may automatically disconnect the information communication between the information processing terminal 4 and the external storage device 6.

[0078] In addition, in acquiring logs, the processing system 1 may be configured to generate a shared folder (not shown) for acquiring logs in either the management device 3 or the information processing terminal 4, and store the log information in the shared folder. The shared folder is a directory accessible from both the management device 3 side and the information processing terminal 4 side. For example, when a shared folder is generated in the information processing terminal 4, the processing system 1 stores the log information of the selected tester 20a only in this shared folder, and does not leave the log information in other storage areas.

[0079] In this way, the processing system 1 enables the log information of the inspection device 2 to be stored in the information processing terminal 4 connected to the inspection device 2 or the management device 3. This allows the processing system 1 to better manage, for example, the state of the inspection device 2 that is located remotely.

[0080] Second Embodiment Next, a processing system 1A according to a second embodiment of the present disclosure will be described. Fig. 10 is a schematic explanatory diagram showing the overall configuration of a processing system 1A according to the second embodiment of the present disclosure.

[0081] 10, the processing system 1A controls the power-on of each tester 20 of the inspection device 2A using an operation terminal 23 provided on the outer surface of a housing 21 of the inspection device 2A. The processing system 1A may also have a management device 3 or an information processing terminal 4 connected to the inspection device 2A so as to be capable of communicating information (see FIG. 4), and may be configured so that the management device 3 or the information processing terminal 4 controls the power-on of each tester 20.

[0082] Specifically, similar to the inspection apparatus 2 of the first embodiment, the inspection apparatus 2A includes an inspection room 21a having a loading / unloading area 24, a transport area 25, and an inspection area 26 (containing a plurality of testers 20), a controller 22, and an operation terminal 23. Furthermore, the inspection apparatus 2A includes a main power switch 8, and a power management device 9 that switches the power of the tester 20 on and off.

[0083] The inspection device 2A is connected to an external power source (not shown) via a harness (not shown), supplies power to the power management device 9 when the main power switch 8 is on, and cuts off the power supply to the inspection device 2A when the main power switch 8 is off. The main power switch 8 is a physical switch provided on the outer surface of the housing 21 (for example, the same outer surface as the operation terminal 23), and is manually switched on and off by the user.

[0084] The power management device 9 is started by turning on the main power switch 8, and is stopped by turning off the main power switch 8. The inspection device 2A may be provided with a physical switch that starts or stops the power management device 9, separate from the main power switch 8. The power management device 9 is a computer having one or more processors 91, a memory 92, an input / output interface 93, an electronic circuit 94, etc., and manages the turning on and off of the power of the multiple testers 20 of the inspection device 2A. The power management device 9 is connected to the operation terminal 23, and is capable of notifying information to an input / output device 233 (monitor 230, keyboard 231, mouse 232, etc.) of the operation terminal 23, and receiving input from the input / output device 233.

[0085] The power management device 9 is connected to all the testers 20 in the inspection device 2A so as to be able to communicate information with them via a communication line such as a LAN cable or a dedicated control line. Note that the power management device 9 may be configured to communicate information with each tester 20 wirelessly.

[0086] Each tester 20 of the inspection device 2A has a control board 200 (a tester computer) and a test head (not shown) controlled by the control board 200, similar to the tester 20 according to the first embodiment. Each tester 20 can selectively turn the power on and off for each of the control board 200 and the test head. Furthermore, each tester 20 can be manually turned on and off by a user, and can also be turned on and off under the command of the power management device 9.

[0087] FIG. 11 is an explanatory diagram showing the switch panel 29 of each tester 20. As shown in FIG. 11, each tester 20 has a switch panel 29 for switching on and off the power on the outer surface of the inspection device 2A (for example, the surface opposite to the surface on which the operation terminal 23 is installed). The switch panel 29 includes a control board switch 290, a test head on switch 291, a test head off switch 292, a control board reset switch 293, and an alarm reset switch 294. The control board switch 290 is a switch for switching on and off the power to the control board 200. The test head on switch 291 is a switch for turning on the power to the test head. The test head off switch 292 is a switch for turning off the power to the test head. The control board reset switch 293 is a switch for restarting the control board 200. The alarm reset switch 294 is a switch for stopping the alarm when an alarm of the tester 20 is issued. Unlike a hardware switch (physical switch), each switch is a soft switch displayed on a switch panel 29 on the outer surface of the inspection device 2A.

[0088] Meanwhile, the processor 91 of the power management device 9 displays power operation screen information 95 on the monitor 230 of the operation terminal 23 while the power management device 9 is in an activated state. Then, the processor 91 switches between turning on and off the power of each tester 20 (control board 200, test head) in response to a user operation of the operation terminal 23 based on the power operation screen information 95.

[0089] FIG. 12 is an explanatory diagram showing the power operation screen information 95. In FIG. 12, the control board 200 is displayed as PC, and the test head is displayed as TH. As shown in FIG. 12, the power operation screen information 95 displays a power state image 950 of each tester 20 in the inspection device 2A as the first screen information 95a, and displays a display operation button image 951 for the second display for each of the multiple testers 20. The power state image 950 of each tester 20 displays the power-on state or power-off state of the tester 20 by, for example, color and text. The display operation button image 951 displays a power operation window for each tester 20, which is the second screen information 95b, based on a user operation (mouse click, touch operation, etc.).

[0090] The second screen information 95b has a plurality of soft switch displays operable on the monitor, similar to the switches of the switch panel 29. Specifically, these are a control board ON switch display 952, a control board OFF switch display 953, a test head ON switch display 954, a test head OFF switch display 955, a control board reset switch display 956, and an alarm reset switch display 957. That is, the user selects a tester 20 that operates the power supply according to the power supply state of each tester 20 in the first screen information 95a, and clicks the display operation button image 951 of that tester 20 (selected tester 20a). Furthermore, the user clicks the switch display of the second screen information 95b displayed by clicking the display operation button image 951.

[0091] When the processor 91 of the power management device 9 recognizes the above user operation, it switches the power state of the selected tester 20a to match the content of the user operation. For example, when all power sources of the selected tester 20a are in the off state and the control board on switch display 952 is clicked by the user, the processor 91 turns on the power to the control board 200 of the selected tester 20a and puts the control board 200 into the activated state. Also, when the test head on switch display 954 is clicked by the user, the processor 91 turns on the power to the test head of the selected tester 20a and puts the test head into the activated state.

[0092] Alternatively, when all the power supplies of the selected tester 20a are on and the user clicks the test head off switch display 955, the processor 91 turns the power on and off for the test head of the selected tester 20a. Furthermore, when the user clicks the control board off switch display 953, the processor 91 turns the power on and off for the control board 200 of the selected tester 20a. Note that the tester 20 does not need to immediately shut off the power when turning the power on and off, and may, for example, perform a test head stop process or a control board 200 stop process before transitioning to the off state.

[0093] Furthermore, it is preferable that the power management device 9 disables power supply to the test head when the power supply to the control board 200 is stopped. This allows the power management device 9 to power on the control board 200 and then the test head in that order, allowing the tester 20 to operate stably. Furthermore, it is preferable that the power management device 9 disables power supply stop to the control board 200 when the power supply to the test head is on. This allows the power management device 9 to power on and off the test head and then the control board 200 in that order, allowing the tester 20 to operate stably.

[0094] The processing system 1A according to the second embodiment is basically configured as described above, and the power-on processing flow will be described below. Fig. 13 is a flow chart showing an example of a method for operating the power supply of the inspection device 2A.

[0095] When operating the inspection device 2A, the user first turns on the main power switch 8 of the inspection device 2A (step S21). By turning on the main power switch 8, the power management device 9 and the operation terminal 23 of the inspection device 2A are started up (step S22).

[0096] After startup, the processor 91 of the power management device 9 displays the power operation screen information 95 on the monitor 230 (step S23). This allows the user of the inspection device 2A to select the tester 20 to be powered on on the monitor 230 of the operation terminal 23, and also operates the power-on of the control board 200 or test head of the selected tester 20a (step S24).

[0097] When the processor 91 of the power management device 9 recognizes the operation of turning on the power of the selected tester 20a by the user, it turns on the power of the control board 200 or the test head of the selected tester 20a according to the operation (step S25). When the control board 200 and the test head are powered on, the selected tester 20a automatically performs start-up processing and becomes ready to inspect the wafer W.

[0098] As described above, the inspection device 2A may not only turn the power on and off for each of the multiple testers 20, but may also switch the power on and off collectively for the control board 200 or test head of the selected tester 20a (or all testers 20). Alternatively, when the inspection device 2A issues an instruction to turn on the power of the selected tester 20a (or all testers 20) collectively, it may turn on the power to the control board 200 and then the power to the test head.

[0099] The aspects and effects of the present disclosure will be summarized below.

[0100] The processing system 1, 1A according to an embodiment of the present disclosure can maintain security in log acquisition by authenticating the tester side ID 27 and the management ID 39. The processing system 1, 1A can easily acquire log information of the selected tester 20a by the management device 3, suppressing the error of acquiring log information from the wrong tester 20, and can easily manage log information acquired from a plurality of testers 20. Furthermore, the processing system 1, 1A eliminates the need for the user to manually acquire logs from the tester 20 installed at a high position in the height direction. This can significantly reduce the user's workload.

[0101] Furthermore, the multiple testers 20 are provided in a housing 21 of the inspection device 2A, the inspection device 2A includes a controller 22 that controls each of the multiple testers 20, and the management device 3 is connected to each of the multiple testers 20 so as to be able to communicate information with them without going through the controller 22. This allows the processing systems 1, 1A to obtain log information from the management device 3 without significantly affecting information communication between the controller 22 and the testers 20.

[0102] The management device 3 also has a user request acquisition unit 310 that displays operation screen information 5 on the monitor 35 for allowing a user to select a plurality of testers 20, and selects a selected tester 20a for acquiring log information based on the tester 20 selected and operated by the user on the operation screen information 5. This enables the processing system 1, 1A to further simplify the selection of a tester 20 by the user.

[0103] The log information also includes an event log that is a record of events that occurred in the tester 20, a diagnosis log that is a record of self-diagnosis within the tester 20, and a system log that is a record of the operation of the tester 20, and the management device 3 can select the type of log information when selecting the selected tester 20a, and acquires the selected type of log information. This allows the processing system 1, 1A to arbitrarily acquire the desired type of log information for the selected tester 20a, further improving the efficiency of maintenance and other operations.

[0104] Furthermore, the management device 3 acquires log information of the selected tester 20a based on the connection of the external storage device 6 capable of communicating with the management device 3, and stores the acquired log information in the external storage device 6, without leaving the log information in the management device 3. This allows the processing systems 1 and 1A to store the log information of the selected tester 20a only in the external storage device 6 connected to the management device 3, thereby improving security.

[0105] Furthermore, after storing the log information in the external storage device 6, the management device 3 automatically disconnects information communication between the management device 3 and the external storage device 6. This allows the processing systems 1 and 1A to smoothly and safely remove the external storage device 6 from the management device 3 after storing the log information in the external storage device 6.

[0106] Also, the management device 3 includes an information processing terminal 4 capable of communicating with the management device 3, and when the management device 3 receives a request for log information from the information processing terminal 4, it acquires the log information of the selected tester 20a and transmits the acquired log information to the information processing terminal 4, without leaving the log information in the management device 3. This allows the processing systems 1, 1A to store the log information of the selected tester 20a in the information processing terminal 4 connected to the management device 3, and makes it possible to easily obtain the log information even in a remote location.

[0107] Furthermore, the information processing terminal 4 can acquire log information of the management device 3, which is related to the state of the management device 3. This allows the user of the information processing terminal 4 to recognize the state of the management device 3.

[0108] Another aspect of the present disclosure is a management device 3 connected to be able to communicate information with multiple testers 20 that inspect semiconductor devices, and which outputs a request command RC to one or more selected testers 20a that select all or a portion of the multiple testers 20, requesting log information related to the status of the testers 20, and has a log request acquisition unit 312 that acquires the log information from the selected tester 20a that receives the request command RC, and an authentication unit 314 that determines whether the tester side ID 27 held by the selected tester 20a acquired based on the request command RC matches a management ID 39 of the selected tester 20a that is held in advance, and acquires the log information when the authentication unit 314 determines that the tester side ID 27 and the management ID 39 match, and does not allow the acquisition of the log information when it determines that the tester side ID 27 and the management ID 39 do not match.

[0109] Another aspect of the present disclosure is a log acquisition method for a processing system 1, 1A including a plurality of testers 20 that inspect semiconductor devices and a management device 3 that is connected to the plurality of testers 20 so as to be capable of communicating information therebetween, in which each of the plurality of testers 20 is arranged in a height direction and has a memory 222 that stores log information relating to the state of the tester 20, and a request command RC is output by the management device 3 to one or more selected testers 20a that have selected all or a portion of the plurality of testers 20, requesting log information collectively. The method includes a step, an authentication step for determining whether or not the tester side ID 27 of the selected tester 20a and the management ID 39 of the selected tester 20a of the management device 3 match based on the request step, a log acquisition disabling step for disabling acquisition of log information to the management device 3 if it is determined in the authentication step that the tester side ID 27 and the management ID 39 do not match, and a log acquisition step for causing the management device 3 to acquire log information from the selected tester 20a if it is determined in the authentication step that the tester side ID 27 and the management ID 39 match.

[0110] The above-described management device 3 and log acquisition method also make it possible to easily acquire log information of a selected tester 20 while maintaining security, thereby reducing the workload of acquiring logs.

[0111] The processing system 1, 1A, management device 3, and log acquisition method according to the above-mentioned embodiments are illustrative in all respects and are not restrictive. The embodiments can be modified and improved in various forms without departing from the scope and spirit of the appended claims. The matters described in the above-mentioned embodiments can be configured in other ways as long as they are not inconsistent, and can be combined as long as they are not inconsistent. [Explanation of symbols]

[0112] 1. 1A Processing System 2. Inspection equipment 20 Tester 202 Memory 27 Tester ID 3 Management device 312 Log request acquisition unit 313 Output section 314 Authentication Department 39 Management ID 4. Information processing terminal 5 Operation screen information 6 External storage device

Claims

1. A plurality of testers for testing semiconductor devices; a management device connected to the plurality of testers so as to be capable of communicating with the plurality of testers, each of the plurality of testers is arranged in a height direction and has a tester-side memory unit that stores log information related to a state of the tester; The management device includes: a log request acquisition unit that outputs a request command for requesting the log information to one or more selected testers that are selected from all or a part of the plurality of testers, and acquires the log information from the selected testers that have received the request command; one of the plurality of testers and the management device has an authentication unit that determines whether tester side identification information of the selected tester matches management identification information of the selected tester that is held by the management device; The management device acquires the log information when an authentication unit of the selected tester or an authentication unit of the management device that has received the request command determines that the tester-side identification information and the management identification information match, and disables acquisition of the log information to the management device when an authentication unit of the selected tester or an authentication unit of the management device that has received the request command determines that the tester-side identification information and the management identification information do not match. A processing system comprising:

2. the plurality of testers are provided within a housing of an inspection device, the inspection apparatus includes a controller for controlling each of the plurality of testers; The management device is connected to each of the plurality of testers so as to be able to communicate information with each other without going through the controller.

2. The processing system according to claim 1.

3. The management device includes: a user request acquisition unit that displays operation screen information for selecting the plurality of testers on an input / output device, and selects the selected tester for which the log information is to be acquired based on the tester selected by a user on the operation screen information; 3. The processing system according to claim 1 or 2.

4. The log information includes an event log which is a record of events occurring in the tester, a diagnosis log which is a record of self-diagnosis performed within the tester, and a system log which is a record of the operation of the tester, The management device is capable of selecting a type of the log information when selecting the selected tester, and acquires the log information of the selected type.

4. The processing system according to claim 3.

5. The management device includes: Based on a connection of an external storage device capable of communicating with the management device, the log information of the selected tester is acquired, the acquired log information is stored in the external storage device, and the log information is not left in the management device.

5. The processing system according to claim 1, wherein the processing system comprises:

6. The management device includes: After storing the log information in the external storage device, the information communication between the management device and the external storage device is automatically cut off.

6. The processing system according to claim 5.

7. an information processing terminal capable of communicating with the management device; The management device includes: When a request for the log information is received from the information processing terminal, the log information of the selected tester is acquired, the acquired log information is transmitted to the information processing terminal, and the log information is not left in the management device.

5. The processing system according to claim 1, wherein the processing system comprises:

8. The information processing terminal is capable of acquiring log information of a management device relating to a state of the management device.

8. The processing system according to claim 7.

9. A management device that is communicably connected to a plurality of testers that inspect semiconductor devices, a log request acquisition unit that outputs a request command to one or more selected testers, which are selected from all or a part of the plurality of testers, to request log information related to the states of the testers, and acquires the log information from the selected testers that have received the request command; an authentication unit that judges whether or not the tester side identification information of the selected tester acquired based on the request command matches with management identification information of the selected tester that is held in advance; When the authentication unit determines that the tester side identification information and the management identification information match, the log information is acquired, and when the authentication unit determines that the tester side identification information and the management identification information do not match, the log information is not acquired. A management device comprising:

10. A plurality of testers for testing semiconductor devices; a management device connected to the plurality of testers so as to be capable of communicating with the plurality of testers, each of the plurality of testers is arranged in a height direction and has a tester-side memory unit that stores log information related to a state of the tester; a request step of outputting a request command for requesting the log information to all of the plurality of testers or one or more selected testers selected from a part of the plurality of testers by the management device; an authentication step of determining whether or not tester side identification information held by the selected tester and management identification information held by the management device of the selected tester match based on the request step; a log acquisition disabling step of disabling acquisition of the log information to the management device when it is determined in the authentication step that the tester side identification information and the management identification information do not match; a log acquisition step of acquiring the log information from the selected tester to the management device when it is determined in the authentication step that the tester side identification information and the management identification information match. A log acquisition method comprising:

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