Automatic analysis device

Abstract

This automatic analysis device makes it possible to start the analysis of a sample with high accuracy in a short time by quickly stabilizing the temperature of a light detection element and a diffraction grating. The present disclosure proposes an automatic analysis device comprising: a light source that irradiates, with light, a reaction vessel in which a sample and a reagent are mixed and reacted; a spectroscopic element that separates the light transmitted through the reaction vessel; a light detection element that detects the light separated by the spectroscopic element; a fixing member that fixes the light detection element and the spectroscopic element; a measurement chamber that accommodates the spectroscopic element and the light detection element; a heating device installed on the fixing member; a control device that controls the heating device; a temperature sensor support member installed on the fixing member on the inside of the measurement chamber in the vicinity of the light detection element; and a measurement chamber internal temperature sensor installed on the temperature sensor support member, wherein the thermal time constant from the heating device to the light detection element is in the range from 80% to 120% of the thermal time constant from the heating device to the measurement chamber internal temperature sensor, and the control device controls the heating device such that the temperature detected by the measurement chamber internal temperature sensor reaches a predetermined temperature (see fig. 2).

Description

automatic analyzer

[0001] The present disclosure relates to an automated analyzer.

[0002] An automated analyzer performs analysis by dispensing a sample solution containing an analyte and a reaction reagent into a reaction vessel, allowing the reaction to occur, and optically measuring the reaction solution. For example, an automated analyzer is used to detect specific biological components or chemical substances contained in samples such as blood, serum, or urine. An analytical method using an automated analyzer includes a step of irradiating the sample with light and measuring its absorbance. In analytical methods including such steps, temperature fluctuations in a light-detecting element, such as a photodiode, which detects light, and in a diffraction grating, which disperses the light, significantly affect measurement accuracy. Therefore, it is desirable to minimize temperature fluctuations in the light-detecting element and the diffraction grating. Furthermore, to enable rapid start of measurements, it is desirable to stabilize the temperature of the light-detecting element and the diffraction grating as quickly as possible during startup of the device.

[0003] As disclosed in Patent Document 1, a spectrophotometer has been known that includes a spectroscopic chamber separated from a light source chamber by a heat insulating section and equipped with at least a spectroscopic element, a sample chamber, and a detector, a temperature measuring means for measuring the temperature inside the spectroscopic chamber, a temperature adjusting means for heating and / or cooling the inside of the spectroscopic chamber, and a control means for acquiring temperature information from the temperature measuring means and operating the temperature adjusting means to maintain the inside of the spectroscopic chamber at a predetermined set temperature.

[0004] JP 2014-48176 A

[0005] However, in the prior art such as that disclosed in Patent Document 1, for example, when the temperature adjustment means is a heater, the temperature measured by the temperature measurement means may rise very quickly, particularly compared to the temperature of the photodetector element. This results in a problem in that the heater output is suppressed even when the temperature of the photodetector element is not yet sufficiently stabilized, slowing down the stabilization of the temperature of the photodetector element or diffraction grating. Conversely, because the temperature measured by the temperature measurement means rises more slowly than the temperature of the photodetector element, the heater output may remain high even when the temperature of the photodetector element has actually reached the set value, causing the temperature of the photodetector element to rise too high, slowing down the stabilization of the temperature. Thus, the prior art faces the challenge of how quickly to stabilize the temperature of the photodetector element or diffraction grating.

[0006] In view of this situation, the present disclosure proposes an improved automatic analyzer that enables highly accurate sample analysis to begin in a short period of time by quickly stabilizing the temperature of the photodetector element and diffraction grating.

[0007] In order to solve the above problems, the present disclosure proposes an automatic analyzer comprising a light source that irradiates light onto a reaction vessel in which a sample and a reagent are mixed and reacted, a spectroscopic element that disperses the light that has passed through the reaction vessel, a photodetector element that detects the light dispersed by the spectroscopic element, a fixing member that fixes the photodetector element and the spectroscopic element, a measurement chamber that houses the spectroscopic element and the photodetector element, a heating device installed in the fixing member, a control device that controls the heating device, a temperature sensor support member installed in the fixing member on the inside of the measurement chamber near the photodetector element, and an intra-measurement chamber temperature sensor installed in the temperature sensor support member, wherein the thermal time constant from the heating device to the photodetector element is in the range of 80% to 120% of the thermal time constant from the heating device to the measurement chamber temperature sensor, and the control device controls the heating device so that the temperature detected by the measurement chamber temperature sensor becomes a predetermined temperature.

[0008] Further features related to the present disclosure will become apparent from the description of this specification and the accompanying drawings. Also, aspects of the present disclosure are achieved and realized by the elements and combinations of various elements and the aspects of the following detailed description and the appended claims. The description of this specification is merely exemplary and does not limit the scope or application of the claims of the present disclosure in any way.

[0009] According to the technology of the present disclosure, the temperatures of the photodetector element and the diffraction grating can be stabilized quickly, making it possible to start highly accurate analysis of the sample in a short period of time.

[0010] 1 is a diagram showing an example of a configuration of an automatic analyzer 100 according to a first embodiment, as viewed from directly above. FIG. 2 is a diagram showing an example of a configuration of a side of the automatic analyzer 100 according to the first embodiment, as viewed from the direction of the arrow in FIG. 1. FIG. 3 is a diagram showing an example of a method for fixing the thermistor 3 in the automatic analyzer 100 according to this embodiment. FIG. 4 is a diagram showing, as a comparative example, a conventional structure for attaching the thermistor 3 to the block 4 (direct attachment). FIG. 5 is a diagram showing simulation results of temperature changes in the vicinity of the photodetector element 2, thermistor 3, and heater 5 of the block 4 in the structure of FIG. 4 when the ambient temperature is low. FIG. 6 is a diagram showing simulation results of heater output. FIG. 7 is a diagram showing simulation results of temperature changes in the vicinity of the photodetector element 2, thermistor 3, and heater 5 of the block 4, as viewed from directly above. FIG. 8 is a diagram showing a relationship between the ambient temperature detected by the ambient temperature sensor 17 and the target temperature of the thermistor 3. FIG. 9 is a diagram showing an example of a configuration of an automatic analyzer 100 according to a second embodiment (corresponding to FIG. 2).

[0011] An embodiment of the present disclosure relates to, for example, a clinical automatic analyzer for analyzing biological samples. More specifically, the present embodiment relates to an automatic analyzer configured such that a thermal time constant τ1 from a heater to a photodetector is in the range of 80% to 120% of a thermal time constant τ2 from the heater to a thermistor, and the automatic analyzer is capable of quickly stabilizing the temperature of the photodetector by controlling a heating device so that the temperature detected by the thermistor becomes a predetermined temperature.

[0012] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. In the accompanying drawings, functionally identical elements may be designated by the same numerals. Note that the accompanying drawings illustrate specific embodiments and implementation examples according to the principles of the present disclosure, but these are for understanding the present disclosure and are not to be used to interpret the present disclosure in any way as being limiting.

[0013] Although the present embodiment has been described in sufficient detail to enable those skilled in the art to practice the present disclosure, it should be understood that other implementations and forms are possible, and that changes in configuration and structure and substitutions of various elements are possible without departing from the scope and spirit of the technical ideas of the present disclosure. Therefore, the following description should not be interpreted as being limited thereto.

[0014] (1) First Embodiment An automatic analyzer according to a first embodiment will be described with reference to FIGS. 1 to 7. FIG.

[0015] 1 and 2 are diagrams showing an example of the internal configuration of an automatic analyzer 100 according to this embodiment. Fig. 1 is a diagram showing an example of the configuration of the automatic analyzer 100 as seen from directly above (the internal configuration of the measurement chamber 1 is shown). Fig. 2 is a diagram showing an example of the configuration of the side of the automatic analyzer 100 as seen from the direction of the arrow in Fig. 1 (the internal configuration of the measurement chamber 1 is shown).

[0016] 1 and 2, the automatic analyzer includes a measurement chamber 1 that houses a photodetector element 2, a thermistor 3 which is a temperature sensor, a heater 5, a diffraction grating 6 which is a spectroscopic element, a photodetector support member 7, a thermistor support member 8, and a diffraction grating support member 9, a light source 10, a light source chamber 11 in which the light source 10 is disposed, a reaction disk 12 that houses constant-temperature water 15 and for reacting the sample with the reagent, a reaction vessel 13 that houses a reaction liquid (a solution in which the sample and the reagent have reacted) 14, a control device 16, an ambient temperature sensor 17, and a block 4 (fixing member) made of metal or the like on which the measurement chamber 1 and the light source chamber 11 are placed.

[0017] The reaction disk 12 is filled with constant temperature water 15, and a plurality (a large number) of reaction vessels 13 are placed thereon.

[0018] The light source 10 is configured by a halogen lamp, an LED lamp, or the like, and is installed in a light source chamber 11. The light source chamber 11 is fixed to the block 4.

[0019] The reaction disk 12 rotates so that a plurality of reaction vessels 13 can be sequentially subjected to measurement. A sample and a reagent are placed in the reaction vessels 13 to produce a reaction solution 14. Light emitted from the light source 10 is irradiated onto the reaction solution 14 in the reaction vessels 13. The light transmitted through the reaction solution 14 enters the measurement chamber 1 through a light-transmitting window (not shown) provided in the measurement chamber 1. The light is incident on the diffraction grating 6, dispersed, and detected by the light detection element 2, such as a photodiode array.

[0020] The measurement chamber 1 has a structure (light-tight structure) that prevents light from entering from outside, thanks to the block 4 and the cover covering the top of it. The photodetector 2 and diffraction grating 6 provided in the measurement chamber 1 are fixed to the block 4 via support members 7 and 9, respectively. Furthermore, to facilitate adjustment of the optical system, it is preferable to fix the light source chamber 11 and the photodetector 2 and diffraction grating 6 to a common block 4. The block 4 may be constructed such that the portion for fixing the light source chamber 11 and the portion for fixing the components installed in the measurement chamber 1 are integrated, or may be constructed by joining separate portions (made of the same material) together. In either case, the block 4 is constructed as a continuous fixing member to ensure uniform heat transfer.

[0021] A heater 5 is installed on the block 4. The heater 5 is provided to quickly stabilize the temperatures of the photodetector element 2 and the diffraction grating 6. The heater 5 is inserted into the block 4, for example, by drilling a hole and then fixed with screws. Applying thermally conductive grease between the heater 5 and the block 4 makes it easier to insert the heater 5 into the block 4. Furthermore, a thermistor 3 fixed to a thermistor support member 8 is installed on the block 4 and inside the measurement chamber 1. In other words, the thermistor 3 is not installed in direct contact with the block 4, but is installed via the thermistor support member 8.

[0022] The control device 16 controls the output of the heater 5 so that the temperature detected by the thermistor 3 reaches a predetermined temperature. The faster the heat from the heater 5 is transferred to the photodetector element 2 and the diffraction grating 6, the faster their temperatures can be stabilized. For this reason, the block 4, which transfers heat by thermal conduction, can be made of a material with high thermal conductivity, such as aluminum. The control device 16 also sets the target temperature of the thermistor 3 based on the ambient temperature around the device detected by the ambient temperature sensor 17 (see FIG. 7 for details).

[0023] In particular, to quickly stabilize the temperature of the photodetector element 2, which is susceptible to temperature-related effects on measurement accuracy, it is desirable that the temperature of the photodetector element 2 and the temperature detected by the thermistor 3 are as close as possible. For this reason, it is conceivable to mount the thermistor 3 directly on the substrate of the photodetector element 2. However, considering the installation space, noise, and heat generated by the thermistor 3 itself, mounting the thermistor 3 directly on the substrate of the photodetector element 2 is not desirable. Therefore, to bring the temperature of the photodetector element 2 and the temperature detected by the thermistor 3 as close as possible to each other, the thermal time constant τ1 (the time required for the temperature to change to the target temperature) from the heater 5 to the photodetector element 2 and the thermal time constant τ2 from the heater 5 to the thermistor 3 should be within a predetermined range (e.g., τ1 is between 80% and 120% of τ2), or more preferably, should be approximately equal. These thermal time constants τ1 and τ2 are determined by the thermal resistance and heat capacity of each component and the amount of heat dissipated from each component to the air. By adjusting the material and size of the support member (mounting member) 8 for the thermistor 3, it is possible to set the relationship between the thermal time constants τ1 and τ2 within the above range or to make them approximately equal. The thermistor support member 8 can be made of a resin material with a lower thermal conductivity than the block 4. Examples of such materials include polyacetal, polycarbonate, and polyphenylene ether.

[0024] <Method of Fixing Thermistor 3> Figure 3 shows an example of a method of fixing the thermistor 3. The thermistor 3 is fixed to the top of a resin thermistor support member 8 by a thermistor fixture 24. The thermistor support member 8 is fixed to the block 4 by a joint 25 provided at its base. For example, the thermistor support member 8 can be fixed by screwing a bolt inserted into a screw hole 26 into the joint 25 and a screw hole (not shown) provided in the block 4. The joint 25 may be provided in multiple locations around the periphery of the thermistor support member 8. Reference numeral 27 denotes thermistor wiring.

[0025] <Thermistor according to a comparative example> A comparative example will be described with reference to Figures 4, 5A, and 5B. Figure 4 is a diagram showing a conventional structure for mounting the thermistor 3 to the block 4 (direct mounting), as a comparative example. Figure 5A is a diagram showing the results of a simulation of temperature changes in the photodetector element 2, thermistor 3, and the vicinity of the heater 5 of the block 4 in the structure of Figure 4 when the ambient temperature is low. Figure 5B is a diagram showing the results of a simulation of heater output. The heater output is feedback-controlled by PID control based on the temperature detected by the thermistor 3.

[0026] 5A, block 4 is directly heated by the heater, so the temperature of block 4 rises quickly. Also, since the thermistor 3 is in contact with block 4, the temperature of the thermistor 3 similarly rises quickly. On the other hand, heat from heater 5 is transferred to photodetector element 2 with a delay, so the temperature rise of photodetector element 2 is relatively slow. At this time, when the temperature of thermistor 3 reaches the target temperature, the output of heater 5 decreases, further slowing the rate of temperature rise of photodetector element 2. For this reason, it takes a long time for the temperature of photodetector element 2 to stabilize.

[0027] <Thermistor According to This Embodiment> Fig. 6A is a diagram showing the simulation results of temperature changes in the vicinity of the photodetector element 2, thermistor 3, and heater 5 of block 4, depending on the installation method of the thermistor 3 according to this embodiment (Figs. 1 to 3). Fig. 6B is a diagram showing the simulation results of heater output.

[0028] 6A, it can be seen that the rate of temperature rise of the thermistor 3 is close to the rate of temperature rise of the photodetector element 2, and that the thermal time constant τ2 from the heater 5 to thermistor 3 is close to the thermal time constant τ1 from the heater 5 to the photodetector element 2. Heating by the heater 5 continues until the temperature of the thermistor 3 reaches near the target temperature, so the temperature of the photodetector element 2 rises quickly and stabilizes quickly.

[0029] <Consideration results of the quantitative relationship between thermistor support member 8 and photodetector support member 7> The inventors have considered and verified the quantitative relationship between thermistor support member 8 and photodetector support member 7 and have confirmed the following relationship.

[0030] When the bottom area of ​​the thermistor support member 8 is A1, the height of the thermistor support member 8 is H1, the thermal conductivity of the thermistor support member 8 is k1, the specific heat of the thermistor support member 8 is c1, and the density of the thermistor support member 8 is ρ1, and the bottom area of ​​the photo-detecting element support member 7 is A2, the height of the photo-detecting element support member 7 is H2, the thermal conductivity of the photo-detecting element support member 7 is k2, the specific heat of the photo-detecting element support member 7 is c2, and the density of the photo-detecting element support member 7 is ρ2, and R1 is defined as R1 = H1 / (k1×A1), C1 = c1×ρ1×A1×H1, R2 = H2 / (k2·A2), and C2 = c2×ρ2×A2×H2, the thermistor support member 8 and the photo-detecting element support member 7 have the following relationship: 0.8×R2×C2≦R1×C1≦1.2×R2×C2 It was found that the following relationship was satisfied. Here, the product of R and C represents the thermal time constant. It is also assumed that the thermal time constants of the block 4 (fixing member) are almost equal, and that the thermal time constants of the thermistor 3 and the photodetector element 2 are small and can be ignored.

[0031] <Relationship Between Ambient Environment Temperature and Target Temperature of Thermistor 3> FIG. 7 is a diagram showing the relationship between the ambient environment temperature detected by the ambient environment temperature sensor 17 and the target temperature of thermistor 3. As shown in FIG.

[0032] The control device 16 sets the target temperature of the thermistor 3 based on the relationship between the ambient temperature and the target temperature of the thermistor 3, which is pre-stored in the storage device 23. The relationship between the ambient temperature and the target temperature of the thermistor 3 is such that the target temperature is the temperature detected by the thermistor 3 when the heater 5 is stopped and stabilized at that ambient temperature. Therefore, the higher the ambient temperature, the higher the target temperature of the thermistor 3 is set. The temperature when the heater 5 is stopped is not necessarily the same as the ambient temperature. Because heat is gradually transferred from the light source 10 and the reaction vessel 13, the temperature inside the measurement chamber 1 when stabilized is higher than the ambient temperature. This temperature is defined as the temperature when the heater 5 is stopped. By setting the target temperature of the thermistor 3 to the temperature when the heater 5 is stopped and stabilized, the output of the heater 5 can be stopped when the temperature stabilizes, thereby reducing the power consumption of the automated analyzer 100. As described above, the temperature of the light detection element 2 can be stabilized quickly, allowing for highly accurate sample analysis to begin in a short time.

[0033] (2) Second Embodiment FIG. 8 is a diagram (corresponding to FIG. 2) showing an example of the configuration of an automatic analyzer 100 according to a second embodiment.

[0034] In this embodiment, the heater 5 can be installed at a position midway between the photodetector element 2 and the diffraction grating 6, and at a position (within the block 4) where the thermal time constant τ1 from the heater 5 to the photodetector element 2 and the thermal time constant τ3 from the heater 5 to the diffraction grating 6 are within a predetermined range (e.g., τ1 is in the range of 80% to 120% of τ3), more preferably, are approximately equal. The thermistor 3 and thermistor support member 8 are installed inside the measurement chamber 1 at a position midway between the photodetector element 2 and the diffraction grating 6. In this case, the material and size of the thermistor support member 8 are adjusted so that the thermal time constant τ2 from the heater 5 to thermistor 3 and the thermal time constant τ1 from the heater 5 to the photodetector element 2 are within a predetermined range (e.g., τ1 is in the range of 80% to 120% of τ2), more preferably, are approximately equal. Furthermore, the heater 5 and the diffraction grating 6 can be placed at a position where the thermal time constant τ3 is within a predetermined range (for example, τ3 is in the range of 80% to 120% of τ2), more preferably at a position where they are approximately equal (within block 4).

[0035] By setting the thermal time constants τ1 to τ3 of each element as described above, the thermal time constant τ1 from the heater 5 to the photodetector element 2 and the thermal time constant τ3 from the heater 5 to the diffraction grating 6 can be set to be in the range of 80% to 120% of the thermal time constant τ2 from the heater 5 to thermistor 3, and more preferably, to be approximately equal.

[0036] With this configuration, the temperature changes of both the photodetector element 2 and the diffraction grating 6 become similar to the temperature changes of the thermistor 3, and the temperatures of both the photodetector element 2 and the diffraction grating 6 can be quickly stabilized, thereby enabling highly accurate sample analysis to begin in a short time.

[0037] (3) Others In the first and second embodiments, the automatic analyzer 100 equipped with the light source 10 is exemplified, but the present invention can also be applied to an automatic analyzer that does not have the light source 10 and causes the reaction solution 14 of the sample and the reagent to emit light itself. Furthermore, although the first and second embodiments are directed to a biochemical analyzer, the present invention can also be applied to other analyzers.

[0038] (4) Summary (i) In the automated analyzer 100 according to this embodiment, the thermal time constant τ1 from the heater (heating device) 5 to the photodetector 2 is set in the range of 80% to 120% of the thermal time constant τ2 from the heater 5 to the thermistor (measurement chamber temperature sensor) 3. The control device 16 controls the heater 5 so that the temperature detected by the thermistor 3 reaches a predetermined temperature. More specifically, the storage device 23 within the control device 16 (which may be provided externally as a separate component from the control device 16) stores the relationship between the ambient temperature and the temperature detected by the thermistor 3 when the heater 5 is stopped and stabilized (see FIG. 7 ). Based on the temperature detected by the ambient temperature sensor, the control device 16 sets the target temperature of the thermistor 3 to the temperature stored in the storage device 23 when the heater 5 is stopped and stabilized, and controls the heater 5 so that the temperature detected by the thermistor 3 reaches the target temperature. This allows the temperature of the photodetector 2 to be stabilized quickly. This allows for the start of high-precision sample analysis in a short time.

[0039] The photodetector element 2 is placed on a photodetector element support member 7 installed inside the measurement chamber 1. This prevents heat from being directly transferred from the block 4 to the photodetector element 2, making it possible to appropriately adjust the thermal time constant τ1.

[0040] (ii) In this embodiment, the block 4 is used as the member for fixing the light source 10 (light source chamber 11) and the member for fixing the light detection element 2 and the diffraction grating 6 (spectroscopy element). In other words, by using a continuous block 4 or an integrated block 4 as the fixing member for fixing the light source 10 and the fixing member for fixing the elements in the measurement chamber 1, heat is transmitted uniformly. By making the heat transmission method common, optical adjustment can be easily performed on the light source (light emission) side and the light receiving side (optical elements in the measurement chamber 1).

[0041] (iii) More specifically, the bottom area of ​​the thermistor support member 8 is denoted as A1, the height of the thermistor support member 8 as H1, the thermal conductivity of the temperature sensor support member as k1, the specific heat of the thermistor support member 8 as c1, and the density of the thermistor support member 8 as ρ1, and the bottom area of ​​the photo-detecting element support member 7 is denoted as A2, the height of the photo-detecting element support member 7 as H2, the thermal conductivity of the photo-detecting element support member 7 as k2, the specific heat of the photo-detecting element support member 7 as c2, and the density of the photo-detecting element support member 7 as ρ2. Furthermore, the following definitions are given: R1 = H1 / (k1 × A1), C1 = c1 × ρ1 × A1 × H1, R2 = H2 / (k2 × A2), and C2 = c2 × ρ2 × A2 × H2.

[0042] In this case, the thermistor support member 8 and the photodetector support member 7 are configured to satisfy the relationship: 0.8×R2×C2≦R1×C1≦1.2×R2×C2. By doing so, it is possible to set the thermal time constant τ1 from the heater 5 to the photodetector element 2 in the range of 80% to 120% of the thermal time constant τ2 from the heater 5 to thermistor 3.

[0043] (iv) Furthermore, in this embodiment, the thermal time constant τ1 from the heater 5 to the light detection element 2 and the thermal time constant τ3 from the heater 5 to the diffraction grating 6 may each be set in the range of 80% to 120% of the thermal time constant τ2 from the heater 5 to thermistor 3.

[0044] (v) In the second embodiment, the thermistor support member 8 is made of a material with a thermal conductivity lower than that of the block 4. The heater 5 is installed inside the block 4 and between it and the photodetector element 2 (see FIG. 8 ). The control device 16 controls the heater 5 so that the temperature detected by the thermistor 3 reaches a predetermined temperature (the target temperature). The thermal conductivity of the block 4 is uniform, and heat is transmitted throughout the block 4. However, it takes some time for the block 4 to reach a uniform temperature. Therefore, by installing the heater 5 between the photodetector element 2 and the diffraction grating 6, their thermal time constants can be set to be approximately equal, allowing their temperatures to be stabilized quickly. This allows for high-precision sample analysis to begin in a short time.

[0045] (vi) It is also possible to use a method in which, without using the light source 10, light emitted in the reaction vessel 13 in which the sample and the reagent are mixed and reacted is dispersed by the diffraction grating 6, and this dispersed light is detected by the photodetector element 2. In this case, too, similar to the above, it is advisable to set the thermal time constant τ1 from the heater 5 to the photodetector element 2 in the range of 80% to 120% of the thermal time constant τ2 from the heater 5 to the thermistor 3.

[0046] (vii) While specific embodiments are described in this disclosure, these are intended to be illustrative (understanding the technology of the present disclosure) and not limiting in all respects. Those skilled in the art will recognize that there are numerous combinations of hardware, software, and firmware suitable for implementing the technology of the present disclosure. Furthermore, in the above-described embodiments, control lines and information lines are shown as being necessary for the explanation, and not all control lines and information lines are necessarily shown in the actual product. All components may be interconnected.

[0047] In addition, other implementations of the present disclosure will be apparent to those skilled in the art from consideration of the present embodiments. The specification and examples are exemplary only, with the scope and spirit of the technology of the present disclosure being indicated by the following claims.

[0048] REFERENCE SIGNS LIST 1 Measurement chamber 2 Photodetector element 3 Thermistor 4 Block (metal block) 5 Heater 6 Diffraction grating 7 Photodetector element support member 8 Thermistor support member 9 Diffraction grating support member 10 Light source 11 Light source chamber 12 Reaction disk 13 Reaction vessel 14 Reaction liquid 15 Constant temperature water 16 Control device 17 Ambient environment temperature sensor 23 Storage device 24 Thermistor fixing tool 25 Joint portion of thermistor fixing member with block 26 Screw hole of thermistor fixing member 27 Thermistor wiring 100 Automatic analyzer

Claims

1. An automatic analyzer comprising: a light source which irradiates light onto a reaction vessel in which a sample and a reagent are mixed and reacted; a spectroscopic element which disperses the light transmitted through the reaction vessel; a photodetection element which detects the light dispersed by the spectroscopic element; a fixing member which fixes the photodetection element and the spectroscopic element; a measurement chamber which houses the spectroscopic element and the photodetection element; a heating device installed on the fixing member; a control device which controls the heating device; a temperature sensor support member installed on the fixing member on the inside of the measurement chamber near the photodetection element; and an internal measurement chamber temperature sensor installed on the temperature sensor support member, wherein the thermal time constant from the heating device to the photodetection element is in the range of 80% to 120% of the thermal time constant from the heating device to the internal measurement chamber temperature sensor, and the control device controls the heating device so that the temperature detected by the measurement chamber temperature sensor becomes a predetermined temperature.

2. An automatic analyzer according to claim 1, further comprising: an ambient environment temperature sensor for detecting the ambient environment temperature; and a memory device for storing the relationship between the ambient environment temperature and the temperature detected by the measurement room temperature sensor when the heating device is stopped and stabilized, wherein the control device sets a target temperature of the measurement room temperature sensor to the temperature stored in the memory device when the heating device is stopped and stabilized based on the temperature detected by the ambient environment temperature sensor, and the control device controls the heating device so that the temperature detected by the measurement room temperature sensor becomes the target temperature.

3. An automatic analyzer according to claim 1, wherein a fixing member for fixing the light source and a fixing member for fixing the light detection element and the spectroscopic element are continuous and configured to transfer heat uniformly.

4. An automatic analyzer according to claim 1, wherein a fixing member for fixing the light source and a fixing member for fixing the light detection element and the spectroscopic element are integrally configured.

5. An automatic analyzer according to claim 1, wherein the light detection element is installed inside the measurement chamber and on a light detection element support member that supports the light detection element.

6. In claim 5, when the bottom area of ​​the temperature sensor support member is expressed as A1, the height of the temperature sensor support member is expressed as H1, the thermal conductivity of the temperature sensor support member is expressed as k1, the specific heat of the temperature sensor support member is expressed as c1, and the density of the temperature sensor support member is expressed as ρ1, the bottom area of ​​the light-detecting element support member is expressed as A2, the height of the light-detecting element support member is expressed as H2, the thermal conductivity of the light-detecting element support member is expressed as k2, the specific heat of the light-detecting element support member is expressed as c2, and the density of the light-detecting element support member is expressed as ρ2, and R1 is defined as H1 / (k1×A1), C1 = c1×ρ1×A1×H1, R2 = H2 / (k2×A2), and C2 = c2×ρ2×A2×H2, the temperature sensor support member and the light-detecting element support member are: An automatic analyzer that satisfies the relationship: 0.8×R2×C2≦R1×C1≦1.2×R2×C2.

7. An automatic analyzer comprising: a light source which irradiates light onto a reaction vessel in which a sample and a reagent are mixed and reacted; a spectroscopic element which disperses the light transmitted through the reaction vessel; a photodetection element which detects the light dispersed by the spectroscopic element; a fixing member which fixes the photodetection element and the spectroscopic element; a measurement chamber in which the spectroscopic element and the photodetection element are installed; a heating device installed on the fixing member; a control device which controls the heating device; a temperature sensor support member installed on the fixing member on the inside of the measurement chamber near the photodetection element; and an internal measurement chamber temperature sensor installed on the temperature sensor support member, wherein the thermal time constant from the heating device to the photodetection element and the thermal time constant from the heating device to the spectroscopic element are in the range of 80% to 120% of the thermal time constant from the heating device to the internal measurement chamber temperature sensor.

8. An automatic analyzer comprising: a light source which irradiates light onto a reaction vessel in which a sample and a reagent are mixed and reacted; a spectroscopic element which disperses light transmitted through the reaction vessel; a photodetection element which detects light dispersed by the spectroscopic element; a fixing member which fixes the photodetection element and the spectroscopic element; a measurement chamber in which the spectroscopic element and the photodetection element are installed; a heating device installed on the fixing member; a control device which controls the heating device; a temperature sensor support member installed on the fixing member on the inside of the measurement chamber near the photodetection element; and a temperature sensor installed on the temperature sensor support member, wherein the temperature sensor support member is a member having a thermal conductivity smaller than that of the fixing member, the heating device is installed at a position between the photodetection element and the spectroscopic element, and the control device controls the heating device so that the temperature detected by the temperature sensor becomes a predetermined temperature.

9. An automatic analyzer comprising: a spectroscopic element that disperses light emitted in a reaction vessel in which a sample and a reagent are mixed and reacted; a photodetection element that detects the light dispersed by the spectroscopic element; a fixing member that fixes the photodetection element and the spectroscopic element; a measurement chamber in which the spectroscopic element and the photodetection element are installed; a heating device installed on the fixing member; a control device that controls the heating device; a temperature sensor support member installed on the fixing member on the inside of the measurement chamber near the photodetection element; and a temperature sensor installed on the temperature sensor support member, wherein the thermal time constant from the heating device to the photodetection element is in the range of 80% to 120% of the thermal time constant from the heating device to the temperature sensor, and the control device controls the heating device so that the temperature detected by the temperature sensor becomes a predetermined temperature.

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