Non-contact sampling head for sampling instrument

Abstract

An instrument includes a head and a main unit. The head includes an inlet and a first outlet on a side of the inlet. The first outlet is elongated along a first axis. The head includes a second outlet on an opposite side of the inlet. The second outlet is elongated along a second axis that forms an angle with the first axis that is between 1 degree and 120 degrees. The head includes a notch configured to receive a filter such that the filter is aligned with the inlet. The main unit includes an impeller that is configured to, when the head is attached to the main unit and the filter is positioned in the notch: move air through the first outlet and against a sample, move air through the second outlet and against the sample, and move air from the sample through the inlet and the filter.

Description

Non-Contact Sampling Head for Sampling InstrumentCROSS-REFERENCE TO RELATED APPLICATION

[0001] This application claims priority to U.S. Provisional Patent Application No. 63 / 579,543, filed on August 30, 2023, the entire contents of which are incorporated by reference herein.STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT

[0002] This invention was made with government support under Grant No.70RSAT21CB0000014, awarded by the Department of Homeland Security. The government has certain rights in the invention.BACKGROUND

[0003] Security screening of persons and their belongings is necessary in various settings such as airports, government buildings, and large public events. In some circumstances, elevated or “secondary” screening is necessary. Secondary screening can involve collecting particle samples from the person’s clothing or belongings and using chemical means for detecting the presence of explosives or other contraband. Secondary screening can be invasive and time consuming.SUMMARY

[0004] A first example is a sampling head configured for attachment to a main unit of a sampling instrument, the sampling head comprising: a suction inlet; one or more first outlets on a first side of the suction inlet, wherein the one or more first outlets are elongated along a first axis; one or more second outlets on a second side of the suction inlet opposite the first side, wherein the one or more second outlets are elongated along a second axis that forms an angle with the first axis that is greater than 1 degree and less than 120 degrees; and a notch configured to receive a filter cartridge comprising a filter such that the filter is aligned with the suction inlet; wherein when the sampling head is attached to the main unit and the filter cartridge is positioned in the notch: the one or more first outlets are configured to receive first air moved via an impeller contained in the main unit and direct the first air against a sample, the one or more second outlets are configured to receive second air moved via the impeller and direct the second air against the sample, and the suction inlet is configured to receive third air from the sample that is moved by the impeller through the suction inlet and the filter.

[0005] A second example is a sampling instrument comprising: a sampling head comprising: a suction inlet; one or more first outlets on a first side of the suction inlet,wherein the one or more first outlets are elongated along a first axis; one or more second outlets on a second side of the suction inlet opposite the first side, wherein the one or more second outlets are elongated along a second axis that forms an angle with the first axis that is greater than 1 degree and less than 120 degrees; and a notch configured to receive a filter cartridge comprising a filter such that the filter is aligned with the suction inlet; and a main unit comprising an impeller that is configured to, when the sampling head is attached to the main unit and the filter cartridge is positioned in the notch: move first air through the one or more first outlets and against a sample, move second air through the one or more second outlets and against the sample, and move third air from the sample through the suction inlet and the filter.

[0006] A third example is a filter cartridge comprising: a frame; and a filter embedded within the frame.

[0007] A fourth example is a method of operating the sampling instrument of the second example, the method comprising: expelling the first air out of the one or more first outlets against the sample, thereby dislodging first particles from the sample; concurrent with expelling the first air, expelling the second air out of the one or more second outlets, thereby dislodging second particles from the sample; and drawing the third air, the first particles, and the second particles through the suction inlet and the filter, thereby capturing the first particles and the second particles within the filter.

[0008] When the term “substantially” or “about” is used herein, it is meant that the recited characteristic, parameter, or value need not be achieved exactly, but that deviations or variations, including, for example, tolerances, measurement error, measurement accuracy limitations, and other factors known to those of skill in the art may occur in amounts that do not preclude the effect the characteristic was intended to provide. In some examples disclosed herein, “substantially” or “about” means within + / - 0-5% of the recited value.

[0009] These, as well as other aspects, advantages, and alternatives will become apparent to those of ordinary skill in the art by reading the following detailed description, with reference where appropriate to the accompanying drawings. Further, it should be understood that this summary and other descriptions and figures provided herein are intended to illustrate by way of example only and, as such, that numerous variations are possible.BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 is an upright view of a sampling instrument, according to an example.

[0011] Figure 2 is an inverted view of a sampling instrument, according to an example.

[0012] Figure 3 is a perspective view of a sampling head, according to an example.

[0013] Figure 4 is a front view of a sampling head, according to an example.

[0014] Figure 5 is a perspective view of a filter cartridge, according to an example.

[0015] Figure 6 is a perspective view of a sampling head with a cover opened, according to an example.

[0016] Figure 7 is a perspective view of a sampling head with a cover opened, according to an example.

[0017] Figure 8 is a cutaway view of a sampling head attached to a pivoting head of a main unit, according to an example.

[0018] Figure 9 is a cutaway view of a sampling head attached to a pivoting head of a main unit, according to an example.

[0019] Figure 10 is a cutaway view of a sampling head, according to an example.

[0020] Figure 11 is a perspective view of a sampling head, according to an example.

[0021] Figure 12 is a cross section view of a sampling head, according to an example.

[0022] Figure 13 is a block diagram of a method, according to an example.DETAILED DESCRIPTION

[0023] A need exists for a sampling instrument that is less invasive and less timeconsuming to use for security screening. Accordingly, this disclosure includes a sampling instrument that includes a sampling head. The sampling head has structural features that facilitate more efficient collection of solid and vapor particles from a sample such as clothing or luggage, for later material characterization analysis. The sampling head includes a suction inlet and one or more first outlets on a first side of the suction inlet. The one or more first outlets are elongated along a first axis. The sampling head also includes one or more second outlets on a second side of the suction inlet opposite the first side. The one or more second outlets are elongated along a second axis that forms an angle with the first axis that is greater than 1 degree and less than 120 degrees. The sampling head also includes a notch configured to receive a filter cartridge including a filter such that the filter is aligned with the suction inlet. The sampling head also includes a main unit that includes an impeller. The impeller is configured to perform functions when the sampling head is attached to the main unit and the filter cartridge is positioned in the notch. The actions include moving first air through the one or more first outlets and against a sample, moving second air through the one or more second outlets and against the sample, and moving third air from the sample through the suction inlet and the filter. The relative positions and orientations of the one or more first outlets and the one or more second outlets create a “reverse plow” formation of air jets that can help dislodge solid or vapor particles of interest from a sample under test for collection and detection. Thesuction inlet is positioned to direct the airflow, and consequently, the particles from the sample to the filter.

[0024] A method of using the sampling instrument includes the impeller expelling the first air out of the one or more first outlets against the sample, thereby dislodging first particles from the sample. For example, the impeller pushes the first air out of the one or more first outlets against a sample such as clothing worn by a person, the person’s luggage, or contents of the person’s luggage. Concurrent with expelling the first air, the impeller expels the second air out of the one or more second outlets, thereby dislodging second particles from the sample. That is, the impeller expels air from the one or more first outlets and from the one or more second outlets on opposite sides of the suction inlet such that the air flows against the sample under test. In various examples, the air flowing against the sample dislodges benign particles such as skin cells or dirt. In other cases, particles of interest like gunpowder residue or vapor particles indicative of contraband are dislodged by the airflow. The impeller inhales air, and consequently the first particles dislodged by air flowing out of the one or more first outlets and the second particles dislodged by air flowing out of the one or more second outlets. The air and the particles are moved through the suction inlet and the filter. The filter captures the solid or vapor particles within the filter for later analysis by a mass spectrometer or chemical test strips, for example.

[0025] Figure 1 is an upright view of a sampling instrument 100. The sampling instrument 100 includes a sampling head 102 that is attachable to a main unit 120, for example via a twist and lock mechanism. The main unit 120 includes a handle 144 and a pivoting head 146. The sampling head 102 is attachable to the pivoting head 146 such that an angle 148 between the sampling head 102 and the handle 144 is adjustable between 180 degrees and 90 degrees. The sampling head 102 and the main unit 120 can be formed via any additive or subtractive manufacturing techniques.

[0026] Figure 2 is an inverted view of the sampling instrument 100 positioned to dislodge and collect solid or vapor particles from a sample 126. The battery of the sampling instrument 100 is omitted in Figure 2. The sample 126 can take the form of clothing worn by a person, the person’s luggage, or contents of the person’s luggage, for example. In many examples, the sample 126 is oriented substantially vertically and a user holds the sampling instrument 100 such that the sampling head 102 is oriented substantially horizontally to face the sample 126.

[0027] Figure 3 is a perspective view of the sampling head 102. The sampling head 102 includes a cover 134 and a base 132. The cover 134 includes a funnel surface 130 configuredto direct air into the suction inlet 104. Figure 3 shows an edge of a filter cartridge 200 extending from the sampling head 102 that is in the closed position.

[0028] Figure 4 is a front view of the sampling head 102. The sampling head 102 includes an outlet 106A on a first side 108 of the suction inlet 104. From the perspective of Figure 4, the outlet 106A is a narrow rectangular opening through which air can be expelled. The outlet 106Ais elongated along an axis 110A. Although the example shown in the Figures shows one outlet 106A, a plurality of outlets 106A could be substituted for the outlet 106A such that the plurality of outlets 106A form an elongated structure along the axis 110A. Thus, any mention of the outlet 106 A herein implicitly includes examples in which a plurality of outlets 106A are used.

[0029] The sampling head 102 includes an outlet 106B on a second side 111 of the suction inlet 104. From the perspective of Figure 4, the outlet 106B is a narrow rectangular opening through which air can be expelled. The outlet 106B is elongated along an axis HOB. Although the example shown in the Figures shows one outlet 106B, a plurality of outlets 106B could be substituted for the outlet 106B such that the plurality of outlets 106B form an elongated structure along the axis HOB. Thus, any mention of the outlet 106B herein implicitly includes examples in which a plurality of outlets 106B are used. The axis HOB forms an angle 112 with the axis 110A that is greater than 1 degree and less than 120 degrees, for example greater than or equal to 30 degrees and less than or equal to 60 degrees. The outlet 106A and the outlet 106B have ends 406 and ends 410. A distance 404 between the outlet 106A and the outlet 106B decreases from the ends 406 to the ends 410.

[0030] Figure 5 is a perspective view of the filter cartridge 200. The filter cartridge 200 includes a frame 202 and a filter 204 embedded within the frame 202. The filter 204 includes a fibrous or porous material such as a sintered stainless-steel mesh. The filter 204 can include a material with pore sizes ranging from 20 pm to 100 pm. The frame 202 is typically formed of polyether ether ketone, Polytetrafluoroethylene, or silicon.

[0031] Figure 6 is a perspective view of the sampling head 102 with the cover 134 opened with respect to the base 132 to expose a notch 114 within the base 132. The notch 114 is configured to receive the filter cartridge 200 such that the filter 204 is aligned with the filter inlet 136 and with the suction inlet 104 when the cover 134 is closed (as shown in Figure 7). The filter cartridge 200 can be flush with a main surface 139 of the base 132 when the filter cartridge 200 is placed in the notch 114. As shown, the suction inlet 104 is formed within the cover 134. The outlet 106B is formed within the base 132. Although the outlet 106A is obscured in Figure 6, the outlet 106A is also formed within the base 132. The base132 includes the filter inlet 136 that is aligned with the suction inlet 104 when the cover 134 is in a closed position with respect to the base 132 (see Figure 7). The base 132 and the cover 134 together form channels 138 configured to direct a portion of air flowing into the suction inlet 104 to bypass or go around the filter inlet 136 (z.e., the filter 204) and to redirect the air to the outlet 106A or the outlet 106B via an impeller housed in the main unit 120. The base 132 includes magnets 142A and the cover 134 includes magnets 142B. The base 132 and the cover 134 are configured to secure the filter cartridge 200 between the base 132 and the cover 134, within the notch 114, via magnetic attraction between the magnets 142A and the magnets 142B.

[0032] Figure 7 is a perspective view of the sampling head 102 with the cover 134 opened to expose the filter cartridge 200 within the notch 114. As shown, some of the channels 138 provide a bypass path for airflow that helps maintain necessary air pressure within the sampling instrument 200 that could otherwise be dissipated too much by the filter 204 if that were the exclusive path for reaching the impeller 122.

[0033] Figure 8 is a cutaway view of the sampling head 102 attached to the pivoting head 146 of the main unit 120. The pivoting head 146 of the main unit 120 houses the impeller 122 that is driven by an electric motor. Figure 8 shows the filter cartridge 200 held between the base 132 and the cover 134. Also shown in Figure 8 is a channel 128B that begins near the impeller 122 and is terminated by the outlet 106B. The channel 128B is formed within the base 132.

[0034] Figure 9 is a cutaway view of the sampling head 102 attached to the pivoting head 146 of the main unit 120. The filter cartridge 200 is held between the base 132 and the cover 134. Also shown in Figure 9 is a channel 128Athat begins near the impeller 122 and is terminated by the outlet 106A. The channel 128A is formed within the base 132.

[0035] Figure 10 is a cutaway view of the sampling head 102. The filter cartridge 200 is held between the base 132 and the cover 134. Also shown in Figure 10 is the channel 128A that is terminated by the outlet 106A.

[0036] Figure 11 is a perspective view of the sampling head 102.

[0037] Figure 12 is a cross section view of the sampling head 102. The channel 128A is configured to direct air 131 A from the suction inlet 104 to the outlet 106 A via the impeller 122. The air 131 A is at least partially made up of the air 131C that is drawn through the suction inlet 104 by the impeller 122. The channel 128B is configured to direct air 13 IB from the suction inlet 104 to the outlet 106B via the impeller 122. The air 13 IB is at least partially made up of the air 131C that is drawn through the suction inlet 104 by the impeller 122.

[0038] In operation, the sampling instrument 100 uses the impeller 122 to expel the air 131 A through the channel 128 A, out of the outlet 106 A, and against the sample 126, thereby dislodging first particles from the sample 126. Concurrently, the sampling instrument 100 uses the impeller 122 to expel the air 13 IB through the channel 128B, out of the outlet 106B, and against the sample 126, thereby dislodging second particles from the sample 126. The sampling instrument 100 also uses the impeller 122 to draw the air 131C, the first particles dislodged by the air 131 A, and the second particles dislodged by the air 13 IB through the suction inlet 104 and the filter 204, thereby capturing the first particles and the second particles within the filter 204. The particles are generally collected by the filter 204 without the sampling instrument 100 making contact with the sample 126. The filter cartridge 200 can be removed from the sampling instrument 100 and analyzed to determine the material composition of the particles captured by the filter 204.

[0039] A user of the sampling instrument 100 can enhance the particle collection efficiency of the sampling instrument 100 by using the sampling instrument 100 in a particular way. The user positions the sampling instrument 100 over the sample 126 such that the air 131 A and the air 13 IB from the top ends 406 of the outlet 106A and the outlet 106B impacts a particular position on the sample. Next, the user positions the sampling instrument 100 over the sample 126 such that the air 131 A and the air 13 IB from the bottom ends 410 of the outlet 106A and the outlet 106B impacts the particular position on the sample 126. This motion enhances the efficiency of the reverse plow configuration of the outlet 106 A and the outlet 106B.

[0040] Furthermore, the outlet 106 A and the outlet 106B are configured (e.g., angled) such that the air 131 A and the air 13 IB are directed toward each other, for example, at an angle 113 that is greater than 1 and less than 60 degrees, by further example, greater than or equal to 5 degrees and less than or equal to 20 degrees.

[0041] Figure 13 is a block diagram of a method 300. As shown in Figure 13, the method 300 includes one or more operations, functions, or actions as illustrated by blocks 302, 304, and 306. Although the blocks are illustrated in a sequential order, these blocks may also be performed in parallel, and / or in a different order than those described herein. Also, the various blocks may be combined into fewer blocks, divided into additional blocks, and / or removed based upon the desired implementation.

[0042] At block 302, the method 300 includes the impeller 122 expelling the air 131 A out of the one or more first outlets 106A against the sample 126, thereby dislodging first particlesfrom the sample 126. Functionality related to block 302 is described above with reference to Figure 12.

[0043] At block 304, the method 300 includes concurrent with expelling the air, the impeller 122 expelling the air 13 IB out of the one or more outlets 106B, thereby dislodging second particles from the sample 126. Functionality related to block 304 is described above with reference to Figure 12.

[0044] At block 306, the method 300 includes the impeller 122 drawing the air 131C, the first particles, and the second particles through the suction inlet 104 and the filter 204, thereby capturing the first particles and the second particles within the filter 204. Functionality related to block 306 is described above with reference to Figure 12.

[0045] ENUMERATED EXAMPLE EMBODIMENTS (EEEs)

[0046] EEE l is a sampling head configured for attachment to a main unit of a sampling instrument, the sampling head comprising: a suction inlet; one or more first outlets on a first side of the suction inlet, wherein the one or more first outlets are elongated along a first axis; one or more second outlets on a second side of the suction inlet opposite the first side, wherein the one or more second outlets are elongated along a second axis that forms an angle with the first axis that is greater than 1 degree and less than 120 degrees; and a notch configured to receive a filter cartridge comprising a filter such that the filter is aligned with the suction inlet; wherein when the sampling head is attached to the main unit and the filter cartridge is positioned in the notch: the one or more first outlets are configured to receive first air moved via an impeller contained in the main unit and direct the first air against a sample, the one or more second outlets are configured to receive second air moved via the impeller and direct the second air against the sample, and the suction inlet is configured to receive third air from the sample that is moved by the impeller through the suction inlet and the filter.

[0047] EEE 2 is the sampling head of EEE 1, wherein the angle is greater than or equal to 30 degrees and less than or equal to 60 degrees.

[0048] EEE 3 is the sampling head of any one of EEEs 1-2, wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other.

[0049] EEE 4 is the sampling head of any one of EEEs 1-3, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than 1 and less than 60 degrees.

[0050] EEE 5 is the sampling head of any one of EEEs 1-3, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than or equal to 5 degrees and less than or equal to 20 degrees.

[0051] EEE 6 is the sampling head of any one of EEEs 1-5, further comprising: a first channel configured to direct a first portion of the third air from the suction inlet to the one or more first outlets; and a second channel configured to direct a second portion of the third air from the suction inlet to the one or more second outlets.

[0052] EEE 7 is the sampling head of any one of EEEs 1-6, further comprising a funnel surface configured to direct the third air into the suction inlet.

[0053] EEE 8 is the sampling head of any one of EEEs 1-7, further comprising: a base; and a cover that is rotatably coupled to the base.

[0054] EEE 9 is the sampling head of EEE 8, wherein the one or more first outlets and the one or more second outlets are formed within the base.

[0055] EEE 10 is the sampling head of any one of EEEs 8-9, wherein the notch is formed within the base.

[0056] EEE 11 is the sampling head of any one of EEEs 8-10, wherein the suction inlet is formed in the cover.

[0057] EEE 12 is the sampling head of any one of EEEs 8-11, wherein the cover comprises a funnel surface configured to direct the third air into the suction inlet.

[0058] EEE 13 is the sampling head of any one of EEEs 8-12, wherein the base comprises a filter inlet that is aligned with the suction inlet when the cover is in a closed position with respect to the base.

[0059] EEE 14 is the sampling head of any one of EEEs 1-13, wherein the base and the cover form channels configured to direct a portion of the third air such that the portion of the third air bypasses the filter inlet and is directed to the one or more first outlets or the one or more second outlets.

[0060] EEE 15 is the sampling head of any one of EEEs 8-14, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover.

[0061] EEE 16 is the sampling head of any one of EEEs 8-15, wherein the base comprises a first magnet and the cover comprises a second magnet, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover via magnetic attraction between the first magnet and the second magnet.

[0062] EEE 17 is a sampling instrument comprising: a sampling head comprising: a suction inlet; one or more first outlets on a first side of the suction inlet, wherein the one or more first outlets are elongated along a first axis; one or more second outlets on a second side of the suction inlet opposite the first side, wherein the one or more second outlets are elongated along a second axis that forms an angle with the first axis that is greater than 1 degree and less than 120 degrees; and a notch configured to receive a filter cartridge comprising a filter such that the filter is aligned with the suction inlet; and a main unit comprising an impeller that is configured to, when the sampling head is attached to the main unit and the filter cartridge is positioned in the notch: move first air through the one or more first outlets and against a sample, move second air through the one or more second outlets and against the sample, and move third air from the sample through the suction inlet and the filter.

[0063] EEE 18 is the sampling instrument of claim 17, wherein the angle is greater than or equal to 30 degrees and less than or equal to 60 degrees.

[0064] EEE 19 is the sampling instrument of any one of EEEs 17-18, wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other.

[0065] EEE 20 is the sampling instrument of any one of EEEs 17-19, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than 1 and less than 60 degrees.

[0066] EEE 21 is the sampling instrument of any one of EEEs 17-19, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than or equal to 5 degrees and less than or equal to 20 degrees.

[0067] EEE 22 is the sampling instrument of any one of EEEs 17-21, wherein the sampling head comprises: a first channel configured to direct a first portion of the third air from the suction inlet to the one or more first outlets; and a second channel configured to direct a second portion of the third air from the suction inlet to the one or more second outlets.

[0068] EEE 23 is the sampling instrument of any one of EEEs 17-22, wherein the sampling head comprises a funnel surface configured to direct the third air into the suction inlet.

[0069] EEE 24 is the sampling instrument of any one of EEEs 17-23, wherein the sampling head further comprises: a base; and a cover that is rotatably coupled to the base.

[0070] EEE 25 is the sampling instrument of EEE 24, wherein the one or more first outlets and the one or more second outlets are formed within the base.

[0071] EEE 26 is the sampling instrument of any one of EEEs 24-25, wherein the notch is formed within the base.

[0072] EEE 27 is the sampling instrument of any one of EEEs 24-26, wherein the suction inlet is formed in the cover.

[0073] EEE 28 is the sampling instrument of any one of EEEs 24-27, wherein the cover further comprises a funnel surface configured to direct the third air into the suction inlet.

[0074] EEE 29 is the sampling instrument of any one of EEEs 24-28, wherein the base comprises a filter inlet that is aligned with the suction inlet when the cover is in a closed position with respect to the base.

[0075] EEE 30 is the sampling instrument of EEE 29, wherein the base and the cover form channels configured to direct a portion of the third air such that the portion of the third air bypasses the filter inlet and is directed to the one or more first outlets or the one or more second outlets.

[0076] EEE 31 is the sampling instrument of any one of EEEs 24-30, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover.

[0077] EEE 32 is the sampling instrument of any one of EEEs 24-31, wherein the base comprises a first magnet and the cover comprises a second magnet, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover via magnetic attraction between the first magnet and the second magnet.

[0078] EEE 33 is the sampling instrument of any one of EEEs 17-32, wherein the main unit comprises a handle and a pivoting head, wherein the sampling head is attachable to the pivoting head such that a second angle between the sampling head and the handle is adjustable.

[0079] EEE 34 is a filter cartridge comprising: a frame; and a filter embedded within the frame.

[0080] EEE 35 is the filter cartridge of EEE 34, wherein the filter comprises a fibrous or porous material.

[0081] EEE 36 is the filter cartridge of any one of EEEs 34-35, wherein the filter comprises a material with pore sizes ranging from 20 pm to 100 pm.

[0082] EEE 37 is the filter cartridge of any one of EEEs 34-36, wherein the frame is formed of polyether ether ketone, Polytetrafluoroethylene, or silicon.

[0083] EEE 38 is the filter cartridge of any one of EEEs 34-37, wherein the filter comprises a sintered stainless-steel mesh.

[0084] EEE 39 is a method of operating the sampling instrument of any one of EEEs 15- 33, the method comprising: expelling the first air out of the one or more first outlets against the sample, thereby dislodging first particles from the sample; concurrent with expelling the first air, expelling the second air out of the one or more second outlets, thereby dislodging second particles from the sample; and drawing the third air, the first particles, and the second particles through the suction inlet and the filter, thereby capturing the first particles and the second particles within the filter.

[0085] EEE 40 is the method of EEE 39, wherein capturing the first particles and the second particles is performed without the sampling instrument contacting the sample.

[0086] EEE 41 is the method of any one of EEEs 39-40, wherein a distance between the one or more first outlets and the one or more second outlets decreases from top to bottom, the method further comprising: positioning the sampling instrument over the sample such that the first air and the second air from top ends of the one or more first outlets and the one or more second outlets impacts a particular position on the sample; and thereafter positioning the instrument over the sample such that the first air and the second air from bottom ends of the one or more first outlets and the one or more second outlets impacts the particular position on the sample.

[0087] While various example aspects and example embodiments have been disclosed herein, other aspects and embodiments will be apparent to those skilled in the art. The various example aspects and example embodiments disclosed herein are for purposes of illustration and are not intended to be limiting, with the true scope and spirit being indicated by the following claims.

Claims

CLAIMSWhat is claimed is:

1. A sampling head configured for attachment to a main unit of a sampling instrument, the sampling head comprising: a suction inlet; one or more first outlets on a first side of the suction inlet, wherein the one or more first outlets are elongated along a first axis; one or more second outlets on a second side of the suction inlet opposite the first side, wherein the one or more second outlets are elongated along a second axis that forms an angle with the first axis that is greater than 1 degree and less than 120 degrees; and a notch configured to receive a filter cartridge comprising a filter such that the filter is aligned with the suction inlet; wherein when the sampling head is attached to the main unit and the filter cartridge is positioned in the notch: the one or more first outlets are configured to receive first air moved via an impeller contained in the main unit and direct the first air against a sample, the one or more second outlets are configured to receive second air moved via the impeller and direct the second air against the sample, and the suction inlet is configured to receive third air from the sample that is moved by the impeller through the suction inlet and the filter.

2. The sampling head of claim 1, wherein the angle is greater than or equal to 30 degrees and less than or equal to 60 degrees.

3. The sampling head of claim 1, wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other.

4. The sampling head of claim 1, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than 1 degree and less than 60 degrees.

5. The sampling head of claim 1, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than or equal to 5 degrees and less than or equal to 20 degrees.

6. The sampling head of claim 1, further comprising: a first channel configured to direct a first portion of the third air from the suction inlet to the one or more first outlets; and a second channel configured to direct a second portion of the third air from the suction inlet to the one or more second outlets.

7. The sampling head of claim 1, further comprising a funnel surface configured to direct the third air into the suction inlet.

8. The sampling head of claim 1, further comprising: a base; and a cover that is rotatably coupled to the base.

9. The sampling head of claim 8, wherein the one or more first outlets and the one or more second outlets are formed within the base.

10. The sampling head of claim 8, wherein the notch is formed within the base.

11. The sampling head of claim 8, wherein the suction inlet is formed in the cover.

12. The sampling head of claim 8, wherein the cover comprises a funnel surface configured to direct the third air into the suction inlet.

13. The sampling head of claim 8, wherein the base comprises a filter inlet that is aligned with the suction inlet when the cover is in a closed position with respect to the base.

14. The sampling head of claim 13, wherein the base and the cover form channels configured to direct a portion of the third air such that the portion of the third air bypasses thefilter inlet and is directed to the one or more first outlets or the one or more second outlets.

15. The sampling head of claim 8, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover.

16. The sampling head of claim 8, wherein the base comprises a first magnet and the cover comprises a second magnet, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover via magnetic attraction between the first magnet and the second magnet.

17. A sampling instrument comprising: a sampling head comprising: a suction inlet; one or more first outlets on a first side of the suction inlet, wherein the one or more first outlets are elongated along a first axis; one or more second outlets on a second side of the suction inlet opposite the first side, wherein the one or more second outlets are elongated along a second axis that forms an angle with the first axis that is greater than 1 degree and less than 120 degrees; and a notch configured to receive a filter cartridge comprising a filter such that the filter is aligned with the suction inlet; and a main unit comprising an impeller that is configured to, when the sampling head is attached to the main unit and the filter cartridge is positioned in the notch: move first air through the one or more first outlets and against a sample, move second air through the one or more second outlets and against the sample, and move third air from the sample through the suction inlet and the filter.

18. The sampling instrument of claim 17, wherein the angle is greater than or equal to 30 degrees and less than or equal to 60 degrees.

19. The sampling instrument of claim 17, wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other.

20. The sampling instrument of claim 17, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than 1 degree and less than 60 degrees.

21. The sampling instrument of claim 17, wherein the angle is a first angle, and wherein the one or more first outlets and the one or more second outlets are configured such that the first air and the second air are directed toward each other at a second angle that is greater than or equal to 5 degrees and less than or equal to 20 degrees.

22. The sampling instrument of claim 17, wherein the sampling head comprises: a first channel configured to direct a first portion of the third air from the suction inlet to the one or more first outlets; and a second channel configured to direct a second portion of the third air from the suction inlet to the one or more second outlets.

23. The sampling instrument of claim 17, wherein the sampling head comprises a funnel surface configured to direct the third air into the suction inlet.

24. The sampling instrument of claim 17, wherein the sampling head further comprises: a base; and a cover that is rotatably coupled to the base.

25. The sampling instrument of claim 24, wherein the one or more first outlets and the one or more second outlets are formed within the base.

26. The sampling instrument of claim 24, wherein the notch is formed within the base.

27. The sampling instrument of claim 24, wherein the suction inlet is formed in the cover.

28. The sampling instrument of claim 24, wherein the cover further comprises a funnel surface configured to direct the third air into the suction inlet.

29. The sampling instrument of claim 24, wherein the base comprises a filter inlet that is aligned with the suction inlet when the cover is in a closed position with respect to the base.

30. The sampling instrument of claim 29, wherein the base and the cover form channels configured to direct a portion of the third air such that the portion of the third air bypasses the filter inlet and is directed to the one or more first outlets or the one or more second outlets.

31. The sampling instrument of claim 24, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover.

32. The sampling instrument of claim 24, wherein the base comprises a first magnet and the cover comprises a second magnet, wherein the base and the cover are configured to secure the filter cartridge between the base and the cover via magnetic attraction between the first magnet and the second magnet.

33. The sampling instrument of claim 17, wherein the main unit comprises a handle and a pivoting head, wherein the sampling head is attachable to the pivoting head such that a second angle between the sampling head and the handle is adjustable.

34. A filter cartridge comprising: a frame; and a filter embedded within the frame.

35. The filter cartridge of claim 34, wherein the filter comprises a fibrous or porous material.

36. The filter cartridge of claim 34, wherein the filter comprises a material with pore sizes ranging from 20 pm to 100 pm.

37. The filter cartridge of claim 34, wherein the frame is formed of polyether ether ketone, Polytetrafluoroethylene, or silicon.

38. The filter cartridge of claim 34, wherein the filter comprises a sintered stainless-steel mesh.

39. A method of operating the sampling instrument of claim 17, the method comprising: expelling the first air out of the one or more first outlets against the sample, thereby dislodging first particles from the sample; concurrent with expelling the first air, expelling the second air out of the one or more second outlets, thereby dislodging second particles from the sample; and drawing the third air, the first particles, and the second particles through the suction inlet and the filter, thereby capturing the first particles and the second particles within the filter.

40. The method of claim 39, wherein capturing the first particles and the second particles is performed without the sampling instrument contacting the sample.

41. The method of claim 39, wherein a distance between the one or more first outlets and the one or more second outlets decreases from top to bottom, the method further comprising: positioning the sampling instrument over the sample such that the first air and the second air from top ends of the one or more first outlets and the one or more second outlets impacts a particular position on the sample; and thereafter positioning the instrument over the sample such that the first air and the second air from bottom ends of the one or more first outlets and the one or more second outlets impacts the particular position on the sample.

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