Voltage conversion method and apparatus in analog circuit, electronic device and storage medium

Abstract

A voltage conversion method in an analog circuit provided by the present application comprises: obtaining time points corresponding to the time when a voltage source reaches a low threshold voltage and a high threshold voltage, respectively inserting calculation breakpoints, calculating a first voltage value, a second voltage value and a third voltage value on the basis of the calculation breakpoints when simulating the voltage source, and converting the first voltage value, the second voltage value and the third voltage value into digital signals. The present application solves the change of the voltage source on the basis of the calculation breakpoints, avoiding invalid calculation, and then improving the simulation speed and efficiency.

Description

Voltage conversion method, device, electronic device and storage medium in simulation circuit

[0001] This application claims priority to the Chinese patent application filed with the China Patent Office on December 28, 2023, with application number 2023118459694 and application name “Voltage conversion method, device, electronic device and storage medium in simulation circuit”, the entire contents of which are incorporated by reference into this application. Technical Field

[0002] The present application relates to the technical field of integrated circuit design, and in particular to a voltage conversion method, device, electronic device and storage medium in a simulation circuit. Background Art

[0003] With the continuous development of electronic circuit technology, integrated circuits have gained widespread application. Industrial production is placing increasingly stringent demands on the performance of electronic circuits, leading to ever-increasing scale and integration of integrated circuits. Simultaneously, within the electronic equipment sector, the proportion of hybrid integrated products is increasing year by year, along with the growing variety and demand for these products. The development of hybrid integrated products has made hybrid circuit simulation technology a highly active and popular topic in the current EDA field.

[0004] In current analog-digital hybrid simulations, the analog portion may contain a high-frequency PWL voltage source connected to the digital portion. In such cases, the simulator converts the voltage source's real-valued value into a digital signal. However, during the simulator's solution, the voltage source's voltage triggers digital changes when it reaches the low and high threshold voltages. This causes the simulator to reject the calculated result and re-solve the problem. This can significantly slow down the simulation for a high-frequency voltage source. Summary of the Invention

[0005] The present application provides a voltage conversion method, device, electronic device and storage medium in a simulation circuit, which can insert calculation breakpoints when the voltage source reaches a low threshold voltage and a high threshold voltage, thereby solving the changes in the voltage source based on the calculation breakpoints, avoiding invalid calculations, and thus improving the overall simulation speed and efficiency.

[0006] The present application provides a voltage conversion method in a simulation circuit, comprising:

[0007] During simulation of the mixed digital-analog circuit, obtaining a first time point corresponding to when the voltage source reaches a low threshold voltage and a second time point corresponding to when the voltage source reaches a high threshold voltage;

[0008] inserting calculation breakpoints at the first time point and the second time point respectively;

[0009] When simulating the voltage source, calculating a first voltage value, a second voltage value, and a third voltage value according to the calculation breakpoint;

[0010] The first voltage value, the second voltage value, and the third voltage value are respectively converted into digital signals.

[0011] Optionally, calculating the first voltage value, the second voltage value, and the third voltage value according to the calculation breakpoint includes:

[0012] Calculating a first voltage value of the voltage source from 0 to a low threshold voltage according to a first calculation breakpoint;

[0013] calculating a second voltage value of the voltage source from a low threshold voltage to a high threshold voltage according to the first calculation breakpoint and the second calculation breakpoint;

[0014] A third voltage value of the voltage source between the high threshold voltage and the maximum value is calculated according to the second calculation breakpoint.

[0015] Optionally, before obtaining the first time point and the second time point, the method further includes:

[0016] Determining whether the voltage source is a high-frequency linear voltage source;

[0017] If so, continue to execute the steps of obtaining the first time point and the second time point.

[0018] Optionally, obtaining a first time point corresponding to when the voltage source reaches a low threshold voltage and a second time point corresponding to when the voltage source reaches a high threshold voltage includes:

[0019] Obtaining a change slope of the high-frequency linear voltage source;

[0020] A first time point is calculated according to the change slope and the low threshold voltage, and a second time point is calculated according to the change slope and the high threshold voltage.

[0021] Optionally, converting the first voltage value, the second voltage value, and the third voltage value into digital signals respectively includes:

[0022] When the voltage value is less than or equal to the low threshold voltage, setting the digital signal value connected to the voltage source to 0;

[0023] When the voltage value is greater than or equal to the high threshold voltage, setting the digital signal value connected to the voltage source to 1;

[0024] When the voltage value is greater than the lower threshold voltage and less than the upper threshold voltage, the digital signal value connected to the voltage source is set to X, where X is a logical intermediate state.

[0025] The present application also provides a voltage conversion device in a simulation circuit, comprising:

[0026] an acquisition module, configured to acquire, during simulation of the digital-analog hybrid circuit, a first time point corresponding to when the voltage source reaches a low threshold voltage and a second time point corresponding to when the voltage source reaches a high threshold voltage;

[0027] An insertion module, configured to insert calculation breakpoints at the first time point and the second time point respectively;

[0028] a calculation module, configured to calculate a first voltage value, a second voltage value, and a third voltage value according to the calculation breakpoint when simulating the voltage source;

[0029] The conversion module is used to convert the first voltage value, the second voltage value and the third voltage value into digital signals respectively.

[0030] Optionally, the acquisition module includes:

[0031] An acquisition submodule is used to obtain the change slope of the high-frequency linear voltage source;

[0032] The first calculation submodule is configured to calculate a first time point according to the change slope and the low threshold voltage, and calculate a second time point according to the change slope and the high threshold voltage.

[0033] Optionally, the calculation module includes:

[0034] a second calculation submodule, configured to calculate a first voltage value of the voltage source from 0 to a low threshold voltage according to the first calculation breakpoint;

[0035] a third calculation submodule, configured to calculate a second voltage value of the voltage source from a low threshold voltage to a high threshold voltage according to the first calculation breakpoint and the second calculation breakpoint;

[0036] The fourth calculation submodule is configured to calculate a third voltage value of the voltage source between the high threshold voltage and the maximum value according to the second calculation breakpoint.

[0037] The present application also provides an electronic device, wherein the electronic device includes a memory and a processor, the memory stores a computer program, and the processor executes the steps of any voltage conversion method in the simulation circuit provided in the present application by calling the computer program stored in the memory.

[0038] The present application also provides a storage medium, wherein the storage medium stores a computer program, and the computer program is suitable for being loaded by a processor to execute the steps of any voltage conversion method in the simulation circuit provided in the present application.

[0039] The voltage conversion method in the simulation circuit provided by the present application can obtain a first time point corresponding to when a voltage source reaches a low threshold voltage and a second time point corresponding to when a voltage source reaches a high threshold voltage during the simulation of a mixed digital-analog circuit, insert calculation breakpoints at the first time point and the second time point, respectively, and calculate a first voltage value, a second voltage value, and a third voltage value according to the calculation breakpoints when simulating the voltage source, and convert the first voltage value, the second voltage value, and the third voltage value into digital signals, respectively. By inserting calculation breakpoints when the voltage source reaches the low threshold voltage and the high threshold voltage, the present application solves the change of the voltage source according to the calculation breakpoints, avoids invalid calculations, and thus improves the overall simulation speed and efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in this application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0041] FIG1 is a flow chart of a voltage conversion method in a simulation circuit provided by an embodiment of the present application;

[0042] FIG2 is another schematic flow chart of a voltage conversion method in a simulation circuit provided in an embodiment of the present application;

[0043] FIG3 is a schematic structural diagram of a voltage conversion device in a simulation circuit provided in an embodiment of the present application;

[0044] FIG4 is another structural diagram of a voltage conversion device in a simulation circuit provided in an embodiment of the present application;

[0045] FIG5 is a schematic structural diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0046] Exemplary embodiments will be described in detail herein, with examples illustrated in the accompanying drawings. In the following description, when referring to the drawings, identical numerals in different figures represent identical or similar elements, unless otherwise indicated. The embodiments described in the following exemplary embodiments are not intended to represent all embodiments consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present application, as detailed in the appended claims.

[0047] It should be noted that, in this document, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprising a ..." does not exclude the presence of other identical elements in the process, method, article or device comprising the element. In addition, components, features, and elements with the same name in different embodiments of the present application may have the same meaning or different meanings, and their specific meanings need to be determined by their explanation in the specific embodiment or further combined with the context of the specific embodiment.

[0048] It should be understood that, although the various steps in the flowchart in the embodiment of the present application are shown in sequence according to the indication of the arrows, these steps are not necessarily performed in sequence in the order indicated by the arrows. Unless clearly stated herein, the execution of these steps is not strictly limited in order, and they can be performed in other orders. Moreover, at least a portion of the steps in the figure may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily performed at the same time, but can be performed at different times, and their execution order is not necessarily performed in sequence, but can be performed in turn or alternately with at least a portion of other steps or sub-steps or stages of other steps.

[0049] It should be noted that in this article, step codes such as 101 and 102 are used for the purpose of expressing the corresponding content more clearly and concisely, and do not constitute a substantial limitation on the order. Those skilled in the art may execute 102 first and then 101, etc. during specific implementation, but these should all be within the scope of protection of this application.

[0050] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0051] An embodiment of the present application provides a voltage conversion method in a simulation circuit. The executor of the voltage conversion method in the simulation circuit can be a voltage conversion device in the simulation circuit provided in the embodiment of the present application, or a server integrating the voltage conversion device in the simulation circuit, wherein the voltage conversion device in the simulation circuit can be implemented in hardware or software.

[0052] As shown in FIG1 , FIG1 is a schematic diagram of a first flow chart of a voltage conversion method in a simulation circuit provided by an embodiment of the present application. The specific flow of the voltage conversion method in the simulation circuit may be as follows:

[0053] 101. During simulation of a mixed digital-analog circuit, obtain a first time point corresponding to when a voltage source reaches a low threshold voltage and a second time point corresponding to when a voltage source reaches a high threshold voltage.

[0054] Specifically, mixed-analog simulation combines analog and digital simulation methods for system- and circuit-level verification of entire electronic systems. It simulates the interaction between digital and analog signals, including factors such as clocking, data transmission, power supply, and noise. The basic process involves first determining system specifications and requirements, then designing a system simulation model, implementing and verifying the digital circuit design, implementing and verifying the analog circuit design, and then performing system-level simulation, optimizing, and iterating the design.

[0055] Among them, in the process of simulating the digital-analog mixed circuit, the simulator needs to solve the change of the voltage source of the analog part and then convert it into a digital signal. However, when it is for a piecewise linear voltage source, when the voltage source voltage rises from 0 to vdd (maximum value), it will pass through two points, vl (low threshold voltage) and vh (high threshold voltage). At this time, the simulator will first perform a round of solution from 0 to vdd, but because it is necessary to trigger digital changes when the voltage rises to vl, it will reject this result and perform a solution from 0 to vl. After that, another round of solution from vl to vdd will be performed. Because it is necessary to trigger digital changes when the voltage rises to vh, it will reject this result and perform a solution from vl to vh again, and finally perform a solution from vh to vdd again. The above steps require the simulator to solve 5 times, and two solution results will be rejected, resulting in a certain waste of computing resources and low efficiency. Therefore, in an embodiment of the present application, it is necessary to find in advance the first time point corresponding to when the voltage source reaches the low threshold voltage and the second time point corresponding to when it reaches the high threshold voltage, so as to directly control the simulator to solve from 0 to vl, from vl to vh, and finally from vh to vdd, thereby skipping the solution process that will trigger digital changes.

[0056] It should be noted that in the embodiments of this application, two conditions must be met: first, the voltage source must be a high-frequency PWL-type voltage source, and second, the voltage source must be directly connected to the digital module. That is, before obtaining the first and second time points, the method further includes determining whether the voltage source is a high-frequency linear voltage source directly connected to the digital module. If so, the steps of obtaining the first and second time points are continued. PWL stands for piece-wise linear, meaning a piecewise linear voltage source, a voltage source that uses point plotting to generate a waveform.

[0057] 102. Insert calculation breakpoints at a first time point and a second time point respectively.

[0058] In an embodiment of the present application, after obtaining the first time point corresponding to when the above-mentioned voltage source reaches the low threshold voltage and the second time point corresponding to when the voltage source reaches the high threshold voltage, calculation breakpoints can be directly inserted at the first time point and the second time point, so as to skip the solution process that will trigger digital changes.

[0059] 103. When simulating the voltage source, calculate a first voltage value, a second voltage value, and a third voltage value according to the calculation breakpoints.

[0060] In one embodiment, due to the insertion of calculation breakpoints at the first and second time points, when simulating the voltage source's transition from 0 to VDD, the simulator first solves for the transition from 0 to V1, then for the transition from V1 to VH, and finally for the transition from VH to VDD. This requires the simulator to perform these steps three times, without rejecting any results. Compared to a simulation without calculation breakpoints, the simulator skips two solution steps, significantly accelerating simulation efficiency and improving performance by approximately 40%.

[0061] 104. Convert the first voltage value, the second voltage value, and the third voltage value into digital signals respectively.

[0062] After obtaining the corresponding voltage through the three solution processes described above, it can be converted into a corresponding digital signal. Specifically, the digital signal can include multiple logical values, namely 0, 1, x, and z, where x represents the logical value of the intermediate state and z represents the logical value of the high-impedance state. After being converted into the above digital signal value, it is equivalent to converting the analog state into a digital state and passing it to the digital simulation part, which will further simulate based on the changes in the received value.

[0063] As described above, the voltage conversion method in the simulation circuit proposed in the embodiment of the present application can obtain a first time point corresponding to when the voltage source reaches a low threshold voltage and a second time point corresponding to when the voltage source reaches a high threshold voltage during the simulation of the digital-analog hybrid circuit, insert calculation breakpoints at the first time point and the second time point, respectively, and when simulating the voltage source, calculate the first voltage value, the second voltage value, and the third voltage value according to the calculation breakpoints, and convert the first voltage value, the second voltage value, and the third voltage value into digital signals respectively. The present application inserts calculation breakpoints when the voltage source reaches the low threshold voltage and the high threshold voltage, thereby solving the change of the voltage source according to the calculation breakpoints, avoiding invalid calculations, thereby improving the overall simulation speed and efficiency.

[0064] The method described in the above embodiment will be further described below.

[0065] Please refer to FIG2 , which is a second flow chart of a voltage conversion method in a simulation circuit provided by an embodiment of the present application. The method includes:

[0066] 201. In the process of simulating a mixed analog-digital circuit, obtain the changing slope of a high-frequency linear voltage source.

[0067] 202. Calculate a first time point according to the change slope and the low threshold voltage, and calculate a second time point according to the change slope and the high threshold voltage.

[0068] In one embodiment, two conditions need to be met in the embodiment of the present application. The first is that the voltage source is a high-frequency PWL type voltage source, and the second is that the voltage source needs to be directly connected to the digital module.

[0069] In the process of simulating a mixed digital-analog circuit, it is necessary to find in advance the first time point corresponding to when the voltage source reaches the low threshold voltage vl and the second time point corresponding to when it reaches the high threshold voltage vh. Since the above-mentioned voltage source is a linear voltage source, its slope change can be obtained, thereby calculating the time points corresponding to when the voltage reaches vl and vh.

[0070] 203. Insert a first calculation breakpoint and a second calculation breakpoint at a first time point and a second time point respectively.

[0071] In an embodiment of the present application, after obtaining the first time point corresponding to when the voltage source reaches the low threshold voltage and the second time point corresponding to when the voltage source reaches the high threshold voltage, calculation breakpoints can be directly inserted at the first time point and the second time point.

[0072] 204. When simulating the voltage source, calculate a first voltage value of the voltage source from 0 to a low threshold voltage according to the first calculation breakpoint.

[0073] 205. Calculate the second voltage value of the voltage source from the low threshold voltage to the high threshold voltage according to the first calculation breakpoint and the second calculation breakpoint.

[0074] 206. Calculate the third voltage value of the voltage source from the high threshold voltage to the maximum value according to the second calculation breakpoint.

[0075] When the voltage of the voltage source rises from 0 to vdd, it will pass through two points vl and vh in sequence. Due to the existence of the above two calculation breakpoints, the emulator will first perform a solution from 0 to vl, then perform another round of solution from vl to vh, and finally perform a solution from vh to vdd. The above steps require the emulator to solve 3 times, and there is no operation to reject the result.

[0076] 207. Convert the first voltage value, the second voltage value, and the third voltage value into digital signals respectively. In one embodiment, after obtaining the corresponding voltages through the above three solution processes, they can be converted into corresponding digital signals. Specifically, the above digital signals can include multiple logical values, namely 0, 1, x, and z, where x represents the logical value of the intermediate state, and z represents the logical value of the high-impedance state. Specifically, let the voltage value of the voltage source be v, the highest value be vdd, the high threshold voltage be vh, and the low threshold voltage be vl. Then when v <= vl, the digital signal value connected to the voltage source becomes 0; when v >= vh, the digital signal value connected to the voltage source becomes 1; when vl < v < vh, the digital signal becomes x. That is, the steps of converting the first voltage value, the second voltage value, and the third voltage value into digital signals respectively can include: when the voltage value is less than or equal to the low threshold voltage, set the digital signal value connected to the voltage source to 0; when the voltage value is greater than or equal to the high threshold voltage, set the digital signal value connected to the voltage source to 1; when the voltage value is greater than the low threshold voltage and less than the high threshold voltage, set the digital signal value connected to the voltage source to X, where X is the logical intermediate state.

[0077] As described above, the voltage conversion method in the simulation circuit proposed in the embodiment of the present application can obtain the change slope of the high-frequency linear voltage source during the simulation of the digital-analog hybrid circuit, calculate the first time point according to the change slope and the low threshold voltage, calculate the second time point according to the change slope and the high threshold voltage, insert the first calculation breakpoint and the second calculation breakpoint at the first time point and the second time point respectively, and when simulating the voltage source, calculate the first voltage value of the voltage source from 0 to the low threshold voltage according to the first calculation breakpoint, calculate the second voltage value of the voltage source from the low threshold voltage to the high threshold voltage according to the first calculation breakpoint and the second calculation breakpoint, and calculate the third voltage value of the voltage source from the high threshold voltage to the maximum value according to the second calculation breakpoint, and convert the first voltage value, the second voltage value and the third voltage value into digital signals respectively. The present application inserts calculation breakpoints when the voltage source reaches the low threshold voltage and the high threshold voltage, thereby solving the change of the voltage source according to the calculation breakpoints, avoiding invalid calculations, thereby improving the overall simulation speed and efficiency.

[0078] In order to implement the above method, an embodiment of the present application further provides a voltage conversion device in a simulation circuit. The voltage conversion device in the simulation circuit can be specifically integrated into a terminal device such as a mobile phone, a tablet computer, or the like.

[0079] For example, as shown in FIG3 , which is a schematic diagram of a first structure of a voltage conversion device in a simulation circuit provided by an embodiment of the present application, the voltage conversion device in the simulation circuit may include:

[0080] An acquisition module 301 is configured to acquire, during simulation of a mixed digital-analog circuit, a first time point corresponding to when a voltage source reaches a low threshold voltage and a second time point corresponding to when a voltage source reaches a high threshold voltage;

[0081] Inserting module 302, configured to insert calculation breakpoints at the first time point and the second time point respectively;

[0082] a calculation module 303, configured to calculate a first voltage value, a second voltage value, and a third voltage value according to the calculation breakpoint when simulating the voltage source;

[0083] The conversion module 304 is configured to convert the first voltage value, the second voltage value, and the third voltage value into digital signals respectively.

[0084] In one embodiment, please continue to refer to FIG. 4 , where the acquisition module 301 may specifically include:

[0085] An acquisition submodule 3011 is used to acquire a change slope of a high-frequency linear voltage source;

[0086] The first calculation submodule 3012 is configured to calculate a first time point according to the change slope and the low threshold voltage, and calculate a second time point according to the change slope and the high threshold voltage.

[0087] In one embodiment, the calculation module 303 may specifically include:

[0088] A second calculation submodule 3031 is configured to calculate a first voltage value of the voltage source from 0 to a low threshold voltage according to the first calculation breakpoint;

[0089] A third calculation submodule 3032 is configured to calculate a second voltage value of the voltage source from a low threshold voltage to a high threshold voltage according to the first calculation breakpoint and the second calculation breakpoint;

[0090] The fourth calculation submodule 3033 is configured to calculate a third voltage value of the voltage source between the high threshold voltage and the maximum value according to the second calculation breakpoint.

[0091] As can be seen from the above, the voltage conversion device in the simulation circuit proposed in the embodiment of the present application can obtain the first time point corresponding to when the voltage source reaches the low threshold voltage and the second time point corresponding to when the voltage source reaches the high threshold voltage during the simulation of the digital-analog mixed circuit, insert calculation breakpoints at the first time point and the second time point respectively, and when simulating the voltage source, calculate the first voltage value, the second voltage value, and the third voltage value according to the calculation breakpoints, and convert the first voltage value, the second voltage value, and the third voltage value into digital signals respectively. By inserting calculation breakpoints when the voltage source reaches the low threshold voltage and the high threshold voltage, the present application solves the change of the voltage source according to the calculation breakpoints, avoids invalid calculations, and thus improves the overall simulation speed and efficiency.

[0092] All of the above technical solutions can be combined in any way to form optional embodiments of the present application, and will not be described in detail here.

[0093] Those skilled in the art will appreciate that all or part of the steps in the various methods of the above embodiments may be accomplished by instructions, or by controlling related hardware through instructions. The instructions may be stored in a computer-readable storage medium and loaded and executed by a processor.

[0094] To this end, an embodiment of the present application provides a computer-readable storage medium storing a plurality of computer programs, which can be loaded by a processor to execute the steps of any of the voltage conversion methods in the simulation circuit provided in the embodiments of the present application. For example, the computer program can execute the following steps:

[0095] During simulation of the mixed digital-analog circuit, obtaining a first time point corresponding to when the voltage source reaches a low threshold voltage and a second time point corresponding to when the voltage source reaches a high threshold voltage;

[0096] inserting calculation breakpoints at the first time point and the second time point respectively;

[0097] When simulating the voltage source, calculating a first voltage value, a second voltage value, and a third voltage value according to the calculation breakpoint;

[0098] The first voltage value, the second voltage value, and the third voltage value are respectively converted into digital signals.

[0099] The specific implementation of the above operations can be found in the previous embodiments and will not be repeated here.

[0100] The storage medium may include a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0101] Since the computer program stored in the storage medium can execute the steps of the voltage conversion method in any simulation circuit provided in the embodiments of the present application, the beneficial effects that can be achieved by the voltage conversion method in any simulation circuit provided in the embodiments of the present application can be achieved. Please refer to the previous embodiments for details and will not be repeated here.

[0102] An embodiment of the present application also provides an electronic device, including a memory and a processor, wherein the memory is used to store a computer program, and the processor is used to call and run the computer program from the memory, so that the device equipped with the chip executes the methods in various possible implementation modes as described above.

[0103] For example, the computer device may be a terminal device with corresponding functions such as a mobile phone, a tablet computer, a personal computer, a cloud computer, etc. Please refer to Figure 5, which is a schematic diagram of the structure of a computer provided in an embodiment of the present application.

[0104] The computer device 400 may include components such as a memory 401 and a processor 402. Those skilled in the art will appreciate that the computer device structure shown in FIG5 does not limit the computer device, and may include more or fewer components than shown, or combine certain components, or arrange the components differently.

[0105] Memory 401 can be used to store applications and data. The applications stored in memory 401 include executable code. Applications can be composed of various functional modules. Processor 402 executes various functional applications and data processing by running the applications stored in memory 401.

[0106] The processor 402 is the control center of the computer device. It uses various interfaces and lines to connect the various parts of the entire computer device. By running or executing applications stored in the memory 401 and calling data stored in the memory 401, it performs various functions of the computer device and processes data, thereby monitoring the computer device as a whole.

[0107] In this embodiment, the processor 402 in the computer device loads the executable code corresponding to one or more application processes into the memory 401 according to the following instructions, and the processor 402 runs the application stored in the memory 401 to execute:

[0108] During simulation of the mixed digital-analog circuit, obtaining a first time point corresponding to when the voltage source reaches a low threshold voltage and a second time point corresponding to when the voltage source reaches a high threshold voltage;

[0109] inserting calculation breakpoints at the first time point and the second time point respectively;

[0110] When simulating the voltage source, calculating a first voltage value, a second voltage value, and a third voltage value according to the calculation breakpoint;

[0111] The first voltage value, the second voltage value, and the third voltage value are respectively converted into digital signals.

[0112] It is understood that the above scenarios are merely examples and do not limit the application scenarios of the technical solutions provided in the embodiments of this application. The technical solutions of this application can also be applied to other scenarios. For example, those skilled in the art will appreciate that with the evolution of system architecture and the emergence of new business scenarios, the technical solutions provided in the embodiments of this application will also be applicable to similar technical problems.

[0113] The steps in the method of the embodiment of the present application can be adjusted in order, combined, or deleted according to actual needs. The modules in the device of the embodiment of the present application can be combined, divided, or deleted according to actual needs.

[0114] In this application, the same or similar terminology, technical solutions and / or application scenario descriptions are generally only described in detail the first time they appear. When they appear again later, they are generally not repeated for the sake of brevity. When understanding the technical solutions and other contents of this application, for the same or similar terminology, technical solutions and / or application scenario descriptions that are not described in detail later, you can refer to the previous relevant detailed descriptions.

[0115] In this application, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, please refer to the relevant description of other embodiments.

[0116] The various technical features of the technical solution of this application can be combined arbitrarily. In order to make the description concise, not all possible combinations of the various technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0117] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When software is used for implementation, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function according to the embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from one website, computer, server or data center to another website, computer, server or data center via a wired (e.g., coaxial cable, optical fiber, digital subscriber line) or wireless (e.g., infrared, wireless, microwave, etc.) method. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrations. The available medium can be a magnetic medium (e.g., a floppy disk, a storage disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state storage disk).

[0118] The above is a detailed introduction to the voltage conversion method, device, electronic device and storage medium in a simulation circuit provided by the embodiments of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea; at the same time, for technical personnel in this field, based on the ideas of the present application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A voltage conversion method in a simulation circuit, wherein, Including: During the simulation of the analog-digital hybrid circuit, obtain the first time point corresponding to when the voltage source reaches the low threshold voltage and the second time point corresponding to when it reaches the high threshold voltage; Insert calculation breakpoints at the first time point and the second time point respectively; When simulating the voltage source, calculate the first voltage value, the second voltage value, and the third voltage value according to the calculation breakpoints; Convert the first voltage value, the second voltage value, and the third voltage value into digital signals respectively.

2. The voltage conversion method in the simulation circuit according to claim 1, wherein, Calculating the first voltage value, the second voltage value, and the third voltage value according to the calculation breakpoints includes: Calculating the first voltage value of the voltage source from 0 to the low threshold voltage according to the first calculation breakpoint; Calculating the second voltage value of the voltage source from the low threshold voltage to the high threshold voltage according to the first calculation breakpoint and the second calculation breakpoint; Calculating the third voltage value of the voltage source from the high threshold voltage to the maximum value according to the second calculation breakpoint.

3. The voltage conversion method in the simulation circuit according to claim 1, wherein, Before obtaining the first time point and the second time point, the method further includes: Determine whether the voltage source is not a high-frequency linear voltage source; If so, continue to execute the step of obtaining the first time point and the second time point.

4. The voltage conversion method in the simulation circuit according to claim 3, wherein, Obtaining the first time point corresponding to when the voltage source reaches the low threshold voltage and the second time point corresponding to when it reaches the high threshold voltage includes: Obtain the change slope of the high-frequency linear voltage source; Calculate the first time point according to the change slope and the low threshold voltage, and calculate the second time point according to the change slope and the high threshold voltage.

5. The voltage conversion method in the simulation circuit according to claim 1, wherein, Converting the first voltage value, the second voltage value, and the third voltage value into digital signals respectively includes: When the voltage value is less than or equal to the low threshold voltage, set the digital signal value connected to the voltage source to 0; When the voltage value is greater than or equal to the high threshold voltage, set the digital signal value connected to the voltage source to 1; When the voltage value is greater than the low threshold voltage and less than the high threshold voltage, set the digital signal value connected to the voltage source to X, where X is a logical intermediate state.

6. A voltage conversion device in a simulation circuit, wherein, Including: An acquisition module, configured to obtain the first time point corresponding to when the voltage source reaches the low threshold voltage and the second time point corresponding to when it reaches the high threshold voltage during the simulation of the analog-digital hybrid circuit; An insertion module, configured to insert calculation breakpoints at the first time point and the second time point respectively; A calculation module, configured to calculate the first voltage value, the second voltage value, and the third voltage value according to the calculation breakpoints when simulating the voltage source; A conversion module, configured to convert the first voltage value, the second voltage value, and the third voltage value into digital signals respectively.

7. The voltage conversion device in the simulation circuit as claimed in claim 6, wherein, The acquisition module includes: An acquisition sub-module, configured to obtain the change slope of the high-frequency linear voltage source; A first calculation sub-module, configured to calculate the first time point according to the change slope and the low threshold voltage, and calculate the second time point according to the change slope and the high threshold voltage.

8. The voltage conversion device in the simulation circuit as claimed in claim 6, wherein, The calculation module includes: A second calculation sub-module, configured to calculate the first voltage value of the voltage source from 0 to the low threshold voltage according to the first calculation breakpoint; A third calculation sub-module, configured to calculate a second voltage value of the voltage source from a low threshold voltage to a high threshold voltage according to a first calculation breakpoint and a second calculation breakpoint; A fourth calculation sub-module, configured to calculate a third voltage value of the voltage source from the high threshold voltage to the maximum value according to the second calculation breakpoint.

9. An electronic device, wherein, The electronic device includes a memory and a processor. A computer program is stored in the memory. The processor executes the steps in the voltage conversion method in the simulation circuit according to any one of claims 1-5 by calling the computer program stored in the memory.

10. A storage medium, wherein, The storage medium stores a computer program, and the computer program is suitable for being loaded by a processor to execute the steps in the voltage conversion method in the simulation circuit according to any one of claims 1-5.

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