Voltage ratio over-range self-calibration method, computer device, and storage medium

Abstract

The present invention relates to a voltage ratio over-range self-calibration method, a computer device, and a storage medium. The method can be used for calibrating a voltage ratio measurement error of a voltage ratio instrument, wherein the voltage ratio instrument is provided with a multi-gear voltage source, which is capable of simultaneously outputting at least two voltage signals, a measurement circuit, which is coupled to output channels of the two voltage signals, and a microprocessor.

Description

Voltage ratio over-range self-calibration method, computer device and storage medium Technical Field

[0001] The present application relates to the field of electrical measurement, and more particularly to a voltage ratio over-range self-calibration method, a computer device, and a storage medium. Background Art

[0002] Voltage ratiometric devices are a crucial piece of equipment in the field of electrical measurement. For example, the accuracy of voltage ratiometric devices is crucial. Current DC voltage ratiometric traceability methods generally employ differential measurement and voltage ratio methods. The differential measurement method traces the test object's value back to the standard by measuring the voltage across the differential bridge arm between the standard and the test object. This method can be categorized as either the compensation method or the difference method. The compensation method connects a compensation power supply and a nulling device in series with the differential bridge arm. The nulling device is manually adjusted to zero by the compensation power supply, and the voltage across the differential bridge arm is measured. The difference method connects a voltmeter in series with the differential bridge arm, directly measuring the voltage across the differential bridge arm. However, in precision measurement, the nulling device used in the compensation method is highly sensitive, making it susceptible to interference from manual adjustments and other artifacts, which can affect traceability accuracy. In the difference method, the differential current flowing through the differential bridge arm significantly impacts traceability accuracy. Therefore, neither the compensation nor the difference method is suitable for high-precision DC voltage ratiometric traceability. The voltage ratio method traces the value of the test object back to the standard by directly measuring the output voltage of the standard and the test object. Since the input impedance of the digital voltmeter will affect the voltage divider ratio of the standard or the test object, and the two digital voltmeters measuring the standard and the test object have different measurement system errors, the final value traceability result of the voltage ratio method is less accurate and cannot meet the requirements in high-precision DC voltage ratio value traceability. In addition, the difference measurement method and voltage ratio method are generally used when the standard and the test object have analog output. With the development of digital technology, the output signals of many DC voltage ratio devices have been converted from analog signals to digital signals that comply with specific protocols. When tracing the value of such DC voltage ratio devices, the existing difference measurement method and voltage ratio method are not applicable.

[0003] One way to accurately measure the voltage ratio using digital technology is to use a resistance bridge measurement circuit to measure the resistance ratio. Figure 1 shows a circuit coupled to two resistors R in the prior art. s 104 and R x 106 is a schematic diagram of a resistance bridge measurement circuit 100. The resistance bridge measurement circuit 100 includes a current source 102, a switch 108, and a measurement circuit 101. The measurement circuit 101 may include an amplifier 110 and an analog-to-digital converter (ADC) 112. The resistor R s 104 is the standard or reference resistor, resistor R x 106 may be a sensor resistor Rx 106. Reference resistor R s 104 and sensor resistor R x 106 are connected in series. When the current source 102 provides current to the circuit, the current flows through the reference resistor R s 104 and sensor resistor Rx106. When current flows through each resistor R s 104 and R x When 106 is applied, a voltage is generated across each resistor that is proportional to the resistance of each resistor. Amplifier 110 and ADC 112 measure the voltage across each resistor in turn. For example, R s The voltage across 104 is U s , R x The voltage across 106 is U x Since only one voltage can be measured at a time, the switch 108 is set to connect the two resistors R s 104 and Rx106 are coupled between the amplifier 110 and ADC112. Once each resistor R is measured s 104 and R x The voltage across 106 can be converted into a voltage ratio, which corresponds to the resistance ratio: U x / U s =R x / R s .

[0004] The resistance ratio measurement method achieves relatively high measurement accuracy within a certain resistance ratio range. However, when the resistance ratio exceeds this range, the voltage ratio measurement accuracy deteriorates due to the over-range voltage ratio. Furthermore, due to the inherent characteristics of resistors, the accuracy of the resistance ratio measurement method is typically limited to one year, requiring regular resistor calibration to maintain measurement accuracy. However, resistor calibration requires specialized skills and is very time-consuming.

[0005] Therefore, a more accurate and efficient voltage ratio measurement calibration method is needed to meet the calibration accuracy and efficiency requirements required for voltage ratio value traceability.

[0006] Summary of the Invention

[0007] The present application aims to solve the problem that a voltage ratio instrument is difficult to calibrate accurately and efficiently when the voltage ratio exceeds the range.

[0008] According to a first aspect, an embodiment of the present application provides a voltage ratio overrange self-calibration method for calibrating the voltage ratio error of a voltage ratio meter. The voltage ratio meter has a multi-range voltage source capable of simultaneously outputting at least two voltage signals, a measurement circuit coupled to the output channels of the at least two voltage signals, and a microprocessor. The method includes: Step S1, making the voltage source output two voltage signals at each output range, and each voltage signal is respectively set to the range amplitude or the lower adjacent range amplitude, generating a same-range signal combination or an adjacent-range signal combination whose voltage ratio meets the linear range requirement of the measurement circuit; Step S2, for each group of same-range signal combinations and adjacent-range signal combinations, respectively measuring the two voltage signals of the same-range signal combination and the adjacent-range signal combination through the measurement circuit and obtaining their voltage ratio error values, and storing the voltage ratio error values in a memory as the same-range voltage ratio calibration parameters and the adjacent-range voltage ratio calibration parameters; Step S3, calling the same-range voltage ratio calibration parameters and the adjacent-range voltage ratio calibration parameters stored in the memory, calculating the cumulative error at a voltage ratio that spans more than two ranges compared with the basic range of the voltage source as the cross-range voltage ratio calibration parameter, and the cross-range voltage ratio calibration parameter includes the calibration parameter in the case where the voltage ratio exceeds the linear range of the measurement circuit; Step S4, storing the cross-range voltage ratio calibration parameter in the memory; Step S5, calling the same-range voltage ratio calibration parameters, the adjacent-range voltage ratio calibration parameters, and the cross-range voltage ratio calibration parameters stored in the memory to calibrate the voltage ratio meter.

[0009] According to a preferred embodiment of the first aspect of the present application, the voltage source is capable of outputting voltage signals of m ranges {U1, U2, … U i … U j … U m-1 , U m}, where m ≥ 3 and is an integer, 1 < i < j ≤ m and both i and j are integers. In Step S2, it is measured that each group of same-range signal combinations and adjacent-range signal combinations are respectively set to U1 / U1, U1 / U2, U2 / U1, U2 / U2, U2 / U3, U3 / U2, U3 / U3 … U i / U i , U i / U i+1 , U i+1 / U i , U i+1 / U i+1 … U m-1 / U m-1 , U m-1 / U m , U m / U m-1 , U m / Um The voltage ratio calibration parameters of the same gear and the voltage ratio calibration parameters of the adjacent gear k(U1,U1), k(U1,U2), k(U2,U1), k(U2,U2), k(U2,U3), k(U3,U2), k(U3,U3)…k(U i ,U i )、k(U i ,U i+1 )、k(U i+1 ,U i )、k(U i+1 ,U i+1 )…k(U m-1 ,U m-1 )、k(U m-1 ,U m )、k(U m ,U m-1 )、k(U m ,U m ).

[0010] According to a preferred embodiment of the first aspect of the present application, in step S3, the cross-gear voltage ratio calibration parameter can be calculated by formula (I) and formula (II) through the same-gear voltage ratio calibration parameter and the adjacent-gear voltage ratio calibration parameter, wherein the cross-gear voltage ratio calibration parameter includes the calibration parameter when the voltage ratio exceeds the range.

[0011] According to a preferred embodiment of the first aspect of the present application, the voltage amplitude ratio of adjacent gear ranges of the voltage source is in the range of 0.1 to 10, preferably in the range of 0.4 to 2.5.

[0012] According to a preferred embodiment of the first aspect of the present application, the measurement circuit includes a first measurement circuit and a second measurement circuit respectively coupled to the output channels of the two voltage signals, and the first measurement circuit and the second measurement circuit are both composed of an adjustable gain amplifier and an ADC.

[0013] According to a preferred embodiment of the first aspect of the present application, the ADCs used by the first measurement circuit and the second measurement circuit are substantially the same.

[0014] According to the second aspect, an embodiment of the present application provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, it implements any one of the methods provided in the embodiment of the first aspect of the present application.

[0015] According to a third aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the computer program implements any one of the methods provided in the embodiments according to the first aspect of the present application.

[0016] The voltage ratio over-range self-calibration method provided in this application can solve the calibration difficulties of voltage ratio instruments when the voltage ratio exceeds the linear error range. Compared with traditional calibration methods, the voltage ratio over-range self-calibration method provided in this application can improve calibration accuracy and save calibration time. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] One or more embodiments of the present application are exemplarily illustrated by corresponding drawings, which do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are represented as similar elements, and unless otherwise stated, the figures in the drawings do not constitute a scale limitation.

[0018] FIG1 is a schematic diagram of a resistance bridge measurement circuit in the prior art.

[0019] FIG2 is a schematic diagram of a voltage ratio measurement circuit suitable for applying a voltage ratio over-range self-calibration method according to an embodiment of the present application.

[0020] FIG3 is a block diagram of a system including a voltage ratio measurement circuit according to an embodiment of the present application.

[0021] FIG4 is a schematic diagram of an application environment of a voltage ratio over-range self-calibration method provided according to an embodiment of the present application.

[0022] FIG5 is a schematic diagram of a calibration environment for a voltage ratio over-range self-calibration method according to an embodiment of the present application.

[0023] FIG6 is a flowchart of a voltage ratio over-range self-calibration method provided according to an embodiment of the present application.

[0024] FIG7 is a matrix diagram of voltage ratio calibration parameters when the voltage ratio is in different range combinations according to the voltage ratio over-range self-calibration method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0026] It should be noted that, if there is no conflict, the various features in the embodiments of the present application can be combined with each other and are all within the scope of protection of the present application. In addition, although the functional modules are divided in the schematic diagram and the logical order is shown in the flow chart, in some cases, the steps shown or described can be performed in a different order than the module division in the schematic diagram or the order in the flow chart.

[0027] Unless otherwise defined, all technical and scientific terms used in this specification have the same meanings as those commonly understood by those skilled in the art to which this application belongs. The terms used in this specification are intended only to describe specific embodiments and are not intended to limit this application. The term "and / or" as used in this specification includes any and all combinations of one or more of the relevant listed items.

[0028] The following will be combined with the drawings of the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application, so that the purpose and advantages of the present application are more clearly understood. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments.

[0029] Referring to FIG2 , FIG2 is a schematic diagram of a voltage ratio measurement circuit 200 suitable for applying a voltage ratio over-range self-calibration method according to an embodiment of the present application. The voltage ratio measurement circuit 200 includes a voltage source 202, a first measurement circuit 201, and a second measurement circuit 203. The voltage source 202 includes at least two output channels CH1 and CH2, and the first measurement circuit 201 and the second measurement circuit 203 include corresponding input signal channels CH1 and CH2. A and CH B Voltage source 202 is configured to provide a voltage signal to first measurement circuit 201 and second measurement circuit 203. First measurement circuit 201 and second measurement circuit 203 are substantially identical circuits. Specifically, first measurement circuit 201 and second measurement circuit 203 include amplifiers 206 and 207, and ADCs 208 and 209, respectively. ADCs 208 and 209 are substantially identical. Amplifiers 206 and 207 are both adjustable-gain amplifiers, coupled to ADCs 208 and 209, respectively. First measurement circuit 201 and second measurement circuit 203 are electrically isolated from each other, for example, by an isolated power supply.

[0030] In one or more embodiments, the two output channels CH1 and CH2 of the voltage source 202 are based on the input signal channels CH1 and CH2 of the first measurement circuit 201 and the second measurement circuit 203. A and CH B The voltage signals U1 and U2 are simultaneously output according to the signal requirements. Amplifiers 206 and 207 each adjust their gain coefficients according to the instructions, amplifying the voltage signals U1 and U2 according to their respective gain coefficients. The voltage signals U1 and U2 are then converted into digital quantities via ADCs 208 and 209, respectively. In a microprocessor (not shown), the digital quantities converted by ADCs 208 and 209 can be expressed as a voltage ratio, which corresponds to the ratio of the voltage signals U1 and U2 output by the two output channels CH1 and CH2 of the voltage source 202.

[0031] Referring to FIG3 , FIG3 is a block diagram of a system 300 including a voltage ratio measurement circuit according to an embodiment of the present application. Components in system 300 of FIG3 similar to those in voltage ratio measurement circuit 200 of FIG2 operate in a similar manner. Therefore, for the sake of brevity, their structures and functions will not be described again. System 300 includes a microprocessor 310 coupled to two measurement circuits 320 and 322, a voltage source 340, and an interface 350 for externally controlling microprocessor 310. Measurement circuits 320 and 322 may include adjustable gain amplifiers and ADCs, and the ADCs of measurement circuits 320 and 322 are substantially identical. In some embodiments, measurement circuits 320 and 322 may be coupled to corresponding isolated power supplies 330 and 332. Isolated power supplies 330 and 332 may be used to power corresponding measurement circuits 320 and 322 when performing measurements. In particular, interface 350 can receive external instructions, enabling microprocessor 310 to control the ratio of the amplitudes of the voltage signals input from voltage source 340 to the input signal channels of measurement circuits 320 and 322. Microprocessor 310 can also be used to control the level of the voltage signal output by voltage source 340, and to obtain a voltage ratio from the voltage measurements made by measurement circuits 320 and 322, and further calculate a voltage ratio error.

[0032] Referring to Figure 4, Figure 4 is a schematic diagram of an application environment for a voltage ratio over-range self-calibration method provided according to an embodiment of the present application. In the application environment shown in Figure 4, the computer device can be a server, and its internal structure diagram can be as shown in Figure 4. The computer device includes a processor, a memory, an interface, and a database connected via a system bus. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and computer program in the non-volatile storage medium. The database of the computer device is used to store data for the voltage ratio over-range self-calibration method. The interface of the computer device is used to communicate with an external terminal. When the computer program is executed by the processor, it can implement the voltage ratio over-range self-calibration method.

[0033] Referring to FIG. 5 , FIG. 5 is a schematic diagram illustrating a calibration environment for a voltage ratio over-range self-calibration method according to an embodiment of the present application. In the calibration environment shown in FIG. 5 , a computer device 500 executes the voltage ratio over-range self-calibration method described herein, thereby automatically calibrating a voltage ratio instrument. In the embodiment shown in FIG. 5 , the voltage ratio instrument is a voltage ratio analyzer 501 developed by the applicant. Computer device 500 is similar to the computer device shown in FIG. 4 above and will not be further described here.

[0034] Concept of the present invention

[0035] The basic principle of the present invention is based on an important discovery: when the ratio of the input voltage signals of the two measurement circuits shown in FIG2 is kept in the range of 0.1 to 10, preferably in the range of 0.4 to 2.5, the ADC of the measurement circuit can maintain good linearity. For the measurement circuit shown in FIG2, the nth level amplitude U of the voltage source can be set to n and the n+1th amplitude U n+1 The ratio between them is configured as 0.4 or 0.5. When the voltage source is set to output the nth voltage (amplitude is U n ), the output channels CH1 and CH2 of the voltage source can be controlled by instructions, so that the channel CH A The input signal value is equal to the nth level amplitude U of the voltage source n Or the n+1th amplitude U n+1 , and the measurement circuit channel CH B The input signal value is equal to the nth level amplitude U of the voltage source n Or the n+1th amplitude U n+1 , such a configuration makes U n+1 / U n or U n / U n+1 The ratio of the measurement circuit to maintain the voltage ratio is 1 (ie, U n / U n ) and the linearity error is very small.

[0036] Set channel CH A The input signal is represented by S A , channel CH B The input signal is represented as S B Signal S A The effective value is recorded as U A , signal S B The effective value is recorded as U B , signal S A 、S B The voltage ratio error between A ,U B As mentioned above, when the voltage source is set to output the nth voltage, the signal S A The effective value is set to the nth amplitude value U of the voltage source n Or equal to the voltage source n+1 level amplitude U n+1 The measured values ​​of the signal are expressed as S A (U n ) and S A (U n+1 ); Similarly, the signal S BThe effective value is set to the nth amplitude value U of the voltage source n Or the middle value U n+1 , the measured values ​​of the signal are expressed as S B (U n ) and S B (U n+1 ). When selecting the signal combination of adjacent gears, the channel signal combination (S A ,S B ) between the voltage ratio error k(U n ,U n )、k(U n ,U n+1 )、k(U n+1 ,U n )、k(U n+1 ,U n+1 ) forms a second-order matrix as shown in Table 1.

[0037] Table 1: Voltage ratio error matrix for channel signal combinations

[0038] k(U n ,U n ) can be calculated by formula (1):

[0039] k(U n ,U n )=S B (U n ) / S A (U n )-1; Formula (1)

[0040] k(U n+1 ,U n+1 ) can be calculated by formula (2):

[0041] k(U n+1 ,U n+1 )=S B (U n+1 ) / S A (U n+1 )-1; Formula (2)

[0042] k(U n ,U n+1 ) and k(U n+1 ,U n ) can be calculated by formula (3) and formula (4) respectively:

[0043] k(U n , U n+1 )=S B (Un+1 ) / [A * S A (U n ) - 1; Equation (3)

[0044] k(U n+1 , U n ) = A * S B (Un) / S A (U n+1 ) - 1; Equation (4)

[0045] Among them, the coefficient A related to the gain of the measurement circuit in Equation (3) and Equation (4) can be given by U n+1 / U n .

[0046] In actual operation, after measuring the voltage ratio errors k(U n , U n ), k(U[[ID=3३]] n )]], U n+1 ), k(U n+1 , U ' n ), k(U n+1 , U n+1 ) through the measurement circuit, the error values can be used as calibration parameters for instruments (such as voltage ratio analyzers) that measure voltage ratios. Assuming that the measurement circuit can maintain good linearity, when the voltage ratio between channel signals S A , S B exceeds the linear range (i.e., the voltage ratio is out of range), the calibration parameters in the case of voltage ratio out of range can be obtained by cumulatively calculating the voltage ratio errors within the linear range of the measurement circuit through a step-by-step tracing method.

[0047] The process of obtaining calibration parameters for voltage ratios spanning more than two ranges through cumulative calculation of voltage ratio errors is described below. Assume that the voltage source can output voltage signals of m levels {U1, U2,... U i ... U j ... U m-1 , U m}, where m ≥ 3 and is an integer, 1 < i < j ≤ m and both i and j are integers, and the voltage ratio of the amplitude between any adjacent i-th and (i + 1)-th ranges of the voltage source, U i / U i+1 or U i+1 / U i is within the linear range of the measurement circuit. First, measure the channel signal combination S A / S BWhen the signals are set to U1 / U1, U1 / U2, U2 / U1, U2 / U2, U2 / U3, U3 / U2, U3 / U3...U i / U i 、U i / U i+1 、U i+1 / U i 、U i+1 / U i+1 …U m-1 / U m-1 、U m-1 / U m 、U m / U m-1 、U m / U m The voltage ratio errors measured at the time are k(U1,U1), k(U1,U2), k(U2,U1), k(U2,U2), k(U2,U3), k(U3,U2), k(U3,U3)…k(U i ,U i )、k(U i ,U i+1 )、k(U i+1 ,U i )、k(U i+1 ,U i+1 )…k(U m-1 ,U m-1 )、k(U m-1 ,U m )、k(U m ,U m-1 )、k(U m ,U m ); then, the cumulative error when the voltage ratio spans more than 2 levels (up to m-1 levels) is calculated using the following formulas (I) and (II):

[0048] The cumulative error calculated by the above formula (I) and formula (II) when the voltage ratio spans more than two levels can be used as a calibration parameter when the voltage ratio exceeds the range.

[0049] For example, the voltage source is usually set to be able to output voltage signals of more than 5 levels, and the amplitude ratio between adjacent levels is usually set to 0.4 or 0.5. Typical voltage output levels are set to {5V, 2V, 1V, 500mV, 200mV, 100mV, 50mV}. If the channel signal combination S of the measurement circuit is A / S BThe voltage ratio between the maximum and minimum ranges is 5V / 50mV=100, which exceeds the linear range of the measurement circuit. In this case, the channel signal combination S A / S B The calibration parameters for the case where the voltage ratio exceeds the range to 5V / 5V, 5V / 2V, 2V / 1V, 1V / 500mV, 500mV / 200mV, 200mV / 100mV, and 100mV / 50mV are obtained by cumulative calculation of the voltage ratio errors measured.

[0050] FIG6 provides a flow chart of a voltage ratio over-range self-calibration method according to an embodiment of the present application, the method comprising: step S1, causing the voltage source to output two voltage signals at each output gear, each voltage signal being set to the gear amplitude or the lower adjacent gear amplitude, to generate a same-gear signal combination or an adjacent-gear signal combination whose voltage ratio meets the linear range requirement of the measurement circuit; step S2, for each group of same-gear signal combination and adjacent-gear signal combination, measuring the two voltage signals of the same-gear signal combination and the adjacent-gear signal combination by the measurement circuit and obtaining their voltage ratio error values, and storing the voltage ratio error values ​​in the memory as same-gear voltage ratio calibration values. The method comprises the following steps: step S1, wherein the calibration parameters of the same-gear voltage ratio and the adjacent-gear voltage ratio are called up in the memory, and the cumulative error of the voltage ratio spanning two or more gears compared with the basic gear of the voltage source is calculated as the cross-gear voltage ratio calibration parameter, and the cross-gear voltage ratio calibration parameter includes the calibration parameter when the voltage ratio exceeds the linear range of the measuring circuit; step S2, wherein the cross-gear voltage ratio calibration parameter is stored in the memory; step S3, wherein the calibration parameters of the same-gear voltage ratio and the adjacent-gear voltage ratio are called up in the memory to calibrate the voltage ratio meter.

[0051] Refer to Figure 7, which is a matrix diagram of voltage ratio calibration parameters under different voltage ratio range combinations according to the voltage ratio over-range self-calibration method provided by an embodiment of the present application. Wherein, m is the range number of the voltage source, m≥3 and m is an integer; U i is the voltage amplitude of the i-th range of the voltage source, 1≤i<m and i is an integer. A or S B Represents the channel CH in the measurement circuit shown in Figure 2 A or channel CH B The voltage ratio range combinations in the matrix diagram include the same range combination, adjacent range combination, and cross-range combination. The same range combination and adjacent range combination identified by the letter M in the matrix diagram represent the signal S A、S B The voltage ratio calibration parameter between is the parameter directly measured in the above step S2, that is, the same gear voltage ratio calibration parameter and the adjacent gear voltage ratio calibration parameter; the cross-gear range combination indicated by the letter C in the matrix diagram represents the signal S A 、S B The voltage ratio calibration parameter between is the parameter calculated according to formula (I) and formula (II) in the above step S3, that is, the cross-range voltage ratio calibration parameter. Among them, the cross-range combination includes the case where the voltage ratio exceeds the linear range of the measurement circuit error. The same-range voltage ratio calibration parameters, adjacent-range voltage ratio calibration parameters and cross-range voltage ratio calibration parameters listed in the matrix diagram in Figure 7 can be stored in the memory. When calibrating the voltage ratio meter, these voltage ratio calibration parameters stored in the memory can be called to achieve high-precision and efficient calibration.

[0052] Those skilled in the art will appreciate that all or part of the processes in the methods for implementing the above embodiments can be accomplished by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0053] The various technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the various technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0054] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Under the concept of the present application, the technical features in the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of the different aspects of the present application as described above, which are not provided in detail for the sake of simplicity. Although the present application has been described in detail with reference to the above embodiments, a person of ordinary skill in the art should understand that the technical solutions described in the above embodiments can still be modified, or some of the technical features can be replaced by equivalents. These modifications or replacements do not deviate from the essence of the corresponding technical solutions within the scope of the technical solutions of the embodiments of the present application. For a person of ordinary skill in the art, without departing from the concept of the present application, several variations and improvements can be made, which all fall within the scope of protection of the present application.

Claims

1. A voltage ratio over-range self-calibration method for calibrating the voltage ratio error of a voltage ratio meter, wherein: The voltage proportional meter has a multi-speed voltage source capable of simultaneously outputting two voltage signals, a measurement circuit coupled to the output channels of the two voltage signals, and a microprocessor, and is characterized in that the method comprises: Step S1, causing the voltage source to output two voltage signals at each output gear, each voltage signal being set to a gear amplitude or a lower adjacent gear amplitude, to generate a same-gear signal combination or an adjacent-gear signal combination whose voltage ratio meets the linear range requirement of the measurement circuit; Step S2, for each group of same-gear signal combination and adjacent-gear signal combination, respectively measure the two voltage signals of the signal combination through the measurement circuit and obtain the voltage ratio error value thereof, and store the voltage ratio error value in the memory as the same-gear voltage ratio calibration parameter and the adjacent-gear voltage ratio calibration parameter; Step S3, calling the same-gear voltage ratio calibration parameter and the adjacent-gear voltage ratio calibration parameter stored in the memory, and calculating the cumulative error under the voltage ratio spanning more than two gears compared with the basic gear of the voltage source as the cross-gear voltage ratio calibration parameter, wherein the cross-gear voltage ratio calibration parameter includes the calibration parameter when the voltage ratio exceeds the linear range of the measurement circuit; Step S4, storing the cross-gear voltage ratio calibration parameter in the memory; Step S5, calling the same-gear voltage ratio calibration parameters, adjacent-gear voltage ratio calibration parameters and inter-gear voltage ratio calibration parameters stored in the memory to calibrate the voltage ratio meter.

2. The voltage ratio over-range self-calibration method according to claim 1, characterized in that: The voltage source can output voltage signals of m levels {U1, U2, … U i … U j … U m-1 , U m}, where m ≥ 3 and is an integer, 1 < i < j ≤ m and both i and j are integers. In the step S2, each set of same-level signal combinations and adjacent-level signal combinations are respectively set as U1 / U1, U1 / U2, U2 / U1, U2 / U2, U2 / U3, U3 / U2, U3 / U3 … U i / U i , U i / U i+1 , U i+1 / U i , U i+1 / U i+1 … U m-1 / U m-1 , U m-1 / U m , U m / U m-1 , U m / U m When the same-level voltage ratio calibration parameters and adjacent-level voltage ratio calibration parameters k(U1, U1), k(U1, U2), k(U2, U1), k(U2, U2), k(U2, U3), k(U3, U2), k(U3, U3) … k(U i , U i ), k(U i , U i+1 ), k(U i+1 , U i ), k(U i+1 , U i+1 ), … k(U m-1 , U m-1 ), k(U m-1 , U m ), k(U m , U m-1 ), k(U m , U m ).

3. The voltage ratio over-range self-calibration method according to claim 2, characterized in that: In step S3, the cross-gear voltage ratio calibration parameter can be calculated by the same-gear voltage ratio calibration parameter and the adjacent-gear voltage ratio calibration parameter according to formula (I) and formula (II): The cross-gear voltage ratio calibration parameters include calibration parameters when the voltage ratio exceeds the range.

4. The voltage ratio over-range self-calibration method according to claim 1, characterized in that: The voltage amplitude ratio of adjacent gear ranges of the voltage source is in the range of 0.1 to 10.

5. The voltage ratio over-range self-calibration method according to claim 4, characterized in that: The voltage amplitude ratio of adjacent gear ranges of the voltage source is in the range of 0.4 to 2.

5.

6. The voltage ratio over-range self-calibration method according to claim 5, characterized in that: The voltage amplitude ratio of adjacent gear ranges of the voltage source is set to 0.4 or 0.

5.

7. The voltage ratio over-range self-calibration method according to claim 1, characterized in that: The measuring circuit comprises a first measuring circuit and a second measuring circuit respectively coupled to the output channels of the two voltage signals, and the first measuring circuit and the second measuring circuit are both composed of an adjustable gain amplifier and an ADC.

8. The voltage ratio over-range self-calibration method according to claim 1, characterized in that: The ADCs used by the first measurement circuit and the second measurement circuit are substantially the same.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the method according to any one of claims 1 to 8 is implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 8 is implemented.

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