Apparatus and method for controlling phase of measurement waveform of mu

Abstract

The present invention relates to an apparatus and a method for controlling a phase of a measurement waveform of an MU, wherein an accurate value at a sampling command time point is obtained, a characteristic for a temperature change of an oscillation element is corrected, and at the same time, a delay characteristic of an analog sensing element with respect to the sampling command time point is corrected. The apparatus for controlling a phase of a measurement waveform of an MU of the present invention comprises: a temperature sensor for providing ambient temperature information; an oscillation element for providing an oscillation signal; an analog-to-digital converter (ADC) for sampling an analog current sensing signal or an analog voltage sensing signal into a digital signal; and a sampling clock providing unit for providing a sampling clock to the ADC on the basis of the ambient temperature information and the oscillation signal under the control of a sampling request unit.

Description

MU measurement waveform phase control device and method

[0001] The present invention relates to a device and method for adjusting the phase of a measurement waveform of a MU (Merging Unit), and more particularly, to correcting the phase with respect to the delay time of an analog sensing element. In addition, the present invention relates to a device and method for adjusting the phase of a measurement waveform of a MU, which can accurately extract the sensed values ​​of voltage and current of the MU at the time of a sampling command.

[0002] The facilities related to the power system are networked, and one of them is a merging unit (hereinafter referred to as 'MU') that collects grid electricity from the power system.

[0003] In general, MU is a device that converts analog voltage / current signals output from an input transformer into digital values ​​and transmits them in the form of IEC 61850 Sampled Value.

[0004] As a function of MU, analog voltage / current signals must be measured at the exact time for the sample command, but a certain level of phase angle delay occurs between the voltage and current signals input to MU and the output value of MU.

[0005] Therefore, research has continued to reduce these errors. For example, Republic of Korea Patent Publication No. 10-2015-7035504 proposes a distributed protection relay device capable of synchronizing the phase of digital data between multiple MUs.

[0006] However, even in this case, phase compensation cannot provide an accurate value for the sampling command point in time, and in particular, has the disadvantage of not being able to accommodate changes in the sampling point in time due to temperature changes.

[0007] The purpose of the present invention is to provide a device and method for adjusting the phase of a measurement waveform of an MU that obtains an accurate value at the sampling command point in time.

[0008] Another purpose of the present invention is to provide a device and method for adjusting the phase of a measurement waveform of an MU that corrects the characteristics of an oscillator element for temperature changes and at the same time corrects the delay characteristics of an analog sensing element for a sampling command point in time.

[0009] The MU measurement waveform phase control device according to the present invention may include a temperature sensor providing ambient temperature information, an oscillation element providing an oscillation signal, an analog-digital converter (ADC) sampling an analog current sensing signal or voltage sensing signal into a digital signal, and a sampling clock providing unit providing a sampling clock to the ADC based on the ambient temperature information and the oscillation signal under the control of a sampling request unit.

[0010] Here, the sampling clock providing unit can input the delay time characteristics of the current sensing signal or voltage sensing signal at room temperature.

[0011] In addition, the input of the delay time characteristic of the current sensing signal or the voltage sensing signal at the room temperature may be performed in the following order: first, the phase A voltage phase is corrected by measuring a phase correction requirement at the room temperature, the phase B voltage phase and the phase C voltage phase are corrected based on the corrected phase A voltage phase, and the phase A current phase, phase B current phase, and phase C current phase are corrected based on the corrected phase A voltage phase.

[0012] At this time, the phase correction required value can be determined according to the individual characteristics of the sensor for current sensing or voltage sensing.

[0013] Additionally, the sampling clock providing unit can control the timing of the sampling clock based on ambient temperature information.

[0014] Here, the sampling clock providing unit can provide a delayed sample time delayed by the delay time of the original waveform and the measured waveform that measured the original waveform as a sampling clock compared to the reference sample time.

[0015] In addition, when the ambient temperature information is different from the room temperature for the first delayed sample time generated based on the first oscillation speed at room temperature, the sampling clock providing unit can provide a corrected sample time corrected by the oscillation speed difference, which is the time difference between the second delayed sample time generated based on the second oscillation speed, as a sampling clock.

[0016] A method for controlling the phase of a measurement waveform of an MU according to another embodiment of the present invention may include a first phase control step of controlling the sampling clock of an ADC in a sampling clock providing unit based on the delay time characteristics of the current sensing signal or voltage sensing signal at room temperature to control the phase of the current sensing signal or voltage sensing signal, and a second phase control step of controlling the timing of the sampling clock based on ambient temperature information.

[0017] Here, the first phase adjustment step may include a phase correction requirement measurement step for measuring a phase correction requirement, an A-phase voltage phase correction step for correcting the A-phase voltage phase, a B-phase and C-phase voltage phase correction step for correcting the B-phase voltage phase and the C-phase voltage phase based on the corrected A-phase voltage phase, and an A-phase, B-phase, and C-phase current phase correction step for correcting the A-phase current phase, the B-phase current phase, and the C-phase current phase based on the corrected A-phase voltage phase.

[0018] At this time, the phase correction required value can be determined according to the individual characteristics of the sensor for current sensing or voltage sensing.

[0019] In addition, the second phase adjustment step may include a temperature compensation information input step for inputting an oscillation speed difference of an oscillating element due to a temperature difference into a sampling clock providing unit, a temperature difference calculation step for calculating a temperature difference after measuring an ambient temperature from a temperature sensor, a temperature compensation information matching step for checking an oscillation speed difference due to a temperature difference in the sampling clock providing unit, and a sampling point correction step for correcting the timing of a sampling clock by the oscillation speed difference.

[0020] Here, the second phase adjustment step can provide a delayed sample time delayed by the delay time of the original waveform and the measured waveform that measured the original waveform as a sampling clock compared to the reference sample time.

[0021] In addition, the second phase adjustment step can provide a correction sample time, which is a time difference between the first delay sample time generated based on the first oscillation speed at room temperature and the second delay sample time generated based on the second oscillation speed, as a sampling clock when the ambient temperature information is different from the room temperature.

[0022] The MU measurement waveform phase control device and method according to the present invention has the advantage of obtaining an accurate value at the sampling command point in time.

[0023] In addition, the MU measurement waveform phase control device and method according to the present invention have the advantage of being able to correct the characteristics of the oscillator element for temperature change and at the same time correct the delay characteristics of the analog sensing element for the sampling command time point.

[0024] FIG. 1 is a schematic diagram showing a measurement waveform phase control device of an MU according to one embodiment of the present invention.

[0025] Fig. 2 is a waveform and timing diagram showing a measurement waveform input to the ADC of Fig. 1. Fig. 2(a) shows a comparison waveform of a source waveform and a measurement waveform, and Fig. 2(b) is a timing diagram showing in detail a reference sample time corresponding to the source waveform and a delay sample time corresponding to the measurement waveform.

[0026] FIG. 3 is a timing diagram showing a sampling clock used in the ADC of FIG. 1, wherein FIG. 3(a) shows a first delayed sample time at room temperature compared to a reference sample time, FIG. 3(b) shows a second delayed sample time for an ambient temperature other than room temperature and a corrected sample time corrected for the same compared to the reference sample time, FIG. 3(c) shows a first oscillation speed for an oscillation element at room temperature, and FIG. 3(d) shows a second oscillation speed for an oscillation element at an ambient temperature other than room temperature.

[0027] FIG. 4 is a flowchart illustrating a method for adjusting the phase of a measurement waveform of an MU according to one embodiment of the present invention.

[0028] Figure 5 is a flowchart illustrating in detail the first phase adjustment step of Figure 4.

[0029] Figure 6 is a flowchart showing in detail the second phase adjustment step of Figure 4.

[0030] Hereinafter, specific embodiments for carrying out the present invention will be described with reference to the attached drawings.

[0031] When describing the present invention, terms such as "first" and "second" may be used to describe various components. However, the components may not be limited by these terms. The terms are used solely to distinguish one component from another. For example, without departing from the scope of the present invention, the first component could be referred to as the "second component," and similarly, the second component could also be referred to as the "first component."

[0032] When it is said that a component is connected or connected to another component, it can be understood that it may be directly connected or connected to that other component, but there may also be other components in between.

[0033] The terminology used in this specification is for the purpose of describing specific embodiments only and is not intended to limit the present invention. Singular expressions may include plural expressions unless the context clearly dictates otherwise.

[0034] In this specification, terms such as “include” or “have” are intended to indicate the presence of a feature, number, step, operation, component, part, or combination thereof described in the specification, and can be understood as not excluding in advance the possibility of the presence or addition of one or more other features, numbers, steps, operations, components, parts, or combinations thereof.

[0035] Additionally, the shape and size of elements in the drawing may be exaggerated for clearer explanation.

[0036]

[0037] Hereinafter, with reference to the attached drawings, a device and method for adjusting the phase of a measurement waveform of a MU (Merging Unit) according to the present invention will be described in detail.

[0038] FIG. 1 is a schematic diagram showing a measurement waveform phase control device of an MU according to one embodiment of the present invention, and FIGS. 2 and 3 are detailed timing diagrams for explaining FIG. 1 in detail.

[0039] Hereinafter, a measurement waveform phase control device of an MU according to one embodiment of the present invention will be described with reference to FIGS. 1 to 3.

[0040] First, referring to FIG. 1, the MU measurement waveform phase control device according to one embodiment of the present invention is composed of a temperature sensor (100) that provides ambient temperature information, an oscillation element (300) that provides an oscillation signal, an ADC (Analog-digital converter) (400) that samples an analog current sensing signal or voltage sensing signal into a digital signal, and a sampling clock providing unit (200) that provides a sampling clock to the ADC (400) based on the ambient temperature information and the oscillation signal under the control of a sampling request unit (500).

[0041] Here, the MU must sample an analog current sensing signal or voltage sensing signal into a digital signal at a sampling request time based on an external request. At this time, a sensor (not shown) for current sensing or voltage sensing is required, and the measured value is input to the ADC (400) after a delay occurring in such a sensor.

[0042] Typically, to overcome this difference in delay time, the phase is compensated through software, but this has the problem that it is not an accurate real-time value and also has the disadvantage of being different depending on the ambient temperature information.

[0043] To overcome this, the MU measurement waveform phase control device according to the present invention inputs the delay time characteristics of the current sensing signal or voltage sensing signal at room temperature into the sampling clock providing unit (200), and controls the timing of the sampling clock based on the ambient temperature information during operation.

[0044] In the present invention, input of delay time characteristics at room temperature is performed by first correcting the phase A voltage phase by measuring the phase correction requirement at room temperature, and then correcting the phase B voltage phase and the phase C voltage phase based on the corrected phase A voltage phase. In addition, correction is performed in the order of correcting the phase A current phase, phase B current phase, and phase C current phase based on the corrected phase A voltage phase.

[0045] Here, the phase compensation requirement is determined according to the individual characteristics of the sensor for current sensing or voltage sensing, and can be measured by a separate measuring instrument and input to the sampling clock providing unit (200).

[0046] In this way, the present invention can sample an accurate analog current sensing signal or voltage sensing signal into a digital signal in real time and transmit it to an upper device regardless of the delay time by inputting the delay time characteristic at room temperature, and a detailed description thereof will be described later with reference to FIGS. 2 and 3.

[0047]

[0048] FIG. 2 is a waveform and timing diagram showing a measurement waveform (W420) input to the ADC (400) of FIG. 1. FIG. 2(a) shows a comparison waveform of a source waveform (W410) and a measurement waveform (W420), and FIG. 2(b) is a timing diagram showing in detail a reference sample time (T410) corresponding to the source waveform (W410) and a delay sample time (T420) corresponding to the measurement waveform (W420).

[0049] As can be seen in Fig. 2, the sampling clock providing unit (200) provides a delayed sample time (T420) that is delayed compared to the reference sample time (T410), which is the sampling request time, by the delay time of the original waveform (W410) at the sampling request time and the measured waveform (W420) that measured the original waveform (W410).

[0050] Accordingly, the present invention can accurately compensate for the time delay in a sensor (not shown) for current sensing or voltage sensing, and will be described in detail below with reference to FIG. 3 for a case where the ambient temperature information is not room temperature.

[0051] FIG. 3 is a timing diagram showing a sampling clock used in the ADC (400) of FIG. 1, wherein FIG. 3(a) shows a first delayed sample time (T421) at room temperature compared to a reference sample time (T410), FIG. 3(b) shows a second delayed sample time (T422) for an ambient temperature other than room temperature and a corrected sample time (T423) corrected for the same compared to the reference sample time (T410), FIG. 3(c) shows a first oscillation speed (X310) for an oscillation element (300) at room temperature, and FIG. 3(d) shows a second oscillation speed (X320) for an oscillation element (300) at an ambient temperature other than room temperature.

[0052] Typically, the oscillation element (300) has a disadvantage in that the oscillation speed varies depending on the temperature, and thus it cannot provide an accurate sampling clock to the ADC (400).

[0053] In FIG. 3, the first delay sample time (T421) represents the case where the oscillating element (300) oscillates at the first oscillation speed (X310) at room temperature, and the second delay sample time (T422) represents the case where the oscillating element (300) oscillates at the second oscillation speed (X320) when the temperature is not room temperature.

[0054] At this time, the sampling clock providing unit (200) provides a corrected sample time (T423) that is corrected by the oscillation speed difference (T430), which is the time difference between the first delayed sample time (T421) generated based on the first oscillation speed (X310) at room temperature and the second delayed sample time (T422) generated based on the second oscillation speed (X320) when the ambient temperature information is different from the room temperature, as a sampling clock.

[0055] Accordingly, the MU measurement waveform phase control device according to the present invention has the advantage of being able to accurately compensate for the time delay in a sensor (not shown) for current sensing or voltage sensing even when the ambient temperature information is not room temperature.

[0056]

[0057] FIG. 4 is a flowchart illustrating a method for adjusting the phase of a measurement waveform of an MU according to an embodiment of the present invention, and FIGS. 5 and 6 are detailed flowcharts for explaining FIG. 4 in detail. Hereinafter, a method for adjusting the phase of a measurement waveform of an MU according to an embodiment of the present invention will be described with reference to FIGS. 4 to 6.

[0058] First, referring to FIG. 4, a method for controlling the phase of a measurement waveform of an MU according to one embodiment of the present invention can control the timing of a sampling clock through two-step phase adjustment.

[0059] That is, the method for controlling the phase of the measurement waveform of the MU according to the present invention is composed of a first phase control step (S100) of controlling the sampling clock of the ADC (400) in the sampling clock providing unit (200) based on the delay time characteristics of the current sensing signal or voltage sensing signal at room temperature to control the phase of the current sensing signal or voltage sensing signal, and a second phase control step (S200) of controlling the timing of the sampling clock based on the ambient temperature information thereafter, and the detailed operations thereof are described below with reference to FIGS. 5 and 6.

[0060] Figure 5 is a flowchart showing in detail the first phase adjustment step (S100) of Figure 4.

[0061] As can be seen in FIG. 5, the first phase adjustment step (S100) of the present invention is composed of a phase correction requirement measurement step (S110) for measuring a phase correction requirement in order to correct the phase of the initial stage, an A-phase voltage phase correction step (S120) for correcting the A-phase voltage phase, a B-phase and C-phase voltage phase correction step (S130) for correcting the B-phase voltage phase and the C-phase voltage phase based on the corrected A-phase voltage phase, and an A-phase, B-phase, and C-phase current phase correction step (S140) for correcting the A-phase current phase, the B-phase current phase, and the C-phase current phase based on the corrected A-phase voltage phase.

[0062] Here, the phase compensation requirement is determined according to the individual characteristics of the sensor for current sensing or voltage sensing, and can be measured by a separate measuring instrument and input to the sampling clock providing unit (200).

[0063] Meanwhile, in the present invention, when the ambient temperature information is not room temperature, the phase corrected in the first phase adjustment step (S100) may be changed, which is described in detail in FIG. 6.

[0064] Figure 6 is a flowchart showing in detail the second phase adjustment step (S200) of Figure 4.

[0065] As can be seen in FIG. 6, the second phase adjustment step (S200) of the present invention is composed of a temperature compensation information input step (S210) of inputting an oscillation speed difference (T430) of an oscillation element (300) due to a temperature difference into a sampling clock providing unit (200), a temperature difference calculation step (S220) of calculating a temperature difference after measuring an ambient temperature from a temperature sensor (100), a temperature compensation information matching step (S230) of checking an oscillation speed difference (T430) due to a temperature difference in the sampling clock providing unit (200), and a sampling point correction step (S240) of correcting the timing of the sampling clock by the oscillation speed difference (T430).

[0066] More specifically, as shown in FIG. 3, the present invention provides a correction sample time (T423) that is corrected by the oscillation speed difference (T430), which is the time difference between the first delay sample time (T421) generated based on the first oscillation speed (X310) at room temperature and the second delay sample time (T422) generated based on the second oscillation speed (X320) when the ambient temperature information is different from the room temperature, as a sampling clock.

[0067] Accordingly, the method for controlling the phase of the measurement waveform of the MU according to the present invention can accurately compensate for the time delayed in a sensor (not shown) for current sensing or voltage sensing even when the ambient temperature information is not room temperature.

[0068]

[0069] As described above, the MU measurement waveform phase control device and method according to the present invention has the advantage of obtaining an accurate value at the sampling command point in time, and has the advantage of being able to correct the delay characteristic of the analog sensing element with respect to the sampling command point in time while correcting the characteristics of the oscillator element for temperature change.

[0070]

[0071] Those skilled in the art will appreciate that the various illustrative logical blocks, modules, processors, means, circuits, and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, various forms of programs or design code (referred to herein, for convenience, as software), or a combination of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the overall system. Those skilled in the art may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.

[0072] The various embodiments presented herein can be implemented as a method, apparatus, or article of manufacture using standard programming and / or engineering techniques. The term article of manufacture includes a computer program, carrier, or media accessible from any computer-readable storage device. For example, computer-readable storage media include, but are not limited to, magnetic storage devices (e.g., hard disks, floppy disks, magnetic strips, etc.), optical disks (e.g., CDs, DVDs, etc.), smart cards, and flash memory devices (e.g., EEPROMs, cards, sticks, key drives, etc.). Furthermore, various storage media presented herein include one or more devices and / or other machine-readable media for storing information.

[0073] It should be understood that the specific order or hierarchy of steps in the presented processes is merely an example of exemplary approaches. It should be understood that the specific order or hierarchy of steps in the processes may be rearranged within the scope of the present invention based on design priorities. The appended method claims provide elements of various steps in a sample order, but are not intended to be limited to the specific order or hierarchy presented.

[0074] The description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other embodiments without departing from the scope of the present invention. Therefore, the present invention is not intended to be limited to the embodiments disclosed herein, but is to be construed in the broadest scope consistent with the principles and novel features disclosed herein.

[0075] The present invention relates to a device and method for controlling a phase of a measurement waveform of a MU (Merging Unit), and can be used in the MU field.

Claims

1. Temperature sensor that provides ambient temperature information; An oscillator that provides an oscillating signal; ADC (Analog-digital converter) that samples analog current sensing signal or voltage sensing signal into a digital signal; A sampling clock providing unit that provides a sampling clock to the ADC based on the ambient temperature information and the oscillation signal under the control of the sampling request unit; A measurement waveform phase control device of an MU including a .

2. In paragraph 1, The above sampling clock providing unit, A measurement waveform phase control device of an MU, characterized in that the delay time characteristics of the current sensing signal or the voltage sensing signal at room temperature are input.

3. In paragraph 2, The input of the delay time characteristics of the current sensing signal or the voltage sensing signal at the above room temperature is, A MU measurement waveform phase control device characterized in that the phase correction requirement is measured at the above-mentioned room temperature to first correct the phase A voltage phase, then the phase B voltage phase and the phase C voltage phase are corrected based on the corrected phase A voltage phase, and then the phase A current phase, phase B current phase, and phase C current phase are corrected based on the corrected phase A voltage phase.

4. In paragraph 3, A phase adjustment device for a measurement waveform of an MU, characterized in that the above phase correction requirement is determined according to the individual characteristics of a sensor for current sensing or voltage sensing.

5. In paragraph 1, The above sampling clock providing unit, A measurement waveform phase control device of an MU characterized by controlling the timing of the sampling clock based on the above ambient temperature information.

6. In paragraph 1, The above sampling clock providing unit, A measurement waveform phase control device of an MU characterized in that it provides a delayed sample time delayed by the delay time of the original waveform and the measurement waveform that measured the original waveform as the sampling clock compared to the reference sample time.

7. In paragraph 5, The above sampling clock providing unit, A measurement waveform phase control device of an MU, characterized in that, when the ambient temperature information is different from the room temperature for the first delayed sample time generated based on the first oscillation speed at room temperature, a correction sample time is provided as the sampling clock by correcting the oscillation speed difference, which is the time difference between the second delayed sample time generated based on the second oscillation speed.

8. A first phase adjustment step for controlling the sampling clock of the ADC in the sampling clock providing unit based on the delay time characteristics of the current sensing signal or the voltage sensing signal at room temperature to adjust the phase of the current sensing signal or the voltage sensing signal; and A method for controlling the phase of a measurement waveform of an MU, comprising a second phase control step for controlling the timing of the sampling clock based on ambient temperature information.

9. In paragraph 8, The above first phase adjustment step is, Phase correction requirement measurement step for measuring the phase correction requirement; A phase voltage phase correction step for correcting the A phase voltage phase; A B-phase and C-phase voltage phase correction step that corrects the B-phase voltage phase and C-phase voltage phase based on the corrected A-phase voltage phase; A method for adjusting the phase of a measurement waveform of an MU, including an A-phase, B-phase, and C-phase current phase correction step for correcting the A-phase current phase, the B-phase current phase, and the C-phase current phase based on the corrected A-phase voltage phase.

10. In paragraph 9, A method for adjusting the phase of a measurement waveform of an MU, characterized in that the above phase correction requirement is determined according to the individual characteristics of a sensor for current sensing or voltage sensing.

11. In paragraph 8, The above second phase adjustment step is, A temperature compensation information input step for inputting the oscillation speed difference of the oscillating element due to the temperature difference into the sampling clock providing unit; A temperature difference calculation step for calculating the temperature difference after measuring the ambient temperature from a temperature sensor; A temperature compensation information matching step for checking the oscillation speed difference due to the temperature difference in the sampling clock providing unit; and A method for adjusting the phase of a measurement waveform of an MU, including a sampling point correction step for correcting the timing of the sampling clock by the difference in the oscillation speed.

12. In paragraph 11, The above second phase adjustment step is, A method for controlling the phase of a measurement waveform of an MU, characterized in that a delayed sample time delayed by the delay time of a measurement waveform measuring the original waveform and the reference sample time is provided as the sampling clock.

13. In paragraph 12, The above second phase adjustment step is, A method for adjusting the phase of a measurement waveform of an MU, characterized in that when the ambient temperature information is different from the room temperature for the first delayed sample time generated based on the first oscillation speed at the above-mentioned room temperature, a corrected sample time corrected by the oscillation speed difference, which is the time difference between the second delayed sample time generated based on the second oscillation speed, is provided as the sampling clock.

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