Pre-combustion maintaining circuit, method and system for xenon lamp, and laser

The pre-ignition maintenance circuit, which uses an insulated gate bipolar transistor and a field effect transistor to work together, solves the problem of unstable xenon lamp startup, achieves stable startup and maintenance of the xenon lamp, and improves the reliability and stability of the laser.

WO2025200924A1PCT designated stage Publication Date: 2025-10-02SHANGHAI RAYKEEN LASER TECH CO LTD
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Patent Information

Application Number
PCT/CN2025/079571
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-03-29
Filing Date
2025-02-27
Publication Date
2025-10-02

AI Technical Summary

Technical Problem

Traditional laser xenon lamps are unstable when starting up and are easily damaged. In addition, the current change rate of the energy storage capacitor is too large during the initial discharge stage, resulting in unstable startup.

Method used

The pre-ignition maintenance circuit uses insulated gate bipolar transistor components and field effect tube components to work together. Through the voltage divider component and signal stabilization unit, it controls the current and voltage of the xenon lamp at different stages to ensure stable startup and maintenance.

Benefits of technology

The startup stability and safety of the xenon lamp are improved, the complexity of the circuit is reduced, and the reliability and stability of the laser are ensured.

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Abstract

The present application relates to a pre-combustion maintaining circuit, method and system for a xenon lamp, and a laser. The circuit comprises an insulated gate bipolar transistor element, a field effect transistor element, a voltage division assembly, and a signal stabilizing unit; a first end of the insulated gate bipolar transistor element is connected to one end of the voltage division assembly and is used for connecting a xenon lamp, a second end of the insulated gate bipolar transistor element is connected to one end of the signal stabilizing unit and is connected to a ground wire, and a third end of the insulated gate bipolar transistor element is used for inputting a pulse driving signal; the other end of the voltage division assembly is connected to a first end of the field effect transistor element; and a second end of the field effect transistor element is connected to the other end of the signal stabilizing unit and is used for outputting a detection signal for detecting whether the xenon lamp has been successfully started, and a third end of the field effect transistor element is used for inputting a driving signal. The use of the circuit can improve the stability of the pre-combustion maintaining process of the xenon lamp, improving the working stability of the laser.
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Description

Xenon lamp pre-ignition maintenance circuit, method, system and laser Technical Field

[0001] The present application relates to the field of laser technology, and in particular to a xenon lamp pre-ignition maintenance circuit, method, system and laser. Background Art

[0002] With the development of laser technology, solid-state lasers have emerged, such as YAG lasers. YAG lasers use xenon lamps as pump sources. When a large pulsed current flows through the xenon lamp, the working material of the YAG laser absorbs light energy and forms stimulated radiation, thereby emitting high-power lasers for laser therapy.

[0003] In traditional technology, the startup of the laser xenon lamp requires an additional power supply. Moreover, the rate of change of the current over time of the energy storage capacitor during the initial discharge phase of the xenon lamp is too large, which can easily lead to unstable startup of the xenon lamp and cause damage to the xenon lamp. Summary of the Invention

[0004] Based on this, it is necessary to provide a xenon lamp pre-ignition maintenance circuit, method, system and laser that can improve the starting stability of the xenon lamp in order to address the above technical problems.

[0005] In a first aspect, a xenon lamp pre-ignition maintenance circuit is provided, which includes an insulated gate bipolar transistor element, a field effect transistor element, a voltage divider component and a signal stabilization unit; wherein, the first end of the insulated gate bipolar transistor element is connected to one end of the voltage divider component and is used to connect to the xenon lamp, the second end of the insulated gate bipolar transistor element is connected to one end of the signal stabilization unit and is connected to a ground line, and the third end of the insulated gate bipolar transistor element is used to connect to a pulse drive signal; the other end of the voltage divider component is connected to the first end of the field effect transistor element; the second end of the field effect transistor element is connected to the other end of the signal stabilization unit and is used to connect to a detection signal for detecting whether the xenon lamp is successfully started, and the third end of the field effect transistor element is used to connect to the drive signal.

[0006] In some embodiments, the voltage dividing component includes a plurality of first resistance elements, and the plurality of first resistance elements are connected in series.

[0007] In some embodiments, the voltage dividing component further includes a fuse element, wherein the fuse element is connected in series with the plurality of first resistance elements.

[0008] In some embodiments, the signal stabilization unit includes a second resistor element and a voltage stabilizing element; wherein, one end of the second resistor element is connected to the second end of the field effect tube element and the negative electrode of the voltage stabilizing element, and is used to receive the detection signal; the other end of the second resistor element is connected to the positive electrode of the voltage stabilizing element and connected to the ground wire.

[0009] In some embodiments, the circuit also includes a pre-ignition success signal detection unit, which includes a third resistor element and a photoelectric coupling element; wherein one end of the third resistor element is connected to one end of the second resistor element, the second end of the field effect tube element and the negative electrode of the voltage stabilizing element; the other end of the third resistor element is connected to the first signal input end of the photoelectric coupling element; the first signal output end of the photoelectric coupling element is connected to the detection signal, the second signal input end of the photoelectric coupling element is grounded, and the second signal output end of the photoelectric coupling element is connected to the analog ground.

[0010] In some embodiments, the circuit further comprises a transistor element, wherein the positive electrode of the transistor element is connected to the first end of the insulated gate bipolar transistor element and is used to connect to one end of the xenon lamp, and the negative electrode of the transistor element is used to connect to the other end of the xenon lamp and to access the power supply voltage.

[0011] In some embodiments, the circuit further includes a driving unit connected to the third end of the field-effect transistor element; the driving unit is configured to apply a preset voltage to the field-effect transistor element before the xenon lamp pre-ignites, convert the preset voltage into a gate threshold voltage to drive the field-effect transistor element to conduct during the pre-ignition stage of the xenon lamp, and continue to maintain the conduction of the field-effect transistor element with the gate threshold voltage during the maintenance stage of the xenon lamp.

[0012] In a second aspect, a method for maintaining simmering of a xenon lamp is provided. The method is applied to the simmering maintenance circuit of the xenon lamp of any one or more embodiments of the first aspect. The method comprises:

[0013] Before the xenon lamp pre-ignites, a preset voltage is applied to the field effect tube component;

[0014] During the pre-ignition phase of the xenon lamp, a high-voltage trigger pulse is applied to the xenon lamp to break down the inert gas in the xenon lamp, and a pulse drive signal is connected to the third terminal of the insulated gate bipolar transistor element to intermittently turn on the insulated gate bipolar transistor element, and the preset voltage is converted into a gate threshold voltage to drive the field effect transistor element to turn on;

[0015] During the maintenance phase of the xenon lamp, the insulated gate bipolar transistor element is controlled to be non-conductive, and the field effect transistor element is continuously driven to be conductive by the gate threshold voltage; wherein the preset voltage is greater than the gate threshold voltage.

[0016] In a third aspect, a simmering maintenance system for a xenon lamp is provided, comprising a xenon lamp, a charging circuit, an energy storage capacitor matrix, a main discharge circuit, a high-voltage trigger circuit, and the simmering maintenance circuit of any one or more embodiments of the first aspect; wherein one end of the charging circuit is connected to one end of the energy storage capacitor matrix, and the other end of the charging circuit is used to connect to an AC power supply; the other end of the energy storage capacitor matrix is ​​connected to one end of the main discharge circuit, one end of the simmering maintenance circuit, and one end of the high-voltage trigger circuit; the other end of the main discharge circuit, the other end of the simmering maintenance circuit, and the other end of the high-voltage trigger circuit are connected to the xenon lamp.

[0017] According to a fourth aspect, a laser is provided, comprising the xenon lamp simmering maintenance system according to the third aspect.

[0018] The above-mentioned xenon lamp pre-ignition maintenance circuit, method, system and laser can use a simple structure to match the requirements of different stages in the pre-ignition and maintenance process of the xenon lamp by controlling the field effect tube elements and the insulated gate bipolar transistor elements to work together. It can improve the stability of the circuit and the safety of the xenon lamp during the pre-ignition and maintenance process of the xenon lamp, thereby reducing the complexity of the circuit while improving the stability of the circuit. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] FIG1 is a schematic diagram of the structure of a pre-ignition maintenance system for a xenon lamp in some embodiments;

[0020] FIG2 is a schematic diagram of a pre-ignition maintenance circuit for a xenon lamp in some embodiments;

[0021] FIG3 is a schematic structural diagram of a pre-ignition maintenance circuit of a xenon lamp in some other embodiments;

[0022] FIG4 is a schematic flow diagram of a method for maintaining pre-ignition of a xenon lamp in some embodiments;

[0023] FIG5 is a schematic diagram of a current path of a pre-ignition maintenance circuit of a xenon lamp during the ignition stage in some embodiments;

[0024] FIG6 is a schematic diagram of a current path of a simmering maintenance circuit of a xenon lamp during a maintenance phase in some embodiments. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0026] Below, the application scenario of the pre-ignition maintenance circuit of the xenon lamp involved in the present application is described. Referring to Figure 1, Figure 1 shows a structural schematic diagram of the pre-ignition maintenance system of the xenon lamp in some embodiments. The pre-ignition maintenance circuit 100 of the xenon lamp provided in the present application can be applied to the pre-ignition maintenance system shown in Figure 1.

[0027] Specifically, the simmer maintenance system includes a xenon lamp 600 , a charging circuit 200 , an energy storage capacitor matrix 300 , a main discharge circuit 400 , a high-voltage trigger circuit 500 , and a simmer maintenance circuit 100 .

[0028] Among them, one end of the charging circuit 200 is connected to one end of the energy storage capacitor matrix 300, and the other end of the charging circuit 200 is used to connect to an AC power supply; the other end of the energy storage capacitor matrix 300 is connected to one end of the main discharge circuit 400, one end of the simmering maintenance circuit 100, and one end of the high-voltage trigger circuit 500; the other end of the main discharge circuit 400, the other end of the simmering maintenance circuit 100, and the other end of the high-voltage trigger circuit 500 are connected to the xenon lamp 600.

[0029] The aforementioned xenon lamp simmering maintenance system charges the energy storage capacitor matrix 300 via an AC power supply and a charging circuit 200. When the xenon lamp 600 is activated, a high-voltage trigger pulse is applied to the xenon lamp 600 via a high-voltage trigger circuit 500, causing the inert gas within the xenon lamp 600 to break down. After the xenon lamp 600 switches from a non-conducting state to a conducting state, the simmering maintenance circuit 100 is provided. During the simmering process, the xenon lamp 600 ignition success rate is improved while preventing damage to the circuit caused by excessive initial discharge of the xenon lamp 600, thereby improving the reliability of the laser. Furthermore, the system maintains the xenon lamp 600 in a stable glow discharge state, i.e., a maintenance state, after simmering, thereby ensuring the subsequent normal operation of the laser. The advantages of this system are primarily reflected in the improvements to the xenon lamp simmering maintenance circuit 100. The xenon lamp simmering maintenance circuit 100 proposed in this application is described in detail below.

[0030] In some embodiments, the present application provides a xenon lamp simmer maintenance circuit. Referring to FIG2 , FIG2 shows a schematic structural diagram of a xenon lamp simmer maintenance circuit 100 in some embodiments. Specifically, the circuit may include: an insulated gate bipolar transistor element 10, a field effect transistor element 20, a voltage divider component 30, and a signal stabilization unit 40; wherein,

[0031] The first end 11 of the insulated gate bipolar transistor element 10 is connected to one end of the voltage divider component 30 and is used to connect to the xenon lamp 600. The second end 12 of the insulated gate bipolar transistor element is connected to one end of the signal stabilization unit and to the ground. The third end of the insulated gate bipolar transistor element 10 is used to connect to the pulse drive signal.

[0032] The other end of the voltage divider component 30 is connected to the first end 21 of the field effect transistor element 20;

[0033] The second end 22 of the field effect transistor element 20 is connected to the other end of the signal stabilization unit 40 and is used to receive a detection signal for detecting whether the xenon lamp is started successfully. The third end of the field effect transistor element 20 is used to receive a driving signal.

[0034] Among them, the insulated-gate bipolar transistor (IGBT) element 10 is a component with three terminals, namely the gate, the collector, and the emitter. In this embodiment, the first terminal 11 of the insulated-gate bipolar transistor element is configured as the collector and the second terminal 12 is configured as the emitter, or the first terminal 11 of the insulated-gate bipolar transistor element is configured as the emitter and the second terminal 12 is configured as the collector. The specific configuration can be adapted according to different IGBT types and different requirements, and is not limited here. The third terminal of the insulated-gate bipolar transistor element can be configured as a gate for receiving a pulse drive signal.

[0035] The field effect transistor (FET) element 20 may be a metal-oxide semiconductor FET (MOSFET). The FET element has three terminals: a gate, a drain, and a source. The first terminal 21 of the FET element 20 may be configured as a drain, and the second terminal 22 of the FET element 20 may be configured as a source. Alternatively, the first terminal 21 of the FET element may be configured as a source, and the second terminal 22 of the FET element may be configured as a drain. The specific configuration may be adapted to the type of FET element and the needs, and is not limited here. The third terminal of the FET element may be configured as a gate for receiving a drive signal.

[0036] More specifically, the voltage divider assembly 30 is used to achieve voltage division while the xenon lamp is pre-ignited, allowing it to maintain a glow discharge state after ignition, also known as the sustaining state, thereby improving the stability of the xenon lamp. The signal stabilization unit 40 is used to maintain and stabilize the incoming detection signal, making the received detection signal more stable. This allows for more accurate monitoring of the xenon lamp's startup status and more accurate determination of successful startup, thereby improving the stability of the laser.

[0037] For example, a single chip microcomputer can be used as a driving device to connect a driving voltage signal to the third terminal of the field effect transistor element. For example, the detection signal can be a voltage signal or a current signal.

[0038] The IGBT 10 and FET 20 work together to stabilize the xenon lamp during different stages of its startup. The specific method by which the IGBT 10 and FET 20 work together to achieve a stable circuit will be described below in conjunction with the xenon lamp pre-ignition maintenance method provided herein.

[0039] 2 and 3 , FIG3 shows a schematic structural diagram of a pre-ignition maintenance circuit for a xenon lamp in other embodiments.

[0040] In some embodiments, the voltage divider component 30 may include multiple first resistor elements 31 (e.g., R1 and R2 in FIG3 ), which may be connected in series. By connecting multiple resistors in series, the voltage can be evenly divided, reducing problems such as uneven heat dissipation caused by excessive power consumption of a single resistor, thereby further improving circuit stability.

[0041] In some embodiments, the voltage divider component 30 may further include a fuse component 32 , which may be a fuse for protecting the circuit in an emergency and improving the safety of the circuit.

[0042] In some embodiments, the signal stabilization unit 40 includes a second resistor 41 (R3) and a voltage-stabilizing element 42 (D3). One end of the second resistor 41 is connected to the second end 22 of the field-effect transistor 20 and the negative electrode of the voltage-stabilizing element 42, and is used to receive a detection signal. The other end of the second resistor 41 is connected to the positive electrode of the voltage-stabilizing element 42 and to ground. In this embodiment, the combination of the voltage-stabilizing element 42 and the second resistor 41 improves the stability of the voltage signal across the second resistor 41 due to the anti-interference and current-limiting properties of the voltage-stabilizing element 42. This improves the stability of the signal received from one end of the second resistor 41. Using this received signal as a detection signal can improve the accuracy of determining whether the xenon lamp has been successfully started.

[0043] In some embodiments, the circuit further includes a pre-ignition success signal detection unit 60, which includes a third resistor element 61 (R5) and a photoelectric coupling element 62 (U1). One end of the third resistor element 61 is connected to one end of the second resistor element 41, the second end 22 of the field effect transistor element 20, and the negative electrode of the voltage stabilizing element 42. The other end of the third resistor element 61 is connected to the first signal input end (pin 1) of the photoelectric coupling element 62. The first signal output end (pin 5) of the photoelectric coupling element 62 receives the detection signal, the second signal input end (pin 2) of the photoelectric coupling element 62 is grounded, and the second signal output end (pin 4) of the photoelectric coupling element 62 is connected to the analog ground line. In this embodiment, the photoelectric coupling element can perform photoelectric conversion on the received detection signal, thereby achieving signal detection.

[0044] In some embodiments, the circuit further includes a transistor element 51. The positive electrode of the transistor element 51 is connected to the first terminal 11 of the insulated gate bipolar transistor element 10 and is used to connect to one end of the xenon lamp 600. The negative electrode of the transistor element 51 is used to connect to the other end of the xenon lamp 600 and is used to receive a power supply voltage. In this embodiment, when the xenon lamp is broken down by a high-voltage trigger pulse output by the high-voltage trigger circuit, a very large current is generated. Under normal circumstances, after the insulated gate bipolar transistor element 10 is turned off, the transistor element 51 can release the current remaining in the parasitic inductance of the circuit. This current release can provide a freewheeling function, thereby protecting the insulated gate bipolar transistor element 10 and preventing damage to the insulated gate bipolar transistor element 10.

[0045] In some embodiments, the circuit further includes a driving unit 70, which is connected to the third end of the field-effect transistor element 20; the driving unit 70 is used to apply a preset voltage to the field-effect transistor element 20 before the xenon lamp 600 is started, convert the preset voltage into a gate threshold voltage to drive the field-effect transistor element 20 to conduct during the pre-ignition stage of the xenon lamp, and continue to maintain the conduction of the field-effect transistor element 20 with the gate threshold voltage during the maintenance stage of the xenon lamp 600.

[0046] In the following, in conjunction with a xenon lamp pre-ignition maintenance method provided in the present application, the states and cooperative working modes of the components of the pre-ignition maintenance circuit at different stages of the xenon lamp startup process are described in detail.

[0047] 4 , which shows a flow chart of a method for maintaining simmering of a xenon lamp in some embodiments. The method for maintaining simmering of a xenon lamp can be implemented based on the simmering circuit of the xenon lamp in any one or more of the above embodiments, and specifically may include the following steps:

[0048] S402: Before the xenon lamp pre-ignites, a preset voltage is applied to the field effect tube component.

[0049] Specifically, before the xenon lamp 600 pre-ignites, a preset voltage may be applied to the field effect tube element 20, and the preset voltage is greater than the U GS(th) —Gate threshold voltage. By applying a larger preset voltage to the field effect transistor element 20, it is possible to prepare for the pre-ignition of the xenon lamp in advance. Since the xenon lamp is easily extinguished at the moment of startup, applying a larger preset voltage in advance (the voltage divider of the field effect transistor element 20 is smaller at this time) can promote the formation of the circuit loop in the initial short time after the xenon lamp is started, thereby improving the success rate of the xenon lamp pre-ignition.

[0050] S404: In the pre-ignition stage of the xenon lamp, a high-voltage trigger pulse is applied to the xenon lamp to break down the inert gas in the xenon lamp, and a pulse drive signal is connected from the third terminal of the insulated gate bipolar transistor element to intermittently turn on the insulated gate bipolar transistor element, and a preset voltage is converted into a gate threshold voltage to drive the field effect transistor element to turn on; wherein the preset voltage is greater than the gate threshold voltage.

[0051] Specifically, referring to FIG5 , during the pre-ignition phase of the xenon lamp 600, a high-voltage trigger pulse is applied to the xenon lamp 600, causing the gas inside the lamp tube to begin ionizing, forming a narrow spark discharge channel. The inert gas inside the xenon lamp 600 is then broken down by the high voltage. At this point, the preset voltage applied to the field-effect transistor element 20 is converted into a gate threshold voltage to drive the field-effect transistor element into a slightly conductive state. In the slightly conductive state, the current flowing through the field-effect transistor element 20 is relatively small, and therefore, it will have a higher U GS Voltage is generated, thereby sharing the voltage of the xenon lamp circuit and limiting the lamp current. At the same time, a pulse drive signal (a high-voltage narrow pulse drive signal) with a pulse width less than a preset threshold is applied to the insulated gate bipolar transistor element 10 to drive it, causing it to intermittently conduct. Subsequently, the energy in the energy storage capacitor matrix 300 (i.e., the 800V power supply in Figure 5) is released to the xenon lamp 600 through the two circuit paths indicated by the arrows in Figure 5. That is, I3 represents the lamp current flowing through the xenon lamp, I1 is the current flowing through the field-effect transistor element 20, and I2 is the pulsed large current flowing through the insulated gate bipolar transistor element 10. During this process, the insulated gate bipolar transistor element 10 is intermittently conducted. Specifically, when the insulated gate bipolar transistor element 10 is conducted, the I1 path (point C1 to GND) is short-circuited and I1 is zero. When the insulated gate bipolar transistor element 10 is not conducted, I1 has a current value to maintain the ignition state of the xenon lamp and prevent it from going out. This state lasts for about one minute, allowing the electrical properties of the inert gas inside the xenon lamp to cross the unstable zone of drastic changes and reach a relatively stable range.

[0052] In some embodiments, if the xenon lamp pre-ignites successfully, a pre-ignition success signal can be obtained from the output side of the pre-ignition success signal detection unit, and the xenon lamp maintenance phase is entered; if the xenon lamp does not pre-ignite successfully, the previous pre-ignition phase process is repeated.

[0053] S406: During the maintenance phase of the xenon lamp, the insulated gate bipolar transistor element is controlled to be non-conductive, and the field effect transistor element is continued to be driven to be conductive by the gate threshold voltage.

[0054] Specifically, referring to FIG6 , FIG6 is a schematic diagram of the current path of the pre-ignition maintenance circuit of the xenon lamp in the maintenance stage in some embodiments. After the electrical characteristics of the inert gas inside the xenon lamp cross the unstable range of drastic changes and reach a relatively stable range, the insulated gate bipolar transistor element 10 can be controlled to be in a non-conducting state, and only the field effect transistor element 20 is kept in a state of conduction at the gate threshold voltage, that is, only I3=I1. Referring to the circuit path indicated by the arrow in FIG6 , the current in the circuit at this moment is the maintenance current, maintaining the xenon lamp in a stable glow discharge state, that is, the maintenance state.

[0055] The above-mentioned method for maintaining the pre-ignition of a xenon lamp is a non-steady-state gas discharge process, because the voltage and current at both ends of the xenon lamp undergo significant changes during the starting process. This causes the xenon lamp to be very easily extinguished immediately after ignition during pre-ignition. In this application, a field-effect transistor element 20 and an insulated gate bipolar transistor element 10 are used to control the pre-ignition circuit. That is, before pre-ignition, a preset voltage is applied to the field-effect transistor element 20. During pre-ignition, a high-voltage trigger pulse breaks down the inert gas in the xenon lamp, and a high-frequency narrow pulse drives the insulated gate bipolar transistor element 10 to intermittently conduct to provide current to start the xenon lamp. At the same time, the on-state voltage of the field-effect transistor element 20 is driven to the gate threshold voltage, causing it to operate in a slightly on state, with a high U GS The voltage is used to share the voltage of the lamp circuit to avoid excessive lamp current. Therefore, while ensuring the reliable ignition of the xenon lamp, it also limits the excessive current generated by the initial discharge of the xenon lamp, increasing the stability and reliability of the system. Furthermore, when the electrical characteristics of the inert gas inside the xenon lamp cross the unstable zone of drastic changes and reach a relatively stable range, it enters the maintenance stage, which can maintain the glow discharge state of the xenon lamp.

[0056] Therefore, the xenon lamp-based pre-ignition maintenance circuit 100 can adapt to the requirements of different stages (pre-ignition and maintenance stages) in the startup process of the xenon lamp 600 by controlling the coordinated action of the insulated gate bipolar transistor element 10 and the field effect transistor element 20 at different stages of the xenon lamp startup, that is, by driving the insulated gate bipolar transistor element 10 and the field effect transistor element 20 in different ways at different stages to work together. Therefore, a simple structure can be used to adapt to the requirements of different stages (pre-ignition and maintenance stages) in the startup process of the xenon lamp 600, thereby reducing the complexity of the circuit and improving the stability of the circuit.

[0057] In some embodiments, the present application further provides a laser, which may include the xenon lamp simmer maintenance system of any one or more of the above-mentioned embodiments. For a description of the laser, please refer to the detailed description of the xenon lamp simmer maintenance circuit, system, and method above, which will not be repeated here.

[0058] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0059] It should be noted that the terms "S402," "S404," "S406," etc. are used to distinguish steps and are not necessarily to be understood as implying that the method steps must be performed in a specific order or sequential sequence. In the above description, when referring to the accompanying drawings, unless otherwise indicated, identical numerals in different drawings represent identical or similar elements. In the present invention, "a plurality" includes two or more, unless otherwise indicated.

[0060] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art could make various modifications and improvements without departing from the spirit of the present application, all of which fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.

Claims

1. A xenon lamp pre-ignition maintenance circuit, the circuit comprising an insulated gate bipolar transistor element, a field effect transistor element, a voltage divider component and a signal stabilization unit; wherein, The first end of the insulated gate bipolar transistor element is connected to one end of the voltage divider component and is used to connect to the xenon lamp, the second end of the insulated gate bipolar transistor element is connected to one end of the signal stabilization unit and is connected to the ground line, and the third end of the insulated gate bipolar transistor element is used to connect to the pulse drive signal; The other end of the voltage divider component is connected to the first end of the field effect tube element; The second end of the field effect tube element is connected to the other end of the signal stabilization unit and is used to receive a detection signal for detecting whether the xenon lamp is started successfully. The third end of the field effect tube element is used to receive a driving signal.

2. The circuit according to claim 1, wherein: The voltage dividing component includes a plurality of first resistance elements, and the plurality of first resistance elements are connected in series.

3. The circuit according to claim 2, characterized in that The voltage dividing component further includes a fuse element, wherein the fuse element is connected in series with the plurality of first resistance elements.

4. The circuit according to claim 1, wherein: The signal stabilization unit includes a second resistance element and a voltage stabilization element; wherein, One end of the second resistor element is connected to the second end of the field effect transistor element and the negative electrode of the voltage stabilizing element, and is used to receive the detection signal; The other end of the second resistance element is connected to the positive electrode of the voltage stabilizing element and to the ground line.

5. The circuit according to claim 4, characterized in that The circuit further includes a pre-ignition success signal detection unit, which includes a third resistor element and a photoelectric coupling element; wherein, One end of the third resistor is connected to one end of the second resistor, the second end of the field effect transistor and the negative electrode of the voltage stabilizing element; The other end of the third resistor element is connected to the first signal input end of the photoelectric coupling element; The first signal output terminal of the photoelectric coupling element is connected to output the detection signal, the second signal input terminal of the photoelectric coupling element is grounded, and the second signal output terminal of the photoelectric coupling element is connected to an analog ground line.

6. The circuit according to claim 1, wherein: The circuit further includes a transistor element; wherein the positive electrode of the transistor element is connected to the first end of the insulated gate bipolar transistor element and is used to connect to one end of the xenon lamp, and the negative electrode of the transistor element is used to connect to the other end of the xenon lamp and is used to access the power supply voltage.

7. The circuit according to any one of claims 1 to 6, characterized in that The circuit further includes a driving unit connected to the third end of the field effect transistor element; The driving unit is used to apply a preset voltage to the field effect transistor element before the xenon lamp pre-ignites, convert the preset voltage into a gate threshold voltage to drive the field effect transistor element to conduct during the pre-ignition stage of the xenon lamp, and continue to maintain the conduction of the field effect transistor element with the gate threshold voltage during the maintenance stage of the xenon lamp.

8. A method for maintaining simmering of a xenon lamp, the method being applied to the simmering maintenance circuit of the xenon lamp according to any one of claims 1 to 7, the method comprising: Before the xenon lamp pre-ignites, applying a preset voltage to the field effect tube element; During the pre-ignition phase of the xenon lamp, a high-voltage trigger pulse is applied to the xenon lamp to break down the inert gas in the xenon lamp, a pulse drive signal is connected to the third terminal of the insulated gate bipolar transistor element to intermittently turn on the insulated gate bipolar transistor element, and the preset voltage is converted into a gate threshold voltage to drive the field effect transistor element to turn on; wherein the preset voltage is greater than the gate threshold voltage; During the maintenance phase of the xenon lamp, the insulated gate bipolar transistor element is controlled to be non-conductive, and the field effect transistor element is continuously driven to be conductive at the gate threshold voltage.

9. A xenon lamp simmer maintenance system, comprising a xenon lamp, a charging circuit, an energy storage capacitor matrix, a main discharge circuit, a high-voltage trigger circuit, and the simmer maintenance circuit according to any one of claims 1 to 7; wherein: One end of the charging circuit is connected to one end of the energy storage capacitor matrix, and the other end of the charging circuit is used to connect to an AC power supply; The other end of the energy storage capacitor matrix is ​​connected to one end of the main discharge circuit, one end of the pre-ignition maintenance circuit and one end of the high-voltage trigger circuit; The other end of the main discharge circuit, the other end of the pre-ignition maintenance circuit, and the other end of the high-voltage trigger circuit are connected to the xenon lamp. 10 . A laser comprising the xenon lamp simmering maintenance system according to claim 9 .

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