Method for diagnosing target device and electronic device for performing same

Abstract

Disclosed are an electronic device and a device diagnosis method, the electronic device comprising: a diagnosis result output circuit including a plurality of diagnosis circuits and a logic gate connected to output terminals of the plurality of diagnosis circuits; a memory storing instructions; and a processor connected to the memory, wherein the processor is configured to: apply a voltage to one ends of a plurality of diagnosis target devices included in the plurality of diagnosis circuits; and diagnose whether the plurality of diagnosis target devices operate normally on the basis of an output value of the diagnosis result output circuit, the output value generated by the logic gate on the basis of values received from the output terminals of the plurality of diagnosis circuits to which the voltage has been applied.

Description

Method for diagnosing target elements and electronic device for performing the same

[0001] The present disclosure relates to a method for diagnosing a target element and an electronic device performing the same.

[0002] Power conversion devices convert between DC and AC voltages, or between high and low voltages, to provide power for a variety of situations. If a fault occurs in the internal circuitry of a power conversion device during operation, overcurrent can cause damage to the device or even cause a fire. Therefore, various research efforts are underway to determine whether the internal components of a power conversion device are properly connected and operating, and to improve the stability and efficiency of the device.

[0003] The disclosed embodiments provide a method for diagnosing a target element and an electronic device for performing the same, wherein a voltage is applied to one end of a diagnostic circuit to which a target element is connected to determine whether it is operating normally, and a method for diagnosing whether the target element is operating normally based on a value generated through a logic gate based on an output value of the diagnostic circuit.

[0004] The technical task to be achieved by this embodiment is not limited to the technical task described above, and other technical tasks can be inferred from the following embodiments.

[0005] An electronic device according to one embodiment includes a diagnostic result output circuit including a plurality of diagnostic circuits and logic gates connected to output terminals of the plurality of diagnostic circuits; a memory storing instructions; and a processor connected to the memory, wherein the processor may be configured to apply a voltage to one terminal of a plurality of diagnostic target elements included in the plurality of diagnostic circuits, and diagnose whether the plurality of diagnostic target elements are operating normally based on an output value of the diagnostic result output circuit generated by the logic gate based on a value received from an output terminal of the plurality of diagnostic circuits to which the voltage is applied.

[0006] The processor may be configured to determine that the plurality of diagnostic target elements are operating normally when receiving a first value through an output terminal of the diagnostic result output circuit, and to determine that at least one of the plurality of diagnostic target elements is operating abnormally when receiving a second value through an output terminal of the diagnostic result output circuit.

[0007] The plurality of diagnostic circuits may include a first diagnostic circuit, and the first diagnostic circuit may include a first resistor connected to a first terminal of a first diagnostic target element; a second resistor connected to a second terminal of the first diagnostic target element; a third resistor connected to the first resistor; a fourth resistor connected to the second resistor; and a first comparator including a first input terminal connected to the third resistor, a second input terminal connected to the fourth resistor, and an output terminal.

[0008] The ratio of the third resistance to the sum of the first resistance and the third resistance may be greater than the ratio of the fourth resistance to the sum of the second resistance and the fourth resistance.

[0009] The first comparator can output a first value to the logic gate through the output terminal when the voltage applied to the first input terminal is greater than the voltage applied to the second input terminal, and can output a second value to the logic gate through the output terminal when the voltage applied to the first input terminal is less than the voltage applied to the second input terminal.

[0010] The plurality of diagnostic circuits include a second diagnostic circuit, and the second diagnostic circuit includes a fifth resistor connected to a first terminal of a second diagnostic target element; a sixth resistor connected to a second terminal of the second diagnostic target element; a seventh resistor connected to the fifth resistor; an eighth resistor connected to the sixth resistor; and a second comparator including a third input terminal connected to the seventh resistor, a fourth input terminal connected to the eighth resistor, and an output terminal, wherein a ratio of the seventh resistance to the sum of the fifth resistance and the seventh resistance may be greater than a ratio of the eighth resistance to the sum of the sixth resistance and the eighth resistance.

[0011] The logic gate is a logic gate including a plurality of input terminals and output terminals connected to output terminals of a plurality of diagnostic circuits, and the logic gate can apply a first value to the processor when all of the values ​​received from the output terminals of the plurality of diagnostic circuits are first values, and can apply a second value to the processor when at least one of the values ​​received from the output terminals of the plurality of diagnostic circuits is the second value.

[0012] Each of the above plurality of diagnostic target elements may be a switch or a fuse.

[0013] A method for diagnosing a target element performed by an electronic device according to one embodiment may include the steps of: applying a voltage to one terminal of a plurality of target elements for diagnosis included in a plurality of diagnostic circuits; and diagnosing whether the plurality of target elements for diagnosis are operating normally based on an output value of a diagnostic result output circuit generated by a logic gate based on a value received from an output terminal of the plurality of diagnostic circuits to which the voltage is applied.

[0014] Specific details of other embodiments are included in the detailed description and drawings.

[0015] According to the proposed embodiment, one or more of the following effects can be expected.

[0016] According to an embodiment of the present specification, in the process of determining whether a device connected to a power conversion device is operating normally, it is possible to confirm whether the device is operating normally using only a logic value generated through a logic gate without a direct comparison of voltage magnitudes.

[0017] In addition, according to the embodiment of the present specification, the operating status of a plurality of diagnostic target elements that are subject to diagnosis for normal operation can be confirmed in a more lightweight manner according to a change in a logic gate that generates a logic value.

[0018] The effects of the present disclosure are not limited to the effects mentioned above, and other effects not mentioned will be clearly understood by those skilled in the art from the description of the claims.

[0019] FIG. 1 is a block diagram showing the configuration of an electronic device according to one embodiment.

[0020] FIG. 2 is a drawing for explaining the configuration of a diagnostic circuit according to one embodiment.

[0021] FIG. 3 is a drawing for explaining the configuration of multiple diagnostic circuits according to one embodiment.

[0022] Figure 4 is a flowchart illustrating a method for diagnosing a target element according to one embodiment.

[0023] The terms used in the embodiments have been selected from widely used and common terms, taking into account the functions of the present disclosure. However, these terms may vary depending on the intentions of those skilled in the art, precedents, the emergence of new technologies, etc. Furthermore, in certain cases, terms may be arbitrarily selected by the applicant, in which case their meanings will be described in detail in the relevant description. Therefore, the terms used in this disclosure should not be defined simply as names of terms, but rather based on the meanings of the terms and the overall content of the present disclosure.

[0024] When a part of a specification is said to "include" a component, this does not mean that it excludes other components, but rather that it may include other components, unless otherwise stated.

[0025] The expression "at least one of a, b, and c" described throughout the specification may encompass 'a alone', 'b alone', 'c alone', 'a and b', 'a and c', 'b and c', or 'all of a, b, and c'.

[0026] The "terminal" mentioned below may be implemented as a computer or portable terminal capable of connecting to a server or other terminal via a network. Here, the computer includes, for example, a notebook, desktop, or laptop equipped with a web browser, and the portable terminal may include, for example, a wireless communication device that guarantees portability and mobility, such as a communication-based terminal such as IMT (International Mobile Telecommunication), CDMA (Code Division Multiple Access), W-CDMA (W-Code Division Multiple Access), LTE (Long Term Evolution), and all types of handheld-based wireless communication devices such as smartphones and tablet PCs.

[0027] Below, embodiments of the present disclosure are described in detail with reference to the attached drawings so that those skilled in the art can easily implement the present disclosure. However, the present disclosure may be implemented in various different forms and is not limited to the embodiments described herein.

[0028] Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings.

[0029] FIG. 1 is a block diagram showing the configuration of an electronic device according to one embodiment.

[0030] Referring to FIG. 1, an electronic device (100) according to an embodiment may be a device that configures and provides various pieces of information. The electronic device (100) may correspond to a power conversion device that converts electrical energy from one form to another. For example, the electronic device (100) may correspond to a rectifier that converts alternating current (AC) power into direct current (DC) power and converts household or industrial electricity into a form that can be used by electronic devices. For example, the electronic device (100) may correspond to an inverter that converts direct current (DC) power into alternating current (AC) power and converts DC power into AC power that can be used in homes or power grids. For example, the electronic device (100) may also correspond to a DC-DC converter that converts DC of one voltage level into another level so that it can be used in a battery management system and an electric vehicle. The electronic device (100) may provide a function to diagnose whether a device (200), which corresponds to a protection device such as a switch or a fuse, is operating normally before driving the power conversion device to determine whether the electrical connection between the input circuit and the output circuit, including the system and the battery, is in a normal state. In one embodiment, the electronic device (100) may determine whether the device (200) is operating normally based on a value received through a diagnostic circuit included in the electronic device (100), and the entire process of performing the diagnosis of the target device will be described in detail below. Here, the device (200) may correspond to a component that requires an operating state diagnosis, such as a switch (FET, TR, Relay) and a fuse.

[0031] An electronic device (100) according to an embodiment may include a diagnostic result output circuit (101), a memory (102), and a processor (103). The electronic device (100) illustrated in FIG. 1 only illustrates components related to the present embodiment. Therefore, it will be understood by those skilled in the art related to the present embodiment that other general components may be included in addition to the components illustrated in FIG. 1.

[0032] A diagnostic result output circuit (101) according to an embodiment may include a plurality of diagnostic circuits and logic gates connected to output terminals of the plurality of diagnostic circuits. The plurality of diagnostic circuits may include a first diagnostic circuit to which a first diagnostic target element is connected. In addition, the plurality of diagnostic circuits may include a second diagnostic circuit to which a second diagnostic target element is connected. The plurality of diagnostic circuits of the diagnostic result output circuit (101) may include an Nth diagnostic circuit (N is a natural number) connected in parallel to diagnose whether the plurality of diagnostic target elements are operating normally. The diagnostic result output circuit (101) according to an embodiment may include a logic gate that receives output values ​​of comparators included in each of the plurality of diagnostic circuits. Each of the plurality of diagnostic circuits included in the diagnostic result output circuit (101) according to an embodiment may include a diagnostic target element, a plurality of resistors, and a comparator, and may transmit an output value of the comparator to the logic gate. The logic gate can apply an output value to the processor (103) based on the output value of the first comparator and the output value of the second comparator of the second diagnosis circuit, and enable the processor (103) to determine whether the diagnosis target element is operating normally. Hereinafter, an embodiment of diagnosing the first diagnosis target element and the second diagnosis target element through the diagnosis result output circuit (101) will be described, but the embodiment according to the present disclosure is not limited to the mentioned case.

[0033] According to one embodiment, the memory (102) is hardware that stores various data processed within the electronic device (100). The memory (102) is located within the processor (103) of the electronic device (100) and can store data processed and data to be processed through the processor (103). In addition, the memory can store basic programming and data structures that can provide functions of at least one embodiment of the present disclosure, as well as applications (programs, code modules, instructions), drivers, etc. that can provide functions of the embodiments of the present disclosure. The memory may include random access memory (RAM) such as dynamic random access memory (DRAM), static random access memory (SRAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), CD-ROM, Blu-ray or other optical disk storage, hard disk drive (HDD), solid state drive (SSD), or flash memory, but is not limited to the specific cases mentioned in the embodiments according to the present disclosure.

[0034] In one embodiment, the processor (103) may control the overall operation of the electronic device (100) and process data and signals. The processor (103) may include an MCU IC (micro controller unit integrated circuit) of a power conversion device. The processor (103) may be composed of at least one hardware unit. In addition, the processor (103) may operate by one or more software modules generated by executing program codes stored in the memory (102). The processor (103) may include the memory (102), and the processor (103) may control the overall operation of the electronic device (100) and process data and signals by executing the program codes stored in the memory (102). That is, the processor (103) according to one embodiment may be set to apply voltage to one end of a plurality of diagnosis target elements included in the plurality of diagnosis circuits, and diagnose whether the plurality of diagnosis target elements are operating normally based on an output value of the diagnosis result output circuit generated by the logic gate based on a value received from an output end of the plurality of diagnosis circuits to which the voltage has been applied, which will be discussed in detail below.

[0035] The electronic device (100) according to the above-described embodiments may include a processor, a memory for storing and executing program data, permanent storage such as a disk drive, a communication port for communicating with an external device, a user interface device such as a touch panel, a key, a button, etc. Methods implemented as software modules or algorithms may be stored on a computer-readable recording medium as computer-readable codes or program commands executable on the processor. Here, the computer-readable recording medium includes a magnetic storage medium (e.g., read-only memory (ROM), random-access memory (RAM), floppy disk, hard disk, etc.) and an optical reading medium (e.g., CD-ROM, DVD: Digital Versatile Disc)). The computer-readable recording medium may be distributed to computer systems connected to a network, so that the computer-readable code may be stored and executed in a distributed manner. The medium may be readable by a computer, stored in a memory, and executed by a processor.

[0036] FIG. 2 is a drawing for explaining the configuration of a diagnostic circuit according to one embodiment.

[0037] Referring to FIG. 2, a first diagnostic circuit (210) included in a diagnostic result output circuit (200) according to an embodiment may be connected to a processor (103). The processor (103) may be configured to apply a voltage to one end (N1) of a first diagnostic target element (212) included in the first diagnostic circuit (210). In an embodiment, the voltage applied to the first diagnostic circuit (210) may correspond to a battery voltage of a power conversion device. The first diagnostic circuit (210) according to an embodiment may include a first diagnostic target element (212). The first diagnostic circuit (210) according to an embodiment may include a first circuit unit (219) including a first resistor (R1) connected to one end of the first diagnostic target element (212), a third resistor (R3) connected to one end of the first resistor (R1), and a first operational amplifier (215). The first operational amplifier (215) is driven by a Vcc voltage (e.g., 5 V) and may correspond to a buffer structure in which an input terminal and an output terminal are connected to each other. The first diagnostic circuit (210) according to one embodiment may include a second circuit unit (217) including a second resistor (R2) connected to another end of the first diagnostic target element (212), a fourth resistor (R4) connected to one end of the second resistor (R2), and a second operational amplifier (213). The second operational amplifier (213) may be driven by a Vcc voltage similarly to the first operational amplifier (215).

[0038] In one embodiment, the first diagnostic circuit (210) can transmit the output value of the first operational amplifier (215) of the first circuit unit (219) and the output value of the second operational amplifier (213) of the second circuit unit (217) to the processor (103). The processor (103) can perform calibration to accurately compare the magnitudes of the voltage values ​​received from each comparator, and can diagnose whether the first diagnostic target element (212) is operating normally. For example, the processor (103) can calibrate the voltage value received from the first operational amplifier (215) and the value received from the second operational amplifier (215) to compare the magnitudes of the respective voltage values. For example, when the first diagnostic target element (212) is operating normally, the output value of the first operational amplifier (215) and the output value of the second operational amplifier (213) can be transmitted to the processor (103) according to the size and ratio relationship of the first resistor (R1) to the fourth resistor (R4), and the processor (103) can compare the output value of the first operational amplifier (215) and the output value of the second operational amplifier (213) with a preset condition according to the size and ratio relationship of the first resistor (R1) to the fourth resistor (R4) to determine that the first diagnostic target element (212) is operating normally. For example, if the first diagnostic target element (212) is not operating normally (e.g., if the first diagnostic target element (212) is being operated in a closed state due to an internal disconnection of the first diagnostic target element (212), but in reality, the first diagnostic target element (212) is operating in an open state), no voltage will be applied to the first resistor (R1), so the processor (103) can determine that the first diagnostic target element (212) is not operating normally by applying an output value of the first operational amplifier (215) as 0 V.

[0039] Also, in the case of a second diagnostic circuit (220) that is connected in parallel with the first diagnostic circuit (210) and includes a diagnostic target element other than the other first diagnostic target element (212), the second diagnostic circuit (220) can apply at least two output values ​​to the processor (103) through at least two circuit sections, and the processor (103) can determine whether the diagnostic target element is operating normally, similarly to the case of the first diagnostic circuit (210).

[0040] FIG. 3 is a drawing for explaining the configuration of multiple diagnostic circuits according to one embodiment.

[0041] Referring to FIG. 3, a diagnostic result output circuit (300) according to one embodiment may include a plurality of diagnostic circuits (e.g., a first diagnostic circuit (310), a second diagnostic circuit (320)) and a logic gate (e.g., a logic gate (330)) connected to output terminals of the plurality of diagnostic circuits.

[0042] For example, a first diagnosis target element (312) may be connected to a first diagnosis circuit (310). The first diagnosis circuit (310) may include a first resistor (R1) connected to a first terminal (N11) of the first diagnosis target element (312). A battery voltage may be applied to the first terminal (N11) of the first diagnosis target element (312). The first diagnosis circuit (310) may include a second resistor (R2) connected to a second terminal (N12) of the first diagnosis target element (312), a third resistor (R3) connected to the first resistor (R1), and a fourth resistor (R4) connected to the second resistor (R2).

[0043] The first diagnostic circuit (310) may include a first comparator (313) including a first input terminal (313-1) connected to a fourth resistor (R4), a second input terminal (313-2) connected to a third resistor (R3), and an output terminal (313-3). In one embodiment, the first comparator (313) may be configured based on an OP-amp driven by a Vcc voltage (e.g., 5 V), and may be configured to input a signal voltage to be compared to an inverting terminal and a reference voltage to a non-inverting terminal, and output different logic values ​​based on a voltage difference between the signal voltage and the reference voltage. The description of the comparator in the present disclosure may also be applied equally below.

[0044] In one embodiment, the ratio of the fourth resistor (R4) to the sum of the second resistor (R2) and the fourth resistor (R4) may be greater than the ratio of the third resistor (R3) to the sum of the first resistor (R1) and the third resistor (R3). For example, when the first diagnostic target element (312) is operating normally, the voltage applied to the first terminal (N1) of the first diagnostic target element (312) in a closed state may also be applied to the second terminal (N2) of the first diagnostic target element (312). In this case, since the ratio of the fourth resistor (R4) to the sum of the second resistor (R2) and the fourth resistor (R4) is greater than the ratio of the third resistor (R3) to the sum of the first resistor (R1) and the third resistor (R3), the voltage input to the first comparator (313) through the first input terminal (313-1) connected to the fourth resistor (R4) may be greater than the voltage input to the first comparator (313) through the second input terminal (313-2) connected to the third resistor (R3). According to one embodiment, the first comparator (313) may output a first value (e.g., 1) to the output terminal (313-3) when the voltage applied to the first input terminal (313-1) is greater than the voltage applied to the second input terminal (313-2). According to one embodiment, the first comparator (313) may output a second value (e.g., 0) to the output terminal (313-3) when the voltage applied to the first input terminal (313-1) is lower than the voltage applied to the second input terminal (313-2). In this case, each of the first value and the second value output by the first comparator (313) may correspond to a logic value. In other words, when the first diagnostic target element (312) operates normally, the voltage applied to the first input terminal (313-1) is greater than the voltage applied to the second input terminal (313-2), and thus the first value may be output from the output terminal (313-3) of the first comparator (313).

[0045] For example, if the first diagnostic target element (312) is not operating normally (if the first diagnostic target element (212) is in a closed state due to an internal disconnection of the first diagnostic target element (212), but is actually operating in an open state), the voltage applied to the first terminal (N11) of the first diagnostic target element (312) in the closed state of the first diagnostic target element (312) may not be applied to the second terminal (N12) of the first diagnostic target element (312). In this case, the voltage input to the first comparator (313) through the first input terminal (313-1) connected to the fourth resistor (R4) may be lower than the voltage input to the first comparator (313) through the second input terminal (313-2) connected to the third resistor (R3). According to one embodiment, a second value can be output from the output terminal (313-3) of the first comparator (313).

[0046] A second diagnostic circuit (320) according to one embodiment may be connected to a second diagnostic target element (322). The second diagnostic circuit (320) may include a fifth resistor (R5) connected to a first terminal (N21) of the second diagnostic target element (322). A battery voltage may be applied to the first terminal (N21) of the second diagnostic target element (322). The second diagnostic circuit (320) may include a sixth resistor (R6) connected to a second terminal (N22) of the second diagnostic target element (322), a seventh resistor (R7) connected to the fifth resistor (R5), and an eighth resistor (R8) connected to the sixth resistor (R6). The second diagnostic circuit (320) may include a second comparator (323) including a first input terminal (323-1) connected to an eighth resistor (R8), a second input terminal (323-2) connected to a seventh resistor (R7), and an output terminal (323-3). In one embodiment, a ratio of the eighth resistor (R8) to the sum of the sixth resistor (R6) and the eighth resistor (R8) may be greater than a ratio of the seventh resistor (R7) to the sum of the fifth resistor (R5) and the seventh resistor (R7).

[0047] For example, when the second diagnostic target element (322) is operating normally, the voltage applied to the first terminal (N21) of the second diagnostic target element (322) may also be applied to the second terminal (N22) of the second diagnostic target element (322). In this case, the ratio of the eighth resistor (R8) to the sum of the sixth resistor (R6) and the eighth resistor (R8) is greater than the ratio of the seventh resistor (R7) to the sum of the fifth resistor (R5) and the seventh resistor (R7), so the voltage input to the second comparator (323) through the first input terminal (323-1) connected to the eighth resistor (R8) may be greater than the voltage input to the second comparator (323) through the second input terminal (323-2) connected to the seventh resistor (R3). According to one embodiment, the second comparator (323) may output a first value (e.g., 1) to the output terminal (323-3) when the voltage applied to the first input terminal (323-1) is greater than the voltage applied to the second input terminal (323-2), and may output a second value (e.g., 0) to the output terminal (323-3) when the voltage applied to the first input terminal (323-1) is less than the voltage applied to the second input terminal (323-2). In one embodiment, when the second diagnostic target element (322) operates normally, the voltage applied to the first input terminal (323-1) is greater than the voltage applied to the second input terminal (323-2), and thus the second value may be output from the output terminal (323-3) of the second comparator (323).

[0048] For example, when the second diagnostic target element (322) does not operate normally, the voltage applied to the first terminal (N21) of the second diagnostic target element (322) may not be applied to the second terminal (N22) of the second diagnostic target element (322). In this case, the voltage input to the second comparator (323) through the first input terminal (323-1) connected to the eighth resistor (R8) may be lower than the voltage input to the second comparator (323) through the second input terminal (323-2) connected to the seventh resistor (R7). In one embodiment, when the second diagnostic target element (322) does not operate normally, the voltage applied to the first input terminal (323-1) is lower than the voltage applied to the second input terminal (323-2), so that a second value may be output from the output terminal (323-3) of the second comparator (323).

[0049] A diagnostic result output circuit (101) according to one embodiment may further include a logic gate (330) including a plurality of input terminals (e.g., a first input terminal (330-1) and a second input terminal (330-2)) and an output terminal (e.g., an output terminal (330-3)) connected to output terminals (e.g., an output terminal (313-3) of a first comparator (313) and an output terminal (323-3) of a second comparator (323)) of a first diagnostic circuit (310), a second diagnostic circuit (320)). The logic gate (330) may correspond to an AND gate that outputs a first value only when two or more input signals are both first values. The logic gate (330) can apply a first value to the processor (103) through the output terminal (330-1) when the value received from the output terminal (313-3) of the first comparator (313) is a first value and the value received from the output terminal (323-3) of the second comparator (323) is the first value. The logic gate (330) can apply a second value to the processor (103) when at least one of the values ​​received from the output terminals of the plurality of diagnostic circuits is a second value. For example, when at least one of the values ​​received from the output terminal (313-3) of the first comparator (313) and the values ​​received from the output terminal (323-3) of the second comparator (323) is the second value, the logic gate (330) can apply the second value to the processor (103) through the output terminal (330-1).

[0050] According to one embodiment, the processor (103) may determine that both the first diagnostic target element (312) and the second diagnostic target element (322) are operating normally when the first value is applied through the output terminal (330-1) of the logic gate (330). According to one embodiment, the processor (103) may determine that at least one of the first diagnostic target element (312) and the second diagnostic target element (322) is in a faulty state that is not operating normally when the second value is applied through the output terminal (330-1) of the logic gate (330). In FIG. 4, the plurality of diagnostic target elements are illustrated as being the first diagnostic target element (312) and the second diagnostic target element (322), and the plurality of diagnostic circuits are illustrated as being the first diagnostic circuit (310) and the second diagnostic circuit (320), but the embodiment according to the present disclosure is not limited to this case, and the processor (103) according to one embodiment can perform diagnosis of the plurality of diagnostic target elements included in the plurality of diagnostic circuits connected in parallel to the logic gate (330) having the plurality of input terminals based on the output value of the logic gate (330) having the plurality of input terminals.

[0051] Figure 4 is a flowchart illustrating a method for diagnosing a target element according to one embodiment.

[0052] Referring to FIG. 4, an electronic device (100) according to an embodiment may apply a voltage to one end of a plurality of diagnostic target elements included in a plurality of diagnostic circuits in step S410. The electronic device (100) according to an embodiment may apply a voltage to one end of each of the diagnostic target elements of the plurality of diagnostic circuits included in a diagnostic result output circuit, for example, when all of the plurality of diagnostic target elements are closed. For example, the voltage applied by the electronic device (100) to one end of the plurality of diagnostic target elements may correspond to a battery voltage for driving the electronic device (100).

[0053] According to an embodiment, the electronic device (100) may diagnose whether a plurality of diagnosis target elements are operating normally based on the output values ​​of the diagnosis result output circuit generated by the logic gate in step S420. In an embodiment, the output values ​​of the diagnosis result output circuit generated by the logic gate may correspond to logic values ​​generated based on the output values ​​of the comparators of each diagnosis circuit included in the diagnosis result output circuit. According to an embodiment, when the electronic device (100) receives a first value through the output terminal of the diagnosis result output circuit, it may determine that the plurality of diagnosis target elements are operating normally. According to an embodiment, when the electronic device (100) receives a second value through the output terminal of the diagnosis result output circuit, it may determine that at least one of the plurality of diagnosis target elements is operating abnormally. According to an embodiment, when the electronic device (100) receives the first value from the diagnosis result output circuit, it may provide a notification that all of the plurality of diagnosis target elements are operating normally. When the electronic device (100) receives a second value from the diagnostic result output circuit, it can provide a notification that at least one of the plurality of diagnostic target elements is operating abnormally.

[0054] Meanwhile, the present specification and drawings disclose preferred embodiments of the present invention. Although specific terms have been used, they are used in a general sense only to easily explain the technical contents of the present invention and to assist in understanding the invention, and are not intended to limit the scope of the present invention. It will be apparent to those skilled in the art that other modified examples based on the technical concept of the present invention are possible in addition to the embodiments disclosed herein.

[0055] The present embodiment may be represented by functional block configurations and various processing steps. These functional blocks may be implemented by various hardware and / or software configurations that perform specific functions. For example, the embodiment may employ integrated circuit configurations such as memory, processing, logic, look-up tables, etc., which may perform various functions under the control of one or more microprocessors or other control devices. Similarly, the present embodiment may be implemented in a programming or scripting language such as C, C++, Java, assembler, Python, etc., including various algorithms implemented as a combination of data structures, processes, routines, or other programming configurations. Functional aspects may be implemented as algorithms that execute on one or more processors. Furthermore, the present embodiment may employ conventional techniques for electronic configuration, signal processing, and / or data processing. Terms such as "mechanism," "element," "means," and "composition" can be used broadly and are not limited to mechanical or physical structures. These terms can also encompass a series of software routines, such as those associated with a processor.

[0056] The above-described embodiments are merely examples, and other embodiments may be implemented within the scope of the claims set forth below.

Claims

1. In electronic devices, A diagnostic result output circuit including a plurality of diagnostic circuits and a logic gate connected to output terminals of the plurality of diagnostic circuits; memory for storing instructions; and comprising a processor connected to the above memory, The above processor, Applying voltage to one end of a plurality of diagnostic target elements included in the above plurality of diagnostic circuits, It is set to diagnose whether the plurality of diagnosis target elements are operating normally based on the output value of the diagnosis result output circuit generated by the logic gate based on the value received from the output terminal of the plurality of diagnosis circuits to which the voltage is applied. Electronic devices.

2. In paragraph 1, The above processor, When the first value is received through the output terminal of the above diagnostic result output circuit, it is determined that the plurality of diagnostic target elements are operating normally, When the second value is received through the output terminal of the above diagnostic result output circuit, it is set to determine that at least one of the plurality of diagnostic target elements is operating abnormally. Electronic devices.

3. In paragraph 1, The above multiple diagnostic circuits are, Includes a first diagnostic circuit, The above first diagnostic circuit, A first resistor connected to the first terminal of the first diagnostic target element; A second resistor connected to the second terminal of the first diagnostic target element; A third resistor connected to the first resistor; a fourth resistor connected to the second resistor; and A first comparator including a first input terminal connected to the third resistor, a second input terminal connected to the fourth resistor, and an output terminal, Electronic devices.

4. In paragraph 3, The ratio of the third resistance to the sum of the first resistance and the third resistance is, greater than the ratio of the fourth resistance to the sum of the second resistance and the fourth resistance, Electronic devices.

5. In paragraph 3, The above first comparator is, When the voltage applied to the first input terminal is greater than the voltage applied to the second input terminal, a first value is output to the logic gate through the output terminal, When the voltage applied to the first input terminal is less than the voltage applied to the second input terminal, a second value is output to the logic gate through the output terminal. Electronic devices.

6. In paragraph 1, The above multiple diagnostic circuits are, Includes a second diagnostic circuit, The above second diagnostic circuit, A fifth resistor connected to the first terminal of the second diagnostic target element; A sixth resistor connected to the second terminal of the second diagnostic target element; A seventh resistor connected to the fifth resistor; An eighth resistor connected to the sixth resistor; A second comparator including a third input terminal connected to the seventh resistor, a fourth input terminal connected to the eighth resistor, and an output terminal, The ratio of the seventh resistor to the sum of the fifth and seventh resistors is greater than the ratio of the eighth resistor to the sum of the sixth resistor and the eighth resistor, Electronic devices.

7. In paragraph 1, The above logic gates are, A logic gate including a plurality of input terminals and output terminals connected to output terminals of a plurality of diagnostic circuits, The above logic gate applies a first value to the processor when all values ​​received from the output terminals of the plurality of diagnostic circuits are first values, If at least one of the values ​​received from the output terminals of the plurality of diagnostic circuits is a second value, applying the second value to the processor, Electronic devices.

8. In paragraph 1, Each of the above multiple diagnostic target elements is: A switch or fuse, Electronic devices.

9. In a method for diagnosing a target element performed by an electronic device, A step of applying voltage to one end of a plurality of diagnostic target elements included in a plurality of diagnostic circuits; and A step of diagnosing whether the plurality of diagnosis target elements are operating normally based on an output value of a diagnosis result output circuit generated by a logic gate based on a value received from an output terminal of the plurality of diagnosis circuits to which the voltage is applied. Method of diagnosing the device.

10. A non-transitory computer-readable recording medium recording a program for executing the device diagnosis method of Article 9 on an electronic device.

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