Method for measuring optical lenses, and device for this purpose

Abstract

The invention relates to a method for measuring optical lenses (10) by means of a device (1), which has, for this purpose: a detection device (11), which is provided on a first side (10a) of the lens (10) in relation to the plane of extent of the lens (10), one or a number of first radiation sources (12), by means of which the position of the lens (10) in space is determined, and / or a second radiation source (13), by means of which the distribution of the planar refractive power over the surface of the lens (10) is determined. According to the invention, a two-dimensionally extending, moving pattern is generated by the second radiation source or another radiation source (13), said pattern being detected through the lens (10) by the detection device (11) and one or more defects (15) on the surface of the lens (10) being detected by means of a computer unit (14).

Description

[0001] METHOD FOR MEASURING OPTICAL

[0002] LENSES AND DEVICE FOR THIS

[0003] The invention relates to a method for measuring optical lenses by means of a device, wherein the device comprises: a detection device arranged on a first side of the lens with respect to a plane of extension of the lens, one or more first radiation sources with which the position of the lens in space is determined, and a second radiation source with which a planar refractive power distribution of the lens over the surface is determined.

[0004] STATE OF THE ART

[0005] From EP 3 531 067 A1, a device for carrying out a method for measuring optical lenses is known, which uses a first radiation source in the form of a laser and a second radiation source in the form of a screen, so that both the position of the lens in space and the refractive power distribution of the lens over its surface can be determined. The surface refractive power distribution is also referred to as a power map. In order to detect defects in the lens after the processes of determining the lens or the first surface of the lens in space and after determining the surface refractive power distribution of the lens, the lens must generally be fed to a further station to detect the defects and to treat the lens accordingly.

[0006] For example, DE 3 943 909 A1 discloses a method for generating data about the lens that takes the defect into account, so that the lens is subsequently subjected to edge processing in which as many defects as possible are located in the edge area, which is removed when the mold body is edge-processed to form the spectacle lens.

[0007] This is achieved by identifying the position and size of any defects present in a semi-finished or finished lens after it has been provided. By recording corresponding edge data, a comparison can be made between this data set and the semi-finished or finished lens, each containing at least one defect. The semi-finished or finished lens is then assigned to a category. This category takes into account the type and position of the defect, so that, depending on the lens category, the edge of the semi-finished lens is designed to minimize the presence of the defect in the final lens.

[0008] REVELATION OF THE INVENTION

[0009] The object of the invention is to further improve the method for measuring optical lenses with an expanded range of functions, in particular by using a single device without increasing the overall system complexity. The lenses should be able to be provided with information about any defects already present in the device.

[0010] This problem is solved starting from a method according to the preamble of claim 1 and starting from a device according to the preamble of claim 12, each with the characterizing features. Advantageous embodiments of the invention are specified in the dependent claims.

[0011] Starting from the features in the preamble, the invention now includes the further technical teaching that a planar, moving pattern is generated with the second or a further radiation source, which is detected by the detection device through the lens and one or more defects on the surface of the lens are detected by means of the computer unit, wherein the lens remains in an associated lens holder for determining the position of the lens in space, if necessary, for determining the planar refractive power distribution of the lens over the surface and for detecting the at least one defect.

[0012] The core concept of the invention is the use of the second radiation source to generate a further pattern with corresponding properties suitable for detecting defects in or on the lens via the existing detection device and providing corresponding information. The detection device can, in particular, be composed of a camera, an image processing unit, and a computer unit, wherein at least the camera and the image processing unit can be part of the detection device, and the computer unit can interact with the detection unit to operate the image processing unit. The first radiation source(s) can be arranged such that they are located on the same first side of the lens with respect to the detection device.are and with which the lens is irradiated with incident light from the first side and a fluorescence is produced which is detected by the detection device, wherein a radiation pattern is produced on the first side of the lens with the first radiation sources, which is detected by the detection device and the position of the lens in space is determined by means of a computer unit.

[0013] The first radiation source can be multiple and include laser beam sources. For example, four lasers can be grouped at two locations to irradiate the lens surface, creating a corresponding radiation pattern on the lens surface, which forms the first side of the lens and also points towards the detection device. Fluorescence can be generated in or on the lens surface, which is then detected by the detection device. A color filter can also be placed in front of the detection device to filter out the actual wavelength of the laser beam source and detect only the fluorescence itself. This makes it possible to determine the lens's position in space and define the corresponding actions taken by the computer unit.

[0014] The second radiation source is, in particular, an active and / or passive screen. The screen may, for example, comprise a TFT screen as a surface emitter to emit light itself as an active screen. Alternatively, the screen may be designed as a passive radiation source illuminated by an adjacent light source, so that the reflected light from the passive screen passes through the lens and is detected by the detection device. This can generate a stationary pattern extending over a surface, which is then detected by the detection device through the lens.Consequently, the second radiation source can be controlled in such a way that a planar, but moving pattern is generated, which is positionally variable over the planar extent of the screen, so that finally the entire surface of the lens is illuminated with the radiation pattern in a time-resolved manner, and defects that create a distortion in the radiation pattern can be detected by the detection device.

[0015] The advantage is, in particular, that the lens can be measured and examined for cosmetic defects in just one device for the complete measurement procedure, including the determination of any defects, and always remains in the same lens holder, so that the information about the position of the lens in space - if necessary - and the information about the localization of the defects can be combined.

[0016] Therefore, it is necessary that the generated pattern not only extends across the entire surface, but in particular that it moves from the screen, for example in the form of regular curves that move across the surface of the screen and that the moving image is captured by the detection device after the path of the radiation emitted by the screen with the corresponding pattern or reflected radiation is captured by the camera, which is part of or forms the detection device.

[0017] The advantage of the solution according to the invention is that, with the system of first and second radiation sources known per se, in addition to determining the position of the lens in space and determining the planar refractive power distribution, the so-called power map, defects on the lens can be detected, which can ultimately be provided as information together with the lens.

[0018] The second or further radiation source can comprise a screen on which the planar patterns are generated, wherein the determination of the planar refractive power distribution of the lens and the detection of one or more defects on the surface of the lens are performed from the generation of patterns on a single screen. The screen is preferably a TFT display or an OLED display capable of generating a corresponding planar pattern as an area emitter, which can then be detected by the detection device or its camera.Only through the multiple use of the screen, which is either active or passive (see above), does the advantage of the inventive method become particularly clear, because with one and the same screen images can be generated that are suitable both for capturing the planar refractive power distribution of the lens and for detecting defects on the surface or in the material of the lens.

[0019] As a surface-extending, stationary pattern for detecting the surface refractive power distribution of the lens, i.e., the power map, a dot pattern can be generated on the screen, which is then detected by the detection device through the lens. For example, 10 to 50 points can be generated across the surface in a regular grid by omitting or highlighting individual pixels or pixel fields on the active display, such as a TFT display.

[0020] A striped pattern, extending across the entire surface, can be generated to detect defects on the lens surface. This striped pattern is then captured by the detection device through the lens. In particular, the striped pattern can consist of a series of moving sine waves, creating a sinusoidal pattern that travels across the screen surface. The moving sinusoidal stripes allow every point on the lens surface to be detected, ensuring that every defect on or within the lens is identified.

[0021] Of course, it is also possible to provide a second or additional radiation source, particularly in the form of a screen on which the moving stripe pattern can be generated, while the dot pattern is generated on a first screen. Multiple screens can be used to further optimize the process by measuring several lenses at multiple stations with the first and second radiation sources. The advantage remains, however, that the lenses remain fixed in a single, shared clamping setup, both in terms of their spatial orientation and for determining the power map and detecting defects. This eliminates the need to re-clamp the lens for further defect detection.

[0022] Furthermore, the device may include a center thickness measuring device with which the center thickness of the lens is measured. The center thickness measuring device may be located in a first working area of ​​the device, while the radiation sources, in particular the screen, are located in a second working area.

[0023] Furthermore, a marking unit can be set up in the first working area. This unit allows for the application of a mark to the lens, either at a defined, predetermined position that can be recognized for subsequent lens processing, or it can mark the defects themselves, thus highlighting or making them visible. Both the marking unit and the center thickness measuring device can be located in the first working area, and the lenses can be moved back and forth between the first and second working areas. The first and second radiation sources and the detection device are located in the second working area.

[0024] The device can have several lens holders in which the lens—if necessary—is held for determining the lens's position in space, for determining the surface refractive power distribution of the lens, and for detecting defects on the lens surface. The lenses remain in these holders continuously, even when moved back and forth between the two working areas. The second working area, containing the aforementioned features, can also be present multiple times.

[0025] Furthermore, the device comprises a movement system with which at least one lens can be moved between the position for illumination with the first and second radiation sources and the position for the center thickness measuring device and / or for marking with the marking unit, i.e., between the two working areas. The movement system comprises, for example, two lens holders positioned 180° opposite each other, in which respective lenses are received, such that the center thickness measuring device and / or the marking of the lens with the marking unit is located in a first lens holder in the first working area, and the illumination of the lens with the first radiation source and / or with the second radiation source is located in the second working area, wherein the lens holders can be rotated on the movement system around a rotational axis, for example, in 180° increments.

[0026] A further advantage is the inclusion of a lifting mechanism that allows the lens and / or at least one lens holder to be repositioned vertically, such that the lens is moved relative to the detection device and / or relative to the screen. Alternatively, the lenses can be fixedly mounted in the device, while the screens, the center thickness measuring device, and / or the marking unit can be movably mounted on the movement system.

[0027] The invention further relates to a device for carrying out the method as described above, wherein the first radiation source with the screen, the second radiation source, the detection device, the center thickness measuring device, the marking unit, the movement system, and the lifting device form a structural unit in a common housing. Furthermore, the computer unit can be part of the structural unit, so that the device enables lenses to be received via a feed device and supplied via a discharge device to a subsequent station, wherein the lenses are marked accordingly if defects are present in them, and digital information is provided on how the defects are located and what type or nature they correspond to.Furthermore, information can be provided, along with predefined data on the lens edge machining and the lens type itself, indicating whether and how the lens can be machined so that the defect remains in the final spectacle lens. The possibility of eliminating the defect through appropriate adjustments to the lens edge machining depends on the type of spectacle lens, for example, whether it is a single-vision lens with lenses that have only a positive or negative diopter correction and are rotatable, such as 360°. Lenses are also known that, in addition to the diopter correction, have a cylinder correction and are either not rotatable or only rotatable by 180°. Furthermore, lenses are known that also include a prism or are multifocal, for example, bifocal or have multiple focal zones.So-called prescription lenses are lenses with freeform surfaces, for example, for progressive lenses. These lenses cannot be rotated, and only within certain limits can the final lens shape be shifted planarly within the lens body so that, for example, defects in the actual lens are eliminated when the lens edge is modified. However, these tolerances are very small, so eliminating the defect through appropriate edge data analysis is particularly relevant for lenses that have only one diopter power or, for example, contain a diopter power and a cylinder and / or prism.

[0028] As an alternative to the above-described determination of the surface refractive power distribution, the first and / or the second or any further radiation source can be used to determine the position of the lens in space and / or the surface refractive power distribution of the lens over the surface, and to perform or implement a wavefront measurement method, an interferometric measurement method, a deflectometry, in particular a deflectometric-reflective or deflectometric-transmissive measurement method, in particular using a first measurement reflection on the first side and a second measurement reflection transmissively through the lens on the second side of the lens, or a point-based method, i.e., not measuring across the entire surface, using a vertex refractometer, a radius scope method, or a confocal measurement method.This means that the determination of the surface refractive force distribution is not limited to the method described above and in the exemplary embodiment.

[0029] The measurement methods that may be considered for determining the position of the lens in space or for determining the area refractive power distribution, in particular as alternatives to the methods described above, are explained in more detail below.

[0030] Deflectometry generally refers to all methods for obtaining shape information about reflective surfaces through the automatic analysis of mirror images of known scenes. The deformations in these mirror images allow conclusions to be drawn about the surface's shape. This enables the detection of local defects, such as bumps or dents on a surface, the flatness testing of surfaces, as well as the geometric measurement and 3D model generation of large and complexly shaped objects. Both defect detection and geometric reconstruction are possible within approximately one second of measurement time. Modern systems no longer require the manual training of difficult contours or edges, as this is handled automatically by the analysis methodology.

[0031] Vertex refractive power measurement uses a lensmeter, also called a focimeter, and is a device for measuring the refractive power of a spectacle lens. The target, typically consisting of crossed rows of lines, is imaged through an objective lens. The spectacle lens to be tested is placed at the rear focal point of this objective lens. The light exiting the spectacle lens enters an eyepiece with an internal reticle. The user moves the target axially until it is in focus simultaneously with the reticle. This occurs when the light exiting the spectacle lens is collimated.

[0032] Interferometry determines the radius of curvature of spherical surfaces and is typically performed using an interferometer for phase measurement to establish the zero positions of the best-fit spherical surface and the center of curvature of the test optics. A linear guide allows movement between these positions, and one or more displacement sensors are used to record the distance between the reflector and the confocal positions, thus determining the radius of curvature.

[0033] Chromatic confocal distance measurement uses the dispersion of white light in a focusing lens to determine the distance between a reflective surface and the sensor. It thus makes use of chromatic aberration.

[0034] In this technique, a white point light source, realized by a very small pinhole aperture of only a few micrometers in diameter, is focused onto the object using a non-color-corrected—that is, dispersive—lens. Due to the dispersion, the blue light components are focused closer to the lens and the red components farther away. The reflected light is re-focused by the same lens and coupled from the illumination beam path using a beam splitter. It is then focused onto an identical pinhole aperture as on the illumination side. Following the same principle as in confocal microscopy, this process blocks out the light that does not originate from the object plane. A spectrometer behind the pinhole aperture then determines the dominant wavelength of the reflected light. Knowing the focal lengths of the individual wavelengths, the object distance can be directly calculated from the dominant wavelength.

[0035] A polychromatic light source illuminates the surface of the object. This light is focused to different distances depending on its wavelength, and only the light within a very narrow wavelength range is focused onto the surface being measured. The remaining light is distributed concentrically around this focal point over a larger area. By determining the wavelength of the focused light reflected back into the optical system, highly accurate distance measurements are possible at up to 70 kHz and with nanometer resolution. The distance is chromatically encoded within the measurement range, and the measuring head, which is connected to the chromatically confocal sensor via an optical fiber, determines the measurement range or the focal depth of the spectrum.

[0036] The high numerical aperture of the measuring heads and the dynamic range of the sensor ensure that almost all materials can be measured, including glass and transparent plastics. This measurement technology is significantly more reliable in all environments than conventional laser-based triangulation methods.

[0037] Advantages of chromatic confocal sensors include high-speed inline inspections at up to 70 kHz, a passive optical measuring head that is compact, passive, and wear-free, and chromatic depth scanning without moving parts enables measurement on any material, regardless of whether it is absorbent or colored, diffuse or reflective, rough or polished, while avoiding shadow effects. Furthermore, very high acceptance angles and high numerical apertures are possible, up to 45° on reflective surfaces and up to 80° on diffusive surfaces. Excellent Z-axis resolution and very high accuracy are also achieved.

[0038] PREFERRED EXAMPLE OF THE INVENTION

[0039] Further measures improving the invention are described in more detail below, together with a description of a preferred embodiment of the invention, with reference to the figures. The figures show:

[0040] Figure 1 shows a view of the device for carrying out the method according to the invention and

[0041] Figure 2 shows a schematic flowchart for the execution of the procedure.

[0042] Figure 1 shows a schematic view of the device 1 with which the method according to the invention can be carried out. The device has a first working area I and a second working area II, wherein a lens 10 can be measured with respect to its center thickness in the first working area I, for which a center thickness measuring device 17 is provided in the first working area I. Furthermore, the lens 10 can be marked, for which a marking unit 18 is provided in the first working area I.

[0043] The second working area II comprises as essential components a number of first radiation sources 12, in particular laser diodes, and a second radiation source 13, in particular in the form of a passive or active, i.e. self-illuminating screen 16. The second radiation source 13 can thus be configured as an active or as a passive radiation source 13, so that it is also conceivable that an image on a screen that does not itself emit light is illuminated in such a way that reflected light from the screen 16 can also be used.

[0044] The second work area II also includes a detection device 11, the core of which is a camera. Generally, the second work area II can also be present multiple times.

[0045] The first radiation sources 12 and the detection device 11 are located on a first side 10a of the lens 10 with respect to a plane of extension E, and the second radiation source 13, in particular the screen 16, is located on the second side 10b of the lens 10 with respect to the plane of extension E. Thus, light reflected from the surface of the lens 10 on the first side 10a by the first radiation sources 12 can be detected by the detection device 11, whereas light emitted or reflected from the screen 16 first passes through the lens 10 and is detected by the detection device 11 after passing through the lens 10. The reflected light from the first radiation sources 12 can, in particular, be reflected back in the form of fluorescence, which is detected by the detection device 11.

[0046] Furthermore, a computer unit 14 is shown schematically, which is in data communication with the first radiation sources 12, the second radiation source 13, and the detection device 11. The center thickness measuring device 17 and the marking unit 18 are also connected to the computer unit 14 for data exchange, though this connection is not shown in detail. The device 1 also includes a movement system 20 with which the lenses 10 can be moved back and forth between the first working area I and the second working area II. By way of example, the movement system 20 comprises two diametrically opposed lens holders 19, each holding a lens 10, which can be moved back and forth between the two working areas I and II. The lens holders 19 can rotate about a rotational axis R to switch between working areas I and II.In addition, a lifting device 21 is provided with which the lens holders 19 can be moved in height, in particular to adjust the lenses 10 relative to the focal plane of the radiation sources and also to the center thickness measuring device 17 and / or the marking unit 18.

[0047] The following describes the procedure step of determining the position 10 of the lens in space.

[0048] The first radiation sources 12 form individual laser diodes, each emitting stripe-shaped lines. The laser diodes, arranged in groups, are aligned such that a grid or lattice pattern is generated on the lower surface of the lens 10, which faces the first side 10a. For example, eight laser diodes are arranged so that four generated stripes from a first group of laser diodes and another four generated stripes from a further group of laser diodes are projected perpendicular to each other onto the surface of the lens 10.

[0049] The fluorescence radiation of the lens material 10 or its coating, excited by the line-shaped beams arranged in this manner, for example with a wavelength of 405 nm to 450 nm, is reflected from the surface of the lens 10 by the two groups of laser diodes, which are arranged perpendicularly or at least at an angle to each other. The reflected fluorescence radiation is then measured by the detection device 11. This fluorescence radiation thus forms a diamond or grid pattern, and the camera of the detection device 11 can, for example, include a CCD sensor that detects the fluorescence radiation.The camera of the detection device 11 can also have a filter, or this filter can be positioned upstream of the camera in the beam path, which filters out the actual wavelength of the laser radiation emitted by the laser diodes, for example, a wavelength of 405 nm to 450 nm, so that the fluorescence radiation can be detected by the camera of the detection device 11 without interference. The resulting measurement data are acquired and processed by the computer unit 14. The position of the lens 10 in space can be determined using a known triangulation method. More precisely, the position of the underside of the lens 10, i.e., the surface of the lens 10 facing the first side 10a, is determined in space. For asymmetrical lenses, such as freeform lenses, the measurement result is unambiguous.For symmetrical lenses, such as spherical lenses, data on the edge contour are also required to determine their position in space. The device 1 according to the invention can be calibrated by performing the method described above using a flat glass as the measuring object.

[0050] The following describes the operation of the second radiation source 13, in particular the screen 16.

[0051] The second radiation source 13 can be a TFT-based LCD screen and serve as a surface emitter, generating a stationary pattern, for example a dot pattern, above the emitting surface. This pattern is detected by the detection unit 11 through the lens 10 and subsequently evaluated by the computer unit 14. The defined pattern is modified according to the contour of the lens 10, particularly its edge contour. Changes in this pattern, for example a dot pattern, can be detected by the detection unit 11 and evaluated by the computer unit 14. Calibration can also be performed using a flat glass as the measuring object.

[0052] In this process step, the edge contour of the lens 10 is also detected, so that together with the data obtained from the operation of the first radiation source 12, a complete position of the lens 10 in space can now be defined.

[0053] As the emitted rays from the second radiation source 13 pass through the lens 10, they are deflected according to the optical properties of the lens 10, i.e., as a consequence of the surface topography. The resulting transmitted radiation is detected by the camera of the detection device 11 and fed to the computer unit 14. The measurement points generated across the surface of the screen 16 are evaluated using a ray tracing method, that is, an algorithm based on the emission of rays to trace the detected measurement points back to their source, i.e., the defined pixels on the screen. Using this ray tracing method, the resulting measurement points detected by the CCD sensor of the camera of the detection device 11 are correlated with the pixels arranged on the second radiation source 13.For the purpose of assigning the recorded measurement points to the pixels generated in the screen 16, the pixel arrangement on the screen 16 of the second radiation source 13 is encoded. The measurement data resulting from the transmission measurement and the ray tracing method are evaluated in the computer unit 14, so that the refractive power distribution, and thus the power map, of the lens 10 over its planar extent is ultimately determined using this method.

[0054] Finally, according to the invention, the second or a further radiation source 13 is used in a further way by generating a moving, planar pattern with the radiation source 13. This pattern is detected by the detection device 11 through the lens 10, and one or more defects 15 on the surface of the lens 10 are detected by the computer unit. For this purpose, the second radiation source 13 is configured, in particular as an active screen, to generate a striped pattern such that it moves across the planar extent of the screen 16, i.e., it travels. The striped pattern can, for example, be a sine pattern, with several sine lines traveling successively across the surface of the screen 10, so that the detection device 11 can also use a ray tracing method as described above to infer defects 15 in the lens 10.Only by generating moving patterns on the surface of the screen 16 of the second radiation source 13 is it possible to check the entire optical area of ​​the lens 10 without gaps, so that any existing defect on the surface of the lens 10 or in the material of the lens 10 itself can be detected.

[0055] The measurements described above using the first radiation source 12 and / or the second radiation source 13 can be preceded by a center thickness measurement, which is performed in the first working area I using the center thickness measuring device 17. Depending on the type of lens 10, it is also possible to determine the center thickness of the lens 10 from the power map or from the lens measurement data regarding the refractive power distribution.

[0056] If a defect 15 is detected on a lens 10, the lens can be transferred to the first working area I, and a marking unit 18 can be used to mark the lens 10 either with respect to its rotational or planar orientation, or a detected defect 15 on the lens 10 can be marked directly with the marking unit 18. Thus, the device 1, with the embodiment according to the invention, offers the possibility of providing lenses 10 that already have a marking, according to which, during subsequent edge processing, the detected defect 15 can be relocated by positioning and / or rotating the lens 10 for the subsequent edge processing so that the defect 15 falls into an area that is not part of the final spectacle lens and is eliminated by the edge processing.

[0057] Figure 2 shows a diagram with the rotation axis R forming a division between the working area I on the left and the second working area II on the right.

[0058] The lens 10 is first inserted into the holder 19 in a work step 100, resulting in the mounting 100 of the lens 10 in the holder 19 in the first working area I. In a subsequent step 101, the lens 10 is positioned towards the center thickness measuring device 17, although this step is optional. If performed, the center thickness is then measured 102 using the center thickness measuring device 17.

[0059] After the center thickness measurement has been completed, the lens is transferred to the second working area II, for which the motion system 20 is activated, so that the transfer 103 of the lens 10 to the second working area II takes place. Then, the positioning 104 of the lens 10 between the radiation sources 12, 13 is carried out by means of the lifting device 21. Subsequently, the fringe pattern is generated 105 with the first radiation sources 12. Then, the detection 106 of the fringe pattern is carried out by means of the detection device 11. Finally, the evaluation 107 of the position of the lens 10 or its lower surface is carried out by the computer unit 14.

[0060] Subsequently, a point pattern is generated 108 using the second radiation source 13. Once the point pattern is generated, it is detected 109 using the detection device 11. Finally, the refractive power distribution of the lens is evaluated 110 using the computer unit 14, these steps preferably being carried out simultaneously.

[0061] Subsequently, a moving stripe pattern is generated 111 with the second radiation source 13, and then the moving stripe pattern is detected 112 by means of the detection device 11. Following this, defects 15 on the lens 10 are detected 113 by means of the computer unit 14.

[0062] The lens 10 is then transferred back to the first working area I by activating the motion system 20 for the transfer 103 of the lens 10. This feeds the lens 10 with the detected defect 15 to the marking unit 18, so that the marking 114 of the lens 10 is carried out by the marking unit 18. Finally, the lens 10 can be fed to a transport means or placed in a magazine, with the defect data of the lens, concerning any defect 15 that may be present, also being supplied in bit form via the device 1 according to the invention.

[0063] The invention is not limited in its implementation to the preferred embodiment described above. Rather, a number of variants are conceivable, which utilize the solution presented even in fundamentally different designs. All features and / or advantages arising from the claims, the description, or the drawings, including design details or spatial arrangements, can be essential to the invention, both individually and in various combinations.

[0064] Reference symbol list:

[0065] I Device

[0066] 10 lenses

[0067] 10a first page

[0068] 10b second page

[0069] II Detection device

[0070] 12 first sources of radiation

[0071] 13 second sources of radiation

[0072] 14 computer units

[0073] 15 defects

[0074] 16-inch screen

[0075] 17 Center thickness measuring device

[0076] 18 marking units

[0077] 19 lens holders

[0078] 20 Movement system

[0079] 21 Lifting device

[0080] R axis of rotation

[0081] First work area

[0082] 11 second work area

[0083] 100 Mounting the lens in the holder in working area I

[0084] 101 Positioning the lens to the center thickness measuring device

[0085] 102 Center thickness measurement

[0086] 103 Transfer of the lens to working area II

[0087] 104 Positioning the lens between radiation sources

[0088] 105 Generation of stripe patterns with first radiation sources

[0089] 106 Detection of stripe patterns using a detection device

[0090] 107 Evaluating the position of the lens (lower surface)

[0091] 108 Generation of dot patterns with a second radiation source 109 Detection of the dot patterns using a detection device

[0092] 110 Evaluating the refractive power distribution of the lens (power map)

[0093] 111 Generation of a moving stripe pattern with a second radiation source 112 Detection of the moving stripe pattern using

[0094] Detection device

[0095] 113 Detecting defects on the lens

[0096] 103 Transfer of the lens to working area I

[0097] 114 Marking the lens with marking unit

Claims

Claims:

1. A method for measuring optical lenses (10) using a device (1), wherein the device (1) comprises: one or more detection devices (11) arranged on a first side (10a) of the lens (10) with respect to a plane of extension (E) of the lens (10), one or more first radiation sources (12) with which the position of the lens (10) in space is determined, and / or a second radiation source (13) with which a planar refractive power distribution of the lens (10) over the surface is determined, characterized in that a planar extending, moving pattern is generated with the second or with a further radiation source (13), which is detected through the lens (10) by the at least one detection device (11) and one or more defects (15) on the surface of the lens (10) are detected by means of the computer unit (14).the lens (10) is used to determine the position of the lens (10) in space and / or the area refractive power distribution of the lens (10) over the surface and to detect the at least one defect (15) in an associated lens holder (19).

2. Method according to claim 1, characterized in that one or a number of first radiation sources (12) are provided which are arranged on the same first side (10a) of the lens (10) with respect to the detection device (11) and with which the lens (10) is illuminated from the first side (10a) with incident light is irradiated and a fluorescence is produced which is detected by the detection device (11), wherein a radiation pattern is produced on the first side (10a) of the lens (10) with the first radiation sources (12), which is detected by the detection device (11) and the position of the lens (10) in space is determined by means of a computer unit (14).

3. Method according to claim 1 or 2, characterized in that the second radiation source (13) is arranged on the opposite second side (10b) of the lens (10) with respect to the detection device (11) and with which the lens (10) is irradiated, the irradiated light is detected by the detection device (11).

4. Method according to claims 1 to 3, characterized in that a planar extending, stationary pattern is generated with the second radiation source (13), which is detected by the detection device (11) through the lens (10) and the planar refractive power distribution of the lens (10) over the surface is determined by means of the computer unit (14).

5. Method according to one of the preceding claims, characterized in that the second or further radiation source (13) comprises a screen (16) on which the planar patterns are generated, wherein the determination of the planar refractive power distribution of the lens (10) and the detection of one or more defects (15) on the surface of the lens (10) is performed from the generation of patterns of a single screen (16).

6. Method according to one of the preceding claims, characterized in that a dot pattern is generated as a planar extending, stationary pattern for detecting the planar refractive power distribution of the lens (10), which is detected through the lens (10) by the detection device (11).

7. Method according to claim 1, characterized in that the second or further radiation source (13), with which the planar refractive power distribution of the lens (10) over the surface is determined, is used to perform a wavefront measurement method, an interferometric measurement method, a deflectometric-reflective or deflectometric-transmissive measurement method, in particular using a first measurement reflection on the first side (10a) and a second measurement reflection transmissively through the lens (10) on the second side (10b) of the lens (10), or a point-based method, i.e. not measuring over the entire area, using a vertex refractometer, a radioscope method or a confocal measurement method.

8. Method according to one of the preceding claims, characterized in that a striped pattern is generated as a planar extending, moving pattern for detecting the defects (15) on the surface of the lens (10), which is detected through the lens (10) by the detection device (11).

9. Method according to claim 8, characterized in that the stripe pattern for detecting the defects (15) on the surface of the lens (10) is generated by means of a sine pattern moving over the screen (16).

10. Method according to one of the preceding claims, characterized in that the device (1) has a center thickness measuring device (17) with which the center thickness of the lens (10) is measured.

11. Method according to one of the preceding claims, characterized in that the device (1) has a marking unit (18) with which the lens (10) is marked with respect to detected defects (15) or the defects (15) themselves.

12. Method according to one of the preceding claims, characterized in that the device (1) has two or more lens holders (19) in which the lenses (10) are received for determining the position of the lens (10) in space, for determining the planar refractive power distribution of the lens (10) over the surface and for detecting the defects (15) on the surface of the lens (10) and remain in these without interruption.

13. Method according to one of the aforementioned claims, characterized in that, that a movement system (20) is provided with which at least one lens (10) is positioned between the position for illumination and the first (12) and is movable with the second radiation source (13) and the position to the mid-thickness measuring device (17) and / or to the marking with the marking unit (18).

14. Method according to one of the preceding claims, characterized in that the movement system (20) has two lens holders (19) positioned 180° opposite each other, in which respective lenses (10) are received, such that the illumination of the lens (10) with the first radiation source (12) and / or with the second radiation source (13) on a first side and the center thickness measuring device (17) and / or marking of the lens (10) with the marking unit (18) on a second side are carried out simultaneously.

15. Method according to one of the preceding claims, characterized in that a lifting device (21) is provided with which the lens (10) and / or the at least one lens holder (19) can be moved in height, such that the lens (10) is moved relative to the detection device (11) and / or relative to the screen (16).

16. Device (1) for carrying out a method according to one of the preceding claims, characterized in that the first radiation sources (12), the second radiation source (13), the detection device (11), the screen (15), the center thickness measuring device (17), the marking unit (18), the The motion system (20) and the lifting device (21) form a structural unit.

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